CN102236729A - Method and device for testing functional coverage - Google Patents
Method and device for testing functional coverage Download PDFInfo
- Publication number
- CN102236729A CN102236729A CN201010163001XA CN201010163001A CN102236729A CN 102236729 A CN102236729 A CN 102236729A CN 201010163001X A CN201010163001X A CN 201010163001XA CN 201010163001 A CN201010163001 A CN 201010163001A CN 102236729 A CN102236729 A CN 102236729A
- Authority
- CN
- China
- Prior art keywords
- test
- capped
- test point
- identity code
- point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
- Debugging And Monitoring (AREA)
Abstract
The invention discloses a method for testing functional coverage. The method is used for realizing relatively complete functional coverage test and improving the accuracy of the functional coverage test. The method comprises the following steps of: testing test points by test vectors and storing test mark codes of the covered test points; and matching the stored test mark codes of all test points which are required to be tested with the test mark codes of the covered test points, wherein if the test mark codes of the test points which are required to be tested are matched with the test mark codes of the covered test points successfully for at least one time, the function is covered completely, and if some of the test mark codes of the test points which are required to be tested are not matched, some of the test points are not covered. The invention also discloses a device for implementing the method.
Description
Technical field
The present invention relates to electronic technology field, particularly relate to method and device that test function covers.
Background technology
Along with the widespread use of integrated circuit, function correctness and speed, power consumption, reliability etc. all there are strict demand, simultaneously, test has become the work of expense maximum in the integrated circuit (IC) design flow process.Which function the function coverage test can more effectively illustrate through test, thereby improves testing efficiency significantly, and therefore, the statistics of the function coverage condition in the test job is a very important step in the large scale integrated circuit design checking.
The test that function is covered at present has two kinds of more common methods.A kind ofly be, manually list detailed function point, each function point is a test point, write out detailed test plan according to test point, realize the test one by one of test point is covered by test vector, by the artificial coverage condition of checkout plan one by one,, then carry out the handmarking then thereafter if certain test point is covered by a certain test vector.This method mainly is to use manually-operated, operates more loaded down with trivial detailsly, and the efficient of function coverage test is lower.
Another kind method is to write out the description program that covers according to test plan, with program emulation one by one, all generate a data recording that comprises the function coverage information behind every procedure simulation, after procedure simulation is finished, can collect the data recording that all comprise coverage information.Can only count the function coverage of testing the test point of passing through, be easy to generate omission, can not accurately count coverage information.
Therefore, more than the function coverage of the test point can only statistical test passed through of two kinds of method in common, and implementation procedure is more loaded down with trivial details or be easy to generate omission, can not satisfy the requirement of test job.
Summary of the invention
The method that the embodiment of the invention provides a kind of test function to cover is used to realize more complete function coverage test, improves the accuracy of function coverage test.
The method that a kind of test function covers may further comprise the steps:
By test vector test point is tested, and store the test identity code of the test point that is capped;
The test identity code of all test points that need participate in testing of the storage test identity code with the test point that is capped is mated;
If need to participate in test test point the test identity code all with the test identity code of the test point that is capped the match is successful at least once, determine that then the function covering is complete;
If have the need that do not mated to participate in the test identity code of the test point of test, then define the test point that is not capped.
The device that a kind of test function covers comprises:
Test module is tested test point by test vector;
First memory module is used to store the test identity code of the test identity code of each test point and the test point that storage is capped;
Control module is used for the identity code of all test points that need participate in the testing test identity code with the test point that is capped is mated; If need to participate in test test point the test identity code all with the test identity code of the test point that is capped the match is successful at least once, determine that then the function covering is complete; If have the need that do not mated to participate in the test identity code of the test point of test, then define the test point that is not capped.
It is that each test point increases the test identity code that the embodiment of the invention is passed through, and stores the test identity code of all test points that need participate in testing in advance, judges whether test point is capped.Test point is if tested vector covers the test identity code of the test point that (tested being is capped) then be capped by test vector output, then the test identity code of the test point that is capped stored.The test identity code of the test point that is capped of storage and the test identity code of the test point that all need participate in testing are mated, if the test identity code of the test point that all need participate in testing all with the test identity code of the test point that is capped the match is successful at least once, determine that then function covers fully; If have the need that do not mated to participate in the test identity code of the test point of test, then define the test point that is not capped.Can count which test point thus and not be capped, thereby realize adding up comparatively accurately the function coverage condition.
Description of drawings
Fig. 1 is the primary structure figure of function coverage test device in the embodiment of the invention;
Fig. 2 is the detailed structure view of function coverage test device in the embodiment of the invention;
Fig. 3 is the main method process flow diagram of function coverage test in the embodiment of the invention;
Fig. 4 is the detailed method process flow diagram that adds the function coverage test of test mode in the embodiment of the invention;
Fig. 5 is the detailed method process flow diagram that adds the function coverage test of test mode and testing time in the embodiment of the invention.
Embodiment
It is that each test point increases the test identity code that the embodiment of the invention is passed through, and stores the test identity code of all test points that need participate in testing in advance, judges whether test point is capped.Test point is if tested vector covers (tested being is capped) then exports the test point that is capped by test vector test identity code, then the test identity code of the test point that is capped is stored, the test identity code of all the test point identity codees that need participate in testing stored and the test point that is capped is mated, if the test identity code of the test point that all need participate in testing all with the test identity code of the test point that is capped the match is successful at least once, determine that then function covers fully; If have the need that do not mated to participate in the test identity code of the test point of test, then define the test point that is not capped.Can count which test point thus and not be capped, thereby realize adding up comparatively accurately the function coverage condition.
Referring to Fig. 1, the device that present embodiment provides a kind of test function to cover, it comprises test module 101, first memory module 102 and control module 103.
The device that described test function covers also comprises second memory module 104, first update module 105 and second update module 106.Referring to shown in Figure 2.
Introduce the method that test function covers below by realization flow.
Determine by increasing the test identity code for each test point whether test point is measured in the present embodiment, referring to shown in Figure 3, the main method flow process of function coverage test is as follows:
In each test vector, test identity code, and the test identity code of all test points that need participate in testing is stored in advance for each test point increases by one.Can be form storages such as tabulation, file or database.
Step 301: by test vector test point is tested, and store the test identity code of the test point that is capped.The test identity code of the test point that is capped by the test vector output of operation is stored the test identity code of the test point that is capped then.Wherein, test vector comprises the test identity code of the test point that this test vector can cover.
The test identity code of test point can adopt and store local mode into, also can adopt the mode that outputs to other memory device and storage.
Can be when beginning test point tested, the test identity code of the test point that storage is capped; Perhaps in the process that test point is tested, store the test identity code of the test point that is capped; Perhaps the time to the end of test (EOT) of test point, the test identity code of the test point that storage is capped.
Step 302: the test identity code of the test point that all that will store need participate in testing mates with the test identity code of the test point that is capped;
Step 303: if need to participate in test test point the test identity code all with the test identity code of the test point that is capped the match is successful at least once, determine that the function covering is complete.
Can be behind the test identity code of a test point that is capped of every storage, the test identity code of all test points that need participate in testing of the storage test identity code with the test point that is capped is mated; Perhaps
Behind the test identity code of all test point that is capped of storage, the test identity code of all test points that need participate in testing of the storage test identity code with the test point that is capped is mated.Can know that by matching result which test point is not capped, thus the statistical function coverage condition.
When test function covers, need not only to know whether test point is capped, wish also to know whether the test point that is capped tests passes through, in the present embodiment by judging for each test point increase test mode whether test point is measured and whether passed through test.Test mode comprises at least: " by ", " failure " reach " detect " three kinds of states.Referring to shown in Figure 4, the specific implementation flow process is as follows:
Test identity code for each test point increases in each test vector, and test mode is set, and the test identity code of all test points that need participate in testing is stored in advance, Cun Chu test mode default setting is " test " in advance.
Step 401: by test vector test point is tested, and store the test identity code of the test point that is capped.The test identity code of the test point that is capped by the test vector output of operation is stored the test identity code of the test point that is capped then.Wherein, test vector comprises the test identity code of the test point that this test vector can cover.
The test identity code of test point can adopt and store local mode into, also can adopt the mode that outputs to other memory device and storage.
Can be when beginning test point tested, the test identity code of the test point that storage is capped; Perhaps in the process that test point is tested, store the test identity code of the test point that is capped; Perhaps the time to the end of test (EOT) of test point, the test identity code of the test point that storage is capped.
Step 402: the test identity code of the test point that all that will store need participate in testing mates with the test identity code of the test point that is capped;
Step 403: if need to participate in test test point the test identity code all with the test identity code of the test point that is capped the match is successful at least once, determine that the function covering is complete.
Can be behind the test identity code of a test point that is capped of every storage, the test identity code of all test points that need participate in testing of the storage test identity code with the test point that is capped is mated; Perhaps
Behind the test identity code of all test point that is capped of storage, the test identity code of all test points that need participate in testing of the storage test identity code with the test point that is capped is mated.
Step 405: the test mode of the test point that storage is capped, whether pass through test with labeled test point.The test mode of test point can adopt and store local mode into, also can adopt the mode that outputs to other memory device and storage.Wherein, if the result of test vector output is consistent with expected results, thinks that then test vector output result is correct, otherwise be wrong.If the test result of test vector output is correct, determine that test point passed through test, then test mode be updated to " by "; If the test result of test vector output is wrong, determine that then test point not by test, then is updated to test mode " failure ".
If when test vector moves at the beginning, store the test identity code of the test point that is capped, perhaps in the test vector operational process, store the test identity code of the test point that is capped, then above sequence of steps is constant; If the test identity code of the test point that storage is capped after the test vector end of run, then step 402, step 403 and step 404 are two relatively independent processes with respect to step 405, and execution sequence can exchange.Step 402, step 403 and step 404 three's order is constant.
By the test mode of the test point of having stored, can know which test point not by test, promptly which test point has produced mistake.
When test function covers, need not only to know whether whether test point is capped, be capped test point tests passes through, also wish to know the number of times that each test point is capped simultaneously,, help obtaining function coverage more accurately so that obtain function coverage condition more accurately.By increasing the test identity code for each test point, test mode and testing time being set, add up whether this test point is capped in emulation, whether passed through the number of times of testing and being capped in the present embodiment.Referring to shown in Figure 5, the specific implementation flow process is as follows:
In each test vector, test identity code, and test mode and testing time are set for each test point increases.Store the test identity code of all test points that need participate in testing in advance, Cun Chu test mode default setting is " not test " in advance, and Cun Chu testing time numerical value is defaulted as " 0 " in advance.
Step 501: by test vector test point is tested, and store the test identity code of the test point that is capped.The test identity code of the test point that is capped by the test vector output of operation is stored the test identity code of the test point that is capped then.Wherein, test vector comprises the test identity code of the test point that this test vector can cover.
The test identity code of test point can adopt and store local mode into, also can adopt the mode that outputs to other memory device and storage.
Can be when beginning test point tested, the test identity code of the test point that storage is capped; Perhaps in the process that test point is tested, store the test identity code of the test point that is capped; Perhaps the time to the end of test (EOT) of test point, the test identity code of the test point that storage is capped.
Step 502: the test identity code of the test point that all that will store need participate in testing mates with the test identity code of the test point that is capped;
Step 503: if need to participate in test test point the test identity code all with the test identity code of the test point that is capped the match is successful at least once, determine that the function covering is complete.
Can be behind the test identity code of a test point that is capped of every storage, the test identity code of all test points that need participate in testing of the storage test identity code with the test point that is capped is mated; Perhaps
Behind the test identity code of all test point that is capped of storage, the test identity code of all test points that need participate in testing of the storage test identity code with the test point that is capped is mated.
Step 505: by the testing time data increases " 1 " of script with test point.The testing time of test point can adopt and store local mode into, also can adopt the mode that outputs to other memory device and storage.
When needs obtain the testing time of all test points that are capped, can be when beginning test point tested, the testing time of the test point that storage is capped; Perhaps in the process that test point is tested, store the testing time of the test point that is capped; Perhaps the time to the end of test (EOT) of test point, the testing time of the test point that storage is capped.
When needs obtain all testing times of test points by test, promptly the time to the end of test (EOT) of test point, the testing time of the test point that refresh test is passed through.
Step 506: the test mode of the test point that storage is capped, whether pass through test with labeled test point.The test mode of test point can adopt and store local mode into, also can adopt the mode that outputs to other memory device and storage.Wherein, if the result of test vector output is consistent with expected results, thinks that then test vector output result is correct, otherwise be wrong.If the test result of test vector output is correct, determine that test point passed through test, then the test mode of this test point that is capped be updated to " by "; If the test result of test vector output is wrong, then determine test point not by test, then the test mode of this test point that is capped is updated to " failure ".
If when test vector moves at the beginning, store the test identity code of the test point that is capped, perhaps in the test vector operational process, store the test identity code of the test point that is capped, then step 502, step 503 and step 304 are two relatively independent processes with respect to step 505, and execution sequence can exchange.Wherein, step 502, step 503, step 504 three step are constant; If the test identity code of test point has been surveyed in storage after the test vector end of run, then step 502, step 503, step 504 three are three relatively independent processes with respect to step 505 and step 506, can carry out simultaneously, also can carry out successively, order can be exchanged simultaneously.But step 502, step 503, step 504 order are constant.
By the test mode of the test point of having stored, can know which test point not by test, promptly which test point has produced mistake.
By the testing time of the test point of having stored, can know the number of times that test point is capped.Thereby realize statistics to function coverage.
Present embodiment has multiple implementation to the statistics of function coverage, for example:
When needs obtain the function coverage of all test points that are capped, all test point numbers that are capped must have been arrived the function coverage numerical value of the test point that is capped divided by total test point number.And can on each test point, add concrete weighted value, thereby obtain the function coverage numerical value of a test point that is capped more accurately.
When needs obtain the function coverage of all test points of passing through test, all test point numbers by test must have been arrived the function coverage numerical value of testing the test point of passing through divided by total test point number.And can on each test point, add concrete weighted value, thereby obtain a function coverage numerical value of testing the test point of passing through more accurately.
The embodiment of the invention increases the test identity code for each test point, and stores the test identity code of all test points that need test in advance.Test point is if tested vector covers the test identity code of the test point that (tested being is capped) then be capped by test vector output, then the test identity code of the test point that is capped stored.The test identity code of the test point that is capped of storage and the test identity code of the test point that all need participate in testing are mated, if the test identity code of the test point that all need participate in testing all with the test identity code of the test point that is capped the match is successful at least once, determine that function covers fully; If have the need that do not mated to participate in the test identity code of the test point of test, then define the test point that is not capped.Can count which test point thus is not capped.And, when each test point is added the test identity code, also added test mode and testing time.Wherein, test mode comprise " by ", " failure ", " test " three kinds of states.Passed through test if determine test point, then the test mode of this test point be updated to " by "; Determine test point not by test, then the test mode of this test point is updated to " failure ", can count which test point thus and make mistakes.And test point whenever is capped or test by once, then by script its testing time numerical value is increased " 1 ", thus can be further obtains function coverage according to the testing time of all test points.Wherein, the function coverage of the test point that can obtain being capped according to all test points that is capped, also can obtain testing the function coverage of the test point of passing through, thereby obtain the detailed more coverage condition of function accurately according to all test points by test.
Be used to realize that the software of the embodiment of the invention can be stored in storage mediums such as floppy disk, hard disk, CD and flash memory.
Obviously, those skilled in the art can carry out various changes and modification to the present invention and not break away from the spirit and scope of the present invention.Like this, if of the present invention these are revised and modification belongs within the scope of claim of the present invention and equivalent technologies thereof, then the present invention also is intended to comprise these changes and modification interior.
Claims (13)
1. the method that test function covers is characterized in that, may further comprise the steps:
By test vector test point is tested, and store the test identity code of the test point that is capped;
The test identity code of all test points that need participate in testing of the storage test identity code with the test point that is capped is mated;
If need to participate in test test point the test identity code all with the test identity code of the test point that is capped the match is successful at least once, determine that then the function covering is complete;
If have the need that do not mated to participate in the test identity code of the test point of test, then define the test point that is not capped.
2. the method for claim 1 is characterized in that, also comprises step: before the test identity code of the test point that storage is capped, export the test identity code of the test point that is capped by test vector.
3. the method for claim 1 is characterized in that, the step of the test identity code of the test point that storage is capped comprises:
When beginning test point tested, the test identity code of the test point that storage is capped; Perhaps
In the process that test point is tested, the test identity code of the test point that storage is capped; Perhaps
To the end of test (EOT) of test point the time, the test identity code of the test point that storage is capped.
4. the method for claim 1 is characterized in that, the step that the test identity code of the test identity code of all test points that need participate in testing of storage and the test point that is capped is mated comprises:
Behind the test identity code of a test point that is capped of every storage, the test identity code of all test points that need participate in testing of the storage test identity code with the test point that is capped is mated; Perhaps
After storing the test identity code of all test points that is capped, the test identity code of all test points that need participate in testing of the storage test identity code with the test point that is capped is mated.
5. the method for claim 1 is characterized in that, also comprises step:
After test point is tested, upgrade the test mode of the test point that is capped according to test result.
6. as any described method in the claim 1 to 5, it is characterized in that, also comprise step:
By test vector test point is tested, and upgrade the testing time of the test point that is capped; And/or
Test point is tested the testing time of the test point that refresh test is passed through by test vector.
7. method as claimed in claim 6 is characterized in that, the step of upgrading the testing time of the test point that is capped comprises:
When beginning test point tested, upgrade the testing time of the test point that is capped; Perhaps
In the process that test point is tested, upgrade the testing time of the test point that is capped; Perhaps
To the end of test (EOT) of test point the time, upgrade the testing time of the test point that is capped;
The step of the testing time of the test point that refresh test is passed through comprises:
To the end of test (EOT) of test point the time, the testing time of the test point that refresh test is passed through according to test result.
8. the device that test function covers is characterized in that, comprising:
Test module is tested test point by test vector;
First memory module is used to store the test identity code of the test identity code of each test point and the test point that storage is capped;
Control module is used for the identity code of all test points that need participate in the testing test identity code with the test point that is capped is mated; If need to participate in test test point the test identity code all with the test identity code of the test point that is capped the match is successful at least once, determine that then the function covering is complete; If have the need that do not mated to participate in the test identity code of the test point of test, then define the test point that is not capped.
9. device as claimed in claim 8 is characterized in that:
First memory module was stored the test identity code of the test point that is capped before test point is tested; Perhaps in the process that test point is tested, store the test identity code of the test point that is capped; Perhaps after being tested, test point stores the test identity code of the test point that is capped.
10. device as claimed in claim 8 is characterized in that:
Control module is mated the test identity code of all test points that need participate in the testing test identity code with the test point that is capped behind the test identity code of a test point that is capped of every storage; Perhaps
Control module is mated the test identity code of all test points that need participate in the testing test identity code with the test point that is capped behind the test identity code of all test point that is capped of storage.
11. device as claimed in claim 8 is characterized in that, also comprises:
First update module is used for the test mode of the test point that is capped of storage is upgraded.
12. as any described device in the claim 8 to 11, it is characterized in that, also comprise:
Second update module is used for the testing time of the test point that is capped of storage is upgraded; And/or, the testing time of the test point passed through of test of storage is upgraded.
13. device as claimed in claim 12 is characterized in that:
Second update module is when beginning test point tested, the testing time of the test point that renewal is capped, perhaps in the process that test point is tested, the testing time of the test point that renewal is capped, perhaps to the end of test (EOT) of test point the time, upgrade the testing time of the test point that is capped; And/or, to the end of test (EOT) of test point the time, the testing time of the test point that refresh test is passed through according to test result.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010163001.XA CN102236729B (en) | 2010-04-29 | 2010-04-29 | The method of a kind of test function covering and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010163001.XA CN102236729B (en) | 2010-04-29 | 2010-04-29 | The method of a kind of test function covering and device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102236729A true CN102236729A (en) | 2011-11-09 |
| CN102236729B CN102236729B (en) | 2016-06-22 |
Family
ID=44887374
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010163001.XA Active CN102236729B (en) | 2010-04-29 | 2010-04-29 | The method of a kind of test function covering and device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102236729B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104462674A (en) * | 2014-11-25 | 2015-03-25 | 三星半导体(中国)研究开发有限公司 | Chip design verifying method |
| CN108664410A (en) * | 2018-03-27 | 2018-10-16 | 北京中电华大电子设计有限责任公司 | A kind of integrated circuit CP test Pass Flag are preserved, refresh, are read comparative approach and its circuit |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5673274A (en) * | 1990-06-26 | 1997-09-30 | Kabushiki Kaisha Toshiba | Test method for semiconductor device |
| CN1952818A (en) * | 2005-10-22 | 2007-04-25 | 康佳集团股份有限公司 | Testing method of program unit with capability of checking test result automatically |
| CN1987877A (en) * | 2006-12-22 | 2007-06-27 | 北京天碁科技有限公司 | Detecting system and method for prototype |
| CN101030163A (en) * | 2006-03-01 | 2007-09-05 | 李春芳 | Method for deciding human-machine interface testing covering rate |
| CN101464829A (en) * | 2007-12-18 | 2009-06-24 | 珠海金山软件股份有限公司 | Method and test device for confirming code coverage rate |
-
2010
- 2010-04-29 CN CN201010163001.XA patent/CN102236729B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5673274A (en) * | 1990-06-26 | 1997-09-30 | Kabushiki Kaisha Toshiba | Test method for semiconductor device |
| CN1952818A (en) * | 2005-10-22 | 2007-04-25 | 康佳集团股份有限公司 | Testing method of program unit with capability of checking test result automatically |
| CN101030163A (en) * | 2006-03-01 | 2007-09-05 | 李春芳 | Method for deciding human-machine interface testing covering rate |
| CN1987877A (en) * | 2006-12-22 | 2007-06-27 | 北京天碁科技有限公司 | Detecting system and method for prototype |
| CN101464829A (en) * | 2007-12-18 | 2009-06-24 | 珠海金山软件股份有限公司 | Method and test device for confirming code coverage rate |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104462674A (en) * | 2014-11-25 | 2015-03-25 | 三星半导体(中国)研究开发有限公司 | Chip design verifying method |
| CN104462674B (en) * | 2014-11-25 | 2017-05-31 | 三星半导体(中国)研究开发有限公司 | The method of proofing chip design |
| CN108664410A (en) * | 2018-03-27 | 2018-10-16 | 北京中电华大电子设计有限责任公司 | A kind of integrated circuit CP test Pass Flag are preserved, refresh, are read comparative approach and its circuit |
| CN108664410B (en) * | 2018-03-27 | 2022-03-22 | 北京中电华大电子设计有限责任公司 | Method and circuit for storing, refreshing and reading comparison of integrated circuit CP test Pass Flag |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102236729B (en) | 2016-06-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102117660B (en) | For testing the tester of data storage device | |
| CN105425201B (en) | metering chip simulation test method for software reliability detection of intelligent electric energy meter | |
| US10007492B2 (en) | System and method for automatically generating device drivers for run time environments | |
| CN110502374A (en) | The traffic capture debugging tool of the basic reason of equipment fault when identification is tested automatically | |
| CN101377749B (en) | Method, programmable logic device, system and apparatus for checking memory data | |
| CN101210952A (en) | Multi-test point semiconductor test machine station automated setting method | |
| CN103678067A (en) | Test method and device for intelligent card power failure and tested device | |
| CN117421217B (en) | Automatic software function test method, system, terminal and medium | |
| CN102479123A (en) | System and method for testing chip operating system (COS) | |
| CN110321292A (en) | Chip detecting method, device, electronic equipment and computer readable storage medium | |
| CN104765671A (en) | Method for verifying uart module by using reusable hierarchical verification platform | |
| CN102592679A (en) | Flash memory chip and testing method thereof | |
| CN109445691A (en) | A kind of method and device improving FTL algorithm development and verification efficiency | |
| CN110134598B (en) | Batch processing method, device and system | |
| CN107357721B (en) | Method and device for testing system | |
| CN115292165A (en) | Test method and device, electronic device and storage medium | |
| CN116126700A (en) | Chip verification method and system based on SystemC | |
| CN107832176A (en) | Hard disk pressure automatic test approach and system under a kind of Windows | |
| CN101017496A (en) | Method and apparatus for automatically formatting data based on a best match test result type | |
| CN102236729A (en) | Method and device for testing functional coverage | |
| CN103294837B (en) | A kind of verifying and debugging method and system of integrated circuit | |
| CN113127331A (en) | Fault injection-based test method and device and computer equipment | |
| CN102279795A (en) | Test method and test device | |
| US6434503B1 (en) | Automated creation of specific test programs from complex test programs | |
| CN105447251B (en) | A kind of verification method based on transaction types excitation |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Address after: 214028 national integrated circuit design (21-1), Changjiang Road, New District, Jiangsu, Wuxi, China, China (610) Applicant after: WUXI ZHONGGAN MICROELECTRONIC CO., LTD. Address before: 214028 national integrated circuit design (21-1), Changjiang Road, New District, Jiangsu, Wuxi, China, China (610) Applicant before: Wuxi Vimicro Co., Ltd. |
|
| COR | Change of bibliographic data | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |