CN107359210B - 用于制造光电转换设备的方法 - Google Patents
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- CN107359210B CN107359210B CN201710327951.3A CN201710327951A CN107359210B CN 107359210 B CN107359210 B CN 107359210B CN 201710327951 A CN201710327951 A CN 201710327951A CN 107359210 B CN107359210 B CN 107359210B
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
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- H10F77/50—Encapsulations or containers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02491—Conductive materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
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- H—ELECTRICITY
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
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- H—ELECTRICITY
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
- H10F39/018—Manufacture or treatment of image sensors covered by group H10F39/12 of hybrid image sensors
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- H—ELECTRICITY
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
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- H—ELECTRICITY
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
- H10F39/8063—Microlenses
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- H—ELECTRICITY
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
- H10F39/8067—Reflectors
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- H—ELECTRICITY
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/10—Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/137—Batch treatment of the devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/139—Manufacture or treatment of devices covered by this subclass using temporary substrates
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F99/00—Subject matter not provided for in other groups of this subclass
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
- H10F39/8053—Colour filters
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/809—Constructional details of image sensors of hybrid image sensors
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016-094171 | 2016-05-09 | ||
| JP2016094171A JP2017204510A (ja) | 2016-05-09 | 2016-05-09 | 光電変換装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107359210A CN107359210A (zh) | 2017-11-17 |
| CN107359210B true CN107359210B (zh) | 2020-03-10 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710327951.3A Active CN107359210B (zh) | 2016-05-09 | 2017-05-04 | 用于制造光电转换设备的方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US10559464B2 (enExample) |
| JP (1) | JP2017204510A (enExample) |
| CN (1) | CN107359210B (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10566287B1 (en) | 2018-02-02 | 2020-02-18 | Inphi Corporation | Light engine based on silicon photonics TSV interposer |
| CN110634892B (zh) * | 2018-06-22 | 2022-02-15 | 中芯集成电路(宁波)有限公司 | 光电探测器及其制造方法、图像传感器 |
| US11101311B2 (en) | 2018-06-22 | 2021-08-24 | Ningbo Semiconductor International Corporation | Photodetector and fabrication method, and imaging sensor |
| CN112424908B (zh) * | 2018-07-25 | 2025-06-13 | 株式会社尼康 | 接合方法以及接合装置 |
| KR102551483B1 (ko) * | 2018-08-14 | 2023-07-04 | 삼성전자주식회사 | 이미지 센서 및 그 제조 방법 |
| CN111384204A (zh) * | 2018-12-28 | 2020-07-07 | 清华大学 | 一种背照式光电器件的背面处理工艺 |
| US11165509B1 (en) | 2020-06-05 | 2021-11-02 | Marvell Asia Pte, Ltd. | Method for co-packaging light engine chiplets on switch substrate |
| US20220328605A1 (en) * | 2021-04-13 | 2022-10-13 | Canon Kabushiki Kaisha | Light-emitting element, light-emitting device, photoelectric conversion device, and electronic device |
| CN115542478B (zh) * | 2022-11-25 | 2023-04-07 | 之江实验室 | 一种基于光电芯片双面工艺的三维封装结构及封装方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102714212A (zh) * | 2009-12-26 | 2012-10-03 | 佳能株式会社 | 固态图像拾取装置和图像拾取系统 |
| CN103579377A (zh) * | 2012-07-31 | 2014-02-12 | 台湾积体电路制造股份有限公司 | 具有堆叠配置的抬升式光电二极管 |
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| JP4032454B2 (ja) * | 1997-06-27 | 2008-01-16 | ソニー株式会社 | 三次元回路素子の製造方法 |
| US7232605B2 (en) * | 2003-07-17 | 2007-06-19 | Board Of Trustees Of Michigan State University | Hybrid natural-fiber composites with cellular skeletal structures |
| JP4046067B2 (ja) * | 2003-11-04 | 2008-02-13 | ソニー株式会社 | 固体撮像素子の製造方法 |
| JP2005259828A (ja) * | 2004-03-10 | 2005-09-22 | Sony Corp | 固体撮像素子及びその製造方法 |
| CN102290425B (zh) * | 2004-08-20 | 2014-04-02 | Kamiyacho知识产权控股公司 | 具有三维层叠结构的半导体器件的制造方法 |
| JP4691939B2 (ja) | 2004-09-27 | 2011-06-01 | ソニー株式会社 | 裏面照射型固体撮像素子の製造方法 |
| JP5512102B2 (ja) * | 2007-08-24 | 2014-06-04 | 本田技研工業株式会社 | 半導体装置 |
| JP4816603B2 (ja) | 2007-09-10 | 2011-11-16 | ソニー株式会社 | 固体撮像素子の製造方法 |
| JP4858367B2 (ja) | 2007-09-10 | 2012-01-18 | ソニー株式会社 | 固体撮像素子の製造方法 |
| JP4816602B2 (ja) | 2007-09-10 | 2011-11-16 | ソニー株式会社 | 固体撮像素子の製造方法 |
| TWI502705B (zh) * | 2009-08-19 | 2015-10-01 | 精材科技股份有限公司 | 晶片封裝體及其製造方法 |
| JP5853351B2 (ja) * | 2010-03-25 | 2016-02-09 | ソニー株式会社 | 半導体装置、半導体装置の製造方法、及び電子機器 |
| US8395919B2 (en) * | 2010-07-29 | 2013-03-12 | General Electric Company | Photovoltaic inverter system and method of starting same at high open-circuit voltage |
| JP5218502B2 (ja) | 2010-08-30 | 2013-06-26 | ソニー株式会社 | 固体撮像装置の製造方法 |
| US20130264688A1 (en) * | 2012-04-06 | 2013-10-10 | Omnivision Technologies, Inc. | Method and apparatus providing integrated circuit system with interconnected stacked device wafers |
| JP6012262B2 (ja) * | 2012-05-31 | 2016-10-25 | キヤノン株式会社 | 半導体装置の製造方法 |
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| JP6299406B2 (ja) * | 2013-12-19 | 2018-03-28 | ソニー株式会社 | 半導体装置、半導体装置の製造方法、及び電子機器 |
| US9230941B2 (en) * | 2014-03-28 | 2016-01-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Bonding structure for stacked semiconductor devices |
| JP2016025255A (ja) * | 2014-07-22 | 2016-02-08 | 株式会社東芝 | 半導体装置とその製造方法 |
| US9525001B2 (en) * | 2014-12-30 | 2016-12-20 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor device and manufacturing method thereof |
| US10177187B2 (en) * | 2015-05-28 | 2019-01-08 | Taiwan Semiconductor Manufacturing Company Ltd. | Implant damage free image sensor and method of the same |
| US9620548B1 (en) * | 2015-10-30 | 2017-04-11 | Taiwan Semiconductor Manufacturing Co., Ltd. | Image sensor with wide contact |
-
2016
- 2016-05-09 JP JP2016094171A patent/JP2017204510A/ja active Pending
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2017
- 2017-05-02 US US15/584,748 patent/US10559464B2/en active Active
- 2017-05-04 CN CN201710327951.3A patent/CN107359210B/zh active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102714212A (zh) * | 2009-12-26 | 2012-10-03 | 佳能株式会社 | 固态图像拾取装置和图像拾取系统 |
| CN103579377A (zh) * | 2012-07-31 | 2014-02-12 | 台湾积体电路制造股份有限公司 | 具有堆叠配置的抬升式光电二极管 |
Also Published As
| Publication number | Publication date |
|---|---|
| US10559464B2 (en) | 2020-02-11 |
| US20170323787A1 (en) | 2017-11-09 |
| JP2017204510A (ja) | 2017-11-16 |
| CN107359210A (zh) | 2017-11-17 |
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