CN206348264U - One kind interference infrared screening rate three-dimensional static test device of particle - Google Patents

One kind interference infrared screening rate three-dimensional static test device of particle Download PDF

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Publication number
CN206348264U
CN206348264U CN201621438358.3U CN201621438358U CN206348264U CN 206348264 U CN206348264 U CN 206348264U CN 201621438358 U CN201621438358 U CN 201621438358U CN 206348264 U CN206348264 U CN 206348264U
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China
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particle
interference
test
infrared
model
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CN201621438358.3U
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Chinese (zh)
Inventor
李晓霞
郭宇翔
冯云松
马德跃
程正东
朱斌
邓潘
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ELECTRONIC ENGINEERING COLLEGE PLA
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ELECTRONIC ENGINEERING COLLEGE PLA
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Abstract

The utility model provides a kind of interference infrared screening rate three-dimensional static test device of particle, including particle dispensing device, the source of infrared radiation, thermal infrared imager, several stand frames and blank model;Particle dispensing device is used to interference uniform particle being dispersed on blank model so that test sample plate is made;Stand frame is used in noiseless particle masks and corresponds placement blank model and test sample plate respectively when having interference particle masks, and each stacks composition 3 D stereo test structure successively;The source of infrared radiation is positioned over the lower section of 3 D stereo test structure;Thermal infrared imager is positioned over the top of 3 D stereo test structure.The utility model had both overcome the big deficiency of two-dimensional static test device test error, overcome again traditional smoke screen case experimental system it is bulky, expend sample size it is big, it is cumbersome the drawbacks of, making the test of the infrared screening rate of interference particle becomes easy, and accuracy is higher.

Description

One kind interference infrared screening rate three-dimensional static test device of particle
Technical field
The utility model is related to particulate and smoke particles attenuation characteristic technical field of measurement and test, is specifically a kind of interference The infrared screening rate three-dimensional static test device of particle.
Background technology
Aerosol or smoke particles can be produced to incident infra-red radiation to be absorbed and scatters, so as to cause infra-red radiation to pass Defeated decay.By thermal infrared imager can obtain decay before and after target and background infrared radiation distribution and its specified point etc. Radiation temperature is imitated, so as to realize the qualitative and quantitatively characterizing to interference effect.
The usual means of current test smoke particles infrared property for obscuring are smoke screen case test systems, by large-scale smoke screen casing (or smoke screen room), smoke agent, smoke generator, agitation fan, mass concentration sampling head, detection window, radiation source, detector, calculating Machine etc. is constituted.During test, the radiometric value I without radiation source in the case of smoke screen is recorded with infrared radiometer respectively0, and smoke box The radiometric value I of radiation source during interior distribution smoke particles.Meanwhile, smoke screen quality is obtained by smoke screen mass concentration sampling apparatus dense Spend Cm.Above-mentioned measured value and smoke box light path L are substituted into (1) formula, you can try to achieve the mass extinction coefficient α of particle.
But, with the development of smoke screen material technology, directly spray the smoke screen producing method of high extinction particle just gradually Replace the traditional smoke screen technology burnt and produced thick smoke by smoke agent.Because existing smoke screen case test device is bulky, test Sample amount is consumed greatly, therefore, it is impossible to meet the testing requirement of a small amount of interference particle extinction performance of laboratory scale preparation.
The test of particle extinction performance is disturbed to use static testing, i.e., by certain mass M interference particle to be measured Uniform adhesion makes the two dimensional surface load sample that a particle surface density is M/S in the sticky high polymer transparent substrates that area is S Plate, is put between radiation source and reception device vertically, obtains light radiation by blank substrate plate with carrying with infrared radiometer respectively Light intensity value I after model0And I, with the equivalently represented column density C of particle surface density M/S values in light pathmL, and substitute into formula (1), you can Try to achieve the mass extinction coefficient α of particle.
Although this static two dimensional plane method of testing is simple, conveniently, consumption sample it is few, tend not to more truly simulation particle In the distribution of three-dimensional space, scattered uniformity is difficult to control, and the adhesive number of particles of adhesive substrate is limited, Surface density arbitrarily can not set and adjust, and test result tends not to objectively respond truth.In addition, thermal infrared imager into For the current main flow equipment for scouting detection, infrared radiometer is just progressively replaced with the advantage that its directly perceived, precision is high.
Utility model content
The purpose of this utility model is to provide a kind of interference infrared screening rate three-dimensional static test device of particle, the test Device had both had the advantages that two dimensional surface static tester was simple in construction, easy to operate, it is few to consume sample amount, and interference can be simulated again Particle is in smoke screen case the characteristics of spatially spatial distribution;By the device and corresponding method of testing, it can flexibly set and treat The concentration and light path of interference particle are surveyed, reduces the error of average extinction coefficient test result.
The technical solution of the utility model is:
One kind interference infrared screening rate three-dimensional static test device of particle, the device includes particle dispensing device, infra-red radiation Source, thermal infrared imager, several stand frames and several blank models;The blank model is by infrared transparent substrate and fixes it The rigid annulus at edge is constituted;The particle dispensing device, for interference uniform particle to be dispersed on the blank model to make Into test sample plate;The stand frame is identical with the quantity of the blank model, the stand frame, in noiseless particle masks When correspond and place the blank model, be additionally operable to correspond when there is interference particle masks and place the test sample plate, And composition 3 D stereo test structure is stacked successively;The source of infrared radiation is positioned under the 3 D stereo test structure Side;The thermal infrared imager is positioned over the top of the 3 D stereo test structure, for gathering the forward and backward institute of interference particle masks State the equivalent blackbody temperature of the source of infrared radiation and its background.
The infrared screening rate three-dimensional static test device of described interference particle, the stand frame is the pros of the foot support of band four Shape frame, the length of side of square-shaped frame and the internal diameter value of the rigid annulus of the foot support of band four meet following relation:
Wherein, a represents the length of side of the square-shaped frame of the foot support of band four, and d represents the internal diameter of rigid annulus.
The infrared screening rate three-dimensional static test device of described interference particle, the source of infrared radiation be a constant temperature black matrix or Constant temperature thermal source.
The beneficial effects of the utility model are:
As shown from the above technical solution, the mode that the utility model stacks test sample plate by using stand frame, is realized Interference particle is uniformly distributed in the solid space of certain light path, preferable simulation can disturb grain under the conditions of easily-testing Son is in the distribution of three dimensions, and two dimension can only be distributed in using finite quantity particle during two-dimensional static test device by both having overcome The big deficiency of plane, test error, overcomes that traditional smoke screen case experimental system is bulky, it is big to expend sample size, it is numerous to operate again Trivial the drawbacks of, making the test of the infrared screening rate of particle becomes easy, and accuracy is higher.
Brief description of the drawings
Fig. 1 is each modular construction schematic diagram of device of the present utility model;
Fig. 2 is apparatus structure schematic diagram of the present utility model.
Embodiment
Below in conjunction with the accompanying drawings the utility model is further illustrated with specific embodiment.
As shown in Figure 1 and Figure 2, a kind of interference infrared screening rate three-dimensional static test device of particle, including particle dispensing device 1, Several blank models 2, several sizes are identical, the square-shaped frame 4 of the foot support of band four, the source of infrared radiation 5 and thermal infrared imager 6。
Wherein, the length of side of the square-shaped frame 4 of the foot support of band four is that a, four foot supports are highly h, and material is macromolecule or gold Category, can be stacked.
Blank model 2 is made up of infrared transparent substrate with the rigid annulus for fixing its edge, and infrared transparent substrate is to red The polymer film of external radiation high transmission, to there is adhesivity to be preferred.The material of rigid annulus can be macromolecule or metal, in it Footpath d values meet (2) formula:
Particle dispensing device 1 is the container that bottom even is punched, and the shape in hole depends on the shape of interference particle to be measured, hole Characteristic size of the characteristic size slightly larger than interference particle to be measured.Make interference particle free by the mechanical oscillation of particle dispensing device 1 Fall, be dispersed on a blank model 2, that is, a test sample plate 3 is made.
The source of infrared radiation 5 is a constant temperature target, can be constant temperature black matrix or constant temperature thermal source.
Thermal infrared imager 6 should be able to show the radiation temperature of Chosen Point in thermal imagery.
Operation principle of the present utility model:
S1, first blank model 2 be placed in the square-shaped frame 4 of first foot support of band four, then by second band The pin of square-shaped frame 4 four of four foot supports is stacked in the square-shaped frame 4 of first foot support of band four in alignment, then by second Blank model 2 is placed in the square-shaped frame 4 of second foot support of band four, according to aforesaid operations, is stacked successively as needed, shape Into the 3 D stereo test structure of a noiseless particle masks.
S2, the source of infrared radiation 5 is positioned in the optical system for testing of the lower section of square-shaped frame 4 of first foot support of band four, and Holding position is constant.
S3, using tripod thermal infrared imager 6 is positioned over last foot support of band four square-shaped frame 4 top, Adjust the position of thermal infrared imager 6 so that the source of infrared radiation 5 and its background are in the visual field of thermal infrared imager 6.
S4, the equivalent blackbody temperature for reading from thermal infrared imager 6 source of infrared radiation 5 and its background.
S5, to improve measuring accuracy, the position of transform infrared radiation source 5 several times, repeat step S3 and S4, and calculate To the source of infrared radiation 5 and the average equivalent blackbody temperature of its background;
S6, the 3 D stereo test structure of noiseless particle masks taken apart, be reduced into independent blank model 2 and band four The square-shaped frame 4 of foot support.
S7, the interference particle that quality is M ± 0.1mg is weighed, load particle dispensing device 1.
S8, make interference particle free-falling by the mechanical oscillation of particle dispensing device 1, be dispersed in a blank model On 2, it is 4M/ π d that an interference particle distribution surface density, which is made,2Test sample plate 3;
S9, repeat step S7 and S8, are made several test sample plates 3 successively;
S10, first test sample plate 3 be placed in the square-shaped frame 4 of first foot support of band four, then by second band The square-shaped frame 4 of four foot supports is stacked in the square-shaped frame 4 of first foot support of band four, then by second test sample plate 3 In the square-shaped frame 4 for being placed on second foot support of band four, according to aforesaid operations, stack successively as needed, forming one has Disturb the 3 D stereo test structure of particle masks.
S11, repeat step S2~S5;
S12, using below equation (3), calculate the infrared screening rate for obtaining disturbing particle:
In formula, η represents to disturb the infrared screening rate of particle, T0、T′0The interference forward and backward infra-red radiation of particle masks is represented respectively Coordinate is average equivalent blackbody temperature of the point of (x, y) on thermal infrared imager 6, T on source 5B、T′BRepresent that interference particle hides respectively It is average equivalent blackbody temperature of the point of (x ', y ') on thermal infrared imager 6 to cover coordinate in the background of the forward and backward source of infrared radiation 5, Represent the target and background of corresponding average equivalent blackbody temperature in 7.5~13 μm of ripples respectively The radiant exitance of section.
Embodiment 1
200 ± 0.1mg interference particle A are weighed, are fitted into particle dispensing device 1;Made by the mechanical oscillation of particle dispensing device 1 Interference particle A free-fallings are simultaneously dispersed on five a diameter of 25cm blank model 2, are made with 4.0746g/m2It is dry Disturb the test sample plate 3 of particle surface density distribution;In the square-shaped frame 4 that test sample plate 3 is placed on to the foot support of band four.
Repeat to make second to the 5th test sample plate 3, successively by the square-shaped frame 4 and first of second foot support of band four The pin of square-shaped frame 4 four alignment of the individual foot support of band four, is stacked in the square-shaped frame 4 of first foot support of band four, then by second Individual test sample plate 3 is placed in the square-shaped frame 4 of second foot support of band four, repeats aforesaid operations, forms one as shown in Figure 2 3 D stereo test structure.
The source of infrared radiation 5 is placed in the optical system for testing of the lower section of square-shaped frame 4 of first foot support of band four;Use three Foot stool fixes thermal infrared imager 6, makes the source of infrared radiation 5 and its background in the visual field of thermal infrared imager 6.
The source of infrared radiation 5 when placing blank model 2 and test sample plate 3 and its temperature of background are read respectively.Conversion is red 5 position of external sort algorithm three times, the average value of corresponding temperature is obtained by repeatedly testing the method for averaging, finally by formula (3) Interference particle A infrared screening rate is obtained, 1 is the results are shown in Table.
Embodiment 2
200 ± 0.1mg interference particle B are weighed, the test in embodiment 1 and calculation procedure is repeated, obtain disturbing particle B's Infrared screening rate test result, is shown in Table 1.
Embodiment 3
200 ± 0.1mg interference particle C are weighed, the test in embodiment 1 and calculation procedure is repeated, obtain disturbing particle C's Infrared screening rate test result, is shown in Table 1.
The infrared screening rate test result of interference particle of each embodiment of table 1
*Note:When placing blank model, TO=50.6 DEG C,
From the foregoing, the utility model realizes interference grain by designing this stacked three-dimensional static test device The three-dimensional spatial distribution of son and the static test of screening rate.The utility model both possessed plane static testing it is simple and easy to apply, consumption The few advantage of sample amount, can simulate interference particle 3 D stereo distribution situation, Neng Goujin in smoke screen case dynamic test system again The error for possibly avoiding two-dimensional static test from being brought to test result by particle distribution difference, gained test result can be with More objectively reflect the true screening performance of particle.
Meanwhile, the utility model had both solved requirement of the two-dimensional static test device to substrate adhesion and interference particle face Density is disturbed the limitation of particle adhesive capacity, also solve a small amount of sample mass concentration in large-scale smoke screen case it is too low, test knot The problem of fruit is inaccurate.
Embodiment described above is only that preferred embodiment of the present utility model is described, not to this practicality New scope is defined, on the premise of the utility model design spirit is not departed from, and those of ordinary skill in the art are to this Various modifications and improvement that the technical scheme of utility model is made, all should fall into the guarantor that claims of the present utility model are determined In the range of shield.

Claims (3)

1. one kind interference infrared screening rate three-dimensional static test device of particle, it is characterised in that:The device include particle dispensing device, The source of infrared radiation, thermal infrared imager, several stand frames and several blank models;The blank model is by infrared transparent substrate Constituted with the rigid annulus for fixing its edge;The particle dispensing device, for interference uniform particle to be dispersed in into the blank sample So that test sample plate is made on plate;The stand frame is identical with the quantity of the blank model, the stand frame, for noiseless Corresponded during particle masks and place the blank model, be additionally operable to correspond when there are interference particle masks and place described survey Sample board, and composition 3 D stereo test structure is stacked successively;The source of infrared radiation is positioned over the 3 D stereo test knot The lower section of structure;The thermal infrared imager is positioned over the top of the 3 D stereo test structure, for gathering interference particle masks The equivalent blackbody temperature of the forward and backward source of infrared radiation and its background.
2. the interference infrared screening rate three-dimensional static test device of particle according to claim 1, it is characterised in that:The branch Frame frame is the square-shaped frame of the foot support of band four, the length of side of the square-shaped frame of the foot support of band four and the internal diameter of the rigid annulus Value meets following relation:
a < d < 2 a
Wherein, a represents the length of side of the square-shaped frame of the foot support of band four, and d represents the internal diameter of rigid annulus.
3. the interference infrared screening rate three-dimensional static test device of particle according to claim 1, it is characterised in that:It is described red External sort algorithm is a constant temperature black matrix or constant temperature thermal source.
CN201621438358.3U 2016-12-26 2016-12-26 One kind interference infrared screening rate three-dimensional static test device of particle Expired - Fee Related CN206348264U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106644949A (en) * 2016-12-26 2017-05-10 中国人民解放军电子工程学院 Three-dimensional static testing device for infrared obscuring ratio of disturbing particles and testing method of three-dimensional static testing device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106644949A (en) * 2016-12-26 2017-05-10 中国人民解放军电子工程学院 Three-dimensional static testing device for infrared obscuring ratio of disturbing particles and testing method of three-dimensional static testing device
CN106644949B (en) * 2016-12-26 2023-08-04 中国人民解放军电子工程学院 Interference particle infrared shielding rate three-dimensional static test device and test method thereof

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Granted publication date: 20170721

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