CN106959314B - Testing device - Google Patents
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- CN106959314B CN106959314B CN201710207337.3A CN201710207337A CN106959314B CN 106959314 B CN106959314 B CN 106959314B CN 201710207337 A CN201710207337 A CN 201710207337A CN 106959314 B CN106959314 B CN 106959314B
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- 238000012360 testing method Methods 0.000 title claims abstract description 74
- 238000001514 detection method Methods 0.000 claims abstract description 31
- 239000000523 sample Substances 0.000 claims abstract description 27
- 230000001960 triggered effect Effects 0.000 claims abstract description 6
- 230000005669 field effect Effects 0.000 claims description 34
- 239000003990 capacitor Substances 0.000 claims description 9
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 6
- 230000006698 induction Effects 0.000 abstract description 9
- 238000000034 method Methods 0.000 description 6
- 230000001276 controlling effect Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 230000006978 adaptation Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000002601 radiography Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 239000011669 selenium Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/084—Investigating materials by wave or particle radiation secondary emission photo-electric effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
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- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
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- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Abstract
The invention discloses a testing device which is applied to testing of an X-ray exposure detection device and comprises a non-light-transmitting cavity, a light source plate, a supporting column and a probe, wherein the light source plate, the supporting column and the probe are arranged in the cavity; the light source plate comprises a plurality of luminous bodies distributed on one side surface of the light source plate and a control part connected with the luminous bodies and used for controlling the luminous bodies to generate light with preset intensity; the support columns are arranged on the light emitting side of the light source plate, and a plurality of support columns form a support plane parallel to the light source plate and are used for placing devices to be tested; the probe is used for triggering the device to be tested and sending out an indication signal when the device to be tested generates induction current when triggered. Compared with the existing testing method, the testing device does not need to install an X-ray exposure detection device and then test the X-ray exposure detection device, so that the testing flow can be simplified, and the testing efficiency can be improved.
Description
Technical Field
The invention relates to the technical field of photoelectric devices, in particular to a testing device.
Background
Flat panel detectors are a core component of digital flat panel X-ray imaging systems (Digital Radiography, DR) that enable the conversion of X-ray energy into electrical signals. Currently, two main types of flat panel detectors are used: amorphous selenium flat panel detector and amorphous silicon flat panel detector, the former from the energy conversion mode, the latter belongs to direct conversion flat panel detector, the latter belongs to indirect conversion flat panel detector.
For amorphous silicon flat panel detectors, the amorphous silicon thin film transistor structure included therein still accumulates dark current without X-ray irradiation and thus causes image artifacts. Therefore, when the flat panel detector is applied, the flat panel detector needs to communicate the exposure sequence with the high voltage generator at any time so as to ensure that dark current is cleared before X-ray generation. Based on the working mechanism, the flat panel detector needs to be communicated with the high voltage generator through a communication line to carry out time sequence communication during exposure, so that one flat panel detector can only be used on the high voltage generator connected with the flat panel detector, cannot move freely and cannot be flexibly applied to other high voltage generators.
The automatic exposure detection (Automatic Exposure Detection, AED) technology solves the problem that the flat panel detector needs to be connected with a high voltage generator, and an AED module is arranged in the flat panel detector, and the synchronous function with the high voltage generator is realized by detecting the exposure of the high voltage generator. AED technology gets rid of the mode that flat panel detector must be connected with high voltage generator, has realized flat panel detector and high voltage generator wireless synchronization, has improved flat panel detector's convenience greatly.
The automatic exposure detection module (AED module) mainly comprises a photodiode and a high-speed high-precision operational amplifier, and is required to be tested to determine whether the AED module can normally sense in the metering range during production.
In the prior art, the AED module is tested by X-ray exposure after the flat panel detector is installed, and the dosimeter is used to calibrate the X-ray dose during testing. However, the testing method needs to install the flat panel detector, has complicated testing flow, and cannot meet the high-efficiency testing requirement.
Disclosure of Invention
The invention aims to provide a testing device which is applied to testing of an X-ray exposure detection device, and compared with the prior art, the testing device can simplify the testing process and improve the testing efficiency.
In order to achieve the above purpose, the present invention provides the following technical solutions:
the testing device is applied to testing of an X-ray exposure detection device and comprises a non-light-transmitting cavity, a light source plate, a supporting column and a probe, wherein the light source plate, the supporting column and the probe are arranged in the cavity;
The light source plate comprises a plurality of luminous bodies distributed on one side surface of the light source plate and a control part connected with the luminous bodies and used for controlling the luminous bodies to generate light with preset intensity;
The support columns are arranged on the light emitting side of the light source plate, and a plurality of support columns form a support plane parallel to the light source plate and are used for placing devices to be tested;
The probe is used for triggering the device to be tested and sending out an indication signal when detecting that the device to be tested generates induction current during triggering.
Optionally, the backlight module further comprises a light homogenizing plate which is arranged on the light emitting side of the light source plate and used for homogenizing the light intensity of the light generated by the light source plate.
Optionally, the dodging plate comprises an acrylic plate and a dodging film arranged on the surface of the acrylic plate.
Optionally, the control part includes:
A control circuit connected to the light emitter for outputting a current to the light emitter;
And the processor is connected with the control circuit and is used for outputting voltage to the control circuit according to the instruction.
Optionally, the control circuit includes a first operational amplifier, a second operational amplifier, a first field effect transistor, a second field effect transistor, a first resistor, a second resistor, a third resistor, and a fourth resistor;
The non-inverting input end of the first operational amplifier is used as the input end of the control circuit, the output end of the first operational amplifier is connected with the grid electrode of the first field effect transistor, and the inverting input end of the first operational amplifier is connected with the source electrode of the first field effect transistor;
The drain electrode of the first field effect tube is connected with the power supply end, the source electrode of the first field effect tube is grounded, a first resistor is connected between the source electrode of the first field effect tube and the grounding end, and a second resistor is connected between the drain electrode of the first field effect tube and the power supply end;
The non-inverting input end of the second operational amplifier is connected with the drain electrode of the first field effect transistor, the inverting input end of the second operational amplifier is connected with the power supply end, and the output end of the second operational amplifier is connected with the grid electrode of the second field effect transistor;
A third resistor and a fourth resistor are sequentially connected between the power supply end and the inverting input end of the second operational amplifier;
The source electrode of the second field effect transistor is connected with the third resistor and the fourth resistor through a circuit, and the drain electrode of the second field effect transistor is connected with the luminous body.
Optionally, the method further comprises:
The light intensity calibration plate is used for being placed on a supporting plane formed by the supporting columns, sensing the light intensity of the light generated by the light source plate, converting the light intensity into a voltage signal and feeding the voltage signal back to the control part;
the control part is also used for adjusting the current output to the luminous body according to the fed-back voltage signal until the light intensity sensed by the light intensity calibration plate is within a set range.
Optionally, the light intensity detection circuit included in the light intensity calibration board includes a photodiode, a third operational amplifier, and a first capacitor;
The non-inverting input end of the third operational amplifier is grounded, the inverting input end of the third operational amplifier is connected with the cathode of the photodiode, the output end of the third operational amplifier is used as the output end of the light intensity detection circuit, one end of the first capacitor is connected with the inverting input end of the third operational amplifier, and the other end of the first capacitor is connected with the output end of the third operational amplifier;
The anode of the photodiode is grounded.
Optionally, the device further comprises an indicator lamp connected with the probe and used for being lightened when the probe detects that the device to be tested generates induction current.
Optionally, the method further comprises:
the USB interface is connected with the light source plate and used for connecting external power supply equipment;
and the button is connected with the light source plate and used for controlling the light source plate to start or stop operating when being triggered.
According to the technical scheme, the testing device provided by the invention is applied to testing of an X-ray exposure detection device and comprises a non-light-transmitting cavity, a light source plate, a supporting column and a probe, wherein the light source plate, the supporting column and the probe are arranged in the cavity. When the device to be tested is tested, the device to be tested is placed on a supporting plane formed by the supporting columns, light with preset intensity is generated by the light source plate and projected to the device to be tested to simulate X-ray exposure, then the device to be tested is triggered by clicking a probe, and an indication signal is sent out when the device to be tested is detected to generate induced current, so that the photoelectric induction test of the device to be tested is realized.
The testing device is applied to the test of the X-ray exposure detection device, realizes the photoelectric induction test of the X-ray exposure detection device, and compared with the existing testing method, the testing device does not need to install an X-ray exposure detection device and then test the X-ray exposure detection device, thereby simplifying the testing flow and improving the testing efficiency.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a testing apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a testing apparatus according to another embodiment of the present invention;
FIG. 3 is a schematic diagram of a control circuit according to an embodiment of the present invention;
fig. 4 is a schematic diagram of a light intensity detection circuit according to an embodiment of the present invention.
Detailed Description
In order to make the technical solution of the present invention better understood by those skilled in the art, the technical solution of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present invention without making any inventive effort, shall fall within the scope of the present invention.
The testing device provided by the embodiment of the invention is applied to testing of an X-ray exposure detection device and comprises a non-light-transmitting cavity, a light source plate, a supporting column and a probe, wherein the light source plate, the supporting column and the probe are arranged in the cavity;
The light source plate comprises a plurality of luminous bodies distributed on one side surface of the light source plate and a control part connected with the luminous bodies and used for controlling the luminous bodies to generate light with preset intensity;
The support columns are arranged on the light emitting side of the light source plate, and a plurality of support columns form a support plane parallel to the light source plate and are used for placing devices to be tested;
The probe is used for triggering the device to be tested and sending out an indication signal when detecting that the device to be tested generates induction current during triggering.
The cavity is a non-light-transmitting cavity so as to avoid interference of external light in the testing process.
A plurality of luminous bodies are distributed on one side surface of the light source plate, the luminous bodies generate light under the control of the control part and are projected to a device to be tested to simulate X-ray exposure, and the intensity of the generated light is controlled to simulate the X-ray exposure dose.
When the device to be tested is tested, the device to be tested is placed on a supporting plane formed by a supporting column, light with preset intensity is generated by a light source plate and projected to the device to be tested, and X-ray exposure is simulated; and then clicking the device to be tested by using the probe, and sending out an indication signal if the device to be tested is detected to generate induced current when triggered, so that the photoelectric induction test of the device to be tested is realized.
The testing device is applied to testing of the X-ray exposure detection device, photoelectric induction testing of the X-ray exposure detection device is achieved, and compared with an existing testing method, the testing device does not need to be installed on the X-ray exposure detection device, and then testing is conducted through X-ray exposure, so that the testing flow can be simplified, and the testing efficiency is improved.
The test apparatus according to this embodiment applied to an X-ray exposure detection device will be described in detail below.
Referring to fig. 1, a schematic diagram of a testing apparatus for an X-ray exposure detection device according to the present embodiment is provided. As can be seen, the present test apparatus comprises a non-light-transmitting cavity 10, a light source plate 11, a support column 12 and a probe 13, wherein the light source plate 11, the support column 12 and the probe 13 are disposed in the cavity 10.
The cavity 10 is a non-transparent cavity to avoid interference of external light during the testing process. Specifically, a test box can be arranged, a non-light-transmitting cavity is formed by the test box, and the light source plate, the support column and the probes are arranged in the test box. Exemplary metal boxes and covers that are well closed may be used, and that do not transmit light after the cover is closed.
Alternatively, the shape of the cavity 10 may be a cuboid.
The light source panel 11 includes a plurality of light emitters 110 distributed on one side surface thereof, and a control part connected to the light emitters 110 for controlling the light emitters 110 to generate light of a predetermined intensity.
The supporting columns 12 are arranged on the light emitting side of the light source plate 11, a supporting plane parallel to the light source plate 11 is formed by a plurality of supporting columns 12 and is used for placing a device to be tested, and during testing, the light emitted by the luminous bodies on the light source plate 11 is projected to the device to be tested. The plurality of luminous bodies 110 are uniformly distributed on one side surface of the light source plate to generate uniform light to each region of the space.
Preferably, referring to fig. 2, the testing device further includes a light homogenizing plate 14 disposed on a side of the light source plate 11 emitting light for adjusting the intensity of the light generated by the light source plate 11 to be uniform. The light emitted by the light source plate 11 is transmitted through the light homogenizing plate 14, the light intensity of the light homogenizing plate 14 is uniformly regulated and projected to the device to be tested, and the photoelectric sensing test of the X-ray exposure detection device is facilitated to be optimized.
Specifically, the light homogenizing plate 14 includes an acrylic plate and a light homogenizing film disposed on a surface of the acrylic plate.
The control part controls the light emission of the light emitting body 110, and the control part controls the intensity of the light generated by the light emitting body to simulate the X-ray exposure dose.
In this embodiment, the control unit specifically includes: a control circuit connected to the light emitter for outputting a current to the light emitter; and the processor is connected with the control circuit and is used for outputting voltage to the control circuit according to the instruction.
The processor is specifically configured to output a voltage with a magnitude equal to a preset value to the control circuit in a set time period according to an instruction.
In the test device of the embodiment, the processor can be connected with the computer, the tester can set the light-emitting time and the light-emitting intensity through the computer, send an instruction to the processor, and the processor outputs a preset voltage value to the control circuit in a set time period according to the light-emitting time and the light-emitting intensity set in the instruction so as to control the light-emitting body to emit light.
In one embodiment, referring to fig. 3, the control circuit includes a first operational amplifier U1, a second operational amplifier U2, a first fet T1, a second fet T2, a first resistor R1, a second resistor R2, a third resistor R3, and a fourth resistor R4;
The non-inverting input end of the first operational amplifier U1 is used as the input end of the control circuit, the output end of the first operational amplifier U1 is connected with the grid electrode of the first field effect transistor T1, and the inverting input end of the first operational amplifier U1 is connected with the source electrode of the first field effect transistor T1;
The drain electrode of the first field effect tube T1 is connected with the power supply end, the source electrode is grounded, a first resistor R1 is connected between the source electrode of the first field effect tube T1 and the ground end, and a second resistor R2 is connected between the drain electrode of the first field effect tube T1 and the power supply end;
the non-inverting input end of the second operational amplifier U2 is connected with the drain electrode of the first field effect tube T1, the inverting input end is connected with the power supply end, and the output end is connected with the grid electrode of the second field effect tube T2;
A third resistor R3 and a fourth resistor R4 are sequentially connected between the power supply end and the inverting input end of the second operational amplifier U2;
The source electrode of the second field effect transistor T2 is connected with the third resistor R3 and the fourth resistor R4 in a circuit way, and the drain electrode of the second field effect transistor T is connected with the luminous body.
The luminous body can adopt a light emitting diode, the anode of the light emitting diode is connected with the drain electrode of the second field effect tube T2, and the cathode of the light emitting diode is grounded.
The processor inputs a voltage V IN to the input end of the control circuit according to the instruction, and the control circuit outputs a current I O to the illuminant under the control of the input voltage V IN. In this circuit structure, the output current I O and the input voltage V IN have the following relation:
For example, when r1=100 kΩ, r2=10 kΩ, r3=5.1Ω, r1=10 kΩ, then
Preferably, the testing device applied to the X-ray exposure detection device of the present embodiment further includes a light intensity calibration board for being placed on a supporting plane formed by the supporting columns 12, sensing the light intensity of the light generated by the light source board 11, and converting the light intensity into a voltage signal to be fed back to the control part. The control part is further configured to adjust the current output to the light emitter 110 according to the fed-back voltage signal until the light intensity sensed by the light intensity calibration board is within a set range.
Before the device to be tested is tested by using the testing device, the light intensity calibration plate is placed on the supporting column, the light emitting time and the light emitting intensity are set, the processor outputs voltage to the control circuit according to the instruction, and the control circuit outputs current to the light emitting body to control the light emitting body to emit light. The light intensity calibration plate senses the light intensity of the generated light and converts the light intensity into a voltage signal to be fed back to the processor; and the processor adjusts the current output to the illuminant according to the fed-back voltage signal until the light intensity sensed by the light intensity calibration plate is within a set range. The intensity of the light generated by the illuminant can be precisely controlled by calibration to simulate X-ray exposure.
Specifically, in one embodiment, referring to fig. 4, the light intensity calibration board includes a light intensity detection circuit including a photodiode DT, a third operational amplifier U3, and a first capacitor C;
The non-inverting input end of the third operational amplifier U3 is grounded, the inverting input end is connected with the cathode of the photodiode DT, the output end is used as the output end of the light intensity detection circuit, one end of the first capacitor C is connected with the inverting input end of the third operational amplifier U3, and the other end of the first capacitor C is connected with the output end of the third operational amplifier U3; the anode of the photodiode DT is grounded.
In this circuit structure, the output of the light intensity calibration circuit is expressed as: v O = 1/C t.
After the light intensity calibration plate is adopted for calibration, the light intensity calibration plate is replaced by the X-ray exposure detection device to be tested, the test device is controlled to start to operate, and the processor controls the illuminant to emit light according to the calibrated set voltage and the calibrated light emitting time, so that the simulation of X-ray exposure is realized, and the accurate control is performed.
When the X-ray exposure detection device to be tested receives illumination, the probe 13 is used for triggering the device to be tested, and when the probe 13 detects that the device to be tested generates induction current, an indication signal is sent out to realize the test.
Referring to fig. 2, the testing apparatus of the present embodiment further includes an indicator lamp 15 connected to the probe for being lighted when the probe detects that the device under test generates an induced current. The indicator light 15 may be provided outside the cartridge.
Further, the test device further comprises:
a USB interface 16 connected to the light source board for connecting an external power supply device;
a button 17 connected to the light source panel for controlling the light source panel to be turned on or off when triggered.
The light source board may be connected to an external power supply device or to a computer via the USB interface 16. The start-up or stop operation of the present test device is controlled by the button 17.
The above describes in detail a testing device provided by the invention. The principles and embodiments of the present invention have been described herein with reference to specific examples, the description of which is intended only to facilitate an understanding of the method of the present invention and its core ideas. It should be noted that it will be apparent to those skilled in the art that various modifications and adaptations of the invention can be made without departing from the principles of the invention and these modifications and adaptations are intended to be within the scope of the invention as defined in the following claims.
Claims (6)
1. The testing device is applied to testing of an X-ray exposure detection device and is characterized by comprising a non-light-transmitting cavity, a light source plate, a supporting column and a probe, wherein the light source plate, the supporting column and the probe are arranged in the cavity;
The light source plate comprises a plurality of luminous bodies distributed on one side surface of the light source plate and a control part connected with the luminous bodies and used for controlling the luminous bodies to generate light with preset intensity;
The support columns are arranged on the light emitting side of the light source plate, and a plurality of support columns form a support plane parallel to the light source plate and are used for placing devices to be tested;
The probe is used for triggering the device to be tested and sending out an indication signal when detecting that the device to be tested generates induced current during triggering;
The device also comprises a light homogenizing plate which is arranged on the light emitting side of the light source plate and is used for adjusting the light intensity of the light generated by the light source plate to be uniform;
The control unit includes:
A control circuit connected to the light emitter for outputting a current to the light emitter;
A processor connected to the control circuit for outputting a voltage to the control circuit according to an instruction;
The control circuit comprises a first operational amplifier, a second operational amplifier, a first field effect transistor, a second field effect transistor, a first resistor, a second resistor, a third resistor and a fourth resistor;
The non-inverting input end of the first operational amplifier is used as the input end of the control circuit, the output end of the first operational amplifier is connected with the grid electrode of the first field effect transistor, and the inverting input end of the first operational amplifier is connected with the source electrode of the first field effect transistor;
The drain electrode of the first field effect tube is connected with the power supply end, the source electrode of the first field effect tube is grounded, a first resistor is connected between the source electrode of the first field effect tube and the grounding end, and a second resistor is connected between the drain electrode of the first field effect tube and the power supply end;
The non-inverting input end of the second operational amplifier is connected with the drain electrode of the first field effect transistor, the inverting input end of the second operational amplifier is connected with the power supply end, and the output end of the second operational amplifier is connected with the grid electrode of the second field effect transistor;
A third resistor and a fourth resistor are sequentially connected between the power supply end and the inverting input end of the second operational amplifier;
The source electrode of the second field effect transistor is connected with the third resistor and the fourth resistor through a circuit, and the drain electrode of the second field effect transistor is connected with the luminous body.
2. The test device of claim 1, wherein the light homogenizing plate comprises an acrylic plate and a light homogenizing film arranged on the surface of the acrylic plate.
3. The test device of claim 1, further comprising:
The light intensity calibration plate is used for being placed on a supporting plane formed by the supporting columns, sensing the light intensity of the light generated by the light source plate, converting the light intensity into a voltage signal and feeding the voltage signal back to the control part;
the control part is also used for adjusting the current output to the luminous body according to the fed-back voltage signal until the light intensity sensed by the light intensity calibration plate is within a set range.
4. A test device according to claim 3, wherein the light intensity calibration board comprises a light intensity detection circuit comprising a photodiode, a third operational amplifier and a first capacitor;
The non-inverting input end of the third operational amplifier is grounded, the inverting input end of the third operational amplifier is connected with the cathode of the photodiode, the output end of the third operational amplifier is used as the output end of the light intensity detection circuit, one end of the first capacitor is connected with the inverting input end of the third operational amplifier, and the other end of the first capacitor is connected with the output end of the third operational amplifier;
The anode of the photodiode is grounded.
5. The test apparatus of any one of claims 1-4, further comprising an indicator light coupled to the probe for illuminating when the probe detects that the device under test is generating an induced current.
6. The test device of any one of claims 1-4, further comprising:
the USB interface is connected with the light source plate and used for connecting external power supply equipment;
and the button is connected with the light source plate and used for controlling the light source plate to start or stop operating when being triggered.
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| CN201710207337.3A CN106959314B (en) | 2017-03-31 | 2017-03-31 | Testing device |
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| CN201710207337.3A CN106959314B (en) | 2017-03-31 | 2017-03-31 | Testing device |
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| CN105911075A (en) * | 2016-05-23 | 2016-08-31 | 奕瑞影像科技（太仓）有限公司 | Test method and test system for X-ray accumulating large dosage |
| CN206696209U (en) * | 2017-03-31 | 2017-12-01 | 上海品臻影像科技有限公司 | A kind of test device |
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| JP4264382B2 (en) * | 2004-04-30 | 2009-05-13 | 株式会社モリタ製作所 | Automatic exposure control method for photographed image and automatic exposure control apparatus using the method |
| CN102256428B (en) * | 2011-04-20 | 2015-05-20 | 北京国药恒瑞美联信息技术有限公司 | Automatic exposure control signal detection device and automatic exposure control system |
| JP5749609B2 (en) * | 2011-09-05 | 2015-07-15 | 富士フイルム株式会社 | Radiation imaging system and radiation source control device |
| US9383336B2 (en) * | 2014-04-04 | 2016-07-05 | General Electric Company | System and method for flat panel detector gel and blot imaging |
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| CN106199372A (en) * | 2016-07-04 | 2016-12-07 | 中国科学院新疆理化技术研究所 | X-ray irradiation test equipment for the test of wafer scale device radiation effect |
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| CN105911075A (en) * | 2016-05-23 | 2016-08-31 | 奕瑞影像科技（太仓）有限公司 | Test method and test system for X-ray accumulating large dosage |
| CN206696209U (en) * | 2017-03-31 | 2017-12-01 | 上海品臻影像科技有限公司 | A kind of test device |
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