CN106841979A - It is a kind of with can test and Real-time Feedback IC electrical characteristic test devices - Google Patents
It is a kind of with can test and Real-time Feedback IC electrical characteristic test devices Download PDFInfo
- Publication number
- CN106841979A CN106841979A CN201611234013.0A CN201611234013A CN106841979A CN 106841979 A CN106841979 A CN 106841979A CN 201611234013 A CN201611234013 A CN 201611234013A CN 106841979 A CN106841979 A CN 106841979A
- Authority
- CN
- China
- Prior art keywords
- module
- low pressure
- pressure difference
- power supply
- circuit module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
Abstract
The invention discloses a kind of IC electrical characteristic test devices that can test simultaneously Real-time Feedback in electric testing equipment field.The test device includes MCU controllers, the first low pressure difference linear voltage regulator module (LDO1), the second low pressure difference linear voltage regulator module (LDO2), input protection circuit, LCD display module, key-press module, power supply gear circuit module, power supply disturbance circuit module, over-current protection circuit module, IC modules to be measured;Method of testing, including current threshold is set to crossing flow monitoring, electric current exceedes current threshold and cuts off power supply;Voltage threshold is set to input protection circuit, and input voltage exceedes voltage threshold, cuts off the electricity supply.Mainly solve to be unable to follow-on test present in prior art, it is impossible to the problem of Real-time Feedback.
Description
Technical field
The present invention relates to electric testing equipment field, it is related specifically to a kind of with the IC electricity that can test simultaneously Real-time Feedback
Gas characteristic test device.
Background technology
With the progress of IC ic manufacturing technologies, people can produce that circuit structure is considerably complicated, integrated level
Very high, Various Functions integrated circuits.But these high integration, multi-functional integrated circuit is only through drawing for Limited Number
Pin completes the connection with external circuit, and this just brings many difficulties soon to the good of judgement integrated circuit.The survey of analog circuit
Examination is generally divided into DC characteristic test and AC characteristic test.DC characteristic test mainly includes terminal voltage characteristic, terminal electricity
Properties of flow etc..DC parameter measures in the form of voltage or electric current to measure IC electric parameters, and its major way is applied voltage
Measurement result electric current and applying current test results voltage.Voltage, the electric current for being applied should have certain dynamic range, with full
The different measurement request of foot.
Existing test device and method of testing can not be carried out continuously when IC is tested to IC operating voltages, power input resists
Interference performance is tested, can not Real-time Feedback test mode and test result.Therefore it provides one kind can have test work
Make voltage range and power supply antijamming capability, IC electrical characteristic test device of the Real-time Feedback test mode with result and test side
Method is just necessary.
The content of the invention
The technical problem to be solved in the present invention is that prior art can not be carried out to IC operating voltages automatically, power input is anti-to be done
The ability of disturbing carries out follow-on test, can not Real-time Feedback test mode and test result technical problem, there is provided one kind has energy
Enough tests and the IC electrical characteristic test devices and method of testing of Real-time Feedback.
In order to solve the above technical problems, the technical solution adopted by the present invention is as follows:
The test device includes MCU controllers, the first low pressure difference linear voltage regulator module LDO1, the second low pressure difference linearity
Voltage regulator module LDO2, input protection circuit, LCD display module, key-press module, power supply gear circuit module, power supply disturbance electricity
Road module, over-current protection circuit module, IC modules to be measured.
In above-mentioned technical proposal, further, the input protection circuit connects the first low pressure difference linear voltage regulator respectively
LDO1 and the second low pressure difference linear voltage regulator LDO2, the MCU controllers being connected with 2 low pressure difference linear voltage regulators, first
Low pressure difference linear voltage regulator LDO1 for MCU controllers provide stabilization operating voltage, the key-press module being connected with MCU controllers,
LCD display module, over-current protection circuit module, power supply gear circuit module and power supply disturbance circuit module, second low pressure
Difference linear constant voltage regulator LDO2 is also connected with power supply gear circuit.
Further, 2 low pressure difference linear voltage regulator input voltages are+5V.
Further, the second low pressure difference linear voltage regulator LDO2 be export band can reconcile control enable low voltage difference line
Property voltage-stablizer.
Further, power supply gear circuit module gear number >=8.
Further, the over-current protection circuit module is powered more than 300mA failures of current.
Further, the power supply disturbance circuit module includes the switch chip K1 being connected with MCU controllers, with switch core
Adjustable resistance R1, the resistance R2 and the electric capacity C1 in parallel with resistance R2 of piece K1 connections.
Invention additionally discloses a kind of using the survey with the IC electrical characteristic test devices that can automatically test Real-time Feedback
Method for testing, methods described includes that three GPIO mouthfuls configures 8 voltages of different gears with encoder to IC using MCU controllers,
The scope of automatic test IC operating voltages;Interference source is produced to test IC noiseproof features using power supply disturbance circuit module;Pass through
MCU controllers monitor in real time simultaneously shows IC voltages.
Further, methods described power supply disturbance circuit module is configured by several switch keys, and control is dry
Disturb the PWM frequency and dutycycle of source signal.
Further, methods described also includes setting current threshold to crossing flow monitoring, and actual current exceedes threshold
Value is switched off being powered to IC;Voltage threshold is set to input protection circuit, electricity is currently input into by hardware circuit automatic decision
Pressure exceedes voltage threshold, is switched off power supply.Obtain effect four, be prevented from misoperation, it is to avoid the too high damage of control source
Test system.
The present invention is by using input protection circuit, excessively stream monitoring module, power supply gear circuit module and power supply disturbance
Circuit module, obtains following beneficial effect:
Effect one, it is prevented from misoperation, it is to avoid the too high damage test system of control source;
Effect two, can avoid because of misoperation, cause short circuit to bring fatal problem;
Effect three, the input range that IC normal working voltages can be tested;
Effect four, the antijamming capability that IC power inputs can be tested;
Effect five, can in real time show whether the current operating voltages of IC and test result pass through.
Brief description of the drawings
The present invention is further described with reference to the accompanying drawings and examples.
Fig. 1 is structured flowchart of the present invention.
Fig. 2 is power supply module schematic diagram of the present invention.
Fig. 3 power supply disturbance circuit figures.
Fig. 4 input protection circuit figures.
The circuit diagram of Fig. 5 over-current protection circuit modules.
The circuit diagram of Fig. 6 power supply gear circuit modules.
Specific embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, with reference to embodiments, to the present invention
It is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not used to
Limit the present invention.
Fig. 1 is the total system block diagram of the present invention, and Fig. 2~Fig. 6 describes power supply flow chart, power supply disturbance circuit module in detail
Circuit diagram, input protection circuit figure, excessively stream monitoring module circuit diagram, power supply gear circuit module map.
Embodiment 1
The present embodiment provide it is a kind of with can test and Real-time Feedback IC electrical characteristic test devices, as described in Figure 1,
Including MCU controllers, the first low pressure difference linear voltage regulator module LDO1, the second low pressure difference linear voltage regulator module LDO2, input
Protection circuit, LCD display module, key-press module, power supply gear circuit module, power supply disturbance circuit module, current foldback circuit
Module, IC modules to be measured.
Input protection circuit, 2 low pressure difference linear voltage regulators of the input protection circuit connection, respectively the first low pressure
Difference linear constant voltage regulator LDO1 and the second low pressure difference linear voltage regulator LDO2, the MCU being connected with 2 low pressure difference linear voltage regulators
Controller, the first low pressure difference linear voltage regulator LDO1 provides the operating voltage of stabilization for MCU controllers, is connected with MCU controllers
Key-press module, LCD display module, over-current protection circuit module, power supply gear circuit module and power supply disturbance circuit module, institute
State the second low pressure difference linear voltage regulator LDO2 and be also connected with power supply gear circuit module.
The power supply gear circuit has 8 different gears.The current foldback circuit is supplied more than 300mA failures of current
Electricity.The power supply disturbance circuit includes the switch chip K1 being connected with MCU controllers, the adjustable resistance being connected with switch new product K1
R1, resistance R2 and the electric capacity C1 in parallel with resistance R2.
Input protection circuit, 2 low pressure difference linear voltage regulator input voltages are+5V.Second low pressure difference linearity
Voltage-stablizer LDO2 be export band can reconcile control enable low pressure difference linear voltage regulator, from low pressure difference linear voltage regulator
SGM2028.Whether setting voltage is exceeded by hardware circuit automatic decision present input voltage, if it exceeds being switched off power supply.
As shown in figure 4, the input circuit includes a dc source PWER_DC9V, a maximum current limliting of switch switch mono- is
The fuse of 3A, in parallel 3 resistance R1, R2, R3, R15,2 voltage-regulator diode D1, D2,2 triodes Q1, Q2 and one
Individual electric capacity C1.Operation principle:As input voltage 9V or 12V, D2 is breakdown, and voltage stabilizing, in 5.6V, Q2 transmitting junction voltages are in
Forward bias, and more than cut-in voltage, Q2 conductings, because of Q2 conductings, make the voltage between the grid of Q1 and source electrode electric less than opening
Pressure, causes Q2 to end, so that step voltage after cutting off, protection system.
Over-current protection circuit module:When because misoperation or IC it is anti-inserted, cause short circuit, system power is very big, so have must
Over-current protection circuit module is taken, can be set be switched off more than 300mA electric currents and be powered to IC.Operation principle:Such as Fig. 5 institutes
Show, first passing through MCU controllers and enabling the second low pressure difference linear voltage regulator module LDO2, an electric current of being connected and IC power supplys between is adopted
Sample resistance, is amplified by precise amplifying circuit to sampling resistor both end voltage difference, recycles comparator to be compared, and is exceeded
Threshold voltage, exports high level signal and gives MCU controllers, and the second low pressure difference linear voltage regulator module is turned off by MCU controllers
LDO2 is enabled, and cut-out IC powers.
Power supply gear circuit module, as shown in fig. 6, using three GPIO mouthfuls of MCU controllers and CD74HC4051 encoders
8 voltages of different gears (S1~S8) are configured to IC, the scope of automatic test IC normal working voltages is realized, this mode is utilized
Encoder CD74HC4051 can save GPIO mouthfuls of MCU controllers.
Power supply disturbance circuit module, as described in Figure 3, due to being difficult superposition on linear low voltage difference linear constant voltage regulator modular power source
Some regular signals such as triangular wave, sine wave, therefore the simple lower-cost circuit of circuit can be taken, use switch chip
With adjustable resistance, operation principle:PWM waveform is exported by MCU controllers, switch ceaselessly opened, broken, it is special using switch
Property, a triangular pulse or irregular impulse waveform can be produced on linear low pressure difference linear voltage regulator modular power source, waveform
Amplitude can be adjusted by adjustable resistance, key switch S1, S2, S3 regulation PWM frequency and dutycycle, facilitate tester
Flexibly tested.PWM frequency refer to each second signal the number of times of high level is returned from high level to low level, dutycycle is
Ratio between high level lasting time and low duration.Carrying out over-current detection, the operating voltage characteristic of IC respectively,
During noiseproof feature, test feedback information feeds back to MCU controller plcs, and judges whether current results pass through and export
LCD display module is shown.For example when voltage characteristic is operated, the ADC carried by MCU controllers implements prison
Control IC current voltages, and show, can in real time show whether the current operating voltages of IC and test result pass through.
A kind of method of testing based on the test device, comprises the following steps:
(1) IC to be measured is connected to test device, to electricity in test device;
(2) by button set current threshold, start overcurrent protection test, set more than 300mA electric currents be switched off to
IC powers, and in whole test process, monitor in real time operating current cuts off more than setting electric current and powers, in monitor current process
In, the second linear low voltage difference linear constant voltage regulator module LDO2, the second linear low voltage difference linear constant voltage regulator are enabled by MCU controllers
One current sampling resistor of series connection, poor to sampling resistor both end voltage by precise amplifying circuit between module LDO2 and IC power supply
It is amplified, recycles comparator to be compared, more than threshold voltage, exports high level signal and give MCU controllers, by MCU
Controller turns off the second linear low voltage difference linear constant voltage regulator module LDO2 enables, and cut-out IC powers;
(3) power supply gear is set by button, voltage range test is operated, using three GPIO mouthfuls of MCU controllers
8 voltages of different gears (S1~S8) are configured to IC with CD74HC4051 encoders, by MCU controls, according to from small to large
Gear order gradually export to the operating voltage of IC, surveyed automatically by monitoring running parameters of the IC in the case of each input voltage
Try the scope of IC normal working voltages;
(4) power supply disturbance circuit module is controlled, anti-interference test is carried out, using switch chip and adjustable resistance, by MCU
Controller exports PWM waveform, switch ceaselessly opened, broken, and using switching characteristic, an irregular waveform is produced on power supply,
Wave-shape amplitude can be adjusted by adjustable resistance, key switch regulation PWM frequency and dutycycle, then monitor IC again herein
Parameters in the case of power supply disturbance;
(5) output test result, test feedback information is anti-by monitoring the working condition of IC to be measured in whole testing engineering
Feed MCU controllers, MCU controllers judge whether current results pass through and shown, and carried by MCU controllers
ADC implementing monitoring IC current voltages, and it is displayed in LCD display module.
Embodiment 2:
The present embodiment further illustrates the numbers of gear steps and MCU controllers of power supply gear circuit on the basis of embodiment 1
The GPIO mouthfuls of relation of quantity, configure 16 different shelves to IC using 4 GPIO mouthfuls of MCU controllers and CD74HC4051 encoders
The voltage of position (S1~S16), realizes the scope of automatic test IC normal working voltages.Test feedback information can feed back to MCU controls
Device processed, MCU controllers judge whether current results pass through and shown.The ADC that can also be carried by MCU controllers
Implementing monitoring IC current voltages, and show.More gear voltages can be extended by 4 PGIO mouthfuls, test result is more defined
Really.
Although being described to illustrative specific embodiment of the invention above, in order to the technology of the art
Personnel are it will be appreciated that the present invention, but the present invention is not limited only to the scope of specific embodiment, to the common skill of the art
For art personnel, as long as long as various change is in appended claim restriction and the spirit and scope of the invention for determining, one
The innovation and creation using present inventive concept are cut in the row of protection.
Claims (7)
1. a kind of with the IC electrical characteristic test devices that can simultaneously test Real-time Feedback, it is characterised in that:Including MCU controls
Device, the first low pressure difference linear voltage regulator module (LDO1), the second low pressure difference linear voltage regulator module (LDO2), input protection electricity
Road, LCD display module, key-press module, power supply gear circuit module, power supply disturbance circuit module, over-current protection circuit module, treat
Survey IC modules.
2. according to claim 1 a kind of with the IC electrical characteristic test devices that can simultaneously test Real-time Feedback, it is special
Levy and be:The input protection circuit connects the first low pressure difference linear voltage regulator (LDO1) and the second low pressure difference linearity voltage stabilizing respectively
Device (LDO2), the MCU controllers being connected with 2 low pressure difference linear voltage regulators, the first low pressure difference linear voltage regulator (LDO1)
The operating voltage of stabilization, the key-press module being connected with MCU controllers, LCD display module, overcurrent protection are provided for MCU controllers
Circuit module, power supply gear circuit module and power supply disturbance circuit module, second low pressure difference linear voltage regulator (LDO2) is also
Connection power supply gear circuit.
3. according to claim 1 a kind of with the IC electrical characteristic test devices that can simultaneously test Real-time Feedback, it is special
Levy and be:2 low pressure difference linear voltage regulator input voltages are+5V.
4. according to claim 1 a kind of with the IC electrical characteristic test devices that can simultaneously test Real-time Feedback, it is special
Levy and be:Second low pressure difference linear voltage regulator (LDO2) be export band can reconcile control enable low pressure difference linearity voltage stabilizing
Device.
5. according to claim 1 a kind of with the IC electrical characteristic test devices that can simultaneously test Real-time Feedback, it is special
Levy and be:Power supply gear circuit module gear number >=8.
6. according to claim 1 a kind of with the IC electrical characteristic test devices that can simultaneously test Real-time Feedback, it is special
Levy and be:The over-current protection circuit module is powered more than 300mA failures of current.
7. according to claim 1 a kind of with the IC electrical characteristic test devices that can simultaneously test Real-time Feedback, it is special
Levy and be:The power supply disturbance circuit module includes the switch chip (K1) being connected with MCU controllers, with switch chip (K1) even
Adjustable resistance (R1), resistance (R2) and the electric capacity (C1) in parallel with resistance (R2) for connecing.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201611234013.0A CN106841979A (en) | 2016-12-28 | 2016-12-28 | It is a kind of with can test and Real-time Feedback IC electrical characteristic test devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201611234013.0A CN106841979A (en) | 2016-12-28 | 2016-12-28 | It is a kind of with can test and Real-time Feedback IC electrical characteristic test devices |
Publications (1)
Publication Number | Publication Date |
---|---|
CN106841979A true CN106841979A (en) | 2017-06-13 |
Family
ID=59114418
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201611234013.0A Pending CN106841979A (en) | 2016-12-28 | 2016-12-28 | It is a kind of with can test and Real-time Feedback IC electrical characteristic test devices |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN106841979A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109342931A (en) * | 2018-07-25 | 2019-02-15 | 北京航天三优科技有限公司 | A kind of the power interruptions test macro and its test method of precision voltage source |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101311739A (en) * | 2007-05-24 | 2008-11-26 | 上海摩波彼克半导体有限公司 | IC chip test platform energy supply structure |
CN102955083A (en) * | 2011-08-31 | 2013-03-06 | 北京中电华大电子设计有限责任公司 | Interference resistance test method and device for power-on resetting circuit of central processing unit (CPU) chip |
CN104050063A (en) * | 2013-03-12 | 2014-09-17 | 鸿富锦精密工业(深圳)有限公司 | CPU (central processing unit) voltage detection device and method |
CN104950240A (en) * | 2014-03-26 | 2015-09-30 | 北京同方微电子有限公司 | Working voltage segment testing system and testing method for smart card |
CN205720565U (en) * | 2016-06-29 | 2016-11-23 | 苏州纳芯微电子股份有限公司 | A kind of batch testing plate for testing signal condition chip |
CN205826731U (en) * | 2016-05-26 | 2016-12-21 | 广州安博检测有限公司 | Running voltage measuring box |
-
2016
- 2016-12-28 CN CN201611234013.0A patent/CN106841979A/en active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101311739A (en) * | 2007-05-24 | 2008-11-26 | 上海摩波彼克半导体有限公司 | IC chip test platform energy supply structure |
CN102955083A (en) * | 2011-08-31 | 2013-03-06 | 北京中电华大电子设计有限责任公司 | Interference resistance test method and device for power-on resetting circuit of central processing unit (CPU) chip |
CN104050063A (en) * | 2013-03-12 | 2014-09-17 | 鸿富锦精密工业(深圳)有限公司 | CPU (central processing unit) voltage detection device and method |
CN104950240A (en) * | 2014-03-26 | 2015-09-30 | 北京同方微电子有限公司 | Working voltage segment testing system and testing method for smart card |
CN205826731U (en) * | 2016-05-26 | 2016-12-21 | 广州安博检测有限公司 | Running voltage measuring box |
CN205720565U (en) * | 2016-06-29 | 2016-11-23 | 苏州纳芯微电子股份有限公司 | A kind of batch testing plate for testing signal condition chip |
Non-Patent Citations (2)
Title |
---|
何社成 等: "《快修国产新型彩色电视机》", 30 September 2001, 北京:人民邮电出版社 * |
沈建华: "《嵌入式系统教程 基于Tiva C系列ARM Cortex-M4微控制器》", 30 April 2015, 北京:北京航空航天大学出版社 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109342931A (en) * | 2018-07-25 | 2019-02-15 | 北京航天三优科技有限公司 | A kind of the power interruptions test macro and its test method of precision voltage source |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN104849579A (en) | System and method for testing sensitive elements of over-current protection and voltage monitoring device | |
CN203965489U (en) | A kind of shelf depreciation high voltage pulse generation device | |
CN217561646U (en) | SOA parameter test circuit | |
CN111579892B (en) | Test system and method for cascaded SVG power module | |
CN106646198B (en) | It is a kind of with can test and Real-time Feedback IC electrical characteristics test method | |
CN106841979A (en) | It is a kind of with can test and Real-time Feedback IC electrical characteristic test devices | |
CN113253079A (en) | Microcomputer type direct current system insulation monitoring test device and method | |
CN112363014A (en) | Distribution network ground short circuit fault distance detection system and detection method thereof | |
CN205427063U (en) | Device is judged in simulation of collector field failure | |
CN213633620U (en) | Loop resistance tester | |
CN203788304U (en) | Device for testing function of hardware interface | |
CN214751575U (en) | Voltage compensation circuit, voltage compensation device and voltage compensation automation equipment | |
CN208862750U (en) | A kind of frequency-conversion constant-current constant voltage source | |
CN113945857A (en) | Detection device and method for switching power supply | |
CN105680484A (en) | Method and device for realizing parallel operation of generators in power grid system | |
Cai et al. | Design of IGBT parameter automatic test system based on LabVIEW | |
CN111426926A (en) | Surge protector detector and detection method thereof | |
CN204649934U (en) | Motor and consumer electric test device | |
CN205038275U (en) | Brake unit testing device | |
CN211043591U (en) | Handheld tester of intelligent universal circuit breaker | |
CN216485436U (en) | Testing device and system | |
CN214375018U (en) | Line loss metering system with residual voltage detection function and suitable for feeder line terminal | |
CN113702747B (en) | Portable locomotive traction converter detection equipment | |
CN218122174U (en) | Pulse back bias test system | |
CN211785746U (en) | Accurate testing arrangement of transient voltage under pulse load |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
RJ01 | Rejection of invention patent application after publication | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170613 |