CN106932107A - A kind of topological charge measurement apparatus based on far field construction principle - Google Patents
A kind of topological charge measurement apparatus based on far field construction principle Download PDFInfo
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- 238000005259 measurement Methods 0.000 title abstract description 5
- 238000010276 construction Methods 0.000 title abstract 3
- 238000001914 filtration Methods 0.000 claims description 4
- CPBQJMYROZQQJC-UHFFFAOYSA-N helium neon Chemical compound [He].[Ne] CPBQJMYROZQQJC-UHFFFAOYSA-N 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 abstract description 11
- 238000001514 detection method Methods 0.000 abstract description 9
- 239000004606 Fillers/Extenders Substances 0.000 abstract 1
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 230000005540 biological transmission Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 238000004088 simulation Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 229910021532 Calcite Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
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Abstract
A kind of topological charge measurement apparatus based on far field construction principle, belong to information optical technical field, solve the problems, such as that the detection light path of existing topological charge measurement apparatus is complicated.Described device：Continuous laser injects beam splitter through polariscope, the first condenser lens and extender lens successively.Incident laser is divided into two beams by beam splitter, and beam of laser is reflected off out described device, and another beam of laser is transmitted into spatial light modulator through it.Incident laser is converted to vortex beams by spatial light modulator.Laser after conversion is divided into two beams by beam splitter, and beam of laser transmits described device through it, and another beam of laser is reflected off to diaphragm.Shelter and the second condenser lens are set gradually between diaphragm and photodetector.There is far field construction in the laser for injecting shelter.Shelter is light tight, and the part that it overlaps with incident laser is sector, and fan-shaped central angle is 30 °, and its summit is located on incident laser central shaft.The present invention is applied to the topological charge number of measurement vortex beams.
Description
Technical Field
The invention relates to a topological load measuring device, and belongs to the technical field of information optics.
Background
The existing vortex light beam topological load measuring device is usually based on an interference or anti-vortex demodulation principle, the two types of topological load measuring devices have the defects of multiple types and quantities of required optical devices, complex detection light path and high cost, and the practical application of the orbital angular momentum detection technology is limited to a great extent.
Disclosure of Invention
The invention provides a topological charge measuring device based on a far field diffraction principle, which aims to solve the problem that the detection light path of the conventional topological charge measuring device is complex.
The topological charge measuring device based on the far field diffraction principle comprises a continuous laser, a polarizer 1, a first beam condensing lens 2, a beam expanding lens 3, a beam splitter 4, a spatial light modulator 5, a diaphragm 6, a shield 7, a second beam condensing lens 8 and a photoelectric detector 9; laser emitted by the continuous laser sequentially passes through the filtering of the polarizer 1, the beam converging of the first beam converging lens 2 and the beam expanding of the beam expanding lens 3 and then is emitted into the beam splitter 4, the beam splitter 4 divides the incident laser into two beams, one beam of laser is reflected out of the measuring device by the beam splitter 4, and the other beam of laser is transmitted into the spatial light modulator 5 through the beam splitter 4;
the spatial light modulator 5 is used for modulating the phase of incident laser and converting the incident laser from a Gaussian beam into a vortex beam;
the laser original path converted by the spatial light modulator 5 returns to the beam splitter 4 and is divided into two beams by the beam splitter 4, one beam of laser is transmitted out of the measuring device through the beam splitter 4, and the other beam of laser is reflected to the diaphragm 6 by the beam splitter 4;
reflected laser from the beam splitter 4 is sequentially filtered by the diaphragm 6 and shielded by the shielding object 7, then is subjected to far-field diffraction, and is converged by the second beam condensing lens 8 and then is incident on a focal plane of the photoelectric detector 9 at a focal point;
the shade 7 is opaque, its part coinciding with the incident laser light being a sector with a central angle of 30 ° and its vertex lying on the central axis of the incident laser light.
Preferably, the polarizer 1 is a glan-taylor prism.
Preferably, the focal length of the first condenser lens 2 is 3cm, and the focal length of the expander lens 3 is 15 cm.
Further, the focal length of the second condenser lens 8 is 40 cm.
Preferably, the spatial light modulator 5 is a reflective spatial light modulator.
Preferably, the photodetector 9 is a CCD detector.
Preferably, the continuous laser is a 632nm helium-neon laser.
Preferably, the measuring device further comprises a positive L-order helical phase plate 10, L being a positive integer and less than or equal to 5; a spiral phase plate 10 of positive L order is arranged on the optical path between the diaphragm 6 and the shutter 7.
The spatial light modulator 5 is pre-written with a topological charge beam phase hologram, and the diaphragm 6 is used for filtering high-order diffraction components in the vortex optical beam so as to purify the quality of the vortex optical beam.
After passing through the shield 7, the vortex beam changes its amplitude and follows the far field diffraction transmission, imaging at infinity.
The second beam condensing lens 8 is used for imaging the vortex light beam transmitted by far-field diffraction on a focal plane of the vortex light beam, and receiving the vortex light beam through the photoelectric detector 9, wherein the number of bright light spots of the image in the photoelectric detector 9 is the topological charge number of the vortex light beam.
The topological load measuring device modulates the phase of laser to be measured through the spatial light modulator to convert the phase into vortex light beams to be measured, and arranges a shielding object on the light path of the vortex light beams to enable the vortex light beams to generate far-field diffraction. Compared with the existing topological charge measuring device based on the interference or anti-vortex demodulation principle, the topological charge measuring device disclosed by the invention has the advantages of fewer optical devices, less quantity, relatively simple detection light path and lower cost, and can effectively promote the practical application of the orbital angular momentum detection technology.
Drawings
The topological charge measurement device based on the far-field diffraction principle according to the present invention will be described in more detail hereinafter on the basis of an embodiment and with reference to the accompanying drawings, in which:
fig. 1 is a schematic optical path diagram of a topological charge measuring device based on the far-field diffraction principle according to a first embodiment, in which 11 is a continuous laser;
FIG. 2 is a schematic view of a fan-shaped portion of the obstruction coinciding with the vortex beam according to one embodiment;
fig. 3 is a schematic optical path diagram of a topological charge measuring device based on the far-field diffraction principle according to an eighth embodiment.
In the drawings, like parts are provided with like reference numerals. The drawings are not to scale.
Detailed Description
The topological charge measuring device based on the far-field diffraction principle according to the present invention will be further described with reference to the accompanying drawings.
The first embodiment is as follows: the present embodiment is described in detail below with reference to fig. 1 and 2.
The topological charge measuring device based on the far-field diffraction principle comprises a continuous laser, a polarizer 1, a first beam condensing lens 2, a beam expanding lens 3, a beam splitter 4, a spatial light modulator 5, a diaphragm 6, a shield 7, a second beam condensing lens 8 and a photoelectric detector 9; laser emitted by the continuous laser sequentially passes through the filtering of the polarizer 1, the beam converging of the first beam converging lens 2 and the beam expanding of the beam expanding lens 3 and then is emitted into the beam splitter 4, the beam splitter 4 divides the incident laser into two beams, one beam of laser is reflected out of the measuring device by the beam splitter 4, and the other beam of laser is transmitted into the spatial light modulator 5 through the beam splitter 4;
the spatial light modulator 5 is used for modulating the phase of incident laser and converting the incident laser from a Gaussian beam into a vortex beam;
the laser original path converted by the spatial light modulator 5 returns to the beam splitter 4 and is divided into two beams by the beam splitter 4, one beam of laser is transmitted out of the measuring device through the beam splitter 4, and the other beam of laser is reflected to the diaphragm 6 by the beam splitter 4; reflected laser from the beam splitter 4 is sequentially filtered by the diaphragm 6 and shielded by the shielding object 7, then is subjected to far-field diffraction, and is converged by the second beam condensing lens 8 and then is incident on a focal plane of the photoelectric detector 9 at a focal point; the shade 7 is opaque, its part coinciding with the incident laser light being a sector with a central angle of 30 ° and its vertex lying on the central axis of the incident laser light.
The expression for the vortex beam is:
wherein,is the Gouy phase;is the Rayleigh length; omega0Is the girdling radius;is the beam radius;is a normalized coefficient;is an associated laguerre polynomial, and l and p are characteristic quantum numbers characterizing the pattern; the radial quantum number p indicates that the number of concentric rings of light in the beam cross-section is p +1 and the azimuthal quantum number l indicates the order of the phase singularity, i.e. the phase changes by 2l pi around the phase singularity. The phase factor exp (il θ) indicates that the beam has a helical structure, i is an imaginary unit, k is the wave vector, r is the radius of the polar coordinates, and z is the transmission distance.
FIG. 2 is a schematic view of a fan-shaped portion of a mask coinciding with a vortex beam, where the white portion is the vortex beam and the black portion is the mask.
The fan-shaped overall amplitude transmittance function is:
the amplitude variation of the vortex beam is:
the far field diffraction of the vortex beam is equivalent to one Fourier transform, and the amplitude after the transform is as follows:
and performing mode squaring on the transformed amplitude to obtain the light intensity distribution of a far field. And (3) obtaining a simulation graph by using software simulation, wherein the number of bright light spots in the simulation graph is the number of topological charges in vortex rotation.
The topological charge measuring device based on the far-field diffraction principle in the embodiment is based on the theory that vortex light beams have orbital angular momentum, adopts a regular shielding object to enable the vortex light beams to generate far-field diffraction, captures the vortex light beams diffracted by the far-field through a beam focusing lens and a CCD detector, and judges the topological charge number of the vortex light beams through the bright light spot number of vortex light images. Compared with the prior art, the topological charge measuring device based on the far-field diffraction principle can realize simple and convenient detection of the topological charge of the vortex light beam, can more accurately measure the topological charge in the signal light, and is suitable for the fields of quantum communication, laser detection, optical signal detection and the like.
Example two: this embodiment is further limited to the topological charge measuring device based on the far-field diffraction principle described in the first embodiment.
In the topological load measuring device based on the far-field diffraction principle, the polarizer 1 is a glan-taylor prism.
In this embodiment, a Glan Taylor prism, which is a birefringent polarizer made of natural calcite crystal and mainly composed of CaCO, is used as a polarizer3The rhombohedral crystal of (1). A beam of unpolarized light is input to obtain a linearly polarized light. Compared with other polarizing devices, the transmittance and the polarization purity of the polarizing device are higher. In this embodiment, a Glan Taylor prism model GCL-070215 is used. The present embodiment uses a GCC-401021 type beam splitter.
Example three: this embodiment is further limited to the topological charge measuring device based on the far-field diffraction principle described in the first embodiment.
In the topology load measuring device based on the far-field diffraction principle, the focal length of the first beam focusing lens 2 is 3cm, and the focal length of the beam expanding lens 3 is 15 cm.
In this embodiment, a lens of model GCL-010217 is used as the first condenser lens, and a lens of model GCL-010212 is used as the beam expander lens.
Example four: this embodiment is further limited to the topological charge measuring device based on the far-field diffraction principle described in the first embodiment.
In the topology load measuring device based on the far-field diffraction principle, the spatial light modulator 5 is a reflective spatial light modulator.
In this embodiment, a liquid crystal on silicon spatial light modulator is used, and the spatial light modulator is a reflective spatial light modulator, and has a resolution of 600 × 600, and only changes the phase of light without changing the intensity and polarization state of light.
Example five: this embodiment is further limited to the topological charge measuring device based on the far-field diffraction principle described in the third embodiment.
In the topological charge measuring device based on the far-field diffraction principle, the focal length of the second focusing lens 8 is 40 cm.
In the embodiment, a lens of GCL-010214 model is adopted as the second condenser lens, and a diaphragm of GCD-5701M model is selected.
Example six: this embodiment is further limited to the topological charge measuring device based on the far-field diffraction principle described in the first embodiment.
In the topological charge measuring device based on the far-field diffraction principle, the photoelectric detector 9 is a CCD detector.
This embodiment uses a GCI-050104 model CCD detector.
Example seven: this embodiment is further limited to the topological charge measuring device based on the far-field diffraction principle described in the first embodiment.
In the topological charge measuring device based on the far-field diffraction principle, the continuous laser is a 632nm helium-neon laser.
The 632nm He-Ne laser of the embodiment has excellent power stability and frequency stability, outputs the linear polarized Gaussian light with the wavelength of 632nm, and has a transverse mode of TEM00The beam divergence angle is less than 1 mrad.
Example eight: the present embodiment is described in detail below with reference to fig. 3. The present embodiment is further defined in that the topological charge measuring device based on the far-field diffraction principle according to any one of the first to seventh embodiments.
The topological charge measuring device based on the far-field diffraction principle further comprises a positive L-order spiral phase plate 10, wherein L is a positive integer and is less than or equal to 5, and the positive L-order spiral phase plate 10 is arranged on an optical path between the diaphragm 6 and the shield 7.
The positive L-order spiral phase plate of this embodiment is used to determine the positive or negative of the topological charge number of the vortex beam, and the specific determination method is as follows:
step one, acquiring the topological charge number of a vortex light beam by adopting a topological charge measuring device based on the far-field diffraction principle in the embodiment one;
and step two, arranging a positive L-order spiral phase plate 10 on an optical path between the diaphragm 6 and the shelter 7, wherein when the number of bright spots of the image in the photoelectric detector 9 is increased, the topological charge number of the vortex light beam obtained in the step one is positive, and when the number of bright spots of the image in the photoelectric detector 9 is decreased, the topological charge number of the vortex light beam obtained in the step one is negative.
The topological charge measuring device based on the far-field diffraction principle judges whether the topological charge number of the vortex light beam is positive or negative through the additionally arranged spiral phase plate with the positive L order, and acquires the orbital angular momentum information of the vortex light beam more comprehensively.
Although the invention herein has been described with reference to particular embodiments, it is to be understood that these embodiments are merely illustrative of the principles and applications of the present invention. It is therefore to be understood that numerous modifications may be made to the illustrative embodiments and that other arrangements may be devised without departing from the spirit and scope of the present invention as defined by the appended claims. It should be understood that features described in different dependent claims and herein may be combined in ways different from those described in the original claims. It is also to be understood that features described in connection with individual embodiments may be used in other described embodiments.
Claims (8)
1. A topological charge measuring device based on a far-field diffraction principle is characterized by comprising a continuous laser, a polarizer (1), a first beam-focusing lens (2), a beam-expanding lens (3), a beam splitter (4), a spatial light modulator (5), a diaphragm (6), a shield (7), a second beam-focusing lens (8) and a photoelectric detector (9);
laser emitted by the continuous laser sequentially passes through the filtering of the polarizer (1), the beam converging of the first beam converging lens (2) and the beam expanding of the beam expanding lens (3) and then is emitted into the beam splitter (4), the beam splitter (4) divides the incident laser into two beams, one beam of laser is reflected out of the measuring device by the beam splitter (4), and the other beam of laser is transmitted into the spatial light modulator (5) through the beam splitter (4);
the spatial light modulator (5) is used for modulating the phase of incident laser and converting the incident laser from a Gaussian beam into a vortex beam;
the laser original path converted by the spatial light modulator (5) returns to the beam splitter (4) and is divided into two beams by the beam splitter (4), one beam of laser is transmitted out of the measuring device through the beam splitter (4), and the other beam of laser is reflected to the diaphragm (6) by the beam splitter (4);
reflected laser from the beam splitter (4) is subjected to far-field diffraction after being sequentially filtered by the diaphragm (6) and shielded by the shielding object (7), and is converged by the second beam condensing lens (8) and then is incident on a focal plane of the photoelectric detector (9) at a focal point;
the shade (7) is opaque, the portion of the shade coinciding with the incident laser is a sector, the central angle of the sector is 30 DEG, and the vertex of the sector is located on the central axis of the incident laser.
2. The topological charge measuring device based on the far-field diffraction principle of claim 1, characterized in that the polarizer (1) is a Glan Taylor prism.
3. The far-field diffraction principle-based topological charge measuring device according to claim 1, wherein the focal length of the first condenser lens (2) is 3cm, and the focal length of the expander lens (3) is 15 cm.
4. The topological charge measuring device based on the far-field diffraction principle as claimed in claim 1, characterized in that the spatial light modulator (5) is a reflective spatial light modulator.
5. The topological charge measuring device based on the far-field diffraction principle according to claim 3, characterized in that the focal length of the second condenser lens (8) is 40 cm.
6. The topological charge measuring device based on far-field diffraction principle according to claim 1, characterized in that the photodetector (9) is a CCD detector.
7. The far-field diffraction based topological charge measuring device of claim 1, wherein said continuous laser is a 632nm helium-neon laser.
8. The far-field diffraction principle-based topological charge measuring device according to any one of claims 1 to 7, further comprising a positive L-order spiral phase plate (10), L being a positive integer and less than or equal to 5;
a positive L-order spiral phase plate (10) is arranged on the light path between the diaphragm (6) and the shutter (7).
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Cited By (7)
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| CN107941353A (en) * | 2018-03-06 | 2018-04-20 | 中国计量大学 | A kind of mensuration based on the associated coherence vortex topological charge of two-photon |
| CN110487395A (en) * | 2019-09-26 | 2019-11-22 | 合肥工业大学 | Acoustics vortex field detector based on Fraunhofer diffraction principle |
| WO2020037813A1 (en) * | 2018-08-24 | 2020-02-27 | 深圳大学 | Double-lug circular diffraction diaphragm and vortex optical topological charge number detection system and method |
| CN112326024A (en) * | 2020-09-25 | 2021-02-05 | 山东师范大学 | Device and method for simultaneously measuring topological load size, positive load size and negative load size of vortex light beam |
| CN112737686A (en) * | 2021-04-01 | 2021-04-30 | 南京信息工程大学 | High-performance space optical transmission system based on geometric probability shaping technology |
| CN115220038A (en) * | 2022-06-21 | 2022-10-21 | 中国人民解放军战略支援部队航天工程大学 | Vortex light radar imaging method based on synthetic aperture mode |
| CN115220038B (en) * | 2022-06-21 | 2024-10-22 | 中国人民解放军战略支援部队航天工程大学 | Vortex optical radar imaging method based on synthetic aperture mode |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107941353A (en) * | 2018-03-06 | 2018-04-20 | 中国计量大学 | A kind of mensuration based on the associated coherence vortex topological charge of two-photon |
| CN107941353B (en) * | 2018-03-06 | 2024-01-09 | 中国计量大学 | Two-photon correlation-based coherent vortex topology charge measurement method |
| WO2020037813A1 (en) * | 2018-08-24 | 2020-02-27 | 深圳大学 | Double-lug circular diffraction diaphragm and vortex optical topological charge number detection system and method |
| CN110487395A (en) * | 2019-09-26 | 2019-11-22 | 合肥工业大学 | Acoustics vortex field detector based on Fraunhofer diffraction principle |
| CN112326024A (en) * | 2020-09-25 | 2021-02-05 | 山东师范大学 | Device and method for simultaneously measuring topological load size, positive load size and negative load size of vortex light beam |
| CN112326024B (en) * | 2020-09-25 | 2022-07-22 | 山东师范大学 | Device and method for simultaneously measuring topological load size and positive and negative of vortex light beam |
| CN112737686A (en) * | 2021-04-01 | 2021-04-30 | 南京信息工程大学 | High-performance space optical transmission system based on geometric probability shaping technology |
| CN115220038A (en) * | 2022-06-21 | 2022-10-21 | 中国人民解放军战略支援部队航天工程大学 | Vortex light radar imaging method based on synthetic aperture mode |
| CN115220038B (en) * | 2022-06-21 | 2024-10-22 | 中国人民解放军战略支援部队航天工程大学 | Vortex optical radar imaging method based on synthetic aperture mode |
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