CN210221287U - Expansion device of LED luminous flux testing method - Google Patents
Expansion device of LED luminous flux testing method Download PDFInfo
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- CN210221287U CN210221287U CN201920958246.8U CN201920958246U CN210221287U CN 210221287 U CN210221287 U CN 210221287U CN 201920958246 U CN201920958246 U CN 201920958246U CN 210221287 U CN210221287 U CN 210221287U
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Abstract
The utility model discloses an extension fixture of led luminous flux test method, wherein, including luminous flux data testing arrangement, and electric power data measuring and calculating device. The luminous flux data testing device comprises an integrating sphere, a multi-chip high-integration-level LED, a light sensor, a photoelectric detection device and an upper computer. The electric power data measuring and calculating device comprises an expansion device and an external power supply. The expansion device comprises a photoelectric coupler, a triode driving circuit and a linear constant current circuit. The linear constant current circuit comprises a first universal meter, a second universal meter, a resistor R3 and a voltage stabilizer LM 317. The second multimeter is connected with the multi-chip high-integration-level LED in parallel; the voltage stabilizer LM317 is connected with the input end of the external power supply; the linear constant current circuit provides constant test current for the multi-chip high-integration-level led. And the first multimeter and the second multimeter respectively record the voltage and the current during the test. The utility model discloses have and be suitable for different power led light source tests and save the cost, and simple structure's effect.
Description
Technical Field
The utility model belongs to luminous flux test field, in particular to extension device of led luminous flux test method.
Background
The method for testing the luminous flux of a light source of a light emitting diode (led) is usually performed by a testing instrument called an integrating sphere. The principle is that an upper computer controls and a photoelectric detection device supplies power to an LED, then the LED is placed in a sealed sphere, light emitted by the LED is received by a photoelectric sensor and converted into an analog electric signal to be transmitted back to the photoelectric detection device, the analog electric signal is converted into a digital signal by a built-in analog/digital conversion circuit, the digital signal is subjected to integral operation processing by a processor, and the digital signal is output to the upper computer to display data and graphs. If the total amount of light emitted by a test led per unit time at different operating currents is defined as the luminous flux of the led at the different operating currents. An electrical parameter detection circuit arranged in the photoelectric detection device detects the working voltage of the led and outputs a digital signal, and power parameters of the led under different working currents are analyzed and calculated through application software of an upper computer. And through comparison of luminous flux and power, light efficiency data of the led is obtained. At present, manufacturers for producing integrating sphere testing instruments basically divide the specifications of integrating sphere products into large and small sizes and design the integrating sphere products into standard products. The large-scale photoelectric parameter of whole lamps and lanterns of measuring, the small-scale photoelectric parameter of measuring single light source. For a user who purchases a small integrating sphere, the range of power supplied by the configured photoelectric detection device is limited, and the device is only suitable for a single-chip LED (for example, 25V), and for measuring a multi-chip high-integration LED (for short, a multi-chip high-integration LED) (for example, a voltage is greater than 25V) appearing in the current market, due to the large power, the operating voltage is relatively high, and the trend is increasing. The small integrating sphere is useless.
SUMMERY OF THE UTILITY MODEL
In view of the above problems, an object of the present invention is to provide an extension apparatus suitable for led light source testing with different powers, cost saving, and a led light flux testing method with a simple structure.
In order to achieve the above object, the present invention provides an expanding device of an led luminous flux testing method, wherein the expanding device comprises a luminous flux data testing device and an electric power data measuring and calculating device arranged on the luminous flux data testing device. The luminous flux data testing device comprises an integrating sphere, a multi-chip high-integration-level LED and a light sensor which are respectively arranged on two sides in the integrating sphere, and a photoelectric detection device connected with the light sensor and an upper computer connected on one side of the photoelectric detection device which are arranged outside the integrating sphere.
The electric power data measuring and calculating device comprises an expansion device and an external power supply, wherein the expansion device is respectively connected with the multi-chip high-integration-level LED and the photoelectric detection equipment, and the external power supply is connected to the expansion device;
the expansion device comprises a photoelectric coupler connected with a port of the photoelectric detection equipment, a triode driving circuit which utilizes the output driving voltage of the photoelectric coupler to generate a high-power N-type field effect and is connected with the photoelectric coupler, and a linear constant current circuit which utilizes the output driving voltage of the triode driving circuit to be connected with the triode driving circuit;
the linear constant current circuit comprises a first multimeter, a second multimeter, a resistor R3 and a voltage stabilizer LM317, wherein the first multimeter is connected with the triode driving circuit in series, the second multimeter is connected with the first multimeter in series, the resistor R3 is connected with the second multimeter in series, and the voltage stabilizer LM317 is connected with the resistor R3 in series; the second multimeter is connected with the multi-chip high-integration-level LED in parallel; the voltage stabilizer LM317 is connected with the input end of an external power supply; the linear constant current circuit provides constant test current for the multi-chip high-integration-level led; the linear constant current circuit provides constant current drive of adjustable current data for the multi-chip high-integration-level led. Therefore, the negative line is connected with the positive meter pen of the first universal meter (which is responsible for measuring direct current), and the negative meter pen of the first universal meter is connected with the source electrode (namely 2 pins) of the N-type high-power field effect transistor driving circuit. And a second universal meter (which is responsible for measuring direct-current voltage), wherein the positive meter pen is connected with the positive pole of the multi-chip high-integration-level LED, and the negative meter pen is connected with the negative pole of the multi-chip high-integration-level LED.
And the first multimeter and the second multimeter respectively record the voltage and the current during testing.
In some embodiments, the opto-coupler is a PC817 opto-coupler.
a resistor R1 is connected in series between the photoelectric coupler and the triode driving circuit; the triode driving circuit is connected with a resistor R2 in parallel.
In some embodiments, the transistor drive circuit is a high power transistor; the high-power triode comprises a first pin grid, a second pin source and a third pin drain; and the drain electrode of the third pin is connected with the output end of the external power supply.
In some embodiments, the voltage of the external power supply should be greater than the sum of the voltage for operating the multi-chip high-integration led and the voltage for operating the voltage regulator LM317, and the output current should be greater than the multi-chip high-integration led test current.
The beneficial effects of the utility model are that with the design of low cost, solved and possessed the high-power multicore piece high integration led photoelectric parameter problem of small-size integrating sphere user test at present, and simple structure's effect. Because two multimeters are adopted, the direct current measurement and the direct current voltage measurement are respectively arranged, and then the two multimeters are connected in series and in parallel with the multi-chip high-integration-level led in the circuit, and the product of the current and the voltage data is used for obtaining electric power data. Meanwhile, the photoelectric detection equipment detects the light signal current from the integrating sphere, outputs the light signal current to the upper computer through integration processing to display luminous flux data and other optical parameters, and finally obtains the light efficiency through comparing the luminous flux data with electric power data, so that the quality grade of the multi-chip high-integration-level led is judged. The whole process overcomes the defect that photoelectric data of a small integrating sphere in the prior art are insufficient to test a multi-chip high-integration-level LED (multi-chip high-integration-level LED) through a simple expansion circuit and with the advantage of low cost, solves the problem that a user needs to increase large equipment investment to test the multi-chip high-integration-level LED in the prior art, and has certain advancement. The LED light source testing device has the advantages of being suitable for LED light source testing with different powers, saving cost and being simple in structure.
Drawings
Fig. 1 is a schematic structural view of the present invention;
fig. 2 is a circuit diagram of the expansion device shown in fig. 1.
Detailed Description
The following describes the present invention in further detail with reference to the accompanying drawings.
As shown in fig. 1-2, an extension device of an led light flux testing method comprises a light flux data testing device 01 and an electric power data calculating device 02 arranged on the light flux data testing device 01. The luminous flux data testing device 01 comprises an integrating sphere 11, a multi-chip high-integration led12 and a light sensor 13 which are respectively arranged on two sides in the integrating sphere 11, and a photoelectric detection device 14 connected with the light sensor 13 and an upper computer 15 connected on one photoelectric detection side are arranged outside the integrating sphere 11. The electric power data measuring and calculating device 02 includes an expansion device 21 connected to the multi-chip high-integration led12 and the photodetection device 14, respectively, and an external power supply 22 connected to the expansion device 21. The extension device 21 includes a photo coupler 211 connected to a port of the photodetection device 14, a transistor driving circuit 212 connected to the photo coupler 211 for generating a high power N-type field effect by using a driving voltage output from the photo coupler 211, and a linear constant current circuit 213 connected to the transistor driving circuit 212 for outputting a driving voltage by using the transistor driving circuit 212. The linear constant current circuit 213 comprises a first multimeter connected in series with the triode drive circuit 212, a second multimeter connected in series with the first multimeter, a resistor R3 connected in series with the second multimeter, and a voltage stabilizer LM317 connected in series with the resistor R3; the second multimeter is connected with the multi-chip high-integration-level LED12 in parallel; the voltage stabilizer LM317 is connected with the input end of the external power supply 22; the linear constant current circuit 213 provides a constant test current for the multi-chip high-integration-level led 12; the linear constant current circuit 213 provides a constant current drive of adjustable current data to the multi-chip high-integration led 12. The negative line is connected with the positive meter pen of the first universal meter (responsible for measuring direct current), and the negative meter pen of the first universal meter is connected with the source electrode (namely 2 feet) of the N-type high-power field effect transistor driving circuit 212. And a second universal meter (which is responsible for measuring direct-current voltage), wherein the positive meter pen is connected with the positive pole of the multi-chip high-integration-level LED12, and the negative meter pen is connected with the negative pole of the multi-chip high-integration-level LED 12. And the first multimeter and the second multimeter respectively record the voltage and the current during the test. The photocoupler 211 is a PC817 photocoupler 211. Pins 1 and 2 of the PC817 photoelectric coupler 211 are internally provided with light emitting diodes which emit light when being electrified, and pins 3 and 4 are internally provided with phototransistors which are conducted by light irradiation and collectors. A resistor R1 is connected in series between the photoelectric coupler 211 and the transistor driving circuit 212, and a resistor R2 is connected in parallel to the transistor driving circuit 212. Transistor drive circuit 212 is a high power transistor. The high-power triode comprises a first pin grid electrode, a second pin source electrode and a third pin drain electrode. The drain of the third pin is connected to the output terminal of the external power supply 22. The voltage of the external power supply 22 should be greater than the sum of the voltage of the multi-chip high-integration-level led12 and the voltage of the voltage regulator LM317, and the output current is greater than the testing current of the multi-chip high-integration-level led 12.
Principle of operation
And (3) opening control software of the photoelectric detection device 14 and the upper computer 15, setting the test current to be 5mA, and starting the test. The light emitting diode built in pins 2111 and 2 of the photoelectric coupler is electrified to emit light, the emitter and the collector of the built-in photosensitive transistor of pins 3 and 4 are conducted under the irradiation of light, the voltage of the external power supply 22 is added to a voltage division circuit consisting of resistors R1 and R2 through the emitter of the photosensitive transistor, and the driving voltage is output to the grid (pin 1) of the N-type field effect triode Q, so that the source (pin 2) and the drain (pin 3) are conducted, and a test current loop is provided for the multi-chip high-integration led 12. The external power supply 22 provides constant test current for the multi-chip high-integration led12 through a constant current source consisting of the voltage regulators LM317 and the R3, and the first multimeter and the second multimeter record voltage and current during testing respectively.
The light sensor 13 in the integrating sphere 11 absorbs the light emitted from the multi-chip high integration led12 in the unit time set by the computer, converts the light into an electric signal, transmits the electric signal to the built-in analog/digital conversion circuit of the photoelectric detection device 14, converts the electric signal into a digital signal by the built-in analog/digital conversion circuit, performs integration operation processing by the processor, and outputs the digital signal to the application software of the upper computer 15 to display luminous flux data and other data.
What has been described above are only some embodiments of the invention. For those skilled in the art, without departing from the inventive concept, several modifications and improvements can be made, which are within the scope of the invention.
Claims (4)
1. An expansion device of an LED luminous flux testing method is characterized by comprising a luminous flux data testing device and an electric power data measuring and calculating device arranged on the luminous flux data testing device;
the luminous flux data testing device comprises an integrating sphere, a multi-chip high-integration-level led and a light sensor which are respectively arranged on two sides in the integrating sphere, photoelectric detection equipment connected with the light sensor and an upper computer connected on one side of photoelectric detection which are arranged outside the integrating sphere;
the electric power data measuring and calculating device comprises an expansion device and an external power supply, wherein the expansion device is respectively connected with the multi-chip high-integration-level LED and the photoelectric detection equipment, and the external power supply is connected to the expansion device;
the expansion device comprises a photoelectric coupler connected with a port of the photoelectric detection equipment, a triode driving circuit which utilizes the output driving voltage of the photoelectric coupler to generate an N-type field effect and is connected with the photoelectric coupler, and a linear constant current circuit which utilizes the triode driving circuit to output the driving voltage;
the linear constant current circuit comprises a first multimeter, a second multimeter, a resistor R3 and a voltage stabilizer LM317, wherein the first multimeter is connected with the triode driving circuit in series, the second multimeter is connected with the first multimeter in series, the resistor R3 is connected with the second multimeter in series, and the voltage stabilizer LM317 is connected with the resistor R3 in series; the second multimeter is connected with the multi-chip high-integration-level LED in parallel; the voltage stabilizer LM317 is connected with the input end of an external power supply; the linear constant current circuit provides constant test current for the multi-chip high-integration-level led;
and the first multimeter and the second multimeter respectively record the voltage and the current during testing.
2. The expanding device for an led luminous flux testing method according to claim 1, wherein the photocoupler is a PC817 photocoupler;
pins 1 and 2 of the PC817 photoelectric coupler are internally provided with light emitting diodes which emit light when being electrified, and pins 3 and 4 are internally provided with emitters and collectors of photosensitive transistors which are irradiated by light and conducted;
a resistor R1 is connected in series between the photoelectric coupler and the triode driving circuit; the triode driving circuit is connected with a resistor R2 in parallel.
3. The expanding device of an led light flux testing method according to claim 2, wherein the transistor driving circuit is a transistor; the triode comprises a first pin grid, a second pin source and a third pin drain; and the drain electrode of the third pin is connected with the output end of the external power supply.
4. The extension device for led luminous flux testing method according to claim 1,2 or 3, wherein the voltage of the external power supply is greater than the sum of the voltage for multi-chip high-integration led operation and the voltage for the voltage regulator LM317 operation, and the output current is greater than the multi-chip high-integration led testing current.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920958246.8U CN210221287U (en) | 2019-06-22 | 2019-06-22 | Expansion device of LED luminous flux testing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920958246.8U CN210221287U (en) | 2019-06-22 | 2019-06-22 | Expansion device of LED luminous flux testing method |
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| Publication Number | Publication Date |
|---|---|
| CN210221287U true CN210221287U (en) | 2020-03-31 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920958246.8U Expired - Fee Related CN210221287U (en) | 2019-06-22 | 2019-06-22 | Expansion device of LED luminous flux testing method |
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| Country | Link |
|---|---|
| CN (1) | CN210221287U (en) |
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2019
- 2019-06-22 CN CN201920958246.8U patent/CN210221287U/en not_active Expired - Fee Related
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