CN106961563A - Low noise wide dynamic range imaging sensor correlation multiple repairing weld circuit - Google Patents
Low noise wide dynamic range imaging sensor correlation multiple repairing weld circuit Download PDFInfo
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- CN106961563A CN106961563A CN201710180039.XA CN201710180039A CN106961563A CN 106961563 A CN106961563 A CN 106961563A CN 201710180039 A CN201710180039 A CN 201710180039A CN 106961563 A CN106961563 A CN 106961563A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
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Abstract
The present invention relates to a kind of related multiple repairing weld circuit of low noise wide dynamic range imaging sensor, the picture element signal that integrator is exported to pixel output state in the circuit is integrated；When integral result is less than the voltage threshold of setting, integral control unit control integrator carries out the integration of subsequent cycle, otherwise integral control unit control, which reads controlling switch closure, makes final integral result be output to AD conversion unit, and integral number of times is exported to data processing unit；AD conversion unit is transferred to data processing unit after final integral result is converted into quantized result data；Data processing unit obtains quantized result data divided by integral number of times last sampled result data.The present invention can carry out the integration of different number of times for different pixel output, reach to the multiple integration of small-signal, to the purpose of big signal appropriateness integration, imaging sensor low noise and wide dynamic range can be realized simultaneously.
Description
Technical field
The invention belongs to semiconductor image detection technology field, it is related to one kind and low noise is realized using related multiple repairing weld technology
The circuit of sound wide dynamic range imaging sensor.
Background technology
The noise of sensor can be reduced by the technology of related multiple repairing weld.A kind of typical related multiple repairing weld circuit is such as
Shown in Fig. 1 a, including integrator and reading controlling switch S5, wherein integrator is by amplifier AMP1, sampling capacitance C1, feedback electricity
Hold C2 and four switch S0, S1, S2, S3, S4 to constitute；The circuit is resetted by closure switch S0 to C2 and circuit first.
It is then turned off switching S0, closure switch S1 and S3, as shown in Figure 1 b；After signal stabilization on C1, switch S1 and S3 is disconnected, will
Picture element signal is sampled on electric capacity C1.Subsequently closure switch S2 and S4, as illustrated in figure 1 c, electric capacity C2 is transferred to by signal charge
On.Noise on pixel output state, can just be integrated by the phase described by iterative cycles Fig. 1 b and Fig. 1 c, due to
Irrelevant noise can be averaged after integration, and then the equivalent inpnt noise on Vpix (picture element signal) can be lowered.Its shortcoming
It is that Vpix effective amplitude of oscillation is reduced with the increase of integral number of times, causes the reduction of the total dynamic range of sensor.
The content of the invention
Repeatedly adopted the technical problem to be solved in the present invention is to provide a kind of low noise wide dynamic range imaging sensor correlation
Sample circuit, the circuit can keep the output of pixel constant, reduce the equivalent inpnt noise of pixel, so as to realize that image is passed simultaneously
Sensor low noise and wide dynamic range.
In order to solve the above-mentioned technical problem, the related multiple repairing weld electricity of low noise wide dynamic range imaging sensor of the invention
Road includes integrator, and integral control unit reads controlling switch, AD conversion unit, data processing unit；The integrator connects
The picture element signal of reproduced image element output state output is simultaneously integrated to it；It is defeated that integral control unit gathers each cyclic integrator
The integral result gone out, when integral result is less than the voltage threshold of setting, output signal control integrator carries out the product of subsequent cycle
Point, when integral result is more than or equal to the voltage threshold of setting, output signal control, which reads controlling switch closure, makes final integration knot
Fruit is output to AD conversion unit, while integral number of times is exported to data processing unit；AD conversion unit will be integrated finally
As a result data processing unit is transferred to after being converted to quantized result data；Data processing unit is by quantized result data divided by integration
Number of times obtains last sampled result data.
The integral control unit includes logic circuit and analog comparator；Analog comparator is defeated by each cyclic integrator
The integral result gone out is compared with the voltage threshold set, and comparative result is exported to logic circuit, when integral result is small
When the voltage threshold of setting, logic circuit output signal control integrator carries out the integration of subsequent cycle, when integral result is big
When the voltage threshold of setting, logic circuit output signal control, which reads controlling switch closure, makes final integral result be output to mould
Number converting unit, while integral number of times is exported to AD conversion unit.
The integral control unit includes logic circuit, analog to digital conversion circuit, digital comparator；Analog-digital conversion circuit as described
The integral result that integrator is exported is converted to and exported after data signal to digital comparator；Digital comparator is by the data signal
It is compared with the voltage threshold of setting, and comparative result is exported to logic circuit, when data signal is less than the voltage of setting
During threshold value, logic circuit output signal control integrator carries out the integration of subsequent cycle, when data signal is more than the voltage of setting
During threshold value, logic circuit output signal control, which reads controlling switch closure, makes final integral result be output to AD conversion unit,
Integral number of times is exported to AD conversion unit simultaneously.
Invented the present invention be directed to the special mechanism of imaging sensor noise.Total noise of imaging sensor has following spy
Point：When the number of photons for being input to pixel is less, total equivalent inpnt noise of sensor is determined by the reading circuit noise of pixel,
Therefore need the noise reduction technology by multiple correlated sampling reduces to circuit noise；And when be input to the number of photons of pixel compared with
When many, total equivalent inpnt noise of sensor determines (shot noise of photon) by the quantity of photon in itself, and at this moment circuit is made an uproar
Sound can be ignored, therefore not need related multiple repairing weld circuit to reduce the noise of reading circuit.The present invention is by product
The result of device is divided to be monitored, to determine whether to continue executing with integral cycle.It can thus be carried out for different pixel output
The integration of different number of times, reaches to the multiple integration of small-signal, the purpose moderately integrated to big signal.The present invention can keep pixel
Output is constant, reduces the equivalent inpnt noise of pixel, so as to realize imaging sensor low noise and wide dynamic range simultaneously.
Brief description of the drawings
The present invention is described in further detail with reference to the accompanying drawings and detailed description.
Fig. 1 a are the structural representations of the related multiple repairing weld circuit of prior art；Fig. 1 b, Fig. 1 c are that prior art is related more
Secondary two operating phase schematic diagrames of sample circuit.
Fig. 2 is the related multiple repairing weld electrical block diagram of low noise wide dynamic range imaging sensor of the present invention.
Fig. 3 is the structural representation of embodiments of the invention 1.
Fig. 4 is the structural representation of embodiments of the invention 2.
Embodiment
Embodiment 1
As shown in Figure 2,3, the related multiple repairing weld circuit of low noise wide dynamic range imaging sensor of the invention includes product
Divide device, integral control unit reads controlling switch, AD conversion unit, data processing unit；The integral control unit includes
Logic circuit and analog comparator.
The integrator receives the picture element signal Vpix of pixel output state output and it is integrated；Simulation is compared
The integral result V that device exports each cyclic integratoriWith the voltage threshold V of setting0It is compared, works as ViLess than V0When, logic
Circuit output signal control integrator carries out the integration of subsequent cycle, works as ViMore than or equal to V0When, logic circuit output signal control
Reading controlling switch S5 closures makes final integral result transmit to AD conversion unit, and the i of order now is equal to integral number of times K, then
Integral number of times K is transferred to data processing unit simultaneously；Final integral result is converted to quantized result number by AD conversion unit
According to being transferred to data processing unit after A；Data processing unit obtains quantized result data A divided by integral number of times last sampling
Result data Y.
Embodiment 2
As shown in Figure 2,4, the related multiple repairing weld circuit of low noise wide dynamic range imaging sensor of the invention includes product
Divide device, integral control unit reads controlling switch, AD conversion unit, data processing unit；The integral control unit includes
Logic circuit, analog to digital conversion circuit and digital comparator.
The integrator receives the picture element signal Vpix of pixel output state output and it is integrated；Analog-to-digital conversion
The integral result that integrator is exported is converted to data signal V by circuiti' export afterwards to digital comparator；Digital comparator is by Vi’
With the voltage threshold V of setting0It is compared, works as Vi' it is less than or equal to V0When, under logic circuit output signal control integrator is carried out
The integration of one circulation, works as ViMore than or equal to V0When, logic circuit output signal control, which reads controlling switch S5 closures, makes final integration
As a result transmit to AD conversion unit, the i of order now is equal to integral number of times K, then integral number of times K is transferred into data processing simultaneously
Unit；AD conversion unit is transferred to data processing unit after final integral result is converted into quantized result data A；At data
Reason unit obtains quantized result data A divided by integral number of times last sampled result data Y.
If K bit wide is N-bit, the quantized result data A of AD conversion unit bit wide is M-bit ADC.By number
After processing, the quantified precision of final result is that (K maximums are equal to 2 to 1LSB (M-bit ADC minimum quantization step-length) divided by KN),
Therefore minimum quantization step-length is 1LSB/ (2N), therefore total quantization bit wide is (M+N) bit.
Claims (3)
1. a kind of related multiple repairing weld circuit of low noise wide dynamic range imaging sensor, including integrator, read controlling switch；
Characterized by further comprising integral control unit, AD conversion unit, data processing unit, the integrator receives pixel output
The picture element signal of buffer output is simultaneously integrated to it；Integral control unit gathers the integration knot of each cyclic integrator output
Really, when integral result is less than the voltage threshold of setting, output signal control integrator carries out the integration of subsequent cycle, works as integration
Output signal control, which reads controlling switch closure, when being as a result more than or equal to the voltage threshold of setting is output to final integral result
AD conversion unit, while integral number of times is exported to data processing unit；AD conversion unit changes final integral result
To be transferred to data processing unit after quantized result data；Data processing unit obtains quantized result data divided by integral number of times
Last sampled result data.
2. the related multiple repairing weld circuit of low noise wide dynamic range imaging sensor according to claim 1, its feature exists
Include logic circuit and analog comparator in the integral control unit；The product that analog comparator exports each cyclic integrator
Point result and the voltage threshold of setting are compared, and comparative result is exported to logic circuit, when integral result is less than setting
Voltage threshold when, logic circuit output signal control integrator carry out subsequent cycle integration, when integral result be more than setting
Voltage threshold when, logic circuit output signal control read controlling switch closure final integral result is output to analog-to-digital conversion
Unit, while integral number of times is exported to AD conversion unit.
3. the related multiple repairing weld circuit of low noise wide dynamic range imaging sensor according to claim 1, its feature exists
Include logic circuit, analog to digital conversion circuit, digital comparator in the integral control unit；Analog-digital conversion circuit as described will be integrated
The integral result of device output, which to be converted to, exported after data signal to digital comparator；Digital comparator is by the data signal with setting
Voltage threshold be compared, and comparative result is exported to logic circuit, when data signal is less than the voltage threshold of setting,
Logic circuit output signal control integrator carries out the integration of subsequent cycle, when data signal is more than the voltage threshold of setting,
Logic circuit output signal control, which reads controlling switch closure, makes final integral result be output to AD conversion unit, while will product
Gradation number is exported to AD conversion unit.
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| CN201710180039.XA CN106961563B (en) | 2017-03-24 | 2017-03-24 | Low-noise wide-dynamic-range image sensor related multi-sampling circuit |
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| CN201710180039.XA CN106961563B (en) | 2017-03-24 | 2017-03-24 | Low-noise wide-dynamic-range image sensor related multi-sampling circuit |
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| CN106961563B CN106961563B (en) | 2020-07-28 |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108064446A (en) * | 2017-10-20 | 2018-05-22 | 深圳市汇顶科技股份有限公司 | Simulate reading circuit and image sensing module |
| WO2020048404A1 (en) * | 2018-09-05 | 2020-03-12 | 江苏美的清洁电器股份有限公司 | Signal processing circuit and device, and vacuum cleaner |
| CN111093043A (en) * | 2018-10-24 | 2020-05-01 | 宁波飞芯电子科技有限公司 | Radiation receiving system and method and sensing array |
| CN112449125A (en) * | 2019-08-29 | 2021-03-05 | 天津大学青岛海洋技术研究院 | Image sensor reading circuit based on self-adaptive threshold adjustment |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1993016552A1 (en) * | 1992-02-06 | 1993-08-19 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Multiple-sampling process |
| EP1237357A3 (en) * | 2001-03-02 | 2003-12-10 | LENZ, Reimar | Digital camera with improved dynamic using CMOS image sensor and method for driving the CMOS image sensor |
| JP2004032212A (en) * | 2002-06-24 | 2004-01-29 | Nippon Hoso Kyokai <Nhk> | Imaging device |
| WO2011119466A2 (en) * | 2010-03-22 | 2011-09-29 | Hologic Inc. | Decorrelated channel sampling for digital imaging |
| JP2013098598A (en) * | 2011-10-28 | 2013-05-20 | Konica Minolta Advanced Layers Inc | Imaging apparatus |
| JP2015023391A (en) * | 2013-07-18 | 2015-02-02 | 株式会社ニコン | Solid-state image pickup device |
| CN104378559A (en) * | 2013-08-14 | 2015-02-25 | 三星电子株式会社 | Image sensor and analog to digital converter and analog to digital converting method thereof |
| US20150268360A1 (en) * | 2014-03-20 | 2015-09-24 | Texas Instruments Incorporated | Multi-sampling in x-ray receiver for noise reduction |
| US20160014361A1 (en) * | 2014-07-09 | 2016-01-14 | Commissariat à l'énergie atomique et aux énergies alternatives | Correlated multiple sampling cmos image sensor |
| CN105323504A (en) * | 2014-07-11 | 2016-02-10 | 株式会社东芝 | Solid-state image pickup device and method of controlling solid-state image pickup device |
| JP2016042650A (en) * | 2014-08-18 | 2016-03-31 | ソニー株式会社 | Semiconductor photodetector, radiation counter and control method of semiconductor photodetector |
| CN105635606A (en) * | 2014-11-26 | 2016-06-01 | 全视科技有限公司 | Method and system for implementing correlated multi-sampling with improved analog-to-digital converter linearity |
| CN106101585A (en) * | 2016-07-27 | 2016-11-09 | 中国科学院西安光学精密机械研究所 | Low-noise CCD camera circuit |
-
2017
- 2017-03-24 CN CN201710180039.XA patent/CN106961563B/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1993016552A1 (en) * | 1992-02-06 | 1993-08-19 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Multiple-sampling process |
| EP1237357A3 (en) * | 2001-03-02 | 2003-12-10 | LENZ, Reimar | Digital camera with improved dynamic using CMOS image sensor and method for driving the CMOS image sensor |
| JP2004032212A (en) * | 2002-06-24 | 2004-01-29 | Nippon Hoso Kyokai <Nhk> | Imaging device |
| WO2011119466A2 (en) * | 2010-03-22 | 2011-09-29 | Hologic Inc. | Decorrelated channel sampling for digital imaging |
| JP2013098598A (en) * | 2011-10-28 | 2013-05-20 | Konica Minolta Advanced Layers Inc | Imaging apparatus |
| JP2015023391A (en) * | 2013-07-18 | 2015-02-02 | 株式会社ニコン | Solid-state image pickup device |
| CN104378559A (en) * | 2013-08-14 | 2015-02-25 | 三星电子株式会社 | Image sensor and analog to digital converter and analog to digital converting method thereof |
| US20150268360A1 (en) * | 2014-03-20 | 2015-09-24 | Texas Instruments Incorporated | Multi-sampling in x-ray receiver for noise reduction |
| US20160014361A1 (en) * | 2014-07-09 | 2016-01-14 | Commissariat à l'énergie atomique et aux énergies alternatives | Correlated multiple sampling cmos image sensor |
| CN105323504A (en) * | 2014-07-11 | 2016-02-10 | 株式会社东芝 | Solid-state image pickup device and method of controlling solid-state image pickup device |
| JP2016042650A (en) * | 2014-08-18 | 2016-03-31 | ソニー株式会社 | Semiconductor photodetector, radiation counter and control method of semiconductor photodetector |
| CN105635606A (en) * | 2014-11-26 | 2016-06-01 | 全视科技有限公司 | Method and system for implementing correlated multi-sampling with improved analog-to-digital converter linearity |
| CN106101585A (en) * | 2016-07-27 | 2016-11-09 | 中国科学院西安光学精密机械研究所 | Low-noise CCD camera circuit |
Non-Patent Citations (1)
| Title |
|---|
| SUNGHO SUH等: "《Column-Parallel Correlated Multiple Sampling Circuits for CMOS Image Sensors and Their Noise Reduction Effects》", 《SENSORS》 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108064446A (en) * | 2017-10-20 | 2018-05-22 | 深圳市汇顶科技股份有限公司 | Simulate reading circuit and image sensing module |
| WO2019075749A1 (en) * | 2017-10-20 | 2019-04-25 | 深圳市汇顶科技股份有限公司 | Analog read circuit and image sensing module |
| CN108064446B (en) * | 2017-10-20 | 2020-11-20 | 深圳市汇顶科技股份有限公司 | Analog reading circuit and image sensing module |
| WO2020048404A1 (en) * | 2018-09-05 | 2020-03-12 | 江苏美的清洁电器股份有限公司 | Signal processing circuit and device, and vacuum cleaner |
| CN111093043A (en) * | 2018-10-24 | 2020-05-01 | 宁波飞芯电子科技有限公司 | Radiation receiving system and method and sensing array |
| CN111093043B (en) * | 2018-10-24 | 2021-10-22 | 宁波飞芯电子科技有限公司 | Radiation receiving system and method and sensing array |
| CN112449125A (en) * | 2019-08-29 | 2021-03-05 | 天津大学青岛海洋技术研究院 | Image sensor reading circuit based on self-adaptive threshold adjustment |
| CN112449125B (en) * | 2019-08-29 | 2022-06-17 | 天津大学青岛海洋技术研究院 | Image sensor reading circuit based on self-adaptive threshold adjustment |
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Inventor after: Liu Yang Inventor after: Guo Yangyu Inventor after: Wang Xinyang Inventor after: Ma Cheng Inventor after: Li Yang Inventor before: Liu Yang Inventor before: Guo Yangyu Inventor before: Wang Xinyang Inventor before: Ma Cheng Inventor before: Li Yang |
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Address after: Office Buildings 1 and 5, Phase I, Optoelectronic Information Industry Park, No. 7691 Ziyou Road, Changchun Economic and Technological Development Zone, Jilin Province, 130000 Patentee after: Changchun Changguang Chenxin Microelectronics Co.,Ltd. Address before: No. 588, Yingkou Road, Jingkai District, Changchun City, Jilin Province, 130033 Patentee before: Changchun Changguangchenxin Optoelectronics Technology Co.,Ltd. |
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