CN107170663A - A kind of method that chip is taken out from packaging body - Google Patents

A kind of method that chip is taken out from packaging body Download PDF

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Publication number
CN107170663A
CN107170663A CN201610121476.XA CN201610121476A CN107170663A CN 107170663 A CN107170663 A CN 107170663A CN 201610121476 A CN201610121476 A CN 201610121476A CN 107170663 A CN107170663 A CN 107170663A
Authority
CN
China
Prior art keywords
chip
packaging body
packaging
casting
rinsing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610121476.XA
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Chinese (zh)
Inventor
李建强
单书珊
陈燕宁
张海峰
唐晓柯
赵东艳
章姝俊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
State Grid Corp of China SGCC
State Grid Information and Telecommunication Co Ltd
State Grid Zhejiang Electric Power Co Ltd
Beijing Smartchip Microelectronics Technology Co Ltd
Original Assignee
State Grid Corp of China SGCC
State Grid Information and Telecommunication Co Ltd
State Grid Zhejiang Electric Power Co Ltd
Beijing Smartchip Microelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by State Grid Corp of China SGCC, State Grid Information and Telecommunication Co Ltd, State Grid Zhejiang Electric Power Co Ltd, Beijing Smartchip Microelectronics Technology Co Ltd filed Critical State Grid Corp of China SGCC
Priority to CN201610121476.XA priority Critical patent/CN107170663A/en
Publication of CN107170663A publication Critical patent/CN107170663A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices

Abstract

The invention discloses a kind of method that chip is taken out from packaging body, including:The seal cover board of packaging body is removed, the bottom of packaging body by bonding die glue on packaging frame, and packaging frame provided with chip is provided with, and seal cover board is arranged at the top of packaging body;Resin by injection and solidify into packaging body, plastic packaging is carried out to packaging body and casting is formed;Processing is ground to the bottom of the casting after plastic packaging, the packaging frame of package bottom is removed;The casting after grinding is heated in preset temperature range, takes chip;The chip to taking carries out taking out the chip after rinsing after strong acid rinsing, preset time.This method need not be heated to too high-temperature, and chip can be just taken out from packaging body;And the acid treatment time is shorter, pad will not be corroded, chip can be fully taken out, chip can also carry out secondary encapsulation.

Description

A kind of method that chip is taken out from packaging body
Technical field
The present invention relates to ic manufacturing technology field, in particular it relates to which a kind of take out core from packaging body The method of piece.
Background technology
Chip is as the core component of product, and its performance and quality play most important to product final mass Influence.Need to carry out accident analysis during chip design stage or use, after failure of chip, lead to Permanent current journey is first progress electrical property failure analysis, then implements physical failure analysis according to initial analysis conclusion, Need to destroy packaging body or chip during physical failure analysis, to observe position and the phenomenon of failure. In development, in order to save cost, frequently with MPW (MPW, Multi Project Wafer) Form carries out flow, and chip is just particularly precious less due to quantity, or under some specific failure conditions, Need using being repaired to circuit and to chip progress secondary encapsulation, often through technological means by chip Taken out from packaging body, and do not destroy aluminum pad, it is ensured that chip can carry out secondary encapsulation.
Generally carried out from the method for packaging body coring piece by heating or acid corrosion, chip gone into encapsulation first, Chip is exposed with framework, then according to the different processing mode of bonding die material different choice.For The encapsulation of bonding die is carried out using eutectic material or conducting resinl, usual method is that packaging body is put into warm table On, (about 400 DEG C or so) make chip and framework apart at high temperature.For being carried out using Ag slurries For the encapsulation of bonding die, usual method is by concentrated sulfuric acid ebuillition of heated, by packaging body quickly in boiling sulfuric acid It is middle to be infiltrated, make the concentrated sulfuric acid and Ag starch react after bonding force rapid decrease so that chip is from frame Depart from frame.
For the encapsulation of above-mentioned the first situation, i.e. eutectic material or conductive silver paste bonding die, generally will Packaging body, which is put into the method handled on closed furnace, to be needed chip being heated to more than 380 DEG C, or even 400 DEG C, Because degeneration occurs in chip at high temperature, although institute can ensure chip well-tended appearance in this way, It is the risk that there is chip characteristics deterioration.
For second above-mentioned of situation, remove after seal cover board, chip is carried out using the boiling concentrated sulfuric acid (according to circumstances, probably needing dozens of minutes) corrodes for a long time.The concentrated sulfuric acid need to be by during such a method is implemented The purpose for reaching corrosion is penetrated into the gap for passing through slowly chip and ceramic bases of step, and the time is longer, and The long time can cause aluminium PAD to corrode, it is impossible to carry out secondary binding.
The content of the invention
The present invention be in order to overcome prior art from packaging body take out chip when may damage the defect of chip, According to an aspect of the present invention, a kind of method that chip is taken out from packaging body is proposed.
A kind of method that chip is taken out from packaging body provided in an embodiment of the present invention, including:
The seal cover board of packaging body is removed, the bottom of packaging body is provided with logical on packaging frame, and packaging frame Bonding die glue is crossed provided with chip, seal cover board is arranged at the top of packaging body;
Resin by injection and solidify into packaging body, plastic packaging is carried out to packaging body and casting is formed;
Processing is ground to the bottom of the casting after plastic packaging, the packaging frame of package bottom is removed;
The casting after grinding is heated in preset temperature range, takes chip;
The chip to taking carries out taking out the chip after rinsing after strong acid rinsing, preset time.
In the above-mentioned technical solutions, the seal cover board of packaging body is removed, including:Removed and encapsulated using blade The seal cover board of body.
In the above-mentioned technical solutions, resin is epoxy resin.
In the above-mentioned technical solutions, plastic packaging is being carried out to packaging body and formed after casting step, in addition to:
Vacuumize process is carried out to casting.
In the above-mentioned technical solutions, processing is ground to the bottom of the casting after plastic packaging, including:
Processing is ground to the bottom of the casting after plastic packaging using autogenous mill and/or diamond disk;
After the packaging frame of bottom of preset thickness is removed, fine grinding processing is carried out using diamond sand paper, Until removing the packaging frame of package bottom completely.
In the above-mentioned technical solutions, the higher limit of preset temperature range is not more than 200 degrees Celsius.
In the above-mentioned technical solutions, the casting after grinding is heated in preset temperature range, Including:
The casting after grinding is heated in preset temperature range using heat gun.
In the above-mentioned technical solutions, strong acid is the fuming nitric aicd of boiling, and the span of preset time is 5 - 60 seconds seconds.
In the above-mentioned technical solutions, the chip after rinsing is taken out, in addition to:After acetone cleaning and rinsing Chip.
A kind of method that chip is taken out from packaging body provided in an embodiment of the present invention, by being molded, grinding, Heat treatment, acid treatment this series of steps, it is not necessary to be heated to too high-temperature, can just be taken out from packaging body Chip;And the acid treatment time is shorter, pad will not be corroded, treatment effect, can be fully than more consistent Chip is taken out, chip can also carry out secondary encapsulation.Moreover, especially for large chip (such as larger than 10mm2) For, this method advantageously, can be reduced effectively due in the excessive caused processing procedure of adhesive strength The physical damage caused to chip.Meanwhile, the temperature heated using heat gun is relatively low, so as to alleviate core The fire damage that piece is subject to;By grinding technics, shorten the processing time of acid treatment step, improve people Security during member's processing, is prevented effectively from strong acid corrosion chip.The chip taken out by this method can expire Sufficient secondary encapsulation requirement, effectively reduces damage of the handling process to chip.
Other features and advantages of the present invention will be illustrated in the following description, also, partly from froming the perspective of Become apparent, or understood by implementing the present invention in bright book.The purpose of the present invention is excellent with other Point can be by specifically noted structure in the specification, claims and accompanying drawing write come real Now and obtain.
Below by drawings and examples, technical scheme is described in further detail.
Brief description of the drawings
Accompanying drawing is used for providing a further understanding of the present invention, and constitutes a part for specification, with Embodiments of the invention are used to explain the present invention together, are not construed as limiting the invention.In accompanying drawing In:
Fig. 1 is the method flow diagram in the embodiment of the present invention from packaging body taking-up chip;
Fig. 2 is the structural representation of single layer of chips in the embodiment of the present invention;
Fig. 3 is the schematic diagram after the seal cover board of single layer of chips removal packaging body in the embodiment of the present invention;
Fig. 4 is the schematic diagram after single layer of chips resin by injection in the embodiment of the present invention;
Fig. 5 removes the schematic diagram after bottom package framework for single layer of chips in the embodiment of the present invention;
Fig. 6 takes the schematic diagram of the chip for single layer of chips in the embodiment of the present invention;
Fig. 7 is the schematic diagram after single layer of chips strong acid rinsing in the embodiment of the present invention;
Fig. 8 is the structural representation of multilayer chiop in the embodiment of the present invention;
Fig. 9 is the schematic diagram after the seal cover board of multilayer chiop removal packaging body in the embodiment of the present invention;
Figure 10 is the schematic diagram after multilayer chiop resin by injection in the embodiment of the present invention;
Figure 11 removes the schematic diagram after bottom package framework for multilayer chiop in the embodiment of the present invention;
Figure 12 takes the schematic diagram of the chip for multilayer chiop in the embodiment of the present invention;
Figure 13 is the schematic diagram after multilayer chiop strong acid rinsing in the embodiment of the present invention.
Embodiment
Below in conjunction with the accompanying drawings, the embodiment to the present invention is described in detail, it is to be understood that this The protection domain of invention is not limited by embodiment.
According to embodiments of the present invention there is provided a kind of method that chip is taken out from packaging body, Fig. 1 is the party The flow chart of method, specifically includes step 101-105:
Step 101:The seal cover board of packaging body is removed, the bottom of packaging body is provided with packaging frame, and encapsulation Chip is provided with by bonding die glue on framework, seal cover board is arranged at the top of packaging body.
In embodiments of the present invention, packaging body uses metal or ceramic package framework 10, and bonding die glue 20 is specific Can be using silver paste, eutectic solder or conducting resinl etc..Referring specifically to shown in Fig. 2, packaging body uses metal The pad 50 and packaging frame 10 of chip 40 are electrically connected by line 30 (Au/AI/Cu lines), are adopted Body is packaged with the seal cover board 60 of metal or ceramics to seal.The packaging frame 10 of bottom, top Seal cover board 60 and the framework complete seal of the surrounding packaging body.
Specifically, removing the seal cover board 60 of packaging body using blade, 23# can be used as the case may be Knife blade is operated.The schematic diagram removed after the seal cover board of packaging body is shown in Figure 3.
Step 102:Resin by injection and solidify into packaging body, plastic packaging is carried out to packaging body and casting is formed.
In the embodiment of the present invention, after seal cover board is removed, you can so that into packaging body, resin by injection 70 is simultaneously Solidify the resin 70, the resin 70 is preferably epoxy resin.Plastic packaging is carried out to packaging body by resin by injection And form casting.Solidify post package body schematic diagram shown in Figure 4.
Meanwhile, vacuumize process also is carried out to casting after plastic packaging, so that casting is in high vacuum Under environment, this is conducive to excluding the air in epoxy resin, and makes epoxy resin filling uniform.Afterwards, Casting is solidified into certain time, about 8-12 hours.
Step 103:Processing is ground to the bottom of the casting after plastic packaging, the encapsulation of package bottom is removed Framework.
Specifically, being ground using autogenous mill and/or diamond disk to the bottom of the casting after plastic packaging Processing;(when such as will be close to silver paste), particle be utilized after the packaging frame of bottom of preset thickness is removed The diamond sand paper that diameter is about 0.5um carries out fine grinding processing, until removing the envelope of package bottom completely Frame up frame.The schematic diagram for removing bottom package framework is shown in Figure 5.Existing usual method according to from Top is handled chip to the order of bottom treatment;And method provided in an embodiment of the present invention is to go After closure, chip is protected by injection molding manner, then started with from base of frame, by going Except under(-)chassis exposes chip.
Step 104:The casting after grinding is heated in preset temperature range, takes chip.
Specifically, the higher limit of preset temperature range is not more than 200 degrees Celsius.It can be existed using heat gun The casting after grinding is heated in preset temperature range, ceramics and chip out of epoxy resin Take out.Heating-up temperature (about 380 DEG C even 400 DEG C of the temperature of heat gun heating compared to common process More than) much lower, only about 150 DEG C or so, the time only needs 10~15 seconds.Fig. 6 schematically shows Go out to take the chip.
For flush system multi-chip package, the framework base material for being generally used for placing multiple chips is in same height Degree, can once be cut out by this method.But for the lead frame of particular design, chip placement Framework base material highly there may be difference, then need to continue repeat step 104, step after segment chip is taken out Rapid 105, until all chips are taken out one by one., can be by multiple bondings for folded envelope formula multi-chip package Chip together disposably takes out.
Step 105:The chip to taking carries out taking out the chip after rinsing after strong acid rinsing, preset time.
Floated about 30 seconds specifically, the chip that will be taken and be put into the fuming nitric aicd of boiling, removal is not ground Clean silver paste and resin, and clean up chip using acetone.In this step, with boiling fuming nitric aicd Processing time it is very short, pad 50 can be avoided to be corroded.Fig. 7 shows the schematic diagram for the chip that processing is completed.
A kind of method that chip is taken out from packaging body provided in an embodiment of the present invention, by being molded, grinding, Heat treatment, acid treatment this series of steps, it is not necessary to be heated to too high-temperature, can just be taken out from packaging body Chip;And the acid treatment time is shorter, pad will not be corroded, treatment effect, can be fully than more consistent Chip is taken out, chip can also carry out secondary encapsulation.Moreover, especially for large chip (such as larger than 10mm2) For, this method advantageously, can be reduced effectively due in the excessive caused processing procedure of adhesive strength The physical damage caused to chip.Meanwhile, the temperature heated using heat gun is relatively low, so as to alleviate core The fire damage that piece is subject to;By grinding technics, shorten the processing time of acid treatment step, improve people Security during member's processing, is prevented effectively from strong acid corrosion chip.The chip taken out by this method can expire Sufficient secondary encapsulation requirement, effectively reduces damage of the handling process to chip.
Method provided in an embodiment of the present invention is also applied for laminated type multichip packaging structure, detailed process with Single layer of chips is similar, and treatment effect is referring to Fig. 8-13.
The present invention can have a variety of various forms of embodiments, be combined above by taking Fig. 1-Figure 13 as an example attached Figure is to technical scheme explanation for example, and this is not meant to the instantiation that the present invention is applied Can only be confined in specific flow or example structure, one of ordinary skill in the art it is to be appreciated that Specific embodiment presented above is some examples in a variety of its preferred usages, any this hair of embodiment The embodiment of bright claim all should be within the scope of technical solution of the present invention be claimed.
Finally it should be noted that:The preferred embodiments of the present invention are the foregoing is only, limit is not used to The system present invention, although the present invention is described in detail with reference to the foregoing embodiments, for this area For technical staff, it can still modify to the technical scheme described in foregoing embodiments, Or equivalent substitution is carried out to which part technical characteristic.Within the spirit and principles of the invention, Any modification, equivalent substitution and improvements made etc., should be included in the scope of the protection.

Claims (9)

1. a kind of method that chip is taken out from packaging body, it is characterised in that including:
The seal cover board of packaging body is removed, the bottom of the packaging body is provided with packaging frame, and the encapsulation Chip is provided with by bonding die glue on framework, the seal cover board is arranged at the top of the packaging body;
Resin by injection and solidify into the packaging body, plastic packaging is carried out to the packaging body and casting is formed;
Processing is ground to the bottom of the casting after plastic packaging, the encapsulation of the package bottom is removed Framework;
The casting after grinding is heated in preset temperature range, takes the chip;
The chip to taking carries out taking out the chip after rinsing after strong acid rinsing, preset time.
2. according to the method described in claim 1, it is characterised in that the closure for removing packaging body Plate, including:
The seal cover board of packaging body is removed using blade.
3. according to the method described in claim 1, it is characterised in that the resin is epoxy resin.
4. according to the method described in claim 1, it is characterised in that the packaging body is carried out described Plastic packaging is simultaneously formed after casting step, in addition to:
Vacuumize process is carried out to the casting.
5. according to the method described in claim 1, it is characterised in that the casting to after plastic packaging Bottom be ground processing, including:
Place is ground to the bottom of the casting after plastic packaging using autogenous mill and/or diamond disk Reason;
After the packaging frame of bottom of preset thickness is removed, fine grinding processing is carried out using diamond sand paper, Until removing the packaging frame of the package bottom completely.
6. according to the method described in claim 1, it is characterised in that the upper limit of the preset temperature range Value is not more than 200 degrees Celsius.
7. method according to claim 6, it is characterised in that described right in preset temperature range Casting after grinding is heated, including:
The casting after grinding is heated in preset temperature range using heat gun.
8. according to the method described in claim 1, it is characterised in that the strong acid is the smoke nitre of boiling Acid, the span of the preset time is -60 seconds 5 seconds.
9. method according to claim 8, it is characterised in that the chip after the taking-up rinsing, Also include:
Utilize the chip after acetone cleaning and rinsing.
CN201610121476.XA 2016-03-03 2016-03-03 A kind of method that chip is taken out from packaging body Pending CN107170663A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
CN201610121476.XA CN107170663A (en) 2016-03-03 2016-03-03 A kind of method that chip is taken out from packaging body

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108090250A (en) * 2017-11-24 2018-05-29 温州大学 A kind of method and system for assessing integrated antenna package thermal damage
CN112735981A (en) * 2020-12-29 2021-04-30 北京振兴计量测试研究所 Unsealing method of metal ceramic packaged crystal oscillator for chip injection molding packaging
CN114927408A (en) * 2022-05-19 2022-08-19 深圳市东方聚成科技有限公司 Nondestructive chip separation and packaging test recycling method for electronic device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104008956A (en) * 2014-06-06 2014-08-27 航天科工防御技术研究试验中心 Unsealing method for flip chip device
CN104599997A (en) * 2015-01-30 2015-05-06 工业和信息化部电子第五研究所 Unpacking method of plastic-packed metal wire bonding device
CN104810240A (en) * 2014-01-23 2015-07-29 北大方正集团有限公司 De-encapsulation method of TO-type encapsulation device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104810240A (en) * 2014-01-23 2015-07-29 北大方正集团有限公司 De-encapsulation method of TO-type encapsulation device
CN104008956A (en) * 2014-06-06 2014-08-27 航天科工防御技术研究试验中心 Unsealing method for flip chip device
CN104599997A (en) * 2015-01-30 2015-05-06 工业和信息化部电子第五研究所 Unpacking method of plastic-packed metal wire bonding device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108090250A (en) * 2017-11-24 2018-05-29 温州大学 A kind of method and system for assessing integrated antenna package thermal damage
CN108090250B (en) * 2017-11-24 2021-04-27 温州大学 Method and system for evaluating heat damage of integrated circuit package
CN112735981A (en) * 2020-12-29 2021-04-30 北京振兴计量测试研究所 Unsealing method of metal ceramic packaged crystal oscillator for chip injection molding packaging
CN114927408A (en) * 2022-05-19 2022-08-19 深圳市东方聚成科技有限公司 Nondestructive chip separation and packaging test recycling method for electronic device

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Application publication date: 20170915

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