CN107219486A - A kind of calibrating device and its calibration method tested for SAW filter - Google Patents
A kind of calibrating device and its calibration method tested for SAW filter Download PDFInfo
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- CN107219486A CN107219486A CN201710371574.3A CN201710371574A CN107219486A CN 107219486 A CN107219486 A CN 107219486A CN 201710371574 A CN201710371574 A CN 201710371574A CN 107219486 A CN107219486 A CN 107219486A
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- Prior art keywords
- calibration
- calibrating device
- saw filter
- low temperature
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
- G01R35/007—Standards or reference devices, e.g. voltage or resistance standards, "golden references"
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Abstract
The invention discloses a kind of calibrating device and its calibration method tested for SAW filter, belong to collimation technique field.The sheet materials of FR 4 that the present invention uses high-low temperature resistant realize the calibration under high and low temperature environment as the loading material of calibrating device；Calibration method of the present invention can realize the passage of high-volume SAW filter test system and the calibration of fixture reference surface, and the influence such as environment, electrical Interference is excluded to greatest extent, reduces the measurement error of SAW filter；Temperature change introducing calibration is considered, calibration of the SAW filter in 55 DEG C~+125 DEG C temperature ranges is realized, improves measurement accuracy.
Description
Technical field
The invention belongs to collimation technique field, and in particular to it is a kind of for SAW filter test calibrating device and its
Calibration method.
Background technology
SAW filter is widely used in mobile communication, navigation, wireless data transmission, electricity with its excellent performance
The fields such as sub- audiovisual, the annual market demand several hundred million, SAW filter dispatch from the factory before need carry out high/low temperature (- 55 DEG C~+
125 DEG C) test and screen.The test system block diagram tested and screened is as shown in Figure 1.
High/low temperature before current batch SAW filter is dispatched from the factory is tested and screened, and having used can the filter of batch clamping
The fixture of ripple device, as shown in figure 1, each fixture 4 SAW filters of clamping, totally 70 fixtures, realize 280 sound surfaces
The test and screening of wave filter.
To be that surface-pasted SAW filter is tested to pin, test probe is designed with fixture, is realized
The connection of SAW filter and multimeter.But the introducing of probe is tested, test error is unavoidably brought, only
There are progress detection calibration and error correction on test probe end face to obtain degree of precision.
At present due to lacking the calibration means for fixture reference surface and TCH test channel, calibration is only rested on to tester
In the calibration of port, it is impossible to which TCH test channel and fixture reference surface are included into calibration category.
The content of the invention
For above-mentioned technical problem present in prior art, the present invention proposes a kind of SAW filter that is used for and surveyed
The calibrating device and its calibration method of examination, it is reasonable in design, the deficiencies in the prior art are overcome, with good effect.
To achieve these goals, the present invention is adopted the following technical scheme that：
It is a kind of for SAW filter high/low temperature test calibrating device, including thru calibration part, open circuit calibrating device and
Load calibration part；
Thru calibration part, including wiring board, multiple smb connectors subheaders and microstrip line, smb connector subheaders symmetrically divide
The both sides of wiring board are distributed in, symmetrical smb connector subheaders are connected by microstrip line；
Open circuit calibrating device, including wiring board, multiple smb connectors subheaders and microstrip line, smb connector subheaders symmetrically divide
It is distributed in the both sides of wiring board；Microstrip line makes symmetrical smb connectors subheader be in open-circuit condition；
Load calibration part, including wiring board, multiple smb connectors subheaders, microstrip line and load, smb connector subheaders
The both sides of wiring board are symmetrically distributed in, load welding is on the microstrip line.
Preferably, the wiring board is made up of FR-4 materials.
In addition, the present invention is it is also mentioned that a kind of calibration method tested for SAW filter high/low temperature, this method is adopted
With a kind of calibrating device tested for SAW filter high/low temperature as described above, comprise the following steps：
Step 1：Temperature in high-low temperature chamber is set；
Step 2：Calibrating device is inserted on clamping fixture seat, and inputs into computer the actual alignment parameter of the calibrating device；
Step 3：Run calibration procedure；
Step 4：Change the temperature and calibrating device in high-low temperature chamber, repeat step 1- steps 3；
Step 5：Complete this calibration.
The advantageous effects that the present invention is brought：
The FR-4 sheet materials that the present invention uses high-low temperature resistant realize the school under high and low temperature environment as the loading material of calibrating device
It is accurate；Calibration method of the present invention can realize the passage of high-volume SAW filter test system and the calibration of fixture reference surface,
The influence such as environment, electrical Interference is excluded to greatest extent, reduces the measurement error of SAW filter；Temperature change is introduced into school
Standard is considered, and is realized calibration of the SAW filter in -55 DEG C~+125 DEG C temperature ranges, is improved measurement accuracy.
Brief description of the drawings
Fig. 1 is SAW filter test and filler test system block diagram.
Fig. 2 is the structural representation of clamp body.
Fig. 3 is the structural representation of cover plate.
Fig. 4 is the structural representation of clamping fixture seat.
Fig. 5 is the structural representation of thru calibration part.
Fig. 6 is the structural representation of open circuit calibrating device.
Fig. 7 is the structural representation of load calibration part.
Embodiment
Below in conjunction with the accompanying drawings and embodiment is described in further detail to the present invention：
The major meters device of SAW filter is vector network analyzer, so surface acoustic wave is filtered in the present invention
The calibration program of device fixture uses the TRL calibration methods for microstrip line, for the fixture of each specification, using a straight-through school
Quasi- part, an open circuit calibrating device and a load calibration part, the fixture to being defined needed for test is realized with vector network analyzer
The plane of reference, whole TCH test channel are calibrated, to ensure the measurement accuracy of whole high/low temperature test system.
SAW filter fixture as shown in figs. 2 to 4, including two parts of clamp body and clamping fixture seat, single clamp body
Can 4 SAW filters of clamping, after the extension connection of multiple clamping fixture seats, clamping 280 can be realized with 70 clamp bodies of grafting
SAW filter；Test cable is drawn out to outside high-low temperature chamber by clamping fixture seat.
In clamp body, each test groove includes input, each one of probe of output bottom test.
The calibration plane of reference is respectively the position where input test pin and output testing needle；Calibration uses indirect alignment method,
I.e. with it is identical with the appearance and size and joint of clamp body but it is internal be microstrip transmission line constitute calibrating device.
The fixture of the every kind of specification of correspondence, has three sets of calibrating devices：Thru calibration part, open circuit calibrating device and load calibration part.
Thru calibration part, as shown in figure 5, microstrip line is shorted to another test lead from a test lead.
Open circuit calibrating device, as shown in fig. 6, design microstrip line, makes two test leads be in open-circuit condition.
Load calibration part, as shown in Figure 7.
During calibration, high/low temperature the temperature inside the box be respectively -55 DEG C, 25 DEG C (room temperature), under the conditions of 125 DEG C, it is logical for test
Road and fixture, will be corresponding under the built-in calibration software prompting of the built-in calibration software or system master computer of tester
Calibrating device is inserted on clamping fixture seat instead of clamp body, is inputted after the actual phase parameter of the calibrating device, operation calibration procedure, i.e., complete
Into this calibration, calibration parameter is automatically held in tester or main control computer.During actual test, according to different temperature strips
The fixture of part, different size, calls corresponding calibration parameter.
Certainly, described above is not limitation of the present invention, and the present invention is also not limited to the example above, this technology neck
The variations, modifications, additions or substitutions that the technical staff in domain is made in the essential scope of the present invention, should also belong to the present invention's
Protection domain.
Claims (3)
1. a kind of calibrating device tested for SAW filter high/low temperature, it is characterised in that including thru calibration part, open circuit
Calibrating device and load calibration part；
Thru calibration part, including wiring board, multiple smb connectors subheaders and microstrip line, smb connector subheaders are symmetrically distributed in
The both sides of wiring board, symmetrical smb connector subheaders are connected by microstrip line；
Open circuit calibrating device, including wiring board, multiple smb connectors subheaders and microstrip line, smb connector subheaders are symmetrically distributed in
The both sides of wiring board；Microstrip line makes symmetrical smb connectors subheader be in open-circuit condition；
Load calibration part, including wiring board, multiple smb connectors subheaders, microstrip line and load, smb connector subheaders are symmetrical
The both sides of wiring board are distributed in, load welding is on the microstrip line.
2. a kind of calibrating device tested for SAW filter high/low temperature according to claim 1, it is characterised in that
The wiring board is made up of FR-4 materials.
3. a kind of calibration method tested for SAW filter high/low temperature, it is characterised in that using such as claim 1 institute
A kind of calibrating device tested for SAW filter high/low temperature stated, comprises the following steps：
Step 1：Temperature in high-low temperature chamber is set；
Step 2：Calibrating device is inserted on clamping fixture seat, and inputs into computer the actual alignment parameter of the calibrating device；
Step 3：Run calibration procedure；
Step 4：Change the temperature and calibrating device in high-low temperature chamber, repeat step 1- steps 3；
Step 5：Complete this calibration.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710371574.3A CN107219486A (en) | 2017-05-24 | 2017-05-24 | A kind of calibrating device and its calibration method tested for SAW filter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710371574.3A CN107219486A (en) | 2017-05-24 | 2017-05-24 | A kind of calibrating device and its calibration method tested for SAW filter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107219486A true CN107219486A (en) | 2017-09-29 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710371574.3A Pending CN107219486A (en) | 2017-05-24 | 2017-05-24 | A kind of calibrating device and its calibration method tested for SAW filter |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113391254A (en) * | 2021-05-20 | 2021-09-14 | 中国电子技术标准化研究院 | High-low temperature on-chip scattering coefficient calibration piece and manufacturing method thereof |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5559443A (en) * | 1994-03-07 | 1996-09-24 | Hitachi Chemical Company Ltd. | Jig for measuring the characteristics of a semiconductor, manufacturing method for the same, and usage of the same |
| CN1808126A (en) * | 2006-01-05 | 2006-07-26 | 厦门大学 | Microwave ceramic element detection clamp and device, and detection method thereof |
| CN104678339A (en) * | 2014-12-30 | 2015-06-03 | 北京无线电计量测试研究所 | Calibration device, system and method for probe type microwave voltage measurement system |
| CN105044637A (en) * | 2015-05-08 | 2015-11-11 | 中国电子科技集团公司第四十一研究所 | Calibration apparatus and calibration method for calibrating vector network analyser |
| CN204789633U (en) * | 2015-06-10 | 2015-11-18 | 航天科工防御技术研究试验中心 | LTCC wave filter test fixture |
-
2017
- 2017-05-24 CN CN201710371574.3A patent/CN107219486A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5559443A (en) * | 1994-03-07 | 1996-09-24 | Hitachi Chemical Company Ltd. | Jig for measuring the characteristics of a semiconductor, manufacturing method for the same, and usage of the same |
| CN1808126A (en) * | 2006-01-05 | 2006-07-26 | 厦门大学 | Microwave ceramic element detection clamp and device, and detection method thereof |
| CN104678339A (en) * | 2014-12-30 | 2015-06-03 | 北京无线电计量测试研究所 | Calibration device, system and method for probe type microwave voltage measurement system |
| CN105044637A (en) * | 2015-05-08 | 2015-11-11 | 中国电子科技集团公司第四十一研究所 | Calibration apparatus and calibration method for calibrating vector network analyser |
| CN204789633U (en) * | 2015-06-10 | 2015-11-18 | 航天科工防御技术研究试验中心 | LTCC wave filter test fixture |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113391254A (en) * | 2021-05-20 | 2021-09-14 | 中国电子技术标准化研究院 | High-low temperature on-chip scattering coefficient calibration piece and manufacturing method thereof |
| CN113391254B (en) * | 2021-05-20 | 2023-03-14 | 中国电子技术标准化研究院 | High-low temperature on-chip scattering coefficient calibration piece and manufacturing method thereof |
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Application publication date: 20170929 |