CN107101724A - A kind of polarization state measuring equipment holographic based on common railway digital and method - Google Patents
A kind of polarization state measuring equipment holographic based on common railway digital and method Download PDFInfo
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Abstract
The present invention provides a kind of polarization state measuring equipment holographic based on common railway digital and method, belongs to polarization state parameter measurement field.The present invention includes light source, Polarization Modulation system, collimating and beam expanding system, the first lens, unpolarized Amici prism, aperture speculum, polarization splitting prism, the first corner reflector, the second corner reflector, the second lens, imaging sensor, computer.Incident light is divided into after reference light and object light, and reference light is radiated on aperture speculum and reflected;Object light is divided into the orthogonal object light of two beam polarization states after polarization splitting prism, and is reflected back a branch of object light of polarization splitting prism synthesis by the first corner reflector and the second corner reflector;After object light and reference light converge, the first corner reflector of adjustment and the second corner reflector can generate the orthogonal hologram in carrier frequency direction on the image sensor;Hologram when+45 ° and 45 ° linearly polarized lights of exposure collection are incident respectively, Stokes matrixes parameter and Jones matrix parameters are obtained by computer.
Description
Technical field
The present invention relates to a kind of polarization state measuring equipment holographic based on common railway digital and method, belong to polarization state ginseng
Measurement field.
Background technology
Polarization state is to describe one of Important Parameters of light wave wavefront features, can be joined with Stokes matrixes parameter, Jones matrixes
Amount etc. is characterized, and it, which is measured, has important science meaning in fields such as bio-photon, nonlinear optics, chemistry and mineral matters
Justice and application value.But traditional measuring polarization state device can only provide the polarization of fixed position on front propagation direction to be measured
Information, and due to not possessing two-dimentional sampling nature, need to frequently adjust light path and multiexposure, multiple exposure to realize the measurement of polarization state property.
In order to improve the measurement efficiency of polarization state property parameter, domestic and foreign scholars have made many Beneficials, wherein, digital hologram due to
The amplitude and phase information of wavefront to be measured are recorded using interference technique, and reconstruct is completed by digital method, is the polarization of light beam
Quickly measurement is there is provided possible for the state property whole audience, so as to cause extensive concern.
The Gabriel Popescu in University of Illinois of U.S. champagne branch school etc. (Zhuo Wang, Larry J.Millet,
Martha U.Gillette,and Gabriel Popescu,"Jones phase microscopy of transparent
And anisotropic samples, " Opt.Lett.33,1270-1272 (2008)) realized using off-axis digital holography
Jones matrixes are measured, but the technology needs four exposure collections to realize Jones matrix parameter measurements, and measuring speed is limited;
Simultaneously as using separation light channel structure, poor anti jamming capability.
(Youngchan Kim, Joonwoo Jeong, the Jaeduck Jang, Mahn such as YongKeun Park of South Korea
Won Kim,and YongKeun Park,"Polarization holographic microscopy for extracting
Spatio-temporally resolved Jones matrix, " Opt.Express 20,9948-9955 (2012)) etc. profit
The orthogonal hologram of carrier frequency is generated with the holography of common railway digital, and then Jones matrixes parameter is realized by the collection that double exposes and is surveyed
Amount, while antijamming capability is improved, improves measurement efficiency.But this method needs two-dimensional grating and hole array to match,
And it is aided with two pieces of polarizers of polarized orthogonal, and it is not only complicated, and adjustment is difficult.
Patent CN 104198040B " holographic measurement method and implementation of a kind of two-dimentional Jones matrix parameter " utilize double
Two-dimensional grating light splitting technology, with reference to spectrum reuse technique, Jones matrix parameter measurements, but the dress can be realized by single exposure
Put and not only further increase system complexity, and light utilization efficiency, simultaneously as using using separation light channel structure, it is anti-interference
Ability.
Yuan's behaviour's the present of Nanjing Normal University etc., (Ma Jun, Yuan behaviour was modern, and Feng Shaotong, Nie Shouping " are based on digital hologram and multiplexing
The whole audience polarization state method of testing of technology ", Acta Physica Sinica .22,224204 (2013)) using polarization and angular multiplexing technology, lead to
Stokes matrixes parameter and Jones vector measurements can be realized by crossing single exposure, but because using using separation light channel structure, be resisted
Interference performance is poor;Simultaneously architectural limitation, the orthogonal frequency spectrum of polarization state is limited in spectrum space separation, in turn results in crosstalk, shadow
Ring the measurement accuracy of polarization state property.
The content of the invention
It is it is an object of the invention to the weak point for above-mentioned technology, polarization spectro modulation technique, spectrum orthogonal is multiple
Road technique is combined there is provided one kind is simple in construction with technology and altogether, the stable polarization state ginseng holographic based on common railway digital of system
Measuring device, and the polarization state parameter measurement side holographic based on common railway digital of a kind of satisfaction and the applicable above method is also provided
Method.
The object of the present invention is achieved like this:Be λ light source including wavelength, Polarization Modulation system, collimating and beam expanding system,
Object under test, the first lens, unpolarized Amici prism, aperture speculum, the second lens, imaging sensor and computer, are also wrapped
Polarization splitting prism, the first corner reflector and the second corner reflector are included, the light beam of light source transmitting is modulated through polarization state modulating system
Sequentially pass through to be formed after collimating and beam expanding system, object under test, the first lens and unpolarized Amici prism after into linearly polarized light and focus on
Reference light and object light;Reference light is radiated on aperture speculum and reflected, and object light is divided into two after polarization splitting prism
The orthogonal object light of beam polarization state, and the orthogonal object light of two beam polarization states is radiated at the first corner reflector and the second corner reflector respectively
Go up and reflected, again pass by and a branch of object light is merged into after polarization splitting prism;Reference light and object light by reflection are passed through again
Cross unpolarized Amici prism merge into it is a branch of after by the second lens;The first corner reflector and the second corner reflector are adjusted, makes two
The orthogonal object light of beam polarization state is orthogonal with the hologram carrier frequency direction with reference to photogenerated, and is gathered with imaging sensor on hologram
Pass in computer;The aperture speculum is located on the conjugate focal planes of the first lens and the second lens, and reflecting surface size
It is consistent in the Airy disc diameter d that Fourior plane is produced with wavelength X, wherein:d<1.22 λ f/D, f are Jiao of the first lens
Away from the visual field width that, D is imaging sensor;First corner reflector and the second corner reflector are located at the first lens and the second lens
On conjugate focal planes, and the first corner reflector adjustment object light is met in the horizontal direction with optical axis into θaAngle, the second corner reflector are adjusted
Whole object light is in vertical direction and optical axis into θbAngle;Or the first corner reflector adjustment object light is met in vertical direction and optical axis into θaAngle,
Second corner reflector adjustment object light is in the horizontal direction with optical axis into θbAngle.
Present invention additionally comprises some such architectural features:
1. polarization state modulating system combines realization with quarter wave plate by rotation linear polarizer or linear polarizer.
2. polarization splitting prism is set according to light splitting surface and optical axis normal plane are at 45 °.
3. microcobjective and correction object lens are also set gradually between object under test and the first lens.
4. a kind of polarization state parameter measuring method holographic based on common railway digital, including it is described holographic based on common railway digital
Polarization state measuring equipment, step is as follows:
(1) light source is opened, projects after wavelength is modulated for λ light beam through polarization state modulating system and forms linearly polarized light, successively
The reference light and object light of focusing are formed after collimating and beam expanding system, object under test, the first lens and unpolarized Amici prism;Ginseng
Light irradiation is examined on aperture speculum and is reflected;Object light is divided into the orthogonal thing of two beam polarization states after polarization splitting prism
Light, is radiated on the first corner reflector and the second corner reflector and is reflected respectively, again passes by and is synthesized after polarization splitting prism
A branch of object light;Reference light and two beam object lights by reflection through unpolarized Amici prism merge into it is a branch of after by the second lens;
The first corner reflector and the second corner reflector are adjusted, makes the orthogonal object light of two beam polarization states and the hologram carrier frequency with reference to photogenerated
Direction is orthogonal, and is uploaded to imaging sensor collection hologram in computer;
(2) when measuring Stokes matrix parameters, polarization state modulating system is adjusted, makes inputs light beam formation+45 ° or -45 ° of lines
Polarised light, collection obtains the orthogonal hologram I of a width carrier frequency, calculates the COMPLEX AMPLITUDE of object under test and can obtain:
Ai(x, y)=IFT { C { FT { I (x, y) } Fi}}
Wherein:I=x, y, FiWave filter is represented, FT represents Fourier transformation, and IFT represents inverse Fourier transform, and C represents frequency
Spectrum puts middle operation;
Obtaining Stokes parameter matrixs is:
Wherein:For the phase difference of corrugated to be measured horizontally and vertically;
(3) when measuring Jones matrix parameters, polarization state modulating system is adjusted, makes inputs light beam formation+45 ° or -45 ° of lines
Polarised light, for the first time exposure collection obtains the orthogonal hologram I of the first width carrier frequency1;Polarization state modulating system is adjusted again, makes input
Light beam formation -45 ° or+45 ° of linearly polarized lights, second of exposure collection obtain the orthogonal hologram I of the second width carrier frequency2;
Calculating the COMPLEX AMPLITUDE of object under test can obtain:
Ani(x, y)=IFT { C { FT { I (x, y) } Fni}}
Wherein:N=1,2, i=x, y, FniWave filter is represented, FT represents Fourier transformation, and IFT represents inverse Fourier transform,
C represents that frequency spectrum puts middle operation;
Then the Jones matrix parameters of object under test are:
Compared with prior art, the beneficial effects of the invention are as follows:1. on the basis of reflective carrier wave point diffraction altogether line structure,
Polarization spectro modulation technique and spectrum reuse technique are introduced, the orthogonal hologram of carrier frequency is formed, and complete using same device
Stokes matrixes parameter and Jones matrix parameter measurements, while antijamming capability is ensured, it is not necessary to two-dimensional grating, space
The special optical element such as filter array, method is simple and easy to apply, and this is to be different from one of innovative point of prior art;2. by inclined
A branch of 45 ° of linearly polarized light object lights are divided into two orthogonal beam object lights of polarization state by light splitting modulation technique of shaking, and only need to utilize double-corner reflection
Mirror places different postures can introduce orthogonal carrier frequency in two beam object lights, not only convenient, flexible, and can avoid to greatest extent
Crosstalk between frequency spectrum, this is the two of the innovative point for being different from prior art.
Apparatus of the present invention are simple in construction, and cost is low, are not required to the special opticals such as any two-dimensional grating, spatial filter array member
Part;Apparatus of the present invention constitute light channel structure altogether using reflection type point diffraction, and system rejection to disturbance ability is strong, and stability is good.
Brief description of the drawings
Fig. 1 is based on the holographic polarization state measuring equipment schematic diagram of common railway digital;
Fig. 2 is based on the holographic polarization state parameter measurement microscope equipment schematic diagram of common railway digital;
Fig. 3 a and Fig. 3 b are that this measurement apparatus measures two width holograms obtained by 45 ° of linear polarizers;
Fig. 4 a, Fig. 4 b, Fig. 4 c, Fig. 4 d are respectively that this measurement apparatus measures J obtained by 45 ° of linear polarizersxx、Jxy、Jyx、Jyy's
Amplitude schematic diagram;
In figure:1 light source, 2 polarization state modulating systems, 3 collimating and beam expanding systems, 4 objects under test, 5 first lens, 6 is unpolarized
Amici prism, 7 aperture speculums, 8 polarization splitting prisms, 9 first corner reflectors, 10 second corner reflectors, 11 second lens, 12
Imaging sensor, 13 computers, 14 microcobjectives and 15 correction object lens.
Embodiment
The present invention is described in further detail with embodiment below in conjunction with the accompanying drawings.
With reference to Fig. 1 to Fig. 4 c, the polarization state measuring equipment holographic based on common railway digital of the invention, including wavelength are
It is λ light source, Polarization Modulation system, collimating and beam expanding system, the first lens, unpolarized Amici prism, aperture speculum, second saturating
Mirror, imaging sensor, computer, the present invention are additionally provided with polarization splitting prism, the first corner reflector and the second corner reflector.Light source
The light beam of 1 transmitting is modulated into linearly polarized light through polarization state modulating system 2, sequentially passes through collimating and beam expanding system 3, object under test 4, the
The reference light and object light of focusing are formed after one lens 5 and unpolarized Amici prism 6;Reference light is radiated on aperture speculum 7 simultaneously
Reflected;Object light is divided into the orthogonal object light of two beam polarization states after polarization splitting prism 8, and the first corner reflector is radiated at respectively
9 and second on corner reflector 10 and are reflected, and again pass by and a branch of object light is merged into after polarization splitting prism 8;By reflection
Reference light and object light again pass by unpolarized Amici prism 6 merge into it is a branch of after, by the second lens 11 formation one width carrier frequency just
Hologram is handed over, is collected by imaging sensor 12 in computer;The first corner reflector 9 and the second corner reflector 10 are adjusted, makes two
The orthogonal object light of beam polarization state is orthogonal with the hologram carrier frequency direction with reference to photogenerated, and gathers hologram with imaging sensor 12
Upload in computer;Described aperture speculum is located on the conjugate focal planes of the first lens and the second lens, and reflecting surface
Size and wavelength X consistent, the wherein d in the Airy disc diameter d that Fourior plane is produced<1.22 λ f/D, f are the first lens
Focal length, D are the visual field width of imaging sensor;First corner reflector and the second corner reflector are located at the first lens and the second lens
Conjugate focal planes on, and the first corner reflector adjustment object light is in the horizontal direction with optical axis into θaAngle, the adjustment of the second corner reflector
Object light is in vertical direction and optical axis into θbAngle, or the first corner reflector adjustment object light in vertical direction and optical axis into θaAngle, second jiao
Reflector alignment object light is in the horizontal direction with optical axis into θbAngle.
Polarization state modulating system can combine realization with quarter wave plate by rotation linear polarizer or linear polarizer.
Polarization splitting prism is placed according to light splitting surface and optical axis normal plane are at 45 °.
Microcobjective and correction object lens can be also sequentially placed between object under test and the first lens.
Based on the holographic polarization state parameter measuring method of common railway digital, comprise the following steps:
(1) whole optical system is adjusted, light source is opened, after injection wavelength is modulated for λ light beam through polarization state modulating system
Linearly polarized light is formed, sequentially passes through and focusing is formed after collimating and beam expanding system, object under test, the first lens and unpolarized Amici prism
Reference light and object light;Reference light is radiated on aperture speculum and reflected;Object light is divided into two after polarization splitting prism
The orthogonal object light of beam polarization state, is radiated on the first corner reflector and the second corner reflector and is reflected respectively, again passes by partially
Shake and synthesize a branch of object light after Amici prism;Reference light and two beam object lights by reflection merge into a branch of through unpolarized Amici prism
Pass through the second lens afterwards;The first corner reflector and the second corner reflector are adjusted, makes the orthogonal object light of two beam polarization states and reference light
The hologram carrier frequency direction of generation is orthogonal, and is uploaded to imaging sensor collection hologram in computer;
(2) when measuring Stokes matrix parameters, polarization state modulating system is adjusted, makes inputs light beam+45 ° (or -45 °) of formation
Linearly polarized light, collection obtains the orthogonal hologram I of a width carrier frequency.
Calculating the COMPLEX AMPLITUDE of object under test can obtain:
Ai(x, y)=IFT { C { FT { I (x, y) } Fi}}
Wherein, i=x, y, FiWave filter is represented, FT { } represents Fourier transformation, and IFT represents inverse Fourier transform, C { } table
Show that frequency spectrum puts middle operation.
It is so as to obtain Stokes parameter matrixs:
Wherein,For the phase difference of corrugated to be measured horizontally and vertically.
(3) when measuring Jones matrix parameters, polarization state modulating system is adjusted, makes inputs light beam+45 ° (or -45 °) of formation
Linearly polarized light, for the first time exposure collection obtains the orthogonal hologram I of the first width carrier frequency1;Polarization state modulating system is adjusted again, is made defeated
Enter light beam -45 ° of (or+45 °) linearly polarized lights of formation, second of exposure collection obtains the orthogonal hologram I of the second width carrier frequency2;
Calculating the COMPLEX AMPLITUDE of object under test can obtain:
Ani(x, y)=IFT { C { FT { I (x, y) } Fni}}
Wherein, n=1,2, i=x, y, FniWave filter is represented, FT represents Fourier transformation, and IFT represents inverse Fourier transform,
C represents that frequency spectrum puts middle operation.
So as to the Jones matrix parameters of object under test are:
The embodiment of the present invention is elaborated with reference to Fig. 1 to Fig. 4 d.
The inventive system comprises:Light source 1, polarization state modulated structure 2, collimating and beam expanding system 3, object under test 4, first are saturating
Mirror 5, unpolarized Amici prism 6, aperture speculum 7, polarization splitting prism 8, the first corner reflector 9, the second corner reflector 10,
Two lens 11, imaging sensor 12, wherein light source 1 are wavelength 632.8nm lasers;Object under test 4 is located at before the first lens 5
On focal plane;Aperture speculum 7, the first corner reflector 9 and the second corner reflector 10 are located at the conjugation of the lens 11 of the first lens 2 second
On focal plane;The focal length of first lens 5 and the second lens 11 is f=200mm;Imaging sensor 12 is located at the second lens 11
On back focal plane;Aperture speculum is located on the conjugate focal planes of the first lens and the second lens, and reflecting surface size exists with wavelength X
The Airy disc diameter d that Fourior plane is produced is consistent, wherein d<1.22 λ f/D, f are that the focal length of the first lens, D are image
The visual field width of sensor;Microcobjective and correction object lens can also be sequentially placed between the lens 5 of object under test 4 and first, should
Method can be applied in micrometering.
The embodiment of the detection method of the present invention is as follows:
Light source 1 is opened, projects after wavelength is modulated for λ light beam through polarization state modulating system 2 and forms linearly polarized light, pass through successively
Cross the reference light and object light that focusing is formed after collimating and beam expanding system 3, object under test 4, the first lens 5 and unpolarized Amici prism 6;
Reference light is radiated on aperture speculum 7 and reflected;It is orthogonal that object light is divided into two beam polarization states after polarization splitting prism 8
Object light, is radiated on the first corner reflector 9 and the second corner reflector 10 and is reflected, again pass by polarization splitting prism 8 respectively
After synthesize a branch of object light;Reference light and two beam object lights by reflection through unpolarized Amici prism merge into it is a branch of after by second
Lens 11;The first corner reflector 9 and the second corner reflector 10 are adjusted, makes the orthogonal object light of two beam polarization states and reference photogenerated
Hologram carrier frequency direction is orthogonal, and is uploaded to the collection hologram of imaging sensor 12 in computer 13;
(2) when measuring Stokes matrix parameters, polarization state modulating system is adjusted, makes inputs light beam+45 ° (or -45 °) of formation
Linearly polarized light, collection obtains the orthogonal hologram I of a width carrier frequency.
Calculating the COMPLEX AMPLITUDE of object under test can obtain
Ai(x, y)=IFT { C { FT { I (x, y) } Fi}}
Wherein, i=x, y, FiWave filter is represented, FT { } represents Fourier transformation, and IFT { } represents inverse Fourier transform, C { }
Represent that frequency spectrum puts middle operation.
It is so as to obtain Stokes parameter matrixs
Wherein,For the phase difference of corrugated to be measured horizontally and vertically.
(3) when measuring Jones matrix parameters, polarization state modulating system is adjusted, makes inputs light beam+45 ° (or -45 °) of formation
Linearly polarized light, for the first time exposure collection obtains the orthogonal hologram I of the first width carrier frequency1;Polarization state modulating system is adjusted again, is made defeated
Enter light beam -45 ° of (or+45 °) linearly polarized lights of formation, second of exposure collection obtains the orthogonal hologram I of the second width carrier frequency2;
Calculating the COMPLEX AMPLITUDE of object under test can obtain
Ani(x, y)=IFT { C { FT { I (x, y) } Fni}}
Wherein, n=1,2, i=x, y, FniWave filter is represented, FT represents Fourier transformation, and IFT represents inverse Fourier transform,
C represents that frequency spectrum puts middle operation.
So as to the Jones matrix parameters of object under test are
To sum up, the invention provides based on the holographic polarization state measuring equipment of common railway digital and method, polarization is belonged to
State property fields of measurement.The present invention includes light source, Polarization Modulation system, collimating and beam expanding system, the first lens, unpolarized light splitting rib
Mirror, aperture speculum, polarization splitting prism, the first corner reflector, the second corner reflector, the second lens, imaging sensor, calculating
Machine.Incident light is divided into after reference light and object light, and reference light is radiated on aperture speculum and reflected;Object light passes through polarization spectro
It is divided into the orthogonal object light of two beam polarization states after prism, and polarization spectro rib is reflected back by the first corner reflector and the second corner reflector
Mirror synthesizes a branch of object light;After object light and reference light converge, the first corner reflector of adjustment and the second corner reflector can be in image sensings
The orthogonal hologram in carrier frequency direction is generated on device;Hologram when+45 ° and -45 ° linearly polarized lights of exposure collection are incident respectively, leads to
Cross computer and obtain Stokes matrixes parameter and Jones matrix parameters.Apparatus of the present invention are simple in construction, and cost is low, are not required to any
The special optical elements such as two-dimensional grating, spatial filter array;Apparatus of the present invention constitute light path knot altogether using reflection type point diffraction
Structure, system rejection to disturbance ability is strong, and stability is good.
Claims (5)
1. a kind of polarization state measuring equipment holographic based on common railway digital, including wavelength are λ light source, Polarization Modulation system
System, collimating and beam expanding system, object under test, the first lens, unpolarized Amici prism, aperture speculum, the second lens, image sensing
Device and computer, it is characterised in that:Also include polarization splitting prism, the first corner reflector and the second corner reflector, light source transmitting
Light beam be modulated into linearly polarized light through polarization state modulating system after sequentially pass through collimating and beam expanding system, object under test, the first lens
With the reference light and object light that focusing is formed after unpolarized Amici prism;Reference light is radiated on aperture speculum and reflected, thing
Light is divided into the orthogonal object light of two beam polarization states after polarization splitting prism, and the orthogonal object light of two beam polarization states is radiated at respectively
On first corner reflector and the second corner reflector and reflected, again pass by and a branch of object light is merged into after polarization splitting prism;Through
Cross reflection reference light and object light again pass by unpolarized Amici prism merge into it is a branch of after by the second lens;Adjust first jiao
Speculum and the second corner reflector, make the orthogonal object light of two beam polarization states orthogonal with the hologram carrier frequency direction with reference to photogenerated,
And uploaded to imaging sensor collection hologram in computer;The aperture speculum is located at the first lens and the second lens
On conjugate focal planes, and reflecting surface size is consistent in the Airy disc diameter d that Fourior plane is produced with wavelength X, wherein:d<
The visual field width that 1.22 λ f/D, f are the focal length of the first lens, D is imaging sensor;First corner reflector and the second corner reflector
On the conjugate focal planes of the first lens and the second lens, and meet the first corner reflector adjustment object light in the horizontal direction with light
Axle is into θaAngle, the second corner reflector adjustment object light are in vertical direction and optical axis into θbAngle;Or meet the first corner reflector adjustment object light
In vertical direction and optical axis into θaAngle, the second corner reflector adjustment object light are in the horizontal direction with optical axis into θbAngle.
2. a kind of polarization state measuring equipment holographic based on common railway digital according to claim 1, it is characterised in that:
Polarization state modulating system combines realization with quarter wave plate by rotation linear polarizer or linear polarizer.
3. a kind of polarization state measuring equipment holographic based on common railway digital according to claim 2, it is characterised in that:
Polarization splitting prism is set according to light splitting surface and optical axis normal plane are at 45 °.
4. a kind of polarization state measuring equipment holographic based on common railway digital according to claim 3, it is characterised in that:
Microcobjective and correction object lens are also set gradually between object under test and the first lens.
5. a kind of polarization state parameter measuring method holographic based on common railway digital, including described in claim 4 based on common way
The holographic polarization state measuring equipment of word, step is as follows:
(1) light source is opened, projects after wavelength is modulated for λ light beam through polarization state modulating system and forms linearly polarized light, sequentially pass through
The reference light and object light of focusing are formed after collimating and beam expanding system, object under test, the first lens and unpolarized Amici prism;Reference light
It is radiated on aperture speculum and is reflected;Object light is divided into the orthogonal object light of two beam polarization states after polarization splitting prism, point
It is not radiated on the first corner reflector and the second corner reflector and is reflected, again passes by and a branch of thing is synthesized after polarization splitting prism
Light;Reference light and two beam object lights by reflection through unpolarized Amici prism merge into it is a branch of after by the second lens;Adjustment the
One corner reflector and the second corner reflector, make the hologram carrier frequency direction of the orthogonal object light of two beam polarization states and reference photogenerated just
Hand over, and uploaded to imaging sensor collection hologram in computer;
(2) when measuring Stokes matrix parameters, polarization state modulating system is adjusted, makes inputs light beam formation+45 ° or -45 ° of linear polarizations
Light, collection obtains the orthogonal hologram I of a width carrier frequency, calculates the COMPLEX AMPLITUDE of object under test and can obtain:
Ai(x, y)=IFT { C { FT { I (x, y) } Fi}}
Wherein:I=x, y, FiWave filter is represented, FT represents Fourier transformation, and IFT represents inverse Fourier transform, and C represents that frequency spectrum is put
Middle operation;
Obtaining Stokes parameter matrixs is:
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<mo>|</mo>
<msub>
<mi>A</mi>
<mi>x</mi>
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<msup>
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</msup>
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<msup>
<mo>|</mo>
<mn>2</mn>
</msup>
</mrow>
</mtd>
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<mtr>
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<mo>|</mo>
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</mtd>
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</mfenced>
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Wherein:For the phase difference of corrugated to be measured horizontally and vertically;
(3) when measuring Jones matrix parameters, polarization state modulating system is adjusted, makes inputs light beam formation+45 ° or -45 ° of linear polarizations
Light, for the first time exposure collection obtains the orthogonal hologram I of the first width carrier frequency1;Polarization state modulating system is adjusted again, makes inputs light beam
- 45 ° or+45 ° of linearly polarized lights are formed, second of exposure collection obtains the orthogonal hologram I of the second width carrier frequency2;
Calculating the COMPLEX AMPLITUDE of object under test can obtain:
Ani(x, y)=IFT { C { FT { I (x, y) } Fni}}
Wherein:N=1,2, i=x, y, FniWave filter is represented, FT represents Fourier transformation, and IFT represents inverse Fourier transform, C tables
Show that frequency spectrum puts middle operation;
Then the Jones matrix parameters of object under test are:
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<mo>.</mo>
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CN110375641A (en) * | 2019-07-19 | 2019-10-25 | 黑龙江大学 | Based on the circle carrier frequency digital holographic detection device and method for improving Michelson structure |
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CN108008615A (en) * | 2017-11-14 | 2018-05-08 | 清华大学 | Wide visual field compresses holographic imaging systems and method |
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