CN107290377A - A kind of sample disc positioner of full-reflection X XRF - Google Patents
A kind of sample disc positioner of full-reflection X XRF Download PDFInfo
- Publication number
- CN107290377A CN107290377A CN201710530862.9A CN201710530862A CN107290377A CN 107290377 A CN107290377 A CN 107290377A CN 201710530862 A CN201710530862 A CN 201710530862A CN 107290377 A CN107290377 A CN 107290377A
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- CN
- China
- Prior art keywords
- sample
- plate rail
- sample disc
- reflection
- xrf
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Abstract
The present invention relates to a kind of sample disc positioner of full-reflection X XRF, including the sample plate rail below detector, the bottom surface of sample plate rail being capable of horizontal pulling, sample disc is horizontally placed on the bottom surface of sample plate rail, pressing device is provided with the lower section of sample plate rail bottom surface, horizontal positioning device is provided with the frame of sample plate rail both sides.The present invention solves the problems, such as the dress sample and Sample location of the total reflection X ray fluorescence instrument of level dress sample system, and positioner does not influence incident and emergent light, and the structure operation is simple, and position is fixed.
Description
Technical field
The invention belongs to the design of full-reflection X XRF, and in particular to a kind of sample of full-reflection X XRF
Disk positioner.
Background technology
Full-reflection X XRF (TXRF) has sensitivity high (pg-ng), amount of samples few (ng- μ g, including micron
Level micronic dust sample), quantitative accurate, sample is without digestion, you can directly and a series of outstanding advantages such as Simultaneous multi element analysis.
TXRF small volumes, can take sampling scene to, can analyze the elements such as neutron activation (NAA) unanalyzable Pb, S, As.
TXRF is by cutting reflector with common ED-XRF differences, when X-ray is totally reflected, incident
X-ray and the intensity of emergent ray are equal, eliminate relevant and incoherent scattering phenomenon of the simple X-ray on reflector, make to dissipate
Penetrate background and reduce 3 multiple order of magnitude, so as to substantially increase peak back of the body ratio.TXRF is exactly using X-ray total reflection principle, by sample
Product apply straticulation on reflector and specimen holder and excited, and reach reduction scattering background, peak back of the body ratio are improved, to realize trace member
One high-new analytical technology of element analysis.
The position of TXRF specimen holders is located at immediately below detector, for carrying sample disc, and second of total reflection should occur
In sample disc surface middle part.It it is 0.1 degree to Mo targets XRF total reflection angle, small change in location can cause very big
Error, it is therefore, strict to specimen holder and positioner required precision.
The sample disc of the TXRF instrument of Brooker is vertical placement, and fixed sample disc uses clip type fixed form, by sample
Frame is pulled out, and measures specimen holder feeding after dress sample, and this dress sample loading mode, which is measured solid dust particale sample, to be present
It is difficult.
Fill sample system for level, be not suitable for using clip type specimen holder and positioning, specimen holder be mounted in incident light direction and
Both sides can all influence incident light to reach sample panel surface, be put into and take out mounted in emergent light aspect effect sample, it has not been convenient to instrument
Debugging.
The content of the invention
It is an object of the invention to fill sample system there is provided a kind of level that is applied to for problems of the prior art
The sample disc positioner of full-reflection X XRF, facilitates instrument testing and puts sample and positioning.
Technical scheme is as follows：A kind of sample disc positioner of full-reflection X XRF, including positioned at spy
The sample plate rail surveyed below device, the bottom surface of sample plate rail can horizontal pulling, sample disc is horizontally placed on the bottom surface of sample plate rail
On, pressing device is provided with the lower section of sample plate rail bottom surface, horizontal positioning device is provided with the frame of sample plate rail both sides.
Further, the sample disc positioner of full-reflection X XRF as described above, wherein, described compression dress
The pressing plate including being obliquely installed and the lifting shaft being connected with pressing plate end are put, the upper end of the lifting shaft is connected with spring, spring
Top be provided with steel ball, when sample disc be in measurement position when, the pressure of the pressing device is pushed by the bottom surface of sample plate rail
Plate side, makes the lifting shaft of pressing plate end side move steel ball described in jack-up upwards, so as to compress sample disc.
Further, the sample disc positioner of full-reflection X XRF as described above, wherein, the pressing plate can be with
Rotated centered on straight pin, set in pressing plate and back-moving spring is connected below one end of lifting shaft.
Further, the sample disc positioner of full-reflection X XRF as described above, wherein, described level is determined
Position device includes the flange being located on the frame of sample plate rail both sides, provided with the positioning decorative pearl on top of an official cap, the positioning decorative pearl on top of an official cap on the flange
Withstand the edge of sample disc.
Beneficial effects of the present invention are as follows：The sample disc positioner of full-reflection X XRF provided by the present invention
It is different from the specimen holder of the TXRF instrument of Brooker using formula is pushed up on pull.The sample disc fixed structure of the device, convenient dress sample,
Setting-out, and sample in place after fixation.Sample plate rail level is extracted out, achievable sample is put into and taken out.Sample disc is positioned
Point is located at sample plate edge, and incident and emergent light is not influenceed, facilitates instrument testing and puts sample and positioning, for solid micronic dust
Particulate samples nor affect on measurement.The present invention solves the dress sample and sample of the total reflection X ray fluorescence instrument of level dress sample system
Orientation problem, the structure operation is simple, and position is fixed.
Brief description of the drawings
Fig. 1 is the sample disc positioning device structure schematic diagram of full-reflection X XRF of the present invention；
Fig. 2 is the mechanical construction drawing of sample disc positioner；
Fig. 3 is the top view of sample disc positioner；
Fig. 4 is the structure principle chart that sample disc positioner is in diverse location.
In figure, the flange 7. of 1. detector, 2. sample disc, 3. sample plate rail, 4. pressing plate, the 5. compressing member 6. positioning decorative pearl on top of an official cap
8. the lifting shaft of 9. back-moving spring of straight pin 10.
Embodiment
The present invention is described in detail with reference to the accompanying drawings and examples.
As shown in figure 1, the sample disc positioner of full-reflection X XRF provided by the present invention, including positioned at spy
Survey the sample plate rail 3 of the lower section of device 1, the bottom surface of sample plate rail 3 can horizontal pulling, sample disc 2 is horizontally placed on sample plate rail 3
On bottom surface, pressing device is provided with the lower section of sample plate rail bottom surface, pressing device includes the pressing plate 4 being obliquely installed and positioned at pressing plate
The compressing member 5 of end, is provided with horizontal positioning device on the frame of sample plate rail both sides.
As a specific embodiment, the structure of pressing device is as shown in Fig. 2 the pressing device includes being obliquely installed
Pressing plate 4, pressing plate one end top connect lifting shaft 10, the upper end of the lifting shaft 10 is connected with spring, the top of spring
Provided with steel ball, lifting shaft, spring, steel ball are a kind of embodiment for constituting compressing member 5.During pressing plate 4 can be with straight pin 8
The heart is rotated, and is set in pressing plate 4 and back-moving spring 9 is connected below one end of lifting shaft.(it is located at when sample disc 2 is in measurement position
The underface of detector 1), the side of pressing plate 4 of the pressing device is pushed by the bottom surface of sample plate rail 3, pressing plate 4 is just surrounded
Straight pin 8 is rotated, make pressing plate end side lifting shaft 10 upwards move, lifting shaft 10 by spring jack-up steel ball,
So as to compress sample disc 2 by steel ball.
Back-moving spring 9 is connected with below one end due to connecting lifting shaft in pressing plate 4, when sample disc 2 is with sample plate rail 3
Outer when taking out, the bottom surface of sample plate rail 3 departs from pressing plate 4, and one end of the connection lifting shaft of pressing plate 4 spring 9 that is reset is pulled down so that lifting
Axle 10 is moved downward therewith.The thrust that its top spring is released to steel ball is moved down due to lifting shaft 10, enables sample disc 2
Enough with the outside pull of sample plate rail 3.
As shown in figure 3, the horizontal positioning device includes the flange 6 being located on 3 liang of side frames of sample plate rail, described
Flange 6 withstands the edge of sample disc 2 provided with the positioning decorative pearl on top of an official cap 7, the positioning decorative pearl on top of an official cap 7.In the present embodiment, set on a side flange
Put and a positioning decorative pearl on top of an official cap is set on two positioning decorative pearls on top of an official cap, another side flange.
When filling sample, sample plate rail bottom surface is extracted out, sample disc 2 is placed on sample disc by A condition as shown in Figure 4
The surface of frame 3；Then sample plate rail 3 is sent back to, depressed pressing plate 4 when sample plate rail 3 is pushed back in place, the pressure of pressing plate end
The tight jack-up of part 5 compresses sample disc 2, B states as shown in Figure 4；Sample disc 2 ensures above with the positioning decorative pearl on top of an official cap on flange 6
The horizontal level of sample disc, the C-state as shown in Fig. 4.
Obviously, those skilled in the art can carry out the essence of various changes and modification without departing from the present invention to the present invention
God and scope.So, if these modifications and variations to the present invention belong to the model of the claims in the present invention and its equivalent technology
Within enclosing, then the present invention is also intended to comprising including these changes and modification.
Claims (4)
1. a kind of sample disc positioner of full-reflection X XRF, it is characterised in that：Including below detector (1)
Sample plate rail (3), the bottom surface of sample plate rail (3) can horizontal pulling, sample disc (2) is horizontally placed on sample plate rail (3)
On bottom surface, pressing device is provided with the lower section of sample plate rail (3) bottom surface, it is fixed provided with level on the side frame of sample plate rail (3) two
Position device.
2. the sample disc positioner of full-reflection X XRF as claimed in claim 1, it is characterised in that：Described pressure
Tight device includes the pressing plate (4) being obliquely installed and the lifting shaft (10) being connected with pressing plate end, the upper end of the lifting shaft (10)
Spring is connected with, the top of spring is provided with steel ball, when sample disc is in measurement position, under the bottom surface by sample plate rail (3)
Pressing plate (4) side of the pressing device is pressed, the lifting shaft (10) of pressing plate (4) end side is moved steel described in jack-up upwards
Pearl, so as to compress sample disc (2).
3. the sample disc positioner of full-reflection X XRF as claimed in claim 2, it is characterised in that：The pressing plate
(4) it can be rotated centered on straight pin (8), connection back-moving spring (9) below one end of lifting shaft (10) is set in pressing plate (4).
4. the sample disc positioner of the full-reflection X XRF as described in any one in claim 1-3, its feature exists
In：Described horizontal positioning device includes the flange (6) being located on the side frame of sample plate rail (3) two, is set on the flange (6)
There is the positioning decorative pearl on top of an official cap (7), the positioning decorative pearl on top of an official cap (7) withstands the edge of sample disc (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710530862.9A CN107290377B (en) | 2017-06-30 | 2017-06-30 | Sample tray positioning device of total reflection X fluorescence spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710530862.9A CN107290377B (en) | 2017-06-30 | 2017-06-30 | Sample tray positioning device of total reflection X fluorescence spectrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107290377A true CN107290377A (en) | 2017-10-24 |
| CN107290377B CN107290377B (en) | 2023-08-18 |
Family
ID=60099678
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710530862.9A Active CN107290377B (en) | 2017-06-30 | 2017-06-30 | Sample tray positioning device of total reflection X fluorescence spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107290377B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111751393A (en) * | 2019-03-27 | 2020-10-09 | 中国石油化工股份有限公司 | XRD clay test dress appearance device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040035183A1 (en) * | 2000-01-25 | 2004-02-26 | The State Of Oregon Acting And Through The State Board Of Higher Education On Behalf Of Portl | Method and apparatus for sample analysis |
| CN202631742U (en) * | 2012-06-14 | 2012-12-26 | 中国人民解放军防化学院 | Sample chamber for testing radioactive samples |
| CN202757897U (en) * | 2012-07-02 | 2013-02-27 | 谢元军 | Movement of x-ray fluorescence (XRF) device for detecting powder samples |
| CN103472081A (en) * | 2013-09-27 | 2013-12-25 | 四川新先达测控技术有限公司 | Automatic energy dispersive X-ray fluorescence analysis test platform |
| CN103472164A (en) * | 2012-06-06 | 2013-12-25 | 北京普源精电科技有限公司 | Sample disc structure of autosampler |
| CN206906284U (en) * | 2017-06-30 | 2018-01-19 | 中国原子能科学研究院 | A kind of sample disc positioner of full-reflection X XRF |
-
2017
- 2017-06-30 CN CN201710530862.9A patent/CN107290377B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040035183A1 (en) * | 2000-01-25 | 2004-02-26 | The State Of Oregon Acting And Through The State Board Of Higher Education On Behalf Of Portl | Method and apparatus for sample analysis |
| CN103472164A (en) * | 2012-06-06 | 2013-12-25 | 北京普源精电科技有限公司 | Sample disc structure of autosampler |
| CN202631742U (en) * | 2012-06-14 | 2012-12-26 | 中国人民解放军防化学院 | Sample chamber for testing radioactive samples |
| CN202757897U (en) * | 2012-07-02 | 2013-02-27 | 谢元军 | Movement of x-ray fluorescence (XRF) device for detecting powder samples |
| CN103472081A (en) * | 2013-09-27 | 2013-12-25 | 四川新先达测控技术有限公司 | Automatic energy dispersive X-ray fluorescence analysis test platform |
| CN206906284U (en) * | 2017-06-30 | 2018-01-19 | 中国原子能科学研究院 | A kind of sample disc positioner of full-reflection X XRF |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111751393A (en) * | 2019-03-27 | 2020-10-09 | 中国石油化工股份有限公司 | XRD clay test dress appearance device |
| CN111751393B (en) * | 2019-03-27 | 2023-09-19 | 中国石油化工股份有限公司 | XRD clay test dress appearance device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107290377B (en) | 2023-08-18 |
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