CN106840611A - It is simple to judge the good and bad method of optical system - Google Patents
It is simple to judge the good and bad method of optical system Download PDFInfo
- Publication number
- CN106840611A CN106840611A CN201710066508.5A CN201710066508A CN106840611A CN 106840611 A CN106840611 A CN 106840611A CN 201710066508 A CN201710066508 A CN 201710066508A CN 106840611 A CN106840611 A CN 106840611A
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- China
- Prior art keywords
- optical system
- aberration
- diaphragm
- optical
- size
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
Abstract
The invention discloses a kind of simple method for judging optical system quality, difference or aberration for measuring optical system are comprised the following steps：A spot light is placed in the left side of optical system；A diaphragm is placed in the left side of the optical system, it is 30-60mm that the diaphragm controls the scope of diaphragm size；A monochrome CCD is placed to gather the imaging of the optical system in the imaging point of the optical system, and then the picture in CCD calculates the size of aberration by aberration formula.Optical filter is had additional between the spot light and the diaphragm, the optical filter is single-point anti-reflection filter piece.It is an advantage of the invention that：It is easy to use, simple.
Description
Technical field
The present invention relates to measuring method technical field, more particularly, to a kind of simple method for judging optical system quality.
Background technology
Actual optical system is only only perfect when near axis area is imaged with the angular aperture of very little.If a light
The imaging of system is only limitted near axis area not what practical significance, because the light energy that can enter is very little, resolution ratio
It is very low.Therefore, any optical system all has certain aperture and visual field, and imaging beam is mostly polychromatic light.In these feelings
Optical system imaging is studied under condition with paraxial optics theory just less suitable, it is necessary to use accurate trigonometric ray tracing formula
Carry out light line computation.Carried out with paraxial rays ray tracing equations picture point (ideal image point) that light calculates with different pore size
Often and misaligned between carrying out the picture point that light is calculated with accurate triangle ray tracing equations, this difference is referred to as aberration.
Aberration is divided to monochromatic aberraation of light and the major class of secondary color aberraation of light two.Monochromatic aberraation of light have again put on axle aberration and off-axis point aberration minute.
Monochromatic aberration is put on axle only has spherical aberration a kind of, and off-axis point monochromatic aberration has spherical aberration, coma, astigmatism, curvature of the image, distortion.Secondary color
Aberraation of light has two kinds of axial chromatic aberration and chromatic longitudiinal aberration.The size of aberration reflects the quality of optical system quality, and optical system
The quality of image quality, is the main standard of finally evaluation optical system quality.Therefore, it is desirable to obtain superior in quality optical system
System, it is necessary first to carry out the measurement of aberration.
The content of the invention
It is an object of the invention to provide a kind of simple method for judging optical system quality, it has easy to use, simple
The characteristics of.
The technical solution adopted in the present invention is：It is simple to judge the good and bad method of optical system, for measuring optical system
Difference or aberration, comprise the following steps：
(1) spot light is placed in the left side of optical system；
(2) diaphragm is placed in the left side of the optical system, it is 30-60mm that the diaphragm controls the scope of diaphragm size；
(3) imaging point in the optical system places a monochrome CCD to gather the imaging of the optical system, then basis
Picture in CCD calculates the size of aberration by aberration formula.
Optical filter is had additional between the spot light and the diaphragm, the optical filter is single-point anti-reflection filter piece.
The invention has the advantages that compared with the prior art,：It is easy to use, simple.Simple judge optics of the invention
The good and bad method measuring principle of system is simple, can survey various aberrations and aberration.Meanwhile, the test equipment for being used is simple, general
Property is good, cost-saved.In this way, measurement workload is small, efficiency can be greatly improved.
Brief description of the drawings
The present invention is further described with reference to the accompanying drawings and examples：
Fig. 1 is the position view of used unit in embodiments of the invention.
In figure：
10th, spot light；
20th, optical filter；
30th, diaphragm；
40th, monochrome CCD；
100th, optical system.
Specific embodiment
Embodiment, as shown in Figure 1：It is simple to judge the good and bad method of optical system, the difference for measuring optical system 100
Or aberration, comprise the following steps：
(1) spot light 10 is placed in the left side of optical system 100.The spot light 10 can send the light of suitable wave band
Line.Such as, the light frequency for being sent is 550nm.
(2) the optical system 100 left side place a diaphragm 30, the diaphragm 30 control diaphragm size scope be 30-
60mm.Such as, it is 30,40 or 60mm that the diaphragm 30 controls the scope of diaphragm size.
(3) imaging point in the optical system 100 places a monochrome CCD40 to gather the imaging of the optical system 100, so
The picture in monochromatic CCD40 calculates the size of aberration by aberration formula afterwards.In this case, what is obtained is the optics
The aberration of system 100.
Operation principle of the invention is：It is different size of to obtain by the size for adjusting the horizontal direction of the diaphragm 30
Picture, so as to draw the aberration size under different diaphragms, measures the aberration in the horizontal direction of optical system 100, and then judging should
The quality of optical system 100.Then, the diaphragm 30 is rotated by 90 ° the diaphragm that can just change vertical direction, so as to measure vertical side
To aberration.
Another way is：Optical filter 20 is had additional between the spot light 10 and the diaphragm 30, the optical filter 20 is single
Point anti-reflection filter piece.Such as, the light of the spot light outgoing 550nm wave bands, the optical filter 20 is that 550nm single-points are anti-reflection, by this
It is changed into the monochromatic light of 550nm after optical filter 20, what is now measured is monochromatic aberration of the optical system 100 in 550nm wave bands.Such as
Fruit will measure the aberration of different-waveband, and different optical filters can be added to be tested.
In above example, the optical system 100 can be optical lens.
The preferred embodiments of the present invention are the foregoing is only, the scope of the claims of the invention, every utilization is not thereby limited
Equivalent structure or equivalent flow conversion that description of the invention and accompanying drawing content are made, or directly or indirectly it is used in other correlations
Technical field, be included within the scope of the present invention.
Claims (2)
1. it is simple to judge the good and bad method of optical system, difference or aberration for measuring optical system (100), including following step
Suddenly：
(1) spot light (10) is placed in the left side of optical system (100)；
(2) diaphragm (30) is placed in the left side of the optical system (100), the diaphragm (30) controls the scope of diaphragm size to be
30—60mm；
(3) imaging point in the optical system (100) places monochrome CCD (40) to gather the imaging of the optical system (100),
Then the picture in monochromatic CCD (40) calculates the size of aberration by aberration formula.
It is 2. according to claim 1 simple to judge the good and bad method of optical system, it is characterised in that：The spot light (10)
Optical filter (20) is had additional and the diaphragm (30) between, the optical filter (20) is single-point anti-reflection filter piece.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710066508.5A CN106840611A (en) | 2017-02-07 | 2017-02-07 | It is simple to judge the good and bad method of optical system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710066508.5A CN106840611A (en) | 2017-02-07 | 2017-02-07 | It is simple to judge the good and bad method of optical system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106840611A true CN106840611A (en) | 2017-06-13 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201710066508.5A Pending CN106840611A (en) | 2017-02-07 | 2017-02-07 | It is simple to judge the good and bad method of optical system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107966274A (en) * | 2017-10-31 | 2018-04-27 | 宁波永新光学股份有限公司 | A kind of quantitative testing device and detection method of high power objective aberration |
Citations (5)
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|---|---|---|---|---|
| US20040061847A1 (en) * | 2002-07-11 | 2004-04-01 | Shinichi Nakamura | Method of measuring optical characteristics of spectacle lenses and lens meter |
| CN1900673A (en) * | 2006-07-25 | 2007-01-24 | 温州医学院眼视光研究院 | Detector for glasses lens optic quality |
| CN101027721A (en) * | 2004-09-27 | 2007-08-29 | 皇家飞利浦电子股份有限公司 | Servo branch of optical disc drive comprising a switchable diaphragm and a device for beam deflection, and methods for measuring beam landing and spherical aberration |
| CN101055222A (en) * | 2007-05-24 | 2007-10-17 | 上海交通大学 | Optical quality measuring device for glasses |
| CN103471816A (en) * | 2013-09-24 | 2013-12-25 | 上海理工大学 | Multi-optical-axis progressive spectacle lens measurement method |
-
2017
- 2017-02-07 CN CN201710066508.5A patent/CN106840611A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040061847A1 (en) * | 2002-07-11 | 2004-04-01 | Shinichi Nakamura | Method of measuring optical characteristics of spectacle lenses and lens meter |
| CN101027721A (en) * | 2004-09-27 | 2007-08-29 | 皇家飞利浦电子股份有限公司 | Servo branch of optical disc drive comprising a switchable diaphragm and a device for beam deflection, and methods for measuring beam landing and spherical aberration |
| CN1900673A (en) * | 2006-07-25 | 2007-01-24 | 温州医学院眼视光研究院 | Detector for glasses lens optic quality |
| CN101055222A (en) * | 2007-05-24 | 2007-10-17 | 上海交通大学 | Optical quality measuring device for glasses |
| CN103471816A (en) * | 2013-09-24 | 2013-12-25 | 上海理工大学 | Multi-optical-axis progressive spectacle lens measurement method |
Non-Patent Citations (1)
| Title |
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| 吴平: "《应用物理实验》", 31 January 2013 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107966274A (en) * | 2017-10-31 | 2018-04-27 | 宁波永新光学股份有限公司 | A kind of quantitative testing device and detection method of high power objective aberration |
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| RJ01 | Rejection of invention patent application after publication | ||
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Application publication date: 20170613 |