CN107300650B - Intermittent life test system and method - Google Patents
Intermittent life test system and method Download PDFInfo
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- CN107300650B CN107300650B CN201710506566.5A CN201710506566A CN107300650B CN 107300650 B CN107300650 B CN 107300650B CN 201710506566 A CN201710506566 A CN 201710506566A CN 107300650 B CN107300650 B CN 107300650B
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Abstract
The invention discloses an intermittent life test system and method, and relates to the field of product reliability tests. The test system includes: the device comprises an input module, a controller module, a display module and a relay output module; the controller module is connected with the relay output module and used for setting test parameters according to the user input acquired by the input module and sending an interrupt signal according to the test parameters; the relay output module is connected with the test power supply and used for outputting an interrupt signal to the test power supply so as to control the on-off of the test power supply. The corresponding test method comprises: acquiring user input to set test parameters; executing a test according to the test parameters selected by the user and generating an interrupt signal; controlling the on-off of the test power supply through the interrupt signal; and displaying the test parameters. The invention can flexibly set the test flow according to the test requirement, has high control precision on time, can visually see the test state, has strong system stability, can be compatible with the tests of various products and has lower cost.
Description
Technical Field
The invention relates to the technical field of product reliability tests, in particular to an intermittent life test system and method.
Background
The intermittent life test is to apply stress to the circuit intermittently, so that the device is subjected to periodic variation of electrical stress between 'on' and 'off' to accelerate the internal physical and chemical reaction process of the circuit, and the periodic variation of the electrical stress causes periodic variation of the temperature of the device and the shell, and finally the typical failure rate of the microelectronic device is measured or the quality or reliability of the device is verified. GJB360 and GJB548 have definite regulations on the intermittent life tests of the existing electronic components and microelectronic devices. The intermittent life test method is characterized in that a 'time switch' is connected between a test device and a power supply in series to regularly and discontinuously apply stress to the test device so as to achieve the purpose of test.
An existing intermittent life test system can be built through a relay, and the hardware system has the following problems: in the intermittent life test, the effective accumulation of time is the first factor, and due to the time precision problem of the charging and discharging control of a hardware relay or a capacitor, the time error is serious after long-time use. For multi-section power on and off logic, an experimental system built by using a hardware relay is poor in universality; after the test is interrupted, if the test needs to be executed from a certain section in the middle, the test is also inconvenient to execute; the test of a certain cycle number is difficult to realize through a time relay; if the test scheme is adjusted in the test, the hardware circuit needs to be built again. The other method is controlled by a programmable power supply, but the programmable power supply has the problems of high cost, fixed voltage and current range, insufficient use stability and convenience and the like. During the test, if the test conditions are changed, reprogramming is needed, which is inconvenient for ordinary test operators.
Disclosure of Invention
The invention aims to provide an intermittent life test system and method, which can perform intermittent life test on electronic components, and has high test time precision and low hardware cost.
In order to achieve the purpose, the invention adopts the following technical scheme:
in one aspect, the present invention provides an intermittent life test system, comprising: the device comprises an input module, a controller module, a display module and a relay output module;
the input module is connected with the controller module and used for acquiring user input;
the controller module is connected with the relay output module and used for setting test parameters according to the user input and sending an interrupt signal according to the test parameters;
the relay output module is connected with a test power supply and used for outputting the interrupt signal to the test power supply so as to control the on-off of the test power supply;
the display module is connected with the controller module and used for displaying the test parameters.
Wherein the relay output module includes: an NPN type triode and a relay;
the base electrode of the NPN type triode is connected with the controller module through a resistor, the collector electrode of the NPN type triode is connected with the coil of the relay, and the NPN type triode is used for realizing on-off according to the interrupt signal output by the controller module so as to control on-off of the relay;
and the contact of the relay is connected with the test power supply and used for controlling the on-off of the test power supply.
Further, the relay output module further includes: a switching diode;
and the anode of the switch diode is connected with the collector of the NPN type triode, and the cathode of the switch diode is respectively connected with one end of the coil of the relay and a working power supply.
Wherein the controller module is an 8051 series singlechip; the input module is a keyboard.
Wherein the test parameters include: the total number of the sections, the current section number, the power on/off state of the current section number, the cycle number of the current section number and the power on/off time of the current section number.
On the other hand, the invention provides an intermittent life test method, which is executed by adopting the intermittent life test system; the method comprises the following steps:
acquiring user input to set test parameters;
executing a test according to the test parameters selected by the user and generating an interrupt signal;
controlling the on-off of the test power supply through the interrupt signal;
and displaying the test parameters.
Wherein, acquire user input in order to set up experimental parameters, include:
acquiring user input, and setting the test parameters comprises: the total number of the sections, the current section number, the power-on and power-off state of the current section number, the cycle number of the current section number and the power-on time of the current section number.
Wherein, executing the test according to the test parameters selected by the user and generating the interrupt signal comprises:
acquiring the power-on and power-off state of the corresponding current segment number and the power-on and power-off time of the current segment number according to the current segment number selected by a user;
entering the power-on and power-off state and timing;
and if the timing reaches the power-on and power-off time, generating an interrupt signal.
Wherein, if the timing reaches the power-on and power-off time, after generating the interrupt signal, the method further comprises:
acquiring the time delay from generation to execution of the interrupt signal;
acquiring a machine cycle occupied by updating the power-on and power-off time;
calculating the sum of the power-on and power-off time, the time delay and the machine period for executing the updating as correction time;
and updating the power-on and power-off time as the correction time.
Wherein, carry out the experiment and produce the interrupt signal according to the said experimental parameter that the user chooses, also include:
executing the test of the current segment number according to the cycle number;
and sequentially and circularly executing the tests of all the segment numbers according to the total segment number.
The invention has the beneficial effects that:
according to the intermittent service life testing system, the testing process can be flexibly set according to the testing requirement and the input of a user through the input and output equipment, the controller and the relay, the corresponding interrupt signal is generated, and the relay circuit controls the testing power supply to test the test sample. The system architecture adopted by the invention has high time control accuracy, is convenient to operate, can visually see the test state, has strong system stability, can be compatible with the experiments of various products, and has lower cost.
Drawings
FIG. 1 is a schematic structural diagram of an intermittent life testing system according to an embodiment of the present invention;
fig. 2 is a schematic circuit diagram of an output module of a relay according to an embodiment of the present invention;
fig. 3 is a flowchart of an intermittent life test method according to a second embodiment of the present invention.
Detailed Description
In order to make the technical problems solved, technical solutions adopted and technical effects achieved by the present invention clearer, the technical solutions of the embodiments of the present invention will be described in further detail below with reference to the accompanying drawings, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments.
Example one
The embodiment provides an intermittent life test system, which is used for carrying out intermittent life tests on electronic components and the like and accords with the current reliability test standard.
Fig. 1 is a schematic structural diagram of an intermittent life test system according to an embodiment of the present invention. As shown in fig. 1, the assay system 10 includes: an input module 11, a controller module 12, a display module 13 and a relay output module 14.
The input module 11 is connected with the controller module 12 and is used for acquiring user input; in this embodiment, the input module 11 is a keyboard, and in other embodiments, the input module may also be an input device such as a touch screen and a mouse. The keyboard comprises numeric keys 0-9 and function keys: set, start, stop, reset, etc.
The controller module 12 is connected to the relay output module 14, and is configured to set a test parameter according to the user input, and send an interrupt signal according to the test parameter; the controller module 12 is an 8051 series single chip microcomputer, and in this embodiment, an STC12 series single chip microcomputer from STC corporation is preferred.
The controller module 12 uses a high-performance STC12 series single chip microcomputer, the highest frequency can reach 320MHz, microsecond-level square wave output can be realized, and the accurate test requirements of some specific components can be met. In contrast, the accuracy of the programmable power supply can be controlled only in 0.1 second, which is far less than the time accuracy of the present embodiment.
Wherein the test parameters include: the total number of the sections, the current section number, the power on/off state of the current section number, the cycle number of the current section number and the power on/off time of the current section number.
Test parameters are directly input through input equipment, and the setting is convenient and visual. The test can be executed from any section, and the test meets the requirement of reliability test interrupt recovery (GJB 899). The device is suitable for the requirements of a test site and is convenient for a tester to master; programmable power supplies require the computer to modify the program.
The controller module 12 includes a timer and a register. Storing power-on and power-off time in a register, after starting a timer, according to the power-on and power-off time, the register automatically adds 1 in the beat of one machine period until an overflow signal is generated, the register is cleared, after an interrupt signal is generated, according to test parameters, the power-on and power-off state is changed, then according to the number of the next test segment, the register is assigned, new power-on and power-off time is set, the timer is started, and the process is circulated until the test is finished.
The relay output module 14 is connected to a test power supply 20, and is configured to output the interrupt signal to the test power supply 20 to control on/off of the test power supply 20. The test power supply 20 is connected to the test specimen 30.
Fig. 2 is a schematic circuit diagram of an output module of a relay according to an embodiment of the present invention. As shown in fig. 2, the relay output module 14 includes: an NPN transistor Q1 and a relay K1.
The base electrode of the NPN type triode Q1 is connected with the controller module 12 through a resistor, the collector electrode of the NPN type triode Q1 is connected with the coil of the relay K1, and the NPN type triode Q1 is used for realizing on-off according to the interrupt signal output by the controller module 12 so as to control on-off of the relay K1; the contact of the relay K1 is connected with the test power supply 20 and is used for controlling the on-off of the test power supply 20.
The relay K1 can be flexibly configured according to the current size (such as configuring a 30A relay), and in addition, a direct current stabilized power supply with the required size can be configured as the working power supply. The cost of the test system is lower and lower along with the increase of the number of sets, and the test system completely meets the laboratory requirement of performing reliability intermittent service life assessment on a large batch of products; moreover, the reusability of the direct current stabilized power supply can be realized by matching one direct current stabilized power supply with a plurality of sets of test systems under the condition of enough current and voltage. Therefore, the scheme has excellent market application value for performing intermittent life tests on large batches of products in laboratories or manufacturers.
Further, the relay output module 14 further includes: a switching diode D1; the positive electrode of the switching diode D1 is connected with the collector of the NPN type triode Q1, and the negative electrode of the switching diode D1 is respectively connected with one end of the coil of the relay K1 and a working power supply VCC. The switching diode D1 is capable of maintaining good unidirectional conductivity at high frequencies.
The display module 13 is connected to the controller module 12, and is configured to display the test parameters, and a general display is adopted.
The test system of the present embodiment is advantageous in avoiding erroneous operation so that the entire test results in irreparable loss. Meanwhile, the experimenter can monitor the current test stage through the display screen at any time. The displays meet the requirements of intuitive and convenient monitoring in reliability test regulations, and have better feasibility and popularization.
Example two
The embodiment provides an intermittent life test method, which is implemented by adopting the intermittent life test system; the test device is used for carrying out intermittent service life tests on electronic components and the like, and accords with the current reliability test standard.
Fig. 3 is a flowchart of an intermittent life test method according to a second embodiment of the present invention. As shown in fig. 3, the method comprises the steps of:
s21, user input is obtained to set the test parameters.
Acquiring user input, and setting the test parameters according to the test requirements comprises the following steps: the total number of the sections, the current section number, the power-on and power-off state of the current section number, the cycle number of the current section number and the power-on time of the current section number.
After the initial setting is completed, the segment number to be started to be executed is selected as the current segment number, and the test is started.
And S22, executing the test according to the test parameters selected by the user and generating an interrupt signal.
Acquiring the power-on and power-off state of the corresponding current segment number and the power-on and power-off time of the current segment number according to the current segment number selected by a user; assigning the power-on and power-off time to a register of a controller, entering the power-on and power-off state and timing by a timer; and if the timing reaches the power-on and power-off time and the register overflows, generating an interrupt signal.
After the interrupt signal is generated, if the controller module executes other tasks at the moment, the controller module needs to wait until the execution is finished and then can respond to the interrupt signal, at the moment, the timer is always in a working state, and if the time is ignored, the delayed time occupies the next power on/off time, so that the power on/off time in the subsequent test is insufficient, and a large time error can be caused by long-term accumulation to influence the test result. Therefore, the delay from generation to execution of the interrupt signal should be acquired at this time.
And, assigning a value to the register also requires a certain operation time, and the controller obtains a machine cycle occupied by updating the power-on and power-off time according to a machine cycle in which the controller can execute an assignment statement.
Calculating the sum of the power-on and power-off time, the time delay and the machine period for executing the updating as correction time; and updating the power-on and power-off time as the correction time, and assigning the power-on and power-off time of the next cycle of the current segment number or the test of the next segment number as the correction time. When the timer counts that the register overflows, the actual power-on and power-off time is the same as the originally set power-on and power-off time.
The operation can avoid the influence of accumulated errors generated after long-time timing, so that the time control is more accurate.
The method for correcting the power-on and power-off time specifically comprises the following steps:
1. after the timer generates the interrupt signal, closing the total interrupt and the timer interrupt, namely before the interrupt signal is executed, no new interrupt signal is generated;
2. reading the current value in the register as the time delay when the controller responds to the interrupt signal;
3. adding the time delay and the machine period of the assignment statement to obtain a dynamic compensation value;
4. assigning the initial value of the dynamic compensation value plus the power-on and power-off time to a register;
5. starting the total interrupt and the timer interrupt, and continuing to start timing.
Wherein, step S22 further includes:
executing the test of the current segment number according to the cycle number; and sequentially and circularly executing the tests of all the segment numbers according to the total segment number.
And S23, controlling the on-off of the test power supply through the interrupt signal.
And controlling the test power supply to keep a corresponding state according to the power-on and power-off state of the current segment number. For example, if the test requires that the current segment number is electrified for 30 seconds, the test power supply is controlled to start timing after being electrified, and the electrification is stopped when an interrupt signal is received after 30 seconds.
And S24, displaying the test parameters.
And displaying the total number of the sections, the current section number, the power-on and power-off state of the current section number, the cycle number of the current section number, the power-on time of the current section number and the like on a display device.
According to the method, a dynamic time compensation method is designed according to the characteristic of executing instructions by a timer in a controller, the influence of accumulated errors generated after the timing time is long is avoided, and the most important requirement of stress application in a reliability test, namely stress accuracy, is met.
The technical principle of the present invention is described above in connection with specific embodiments. The description is made for the purpose of illustrating the principles of the invention and should not be construed in any way as limiting the scope of the invention. Based on the explanations herein, those skilled in the art will be able to conceive of other embodiments of the present invention without inventive effort, which would fall within the scope of the present invention.
Claims (2)
1. An intermittent life test method is characterized in that: the method is implemented by adopting an intermittent life test system;
wherein, the intermittent life test system includes: the device comprises an input module, a controller module, a display module and a relay output module;
the input module is connected with the controller module and used for acquiring user input;
the controller module is connected with the relay output module and used for setting test parameters according to the user input and sending an interrupt signal according to the test parameters; wherein the test parameters include: the total number of the sections, the current section number, the power on/off state of the current section number, the cycle number of the current section number and the power on/off time of the current section number;
the controller module comprises a timer and a register, the on-off time is stored in the register, after the timer is started, the register is self-added with 1 according to the on-off time in the beat of one machine period until an overflow signal is generated, the register is reset, after an interrupt signal is generated, the on-off state is changed according to test parameters, then the register is assigned with a value according to the number of a next test section, new on-off time is set, the timer is started, and the process is circulated until the test is finished;
the relay output module includes: NPN type triode, relay and switching diode;
the base electrode of the NPN type triode is connected with the controller module through a resistor, the collector electrode of the NPN type triode is connected with the coil of the relay, and the NPN type triode is used for realizing on-off according to the interrupt signal output by the controller module so as to control on-off of the relay;
the contact of the relay is connected with a test power supply and used for outputting the interrupt signal to the test power supply so as to control the on-off of the test power supply; wherein the relay is configured according to the current magnitude;
the positive electrode of the switch diode is connected with the collector electrode of the NPN type triode, and the negative electrode of the switch diode is respectively connected with one end of the coil of the relay and a working power supply; wherein, the working power supply is a direct current stabilized voltage supply;
the display module is connected with the controller module and is used for displaying the test parameters;
obtaining user input to set trial parameters, the trial parameters including: the total number of the sections, the current section number, the power-on and power-off state of the current section number, the cycle number of the current section number and the power-on time of the current section number;
executing a test according to the test parameters selected by the user and generating an interrupt signal: acquiring the power-on and power-off state of the corresponding current segment number and the power-on and power-off time of the current segment number according to the current segment number selected by a user; entering the power-on and power-off state and timing; if the timing reaches the power-on and power-off time, generating an interrupt signal; executing the test of the current segment number according to the cycle number; sequentially and circularly executing the tests of all the segment numbers according to the total segment number;
closing the total interrupt and the timer interrupt, and controlling the on-off of the test power supply through the interrupt signal;
acquiring the time delay from generation to execution of the interrupt signal while the controller responds to the interrupt signal;
acquiring a machine cycle occupied by updating the power-on and power-off time;
calculating the sum of the power-on and power-off time, the time delay and the machine period for executing the updating as correction time;
updating the power-on and power-off time as the correction time, and giving the correction time to a register;
starting total interruption and timer interruption, and continuing to start timing;
and displaying the test parameters.
2. The intermittent life test method according to claim 1, characterized in that:
the controller module is an 8051 series single chip microcomputer; the input module is a keyboard.
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| CN108051724A (en) * | 2018-01-09 | 2018-05-18 | 深圳市振华微电子有限公司 | Power module discontinuous operation service life experiment system and method |
| CN109709875B (en) * | 2019-01-24 | 2024-06-11 | 宁波赛宝信息产业技术研究院有限公司 | Intelligent power-on and power-off control device |
| CN110531735B (en) * | 2019-08-07 | 2022-08-05 | 广东科鉴检测工程技术有限公司 | Reliability index assessment method for instrument electric control system |
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| CN103353564A (en) * | 2013-07-08 | 2013-10-16 | 工业和信息化部电子第五研究所 | Intermittent life testing device |
| CN103955151A (en) * | 2014-01-27 | 2014-07-30 | 工业和信息化部电子第五研究所华东分所 | Power up and power outage system specially used for sample testing and realization method thereof |
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| CN104502827B (en) * | 2014-12-17 | 2017-09-05 | 工业和信息化部电子第五研究所 | Power device timed manner intermittent life experimental condition is determined and test method |
| CN105701350B (en) * | 2016-01-13 | 2018-09-18 | 安徽理工大学 | Intermittent work Switching Power Supply method for predicting residual useful life |
| CN106443483B (en) * | 2016-11-07 | 2019-07-16 | 成都雅骏新能源汽车科技股份有限公司 | A kind of pulse cycle life testing method of nickel-metal hydride battery for electric vehicle |
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| CN103353564A (en) * | 2013-07-08 | 2013-10-16 | 工业和信息化部电子第五研究所 | Intermittent life testing device |
| CN104569711A (en) * | 2013-10-22 | 2015-04-29 | 珠海格力电器股份有限公司 | Method and testing device for electronic component open/short circuit test |
| CN103955151A (en) * | 2014-01-27 | 2014-07-30 | 工业和信息化部电子第五研究所华东分所 | Power up and power outage system specially used for sample testing and realization method thereof |
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