CN106998433A - Related multiple repairing weld method and circuit for wide dynamic range imaging sensor - Google Patents

Related multiple repairing weld method and circuit for wide dynamic range imaging sensor Download PDF

Info

Publication number
CN106998433A
CN106998433A CN201710180040.2A CN201710180040A CN106998433A CN 106998433 A CN106998433 A CN 106998433A CN 201710180040 A CN201710180040 A CN 201710180040A CN 106998433 A CN106998433 A CN 106998433A
Authority
CN
China
Prior art keywords
picture element
element signal
result data
integrator
integral number
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710180040.2A
Other languages
Chinese (zh)
Inventor
刘洋
郭杨钰
王欣洋
马成
李杨
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GPIXEL Inc
Original Assignee
GPIXEL Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GPIXEL Inc filed Critical GPIXEL Inc
Priority to CN201710180040.2A priority Critical patent/CN106998433A/en
Publication of CN106998433A publication Critical patent/CN106998433A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/71Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75Circuitry for providing, modifying or processing image signals from the pixel array

Abstract

The related multiple repairing weld method for wide dynamic range imaging sensor of the present invention, this method is as follows:Integral number of times K is determined according to the picture element signal size that pixel output state is exported, the smaller then integral number of times K of picture element signal is bigger;The picture element signal that control integrator exports pixel output state is integrated K times;Result progress analog-to-digital conversion to K integration of picture element signal obtains quantized result data;Quantized result data divided by integral number of times K are obtained to last sampled result data.The present invention is directed to the integral number of times of different size of picture element signal active control integrator, both the multiple integral mean to details in a play not acted out on stage, but told through dialogues can have been realized, integral number of times can be reduced in bright field again, can avoided because integrator exports saturation to the influence caused by the effective amplitude of oscillation of pixel output signal.

Description

Related multiple repairing weld method and circuit for wide dynamic range imaging sensor
Technical field
The invention belongs to semiconductor image detection technology field, it is related to a kind of phase for wide dynamic range imaging sensor Close multiple repairing weld method and circuit.
Background technology
The noise of sensor can be reduced by the technology of related multiple repairing weld.A kind of typical related multiple repairing weld circuit is such as Shown in Fig. 1 a, including integrator and reading controlling switch S5, wherein integrator is by amplifier AMP1, sampling capacitance C1, feedback electricity Hold C2 and five switch S0, S1, S2, S3, S4 to constitute;The circuit is resetted by closure switch S0 to C2 and circuit first. It is then turned off switching S0, closure switch S1 and S3, as shown in Figure 1 b;After signal stabilization on C1, switch S1 and S3 is disconnected, will Picture element signal is sampled on electric capacity C1.Subsequently closure switch S2 and S4, as illustrated in figure 1 c, electric capacity C2 is transferred to by signal charge On.Noise on pixel output state, can just be integrated by the phase described by iterative cycles Fig. 1 b and Fig. 1 c, integrate Closure reads controlling switch S5 and can read integral result after circulation terminates.Because irrelevant noise can be put down after integration , the equivalent inpnt noise then on Vpix (picture element signal) can be lowered.It has the disadvantage Vpix effective amplitude of oscillation with integration The increase of number of times and reduce, cause the reduction of the total dynamic range of sensor.
The content of the invention
The invention solves the problems that a technical problem be to provide it is a kind of for wide dynamic range imaging sensor correlation it is many The secondary method of sampling and circuit, this method can keep the output of pixel constant, the equivalent inpnt noise of pixel be reduced, so as to simultaneously Realize imaging sensor low noise and wide dynamic range.
In order to solve the above-mentioned technical problem, the related multiple repairing weld side for wide dynamic range imaging sensor of the invention Method, it is characterised in that comprise the steps:
Step 1: the picture element signal size exported according to pixel output state determines integral number of times K, picture element signal is smaller Then integral number of times K is bigger;
Step 2: the picture element signal that control integrator exports pixel output state is integrated K times;
Step 3: the result progress analog-to-digital conversion to K integration of picture element signal obtains quantized result data;
Step 4: quantized result data divided by integral number of times K to be obtained to last sampled result data.
A kind of circuit for realizing the above-mentioned related multiple repairing weld method for wide dynamic range imaging sensor, can be with following Three kinds of technical schemes.
Technical scheme one
A kind of circuit for realizing the above-mentioned related multiple repairing weld method for wide dynamic range imaging sensor, including pixel Output state, integrator reads controlling switch;Characterized by further comprising the first AD conversion unit, logic control element, Second AD conversion unit, data processing unit;The pixel output state exports picture element signal to integrator and first AD conversion unit;Picture element signal is converted to pixel digital signals K by the first AD conversion unit0, logic control element will set The integral number of times threshold limit value K putmaxWith K0Subtract each other and obtain picture element signal integral number of times K;Then logic control element will integrate secondary Number K is transferred to data processing unit, while output control signal makes integrator integrate picture element signal K times;Integration is closed after terminating Close and read controlling switch, K integral result of picture element signal is converted to and exported after quantized result data A by the second AD conversion unit To data processing unit;Quantized result data A divided by integral number of times K are obtained sampled result data Y by data processing unit.
Technical scheme two
A kind of circuit for realizing the above-mentioned related multiple repairing weld method for wide dynamic range imaging sensor, including pixel Output state, integrator reads controlling switch;Characterized by further comprising pre- comparator, logic control element, analog-to-digital conversion Unit, data processing unit;The pixel output state exports picture element signal to integrator and pre- comparator;Pre- comparator Comparative result data are transferred to logic control element after multiple voltage steps of picture element signal and setting are compared;Logic Control unit controls integrator to integrate picture element signal K times according to comparative result data, while integral number of times K is transferred into modulus Converting unit;Closure reads controlling switch after integration terminates, and AD conversion unit is by K integral result amount of being converted to of picture element signal Exported after changing result data A to data processing unit;Data processing unit obtains quantized result data A divided by integral number of times K Sampled result data Y.
The pre- comparator sets multiple voltage step V1、V2、……、Vn, pre- comparator is by picture element signal Vpix and voltage Step V1、V2、……、VnComparative result the data K, picture element signal Vpix that bit wide N-bit is obtained after being compared smaller compare knot Fruit data K is bigger;Logic control element controls integrator to integrate picture element signal K times according to comparative result data K.
The pre- comparator sets multiple voltage step V1’、V2’、……、Vn’;Pre- comparator by picture element signal Vpix with Voltage step V1’、V2’、……、Vn' be compared after obtain bit wide N-bit comparative result data K0, picture element signal Vpix gets over Small comparative result data K0It is smaller;Logic control element is by the bit wide N-bit of setting integral number of times threshold limit value KmaxWith K0Phase Subtract and obtain picture element signal integral number of times K;Then logic control element output control signal makes integrator accumulate picture element signal Vpix Divide K times.
Technical scheme three
A kind of circuit for realizing the above-mentioned related multiple repairing weld method for wide dynamic range imaging sensor, including pixel Output state, integrator reads controlling switch;Characterized by further comprising B AD conversion units, the pre- comparators of B, logic control Unit processed, AD conversion unit, data processing unit;The pixel output state exports picture element signal to integrator and B Pre- comparator;Picture element signal Vpix is converted to and the pre- comparators of B is transferred to after data signal by B AD conversion units, the pre- comparators of B Comparative result data are transferred to logic control element after multiple voltage steps of picture element signal and setting are compared;Logic Control unit controls integrator to integrate picture element signal K times according to comparative result data, while integral number of times K is transferred into modulus Converting unit;Closure reads controlling switch after integration terminates, and AD conversion unit is by K integral result amount of being converted to of picture element signal Exported after changing result data A to data processing unit;Data processing unit obtains quantized result data A divided by integral number of times K Sampled result data Y.
The pre- comparators of B are digital comparator, and the digital comparator sets multiple voltage step V1、V2、……、Vn;B Picture element signal Vpix is converted to and the pre- comparators of B is transferred to after data signal by AD conversion unit, then by the pre- comparators of B by its with Voltage step V1、V2、……、VnThe bit wide N-bit smaller ratio of comparative result data K, picture element signal Vpix is obtained after being compared It is bigger compared with result data K;Logic control element controls integrator to integrate picture element signal K times according to comparative result data K.
The pre- comparators of B are digital comparator, and the digital comparator sets multiple voltage step V1’、V2’、……、 Vn’;Picture element signal Vpix is converted to and the pre- comparators of B is transferred to after data signal by B AD conversion units, then by the pre- comparators of B By itself and voltage step V1’、V2’、……、Vn' be compared after obtain bit wide N-bit comparative result data K0, picture element signal The smaller comparative result data K of Vpix0It is smaller;Logic control element is by the bit wide N-bit of setting integral number of times threshold limit value Kmax With K0Subtract each other and obtain picture element signal integral number of times K;Then logic control element output control signal makes integrator to picture element signal Vpix is integrated K times.
Total noise of imaging sensor has following features:When the number of photons for being input to pixel is less, sensor it is total etc. Effect input noise is determined by the reading circuit noise of pixel, it is therefore desirable to circuit is made an uproar by the noise reduction technology of multiple correlated sampling Sound is reduced;And when the number of photons for being input to pixel is more, the number of total equivalent inpnt noise of sensor by photon in itself Amount determines (shot noise of photon), and at this moment the noise of circuit can be ignored, therefore need not related multiple repairing weld circuit To reduce the noise of reading circuit.The picture element signal size that the present invention is exported according to pixel output state determines integral number of times, By rationally designing the digit of first, second AD conversion unit, or pre- comparator comparative level and AD conversion unit Digit can just realize the low noise and wide dynamic range of sensor simultaneously.The circuit is for the special of imaging sensor noise Mechanism is invented.
The present invention is directed to the integral number of times of different size of picture element signal active control integrator, can both realize to details in a play not acted out on stage, but told through dialogues The multiple integral mean of (output signal of pixel and Vref difference are small), again can (pixel output signal and Vref be poor in bright field Value is larger) when reduce integral number of times, can avoid because integrator export saturation to the shadow caused by the effective amplitude of oscillation of pixel output signal Ring.
Brief description of the drawings
The present invention is described in further detail with reference to the accompanying drawings and detailed description.
Fig. 1 a are the structural representations of the related multiple repairing weld circuit of prior art;Fig. 1 b, Fig. 1 c are that prior art is related more Secondary two operating phase schematic diagrames of sample circuit.
Fig. 2 is the related multiple repairing weld method flow diagram for wide dynamic range imaging sensor of the present invention.
Fig. 3 is the signal of the related multiple repairing weld circuit embodiments 1 for wide dynamic range imaging sensor of the present invention Figure.
Fig. 4 is showing for the related multiple repairing weld circuit embodiments 2,3 for wide dynamic range imaging sensor of the present invention It is intended to.
Fig. 5 is showing for the related multiple repairing weld circuit embodiments 4,5 for wide dynamic range imaging sensor of the present invention It is intended to.
Embodiment
As shown in Fig. 2 the related multiple repairing weld method for wide dynamic range imaging sensor of the present invention, specifically such as Under:
Step 1: the picture element signal Vpix sizes exported according to pixel output state determine integral number of times K, picture element signal The smaller then integral number of times K of Vpix are bigger;
Step 2: the picture element signal Vpix that control integrator exports pixel output state is integrated K times;
Step 3: the result progress analog-to-digital conversion to K integration of picture element signal obtains quantized result data A;
Step 4: quantized result data A divided by integral number of times K to be obtained to last final sampled result data Y.
If integral number of times K bit wide is N-bit, quantized result data A bit wides are M-bit, then after data processing, most The quantified precision of termination fruit is 1LSB (M-bit ADC minimum quantization step-length) divided by K (K max=2N), therefore minimum quantization is walked A length of 1LSB/ (2N).ADC range is M-bit, therefore total quantization bit wide is (M+N) bit.
Embodiment 1
As shown in figure 3, a kind of electricity for realizing the above-mentioned related multiple repairing weld method for wide dynamic range imaging sensor Road, including pixel output state, integrator, the first AD conversion unit, logic control element read controlling switch S5, the Two AD conversion units, data processing unit;The pixel output state exports picture element signal Vpix to integrator and One AD conversion unit;First AD conversion unit is converted to picture element signal Vpix bit wide N-bit pixel digital signals K0, Then logic control element is by the bit wide N-bit of setting integral number of times threshold limit value KmaxWith K0Subtract each other and obtain picture element signal product Gradation number K;Then integral number of times K is transferred to data processing unit by logic control element, while output control signal makes integration Device is integrated K times to picture element signal Vpix;Closure reads controlling switch S5 after integration terminates, and the second AD conversion unit believes pixel Number K integral result Vout is exported to data processing unit after being converted to M-bit quantized result data A;Data processing unit Quantized result data A divided by integral number of times K are obtained into sampled result data Y, Y=A/K.
Embodiment 2
As shown in figure 4, a kind of electricity for realizing the above-mentioned related multiple repairing weld method for wide dynamic range imaging sensor Road, including pixel output state, integrator, pre- comparator, logic control element read controlling switch S5, analog-to-digital conversion list Member, data processing unit;The pixel output state exports picture element signal Vpix to integrator and pre- comparator;Compare in advance Device sets multiple voltage step V1、V2、……、Vn, pre- comparator is by picture element signal Vpix and voltage step V1、V2、……、VnEnter The smaller comparative result data K of comparative result data K, picture element signal Vpix that row obtains bit wide N-bit more afterwards is bigger;Logic control Unit processed controls integrator to integrate picture element signal K times according to comparative result data K;Integral number of times K is transferred into modulus to turn Change unit;Closure reads controlling switch S5 after integration terminates, and AD conversion unit changes K integral result Vout of picture element signal To be exported after quantized result data A to data processing unit;Data processing unit is by quantized result data A divided by integral number of times K Obtain sampled result data Y.
Embodiment 3
As shown in figure 4, a kind of electricity for realizing the above-mentioned related multiple repairing weld method for wide dynamic range imaging sensor Road, including pixel output state, integrator, pre- comparator, logic control element read controlling switch S5, analog-to-digital conversion list Member, data processing unit;The pixel output state exports picture element signal Vpix to integrator and pre- comparator;Compare in advance Device sets multiple voltage step V1’、V2’、……、Vn’;Pre- comparator is by picture element signal Vpix and voltage step V1’、 V2’、……、Vn' be compared after obtain bit wide N-bit comparative result data K0, the smaller comparative result numbers of picture element signal Vpix According to K0It is smaller;Logic control element is by the bit wide N-bit of setting integral number of times threshold limit value KmaxWith K0Subtract each other and obtain pixel letter Number integral number of times K;Then integral number of times K is transferred to data processing unit by logic control element, while output control signal makes Integrator is integrated K times to picture element signal Vpix;Closure reads controlling switch S5 after integration terminates, and AD conversion unit believes pixel Number K integral result Vout is exported to data processing unit after being converted to M-bit quantized result data A;Data processing unit Quantized result data A divided by integral number of times K are obtained into sampled result data Y, Y=A/K.
Embodiment 4
As shown in figure 5, a kind of electricity for realizing the above-mentioned related multiple repairing weld method for wide dynamic range imaging sensor Road, including pixel output state, integrator, B AD conversion units, the pre- comparators of B, logic control element read control and opened Close S5, AD conversion unit, data processing unit;The pixel output state picture element signal Vpix is exported to integrator and B AD conversion units;The pre- comparators of B use digital comparator, and the digital comparator sets multiple voltage step V1、V2、……、 Vn;Picture element signal Vpix is converted to and the pre- comparators of B is transferred to after data signal by B AD conversion units, then will by the pre- comparators of B Itself and voltage step V1、V2、……、VnBe compared obtain bit wide N-bit comparative result data K, picture element signal Vpix it is smaller Comparative result data K is bigger;Logic control element controls integrator to integrate picture element signal K times according to comparative result data K, Integral number of times K is transferred to AD conversion unit simultaneously;Closure reads controlling switch S5 after integration terminates, and AD conversion unit will K integral result Vout of picture element signal is exported to data processing unit after being converted to quantized result data A;Data processing unit will Quantized result data A divided by integral number of times K obtain sampled result data Y.
Embodiment 5
As shown in figure 5, a kind of electricity for realizing the above-mentioned related multiple repairing weld method for wide dynamic range imaging sensor Road, including pixel output state, integrator, B AD conversion units, the pre- comparators of B, logic control element read control and opened Close S5, AD conversion unit, data processing unit;The pixel output state picture element signal Vpix is exported to integrator and B AD conversion units;The pre- comparators of B use digital comparator, and the digital comparator sets multiple voltage step V1’、 V2’、……、Vn’;B AD conversion units, which are converted to picture element signal Vpix, is transferred to the pre- comparators of B after data signal, then by B Pre- comparator is by itself and voltage step V1’、V2’、……、Vn' it is compared the comparative result data K for obtaining bit wide N-bit0, as The plain smaller comparative result data K of signal Vpix0Also it is smaller;Logic control element by the bit wide N-bit of setting integral number of times most Big limit value KmaxWith K0Subtract each other and obtain picture element signal integral number of times K;Then integral number of times K is transferred to data by logic control element Processing unit, while output control signal makes integrator integrate picture element signal Vpix K times;Closure reads control after integration terminates S5 is switched, AD conversion unit is exported after K integral result Vout of picture element signal to be converted to M-bit quantized result data A To data processing unit;Quantized result data A divided by integral number of times K are obtained sampled result data Y, Y=by data processing unit A/K。

Claims (8)

1. a kind of related multiple repairing weld method for wide dynamic range imaging sensor, it is characterised in that comprise the steps:
Step 1: the picture element signal size exported according to pixel output state determines integral number of times K, picture element signal is smaller, accumulates Gradation number K is bigger;
Step 2: the picture element signal that control integrator exports pixel output state is integrated K times;
Step 3: the result progress analog-to-digital conversion to K integration of picture element signal obtains quantized result data;
Step 4: quantized result data divided by integral number of times K to be obtained to last sampled result data.
2. a kind of electricity for realizing the related multiple repairing weld method as claimed in claim 1 for wide dynamic range imaging sensor Road, including pixel output state, integrator read controlling switch;Characterized by further comprising the first AD conversion unit, patrol Collect control unit, the second AD conversion unit, data processing unit;The pixel output state exports picture element signal to product Divide device and the first AD conversion unit;Picture element signal is converted to pixel digital signals K by the first AD conversion unit0, logic control Unit processed is by the integral number of times threshold limit value K of settingmaxWith K0Subtract each other and obtain picture element signal integral number of times K;Then logic control list Integral number of times K is transferred to data processing unit by member, while output control signal makes integrator integrate picture element signal K times;Product Closure after terminating is divided to read controlling switch, K integral result of picture element signal is converted to quantized result by the second AD conversion unit Exported after data A to data processing unit;Quantized result data A divided by integral number of times K are obtained sampling knot by data processing unit Fruit data Y.
3. a kind of electricity for realizing the related multiple repairing weld method as claimed in claim 1 for wide dynamic range imaging sensor Road, including pixel output state, integrator read controlling switch;Characterized by further comprising pre- comparator, logic control list Member, AD conversion unit, data processing unit;Picture element signal is exported to integrator and compared in advance by the pixel output state Device;Comparative result data are transferred to logic control by pre- comparator after multiple voltage steps of picture element signal and setting are compared Unit processed;Logic control element controls integrator to integrate picture element signal K times according to comparative result data, while by integral number of times K is transferred to AD conversion unit;Closure reads controlling switch after integration terminates, and AD conversion unit integrates picture element signal for K times As a result exported after being converted to quantized result data A to data processing unit;Data processing unit is by quantized result data A divided by product Gradation number K obtains sampled result data Y.
4. the related multiple repairing weld circuit according to claim 3 for wide dynamic range imaging sensor, its feature exists In the pre- comparator, multiple voltage step V are set1、V2、……、Vn, pre- comparator is by picture element signal Vpix and voltage step V1、V2、……、VnThe bit wide N-bit smaller comparative result number of comparative result data K, picture element signal Vpix is obtained after being compared It is bigger according to K;Logic control element controls integrator to integrate picture element signal K times according to comparative result data K.
5. the related multiple repairing weld circuit according to claim 3 for wide dynamic range imaging sensor, its feature exists In the pre- comparator, multiple voltage step V are set1’、V2’、……、Vn’;Pre- comparator is by picture element signal Vpix and voltage platform Rank V1’、V2’、……、Vn' be compared after obtain bit wide N-bit comparative result data K0, the smaller comparisons of picture element signal Vpix Result data K0It is smaller;Logic control element is by the bit wide N-bit of setting integral number of times threshold limit value KmaxWith K0Subtract each other and obtain Picture element signal integral number of times K;Then logic control element output control signal makes integrator integrate picture element signal Vpix K times.
6. a kind of electricity for realizing the related multiple repairing weld method as claimed in claim 1 for wide dynamic range imaging sensor Road, including pixel output state, integrator read controlling switch;Characterized by further comprising B AD conversion units, B compares in advance Compared with device, logic control element, AD conversion unit, data processing unit;The pixel output state exports picture element signal To integrator and the pre- comparators of B;B AD conversion units, which are converted to picture element signal Vpix, to be transferred to B and compares in advance after data signal Comparative result data are transferred to logic by device, the pre- comparators of B after multiple voltage steps of picture element signal and setting are compared Control unit;Logic control element controls integrator to integrate picture element signal K times according to comparative result data, while will integration Number K is transferred to AD conversion unit;Closure reads controlling switch after integration terminates, and AD conversion unit is by K product of picture element signal Point result is exported to data processing unit after being converted to quantized result data A;Data processing unit by quantized result data A divided by Integral number of times K obtains sampled result data Y.
7. the related multiple repairing weld circuit according to claim 6 for wide dynamic range imaging sensor, its feature exists It is digital comparator in the pre- comparators of the B, the digital comparator sets multiple voltage step V1、V2、……、Vn;B moduluses turn Change unit and be converted to picture element signal Vpix and the pre- comparators of B are transferred to after data signal, then by the pre- comparators of B by itself and voltage platform Rank V1、V2、……、VnThe bit wide N-bit smaller comparative result of comparative result data K, picture element signal Vpix is obtained after being compared Data K is bigger;Logic control element controls integrator to integrate picture element signal K times according to comparative result data K.
8. the related multiple repairing weld circuit according to claim 6 for wide dynamic range imaging sensor, its feature exists It is digital comparator in the pre- comparators of the B, the digital comparator sets multiple voltage step V1’、V2’、……、Vn’;B moduluses Picture element signal Vpix is converted to and the pre- comparators of B is transferred to after data signal by converting unit, then by the pre- comparators of B by itself and voltage Step V1’、V2’、……、Vn' be compared after obtain bit wide N-bit comparative result data K0, the smaller ratios of picture element signal Vpix Compared with result data K0It is smaller;Logic control element is by the bit wide N-bit of setting integral number of times threshold limit value KmaxWith K0Subtract each other To picture element signal integral number of times K;Then logic control element output control signal makes integrator integrate K to picture element signal Vpix It is secondary.
CN201710180040.2A 2017-03-24 2017-03-24 Related multiple repairing weld method and circuit for wide dynamic range imaging sensor Pending CN106998433A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710180040.2A CN106998433A (en) 2017-03-24 2017-03-24 Related multiple repairing weld method and circuit for wide dynamic range imaging sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710180040.2A CN106998433A (en) 2017-03-24 2017-03-24 Related multiple repairing weld method and circuit for wide dynamic range imaging sensor

Publications (1)

Publication Number Publication Date
CN106998433A true CN106998433A (en) 2017-08-01

Family

ID=59431537

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710180040.2A Pending CN106998433A (en) 2017-03-24 2017-03-24 Related multiple repairing weld method and circuit for wide dynamic range imaging sensor

Country Status (1)

Country Link
CN (1) CN106998433A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021138838A1 (en) * 2020-01-08 2021-07-15 华为技术有限公司 Image reading circuit, image sensor and terminal device
CN114636494A (en) * 2022-05-09 2022-06-17 上海艾为微电子技术有限公司 Sensing device, sensing detection method thereof and electronic equipment

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013098598A (en) * 2011-10-28 2013-05-20 Konica Minolta Advanced Layers Inc Imaging apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013098598A (en) * 2011-10-28 2013-05-20 Konica Minolta Advanced Layers Inc Imaging apparatus

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
SUNGHO SUH等: "《Column-Parallel Correlated Multiple Sampling Circuits for CMOS Image Sensors and Their Noise Reduction Effects》", 《SENSORS》 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021138838A1 (en) * 2020-01-08 2021-07-15 华为技术有限公司 Image reading circuit, image sensor and terminal device
CN114982222A (en) * 2020-01-08 2022-08-30 华为技术有限公司 Image reading circuit, image sensor and terminal equipment
CN114636494A (en) * 2022-05-09 2022-06-17 上海艾为微电子技术有限公司 Sensing device, sensing detection method thereof and electronic equipment

Similar Documents

Publication Publication Date Title
CN104869330B (en) Photoelectric conversion device and image capture system
JP4485203B2 (en) Noise elimination type CMOS image sensor
US8659339B2 (en) Offset canceling circuit, sampling circuit and image sensor
US20170310910A1 (en) Oversampled image sensor with conditional pixel readout
US7375751B2 (en) CMOS image sensor
JP4065380B2 (en) CMOS image sensor
JP3290964B2 (en) Digital automatic gain control circuit
US8305474B2 (en) Analog-to-digital conversion in image sensors
JP4798320B2 (en) Solid-state imaging device
US20120287316A1 (en) Ramp and successive approximation register analog to digital conversion methods, systems and apparatus
CN210157249U (en) Image sensor and data converter
CN105706361B (en) Suitable for the amplifier of cmos imaging sensor
US10728483B2 (en) Comparator with correlated double sampling scheme, CMOS image sensor including the same, and operating method thereof
US9264644B2 (en) Analog-to-digital conversion for image sensor with non-destructive read pixel
US8816892B2 (en) Segmented column-parallel analog-to-digital converter
US9848154B2 (en) Comparator with correlated double sampling scheme and operating method thereof
EP3078188A1 (en) Variable gain column amplifier adapted for use in imaging arrays
CN108337460A (en) The reading circuit of imaging sensor
CN106961563A (en) Low noise wide dynamic range imaging sensor correlation multiple repairing weld circuit
CN114727039A (en) Column-level analog-to-digital converter for CMOS image sensor and analog-to-digital conversion method thereof
JP3792995B2 (en) Imaging device
CN106998433A (en) Related multiple repairing weld method and circuit for wide dynamic range imaging sensor
JP4489914B2 (en) A / D converter and solid-state imaging device
US9019139B2 (en) Analog to digital converter with built-in data compression based on shot noise of image sensor
Lim et al. A low noise CMOS image sensor with a 14-bit two-step single-slope ADC and a column self-calibration technique

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20170801