CN107192325B - The direct measuring method of annular flow local dynamic station liquid film average thickness - Google Patents
The direct measuring method of annular flow local dynamic station liquid film average thickness Download PDFInfo
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- CN107192325B CN107192325B CN201710227523.3A CN201710227523A CN107192325B CN 107192325 B CN107192325 B CN 107192325B CN 201710227523 A CN201710227523 A CN 201710227523A CN 107192325 B CN107192325 B CN 107192325B
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- liquid film
- insertion depth
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
Abstract
The present invention relates to a kind of direct measuring methods of annular flow local dynamic station liquid film average thickness, for measuring the liquid film of the conducting liquid flowed in pipeline, used data measurement module includes D.C. regulated power supply, the adjustable contact probe sensor of insertion depth and a precision resistance；The adjustable contact probe sensor of insertion depth, including micrometer caliper 6, double parallel contact probe 2, connecting component 9, fixed bracket 3, telescoping shoring column 7 and spring 8.Measurement method is as follows: when conducting liquid floods probe lower end, it is connected between two probes, entire circuit constitutes circuit, and electric current flows through precision resistance, and the voltage at both ends is not zero, when there is no liquid between two probes, the voltage at precision resistance both ends is zero, continuously when measurement, shows as different duty ratios, the voltage signal of corresponding insertion depth is obtained, final data processing module calculates the average thickness of local dynamic station liquid film.
Description
Technical field
The present invention relates to a kind of measurement methods of annular flow local dynamic station liquid film average thickness.
Background technique
Multiphase Flow process be widely present in many departments such as petroleum, chemical industry, metallurgy, water supply, medicine and environmental project and
It is the important research field of international and domestic extensive concern now in industrial process.Multiphase Flow system, it is usually continuous by two kinds
What medium and several discontinuous media formed.It include that substance number of phases purpose difference multiphase flow can be generally divided into root pick fluid
Two-phase and three-phase flow.According to the difference of component physical state, two phase flow is generally divided into gas/liquid, gas/solid, liquid/solid, liquid liquid again
(such as oil/water) two phase flow；Three-phase flow is generally divided into gas/liquid/liquid, gas liquid solid three-phase flow etc..It is present in multiphase flow gas-liquid interface
In thickness of liquid film not only have a great impact to the heat transfer of biphase gas and liquid flow, mass transfer and drag characteristic, but also be also calculate it is more
The dynamic (dynamical) basis of phase fluid, therefore the key for just becoming these characteristics of understanding is correctly and efficiently measured to thickness of liquid film.
Up to the present, mainly there are following 5 kinds of film thickness measurement methods: (1) conductance method；(2) capacitance method；(3) optical method；(4) sonic method
(5) nuclear radiation method.The basic principle of conductance method be liquid membrane with its conductance there are certain corresponding relationships, by measuring conductance
To obtain thickness of liquid film, the method is only limited to conducting liquid.The cardinal principle of capacitance method is that gas-liquid two-phase has different Jie
Electric constant reflects the thickness change of liquid phase between electrode by two interelectrode capacitance variations, but capacitance method is by gas-liquid two
Mutually stream flow pattern and temperature change are affected, and are suitable for square pipe.Optical method is one of higher method of measurement accuracy, wherein
Interface detection method, laser scattering method and fluorescence intensity method are typically necessary and coloring agent, latex particle or fluorescence are added in the liquid phase
Agent, accuracy, excitating light strength variation and the time and space variation that mass concentration is added are directly related to thickness of liquid film measurement
Uncertainty, uniformity in the liquid phase not can guarantee, and it belongs to easily-consumed products, be only applicable to laboratory measurement, limit
It is promoted and applied；Shade that shadow method is formed by camera record due to liquid film reflected refraction measures thickness of liquid film, the party
Method real-time is poor, can not quick response liquid film variation；The measurement of laser spot displacement method and interferometry to thin liquid film thickness
It is largely effective, high resolution, but structure is complicated for two kinds of measuring systems, and it is very high to sensor performance requirement, due to transparent pipeline
Use limit its mesohigh thickness of liquid film measurement in use；In light decay subtraction, it is seen that light decay subtraction is suitable only for
There is the translucent medium of absorption to visible light, middle infrared attenuating method is only applicable to 2-30 μm due to powerful absorption
The measurement of very thin liquid film.Sonic method is based on ultrasonic technology, and description flow pattern features are powerful, passes through discontinuous be situated between using it
Decaying and principle of reflection can occur when matter to measure thickness of liquid film, but it can not measure wavy liquid films, after will cause reflection
Ultrasonic listening is difficult.Nuclear radiation method disadvantage has very strong radioactivity, and when use needs necessary heavy security protection, limits
Its application in industry spot is made.
Summary of the invention
The purpose of the present invention is overcoming the above-mentioned deficiency of the prior art, a kind of average thickness of annular flow local dynamic station liquid film is provided
The direct measuring method of degree.
To achieve the above object, the present invention takes following technical scheme:
A kind of direct measuring method of annular flow local dynamic station liquid film average thickness, for measuring leading of flowing in pipeline
The liquid film of electro-hydraulic body, used measuring system include data measurement module, data acquisition module and data processing module,
In, data measurement module includes D.C. regulated power supply, the adjustable contact probe sensor of insertion depth and a precision resistance；
The adjustable contact probe sensor of the insertion depth, including micrometer caliper 6, double parallel contact probe 2, company
Relay part 9, fixed bracket 3, telescoping shoring column 7 and spring 8, wherein the main body of micrometer caliper 6 is fixed on fixed bracket 3；
Connecting component 9 includes shell 10, is fixedly connected on support ring on shell 10, is close on the inside of metallic rod 13 and support ring 12；Spiral
The measurement end of mircrometer gauge 6 is connected with the metallic rod 13 of connecting component 9；Double parallel contact probe 2 is fixed on 9 shell of connecting component
Lower part；Connecting component 9 is connected by telescoping shoring column 7 with fixed bracket 3, is provided with spring outside the vertical bar of telescoping shoring column 7,
Spring is placed between fixed bracket and connecting component 9；Double parallel contact probe 2 coats hydrophobic material in addition to probe lower end；Directly
It flows the source of stable pressure that regulated power supply provides and loads the precision resistance two on the precision resistance and double parallel contact probe 2 being serially connected
The voltage at end is by being admitted to data processing module after data collecting module collected.Measurement method is as follows: when conducting liquid floods spy
It when needle lower end, is connected between two probes, entire circuit constitutes circuit, and electric current flows through precision resistance, and the voltage at both ends is not
Zero, when not having liquid between two probes, the voltage at precision resistance both ends is zero, when continuous measurement, shows as different duties
Than according to the difference of required precision, the insertion depth incremental value of double parallel contact probe is selected using micrometer caliper, is obtained pair
The voltage signal of insertion depth is answered, final data processing module calculates the average thickness of local dynamic station liquid film.
Preferably, the support ring includes becket outer ring 11 interconnected and is located at outside becket
Rubber ring 12 in circle 11.
Measurement method can be with are as follows: and by a pair of of double parallel contact probe insertion tube, it is located at probe lower end near liquid film, when
Probe lower end is located at liquid film surface and when liquid contacts, and forms conductive path between probe；When probe is on liquid film surface
On when not contacted with liquid film, then circuit is in open circuit, the voltage by measuring precision resistance both ends can determine whether liquid film whether with
Probe is in contact；Micrometer caliper is adjusted, the insertion depth of contact probe is gradually increased, starts to occur when in acquisition data
Insertion depth value corresponding voltage signal time series at this time is write down when non-zero signal；According to the difference of required precision, choosing
Determine the insertion depth incremental value of probe sensor, continuation adjusts micrometer caliper down, successively writes down each insertion depth value
Corresponding voltage signal time series, until the voltage signal of detection remains non-zero voltage；Insertion depth value is switched to
Change thickness of liquid film value, convert the corresponding duty ratio of insertion depth value for voltage signal time series, after sorting from small to large
Duty ratio is made the difference one by one, each corresponding weight of thickness of liquid film value can be obtained, it is corresponding if thickness of liquid film sequence is hi
Weight sequence is wi, i=1,2,3 ..., N, so obtain average thickness of liquid film value H=(h1 × w1+h2 × w2+h3 × w3+ ...+
hN×wN)。
The invention adopts the above technical scheme, which has the following advantages:
(1) source of stable pressure is provided by D.C. regulated power supply module, with a precision resistance, the adjustable contact probe of insertion depth
Sensor series, data acquisition module are used to acquire the voltage at precision resistance both ends, pass through the insertion of the micrometer caliper of adjusting
Depth, which obtains corresponding voltage signal, realizes direct measurement to thickness of liquid film.
(2) according to the difference of required precision, the insertion depth incremental value of probe sensor is selected to get different numbers are arrived
Thickness of liquid film can satisfy the measurement under different accuracy requirement.
(3) due to the special designing of the adjustable contact probe structure of insertion depth, realize micrometer caliper rotation but with
The problem of its non-rotary specific function of connected contact probe, effective solution extraction wire winding.
Detailed description of the invention
Fig. 1 is the adjustable contact probe sensor of insertion depth
Fig. 2 is the adjustable contact probe sensor attachment portion part structure chart of insertion depth
Fig. 3 is the weighted average thickness algorithm principle figure of optimization
Fig. 4 is the direct measuring system specific structure connection figure of annular flow local dynamic station liquid film average thickness
Fig. 5 is measuring circuit connection figure
Fig. 6 is measuring method flow chart
Figure label explanation: 1 pipeline；2 double parallel contact probes；3 fixed brackets；4 fixed screws；5 extraction wires；6 spiral shells
Revolve mircrometer gauge；7 telescoping shoring columns；8 springs；9 connecting components；10 organic glass shells；11 becket outer rings；12 rubber rings；13
Metallic rod
Specific embodiment
The system includes data measurement module, data acquisition module and data processing module.Wherein, data measurement module
Including D.C. regulated power supply, the adjustable contact probe sensor of insertion depth and a precision resistance；Data acquisition module packet
Include data collecting card, computer and data acquisition software；Data processing module includes computer and realization weighted average thickness
The software of algorithm.The device provides source of stable pressure by D.C. regulated power supply module, adjustable with precision resistance, an insertion depth
Contact probe sensor series, data acquisition module is used to acquire the voltage at precision resistance both ends, when conducting liquid floods probe
When probe, being connected between two probes, entire circuit constitutes circuit, and electric current flows through precision resistance, and the voltage at both ends is not zero,
When not having liquid between two probes, the voltage at precision resistance both ends is zero, continuously when measurement, shows as different duty ratios,
According to the difference of required precision, the insertion depth incremental value of probe sensor is selected, obtains the voltage signal of corresponding insertion depth,
Final data processing module calculates the average thickness of local dynamic station liquid film using weighted average thickness algorithm.
In order to accomplish the direct measurement to annular flow local dynamic station liquid film average thickness, by a pair of of double parallel contact probe
In insertion tube, it is located at probe near liquid film, upper end is connected with the micrometer caliper being fixed on tube wall, lead and precision electricity
Resistance, D.C. regulated power supply are connected, and when probe is located at liquid film surface and liquid contacts, form between probe conductive logical
Road；When probe does not contact on liquid film surface with liquid film, then circuit is in open circuit.It is thus constituted in circuit by measuring
The voltage at precision resistance both ends can determine whether liquid film is in contact with probe.Micrometer caliper is adjusted, contact probe is made
Insertion depth gradually increases, and the corresponding electricity of insertion depth value at this time is write down when acquiring and starting to occur non-zero signal in data
Press signal time sequence；According to the difference of required precision, the insertion depth incremental value of probe sensor is selected, continuation is adjusted down
Micrometer caliper successively writes down the corresponding voltage signal time series of each insertion depth value, until the voltage of detection
Signal remains non-zero voltage.By insertion depth value switching to thickness of liquid film value, insertion is converted by voltage signal time series
Each thickness of liquid film value correspondence can be obtained by duty ratio is made the difference one by one after sorting from small to large in the corresponding duty ratio of depth value
Weight, it is assumed that thickness of liquid film sequence be hi (i=1,2,3 ..., N), corresponding weight sequence be wi (i=1,2,3 ...,
N), so obtaining average thickness of liquid film value H=(h1 × w1+h2 × w2+h3 × w3+ ...+hN × wN).
In order to realize the function of the adjustable contact probe of insertion depth, structure design is as follows: including micrometer caliper 6, double
Parallel contact probe 2, connecting component 9, fixed bracket 3, telescoping shoring column 7, spring 8 and extraction wire 5, connecting component is again
Including organic glass shell 10, becket outer ring 11, rubber ring 12, metallic rod 13.Double parallel contact probe 2 removes probe front
Hydrophobic material is coated outside 1mm, to exclude surface tension bring measurement error.Organic glass shell 10 in connecting component 9,
Becket outer ring 11, rubber ring 12 are binded with seccotine, and metallic rod 13 is centrally disposed place, and the upper end and 12 inside of rubber ring are tight
Closely connected conjunction, lower end are fitted closely with 12 low side of rubber ring, be can reach and are rotated freely but upper and lower fixed function.To micrometer caliper
6 are transformed, its lower end is connected with the metallic rod 13 of connecting component 9, visit in the lower end of connecting component 9 installation double parallel contact
Needle 2 will be mounted on pipeline entirely through fixed bracket 3 above, then by connecting component 9 and fix branch by telescoping shoring column 7
Frame 3 is connected, and telescoping shoring column 7 is hollow pipe, and two of double parallel contact probe 2 electric grades are drawn by telescoping shoring column 7,
It is a spring 8 outside its telescope support 7, increases the stress of double parallel contact probe 2 and micrometer caliper 6, reduces water flow punching
Hit 2 bring measurement error of double parallel contact probe.
It will be connected in two-phase flow system equipped with the adjustable contact probe experiment pipeline section of insertion depth, referring to fig. 4, with one
Precision resistance, D.C. regulated power supply series connection, referring to Fig. 5.Adjust gas phase, liquid phase flow rate makes to form annular flow simultaneously in experiment pipeline section
It keeps stablizing.Micrometer caliper is adjusted, the insertion depth of contact probe is made slowly to become larger, starts non-zero occur when acquiring in data
Write down when signal at this time go deep into the corresponding voltage signal time series of depth value；According to the difference of required precision, select
The insertion depth incremental value of probe sensor, continuation adjust micrometer caliper down, acquire the voltage of each insertion depth value
Signal time sequence.The collected data of acquisition software are imported into Excel table, Sequence Transformed insertion depth value is
Voltage signal time series is converted into duty ratio by thickness of liquid film sequence, in Excel table by thickness of liquid film from high to low into
Row sequence.Whether duty ratio according to sorting from low to high in data after checking sequence, if so, acquisition data can be used for calculating
Dynamic liquid film average thickness, if it is not, then illustrating that nowed forming is not up to stable state when acquiring data, needs to measure again.
The case where 5 insertion depth values will be acquired citing, such as Fig. 3, it is assumed that be sample range in dotted line frame, wherein h1 pairs
The duty ratio answered is t1/t, and the corresponding duty ratio of h2 is t2/t, and the corresponding duty ratio of h3 is t3/t, and the corresponding duty ratio of h4 is
The corresponding duty ratio of t4/t, h5 is t5/t, and red oblique line area is the product of h1 and t1, and green square area is h2 and (t2-
T1 product), the netted area of purple are the product of h3 and (t3-t1), and blue horizontal line area is the product of h4 and (t4-t3), yellow
Color vertical line area is the product of h5 and (t5-t4), and the product of average thickness h and t are approximately the above area summation, so obtain
Average thickness h=(h1 × t1+h2 × (t2-t1)+h3 × (t3-t1)+h4 × (t4-t3)+h5 × (t5-t4))/t.
Claims (2)
1. a kind of direct measuring method of annular flow local dynamic station liquid film average thickness, for measuring the conduction flowed in pipeline
The liquid film of liquid, used measuring system include data measurement module, data acquisition module and data processing module,
In, data measurement module includes D.C. regulated power supply, the adjustable contact probe sensor of insertion depth and a precision resistance；
The adjustable contact probe sensor of the insertion depth, including micrometer caliper (6), double parallel contact probe (2), company
Relay part (9), fixed bracket (3), telescoping shoring column (7) and spring (8), wherein the main body of micrometer caliper (6) is fixed on
On fixed rack (3)；Connecting component (9) includes shell (10), is fixedly connected on support ring on shell (10), metallic rod (13) and branch
It is close on the inside of pushing out ring (12)；The measurement end of micrometer caliper (6) is connected with the metallic rod (13) of connecting component (9)；Double parallel connects
Feeler inspection needle (2) is fixed on the lower part of connecting component (9) shell；Connecting component (9) passes through telescoping shoring column (7) and fixed bracket
(3) it is connected, is provided with spring outside the vertical bar of telescoping shoring column (7), spring is placed between fixed bracket and connecting component (9)；
Double parallel contact probe (2) coats hydrophobic material in addition to probe lower end；The source of stable pressure that D.C. regulated power supply provides is loaded in phase
On mutual concatenated precision resistance and double parallel contact probe (2), after the voltage at precision resistance both ends is by data collecting module collected
It is admitted to data processing module；Measurement method is as follows: when conducting liquid floods probe lower end, is connected between two probes, it is whole
A circuit constitutes circuit, and electric current flows through precision resistance, and the voltage at both ends is not zero, when there is no liquid between two probes, essence
The voltage that cipher telegram hinders both ends is zero, continuously when measurement, shows as different duty ratios, according to the difference of required precision, utilizes spiral shell
The insertion depth incremental value that mircrometer gauge selectes double parallel contact probe is revolved, the voltage signal of corresponding insertion depth is obtained, finally counts
The average thickness of local dynamic station liquid film, measurement method are calculated according to processing module are as follows:
By in a pair of of double parallel contact probe insertion tube, it is located at probe lower end near liquid film, when probe lower end is located at liquid film table
When face and liquid contact, conductive path is formd between probe；When probe does not contact on liquid film surface with liquid film,
Then circuit is in open circuit, and the voltage by measuring precision resistance both ends can determine whether liquid film is in contact with probe；Adjust spiral shell
Mircrometer gauge is revolved, the insertion depth of contact probe is gradually increased, is write down at this time when acquiring and starting to occur non-zero signal in data
The corresponding voltage signal time series of insertion depth value；According to the difference of required precision, the insertion of probe sensor is selected
Depth increments value, continuation adjust micrometer caliper down, successively write down the corresponding voltage signal of each insertion depth value
Time series, until the voltage signal of detection remains non-zero voltage；By insertion depth value switching to thickness of liquid film value, by voltage
Signal time it is Sequence Transformed be the corresponding duty ratio of insertion depth value, by from small to large sequence after duty ratio is made the difference one by one and can be obtained
To each corresponding weight of thickness of liquid film value, if thickness of liquid film sequence is hi, corresponding weight sequence is wi, i=1,2,
3 ..., N, so obtain average thickness of liquid film value H=(h1 × w1+h2 × w2+h3 × w3+ ...+hN × wN).
2. direct measuring method according to claim 1, which is characterized in that the support ring includes gold interconnected
The rubber ring (12) for belonging to ring outer ring (11) and being located in becket outer ring (11).
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| CN108709584B (en) * | 2018-01-23 | 2021-04-02 | 四川大学 | Method for measuring liquid phase film forming thickness and hydromechanics behavior in falling film microchannel |
| CN109708564B (en) * | 2018-12-13 | 2020-11-06 | 天津大学 | Gas-liquid/oil-gas-water multiphase flow liquid film thickness distributed conductivity measurement method |
| CN112097607B (en) * | 2020-09-04 | 2022-06-24 | 联钢精密科技(中国)有限公司 | Rivet hole depth measuring method and measuring device |
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