CN206696209U - A kind of test device - Google Patents
A kind of test device Download PDFInfo
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- CN206696209U CN206696209U CN201720337248.6U CN201720337248U CN206696209U CN 206696209 U CN206696209 U CN 206696209U CN 201720337248 U CN201720337248 U CN 201720337248U CN 206696209 U CN206696209 U CN 206696209U
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Abstract
The utility model discloses a kind of test device, detects device detection applied to X-ray exposure, including non-transparent cavity, light source board, support column and probe, light source board, support column and probe are arranged in cavity；Light source board includes being distributed in multiple illuminators of the side surface of light source board one, and be connected with illuminator, control unit for controlling illuminator generation preset strength light；Support column is arranged on light source board transmitting light side, the supporting plane parallel with light source board is formed by multiple support columns, for placing tested device；Probe is used to trigger tested device, and is detected in triggering when tested device produces induced-current and send indication signal.The utility model test device, which realizes, tests the optoelectronic induction of X-ray exposure detection device, compared with existing method of testing, it is not necessary to tested by X-ray exposure detection device installation, then by X-ray exposure, testing process can be simplified, improve testing efficiency.
Description
Technical field
Photoelectric device technical field is the utility model is related to, more particularly to a kind of test device.
Background technology
Flat panel detector is digital flat panel x-ray imaging system (Digital Radiography, DR) core component,
It is realized is converted to electric signal by X-ray energy.At present, the flat panel detector of use mainly has two kinds：Amorphous selenium flat-bed detection
Device and Amorphous silicon flat-panel detectors, from the point of view of the mode of energy conversion, the former belongs to directly conversion flat panel detector, the latter and belonged to
Indirect conversion flat panel detector.
For Amorphous silicon flat-panel detectors, situation of its amorphous silicon film transistor structure included in no roentgen radiation x
Under, it can still accumulate dark current thus image artifacts can be caused.Therefore, this flat panel detector is in use, flat panel detector needs
The order of exposure is linked up with high pressure generator at any time, to ensure that dark current is cleaned before x-ray produces.Based on this work
Make mechanism, make flat panel detector need to keep communicating with high pressure generator by connection, to carry out sequential communication in exposure,
Therefore this causes one flat plate detector to be used on the high pressure generator being attached thereto, and can not move freely, Wu Faling
Work is applied to other high pressure generators.
Automatic exposure detects the appearance of (Automatic Exposure Detection, AED) technology, solves above-mentioned flat
The problem of partitioned detector has to connect with high pressure generator, AED modules are set in flat panel detector, by detecting high pressure
Raw device exposure, and realize the synchronizing function with high pressure generator.AED technologies have broken away from flat panel detector and have had to occur with high pressure
The pattern of device connection, realizes flat panel detector and high pressure generator wireless synchronization, substantially increases the convenient of flat panel detector
Property.
Automatic exposure detection module (hereinafter referred to as AED modules) is mainly by photodiode, high-speed, high precision operation amplifier
Whether device forms, need to test AED modules can normal induction in its measures range in production.
In the prior art, the method tested AED modules is after flat panel detector is installed, to pass through X-ray exposure
To be tested, the dosage meter calibrating x-ray dosage in test.But this method of testing needs to fill flat panel detector
Machine, testing process are cumbersome, it is impossible to meet efficient test request.
Utility model content
The purpose of this utility model is to provide a kind of test device, and device detection is detected applied to X-ray exposure, and existing
Technology improves testing efficiency compared to that can simplify testing process.
To achieve the above object, the utility model provides following technical scheme：
A kind of test device, device detection, including non-transparent cavity, light source board, supporting are detected applied to X-ray exposure
Post and probe, the light source board, the support column and the probe are arranged in the cavity；
The light source board includes the multiple illuminators for being distributed in the side surface of light source board one, and connects with the illuminator
Control unit connecing, for controlling the illuminator to produce preset strength light；
The support column is arranged on the light source board transmitting light side, is formed by multiple support columns parallel with light source board
Supporting plane, for placing tested device；
The probe is used to trigger the tested device, and detects the tested device in triggering and produce sensing
Indication signal is sent during electric current.
Alternatively, in addition to be arranged on light source board transmitting light side, for light caused by the light source board to be adjusted
The uniform light board of whole light intensity uniform.
Alternatively, the uniform light board includes acrylic board and is arranged on the even smooth film on the acrylic board surface.
Alternatively, the control unit includes：
It is being connected with the illuminator, for the control circuit of the illuminator output current；
It is being connected with the control circuit, for according to instruction to the control circuit output voltage processor.
Alternatively, the control circuit includes the first operational amplifier, the second operational amplifier, the first FET, the
Two FETs, first resistor, second resistance, 3rd resistor and the 4th resistance；
Input of the in-phase input end of first operational amplifier as the control circuit, output end and described the
One fet gate is connected, and inverting input is connected with the first FET source electrode；
First FET drain is connected with feeder ear, source ground, in the first FET source electrode with connecing
First resistor is connected between ground terminal, second resistance is connected between first FET drain and feeder ear；
The in-phase input end of second operational amplifier is connected with first FET drain, inverting input with
Feeder ear is connected, and output end is connected with second fet gate；
3rd resistor and the 4th are connected with turn between the inverting input of feeder ear and second operational amplifier
Resistance；
Connection between the second FET source electrode and the 3rd resistor and the 4th resistance, drain electrode and institute
State illuminator connection.
Alternatively, in addition to：
The supporting plane formed for being placed on the support column, sense the luminous intensity that the light source board produces light, and
Be converted to the luminous intensity calibration plate that voltage signal feeds back to the control unit.
Alternatively, the light intensity detection circuit that the luminous intensity calibration plate includes includes photodiode, the 3rd computing is put
Big device and the first electric capacity；
The in-phase input end ground connection of 3rd operational amplifier, inverting input connect with the photodiode negative pole
Connect, output end of the output end as the light intensity detection circuit, one end of first electric capacity and the 3rd operation amplifier
The inverting input connection of device, the other end are connected with the output end of the 3rd operational amplifier；
The plus earth of the photodiode.
Alternatively, in addition to the probe it is being connected, produced for detecting the tested device in the probe
The indicator lamp lighted during induced-current.
Alternatively, in addition to：
USB interface be connected with the light source board, for connecting externally fed equipment；
It is being connected with the light source board, for controlling the light source board to open operation or out of service when being triggered
Button.
As shown from the above technical solution, test device provided by the utility model, device is detected applied to X-ray exposure
Test, including non-transparent cavity, light source board, support column and probe, wherein light source board, support column and probe are arranged on cavity
It is interior.When testing tested device, tested device is placed on the supporting plane of support column formation, by light source board
Preset strength light is produced, projects tested device, to simulate X-ray exposure, then with probe clicking trigger tested device,
Indication signal can be sent when detecting tested device and producing induced-current, so realizes the optoelectronic induction to tested device
Test.
The utility model test device is applied to X-ray exposure detection device detection, realizes to X-ray exposure detector
The optoelectronic induction test of part, compared with existing method of testing, it is not necessary to by X-ray exposure detection device installation, then pass through X ray
Expose to be tested, testing process can be simplified, improve testing efficiency.
Brief description of the drawings
, below will be to embodiment in order to illustrate more clearly of the utility model embodiment or technical scheme of the prior art
Or the required accompanying drawing used is briefly described in description of the prior art, it should be apparent that, drawings in the following description are only
It is some embodiments of the utility model, for those of ordinary skill in the art, is not paying the premise of creative work
Under, other accompanying drawings can also be obtained according to these accompanying drawings.
Fig. 1 is a kind of schematic diagram for test device that the utility model embodiment provides；
Fig. 2 is a kind of schematic diagram for test device that the another embodiment of the utility model provides；
Fig. 3 is a kind of schematic diagram for control circuit that the utility model embodiment provides；
Fig. 4 is a kind of schematic diagram for light intensity detection circuit that the utility model embodiment provides.
Embodiment
In order that those skilled in the art more fully understand the technical scheme in the utility model, below in conjunction with this reality
With the accompanying drawing in new embodiment, the technical scheme in the embodiment of the utility model is clearly and completely described, it is clear that
Described embodiment is only the utility model part of the embodiment, rather than whole embodiments.Based on the utility model
In embodiment, the every other implementation that those of ordinary skill in the art are obtained under the premise of creative work is not made
Example, it should all belong to the scope of the utility model protection.
A kind of test device that the utility model embodiment provides, device detection is detected applied to X-ray exposure, including it is non-
Cavity, light source board, support column and the probe of printing opacity, the light source board, the support column and the probe are arranged on the chamber
In vivo；
The light source board includes the multiple illuminators for being distributed in the side surface of light source board one, and connects with the illuminator
Control unit connecing, for controlling the illuminator to produce preset strength light；
The support column is arranged on the light source board transmitting light side, is formed and the light source board by multiple support columns
Parallel supporting plane, for placing tested device；
The probe is used to trigger the tested device, and detects the tested device in triggering and produce sensing
Indication signal is sent during electric current.
Wherein, the cavity is non-transparent cavity, to avoid the interference of the ambient light in test process.
In the multiple illuminators of light source board side surface distributed, illuminator is produced light under the control of control unit, project
Tested device, to simulate X-ray exposure, and the intensity for producing light is controlled, to simulate X-ray exposure dosage.
When testing tested device, tested device is placed on the supporting plane of support column formation, by
Light source board produces preset strength light projection to tested device, simulates X-ray exposure；Then tested device is clicked on probe,
Indication signal is sent if detecting tested device and producing induced-current in triggering, so realizes the light to tested device
Electric induction is tested.
The present embodiment test device is applied to X-ray exposure detection device detection, realizes and detects device to X-ray exposure
Optoelectronic induction test, compared with existing method of testing, it is not necessary to by X-ray exposure detection device installation, then exposed by X ray
Light is tested, and can simplify testing process, improves testing efficiency.
The test device for being applied to X-ray exposure detection device to the present embodiment below is described in detail.
Fig. 1 is refer to, a kind of signal of the test device that device is detected applied to X-ray exposure provided for the present embodiment
Figure.As seen from the figure, this test device includes non-transparent cavity 10, light source board 11, support column 12 and probe 13, the light source board
11st, the support column 12 and the probe 13 are arranged in the cavity 10.
Wherein, cavity 10 is non-transparent cavity, to avoid the interference of the ambient light in test process.It is specifically, settable
Testing cassete, non-transparent cavity is formed by testing cassete, light source board, support column and probe are arranged in testing cassete.Exemplary adopts
With closure good can and lid, on covering after will not printing opacity.
Optionally, the shape of the cavity 10 can be cuboid.
The light source board 11 includes being distributed in multiple illuminators 110 of the side surface of light source board one, and with the hair
Control unit that body of light 110 connects, for controlling the illuminator 110 to produce preset strength light.
Support column 12 is arranged on the light source board 11 and launches light side, is formed and the light source board 11 by multiple support columns 12
Parallel supporting plane, for placing tested device, in test, illuminator produces light on light source board 11, projects to be measured
Try device.Multiple illuminators 110 are evenly distributed on the side surface of light source board one, to produce uniform light to each region in space.
Preferably, refer to Fig. 2, this test device also include being arranged on the light source board 11 launch light side, be used for
By the uniform light board 14 of light adjustment light intensity uniform caused by the light source board 11.The light that light source board 11 is sent passes through uniform light board 14,
Uniform light board 14 adjusts luminous intensity uniformly, projects tested device, is advantageous to the photoelectricity that optimization detects device to X-ray exposure
Sensing test.
Specifically, the uniform light board 14 includes acrylic board and is arranged on the even smooth film on the acrylic board surface.
Control illuminator to produce the intensity of light by the luminous of control unit control illuminator 110, and by control unit, come
Simulate X-ray exposure dosage.
In the present embodiment, the control unit specifically includes：It is being connected with the illuminator, for the illuminator export
The control circuit of electric current；It is being connected with the control circuit, for according to processing of the instruction to the control circuit output voltage
Device.
Wherein, the processor specifically for being to the control circuit output size in setting time section according to instruction
The voltage of preset value.
Processor can be connected with computer in the present embodiment test device, tester can pass through computer settings
Fluorescent lifetime and luminous intensity, under issue a command to processor, processor according to the fluorescent lifetime and luminous intensity set in instruction,
Threshold voltage is preset to control circuit output in setting time section, to control light.
In a kind of embodiment, Fig. 3 is refer to, the control circuit includes the first operational amplifier U1, second
Operational amplifier U2, the first FET T1, the second FET T2, first resistor R1, second resistance R2,3rd resistor R3 and
4th resistance R4；
Input of the in-phase input end of the first operational amplifier U1 as the control circuit, output end with it is described
First FET T1 grids are connected, and inverting input is connected with the first FET T1 source electrodes；
The first FET T1 drain electrodes are connected with feeder ear, source ground, in the first FET T1 source electrodes
First resistor R1 is connected between earth terminal, the second electricity is connected between the first FET T1 drain electrodes and feeder ear
Hinder R2；
The in-phase input end of the second operational amplifier U2 connects with the first FET T1 drain electrodes, anti-phase input
End is connected with feeder ear, and output end is connected with the second FET T2 grids；
Be connected with turn between feeder ear and the second operational amplifier U2 inverting input 3rd resistor R3 and
4th resistance R4；
Connection between the second FET T2 source electrodes and the 3rd resistor R3 and the 4th resistance R4, leakage
Pole is connected with the illuminator.
Wherein illuminator can use light emitting diode, and light emitting diode positive pole and the second FET T2 drain electrodes are connected, born
Pole is grounded.
Processor is according to instruction to control circuit input input voltage VIN, control circuit is in input voltage VINControl
It is lower to illuminator output current IO.In this circuit structure, output current IOWith input voltage VINWith following relational expression：
It is exemplary, as R1=100k Ω, R2=10k Ω, R3=5.1 Ω, R1=10k Ω, then
Preferably, the present embodiment is applied to the test device of X-ray exposure detection device, strong for calibration test light
Degree, in addition to luminous intensity calibration plate, the supporting plane formed for being placed on the support column 12, sense the light source board 11
The luminous intensity of light is produced, and is converted to voltage signal and feeds back to the control unit.The control unit is additionally operable to the electricity according to feedback
Signal is pressed, adjusts the electric current exported to the illuminator 110, until the luminous intensity that the luminous intensity calibration plate senses is being set
In the range of.
Before being tested using the test device tested device, first luminous intensity calibration plate is placed on support column, set
Good fluorescent lifetime and luminous intensity, processor export electricity to control circuit output voltage, control circuit according to instruction to illuminator
Stream, control light.The sensing of luminous intensity calibration plate produces the luminous intensity of light, and is converted to voltage signal and feeds back to processing
Device；Processor adjusts the electric current exported to illuminator, until the light that luminous intensity calibration plate senses according to the voltage signal of feedback
Intensity is in setting range.The intensity of illuminator generation light can be accurately controlled by calibration, to simulate X-ray exposure.
Specifically, in a kind of embodiment, Fig. 4 is referred to, the luminous intensity inspection that the luminous intensity calibration plate includes
Slowdown monitoring circuit includes photodiode DT, the 3rd operational amplifier U3 and the first electric capacity C；
The in-phase input end ground connection of the 3rd operational amplifier U3, inverting input and the photodiode DT negative poles
Connection, output end of the output end as the light intensity detection circuit, one end and the 3rd computing of the first electric capacity C are put
Big device U3 inverting input connection, the other end are connected with the output end of the 3rd operational amplifier U3；The pole of photoelectricity two
Pipe DT plus earth.
In this circuit structure, the output of the luminous intensity calibration circuit is expressed as：VO=1/C*t.
After the completion of using the calibration of luminous intensity calibration plate, luminous intensity school is replaced with X-ray exposure detection device to be tested
Quasi- plate, control test device open operation, then processor is according to the setting voltage and fluorescent lifetime after calibration, control illuminator hair
Light, so as to realize simulation X-ray exposure, it is precisely controlled.
Illumination is received when X-ray exposure to be tested detects device, uses probe 13 to trigger tested device, probe 13
Detect tested device and produce induced-current, then send indication signal, realize test.
Refer to Fig. 2, the present embodiment test device also include it is being connected with the probe, for being detected in the probe
The tested device produces the indicator lamp 15 lighted during induced-current.Indicator lamp 15 may be provided on the outside of testing cassete.
Further, this test device also includes：
Usb 16 be connected with the light source board, for connecting externally fed equipment；
It is being connected with the light source board, for controlling the light source board to open operation or out of service when being triggered
Button 17.
Light source board can be connected with externally fed equipment by usb 16, or be connected with computer.Pass through button 17
To control the unlatching of this test device operation or out of service.
A kind of test device provided by the utility model is described in detail above.It is used herein specifically individual
Example is set forth to principle of the present utility model and embodiment, and the explanation of above example is only intended to help and understands this reality
With new method and its core concept.It should be pointed out that for those skilled in the art, this is not being departed from
On the premise of utility model principle, some improvement and modification can also be carried out to the utility model, these are improved and modification also falls
Enter in the protection domain of the utility model claims.
Claims (9)
1. a kind of test device, detect device detection applied to X-ray exposure, it is characterised in that including non-transparent cavity, light
Source plate, support column and probe, the light source board, the support column and the probe are arranged in the cavity；
The light source board includes the multiple illuminators for being distributed in the side surface of light source board one, and is connected with the illuminator
, for controlling the illuminator to produce the control unit of preset strength light；
The support column is arranged on the light source board transmitting light side, and the branch parallel with light source board is formed by multiple support columns
Peaceful face, for placing tested device；
The probe is used to trigger the tested device, and detects the tested device in triggering and produce induced-current
When send indication signal.
2. test device according to claim 1, it is characterised in that also include being arranged on the light source board transmitting light side
, for by caused by the light source board light adjust light intensity uniform uniform light board.
3. test device according to claim 2, it is characterised in that the uniform light board includes acrylic board and is arranged on institute
State the even smooth film on acrylic board surface.
4. test device according to claim 1, it is characterised in that the control unit includes：
It is being connected with the illuminator, for the control circuit of the illuminator output current；
It is being connected with the control circuit, for according to instruction to the control circuit output voltage processor.
5. test device according to claim 4, it is characterised in that the control circuit include the first operational amplifier,
Second operational amplifier, the first FET, the second FET, first resistor, second resistance, 3rd resistor and the 4th electricity
Resistance；
Input of the in-phase input end of first operational amplifier as the control circuit, output end with described first
Effect tube grid is connected, and inverting input is connected with the first FET source electrode；
First FET drain is connected with feeder ear, source ground, in the first FET source electrode and earth terminal
Between be connected with first resistor, be connected with second resistance between first FET drain and feeder ear；
The in-phase input end of second operational amplifier is connected with first FET drain, inverting input and power supply
End connection, output end are connected with second fet gate；
3rd resistor and the 4th resistance are connected with turn between the inverting input of feeder ear and second operational amplifier；
Connection between the second FET source electrode and the 3rd resistor and the 4th resistance, drain electrode and the hair
Body of light connects.
6. test device according to claim 1, it is characterised in that also include：
The supporting plane formed for being placed on the support column, sense the light source board and produce the luminous intensity of light, and change
The luminous intensity calibration plate of the control unit is fed back to for voltage signal.
7. test device according to claim 6, it is characterised in that the luminous intensity detection that the luminous intensity calibration plate includes
Circuit includes photodiode, the 3rd operational amplifier and the first electric capacity；
The in-phase input end ground connection of 3rd operational amplifier, inverting input is connected with the photodiode negative pole, defeated
Go out output end of the end as the light intensity detection circuit, one end of first electric capacity is anti-with the 3rd operational amplifier
Phase input is connected, and the other end is connected with the output end of the 3rd operational amplifier；
The plus earth of the photodiode.
8. according to the test device described in claim any one of 1-7, it is characterised in that also include be connected with the probe,
For detecting the indicator lamp lighted when the tested device produces induced-current in the probe.
9. according to the test device described in claim any one of 1-7, it is characterised in that also include：
USB interface be connected with the light source board, for connecting externally fed equipment；
It is being connected with the light source board, for controlled when being triggered the light source board open operation or it is out of service by
Button.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720337248.6U CN206696209U (en) | 2017-03-31 | 2017-03-31 | A kind of test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720337248.6U CN206696209U (en) | 2017-03-31 | 2017-03-31 | A kind of test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206696209U true CN206696209U (en) | 2017-12-01 |
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ID=60438319
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720337248.6U Active CN206696209U (en) | 2017-03-31 | 2017-03-31 | A kind of test device |
Country Status (1)
| Country | Link |
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| CN (1) | CN206696209U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106959314A (en) * | 2017-03-31 | 2017-07-18 | 上海品臻影像科技有限公司 | A kind of test device |
-
2017
- 2017-03-31 CN CN201720337248.6U patent/CN206696209U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106959314A (en) * | 2017-03-31 | 2017-07-18 | 上海品臻影像科技有限公司 | A kind of test device |
| CN106959314B (en) * | 2017-03-31 | 2024-07-05 | 上海品臻影像科技有限公司 | Testing device |
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