CN106644949A - Three-dimensional static testing device for infrared obscuring ratio of disturbing particles and testing method of three-dimensional static testing device - Google Patents
Three-dimensional static testing device for infrared obscuring ratio of disturbing particles and testing method of three-dimensional static testing device Download PDFInfo
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Abstract
The invention provides a three-dimensional static testing device for the infrared obscuring ratio of disturbing particles. The three-dimensional static testing device comprises a particle dispenser, an infrared radiation source, a thermal infrared imager, a plurality of bracket frames and a blank sample board, wherein the particle dispenser is used for uniformly dispersing the disturbing particles to the blank sample board so as to prepare a test sample board; the bracket frames are used for respectively placing the blank sample board and the test sample board in a one-to-one correspondence manner under a particle obscuring condition or not and are respectively and sequentially overlapped to form a three-dimensional testing structure; the infrared radiation source is placed below the three-dimensional testing structure; and the thermal infrared imager is placed above the three-dimensional testing structure. The invention further provides a testing method of the three-dimensional static testing device for the infrared obscuring ratio of the disturbing particles. According to the three-dimensional static testing device, the defect of a big testing error of a two-dimensional static testing device is overcome, the defects of huge volume, high consumed sample amount and tediousness in operation of a traditional smoke chamber experiment system are overcome, the testing of the infrared obscuring ratio of the disturbing particles is simplified, and the precision is relatively high.
Description
Technical field
The present invention relates to particulate and smoke particles attenuation characteristic technical field of measurement and test, specifically a kind of interference particle
Infrared screening rate three-dimensional static test device and its method of testing.
Background technology
Aerosol or smoke particles can produce to incident infra-red radiation and absorb and scatter, so as to cause infra-red radiation to pass
Defeated decay.By thermal infrared imager can be decayed before and after target and background infrared radiation distribution and its specified point etc.
Effect radiation temperature, so as to realize the qualitative and quantitatively characterizing to interference effect.
The usual means of current test smoke particles infrared property for obscuring are smoke screen case test systems, by large-scale smoke screen casing
(or smoke screen room), smoke agent, smoke generator, agitation fan, mass concentration sampling head, detection window, radiation source, detector, calculating
Machine etc. is constituted.During test, radiometric value I without radiation source in the case of smoke screen is recorded with infrared radiometer respectively0, and smoke box
Radiometric value I of radiation source during interior distribution smoke particles.Meanwhile, smoke screen quality is obtained by smoke screen mass concentration sampling apparatus dense
Degree Cm.Above-mentioned measured value and smoke box light path L are substituted into (1) formula, you can try to achieve the mass extinction coefficient α of particle.
But, with the development of smoke screen material technology, directly spray the smoke screen producing method of high extinction particle just gradually
Replace the traditional smoke screen technology produced thick smoke by smoke agent burning.Because existing smoke screen case test device is bulky, test
Consumption sample amount is big, therefore, it is impossible to meet the testing requirement of a small amount of interference particle extinction performance of laboratory scale preparation.
The test of interference particle extinction performance can also adopt static testing, will certain mass M interference particle to be measured
Uniform adhesion makes the two dimensional surface load sample that a particle surface density is M/S in the viscosity high polymer transparent substrates that area is S
Plate, is vertically put between radiation source and reception device, obtains light radiation by blank substrate plate and load with infrared radiometer respectively
Light intensity value I after model0And I, with equivalently represented column density C of particle surface density M/S value in light pathmL, and substitute into formula (1), you can
Try to achieve the mass extinction coefficient α of particle.
Although this static two dimensional plane method of testing is simple, convenient, consumption sample is few, more truly simulation particle is tended not to
In the distribution of three-dimensional space, scattered uniformity is wayward, and the number of particles that adhesive substrate can be adhered to is limited,
Surface density can not arbitrarily be arranged and adjusted, and test result tends not to objectively respond truth.Additionally, thermal infrared imager into
For the current main flow equipment for scouting detection, infrared radiometer is just progressively being replaced with the advantage of its directly perceived, high precision.
The content of the invention
It is an object of the invention to provide a kind of disturb the infrared screening rate three-dimensional static test device of particle and its test side
Method, the test device had both had the advantages that two dimensional surface static tester simple structure, easy to operate, consumption sample amount were few, again might be used
Disturb particle in smoke screen case the characteristics of spatially spatial distribution to simulate；By the device and corresponding method of testing, can be with
The concentration and light path of interference particle to be measured are flexibly set, and the error for making average extinction coefficient test result reduces.
The technical scheme is that：
The infrared screening rate three-dimensional static test device of one kind interference particle, the device includes particle dispensing device, infra-red radiation
Source, thermal infrared imager, several stand frames and several blank models；The blank model is by infrared transparent substrate and fixes it
The rigid annulus at edge are constituted；The particle dispensing device, for interference uniform particle to be dispersed on the blank model to make
Into test sample plate；The stand frame is identical with the quantity of the blank model, the stand frame, in noiseless particle masks
When correspond and place the blank model, be additionally operable to be corresponded when there is interference particle masks and place the test sample plate,
And stack successively composition 3 D stereo test structure；The source of infrared radiation is positioned under the 3 D stereo test structure
Side；The thermal infrared imager is positioned over the top of the 3 D stereo test structure, for the forward and backward institute of collection interference particle masks
State the equivalent blackbody temperature of the source of infrared radiation and its background.
The infrared screening rate three-dimensional static test device of described interference particle, the stand frame is the pros with four foot supports
Shape frame, the length of side of the square-shaped frame of the foot support of the band four meets following relation with the internal diameter value of the rigid annulus：
Wherein, a represents the length of side of the square-shaped frame with four foot supports, and d represents the internal diameter of rigid annulus.
The infrared screening rate three-dimensional static test device of described interference particle, the source of infrared radiation be a constant temperature black matrix or
Constant temperature thermal source.
A kind of method of testing of the described infrared screening rate three-dimensional static test device of interference particle, the method includes following
Step：
(1) first blank model is placed on first stand frame, then second stand frame is stacked at first
On stand frame, then second blank model is placed on second stand frame, the like, constitute noiseless particle masks
3 D stereo test structure；
(2) source of infrared radiation is positioned over the lower section of first stand frame, and holding position is constant；
(3) thermal infrared imager is positioned over the top of last stand frame, the position of thermal infrared imager is adjusted so that red
External sort algorithm and its background are in the visual field of thermal infrared imager；
(4) source of infrared radiation and the equivalent blackbody temperature of its background are read from thermal infrared imager；
(5) position of transform infrared radiation source several times, repeat step (3) and (4), and be calculated the source of infrared radiation and
The average equivalent blackbody temperature of its background；
(6) the 3 D stereo test structure of noiseless particle masks is taken apart, is reduced into independent blank model and support
Frame；
(7) the interference particle of certain mass is weighed, loads particle dispensing device；
(8) mechanical oscillation by particle dispensing device make interference particle free-falling, are dispersed in a blank model
On, make a test sample plate；
(9) repeat step (7) and (8), make successively several test sample plates；
(10) first test sample plate is placed on first stand frame, then second stand frame is stacked at first
On stand frame, then second test sample plate is placed on second stand frame, the like, composition has interference particle masks
3 D stereo test structure；
(11) repeat step (2)～(5)；
(12) below equation is adopted, is calculated the infrared screening rate of interference particle：
Wherein, η represents the infrared screening rate of interference particle, TO、T′OThe forward and backward infra-red radiation of interference particle masks is represented respectively
On source coordinate for (x, y) average equivalent blackbody temperature of the point on thermal infrared imager, TB、T′BInterference particle masks are represented respectively
Coordinate is average equivalent blackbody temperature of the point of (x ', y ') on thermal infrared imager in forward and backward source of infrared radiation background,Represent the target and background with corresponding average equivalent blackbody temperature at 7.5～13 μm respectively
The radiant exitance of wave band.
Beneficial effects of the present invention are：
As shown from the above technical solution, the present invention is realized dry by way of using stand frame test sample plate is stacked
Disturb particle to be uniformly distributed in the solid space of certain light path, preferable simulation interference particle can exist under the conditions of easily-testing
Three-dimensional distribution, both having overcome can only be distributed in two-dimentional putting down using finite quantity particle during two-dimensional static test device
The big deficiency of face, test error, overcome again traditional smoke screen case experimental system it is bulky, expend sample size it is big, cumbersome
The drawbacks of, making the test of the infrared screening rate of particle becomes easy, and accuracy is higher.
Description of the drawings
Fig. 1 is each modular construction schematic diagram of device of the present invention；
Fig. 2 is the apparatus structure schematic diagram of the present invention.
Specific embodiment
Further illustrate the present invention with specific embodiment below in conjunction with the accompanying drawings.
A kind of as shown in Figure 1 and Figure 2, the infrared screening rate three-dimensional static test device of interference particle, including particle dispensing device 1,
Several blank models 2, several equivalently-sized, square-shaped frame 4 with four foot supports, the source of infrared radiation 5 and thermal infrared imagers
6。
Wherein, the length of side of the square-shaped frame 4 with four foot supports is highly h for a, four foot supports, and material is macromolecule or gold
Category, can stack.
Blank model 2 is made up of infrared transparent substrate with the rigid annulus for fixing its edge, and infrared transparent substrate is to red
The polymer film of external radiation high transmission, to there is adhesivity to be preferred.The material of rigid annulus can be macromolecule or metal, in it
Footpath d values meet (2) formula：
Particle dispensing device 1 is the container of bottom even punching, and the shape in hole depends on the shape of interference particle to be measured, hole
Characteristic size of the characteristic size slightly larger than interference particle to be measured.Mechanical oscillation by particle dispensing device 1 make interference particle freedom
Fall, be dispersed on a blank model 2, that is, make a test sample plate 3.
The source of infrared radiation 5 is a constant temperature target, can be constant temperature black matrix or constant temperature thermal source.
Thermal infrared imager 6 should be able to show the radiation temperature of Chosen Point in thermal imagery.
A kind of method of testing of the infrared screening rate three-dimensional static test device of particle, comprises the following steps：
S1, first blank model 2 is placed in the square-shaped frame 4 of first foot support of band four, then by second band
The pin of square-shaped frame 4 four of four foot supports is stacked in alignment in the square-shaped frame 4 of first foot support of band four, then by second
Blank model 2 is placed in the square-shaped frame 4 of second foot support of band four, according to aforesaid operations, is stacked successively as needed, shape
Into the 3 D stereo test structure of a noiseless particle masks.
In S2, the optical system for testing being positioned over the source of infrared radiation 5 below the square-shaped frame 4 of first foot support of band four, and
Holding position is constant.
S3, the top that thermal infrared imager 6 is positioned over last square-shaped frame 4 with four foot supports using tripod,
Adjust the position of thermal infrared imager 6 so that the source of infrared radiation 5 and its background are in the visual field of thermal infrared imager 6.
S4, the equivalent blackbody temperature for reading from thermal infrared imager 6 source of infrared radiation 5 and its background.
S5, to improve measuring accuracy, the position of transform infrared radiation source 5 several times, repeat step S3 and S4, and calculate
To the source of infrared radiation 5 and the average equivalent blackbody temperature of its background；
S6, the 3 D stereo test structure of noiseless particle masks is taken apart, be reduced into independent blank model 2 and band four
The square-shaped frame 4 of foot support.
S7, the interference particle that quality is M ± 0.1mg is weighed, load particle dispensing device 1.
S8, the mechanical oscillation by particle dispensing device 1 make interference particle free-falling, are dispersed in a blank model
On 2, it is 4M/ π d to make an interference particle distribution surface density2Test sample plate 3；
S9, repeat step S7 and S8, make successively several test sample plates 3；
S10, first test sample plate 3 is placed in the square-shaped frame 4 of first foot support of band four, then by second band
The square-shaped frame 4 of four foot supports is stacked in the square-shaped frame 4 of first foot support of band four, then by second test sample plate 3
It is placed in the square-shaped frame 4 of second foot support of band four, according to aforesaid operations, stacks successively as needed, forming one has
The 3 D stereo test structure of interference particle masks.
S11, repeat step S2～S5；
S12, using below equation (3), be calculated the infrared screening rate of interference particle：
In formula, η represents the infrared screening rate of interference particle, TO、T′OThe forward and backward infra-red radiation of interference particle masks is represented respectively
On source 5 coordinate for (x, y) average equivalent blackbody temperature of the point on thermal infrared imager 6, TB、T′BRepresent that interference particle hides respectively
It is average equivalent blackbody temperature of the point of (x ', y ') on thermal infrared imager 6 to cover coordinate in the background of the forward and backward source of infrared radiation 5, Represent the target and background of corresponding average equivalent blackbody temperature in 7.5～13 μm of ripples respectively
The radiant exitance of section.
Embodiment 1
200 ± 0.1mg interference particle A are weighed, in being fitted into particle dispensing device 1；Made by the mechanical oscillation of particle dispensing device 1
Interference particle A free-fallings are simultaneously dispersed on the blank model 2 of five a diameter of 25cm, are made with 4.0746g/m2It is dry
Disturb the test sample plate 3 of particle surface density distribution；Test sample plate 3 is placed in the square-shaped frame 4 with four foot supports.
Repeat to make second to the 5th test sample plate 3, successively by the square-shaped frame 4 and first of second foot support of band four
The pin of square-shaped frame 4 four alignment of the foot support of individual band four, stacks in the square-shaped frame 4 of first foot support of band four, then by second
Individual test sample plate 3 is placed in the square-shaped frame 4 of second foot support of band four, repeats aforesaid operations, forms one as shown in Figure 2
3 D stereo test structure.
The source of infrared radiation 5 is placed in the optical system for testing of the lower section of square-shaped frame 4 of first foot support of band four；Using three
Foot rest fixes thermal infrared imager 6, makes the source of infrared radiation 5 and its background in the visual field of thermal infrared imager 6.
The temperature of the source of infrared radiation 5 when placing blank model 2 and test sample plate 3 and its background is read respectively.Conversion is red
5 position of external sort algorithm three times, by repeatedly testing the mean value that the method being averaging obtains corresponding temperature, finally by formula (3)
The infrared screening rate of interference particle A is obtained, 1 is the results are shown in Table.
Embodiment 2
200 ± 0.1mg interference particle B are weighed, repeats the test in embodiment 1 and calculation procedure, obtain disturbing particle B's
Infrared screening rate test result, is shown in Table 1.
Embodiment 3
200 ± 0.1mg interference particle C are weighed, repeats the test in embodiment 1 and calculation procedure, obtain disturbing particle C's
Infrared screening rate test result, is shown in Table 1.
The infrared screening rate test result of interference particle of each embodiment of table 1
*Note：When placing blank model, TO=50.6 DEG C,TB=19.1 DEG C,
From the foregoing, the present invention realizes the three dimensions of interference particle by this stacked three-dimensional static test device of design
Distribution and the static test of screening rate.The present invention had both possessed the advantage that plane static testing is simple, consumption sample amount is few, again might be used
To simulate interference particle 3 D stereo distribution situation in smoke screen case dynamic test system, two-dimensional static can be avoided as much as
The error brought to test result because of particle distribution difference is tested, gained test result can more objectively reflect particle
True screening performance.
Meanwhile, the present invention had both solved requirement of the two-dimensional static test device to substrate adhesion and interference particle surface density
Be disturbed the restriction of particle adhesive capacity, also solve that a small amount of sample mass concentration in large-scale smoke screen case is too low, test result not
Accurate problem.
The above embodiment is only that the preferred embodiment of the present invention is described, not to the model of the present invention
Enclose and be defined, on the premise of without departing from design spirit of the present invention, technical side of the those of ordinary skill in the art to the present invention
Various modifications and improvement that case is made, all should fall into the protection domain of claims of the present invention determination.
Claims (4)
- It is 1. a kind of to disturb the infrared screening rate three-dimensional static test device of particle, it is characterised in that：The device include particle dispensing device, The source of infrared radiation, thermal infrared imager, several stand frames and several blank models；The blank model is by infrared transparent substrate Constitute with the rigid annulus for fixing its edge；The particle dispensing device, for interference uniform particle to be dispersed in into the blank sample Making test sample plate on plate；The stand frame is identical with the quantity of the blank model, the stand frame, for noiseless Correspond during particle masks and place the blank model, be additionally operable to be corresponded when there are interference particle masks and place the survey Sample board, and composition 3 D stereo test structure is stacked successively；The source of infrared radiation is positioned over the 3 D stereo test knot The lower section of structure；The thermal infrared imager is positioned over the top of the 3 D stereo test structure, for collection interference particle masks The equivalent blackbody temperature of the forward and backward source of infrared radiation and its background.
- It is 2. according to claim 1 to disturb the infrared screening rate three-dimensional static test device of particle, it is characterised in that：Described Frame frame is the square-shaped frame with four foot supports, the length of side of the square-shaped frame of the foot support of the band four and the internal diameter of the rigid annulus Value meets following relation：Wherein, a represents the length of side of the square-shaped frame with four foot supports, and d represents the internal diameter of rigid annulus.
- It is 3. according to claim 1 to disturb the infrared screening rate three-dimensional static test device of particle, it is characterised in that：It is described red External sort algorithm is a constant temperature black matrix or constant temperature thermal source.
- 4. the method for testing of a kind of interference infrared screening rate three-dimensional static test device of particle according to claim 1, its It is characterised by, the method is comprised the following steps：(1) first blank model is placed on first stand frame, then second stand frame is stacked in first support On frame, then second blank model is placed on second stand frame, the like, constitute the three of noiseless particle masks The three-dimensional test structure of dimension；(2) source of infrared radiation is positioned over the lower section of first stand frame, and holding position is constant；(3) thermal infrared imager is positioned over the top of last stand frame, the position of thermal infrared imager is adjusted so that infrared spoke She Yuan and its background are in the visual field of thermal infrared imager；(4) source of infrared radiation and the equivalent blackbody temperature of its background are read from thermal infrared imager；(5) position of transform infrared radiation source several times, repeat step (3) and (4), and be calculated the source of infrared radiation and it is carried on the back The average equivalent blackbody temperature of scape；(6) the 3 D stereo test structure of noiseless particle masks is taken apart, is reduced into independent blank model and stand frame；(7) the interference particle of certain mass is weighed, loads particle dispensing device；(8) mechanical oscillation by particle dispensing device make interference particle free-falling, are dispersed on a blank model, system Into a test sample plate；(9) repeat step (7) and (8), make successively several test sample plates；(10) first test sample plate is placed on first stand frame, then second stand frame is stacked in first support On frame, then second test sample plate is placed on second stand frame, the like, composition has the three of interference particle masks The three-dimensional test structure of dimension；(11) repeat step (2)～(5)；(12) below equation is adopted, is calculated the infrared screening rate of interference particle：Wherein, η represents the infrared screening rate of interference particle, TO、T′ORepresent respectively on the forward and backward source of infrared radiation of interference particle masks Coordinate for (x, y) average equivalent blackbody temperature of the point on thermal infrared imager, TB、T′BRespectively represent interference particle masks before, Afterwards coordinate is average equivalent blackbody temperature of the point of (x ', y ') on thermal infrared imager in source of infrared radiation background,Represent the target and background with corresponding average equivalent blackbody temperature at 7.5～13 μm respectively The radiant exitance of wave band.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111735743A (en) * | 2020-07-24 | 2020-10-02 | 中国人民解放军国防科技大学 | Method for determining particle morphology of strong extinction biological material under target waveband |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5466943A (en) * | 1993-09-16 | 1995-11-14 | Hughes Aircraft Company | Evacuated testing device having calibrated infrared source |
| CN102121893A (en) * | 2010-12-02 | 2011-07-13 | 中国人民解放军防化指挥工程学院 | Ultrahigh-pressure water fog test system |
| CN104007137A (en) * | 2014-04-30 | 2014-08-27 | 中国人民解放军63983部队 | Device and method for measuring infrared thermal transmittance of camouflage screen |
| CN105283056A (en) * | 2014-07-15 | 2016-01-27 | 联茂电子股份有限公司 | Electromagnetic wave interference shielding film |
| CN206348264U (en) * | 2016-12-26 | 2017-07-21 | 中国人民解放军电子工程学院 | One kind interference infrared screening rate three-dimensional static test device of particle |
-
2016
- 2016-12-26 CN CN201611221802.0A patent/CN106644949B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5466943A (en) * | 1993-09-16 | 1995-11-14 | Hughes Aircraft Company | Evacuated testing device having calibrated infrared source |
| CN102121893A (en) * | 2010-12-02 | 2011-07-13 | 中国人民解放军防化指挥工程学院 | Ultrahigh-pressure water fog test system |
| CN104007137A (en) * | 2014-04-30 | 2014-08-27 | 中国人民解放军63983部队 | Device and method for measuring infrared thermal transmittance of camouflage screen |
| CN105283056A (en) * | 2014-07-15 | 2016-01-27 | 联茂电子股份有限公司 | Electromagnetic wave interference shielding film |
| CN206348264U (en) * | 2016-12-26 | 2017-07-21 | 中国人民解放军电子工程学院 | One kind interference infrared screening rate three-dimensional static test device of particle |
Non-Patent Citations (1)
| Title |
|---|
| 李晓霞;豆正伟;: "热成像法定量测试红外干扰剂遮蔽效果" * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111735743A (en) * | 2020-07-24 | 2020-10-02 | 中国人民解放军国防科技大学 | Method for determining particle morphology of strong extinction biological material under target waveband |
| CN111735743B (en) * | 2020-07-24 | 2020-11-20 | 中国人民解放军国防科技大学 | Method for determining particle morphology of strong extinction biological material under target waveband |
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