CN106687794B - 供电装置和供电方法 - Google Patents

供电装置和供电方法 Download PDF

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Publication number
CN106687794B
CN106687794B CN201580052659.4A CN201580052659A CN106687794B CN 106687794 B CN106687794 B CN 106687794B CN 201580052659 A CN201580052659 A CN 201580052659A CN 106687794 B CN106687794 B CN 106687794B
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workpiece
abutment
switch
switching
power supply
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Chinese (zh)
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CN106687794A (zh
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近藤正敬
北岛功朗
菊地荣治
田中利典
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Europa Corp
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Europa Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
CN201580052659.4A 2014-11-06 2015-10-21 供电装置和供电方法 Active CN106687794B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2014225859A JP6390355B2 (ja) 2014-11-06 2014-11-06 給電装置および給電方法
JP2014-225859 2014-11-06
PCT/JP2015/079720 WO2016072265A1 (ja) 2014-11-06 2015-10-21 給電装置および給電方法

Publications (2)

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CN106687794A CN106687794A (zh) 2017-05-17
CN106687794B true CN106687794B (zh) 2019-11-26

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CN201580052659.4A Active CN106687794B (zh) 2014-11-06 2015-10-21 供电装置和供电方法

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JP (1) JP6390355B2 (ja)
CN (1) CN106687794B (ja)
WO (1) WO2016072265A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110987172B (zh) * 2019-12-18 2020-10-30 扬州天润传感技术有限公司 一种光敏传感器性能测试仪器

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1220905C (zh) * 2001-09-19 2005-09-28 精工爱普生株式会社 光学元件的检查装置和光学元件的检查方法
CN201197025Y (zh) * 2008-04-09 2009-02-18 富士康(昆山)电脑接插件有限公司 电子卡连接器
CN101551430A (zh) * 2008-03-31 2009-10-07 东京威尔斯股份有限公司 电容器漏电流测定方法和电容器漏电流测定装置
CN101740260A (zh) * 2008-11-14 2010-06-16 株式会社日立制作所 真空开关设备
CN101894698A (zh) * 2009-04-21 2010-11-24 阿尔卑斯电气株式会社 带开关的旋转型电部件
WO2011016441A1 (ja) * 2009-08-04 2011-02-10 国立大学法人奈良先端科学技術大学院大学 太陽電池の評価方法、評価装置、メンテナンス方法、メンテナンスシステム、および太陽電池モジュールの製造方法
KR20130042226A (ko) * 2011-10-18 2013-04-26 가부시키가이샤 어드밴티스트 시험 장치, 시험 방법, 및 디바이스 인터페이스

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0599788A (ja) * 1991-10-09 1993-04-23 Tokyo Electron Yamanashi Kk 液晶デイスプレイ基板の検査装置
JP4196065B2 (ja) * 2002-11-20 2008-12-17 パナソニック株式会社 ディスプレイパネルの点灯検査装置
US8502967B2 (en) * 2011-02-01 2013-08-06 Cooper S. K. Kuo Apparatus for optical inspection

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1220905C (zh) * 2001-09-19 2005-09-28 精工爱普生株式会社 光学元件的检查装置和光学元件的检查方法
CN101551430A (zh) * 2008-03-31 2009-10-07 东京威尔斯股份有限公司 电容器漏电流测定方法和电容器漏电流测定装置
CN201197025Y (zh) * 2008-04-09 2009-02-18 富士康(昆山)电脑接插件有限公司 电子卡连接器
CN101740260A (zh) * 2008-11-14 2010-06-16 株式会社日立制作所 真空开关设备
CN101894698A (zh) * 2009-04-21 2010-11-24 阿尔卑斯电气株式会社 带开关的旋转型电部件
WO2011016441A1 (ja) * 2009-08-04 2011-02-10 国立大学法人奈良先端科学技術大学院大学 太陽電池の評価方法、評価装置、メンテナンス方法、メンテナンスシステム、および太陽電池モジュールの製造方法
KR20130042226A (ko) * 2011-10-18 2013-04-26 가부시키가이샤 어드밴티스트 시험 장치, 시험 방법, 및 디바이스 인터페이스

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Publication number Publication date
JP2016090424A (ja) 2016-05-23
WO2016072265A1 (ja) 2016-05-12
CN106687794A (zh) 2017-05-17
JP6390355B2 (ja) 2018-09-19

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