CN106706650A - Chip resistor detection process device - Google Patents
Chip resistor detection process device Download PDFInfo
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- CN106706650A CN106706650A CN201510513161.5A CN201510513161A CN106706650A CN 106706650 A CN106706650 A CN 106706650A CN 201510513161 A CN201510513161 A CN 201510513161A CN 106706650 A CN106706650 A CN 106706650A
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- process device
- detection process
- chip resistor
- chip
- resistor detection
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Abstract
The invention discloses a chip resistor detection process device. The chip resistor detection process device comprises an automatic control device and an equipment platform; a feeding device, a detecting device, and a receiving device are arranged on the equipment platform; the detecting device comprises an industrial camera and a light source; a feeding driving wheel is connected with a power device; the receiving device comprises a receiving guide wheel and a receiving cabin. The chip resistor detection process device is capable of avoiding defects of manual detection, is high in efficiency, accuracy, stability, and universality; each chip resistor detection process device can be used for detecting products of more than 20 different types; the chip resistor detection process device can be used for detecting defects caused by packaging such as crushed material, mixed material, vertical material, reverse material, folding material, empty material, jumping material, material angle missing, carrier band contamination, and carrier band damaging. Standards are maintained for the last time for product output, output of bad products is avoided effectively, product quality report is generated automatically, data statistics and history image recording functions are provided, operation is convenient and rapid, and cost is reduced.
Description
Technical field
The invention belongs to automatic detection device, more particularly to Chip-R detection means.
Background technology
Packaging can be carried out after the completion of all processing procedures of Chip-R to be placed in forming ribbon on carrier band, particle, batch mixing can be brought in packaging, vertical material, anti-material, stack, empty material, the phenomenons such as material, material unfilled corner, carrier band stain, carrier band is damaged is jumped, because resistance is bad, it flow to client terminal laminating on circuit boards, the bad of a final product, or even the possibility for having potential safety hazard can be caused;In the outward appearance detection packed after the completion of Chip-R processing procedure, traditional approach is the outward appearance and defect by manually detecting product by naked eyes with microscope, and manual detection has the shortcomings that many:As human eye can fatigue cause that quality is unstable, production efficiency low, tested outward appearance precision not enough, product appearance and the defects detection unusual crux in whole processing procedure, open defect detection cannot be ensured, can directly affect the quality and function of finished product product.
The content of the invention
In order to solve the above problems, the invention provides a kind of Chip-R testing process device of automation.
According to an aspect of the present invention, a kind of Chip-R testing process device is provided, including automaton and equipment platform, the equipment platform is provided with feed device, detection means and material collecting device, the detection means includes industrial camera and light source, the feeding driving wheel is connected with power set, and the material collecting device includes rewinding directive wheel and receiving warehouse.
In some embodiments, the industrial camera and light source lower section are provided with support block, and the support block is provided with induction installation.
In some embodiments, the Chip-R testing process device is additionally provided with protection shell, and the protection shell is provided with retractable door.
In some embodiments, the automaton is connected with warning device, and the warning device connects master switch.
The all of shortcoming of the manual detection that present device is fully solved, efficiency high can realize the detection speed of 3000/second;High precision, stability is high, highly versatile, one machine can detect more than the 20 kinds products of different model, can effective detection go out the brought particle of packaging, batch mixing, vertical material, anti-material, stack, empty material, jump the problems such as material, material unfilled corner, carrier band stain, carrier band is damaged, it is product turnout last one pass, is prevented effectively from bad products shipment;Product quality report can be automatically generated, there is data statistics and history picture record function;It is simple and quick, it is cost-effective.
Brief description of the drawings
Fig. 1 is flowage structure schematic diagram of the invention.
Fig. 2 is Chip-R and carrying structure schematic diagram.
In figure:1- equipment platforms, 2- industrial cameras, 3- light sources, 4- feeding storehouses, 5- feeding driving wheels, 6- rewinding directive wheels, 7- receiving warehouses, 8- carrier bands, 9- Chip-Rs, 10- support blocks.
Specific embodiment
1 and 2 the present invention is further illustrated below in conjunction with the accompanying drawings.Attached Fig. 1 and 2 schematically shows Chip-R testing process device of the present invention and puts, including automaton and equipment platform 1, the equipment platform 1 is provided with feed device, detection means and material collecting device, the detection means includes industrial camera 2 and light source 3, the feed device includes feeding storehouse 4 and feeding driving wheel 5, the feeding driving wheel 5 is connected with power set, and the material collecting device includes rewinding directive wheel 6 and receiving warehouse 7.
Preferably, the industrial camera 2 and the lower section of light source 3 are provided with support block 10, and the support block 10 is provided with induction installation.
Preferably, the Chip-R testing process device is additionally provided with protection shell, and the protection shell is provided with retractable door.
Preferably, the automaton is connected with warning device, and the warning device connects master switch.
On equipment platform 1, tested Chip-R 9 and carrier band 8 are sent out from feeding storehouse 4, by the pulling of the feeding driving wheel 5 of operation clockwise, tested Chip-R 9 and carrier band 8 are delivered in the support block 10 under detection means, induction installation senses Chip-R 9 in support block 10, then the industrial camera 2 and light source 3 in detection means are actuated for detection, its detection data is input into automaton, if product is normal in detection, tested Chip-R 9 and carrier band 8 deliver to receiving warehouse peace 7 by rewinding directive wheel 6;When an abnormality is discovered, warning device is alarmed and is shut down, and treats manual confirmation;Installing for protection shell can be with the clean and tidy of protection equipment inside and examined product, and door to be opened/closed is easy to maintenance of equipment.
Above-described is only some embodiments of the present invention, it is noted that for the person of ordinary skill of the art, on the premise of creation design of the invention is not departed from, can also make other deformations and improve, and these belong to protection scope of the present invention.
Claims (4)
1. Chip-R testing process device, including automaton and equipment platform(1), the equipment platform(1)Feed device, detection means and material collecting device are provided with, the detection means includes industrial camera(2)And light source(3), it is characterised in that
The feed device includes feeding storehouse(4)With feeding driving wheel(5), the feeding driving wheel(5)It is connected with power set,
The material collecting device includes rewinding directive wheel(6)And receiving warehouse(7).
2. Chip-R testing process device as claimed in claim 1, it is characterised in that the industrial camera(2)And light source(3)Lower section is provided with support block(10), the support block(10)It is provided with induction installation.
3. Chip-R testing process device as claimed in claim 1, it is characterised in that the testing process device of the Chip-R packaging and carrier band is additionally provided with protection shell, and the protection shell is provided with retractable door.
4. Chip-R testing process device as claimed in claim 1, it is characterised in that the automaton is connected with warning device, the warning device connects master switch.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201510513161.5A CN106706650A (en) | 2015-08-20 | 2015-08-20 | Chip resistor detection process device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510513161.5A CN106706650A (en) | 2015-08-20 | 2015-08-20 | Chip resistor detection process device |
Publications (1)
Publication Number | Publication Date |
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CN106706650A true CN106706650A (en) | 2017-05-24 |
Family
ID=58918573
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN201510513161.5A Pending CN106706650A (en) | 2015-08-20 | 2015-08-20 | Chip resistor detection process device |
Country Status (1)
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CN (1) | CN106706650A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112698098A (en) * | 2019-10-23 | 2021-04-23 | 神讯电脑(昆山)有限公司 | Device for measuring winding wrapping type resistance |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0431974A (en) * | 1990-05-29 | 1992-02-04 | Omron Corp | Defect inspecting device for rectangular member |
CN201277953Y (en) * | 2008-10-30 | 2009-07-22 | 天津伍嘉联创科技发展有限公司 | Machine for automatic external view inspection after electronic component breding |
CN202119399U (en) * | 2011-06-23 | 2012-01-18 | 杭州古思科技有限公司 | Device for detecting position of SMD resistor on substrate |
CN204291620U (en) * | 2014-09-28 | 2015-04-22 | 石龙娇 | A kind of SMD paster automatic thresher being convenient to sub-material |
CN204903419U (en) * | 2015-08-20 | 2015-12-23 | 昆山市和博电子科技有限公司 | Chip resistor detects flow device |
-
2015
- 2015-08-20 CN CN201510513161.5A patent/CN106706650A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0431974A (en) * | 1990-05-29 | 1992-02-04 | Omron Corp | Defect inspecting device for rectangular member |
CN201277953Y (en) * | 2008-10-30 | 2009-07-22 | 天津伍嘉联创科技发展有限公司 | Machine for automatic external view inspection after electronic component breding |
CN202119399U (en) * | 2011-06-23 | 2012-01-18 | 杭州古思科技有限公司 | Device for detecting position of SMD resistor on substrate |
CN204291620U (en) * | 2014-09-28 | 2015-04-22 | 石龙娇 | A kind of SMD paster automatic thresher being convenient to sub-material |
CN204903419U (en) * | 2015-08-20 | 2015-12-23 | 昆山市和博电子科技有限公司 | Chip resistor detects flow device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112698098A (en) * | 2019-10-23 | 2021-04-23 | 神讯电脑(昆山)有限公司 | Device for measuring winding wrapping type resistance |
CN112698098B (en) * | 2019-10-23 | 2023-10-13 | 神讯电脑(昆山)有限公司 | Device for measuring coiled tape wrapped resistor |
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Application publication date: 20170524 |
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