CN107356336B - A kind of small-sized LONG WAVE INFRARED imaging spectrometer and its imaging method - Google Patents

A kind of small-sized LONG WAVE INFRARED imaging spectrometer and its imaging method Download PDF

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CN107356336B
CN107356336B CN201710518443.3A CN201710518443A CN107356336B CN 107356336 B CN107356336 B CN 107356336B CN 201710518443 A CN201710518443 A CN 201710518443A CN 107356336 B CN107356336 B CN 107356336B
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imaging
long wave
wave infrared
interference
light
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CN107356336A (en
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张智杰
余徽
王波
刘兴超
王晨晟
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Huazhong Institute Of Optoelectronic Technology (china Shipbuilding Industry Corp 717 Institute)
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Huazhong Institute Of Optoelectronic Technology (china Shipbuilding Industry Corp 717 Institute)
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/45Interferometric spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
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  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

The invention discloses a kind of small-sized LONG WAVE INFRARED imaging spectrometers, including preposition telephotolens, collimation object microscope group, variable phase filtering system, imaging optical system, LONG WAVE INFRARED focus planar detector, imaging electric component and interference illustration processing module, variable phase filtering system includes stationary mirror, index glass and driving motor, and index glass moves under the driving of driving motor along its normal direction;Also disclose the imaging method of spectrometer;This spectrometer acquires spectral image information while obtaining two dimension target scene infrared radiation signal interference pattern, so that the acquisition rate of spectrum picture is promoted, this spectrometer has stronger shock resistance, smaller volume and weight and more reliable performance relative to traditional interference formula Infrared Imaging Spectrometer.

Description

A kind of small-sized LONG WAVE INFRARED imaging spectrometer and its imaging method
Technical field
The invention belongs to infrared spectroscopy technical field of imaging, and in particular to a kind of small-sized LONG WAVE INFRARED imaging spectrometer and its Imaging method.
Background technique
Infrared Imaging Spectrometer can provide scene image information and spectral information simultaneously, to analyse in depth scene objects Ingredient and characteristic are a kind of important observation, analysis and detection devices.Currently, Infrared Imaging Spectrometer Stealthy Target scout, The fields such as hazardous gas detection, environmental pollution monitoring, resource exploration, maritime search and rescue are widely applied, and light is just gradually become The important growing market in Electrical imaging field.
Compared to common thermal infrared imager, Infrared Imaging Spectrometer increases light splitting part (interferometer, filtering device or color Dissipate device etc.), this also causes its volume and weight to be significantly increased, and limits its scope of application.Especially in LONG WAVE INFRARED range, The resolution ratio of filtering device and Dispersive Devices is lower, and signal energy decaying is serious;And based on traditional Michelson's interferometer Time-modulation light splitting technology there is also volume weights problem larger, with high costs.
In contrast, realize that interference is a kind of scheme of simplification in the way of variable phase filtering, it is preferable providing While spectral resolution, effective control is also can be obtained in volume and weight, be it is current realize miniaturization, EO-1 hyperion LONG WAVE INFRARED at As the possible technique route of spectrometer.
Summary of the invention
It is an object of the present invention to deficiencies according to prior art, provide a kind of small-sized LONG WAVE INFRARED imaging spectrometer And its imaging method, this small-sized LONG WAVE INFRARED imaging spectrometer have the characteristics that small in size, light-weight.
The technical solution adopted by the present invention to solve the technical problems is: a kind of small-sized LONG WAVE INFRARED imaging spectrometer, edge Object space to the component that image space is set gradually include: preposition telephotolens, for by the focus IR radiation Yu Yici image planes of scene; Collimation object microscope group, it is directional light that the light for will transmit through preposition telephotolens, which collimates,;Variable phase filtering system, for transmission The light of preposition telephotolens carries out phase-modulation, generates the different light of two beam phases;Imaging optical system is used for out of phase Two-beam converge on the target surface of LONG WAVE INFRARED focus planar detector;LONG WAVE INFRARED focus planar detector is used for optical signal Be converted to electric signal;Electric component is imaged, for completing the function such as signal amplification, analog-to-digital conversion, nonuniformity correction, bad member rejecting Can, export interference image signal;Interference illustration processing module carries out interference data pretreatment and interference pattern to interference image signal As reconstruct, output spectrum image;The variable phase filtering system by driving motor, under the driving of driving motor along its method The index glass of line direction movement and the stationary mirror composition being connect with index glass.
The second object of the present invention is to provide a kind of imaging method of small-sized LONG WAVE INFRARED imaging spectrometer, including following Step:
A), the infra-red radiation of scene focuses on focal plane behind through preposition telephotolens;
B), the light collimation that collimation object microscope group will transmit through preposition telephotolens is directional light;
C), variable phase filtering system carries out phase-modulation to the light through collimation object microscope group, and it is different to generate two beam phases Light;
D), imaging optical system converges to the two-beam of out of phase on the target surface of LONG WAVE INFRARED focus planar detector;
E), LONG WAVE INFRARED focus planar detector converts optical signals to electric signal;
F), it is dry to complete functions, the outputs such as signal amplification, analog-to-digital conversion, nonuniformity correction, bad member rejecting for imaging electric component Relate to picture signal;
G), interference illustration processing module carries out interference data pretreatment to interference image signal and interference image reconstructs, most Whole output spectrum image data cube.
Further, the phase-modulation in step c) the following steps are included:
C1), driving motor driving index glass is moved along its normal orientation, and mobile step-length is d;
C2), the distance of the every mobile d of index glass, LONG WAVE INFRARED focus planar detector acquire an infrared signal, are imaged electrical group Part then exports the infrared signal of acquisition for interference image, and the mobile whole strokes of index glass, it is dry that imaging electric component continuously exports n frame Relate to image;
C3), interference illustration processing module is pre- by the n frame interference image signal progress interference data that electric component output is imaged Processing and interference image reconstruct, final output spectral image data cube.
The beneficial effects of the present invention are: this imaging spectrometer uses variable phase filtering system, two dimension target field is being obtained Spectral image information is acquired while scape infrared radiation signal interference pattern, so that the acquisition rate of spectrum picture is promoted, phase Stronger shock resistance can have for traditional interference formula Infrared Imaging Spectrometer, smaller volume and weight and more reliable Performance.
Detailed description of the invention
Fig. 1 is the principle of the present invention schematic diagram;
Fig. 2 is the schematic illustration of variable phase filtering system of the present invention.
Each appended drawing reference are as follows: 1-preposition telephotolens, 2-collimation object microscope groups, 3-variable phase filtering systems, 3.1- Index glass, 3.2-stationary mirrors, 3.3-driving motors, 4-imaging optical systems, 5-LONG WAVE INFRARED focus planar detectors, 6-imaging electric components, 7-interference illustration processing modules.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right The present invention is further elaborated.It should be appreciated that described herein, specific examples are only used to explain the present invention, not For limiting the present invention.
Shown in referring to Fig.1, the invention discloses a kind of miniaturization non-brake method LONG WAVE INFRARED imaging spectrometers, including along optical axis Preposition telephotolens 1, collimation object microscope group 2, variable phase filtering system 3, imaging optical system 4 and the non-system that direction is set gradually Cold LONG WAVE INFRARED focus planar detector 5, non-refrigerated infrared focal plane probe is placed between relay lens and image-forming assembly, described Imaging electric component 6 and interference illustration processing module 7 are connected on LONG WAVE INFRARED focus planar detector 5 in turn, referring to Fig. 2 institute Show, the variable phase filtering system 3 is moved by driving motor 3.3, under the driving of driving motor 3.3 along its normal direction Index glass 3.1 and the stationary mirror 3.2 that is connect with index glass 3.1 form.
The function of various components is as described below:
Preposition telephotolens 1: Yu Yici image planes are focused to scene radiation;
Collimation object microscope group 2: the light for will transmit through preposition telephotolens 1 is collimated, its directional light is made;
Variable phase filtering system 3: phase-modulation is carried out to the light through collimation object microscope group 2, generates the two of out of phase Shu Guang;
Imaging optical system 4: interference light is converged on the target surface of LONG WAVE INFRARED focus planar detector 5;
LONG WAVE INFRARED focus planar detector 5: electric signal is converted optical signals to;
Electric component 6 is imaged: it is dry to complete functions, the outputs such as signal amplification, analog-to-digital conversion, nonuniformity correction, bad member rejecting Relate to picture signal;
Interference illustration processing module 7: the interference image signal that imaging electric component 6 is sent is received, it is pre- to complete interference data The functions such as processing, interference image reconstruct, output spectrum image.
The invention also discloses a kind of imaging methods of small-sized LONG WAVE INFRARED imaging spectrometer, comprising the following steps:
A), the light that collimation object microscope group 2 is used to will transmit through preposition telephotolens 1 is collimated, and makes its directional light.
B), 3 pairs of the variable phase filtering system light through collimation object microscope group 2 carries out phase-modulation, generates out of phase Two-beam.
C), 3 pairs of the variable phase filtering system light through collimation object microscope group 2 carries out phase-modulation, generates two beam phases not Same light;
D), the two-beam of out of phase obtained in upper step is converged to LONG WAVE INFRARED focal plane by imaging optical system 4 On the target surface of detector 5.
E), LONG WAVE INFRARED focus planar detector 5 converts optical signals to electric signal;
F), imaging electric component 6 completes the functions such as signal amplification, analog-to-digital conversion, nonuniformity correction, bad member rejecting, output Interference image signal.
G), interference illustration processing module 7 carries out interference data pretreatment to interference image signal and interference image reconstructs, most Whole output spectrum image data cube.
Wherein the phase modulating method is as described below:
C1), driving motor 3.3 drives index glass 3.1 to move along the direction of blue arrow in figure, and mobile step-length is d.
C2), the distance of the every mobile d of index glass 3.1, LONG WAVE INFRARED focus planar detector 5 acquire an infrared signal, imaging electricity Pneumatic module 6 then exports the infrared signal of acquisition for interference image, the mobile whole strokes of index glass 3.1, and imaging electric component 6 is continuous Export n frame interference image.
C3), interference illustration processing module 7 carries out interference data for the n frame interference image signal that electric component 6 exports is imaged Pretreatment and interference image reconstruct, final output spectral image data cube.
It should be understood that for those of ordinary skills, it can be modified or changed according to the above description, And all these modifications and variations should all belong to the protection domain of appended claims of the present invention.

Claims (3)

1. a kind of small-sized LONG WAVE INFRARED imaging spectrometer, it is characterised in that: the component set gradually along object space to image space includes
Preposition telephotolens (1), for by the focus IR radiation Yu Yici image planes of scene;
Collimation object microscope group (2), it is directional light that the light for will transmit through preposition telephotolens (1), which collimates,;
Variable phase filtering system (3) generates two beam phases for carrying out phase-modulation to the light through preposition telephotolens (1) The different light in position;
Imaging optical system (4), for the two-beam of out of phase to be converged to the target surface of LONG WAVE INFRARED focus planar detector (5) On;
LONG WAVE INFRARED focus planar detector (5), for converting optical signals to electric signal;
It is imaged electric component (6), for completing the functions such as signal amplification, analog-to-digital conversion, nonuniformity correction, bad member rejecting, output Interference image signal;
Interference illustration processing module (7) carries out interference data pretreatment to interference image signal and interference image reconstructs, output light Spectrogram picture;
The variable phase filtering system (3) by driving motor (3.3), under the driving of driving motor (3.3) along its normal The index glass (3.1) of direction movement and stationary mirror (3.2) composition being connect with index glass (3.1).
2. a kind of imaging method of small-sized LONG WAVE INFRARED imaging spectrometer as described in claim 1, which is characterized in that including with Lower step:
A), the infra-red radiation of scene focuses on focal plane behind through preposition telephotolens (1);
B), the light collimation that collimation object microscope group (2) will transmit through preposition telephotolens (1) is directional light;
C), variable phase filtering system (3) carries out phase-modulation to the light through collimation object microscope group (2), generates two beam phases not Same light;
D), the two-beam of out of phase is converged to the target surface of LONG WAVE INFRARED focus planar detector (5) by imaging optical system (4) On;
E), LONG WAVE INFRARED focus planar detector (5) converts optical signals to electric signal;
F), it is dry to complete functions, the outputs such as signal amplification, analog-to-digital conversion, nonuniformity correction, bad member rejecting for imaging electric component (6) Relate to picture signal;
G), interference illustration processing module (7) carries out interference data pretreatment to interference image signal and interference image reconstructs, finally Output spectrum image data cube.
3. a kind of imaging method of small-sized LONG WAVE INFRARED imaging spectrometer according to claim 2, which is characterized in that step C) phase-modulation in the following steps are included:
C1), driving motor (3.3) driving index glass (3.1) is moved along its normal orientation;
C2), the distance of the every mobile d of index glass (3.1), LONG WAVE INFRARED focus planar detector (5) acquire an infrared signal, imaging electricity Pneumatic module (6) then exports the infrared signal of acquisition for interference image, the mobile whole strokes of index glass (3.1), imaging electric component (6) n frame interference image is continuously exported.
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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1900667A (en) * 2005-07-23 2007-01-24 中国科学院西安光学精密机械研究所 Imaging method for high stablility interference imaging spectral instrument and spetral instrument for realizing said method
CN204286598U (en) * 2014-06-21 2015-04-22 象山星旗电器科技有限公司 Window sweeps type Fourier transform imaging spectrometer
CN105051484A (en) * 2013-01-07 2015-11-11 斯维尔系统 Spatial splitting-based optical mems interferometers
CN106052870A (en) * 2016-05-23 2016-10-26 湖北久之洋红外系统股份有限公司 High resolution infrared imaging spectrometer and imaging method thereof
CN106197666A (en) * 2016-06-27 2016-12-07 湖北久之洋红外系统股份有限公司 Miniaturization non refrigerating infrared imaging spectrogrph and method
CN106525241A (en) * 2016-10-26 2017-03-22 北京雪迪龙科技股份有限公司 Interferometer and spectrograph

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1900667A (en) * 2005-07-23 2007-01-24 中国科学院西安光学精密机械研究所 Imaging method for high stablility interference imaging spectral instrument and spetral instrument for realizing said method
CN105051484A (en) * 2013-01-07 2015-11-11 斯维尔系统 Spatial splitting-based optical mems interferometers
CN204286598U (en) * 2014-06-21 2015-04-22 象山星旗电器科技有限公司 Window sweeps type Fourier transform imaging spectrometer
CN106052870A (en) * 2016-05-23 2016-10-26 湖北久之洋红外系统股份有限公司 High resolution infrared imaging spectrometer and imaging method thereof
CN106197666A (en) * 2016-06-27 2016-12-07 湖北久之洋红外系统股份有限公司 Miniaturization non refrigerating infrared imaging spectrogrph and method
CN106525241A (en) * 2016-10-26 2017-03-22 北京雪迪龙科技股份有限公司 Interferometer and spectrograph

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