CN107063635A - Optical module high/low temperature test device - Google Patents
Optical module high/low temperature test device Download PDFInfo
- Publication number
- CN107063635A CN107063635A CN201710291198.7A CN201710291198A CN107063635A CN 107063635 A CN107063635 A CN 107063635A CN 201710291198 A CN201710291198 A CN 201710291198A CN 107063635 A CN107063635 A CN 107063635A
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- CN
- China
- Prior art keywords
- optical module
- low temperature
- test device
- temperature test
- thermocouple probe
- Prior art date
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- 238000012360 testing method Methods 0.000 title claims abstract description 86
- 230000003287 optical effect Effects 0.000 title claims abstract description 83
- 239000000523 sample Substances 0.000 claims abstract description 51
- 230000007306 turnover Effects 0.000 claims description 3
- 238000005516 engineering process Methods 0.000 abstract description 7
- 238000006073 displacement reaction Methods 0.000 abstract description 6
- 238000009434 installation Methods 0.000 abstract description 3
- 238000010276 construction Methods 0.000 abstract 1
- 239000011521 glass Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 238000009833 condensation Methods 0.000 description 2
- 230000005494 condensation Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 241000208340 Araliaceae Species 0.000 description 1
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 description 1
- 235000003140 Panax quinquefolius Nutrition 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 235000008434 ginseng Nutrition 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000012774 insulation material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000005619 thermoelectricity Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/14—Supports; Fastening devices; Arrangements for mounting thermometers in particular locations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The present invention relates to a kind of optical module high/low temperature test device, it is to test optical module, and the optical module high/low temperature test device includes base and the testing jig being arranged on the base, and the optical module is placed on the testing jig；Thermocouple probe is provided with above the testing jig, the thermocouple probe is contacted with the optical module being placed on the testing jig, the thermocouple probe is fixed by support, the thermocouple probe of the optical module high/low temperature test device is fixed by support, with after optical module is fixed on the tester rack, thermocouple probe is directly contacted with optical module, so that the installation test technology is convenient, and because thermocouple probe will not be subjected to displacement phenomenon, the problem of test data is inaccurate is brought so as to avoid the displacement popped one's head in due to electroheat pair from changing, in addition, relative to existing technologies, the optical module high/low temperature test device is simple in construction.
Description
Technical field
The present invention relates to a kind of optical module high/low temperature test device.
Background technology
The ginseng under high/low temperature to optical module is needed in the production of the High Speeding Optical Transmitter-receiver Circuit transmitted currently used for long range
Number is calibrated, to ensure the stabilization of wavelength and luminous power.At present, incubator or the jet case with cloche interface are generally used
The temperature control source tested as high/low temperature, but the former efficiency is low, programming rate is slow, easily error, the latter's expensive, glass
The high-speed line that cover size can limit the design size of optical module test fixture plate, particularly high-speed optical module has cabling requirement, glass
The size limitation of glass cover can influence cabling.And both is all very inconvenient in terms of the temp probe of module to be measured is connected.Such as
Fruit can cause the change of probe positions to introduce more error of measured data using artificial stickup or by the way of placing.And glass
The gas outlet of glass cover is typically fixed, and the flowing of such air-flow is relatively fixed, for the optical module that test volume is larger, optical module table
The temperature distribution evenness in face can be bad.
The content of the invention
Test technology is installed conveniently it is an object of the invention to provide one kind, the optical module height of test accuracy can be improved
Warm test device.
To reach above-mentioned purpose, the present invention provides following technical scheme：A kind of optical module high/low temperature test device, to survey
Optical module, including base and the testing jig being arranged on the base are tried, the optical module is placed on the testing jig；It is described
Thermocouple probe is provided with above testing jig, the thermocouple probe is contacted with the optical module being placed on the testing jig,
The thermocouple probe is fixed by support.
Further：The support includes the fixed plate being located above the testing jig and is arranged in the fixed plate
Slipping block；The thermocouple probe be arranged in the fixed plate and can the fixed plate relatively towards being placed on the testing jig
The optical module direction movement；The slipping block can be moved relative to the fixed plate, and institute is driven during the slipping block movement
Thermocouple probe is stated towards the direction movement for the optical module being placed on the testing jig.
Further：Be fixed with the fixed plate on supporting plate, the supporting plate and offer through hole, the fixed plate with it is described
The cavity for housing the thermocouple probe is formed between supporting plate, one end of the thermocouple probe passes through the through hole, described
Movable part is fixed with thermocouple probe, the movable part is located in the cavity, is provided between the movable part and supporting plate
First elastic component, the slipping block is supported in the side of the movable part and the slipping block drives the movable part towards placement
During the direction movement of the optical module on the testing jig, the thermocouple probe is moved with the movable part.
Further：The second elastic component is provided between the slipping block and fixed plate, the second elastic component deformation is answered
The opposite direction of the slipping block towards movable part is driven to move during position.
Further：The optical module high/low temperature test device also includes the housing being arranged on the base and movable
Turnover door on the housing is installed, the housing, which encloses, to be set to form test chamber, and the testing jig is arranged on the survey
Intracavitary is tried, the fixed plate is fixed on the housing, and the side of the slipping block is provided with press part, the press part and work
Moving part is oppositely arranged on the both sides of the slipping block on the longitudinally along the optical module being placed in the fixed plate, described to support
Casting die is fixed on the door；When being turned under the door, the press part supports the slipping block and promotes the sliding
Block is moved towards the direction of movable part.
Further：The door and it is respectively arranged on the base with magnetic part.
Further：The air inlet that can be connected with temperature control source is provided with the housing.
Further：Some exhaust outlets are offered on the housing.
Further：Neonychium is provided with below the thermocouple.
Further：The optical module high/low temperature test device also includes the radiating group for being arranged on the testing jig side
Part.
The beneficial effects of the present invention are：The thermocouple probe of the optical module high/low temperature test device of the present invention passes through support
It is fixed, so that after optical module is fixed on the tester rack, thermocouple probe is directly contacted with optical module, so that the installation is tested
Technique is convenient, and because thermocouple probe will not be subjected to displacement phenomenon, so as to avoid the displacement popped one's head in due to electroheat pair from changing
And the problem of test data is inaccurate is brought, in addition, relative to existing technologies, the optical module high/low temperature test device structure
Simply.
Described above is only the general introduction of technical solution of the present invention, in order to better understand the technological means of the present invention,
And can be practiced according to the content of specification, below with presently preferred embodiments of the present invention and coordinate accompanying drawing describe in detail as after.
Brief description of the drawings
Fig. 1 is the structural representation of the optical module high/low temperature test device shown in one embodiment of the invention；
Fig. 2 is the optical cable of the optical module high/low temperature test device shown in Fig. 1；
Fig. 3 is the exploded view of part-structure in Fig. 1；
Fig. 4 is the structural representation of Fig. 1 medium-height trestles；
Fig. 5 be Fig. 4 in support part-structure schematic diagram；
Fig. 6 is the part-structure of Fig. 5 medium-height trestles in the structural representation on other direction；
Fig. 7 is the structural representation of fixed plate in Fig. 4.
Embodiment
With reference to the accompanying drawings and examples, the embodiment to the present invention is described in further detail.Implement below
Example is used to illustrate the present invention, but is not limited to the scope of the present invention.
Fig. 1 and Fig. 2 and Fig. 4 are referred to, a kind of optical module high/low temperature test device shown in a preferred embodiment of the present invention
To test optical module 10, the optical module high/low temperature test device includes base, the housing 2 being arranged on the base 1, activity
Turnover door 3 that formula is arranged on the housing 2, the testing jig 4 that is arranged on the base 1 and it is arranged on the housing
The radiating subassembly 5 of 2 sides.The housing 2, which encloses to set, is formed with test chamber (non-label), and the testing jig 4 is arranged on the test
Intracavitary.Cause condensation vapor to prevent the internal-external temperature difference of housing 2 excessive, the housing 2 and door 3 are insulation material.It is described
Door 3 is fixed on the housing 2 by hinge 6, and the structure of hinge 6 is conventional design, therefore be will not be repeated here.In order to protect
Demonstrate,prove and be respectively arranged with the closing that door 3 can be good, the door 3 and base 1 on magnetic part (not shown), the door 3
It is provided with handle 31.In the present embodiment, a-a directions are the longitudinally of optical module 10 in the visual angle on the basis of Fig. 1, Fig. 1.Institute
State and circuit board 7 is provided with base 1, be electrically connected between the circuit board 7 and testing jig 4, the housing 2 and door 3 are along light
The longitudinally arrangement of module 10.The radiating subassembly 5 is fan, when removing the housing 2 and door 3 at normal temperatures to optical mode
When block 10 is tested, fan cools to the optical module 10.
Fig. 2 and Fig. 4 are referred to, the top of the testing jig 4 is provided with thermocouple probe 8, and the thermocouple probe 8 is with putting
The upper surface of the optical module 10 on the testing jig 4 is put, the thermocouple probe 8 is fixed by support 9.The thermoelectricity
The lower section of even probe 8 is provided with neonychium (not shown), and the neonychium is fixed on the bottom of thermocouple probe 8 by way of stickup
Portion, the size of the neonychium can be 0.5mm, by setting the neonychium to avoid thermocouple by the upper table face pressure of optical module 10
Wound.Refer to Fig. 3 and Fig. 4 and combine Fig. 2, the support 9 includes being located at the fixed plate 91 of the top of testing jig 4 and is arranged on
Slipping block 92 in the fixed plate 91.In the present embodiment, the fixed plate 91 is fixed on the housing 2, really, and this is consolidated
Fixed board 91 can also be fixed on testing jig 4.The thermocouple probe 8 is arranged in the fixed plate 91 and can be relatively described solid
Fixed board 91 is moved towards the direction for the optical module 10 being placed on the testing jig 4；The slipping block 92 can be relatively described solid
Fixed board 91 is moved, and the slipping block 92 drives the thermocouple probe 8 towards the light being placed on the testing jig 4 when moving
The direction movement of module 10.In the present embodiment, the annexation between the slipping block 92, thermocouple probe 8 and fixed plate 91
It is specific as follows：Be fixed with the fixed plate 91 on supporting plate 93, the supporting plate 93 and offer through hole 931, the fixed plate 91 with
The cavity 94 for housing the thermocouple probe 8 is formed between the supporting plate 93, one end of the thermocouple probe 8 is described in
Movable part 95 is fixed with through hole 931, the thermocouple probe 8, the movable part 95 is located in the cavity 94, the activity
Be provided with the first elastic component 901 between part 95 and supporting plate 93, the slipping block 92 support in the side of the movable part 95 and
The slipping block 92 drive the movable part 95 towards the optical module 10 being placed on the testing jig 4 direction movement when,
The thermocouple probe 8 is moved with the movable part 95.In the present embodiment, first elastic component 901 is the first spring 901.For
It is more steady when causing the thermocouple probe 8 movement, offer two unthreaded holes 951, two light on the movable part 95
Optical axis 952 is provided with hole 951, one end of the optical axis 952 is fixed on the supporting plate 93, on two optical axises 952
First spring 901 is arranged with, two optical axises 952 are oppositely arranged on the both sides of the thermocouple probe 8.Refer to figure
5 and Fig. 6, in the present embodiment, arranges between the slipping block 92 and movable part 95 along the longitudinally of the optical module 10, institute
State slipping block 92 and have and compress face 921 in what inclined-plane was set, the movable part 95 have with it is described compress that face 921 is engaged it is oblique
Domatic 953, the face 921 that compresses is held in slope 953.The slipping block 92 is to be placed on along described on the testing jig 4
The optical module 10 longitudinally extension strip plate body, the slipping block 92 also has vertical plane 922, described vertical
Face 922 compresses the rear end of face 921 described in being located at, and the vertical plane 922 extends to be formed downward vertically from the rear end for compressing face 921.
The movable part 95 also has towards the stop face 954 of the vertical plane 922, when the face 921 that compresses is towards the oblique of movable part 92
Domatic 953 when being moved to certain distance, and the vertical plane 922 is supported with stop face 954, to prevent slipping block 92 and movable part 95
Excessively dislocation.
Fig. 5 is referred to 7, the second elastic component 902, second bullet are provided between the slipping block 92 and fixed plate 91
Property part 902 deformation drive the opposite direction of the slipping block 92 towards movable part 95 to move when resetting.The both sides of the slipping block 92 are convex
Stretch and be formed with projection 921, fixed column 922 is provided with the projection 921, second elastic component 902 is second spring, described
Second spring 902 is set in the fixed column 922, and the peace inserted for the fixed column 922 is provided with the fixed plate 91
Fill hole 911.It is provided with the fixed plate 91 on chute 912, the movable plate and is provided with sliding block 923, sliding block 923 is inserted into institute
State in chute 912 and can be relative to the chute 912 along optical module 10 longitudinally move.
Fig. 1 to Fig. 3 is referred to, the side of the slipping block 92 is provided with press part 96, the press part 96 and movable part
95 are oppositely arranged on the both sides of the slipping block 92, institute along along the longitudinally for the optical module 10 being placed in the fixed plate 91
Press part 96 is stated to be fixed on the door 3；When being turned under the door 3, the press part 96 supports the slipping block 92 simultaneously
The slipping block 92 is promoted to be moved towards the direction of movable part 95.In order to prevent rigid shock, the press part 96 and slipping block 92
Between be provided with the 3rd elastic component (not shown).The air inlet that can be connected with temperature control source (not shown) is provided with the housing 2
21, the air inlet 21 is by air-out hose connection (not shown), and when being in barotropic state in housing 2, door 3 can use normal temperature
The mode for entering gas at normal temperature dispels vapor, to reduce the risk of Water vapor condensation.Some exhaust outlets are offered on the housing 2
22, taken away with ensureing that the gas of temperature control source entrance can be diffused out uniformly in heat or heating, the present embodiment, the exhaust outlet 22 is set
Four are put, is oppositely arranged on respectively on four ends angle of housing, in other embodiments, the exhaust outlet 22 can be according to reality
Demand sets other quantity and its layout to arrange according to the actual requirements.
Application method of the above-mentioned optical module high/low temperature test device when installing detection optical module 10 is as follows：Pass through handle 31
Door 3 is dug, the testing jig 4 for being fixed with optical module 10 is put into test chamber, then under overturn the door 3, when the lower section of door 3
When, the press part 96 on door 3 is moved with door 3, and now press part 96 is overturn towards the direction of slipping block 92, when compressing
Part 96 is turned to after certain position, and press part 96 supports slipping block 92；When press part 96 continues to overturn mobile with door 3, the
Two springs 902 are compressed, while the press part 96 will promote slipping block 92 to be moved towards the direction of movable part 95；At the same time, with
Slipping block 92 to move, the face 921 that compresses of slipping block 92 compresses downwards the slope 953 of movable part 95, makes movable part 95 downward
It is mobile；When movable part 95 is moved down, the first spring 901 is compressed, and the thermocouple probe 8 on movable part 95 is moved down, until heat
The upper surface of thermocouple probe 8 and optical module 10, while thermocouple probe 8 is contacted with optical module 10, door 3 is closed.
After the completion of the detection of optical module 10, door 3 is opened, now, slipping block 92 loses press part 96 and is applied to after its pressure, sliding
Block 92 moves right and resetted in the presence of second spring 902, when slipping block 92 is during reset, on movable part 95
Pressure is gradually cancelled, and movable part 95 is moved up and resetted in the presence of the first spring 901, and thermocouple probe 8 is with activity
Part 95 is moved up with the upper surface away from optical module 10.In the present embodiment, by setting the first spring 901 and second spring
902 in addition to realizing auto-reset function, and it can also realize control clamping force.
In summary：The thermocouple probe 8 of above-mentioned optical module high/low temperature test device is fixed by support 9, to work as optical mode
After block 10 is fixed on testing jig 4, thermocouple probe 8 is directly contacted with optical module 10, so that the installation test technology side
Just, and because thermocouple probe 8 will not be subjected to displacement phenomenon, so as to avoid the displacement change due to thermocouple probe 8 and band
Carry out the problem of test data is inaccurate, in addition, relative to existing technologies, optical module high/low temperature test device structure letter
It is single.
Each technical characteristic of embodiment described above can be combined arbitrarily, to make description succinct, not to above-mentioned reality
Apply all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, the scope of this specification record is all considered to be.
Embodiment described above only expresses the several embodiments of the present invention, and it describes more specific and detailed, but simultaneously
Can not therefore it be construed as limiting the scope of the patent.It should be pointed out that coming for one of ordinary skill in the art
Say, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the protection of the present invention
Scope.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (10)
1. a kind of optical module high/low temperature test device, it is characterised in that to test optical module, including base and it is arranged on described
Testing jig on base, the optical module is placed on the testing jig；Thermocouple probe is provided with above the testing jig,
The thermocouple probe is contacted with the optical module being placed on the testing jig, and the thermocouple probe is fixed by support.
2. optical module high/low temperature test device as claimed in claim 1, it is characterised in that the support includes being located at described survey
Fixed plate and the slipping block being arranged in the fixed plate above examination frame；The thermocouple probe is arranged in the fixed plate
And can be moved relative to the fixed plate towards the direction for the optical module being placed on the testing jig；The slipping block can be relative
The fixed plate movement, drives the thermocouple probe towards the light being placed on the testing jig during slipping block movement
The direction movement of module.
3. optical module high/low temperature test device as claimed in claim 2, it is characterised in that support is fixed with the fixed plate
Through hole is offered on plate, the supporting plate, the chamber for housing the thermocouple probe is formed between the fixed plate and the supporting plate
Body, one end of the thermocouple probe passes through and movable part is fixed with the through hole, the thermocouple probe, the movable part position
In in the cavity, the first elastic component is provided between the movable part and supporting plate, the slipping block is supported in the movable part
Side and the slipping block drives the movable part towards the direction movement for the optical module being placed on the testing jig
When, the thermocouple probe is moved with the movable part.
4. optical module high/low temperature test device as claimed in claim 3, it is characterised in that between the slipping block and fixed plate
The second elastic component is provided with, the second elastic component deformation drives the opposite direction of the slipping block towards movable part to move when resetting.
5. optical module high/low temperature test device as claimed in claim 4, it is characterised in that the optical module high/low temperature test dress
Putting also includes the housing being arranged on the base and the turnover door being movably arranged on the housing, the housing
Enclose and set to form test chamber, the testing jig is arranged in the test chamber, the fixed plate is fixed on the housing, the cunning
The side for moving block is provided with press part, lengthwise side of the press part with movable part along the optical module being placed in the fixed plate
The both sides of the slipping block are oppositely arranged on upwards, and the press part is fixed on the door；When being turned under the door, institute
Press part is stated to support the slipping block and promote the slipping block to move towards the direction of movable part.
6. optical module high/low temperature test device as claimed in claim 5, it is characterised in that set respectively on the door and base
It is equipped with magnetic part.
7. optical module high/low temperature test device as claimed in claim 6, it is characterised in that being provided with the housing can be with control
The air inlet of warm source connection.
8. optical module high/low temperature test device as claimed in claim 6, it is characterised in that some rows are offered on the housing
Gas port.
9. optical module high/low temperature test device as claimed in claim 1, it is characterised in that be provided with guarantor below the thermocouple
Protection pad.
10. optical module high/low temperature test device as claimed in claim 1, it is characterised in that the optical module high/low temperature test
Device also includes the radiating subassembly for being arranged on the testing jig side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710291198.7A CN107063635B (en) | 2017-04-28 | 2017-04-28 | Optical module high-low temperature testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710291198.7A CN107063635B (en) | 2017-04-28 | 2017-04-28 | Optical module high-low temperature testing device |
Publications (2)
| Publication Number | Publication Date |
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| CN107063635A true CN107063635A (en) | 2017-08-18 |
| CN107063635B CN107063635B (en) | 2023-10-27 |
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| CN201710291198.7A Active CN107063635B (en) | 2017-04-28 | 2017-04-28 | Optical module high-low temperature testing device |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108709654A (en) * | 2018-07-26 | 2018-10-26 | 深圳市亚派光电器件有限公司 | Temperature testing device |
| CN110806272A (en) * | 2018-08-06 | 2020-02-18 | 宁波方太厨具有限公司 | Power strip temperature rise testing arrangement |
| CN111721440A (en) * | 2020-05-28 | 2020-09-29 | 武汉华工正源光子技术有限公司 | High-low temperature test system of optical module |
| CN113432835A (en) * | 2021-06-03 | 2021-09-24 | 厦门特仪科技有限公司 | Multi-cavity high-low temperature testing device and system thereof |
| CN114986409A (en) * | 2022-05-18 | 2022-09-02 | 苏州联讯仪器有限公司 | Clamping device for optical module, crimping box and error code testing equipment |
| CN115855295A (en) * | 2023-02-28 | 2023-03-28 | 瑞熙恩电气（珠海）有限公司 | Integrated industrial temperature measurement system and method based on pre-operation |
| CN116818119A (en) * | 2023-06-28 | 2023-09-29 | 苏州联讯仪器股份有限公司 | Testing device for testing optical module and water cooling system |
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