CN107101724B - A kind of polarization state measuring equipment and method based on total railway digital holography - Google Patents
A kind of polarization state measuring equipment and method based on total railway digital holography Download PDFInfo
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- CN107101724B CN107101724B CN201710436260.7A CN201710436260A CN107101724B CN 107101724 B CN107101724 B CN 107101724B CN 201710436260 A CN201710436260 A CN 201710436260A CN 107101724 B CN107101724 B CN 107101724B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
Abstract
The present invention provides a kind of polarization state measuring equipment and method based on total railway digital holography, belongs to polarization state parameter measurement field.The present invention includes light source, Polarization Modulation system, collimating and beam expanding system, the first lens, unpolarized Amici prism, aperture reflecting mirror, polarization splitting prism, the first corner reflector, the second corner reflector, the second lens, imaging sensor, computer.After incident light is divided into reference light and object light, reference light is radiated on aperture reflecting mirror and is reflected；Object light is divided into the orthogonal object light of two beam polarization states after polarization splitting prism, and is reflected back polarization splitting prism by the first corner reflector and the second corner reflector and synthesizes a branch of object light；After object light and reference light converge, the first corner reflector and the second corner reflector are adjusted, the orthogonal hologram in carrier frequency direction can be generated on the image sensor；Exposure acquires+45 ° and hologram when -45 ° of linearly polarized light incidence respectively, passes through computer and obtains Stokes matrix parameter and Jones matrix parameter.
Description
Technical field
The present invention relates to a kind of polarization state measuring equipments and method based on total railway digital holography, belong to polarization state ginseng
Measurement field.
Background technique
Polarization state is one of the Important Parameters for describing light wave wavefront features, can be joined with Stokes matrix parameter, Jones matrix
The characterization such as amount, measuring it has important science meaning in fields such as bio-photon, nonlinear optics, chemistry and minerals
Justice and application value.But traditional measuring polarization state device can only provide the polarization of fixed position on front propagation direction to be measured
Information, and due to not having two-dimentional sampling nature, optical path and multiple exposure need to be adjusted frequently to realize the measurement of polarization state property.
In order to improve the measurement efficiency of polarization state property parameter, domestic and foreign scholars have made many beneficial trials, wherein digital hologram due to
The amplitude and phase information of wavefront to be measured are recorded using interference technique, and completes to reconstruct by digital method, are the polarization of light beam
State property whole audience rapid survey provides possibility, so as to cause extensive concern.
The Gabriel Popescu in University of Illinois, U.S. champagne branch school etc. (Zhuo Wang, Larry J.Millet,
Martha U.Gillette,and Gabriel Popescu,"Jones phase microscopy of transparent
And anisotropic samples, " Opt.Lett.33,1270-1272 (2008)) it is realized using off-axis digital holography
The measurement of Jones matrix, but the technology needs four exposures acquisition to be just able to achieve Jones matrix parameter measurement, and measuring speed is limited；
Simultaneously as using separation light channel structure, poor anti jamming capability.
(Youngchan Kim, Joonwoo Jeong, the Jaeduck Jang, Mahn such as YongKeun Park of South Korea
Won Kim,and YongKeun Park,"Polarization holographic microscopy for extracting
Spatio-temporally resolved Jones matrix, " Opt.Express 20,9948-9955 (2012)) etc. benefits
The orthogonal hologram of carrier frequency is generated with total railway digital holography, and then the survey of Jones matrix parameter is realized by the acquisition that double exposes
Amount, while improving anti-interference ability, improves measurement efficiency.But this method needs two-dimensional grating and hole array to match,
And it is aided with two pieces of polarizing films of polarized orthogonal, not only structure is complicated, but also adjusts difficult.
Patent CN 104198040B " a kind of holographic measurement method and implementing device of two dimension Jones matrix parameter " utilizes double
Two-dimensional grating light splitting technology can realize Jones matrix parameter measurement, but the dress by single exposure in conjunction with spectrum reuse technique
It sets and not only further increases system complexity, but also light utilization efficiency, simultaneously as using using separation light channel structure, it is anti-interference
Ability is poor.
Yuan behaviour of Nanjing Normal University modern equal (Ma Jun, Yuan's behaviour's the present, Feng Shaotong, Nie Shouping, " based on digital hologram and multiplexing
The whole audience polarization state test method of technology ", Acta Physica Sinica .22,224204 (2013)) using polarization and angular multiplexing technology, lead to
Stokes matrix parameter and Jones vector measurement can be realized by crossing single exposure, but because be resisted using using separation light channel structure
Interference performance is poor；It is architectural limitation simultaneously, the orthogonal frequency spectrum of polarization state is limited in spectrum space separation, in turn results in crosstalk, shadow
Ring the measurement accuracy of polarization state property.
Summary of the invention
It is an object of the invention to shortcomings in view of the above technology, and polarization spectro modulation technique, spectrum orthogonal is multiple
Road technique combines with technology and altogether, provides that a kind of structure is simple, the stable polarization state based on total railway digital holography of system is joined
Measuring device, and the polarization state parameter measurement side based on total railway digital holography of a kind of satisfaction and the applicable above method is also provided
Method.
The object of the present invention is achieved like this: including wavelength be the light source of λ, Polarization Modulation system, collimating and beam expanding system,
Object under test, the first lens, unpolarized Amici prism, aperture reflecting mirror, the second lens, imaging sensor and computer, are also wrapped
Polarization splitting prism, the first corner reflector and the second corner reflector are included, the light beam of light source transmitting is modulated through polarization state modulating system
It is focused at successively being formed after collimating and beam expanding system, object under test, the first lens and unpolarized Amici prism after linearly polarized light
Reference light and object light；Reference light is radiated on aperture reflecting mirror and is reflected, and object light is divided into two after polarization splitting prism
The orthogonal object light of beam polarization state, and the orthogonal object light of two beam polarization states is radiated at the first corner reflector and the second corner reflector respectively
It above and is reflected, merges into a branch of object light after again passing by polarization splitting prism；Reference light and object light by reflection pass through again
Cross unpolarized Amici prism merge into it is a branch of after by the second lens；The first corner reflector and the second corner reflector are adjusted, makes two
The orthogonal object light of beam polarization state is orthogonal with reference to the hologram carrier frequency direction of photogenerated, and on imaging sensor acquisition hologram
It passes in computer；The aperture reflecting mirror is located on the conjugate focal planes of the first lens and the second lens, and reflecting surface size
It is consistent with the Airy diameter d that wavelength X is generated in Fourior plane, in which: λ f/D of d < 1.22, f are the coke of the first lens
It is the visual field width of imaging sensor away from, D；First corner reflector and the second corner reflector are located at the first lens and the second lens
On conjugate focal planes, and meet the first corner reflector adjustment object light in the horizontal direction with optical axis at θaAngle, the second corner reflector tune
Whole object light is in vertical direction and optical axis at θbAngle；Or meet the first corner reflector adjustment object light in vertical direction and optical axis into θaAngle,
Second corner reflector adjusts object light in the horizontal direction with optical axis at θbAngle.
The invention also includes structure features some in this way:
1. polarization state modulating system combines realization with quarter wave plate by rotation linear polarizer or linear polarizer.
2. polarization splitting prism is according to light splitting surface and the setting at 45 ° of optical axis normal plane.
3. also setting gradually microcobjective and correction object lens between object under test and the first lens.
4. a kind of polarization state parameter measuring method based on total railway digital holography, including described holographic based on total railway digital
Polarization state measuring equipment, steps are as follows:
(1) light source is opened, the light beam that wavelength is λ is projected and forms linearly polarized light after the modulation of polarization state modulating system, successively
The reference light and object light of focusing are formed after collimating and beam expanding system, object under test, the first lens and unpolarized Amici prism；Ginseng
Light is examined to be radiated on aperture reflecting mirror and reflected；Object light is divided into the orthogonal object of two beam polarization states after polarization splitting prism
Light is radiated on the first corner reflector and the second corner reflector respectively and is reflected, synthesized after again passing by polarization splitting prism
A branch of object light；By the reference light of reflection and two beam object lights through unpolarized Amici prism merge into it is a branch of after by the second lens；
The first corner reflector and the second corner reflector are adjusted, the object light for keeping two beam polarization states orthogonal and the hologram carrier frequency with reference to photogenerated
Direction is orthogonal, and is uploaded in computer with imaging sensor acquisition hologram；
(2) when measuring Stokes matrix parameter, polarization state modulating system is adjusted, makes to input light beam formation+45 ° or -45 ° of lines
Polarised light, acquisition obtain the orthogonal hologram I of a width carrier frequency, and the COMPLEX AMPLITUDE for calculating object under test can obtain:
Ai(x, y)=IFT { C { FT { I (x, y) } Fi}}
Wherein: i=x, y, FiIndicate that filter, FT indicate Fourier transformation, IFT indicates inverse Fourier transform, and C indicates frequency
Spectrum sets middle operation；
Obtain Stokes parameter matrix are as follows:
Wherein:For the phase difference of corrugated to be measured horizontally and vertically；
(3) when measuring Jones matrix parameter, polarization state modulating system is adjusted, makes to input light beam formation+45 ° or -45 ° of lines
Polarised light, for the first time exposure acquisition obtain the orthogonal hologram I of the first width carrier frequency1；Polarization state modulating system is adjusted again, makes to input
Light beam forms -45 ° or+45 ° of linearly polarized lights, and second of exposure acquisition obtains the orthogonal hologram I of the second width carrier frequency2；
The COMPLEX AMPLITUDE for calculating object under test can obtain:
Ani(x, y)=IFT { C { FT { I (x, y) } Fni}}
Wherein: n=1,2, i=x, y, FniIndicating that filter, FT indicate Fourier transformation, IFT indicates inverse Fourier transform,
C indicates that frequency spectrum sets middle operation；
The then Jones matrix parameter of object under test are as follows:
Compared with prior art, the beneficial effects of the present invention are: 1. on the basis of reflective carrier wave point diffraction is total to line structure,
Polarization spectro modulation technique and spectrum reuse technique are introduced, forms the orthogonal hologram of carrier frequency, and complete using same device
Stokes matrix parameter and Jones matrix parameter measurement do not need two-dimensional grating, space while guaranteeing anti-interference ability
The special opticals element such as filter array, method is simple and easy, this is one of the innovative point being different from the prior art；2. by inclined
A branch of 45 ° of linearly polarized light object lights are divided into two orthogonal beam object lights of polarization state by vibration light splitting modulation technique, need to only utilize double-corner reflection
Mirror places different postures can introduce orthogonal carrier frequency in two beam object lights, not only convenient, flexible, but also can avoid to greatest extent
Crosstalk between frequency spectrum, this is the two of the innovative point being different from the prior art.
Apparatus of the present invention structure is simple, at low cost, is not required to the special opticals such as any two-dimensional grating, spatial filter array member
Part；Apparatus of the present invention constitute light channel structure altogether using reflection type point diffraction, and system rejection to disturbance ability is strong, and stability is good.
Detailed description of the invention
Fig. 1 is the polarization state measuring equipment schematic diagram based on total railway digital holography；
Fig. 2 is the polarization state parameter measurement microscope equipment schematic diagram based on total railway digital holography；
Fig. 3 a and Fig. 3 b are that this measuring device measures two width holograms obtained by 45 ° of linear polarizers；
Fig. 4 a, Fig. 4 b, Fig. 4 c, Fig. 4 d are respectively that this measuring device measures J obtained by 45 ° of linear polarizersxx、Jxy、Jyx、Jyy's
Amplitude schematic diagram；
In figure: 1 light source, 2 polarization state modulating systems, 3 collimating and beam expanding systems, 4 objects under test, 5 first lens, 6 is unpolarized
Amici prism, 7 aperture reflecting mirrors, 8 polarization splitting prisms, 9 first corner reflectors, 10 second corner reflectors, 11 second lens, 12
Imaging sensor, 13 computers, 14 microcobjectives and 15 correction object lens.
Specific embodiment
Present invention is further described in detail with specific embodiment with reference to the accompanying drawing.
In conjunction with Fig. 1 to Fig. 4 c, the polarization state measuring equipment of the invention based on total railway digital holography, including wavelength is
The light source of λ, Polarization Modulation system, collimating and beam expanding system, the first lens, unpolarized Amici prism, aperture reflecting mirror, second are thoroughly
Mirror, imaging sensor, computer, the present invention are additionally provided with polarization splitting prism, the first corner reflector and the second corner reflector.Light source
The light beam of 1 transmitting is modulated into linearly polarized light through polarization state modulating system 2, successively by collimating and beam expanding system 3, object under test 4, the
The reference light and object light of focusing are formed after one lens 5 and unpolarized Amici prism 6；Reference light is radiated on aperture reflecting mirror 7 simultaneously
It is reflected；Object light is divided into the orthogonal object light of two beam polarization states after polarization splitting prism 8, is radiated at the first corner reflector respectively
9 and second on corner reflector 10 and are reflected, and merge into a branch of object light after again passing by polarization splitting prism 8；By reflection
Reference light and object light again pass by unpolarized Amici prism 6 merge into it is a branch of after, by the second lens 11 formed a width carrier frequency just
Hologram is handed over, is collected in computer by imaging sensor 12；The first corner reflector 9 and the second corner reflector 10 are adjusted, makes two
The orthogonal object light of beam polarization state is orthogonal with reference to the hologram carrier frequency direction of photogenerated, and acquires hologram with imaging sensor 12
It uploads in computer；The aperture reflecting mirror is located on the conjugate focal planes of the first lens and the second lens, and reflecting surface
Size is consistent with the Airy diameter d that wavelength X is generated in Fourior plane, and wherein λ f/D of d < 1.22, f are the first lens
Focal length, the visual field width that D is imaging sensor；First corner reflector and the second corner reflector are located at the first lens and the second lens
Conjugate focal planes on, and the first corner reflector adjustment object light in the horizontal direction with optical axis at θaAngle, the adjustment of the second corner reflector
Object light is in vertical direction and optical axis at θbAngle or the first corner reflector adjust object light in vertical direction and optical axis into θaAngle, second jiao
Reflector alignment object light is in the horizontal direction with optical axis at θbAngle.
Polarization state modulating system can combine realization with quarter wave plate by rotation linear polarizer or linear polarizer.
Polarization splitting prism is according to light splitting surface and the placement at 45 ° of optical axis normal plane.
Microcobjective and correction object lens can be also sequentially placed between object under test and the first lens.
Based on the polarization state parameter measuring method of total railway digital holography, include the following steps:
(1) entire optical system is adjusted, light source is opened, projecting wavelength is the light beam of λ after the modulation of polarization state modulating system
Linearly polarized light is formed, is successively formed and is focused after collimating and beam expanding system, object under test, the first lens and unpolarized Amici prism
Reference light and object light；Reference light is radiated on aperture reflecting mirror and is reflected；Object light is divided into two after polarization splitting prism
The orthogonal object light of beam polarization state is radiated on the first corner reflector and the second corner reflector respectively and is reflected, and again passes by partially
A branch of object light is synthesized after vibration Amici prism；Reference light and two beam object lights by reflection merge into a branch of through unpolarized Amici prism
Pass through the second lens afterwards；The first corner reflector and the second corner reflector are adjusted, the object light and reference light for keeping two beam polarization states orthogonal
The hologram carrier frequency direction of generation is orthogonal, and is uploaded in computer with imaging sensor acquisition hologram；
(2) when measuring Stokes matrix parameter, polarization state modulating system is adjusted, makes to input light beam+45 ° (or -45 °) of formation
Linearly polarized light, acquisition obtain the orthogonal hologram I of a width carrier frequency.
The COMPLEX AMPLITUDE for calculating object under test can obtain:
Ai(x, y)=IFT { C { FT { I (x, y) } Fi}}
Wherein, i=x, y, FiIndicate that filter, FT { } indicate Fourier transformation, IFT indicates inverse Fourier transform, C { } table
Show that frequency spectrum sets middle operation.
So as to obtain Stokes parameter matrix are as follows:
Wherein,For the phase difference of corrugated to be measured horizontally and vertically.
(3) when measuring Jones matrix parameter, polarization state modulating system is adjusted, makes to input light beam+45 ° (or -45 °) of formation
Linearly polarized light, for the first time exposure acquisition obtain the orthogonal hologram I of the first width carrier frequency1；Polarization state modulating system is adjusted again, is made defeated
Enter light beam and form -45 ° of (or+45 °) linearly polarized lights, second of exposure acquisition obtains the orthogonal hologram I of the second width carrier frequency2；
The COMPLEX AMPLITUDE for calculating object under test can obtain:
Ani(x, y)=IFT { C { FT { I (x, y) } Fni}}
Wherein, n=1,2, i=x, y, FniIndicating that filter, FT indicate Fourier transformation, IFT indicates inverse Fourier transform,
C indicates that frequency spectrum sets middle operation.
So as to obtain the Jones matrix parameter of object under test are as follows:
It elaborates below with reference to Fig. 1 to Fig. 4 d to embodiment of the invention.
The inventive system comprises: light source 1, polarization state modulated structure 2, collimating and beam expanding system 3, object under test 4, first are saturating
Mirror 5, unpolarized Amici prism 6, aperture reflecting mirror 7, polarization splitting prism 8, the first corner reflector 9, the second corner reflector 10,
Two lens 11, imaging sensor 12, wherein light source 1 is wavelength 632.8nm laser；Before object under test 4 is located at the first lens 5
On focal plane；Aperture reflecting mirror 7, the first corner reflector 9 and the second corner reflector 10 are located at the conjugation of 2 second lens 11 of the first lens
On focal plane；The focal length of first lens 5 and the second lens 11 is f=200mm；Imaging sensor 12 is located at the second lens 11
On back focal plane；Aperture reflecting mirror is located on the conjugate focal planes of the first lens and the second lens, and reflecting surface size and wavelength X exist
The Airy diameter d that Fourior plane generates is consistent, and wherein λ f/D of d < 1.22, f are the focal length of the first lens, D is image
The visual field width of sensor；Microcobjective and correction object lens can also be sequentially placed between object under test 4 and the first lens 5, it should
Method can be applied in micrometering.
The specific embodiment of detection method of the invention is as follows:
Light source 1 is opened, the light beam that wavelength is λ is projected and forms linearly polarized light after the modulation of polarization state modulating system 2, successively pass through
It crosses after collimating and beam expanding system 3, object under test 4, the first lens 5 and unpolarized Amici prism 6 and forms the reference light and object light of focusing；
Reference light is radiated on aperture reflecting mirror 7 and is reflected；It is orthogonal that object light is divided into two beam polarization states after polarization splitting prism 8
Object light is radiated on the first corner reflector 9 and the second corner reflector 10 respectively and is reflected, again passes by polarization splitting prism 8
After synthesize a branch of object light；By the reference light of reflection and two beam object lights through unpolarized Amici prism merge into it is a branch of after by second
Lens 11；The first corner reflector 9 and the second corner reflector 10 are adjusted, the object light for keeping two beam polarization states orthogonal and reference photogenerated
Hologram carrier frequency direction is orthogonal, and acquires hologram with imaging sensor 12 and upload in computer 13；
(2) when measuring Stokes matrix parameter, polarization state modulating system is adjusted, makes to input light beam+45 ° (or -45 °) of formation
Linearly polarized light, acquisition obtain the orthogonal hologram I of a width carrier frequency.
The COMPLEX AMPLITUDE for calculating object under test can obtain
Ai(x, y)=IFT { C { FT { I (x, y) } Fi}}
Wherein, i=x, y, FiIndicate that filter, FT { } indicate Fourier transformation, IFT { } indicates inverse Fourier transform, C { }
Indicate that frequency spectrum sets middle operation.
It is so as to obtain Stokes parameter matrix
Wherein,For the phase difference of corrugated to be measured horizontally and vertically.
(3) when measuring Jones matrix parameter, polarization state modulating system is adjusted, makes to input light beam+45 ° (or -45 °) of formation
Linearly polarized light, for the first time exposure acquisition obtain the orthogonal hologram I of the first width carrier frequency1；Polarization state modulating system is adjusted again, is made defeated
Enter light beam and form -45 ° of (or+45 °) linearly polarized lights, second of exposure acquisition obtains the orthogonal hologram I of the second width carrier frequency2；
The COMPLEX AMPLITUDE for calculating object under test can obtain
Ani(x, y)=IFT { C { FT { I (x, y) } Fni}}
Wherein, n=1,2, i=x, y, FniIndicating that filter, FT indicate Fourier transformation, IFT indicates inverse Fourier transform,
C indicates that frequency spectrum sets middle operation.
It is so as to obtain the Jones matrix parameter of object under test
To sum up, the present invention provides polarization state measuring equipment and method based on total railway digital holography, belong to polarization
State property fields of measurement.The present invention includes light source, Polarization Modulation system, collimating and beam expanding system, the first lens, unpolarized light splitting rib
Mirror, aperture reflecting mirror, polarization splitting prism, the first corner reflector, the second corner reflector, the second lens, imaging sensor, calculating
Machine.After incident light is divided into reference light and object light, reference light is radiated on aperture reflecting mirror and is reflected；Object light passes through polarization spectro
It is divided into the orthogonal object light of two beam polarization states after prism, and polarization spectro rib is reflected back by the first corner reflector and the second corner reflector
Mirror synthesizes a branch of object light；After object light and reference light converge, the first corner reflector and the second corner reflector are adjusted, it can be in image sensing
The orthogonal hologram in carrier frequency direction is generated on device；Exposure acquires+45 ° and hologram when -45 ° of linearly polarized light incidence respectively, leads to
It crosses computer and obtains Stokes matrix parameter and Jones matrix parameter.Apparatus of the present invention structure is simple, at low cost, is not required to any
The special opticals elements such as two-dimensional grating, spatial filter array；Apparatus of the present invention constitute optical path knot altogether using reflection type point diffraction
Structure, system rejection to disturbance ability is strong, and stability is good.
Claims (5)
1. a kind of polarization state measuring equipment based on total railway digital holography, light source, Polarization Modulation system including wavelength for λ
System, collimating and beam expanding system, object under test, the first lens, unpolarized Amici prism, aperture reflecting mirror, the second lens, image sensing
Device and computer, it is characterised in that: further include polarization splitting prism, the first corner reflector and the second corner reflector, light source transmitting
Light beam after polarization state modulating system is modulated into linearly polarized light successively pass through collimating and beam expanding system, object under test, the first lens
With the reference light and object light for forming focusing after unpolarized Amici prism；Reference light is radiated on aperture reflecting mirror and is reflected, object
Light is divided into the orthogonal object light of two beam polarization states after polarization splitting prism, and the orthogonal object light of two beam polarization states is radiated at respectively
It on first corner reflector and the second corner reflector and is reflected, merges into a branch of object light after again passing by polarization splitting prism；Through
The reference light and object light for crossing reflection again pass by unpolarized Amici prism merge into it is a branch of after by the second lens；Adjust first jiao
Reflecting mirror and the second corner reflector, the object light for keeping two beam polarization states orthogonal is orthogonal with reference to the hologram carrier frequency direction of photogenerated,
And it is uploaded in computer with imaging sensor acquisition hologram；The aperture reflecting mirror is located at the first lens and the second lens
On conjugate focal planes, and reflecting surface size is consistent with the Airy diameter d that wavelength X is generated in Fourior plane, in which: and d <
1.22 λ f/D, f are the focal length of the first lens, the visual field width that D is imaging sensor；First corner reflector and the second corner reflector
On the conjugate focal planes of the first lens and the second lens, and meet the first corner reflector adjustment object light in the horizontal direction with light
Axis is at θaAngle, the second corner reflector adjustment object light are in vertical direction and optical axis at θbAngle；Or meets the first corner reflector and adjust object light
In vertical direction and optical axis at θaAngle, the second corner reflector adjustment object light are in the horizontal direction with optical axis at θbAngle.
2. a kind of polarization state measuring equipment based on total railway digital holography according to claim 1, it is characterised in that:
Polarization state modulating system combines realization with quarter wave plate by rotation linear polarizer.
3. a kind of polarization state measuring equipment based on total railway digital holography according to claim 2, it is characterised in that:
Polarization splitting prism is according to light splitting surface and the setting at 45 ° of optical axis normal plane.
4. a kind of polarization state measuring equipment based on total railway digital holography according to claim 3, it is characterised in that:
Microcobjective and correction object lens are also set gradually between object under test and the first lens.
5. a kind of polarization state property of the polarization state measuring equipment according to claim 4 based on total railway digital holography
Measurement method, it is characterised in that: steps are as follows:
(1) light source is opened, the light beam that wavelength is λ is projected and forms linearly polarized light after the modulation of polarization state modulating system, successively pass through
The reference light and object light of focusing are formed after collimating and beam expanding system, object under test, the first lens and unpolarized Amici prism；Reference light
It is radiated on aperture reflecting mirror and is reflected；Object light is divided into the orthogonal object light of two beam polarization states after polarization splitting prism, point
It is not radiated on the first corner reflector and the second corner reflector and is reflected, synthesize a branch of object after again passing by polarization splitting prism
Light；By the reference light of reflection and two beam object lights through unpolarized Amici prism merge into it is a branch of after by the second lens；Adjustment the
The hologram carrier frequency direction of one corner reflector and the second corner reflector, the object light for keeping two beam polarization states orthogonal and reference photogenerated is just
It hands over, and is uploaded in computer with imaging sensor acquisition hologram；
(2) when measuring Stokes matrix parameter, polarization state modulating system is adjusted, makes to input light beam formation+45 ° or -45 ° of linear polarizations
Light, acquisition obtain the orthogonal hologram I of a width carrier frequency, and the COMPLEX AMPLITUDE for calculating object under test can obtain:
Ai(x, y)=IFT { C { FT { I (x, y) } Fi}}
Wherein: i=x, y, FiIndicate that filter, FT indicate Fourier transformation, IFT indicates inverse Fourier transform, and C indicates that frequency spectrum is set
Middle operation；
Obtain Stokes parameter matrix are as follows:
Wherein:For the phase difference of corrugated to be measured horizontally and vertically；
(3) when measuring Jones matrix parameter, polarization state modulating system is adjusted, makes to input light beam formation+45 ° or -45 ° of linear polarizations
Light, for the first time exposure acquisition obtain the orthogonal hologram I of the first width carrier frequency1；Polarization state modulating system is adjusted again, makes to input light beam
- 45 ° or+45 ° of linearly polarized lights are formed, second of exposure acquisition obtains the orthogonal hologram I of the second width carrier frequency2；
The COMPLEX AMPLITUDE for calculating object under test can obtain:
Ani(x, y)=IFT { C { FT { I (x, y) } Fni}}
Wherein: n=1,2, i=x, y, FniIndicate that filter, FT indicate Fourier transformation, IFT indicates inverse Fourier transform, C table
Show that frequency spectrum sets middle operation；
The then Jones matrix parameter of object under test are as follows:
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| CN108008615B (en) * | 2017-11-14 | 2019-07-26 | 清华大学 | Wide visual field compresses holographic imaging systems and method |
| CN108051089B (en) * | 2017-11-20 | 2020-11-20 | 西北工业大学 | Method and system for measuring polarization state of sample based on Wollaston prism |
| CN110375641B (en) * | 2019-07-19 | 2021-04-09 | 黑龙江大学 | Circular carrier frequency digital holographic detection device and method based on improved Michelson structure |
| CN112414298A (en) * | 2020-10-27 | 2021-02-26 | 衡阳市智谷科技发展有限公司 | Transmission type digital holographic microscopy test method for full polarization state measurement |
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