CN106526367A - Electronic equipment testing method and device - Google Patents
Electronic equipment testing method and device Download PDFInfo
- Publication number
- CN106526367A CN106526367A CN201610947514.7A CN201610947514A CN106526367A CN 106526367 A CN106526367 A CN 106526367A CN 201610947514 A CN201610947514 A CN 201610947514A CN 106526367 A CN106526367 A CN 106526367A
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- Prior art keywords
- test
- mark
- instruction
- identification number
- program
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Abstract
The invention is suitable for the technical field of computers and provides an electronic equipment testing method and device. The method comprises steps of sequentially obtaining test instructions stored in electronic equipment; detecting a test state identifier corresponding to a test identifier number of the previous test instruction when the current test instruction is read; when the corresponding test state identifier is detected as a pass-test identifier, obtaining and executing a corresponding test program according to the test identifier number in the current test instruction; and when the test program passes through the test, setting the test state identifier corresponding to the test identifier number in the current test instruction as the pass-test identifier. Therefore, the testing is automatically executed. When the test program does not pass the test, the test state identifier corresponding to the test identifier number as a preset test failure identifier, and a related repair guidance operation instruction is executed, so that the user is guided to timely and accurately repair the electronic equipment, thereby preventing interruption of the test program and improving the test efficiency.
Description
Technical field
The invention belongs to field of computer technology, more particularly to a kind of electronic equipment method of testing and device.
Background technology
In the epoch now that science and technology is maked rapid progress, most of science-and-technology enterprises are all proposed the electronic equipment or product of itself
Product, to meet the different demands of user.The reliability and stability of electronic product are the important evidences that user selects electronic product,
And it is to ensure one of important channel of electronic product reliability and stability to test, it is an important ring of Electronic products manufacturing.
However, in the test process of existing electronic product, generally needing testing staff when failure is detected with artificial
Mode of operation is analyzed to error code, is purged reparation to failure, is just manually operated afterwards and is entered next stage
Test, reduce the detection efficiency of electronic product, while also result in the waste of the energy.
The content of the invention
It is an object of the invention to provide a kind of electronic equipment method of testing and device, it is intended to solve due to prior art without
Method provides a kind of effective testing for electrical equipment method, the problem for causing testing for electrical equipment cycle length, testing efficiency low.
On the one hand, the invention provides a kind of electronic equipment method of testing, methods described comprises the steps:
Storage test instruction on an electronic device is obtained successively, and the test instruction includes the test mark of test step
Knowledge number;
Perform the current test instruction read;
The step of current test for performing reading is instructed, including:
The corresponding test mode mark of test identification number of previous test instruction is detected;
When detect the corresponding test mode be designated test by mark when, according to it is described it is current test instruction in
The test identification number obtains corresponding test program and performs;
When test program test passes through, the corresponding test of identification number will be tested described in the current test instruction
Status indicator is set to test by mark;
When the test program is tested not to be passed through, the test identification number corresponding test mode mark is set to pre-
If test by mark, and perform association reparation guiding operational order, to guide user to carry out the electronic equipment
Repair.
On the other hand, the invention provides a kind of electronic equipment test device, it is characterised in that described device includes:
Instruction acquiring unit, for obtaining storage test instruction on an electronic device successively, wraps in the test instruction
Include the test identification number of test step;
Instruction execution unit, for performing the current test instruction read;
The instruction execution unit includes:
State detection unit, examines for the corresponding test mode mark of test identification number to previous test instruction
Survey;
Program execution unit, for when detect the corresponding test mode be designated test by mark when, according to
Identification number is tested described in the current test instruction to obtain corresponding test program and perform;
Mark setting unit, for when test program test passes through, will survey described in the current test instruction
The corresponding test mode mark of examination identification number is set to test by mark;And
Guidance unit is repaired, for when test program test does not pass through, by the test identification number corresponding survey
Examination status indicator is set to default test not by mark, and performs the reparation guiding operational order of association, to guide user
The electronic equipment is repaired.
The present invention obtains storage test instruction on an electronic device successively, when the current test read in execution is instructed,
The test identification number corresponding test mode mark of previous test instruction is detected, when detecting corresponding test mode mark
When knowing for testing by mark, identification number is tested in instructing according to current test and is obtained corresponding test program and is performed, work as survey
When examination program test passes through, the corresponding test mode mark of identification number will be tested in current test instruction and is set to test by mark
Knowledge, so as to realize the full-automatic execution tested, improves testing efficiency, and when test program test does not pass through, will test
Identification number corresponding test mode mark is set to default test by mark, and performs the reparation guiding operation of association and refer to
Order, to guide user to carry out timely, accurate reparation to electronic equipment, prevents test program from occurring to interrupt, can equally improve electricity
The testing efficiency of sub- product.
Description of the drawings
Fig. 1 is the flowchart of the testing for electrical equipment method that the embodiment of the present invention one is provided;
Fig. 2 is the reality of the current test instruction for performing reading in the testing for electrical equipment method that the embodiment of the present invention one is provided
Existing flow chart;
Fig. 3 is the structural representation of the testing for electrical equipment device that the embodiment of the present invention two is provided;And
Fig. 4 is the structural representation of instruction execution unit in the testing for electrical equipment device that the embodiment of the present invention two is provided.
Specific embodiment
In order that the objects, technical solutions and advantages of the present invention become more apparent, it is below in conjunction with drawings and Examples, right
The present invention is further elaborated.It should be appreciated that specific embodiment described herein is only to explain the present invention, and
It is not used in the restriction present invention.
Implementing for the present invention is described in detail below in conjunction with specific embodiment:
Embodiment one:
Fig. 1 shows that the testing for electrical equipment method that the embodiment of the present invention one is provided realizes flow process, for convenience of description,
The part related to the embodiment of the present invention is illustrate only, details are as follows:
In step s 11, storage test instruction on an electronic device is obtained successively, and test instruction includes test step
Test identification number.
The embodiment of the present invention is applied to the electronic equipments with memory space such as mobile terminal, vehicle electronic device, for example,
Smart mobile phone.Wherein, memory space is used for test job sequence or the test instruction set tested to electronic equipment by storage,
The test job sequence or test instruction set include a plurality of test instruction, the test in test instruction at least including test step
Identification number, to obtain corresponding test program according to test identification number.In concrete test, can obtain successively or one by one and be stored in
Test instruction on electronic equipment, is tested according to the current current test instruction read.
In step s 12, perform the current test instruction read.
In embodiments of the present invention, the current test instruction read can be performed according to the flow process shown in Fig. 2, to set to electronics
It is standby to be tested, wherein:
In the step s 120, the corresponding test mode mark of test identification number of previous test instruction is detected.
In embodiments of the present invention, testing identification number is used for identifying test instruction or corresponding test program, for each
Whether bar test instruction is provided with corresponding test mode mark, for mark test instruction by test.
In step S121, lead to when detecting the corresponding test mode of previous test instruction testing identification number and being designated to test
When crossing mark, obtain corresponding test program and perform according to identification number being tested in current test instruction.
In embodiments of the present invention, test is designated by mark when detecting the corresponding test mode of previous test instruction
When, then current test instruction is performed, to enter the corresponding test of current test instruction.Preferably, obtaining corresponding test journey
During sequence, corresponding test program is obtained from the testing service device of connection.So, set without the need for all test programs are imported to electronics
It is standby upper, only test program unification need to be stored on testing service device, test is provided with the electronic equipment to variety classes, model
Program, improves testing efficiency.
In step S122, judge whether test program is tested and pass through, be then execution step S123, otherwise execution step
S124。
In step S123, when test program test passes through, will currently test
Examination status indicator is set to test by mark.
In step S124, when test program is tested not to be passed through, the corresponding test mode mark of identification number will be tested and set
Default test is set to not by mark, and performs the reparation guiding operational order of association, to guide user to enter electronic equipment
Row is repaired.
In embodiments of the present invention, when test program is tested not to be passed through, the corresponding test mode mark of identification number will be tested
Knowledge is set to default test not by mark, and performs the reparation guiding operational order of association, to guide user to set electronics
It is standby to be repaired.
Preferably, test is not configured according to the different types of failure of electronic equipment by mark, that is to say, that can
Different tests are pre-set by mark, with identify the test of test program in test process not by when different failure or
Failure cause, so can according to the test by identify obtain with test by identify associate, for electronic equipment
Correspondence repairs guiding operational order, performs the reparation and guides operational order, to guide user to repair electronic equipment, improves
The testing efficiency of electronic equipment, improves the production efficiency of electronic equipment indirectly.Preferably, reparation guiding operational order may include right
The voice message answered, is operated with, pointing out user to carry out next reparation after user has performed a reparation operation, finally guides user
Complete the reparation to the failure for detecting.
In embodiments of the present invention, no matter test program is test passes through or does not pass through, it is preferable that will test identification number
The testing service device of connection is sent to corresponding test mode mark and is stored, to form corresponding test log or record,
It is easy to user or tester to the tracking of testing for electrical equipment process or checks, facilitates event during Subsequent electronic equipment use
The determination of barrier.
In embodiments of the present invention, when detect corresponding test mode be designated it is default test not by mark when,
Previous test instruction is performed, implementation procedure refers to the aforementioned execution to current test instruction, will not be described here.
One of ordinary skill in the art will appreciate that all or part of step in realizing above-described embodiment method can be
Instruct related hardware to complete by program, described program can be stored in a computer read/write memory medium,
Described storage medium, such as ROM/RAM, disk, CD etc..
Embodiment two:
Fig. 3 shows the structure of the testing for electrical equipment device that the embodiment of the present invention two is provided, and for convenience of description, only shows
Go out the part related to the embodiment of the present invention, including:
Instruction acquiring unit 11, for obtaining storage test instruction on an electronic device successively, test instruction includes
The test identification number of test step;And
Instruction execution unit 12, for performing the current test instruction read.
In embodiments of the present invention, as shown in figure 4, instruction execution unit 12 includes:
State detection unit 120, is carried out for the corresponding test mode mark of test identification number to previous test instruction
Detection;
Program execution unit 121, for when detect corresponding test mode be designated test by mark when, according to institute
Identification number is tested in stating current test instruction to obtain corresponding test program and perform;
Mark setting unit 122, for when test program test passes through, currently testing
The test mode mark answered is set to test by mark;And
Guidance unit 123 is repaired, for when test program test does not pass through, the corresponding test mode of identification number will be tested
Mark is set to default test not by mark, and performs the reparation guiding operational order of association, to guide user to electronics
Equipment is repaired.
In embodiments of the present invention, testing identification number is used for identifying test instruction or corresponding test program, for each
Whether bar test instruction is provided with corresponding test mode mark, for mark test instruction by test.When detecting
When previous test instructs corresponding test mode test to be designated by mark, then perform currently test instruction, it is current to enter
The corresponding test of test instruction.Preferably, when corresponding test program is obtained, obtain corresponding from the testing service device of connection
Test program.So, without the need for all test programs are imported on electronic equipment, as long as test program unification is stored in test
On server, test program is provided with the electronic equipment to variety classes, model, improve testing efficiency.
In embodiments of the present invention, when test program is tested not to be passed through, the corresponding test mode mark of identification number will be tested
Knowledge is set to default test not by mark, and performs the reparation guiding operational order of association, to guide user to set electronics
It is standby to be repaired.
Preferably, test is not configured according to the different types of failure of electronic equipment by mark, that is to say, that can
Different tests are pre-set by mark, with identify the test of test program in test process not by when different failure or
Failure cause, so can according to the test by identify obtain with test by identify associate, for electronic equipment
Guiding operational order is repaired, the reparation is performed and is guided operational order, to guide user to repair electronic equipment, improve electronics
The testing efficiency of equipment, improves the production efficiency of electronic equipment indirectly.Preferably, reparation guiding operational order may include corresponding
Voice message, is operated with, pointing out user to carry out next reparation after user has performed a reparation operation, and final guiding user completes
The reparation of the failure to detecting.
In embodiments of the present invention, no matter test program is test passes through or does not pass through, it is preferable that will test identification number
The testing service device of connection is sent to corresponding test mode mark and is stored, to form corresponding test log or record,
It is easy to user or tester to the tracking of testing for electrical equipment process or checks, facilitates event during Subsequent electronic equipment use
The determination of barrier.
It is therefore preferred that repair guidance unit 123 to may include to repair guiding subelement, for obtaining and default test
Operational order is not guided by identifying reparation for electronic equipment associate, perform and repair guiding operational order, to guide use
Family is repaired by electronic equipment.
Further, when detect corresponding test mode be designated it is default test not by mark when, instruction perform
Unit 12 is additionally operable to perform previous test instruction.
Further, program execution unit 121 can also include program performing subelement, for according to current test instruction
Middle test identification number, obtains corresponding test program from the testing service device of connection and performs.
Further, testing for electrical equipment device also includes test record unit, for will test identification number and corresponding
Test mode mark is sent to the testing service device of connection and stores.
In embodiments of the present invention, each unit of testing for electrical equipment device can be by corresponding hardware or software unit reality
Existing, each unit can be independent soft and hardware unit, it is also possible to be integrated into a soft and hardware unit of electronic equipment, here is not
To limit the present invention.
Presently preferred embodiments of the present invention is the foregoing is only, not to limit the present invention, all essences in the present invention
Any modification, equivalent and improvement made within god and principle etc., should be included within the scope of the present invention.
Claims (10)
1. a kind of electronic equipment method of testing, it is characterised in that methods described comprises the steps:
Storage test instruction on an electronic device is obtained successively, and the test instruction includes the test mark of test step
Number;
Perform the current test instruction read;
The step of current test for performing reading is instructed, including:
The corresponding test mode mark of test identification number of previous test instruction is detected;
When detect the corresponding test mode be designated test by mark when, according to it is described it is current test instruction described in
Test identification number obtains corresponding test program and performs;
When test program test passes through, the corresponding test mode of identification number will be tested described in the current test instruction
Mark is set to test by mark;
When the test program is tested not to be passed through, the test identification number corresponding test mode mark is set to default
Test does not pass through to identify, and performs the reparation guiding operational order of association, to guide user to repair the electronic equipment.
2. the method for claim 1, it is characterised in that the step of performing the reparation guiding operational order of association, including:
Obtain reparation for the electronic equipment do not associate by mark with the default test and guide operational order,
Perform described reparation and guide operational order, to guide user to repair the electronic equipment.
3. the method for claim 1, it is characterised in that methods described also includes:
When detect the corresponding test mode be designated it is default test not by mark when, perform it is described it is previous test refer to
Order.
4. the method for claim 1, it is characterised in that obtain according to identification number is tested described in the current test instruction
The step of taking corresponding test program and perform, including:
Identification number is tested according to described in the current test instruction, corresponding test program is obtained from the testing service device of connection
And perform.
5. method as claimed in claim 4, it is characterised in that methods described also includes:
The test identification number and the corresponding test mode mark are sent to the testing service device of the connection and are stored.
6. a kind of electronic equipment test device, it is characterised in that described device includes:
Instruction acquiring unit, for obtaining storage test instruction on an electronic device successively, the test instruction includes surveying
The test identification number of trial work sequence;
Instruction execution unit, for performing the current test instruction read;
The instruction execution unit includes:
State detection unit, detects for the corresponding test mode mark of test identification number to previous test instruction;
Program execution unit, for when detect the corresponding test mode be designated test by mark when, according to described
Identification number is tested described in current test instruction to obtain corresponding test program and perform;
Mark setting unit, for when test program test passes through, by test mark described in the current test instruction
Know a number corresponding test mode mark test is set to by mark;And
Guidance unit is repaired, for when test program test does not pass through, by the test identification number corresponding test shape
State mark is set to default test not by mark, and performs the reparation guiding operational order of association, to guide user to institute
State electronic equipment to be repaired.
7. device as claimed in claim 6, it is characterised in that the reparation guidance unit includes:
Repair guiding subelement, for obtain and it is described it is default test by mark associate, for the electronic equipment
Reparation guiding operational order, perform it is described repair guiding operational order, to guide user to repair the electronic equipment.
8. device as claimed in claim 6, it is characterised in that when detect the corresponding test mode be designated it is default
When test does not pass through mark, the instruction execution unit is additionally operable to perform the previous test instruction.
9. device as claimed in claim 6, it is characterised in that described program performance element includes:
Program performing subelement, for testing identification number according to described in the current test instruction, from the testing service of connection
Device obtains corresponding test program and performs.
10. device as claimed in claim 9, it is characterised in that described device also includes:
Test record unit, for being sent to the connection by the test identification number and the corresponding test mode mark
Testing service device is simultaneously stored.
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CN201610947514.7A CN106526367A (en) | 2016-10-26 | 2016-10-26 | Electronic equipment testing method and device |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107480532A (en) * | 2017-08-02 | 2017-12-15 | 四川长虹电器股份有限公司 | Regression testing method based on vulnerability scanning |
CN110177166A (en) * | 2019-06-10 | 2019-08-27 | 深圳市中诺通讯有限公司 | A kind of mobile phone audio test method and system |
CN111538632A (en) * | 2020-04-27 | 2020-08-14 | Oppo(重庆)智能科技有限公司 | Inspection method, inspection system, and storage medium |
CN113078961A (en) * | 2021-03-12 | 2021-07-06 | 维沃移动通信有限公司 | Detection method and detection device for electronic equipment test state |
CN116708632A (en) * | 2022-09-22 | 2023-09-05 | 荣耀终端有限公司 | Test method and electronic equipment |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1357389A2 (en) * | 2002-04-23 | 2003-10-29 | Agilent Technologies Inc. (a Delaware Corporation) | Electronic test program with run selection |
CN101738550A (en) * | 2008-11-14 | 2010-06-16 | 鸿富锦精密工业(深圳)有限公司 | Electronic device test device and test method |
CN102905034A (en) * | 2011-07-29 | 2013-01-30 | 富泰华工业(深圳)有限公司 | Electronic device testing system and electronic device testing method |
CN103475854A (en) * | 2013-07-03 | 2013-12-25 | 广东迅通科技股份有限公司 | Interactive video command system |
CN103488569A (en) * | 2013-09-30 | 2014-01-01 | 北京安兔兔科技有限公司 | Method and device for testing performance of electronic equipment |
CN104976733A (en) * | 2014-04-10 | 2015-10-14 | 珠海格力电器股份有限公司 | Method and system for processing network fault information of multi-split air conditioner |
CN104991137A (en) * | 2015-06-30 | 2015-10-21 | 小米科技有限责任公司 | Equipment testing method and device |
CN105203908A (en) * | 2015-10-12 | 2015-12-30 | 中国人民解放军国防科学技术大学 | BIST-based open-circuit test method for TSVs in 3D SRAM |
-
2016
- 2016-10-26 CN CN201610947514.7A patent/CN106526367A/en active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1357389A2 (en) * | 2002-04-23 | 2003-10-29 | Agilent Technologies Inc. (a Delaware Corporation) | Electronic test program with run selection |
CN101738550A (en) * | 2008-11-14 | 2010-06-16 | 鸿富锦精密工业(深圳)有限公司 | Electronic device test device and test method |
CN102905034A (en) * | 2011-07-29 | 2013-01-30 | 富泰华工业(深圳)有限公司 | Electronic device testing system and electronic device testing method |
CN103475854A (en) * | 2013-07-03 | 2013-12-25 | 广东迅通科技股份有限公司 | Interactive video command system |
CN103488569A (en) * | 2013-09-30 | 2014-01-01 | 北京安兔兔科技有限公司 | Method and device for testing performance of electronic equipment |
CN104976733A (en) * | 2014-04-10 | 2015-10-14 | 珠海格力电器股份有限公司 | Method and system for processing network fault information of multi-split air conditioner |
CN104991137A (en) * | 2015-06-30 | 2015-10-21 | 小米科技有限责任公司 | Equipment testing method and device |
CN105203908A (en) * | 2015-10-12 | 2015-12-30 | 中国人民解放军国防科学技术大学 | BIST-based open-circuit test method for TSVs in 3D SRAM |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107480532A (en) * | 2017-08-02 | 2017-12-15 | 四川长虹电器股份有限公司 | Regression testing method based on vulnerability scanning |
CN110177166A (en) * | 2019-06-10 | 2019-08-27 | 深圳市中诺通讯有限公司 | A kind of mobile phone audio test method and system |
CN111538632A (en) * | 2020-04-27 | 2020-08-14 | Oppo(重庆)智能科技有限公司 | Inspection method, inspection system, and storage medium |
CN111538632B (en) * | 2020-04-27 | 2023-08-08 | Oppo(重庆)智能科技有限公司 | Inspection method, inspection system, and storage medium |
CN113078961A (en) * | 2021-03-12 | 2021-07-06 | 维沃移动通信有限公司 | Detection method and detection device for electronic equipment test state |
CN116708632A (en) * | 2022-09-22 | 2023-09-05 | 荣耀终端有限公司 | Test method and electronic equipment |
CN116708632B (en) * | 2022-09-22 | 2024-04-05 | 荣耀终端有限公司 | Test method and electronic equipment |
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