CN107290377B - Sample tray positioning device of total reflection X fluorescence spectrometer - Google Patents
Sample tray positioning device of total reflection X fluorescence spectrometer Download PDFInfo
- Publication number
- CN107290377B CN107290377B CN201710530862.9A CN201710530862A CN107290377B CN 107290377 B CN107290377 B CN 107290377B CN 201710530862 A CN201710530862 A CN 201710530862A CN 107290377 B CN107290377 B CN 107290377B
- Authority
- CN
- China
- Prior art keywords
- sample
- sample tray
- positioning device
- frame
- total reflection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention relates to a sample tray positioning device of a total reflection X-ray fluorescence spectrometer, which comprises a sample tray frame positioned below a detector, wherein the bottom surface of the sample tray frame can be horizontally pulled, a sample tray is horizontally arranged on the bottom surface of the sample tray frame, a pressing device is arranged below the bottom surface of the sample tray frame, and horizontal positioning devices are arranged on side frames on two sides of the sample tray frame. The invention solves the problems of sample loading and sample positioning of the total reflection X-ray fluorescent instrument of the horizontal sample loading system, and the positioning device does not influence the incident light and the emergent light.
Description
Technical Field
The invention belongs to the design of total reflection X fluorescence spectrometers, and particularly relates to a sample tray positioning device of a total reflection X fluorescence spectrometer.
Background
The total reflection X-ray fluorescence spectrometer (TXRF) has a series of outstanding advantages of high sensitivity (pg-ng), small sample dosage (ng-mug, including micron-sized dust sample), accurate quantification, no need of digestion of the sample, direct and simultaneous multi-element analysis, and the like. TXRF is small in size and can be brought to a sampling site, and Pb, S, as and other elements which cannot be analyzed by neutron activation (NAA) can be analyzed.
TXRF is different from the common ED-XRF in that through cutting the reflector, when the X-ray is totally reflected, the intensity of the incident X-ray is equal to that of the emergent X-ray, so that the coherent and incoherent scattering phenomena of the primary X-ray on the reflector are eliminated, the scattering background is reduced by 3 orders of magnitude, and the peak-to-back ratio is greatly improved. TXRF is a high-new analysis technology for realizing trace element analysis by using the principle of total reflection of X rays to coat a sample into a thin layer on a reflector and a sample frame for excitation so as to reduce the scattering background and improve the peak-to-back ratio.
The TXRF sample holder is positioned directly below the detector for carrying the sample tray, and the second total reflection should occur in the middle of the surface of the sample tray. The total reflection angle of the Mo target X-ray fluorescence is 0.1 degree, and the tiny position change can cause great error, so the precision requirements on the sample frame and the positioning device are strict.
The sample tray of the TXRF instrument of Bruce is vertically arranged, the fixed sample tray adopts a clamping piece type fixing mode, the sample rack is pulled out, the sample rack is sent into for measurement after sample loading, and the sample loading mode has difficulty in measuring the solid dust particle sample.
For the horizontal sample loading system, the clamping type sample rack and positioning are not suitable, the sample rack is mounted on the surface of a sample tray, the incident light can be influenced on the incident light direction and two sides of the sample rack, the sample is mounted on the emergent light direction, the sample is put in and taken out, and the instrument debugging is inconvenient.
Disclosure of Invention
The invention aims to solve the problems in the prior art and provides a sample tray positioning device of a total reflection X-ray fluorescence spectrometer suitable for a horizontal sample loading system, which is convenient for debugging and loading and positioning of a sample.
The technical scheme of the invention is as follows: the utility model provides a sample dish positioner of total reflection X fluorescence spectrometer, includes the sample dish frame that is located the detector below, and the bottom surface of sample dish frame can the horizontal pull, and the sample dish level sets up on the bottom surface of sample dish frame, is equipped with closing device in the below of sample dish frame bottom surface, is equipped with horizontal positioner on the frame of sample dish frame both sides.
Further, the sample tray positioning device of the total reflection X fluorescence spectrometer comprises a pressing plate obliquely arranged and a lifting shaft connected with the end part of the pressing plate, wherein the upper end of the lifting shaft is connected with a spring, the top end of the spring is provided with a steel ball, when the sample tray is positioned at a measuring position, one side of the pressing plate of the pressing device is pressed down through the bottom surface of the sample tray frame, and the steel ball is jacked up by the lifting shaft at the end part of the other side of the pressing plate to press the sample tray.
Further, according to the sample tray positioning device of the total reflection X-ray fluorescence spectrometer, the pressing plate can rotate around the cylindrical pin, and the reset spring is connected below one end of the pressing plate, provided with the lifting shaft.
Further, the sample tray positioning device of the total reflection X-ray fluorescence spectrometer comprises flanges positioned on two side frames of the sample tray frame, wherein positioning top beads are arranged on the flanges, and the positioning top beads are propped against the edges of the sample tray.
The beneficial effects of the invention are as follows: the sample tray positioning device of the total reflection X-ray fluorescence spectrometer provided by the invention adopts a drawing top type, and is different from a sample rack of a Bruce TXRF (X-ray fluorescence) instrument. The sample tray fixing structure of the device is convenient for loading and laying out samples and fixing the samples in place. The sample tray frame is horizontally pulled out, so that the sample can be put in and taken out. The positioning point of the sample disk is positioned at the edge of the sample disk, so that incident light and emergent light are not influenced, the instrument is convenient to debug and hold samples and position, and the measurement is not influenced on solid dust particle samples. The invention solves the problems of sample loading and sample positioning of the total reflection X-ray fluorescent instrument of the horizontal sample loading system, and has simple structure operation and fixed position.
Drawings
FIG. 1 is a schematic diagram of a sample tray positioning device of a total reflection X-ray fluorescence spectrometer of the present invention;
FIG. 2 is a mechanical block diagram of a sample tray positioning device;
FIG. 3 is a top view of the sample tray positioning device;
fig. 4 is a schematic diagram of the structure of the sample tray positioning device in different positions.
In the figure, 1, a detector 2, a sample tray 3, a sample tray frame 4, a pressing plate 5, a pressing piece 6, a flange 7, a positioning top bead 8, a cylindrical pin 9, a reset spring 10 and a lifting shaft
Detailed Description
The present invention will be described in detail with reference to the accompanying drawings and examples.
As shown in fig. 1, the sample tray positioning device of the total reflection X fluorescence spectrometer provided by the invention comprises a sample tray frame 3 positioned below a detector 1, wherein the bottom surface of the sample tray frame 3 can be horizontally pulled, a sample tray 2 is horizontally arranged on the bottom surface of the sample tray frame 3, a pressing device is arranged below the bottom surface of the sample tray frame, the pressing device comprises a pressing plate 4 obliquely arranged and a pressing piece 5 positioned at the end part of the pressing plate, and horizontal positioning devices are arranged on side frames at two sides of the sample tray frame.
As a specific example, the structure of the pressing device is shown in fig. 2, the pressing device includes a pressing plate 4 that is obliquely arranged, a lifting shaft 10 is connected above one end of the pressing plate, a spring is connected to the upper end of the lifting shaft 10, a steel ball is arranged at the top end of the spring, and the lifting shaft, the spring and the steel ball form an implementation mode of the pressing member 5. The pressing plate 4 can rotate by taking the cylindrical pin 8 as a center, and a reset spring 9 is connected below one end of the pressing plate 4 provided with the lifting shaft. When the sample tray 2 is at the measuring position (i.e. located right below the detector 1), one side of the pressing plate 4 of the pressing device is pressed down through the bottom surface of the sample tray frame 3, the pressing plate 4 rotates around the cylindrical pin 8, so that the lifting shaft 10 at the end part of the other side of the pressing plate moves upwards, and the lifting shaft 10 jacks up the steel balls through the springs, so that the sample tray 2 is pressed by the steel balls.
Because the reset spring 9 is connected below one end of the pressing plate 4 connected with the lifting shaft, when the sample tray 2 is pulled out along with the sample tray frame 3, the bottom surface of the sample tray frame 3 is separated from the pressing plate 4, and one end of the pressing plate 4 connected with the lifting shaft is pulled down by the reset spring 9, so that the lifting shaft 10 moves downwards along with the pressing plate 4. The downward movement of the lifting shaft 10 releases the pressing force of the top spring to the steel balls, so that the sample tray 2 can be pulled outwards along with the sample tray frame 3.
As shown in fig. 3, the horizontal positioning device comprises flanges 6 positioned on two side frames of the sample tray frame 3, positioning top beads 7 are arranged on the flanges 6, and the positioning top beads 7 are propped against the edge of the sample tray 2. In this embodiment, two positioning top beads are provided on one side flange, and one positioning top bead is provided on the other side flange.
In loading the sample, the bottom surface of the sample tray is pulled out, and the sample tray 2 is placed on the surface of the sample tray 3 in the state A shown in FIG. 4; then the sample tray 3 is sent back, the pressing plate 4 is pressed down when the sample tray 3 is pushed back to the position, and the pressing piece 5 at the end part of the pressing plate is jacked up to press the sample tray 2, as shown in the state B in fig. 4; the horizontal position of the sample tray 2 is ensured by the positioning of the top bead on the flange 6, as shown in the C-state of fig. 4.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
Claims (3)
1. A sample tray positioning device of a total reflection X-ray fluorescence spectrometer, which is characterized in that: including sample dish frame (3) that are located detector (1) below, the bottom surface of sample dish frame (3) can the horizontal pull, sample dish (2) level sets up on the bottom surface of sample dish frame (3), is equipped with closing device in the below of sample dish frame (3) bottom surface, is equipped with horizontal positioning device on sample dish frame (3) both sides frame, closing device including clamp plate (4) and lifting shaft (10) with clamp plate end connection that the slope set up, the upper end of lifting shaft (10) is connected with the spring, the top of spring is equipped with the steel ball, when sample dish is in measuring position, pushes down through the bottom surface of sample dish frame (3) closing device's clamp plate (4) one side makes lifting shaft (10) upward movement jack-up of clamp plate (4) opposite side tip steel ball to compress tightly sample dish (2).
2. The sample tray positioning device of the total reflection X-ray fluorescence spectrometer of claim 1, wherein: the pressing plate (4) can rotate by taking the cylindrical pin (8) as a center, and a reset spring (9) is connected below one end of the pressing plate (4) provided with the lifting shaft (10).
3. The sample tray positioning device of a total reflection X-ray fluorescence spectrometer of claim 1 or 2, wherein: the horizontal positioning device comprises flanges (6) positioned on the side frames at two sides of the sample tray frame (3), positioning top beads (7) are arranged on the flanges (6), and the positioning top beads (7) are propped against the edges of the sample tray (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710530862.9A CN107290377B (en) | 2017-06-30 | 2017-06-30 | Sample tray positioning device of total reflection X fluorescence spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710530862.9A CN107290377B (en) | 2017-06-30 | 2017-06-30 | Sample tray positioning device of total reflection X fluorescence spectrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107290377A CN107290377A (en) | 2017-10-24 |
| CN107290377B true CN107290377B (en) | 2023-08-18 |
Family
ID=60099678
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710530862.9A Active CN107290377B (en) | 2017-06-30 | 2017-06-30 | Sample tray positioning device of total reflection X fluorescence spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107290377B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111751393B (en) * | 2019-03-27 | 2023-09-19 | 中国石油化工股份有限公司 | XRD clay test dress appearance device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202631742U (en) * | 2012-06-14 | 2012-12-26 | 中国人民解放军防化学院 | Sample chamber for testing radioactive samples |
| CN202757897U (en) * | 2012-07-02 | 2013-02-27 | 谢元军 | Movement of x-ray fluorescence (XRF) device for detecting powder samples |
| CN103472164A (en) * | 2012-06-06 | 2013-12-25 | 北京普源精电科技有限公司 | Sample disc structure of autosampler |
| CN103472081A (en) * | 2013-09-27 | 2013-12-25 | 四川新先达测控技术有限公司 | Automatic energy dispersive X-ray fluorescence analysis test platform |
| CN206906284U (en) * | 2017-06-30 | 2018-01-19 | 中国原子能科学研究院 | A kind of sample disc positioner of full-reflection X XRF |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6865926B2 (en) * | 2000-01-25 | 2005-03-15 | State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Portland State University | Method and apparatus for sample analysis |
-
2017
- 2017-06-30 CN CN201710530862.9A patent/CN107290377B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103472164A (en) * | 2012-06-06 | 2013-12-25 | 北京普源精电科技有限公司 | Sample disc structure of autosampler |
| CN202631742U (en) * | 2012-06-14 | 2012-12-26 | 中国人民解放军防化学院 | Sample chamber for testing radioactive samples |
| CN202757897U (en) * | 2012-07-02 | 2013-02-27 | 谢元军 | Movement of x-ray fluorescence (XRF) device for detecting powder samples |
| CN103472081A (en) * | 2013-09-27 | 2013-12-25 | 四川新先达测控技术有限公司 | Automatic energy dispersive X-ray fluorescence analysis test platform |
| CN206906284U (en) * | 2017-06-30 | 2018-01-19 | 中国原子能科学研究院 | A kind of sample disc positioner of full-reflection X XRF |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107290377A (en) | 2017-10-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107290377B (en) | Sample tray positioning device of total reflection X fluorescence spectrometer | |
| CN204101456U (en) | A kind of optical detection apparatus of applicable automatic clinical chemistry analyzer | |
| CN203385720U (en) | Test paper box for immunity detector | |
| CN207528662U (en) | EBSD test sample platforms | |
| CN206906284U (en) | A kind of sample disc positioner of full-reflection X XRF | |
| CN209878194U (en) | Elasticity detection device | |
| CN201859857U (en) | Silicon wafer level image sensor test device adopting a LED backlight board and a parallel light barrel | |
| JP5806756B2 (en) | Portable hand press for XRF measurement sample preparation | |
| CN108181216B (en) | Beta ray smoke tester | |
| CN207456747U (en) | A kind of lens of car light solar light focusing point detection device | |
| CN201724653U (en) | Surface profiler testing platform device of wire wheel | |
| CN213337279U (en) | Adhesive strength detector calibrating device | |
| CN210953879U (en) | Accelerator neutron activation sample calibration device | |
| CN210954052U (en) | Shadow removing device for immunochromatography detection | |
| CN102954899A (en) | Clamp used for drilling cuttings sample of irregular sample | |
| CN208313732U (en) | A kind of curved test macro of list | |
| CN209102916U (en) | For accurately measuring the device of phosphorus screen Imaged samples activity | |
| CN207408735U (en) | A kind of detection device and camera module detection device | |
| CN208568575U (en) | A kind of Fourier transform infrared spectrometer sample holder | |
| CN207816826U (en) | A kind of detector reagent card chucking mechanism | |
| CN110441534A (en) | Glycosylated hemoglobin detector | |
| CN201058034Y (en) | Apparatus for detecting X-ray bulb tube focus performance | |
| CN210005422U (en) | sampling device for portable Raman spectrum test | |
| CN209263904U (en) | One kind being used for spherical surface photomultiplier tube film thickness test device | |
| CN221317354U (en) | Kit for antibody based on capillary protein electrophoresis technology |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |