CN106679629B - Ruler type level meter based on grating diffraction and method for measuring inclined plane inclination angle - Google Patents
Ruler type level meter based on grating diffraction and method for measuring inclined plane inclination angle Download PDFInfo
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- CN106679629B CN106679629B CN201710024164.1A CN201710024164A CN106679629B CN 106679629 B CN106679629 B CN 106679629B CN 201710024164 A CN201710024164 A CN 201710024164A CN 106679629 B CN106679629 B CN 106679629B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
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Abstract
The invention discloses a ruler type level gauge based on grating diffraction and a method for measuring an inclined plane inclination angle. The ruler-type level comprises a box body, a grating rotating shaft is arranged in the box body, a grating is fixed on the grating rotating shaft, one end of the grating rotating shaft penetrates through the box body to be connected with a vernier turntable, a soft thin wire is fixed on the grating, the lower end of the soft thin wire is connected with a pendant body, a parallel light source is arranged on the soft thin wire, light rays emitted by the parallel light source point to the grating, a telescope extending into the box body is arranged on the box body, and the telescope is used for observing diffracted light of the. The ruler-type level meter based on grating diffraction provided by the invention uses the method of controlling the grating diffraction direction by the grating deflection to convert the tiny inclination angle into the deflection angle of incident light, thereby realizing the amplification measurement of the tiny inclination angle. Compared with the prior bubble level meter and the electronic level meter, the device has the advantages of better stability, higher accuracy and stronger practicability.
Description
Technical Field
The invention belongs to the technical field of gradienters, and particularly relates to a ruler type gradienter based on grating diffraction and a method for measuring an inclined plane inclination angle.
Background
The level gauge is a micro-angle measuring tool widely applied to the building, machinery and instrument manufacturing industries, and can be used for measuring the straightness of a machine tool equipment guide rail, the horizontal position of equipment installation, whether uneven settlement occurs in a house or not and the like. At present, the commonly used gradienters mainly comprise a bubble gradienter and an electronic gradienter. The bubble level meter has low precision and poor stability. The precision of the electronic level meter is improved, but the requirement on the working environment is high, and the precision can be greatly reduced and even fails under extreme temperature and severe environment. The one-dimensional grating is widely applied to the field of micro-measurement, and can amplify a micro angle which is difficult to measure according to the angle change relation of incident light and diffracted light, so that the measurement precision is greatly improved.
Disclosure of Invention
The invention aims to solve the problems and provides a ruler type level gauge based on grating diffraction and a method for measuring the inclination angle of an inclined plane.
In order to solve the technical problems, the technical scheme of the invention is as follows: the utility model provides a chi formula spirit level based on grating diffraction, includes the box body, is equipped with the grating pivot in the box body, is fixed with the grating in the grating pivot, and the box body is passed to the one end of grating pivot and links to each other with the vernier carousel, is fixed with soft fine rule on the grating, and the lower extreme and the weight body of soft fine rule link to each other, are equipped with parallel light source on the soft fine rule, and the directional grating of light that parallel light source sent is equipped with the telescope that stretches into in the box body on the box body, and the telescope.
Preferably, the side wall of the box body is provided with a dial, and the vernier dial can be matched with the dial for reading.
Preferably, two cursors are arranged on the cursor turntable, and the two cursors are arranged at symmetrical positions on the cursor turntable at an interval of 180 degrees.
Preferably, the box body is provided with a transverse leveling tube.
A method of measuring the inclination of a bevel comprising the steps of:
s1, placing the ruler-type level on a horizontal plane, turning on a parallel light source, rotating a vernier turntable, observing from the telescope, stopping rotating when the kth-order diffracted light energy horizontally emits to the center in the field of view of the telescope, and reading the initial reading alpha of the vernier turntable1；
S2, placing the ruler type level meter at the inclination angle theta2On the plane to be measured, the falling body, the soft thin wire and the incident light generate theta under the action of gravity1And theta1＝θ2；
S3, rotating the cursor turntable, observing the telescope at the same time, returning the k-th order diffracted light to the center of the field of view of the telescope again, and reading the reading alpha of the cursor turntable2Then the grating is rotated by an angle α:
α＝α2-α1，
angle theta of incident light rotation1Comprises the following steps:
wherein d is a grating constant, and λ is the wavelength of incident light emitted by the parallel light source;
the inclination angle theta of the plane to be measured2Comprises the following steps:
the invention has the beneficial effects that: the ruler-type level meter based on grating diffraction provided by the invention uses the method of controlling the grating diffraction direction by grating deflection to convert a tiny inclination angle into the deflection angle of incident light, thereby realizing the amplification measurement of the tiny inclination angle; compared with the prior bubble level meter and the electronic level meter, the device has the advantages of better stability, higher accuracy and stronger practicability.
Drawings
FIG. 1 is a schematic view of a grating diffraction based scale level according to the present invention.
FIG. 2 is a schematic diagram of the internal structure of a grating diffraction based scale level according to the present invention.
Fig. 3 is a schematic view showing a state of a thin soft wire in a horizontal plane state.
Fig. 4 is a schematic view showing a state of the soft thin line in the inclined plane state.
FIG. 5 shows the angle θ of the incident light obtained by selecting the incident light with a wavelength of 546.1nm, the grating of 100 lines, and the 1 st order diffraction light according to the present invention1Theoretical plot of the angle alpha of rotation of the grating.
Description of reference numerals: 1. a box body; 2. a grating rotating shaft; 3. a grating; 4. a vernier dial; 5. a soft thin wire; 6. a pendant body; 7. a collimated light source; 8. a telescope; 9. a dial scale; 10. a leveling tube; 11. the level plane.
Detailed Description
The invention is further described with reference to the following figures and specific embodiments:
as shown in fig. 1 and 2, the ruler-type level based on grating diffraction provided by the invention comprises a rectangular box body 1, wherein a transverse leveling pipe 10 is arranged on the box body 1, and a transverse grating rotating shaft 2 is arranged in the box body 1. The grating rotating shaft 2 is fixed with a grating 3, one end of the grating rotating shaft 2 penetrates through the box body 1 to be connected with the vernier dial 4, the side wall of the box body 1 is provided with a dial 9, and the vernier dial 4 can be matched with the dial 9 for reading. The vernier turntable 4 is provided with two cursors which are arranged at symmetrical positions on the vernier turntable 4 at intervals of 180 degrees, and the cursors are arranged at symmetrical positions at intervals of 180 degrees, so that the eccentricity difference can be effectively eliminated.
The soft thin wire 5 is fixed on the grating 3, the lower end of the soft thin wire 5 is connected with the pendant body 6, the parallel light source 7 with a slit is arranged on the soft thin wire 5, light rays emitted by the parallel light source 7 point to the grating 3, the telescope 8 extending into the box body 1 is arranged on the box body 1, and the telescope 8 is used for observing diffracted light of the grating 3. A reticle for scribing a horizontal line is provided in the field of view of the telescope 8.
If the ruler type level is placed on a flat ground without an inclination angle, after the level tube 10 indicates horizontal, the soft thin line 5 is perpendicular to the level plane 11, and the incident light emitted by the parallel light source 7 is vertical, as shown in fig. 3. Placing the ruler-type level meter at the inclination angle theta to be measured2On the inclined plane of (2), as shown in fig. 4, the weight body 6, together with the soft thin wire 5 and the incident light, generates θ due to the gravity1And theta1＝θ2。
Example one
A method for measuring the inclination angle of an inclined plane by using the ruler-type level gauge based on grating diffraction comprises the following steps:
s1, placing the ruler-type level on a horizontal plane, turning on a parallel light source, rotating a vernier turntable, observing from the telescope, stopping rotating when the kth-order diffracted light energy horizontally exits to a central reticle in the field of view of the telescope, and reading an initial reading alpha of the vernier turntable1；
S2, placing the ruler type level meter at the inclination angle theta2On the plane to be measured, the falling body, the soft thin wire and the incident light generate theta under the action of gravity1And theta1＝θ2；
S3, rotating the cursor turntable, observing the telescope at the same time, returning the k-th order diffracted light to the central line in the field of view of the telescope again, and reading the reading alpha of the cursor turntable2Then the grating is rotated by an angle α:
α＝α2-α1，
angle theta of incident light rotation1Comprises the following steps:
wherein d is a grating constant, λ is the wavelength of incident light emitted by the collimated light source, and k is 0, ± 1, ± 2.
The inclination angle theta of the plane to be measured2Comprises the following steps:
FIG. 5 shows the angle θ of the incident light obtained by selecting the incident light with a wavelength of 546.1nm, the grating of 100 lines, and the 1 st order diffraction light according to the present invention1Theoretical plot of the angle alpha of rotation of the grating. As can be seen from the figure, the inclination angle theta of the plane to be measured2Is 5', i.e. the angle theta through which the incident light turns1In the 5' case, the grating needs to be rotated by about 11 ° to ensure that the diffracted light is in place. The method for measuring the inclination angle of the inclined plane can convert a tiny inclination angle into a deflection angle of incident light, and realizes the amplification measurement of the tiny inclination angle.
Example two
A method for measuring the inclination angle of an inclined plane by using the ruler-type level gauge based on grating diffraction comprises the following steps:
s1, placing the ruler-type level on a horizontal plane, turning on a parallel light source, rotating a vernier turntable, observing from the telescope, stopping rotating when the k-th order diffracted light energy horizontally exits to a central reticle in the field of view of the telescope, and reading initial readings alpha of two cursors of the vernier turntable at 180-degree intervals1And alpha'1；
S2, placing the ruler type level meter at the inclination angle theta2On the plane to be measured, the falling body, the soft thin wire and the incident light generate theta under the action of gravity1And theta1＝θ2；
S3, rotating the cursor turntable, observing the telescope at the same time, returning the k-th order diffracted light to the central reticle in the field of view of the telescope again, and reading the readings alpha of two cursors 180 degrees apart from the cursor turntable at the moment2And alpha'2Then the grating is rotated by an angle α:
incident lightAngle of rotation theta1Comprises the following steps:
wherein d is a grating constant, λ is the wavelength of incident light emitted by the collimated light source, and k is 0, ± 1, ± 2.
The inclination angle theta of the plane to be measured2Comprises the following steps:
it will be appreciated by those of ordinary skill in the art that the embodiments described herein are intended to assist the reader in understanding the principles of the invention and are to be construed as being without limitation to such specifically recited embodiments and examples. Those skilled in the art can make various other specific changes and combinations based on the teachings of the present invention without departing from the spirit of the invention, and these changes and combinations are within the scope of the invention.
Claims (4)
1. The utility model provides a chi formula spirit level based on grating diffraction which characterized in that: the novel optical grating comprises a box body (1), wherein a grating rotating shaft (2) is arranged in the box body (1), a grating (3) is fixed on the grating rotating shaft (2), one end of the grating rotating shaft (2) penetrates through the box body (1) to be connected with a vernier turntable (4), a soft thin wire (5) is fixed on the grating (3), the lower end of the soft thin wire (5) is connected with a pendant body (6), a parallel light source (7) is arranged on the soft thin wire (5), light rays emitted by the parallel light source (7) point to the grating (3), a telescope (8) extending into the box body (1) is arranged on the box body (1), and the telescope (8) is used for observing diffracted light of the grating (; be equipped with calibrated scale (9) on the lateral wall of box body (1), vernier dial (4) can cooperate calibrated scale (9) reading.
2. A grating diffraction-based scale level according to claim 1 wherein: two cursors are arranged on the vernier turntable (4), and are arranged at symmetrical positions on the vernier turntable (4) which are separated by 180 degrees.
3. A grating diffraction-based scale level according to claim 1 wherein: the box body (1) is provided with a transverse leveling tube (10).
4. A method of measuring the inclination of a bevel, comprising the steps of:
s1, placing the ruler-type level on a horizontal plane, turning on a parallel light source, rotating a vernier turntable, observing from the telescope, stopping rotating when the kth-order diffracted light energy horizontally emits to the center in the field of view of the telescope, and reading the initial reading alpha of the vernier turntable1；
S2, placing the ruler type level meter at the inclination angle theta2On the plane to be measured, the falling body, the soft thin wire and the incident light generate theta under the action of gravity1And theta1＝θ2；
S3, rotating the cursor turntable, observing the telescope at the same time, returning the k-th order diffracted light to the center of the field of view of the telescope again, and reading the reading alpha of the cursor turntable2Then the grating is rotated by an angle α:
α＝α2-α1，
angle theta of incident light rotation1Comprises the following steps:
wherein d is a grating constant, and λ is the wavelength of incident light emitted by the parallel light source;
the inclination angle theta of the plane to be measured2Comprises the following steps:
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