CN103678067A - Test method and device for intelligent card power failure and tested device - Google Patents
Test method and device for intelligent card power failure and tested device Download PDFInfo
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Abstract
The invention discloses a test method for an intelligent card power failure. The test method is applied to a test device. The method includes the steps that after a TCK test case is installed on a tested device, an instruction of starting a power failure mode is sent to the tested device; a test script starts to run; after a test command is sent each time, status words and test data returned by the tested device after the test command is executed are received, and if the received status words are status words expressing the power failure, the test script starts to run again; if the received status words and the test data meet an expectation, whether a next test command exist or not is judged, if yes, the next test command continues to be sent, and if not, running of the test script is finished and an instruction of shutting the power failure mode is sent to the tested device. The problems that according to a traditional power failure test, a special test device is needed, a special power failure test case needs to be compiled, so that test cost is high, test efficiency is low, and the test strength is weak are solved. The invention further discloses the test device, tested device and a test system.
Description
Technical field
The present invention relates to technical field of intelligent card, in particular a kind of smart card power down method of testing, testing apparatus, equipment under test and power down test macro.
Background technology
The power down test of smart card; i.e. anti-plug test; while its objective is in the chip operating system (Chip Operating System, COS) that detects smart card and terminal (as POS machine) reciprocal process unexpected power down to the protection of data integrity and the ability of rollback automatically.For example, in a credit transaction, any moment power down of smart card before return state, should be able to arrive the state before transaction by data rewind after card powers on again.The data that smart card writes must guarantee its atomicity, and so-called atomicity just refers to a sequence of operation, and these operations are entirely done or all do not done, and are an indivisible work unit (also can be called affairs).To guarantee that in data writing process, appearance can be carried out rollback to data extremely, once write successfully, to the modification of data, should be permanent simultaneously.
Special testing apparatus (power down tester) is used in traditional power down test, and power down test case and script for testing apparatus write specialized are tested test card (smart card), during test, power down tester carried out power down and re-powers test card according to the default time interval, the state of validation test card, if normal, power down tester continues interval certain hour and carries out power down, so circulation, until complete the power down test of the operation flow of whole application.
Existing power down measuring technology needs high-precision power down testing tool, more (time interval is less for high precision, precision is higher) power down tester, cost is just higher, and, owing to needing the test case of write specialized, carry out power down test, so coverage rate inadequate (test dynamics is weak) to COS test, and test process complexity is loaded down with trivial details, in addition, utilize power down tester to test the spent test duration long, such as, test a transaction that 50ms completes, utilizing power down tester to carry out power down test according to the precision of 0.01ms needs aptitude test in several hours to complete.
Therefore there is the shortcoming that cost is high, efficiency is low, test dynamics is weak in existing power down method of testing.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of smart card power down method of testing, testing apparatus, equipment under test and power down test macro, solves the problem that testing cost is high, efficiency is low, test dynamics is weak that conventional power down test needs the power down test case of special testing apparatus and write specialized to cause.
In order to solve the problems of the technologies described above, the invention provides a kind of power down method of testing of smart card, the method is applied to testing apparatus, comprising:
After compatibility test instrument TCK test case is installed on equipment under test, to equipment under test, send the instruction of opening power-down mode;
Test script brings into operation; After test command of every transmission, receive equipment under test and carrying out status word and the test data of returning after this test command, as the status word receiving is for representing the status word of power down, restarts to move this test script; As the status word receiving and test data meet expection, judge whether to exist next test command, be to continue to send next test command, otherwise finish the operation of described test script, to equipment under test, send the instruction of closing power-down mode;
Wherein, described test script comprises one or more test command.
Further, the method also comprises following feature:
As the status word receiving and test data do not meet expection, end the operation of this test script, to equipment under test, send the instruction of closing power-down mode, and preserve the status word that receives and test data for follow-up error analysis.
Further, the method also comprises following feature:
Described test command is Application Protocol Data Unit APDU order.
In order to solve the problems of the technologies described above, the present invention also provides a kind of power down method of testing of smart card, and the method is applied to equipment under test, the chip operating system COS of dry run smart card on described equipment under test, and the test case that compatibility test instrument TCK has been installed, comprising:
The instruction of the unlatching power-down mode that testing apparatus sends as received, enters power-down mode, initialization write operation counter and power down location variable; Wherein, described write operation counter automatically to memory write each time operation to carry out number of times cumulative;
Under power-down mode, often receive after a test command, judge whether to need memory write, if needed, memory write, judge whether the current count value of described write operation counter and the value of described power down location variable equate, as equated to return to testing apparatus the status word that represents power down, the value of described power down location variable is increased to a power down step-length, simulate COS power down and re-power, at the inferior test command of accepting waiting of power-down mode; If do not needed, carry out this test command, to testing apparatus return state word and test data, at the inferior test command of accepting waiting of power-down mode.
Further, the method also comprises following feature:
In the inferior process of accepting a test command waiting of power-down mode, also judge whether to receive the instruction of closing power-down mode that testing apparatus sends, be to close power-down mode.
Further, the method also comprises following feature:
Described storer is the scratch pad memory on smart card.
Further, the method also comprises following feature:
Described smart card is Java card.
In order to solve the problems of the technologies described above, the present invention also provides a kind of power down method of testing of smart card, comprising:
Testing apparatus adopts method as above to carry out power down test to equipment under test;
Equipment under test adopts the power down test of method acceptance test equipment as above.
In order to solve the problems of the technologies described above, the present invention also provides a kind of testing apparatus, comprising:
Power down test opening module, after being installed on equipment under test in compatibility test instrument TCK test case, sends the instruction of opening power-down mode to equipment under test;
Order sends and processing module, for the test script that brings into operation; After test command of every transmission, receive equipment under test and carrying out status word and the test data of returning after this test command, as the status word receiving is for representing the status word of power down, restarts to move this test script; As the status word receiving and test data meet expection, judge whether to exist next test command, be to continue to send next test command, otherwise finish the operation of described test script, to equipment under test, send the instruction of closing power-down mode; Wherein, described test script comprises one or more test command.
Further, this testing apparatus also comprises following feature:
Described order transmission and processing module, also for not meeting expection as the status word and the test data that receive, end the operation of this test script, to equipment under test, send the instruction close power-down mode, and preserve the status word that receives and test data for follow-up error analysis.
In order to solve the problems of the technologies described above, the present invention also provides a kind of equipment under test, the chip operating system COS of dry run smart card on described equipment under test, and the test case that compatibility test instrument TCK has been installed, and this equipment under test comprises:
Power down test opening module, for as received the instruction of the unlatching power-down mode of testing apparatus transmission, enters power-down mode, initialization write operation counter and power down location variable; Wherein, described write operation counter automatically to memory write each time operation to carry out number of times cumulative;
Order receives and processing module, for often receiving under power-down mode after a test command, judge whether to need memory write, if needed, memory write, judges whether the current count value of described write operation counter and the value of described power down location variable equate, as equated to return to testing apparatus the status word that represents power down, the value of described power down location variable is increased to a power down step-length, simulate COS power down and re-power, at the inferior test command of accepting waiting of power-down mode; If do not needed, carry out this test command, to testing apparatus return state word and test data, at the inferior test command of accepting waiting of power-down mode.
Further, this equipment under test also comprises following feature:
Described order reception and processing module, in the inferior process of accepting a test command waiting of power-down mode, also judge whether to receive the instruction of closing power-down mode that testing apparatus sends, and is to close power-down mode.
Further, this equipment under test also comprises following feature:
Described smart card is Java card.
In order to solve the problems of the technologies described above, the present invention also provides a kind of power down test macro of smart card, comprising: above-mentioned testing apparatus and above-mentioned equipment under test.
Compared with prior art, a kind of smart card power down method of testing provided by the invention, testing apparatus, equipment under test and power down test macro, chip operating system COS at the upper dry run smart card of equipment under test (simulator), and the test case that TCK is installed, by testing apparatus, to equipment under test, sending instruction unlatching power down tests, equipment under test is counted the number of times of memory write operation, at interval of certain write operation number of times, simulate a power down and re-power, and return to power-down state word to testing apparatus, testing apparatus receives power-down state word, rerun this test script, otherwise check whether status word and test data that equipment under test returns meet expection, then process, the testing cost that the power down test case that can solve conventional power down test needs special testing apparatus and write specialized causes is high, efficiency is low, the problem that test dynamics is weak.
Accompanying drawing explanation
Fig. 1 is the process flow diagram of a kind of smart card power down method of testing (testing apparatus) of the embodiment of the present invention.
Fig. 2 is the process flow diagram of a kind of smart card power down method of testing (equipment under test) of the embodiment of the present invention.
Fig. 3 is the detail flowchart that the testing apparatus of the embodiment of the present invention is carried out power down test.
Fig. 4 is the detail flowchart that the equipment under test (simulator) of the embodiment of the present invention carries out power down test.
Fig. 5 is the structural representation of the testing apparatus of the embodiment of the present invention.
Fig. 6 is the structural representation of the equipment under test of the embodiment of the present invention.
Fig. 7 is the structural representation of a kind of smart card power down test macro of the embodiment of the present invention.
Embodiment
For making the object, technical solutions and advantages of the present invention clearer, hereinafter in connection with accompanying drawing, embodiments of the invention are elaborated.It should be noted that, in the situation that not conflicting, the embodiment in the application and the feature in embodiment be combination in any mutually.
Java standard is open standard, TCK(Technology Compatibility Kit, compatibility test instrument) be a set of kit being formed by one group of test pack and corresponding testing tool, for guaranteeing that one is used the realization of Java technology can observe its applicable Java platform standard completely, and meet corresponding with reference to realizing.
Java Card technology is the technology that the runtime environment of the same optimization of subset of Java programming language is combined.This optimization is the special embedded device for little memory space, for example smart card.The target of Java Card technology is to allow those resource-constrained equipment such as smart card benefit from the software of Java language exploitation.Java card technical manual comprises three parts: 1, Java Card Virtual Machine standard: this normalized definition Java language subset and be applicable to the virtual machine of smart card.2, Java Card Runtime Environment standard: this standard has further defined the runtime environment of the smart card based on Java.3, Java Card API standard: this normalized definition be the customized core frame of application program of intelligent card and various bag and class.
Java Card TCK is a set of kit being comprised of one group of test pack and corresponding automatic test software, for guaranteeing that one is used the realization of Java Card technology can observe its corresponding Java Card platform standard completely.A series of test cases for Java Card test are provided in the test pack of Java Card TCK.
The invention provides a kind of power down method of testing based on Java Card TCK, chip operating system COS at the upper dry run smart card of equipment under test (simulator), and the test case that TCK is installed, by testing apparatus, to equipment under test, sending instruction unlatching power down tests, equipment under test is counted the number of times of memory write operation, at interval of certain write operation number of times, simulate a power down and re-power, and return to power-down state word to testing apparatus, testing apparatus receives power-down state word, rerun this test script, otherwise check whether status word and test data that equipment under test returns meet expection, then process.Test case of the present invention is based on TCK, nearly cover the test of Java Card all functions, so test dynamics is strong, and, by software control power down, without special power down tester, therefore reduced testing cost.
As shown in Figure 1, the embodiment of the present invention provides a kind of power down method of testing of smart card, and the method is applied to testing apparatus, comprising:
S10, after compatibility test instrument TCK test case is installed on equipment under test, sends the instruction of opening power-down mode to equipment under test;
S20, test script brings into operation; After test command of every transmission, receive equipment under test and carrying out status word and the test data of returning after this test command, as the status word receiving is for representing the status word of power down, restarts to move this test script; As the status word receiving and test data meet expection, judge whether to exist next test command, be to continue to send next test command, otherwise finish the operation of described test script, to equipment under test, send the instruction of closing power-down mode; Wherein, described test script comprises one or more test command.
The method can also comprise following feature:
Preferably, before step S10, also comprise: between testing apparatus and equipment under test, set up socket and be connected.
Preferably, test command is Application Protocol Data Unit (Application Protocol Data Unit, APDU) order;
Preferably, in step S20, also comprise: as the status word receiving and test data do not meet expection, ends the operation of this test script, to equipment under test, send the instruction close power-down mode, and preserve the status word that receives and test data for follow-up error analysis.
Preferably, represent that the status word of power down is specific status word, such as 0xFFFF.
As shown in Figure 2, the embodiment of the present invention provides a kind of power down method of testing of smart card, and the method is applied to equipment under test, the chip operating system COS of dry run smart card on described equipment under test, and the test case that compatibility test instrument TCK has been installed, comprising:
S10, the instruction of the unlatching power-down mode that testing apparatus sends as received, enters power-down mode, initialization write operation counter and power down location variable; Wherein, described write operation counter automatically to memory write each time operation to carry out number of times cumulative;
S20, under power-down mode, often receive after a test command, judge whether to need memory write, if needed, memory write, judges whether the current count value of described write operation counter and the value of described power down location variable equate, as equated to return to testing apparatus the status word that represents power down, the value of described power down location variable is increased to a power down step-length, simulate COS power down and re-power, at the inferior test command of accepting waiting of power-down mode; If do not needed, carry out this test command, to testing apparatus return state word and test data, at the inferior test command of accepting waiting of power-down mode;
The method can also comprise following feature:
Preferably, in the inferior process of accepting a test command waiting of power-down mode, also judging whether to receive the instruction of closing power-down mode that testing apparatus sends, is to close power-down mode.
Preferably, described smart card is Java card;
Preferably, between described testing apparatus and equipment under test, setting up socket is connected.
Preferably, described test command is Application Protocol Data Unit APDU order;
Preferably, represent that the status word of power down is specific status word, such as 0xFFFF.
Wherein, described storer be scratch pad memory on smart card (such as, EEPROM).
Preferably, in order to improve the precision of power down test, it is minimum value that described power down step-length can be set, such as 1.
Simulator carries out power down in simulation memory write when operation, and to adopt write operation number of times be that power down is carried out at interval, utilizes the scheme of time interval power down to compare that testing efficiency is higher, measuring accuracy is higher with conventional power down testing scheme.If what power down step-length was arranged is less, power down test is more accurate.
As shown in Figure 3, testing apparatus is PC (operation compatibility test instrument TCK), equipment under test is simulator (analog platform of the chip operating system COS of dry run smart card), and after TCK test case is installed on described simulator, the flow process that testing apparatus is carried out power down test comprises:
Step S101, sends the instruction of opening power-down mode to simulator;
Step S102, test script brings into operation;
Step S103, sends a test command to simulator;
Step S104, receives simulator and is carrying out status word and the test data of returning after this test command;
Step S105, judges whether status word is power-down state word, is to restart to move this test script, also, returns to step S102; Otherwise execution step S106;
Step S106, judges whether status word and test data meet expection, is to perform step S107, otherwise execution step S109;
Whether step S107, there is next test command, is to simulator, to send next test command, also returns to step S103, otherwise execution step S108;
Step S108, finishes the operation of described test script, sends the instruction of closing power-down mode to simulator;
Step S109, ends the operation of this test script, send the instruction of closing power-down mode, and preservation returns results (status word receiving and test data are for follow-up error analysis) to simulator.
As shown in Figure 4, the chip operating system COS of the upper dry run smart card of equipment under test (simulator), and the test case that compatibility test instrument TCK has been installed, the treatment scheme that simulator carries out power down test comprises:
Step S201, the instruction of the unlatching power-down mode that testing apparatus sends as received, performs step S202;
Step S202, enters power-down mode, initialization write operation counter and power down location variable;
Wherein, described write operation counter automatically to memory write each time operation to carry out number of times cumulative;
Step S203, receives a test command;
Step S204, judges whether to need memory write, is to perform step S205, otherwise execution step S208;
Step S205, memory write;
Step S206, judges that whether the current count value of described write operation counter and the value of described power down location variable equate, are to perform step S207, otherwise forward step S209 to;
Step S207, returns to the status word that represents power down to testing apparatus, the value of described power down location variable is increased to a power down step-length, simulates COS power down and re-powers, and forwards step S209 to;
Step S208, carries out this test command, to testing apparatus return state word and test data;
Step S209, judges whether to receive the instruction of closing power-down mode that testing apparatus sends, and is to perform step S210, otherwise returns to step S203;
Step S210, closes power-down mode.
As shown in Figure 5, the embodiment of the present invention provides a kind of testing apparatus, comprising:
Power down test opening module, after being installed on equipment under test in compatibility test instrument TCK test case, sends the instruction of opening power-down mode to equipment under test;
Order sends and processing module, for the test script that brings into operation; After test command of every transmission, receive equipment under test and carrying out status word and the test data of returning after this test command, as the status word receiving is for representing the status word of power down, restarts to move this test script; As the status word receiving and test data meet expection, judge whether to exist next test command, be to continue to send next test command, otherwise finish the operation of described test script, to equipment under test, send the instruction of closing power-down mode; Wherein, described test script comprises one or more test command.
This testing apparatus can also comprise following feature:
Preferably, described order transmission and processing module, also, for not meeting expection as the status word and the test data that receive, end the operation of this test script, to equipment under test, send the instruction close power-down mode, and preserve the status word that receives and test data for follow-up error analysis.
Preferably, described test command is Application Protocol Data Unit APDU order;
Described equipment under test is the analog platform of simulated intelligence card internal operating system COS; Wherein, described smart card is Java card.
As shown in Figure 6, the embodiment of the present invention provides a kind of equipment under test, the chip operating system COS of dry run smart card on described equipment under test, and the test case that compatibility test instrument TCK has been installed, and this equipment under test comprises:
Power down test opening module, for as received the instruction of the unlatching power-down mode of testing apparatus transmission, enters power-down mode, initialization write operation counter and power down location variable; Wherein, described write operation counter automatically to memory write each time operation to carry out number of times cumulative;
Order receives and processing module, for often receiving under power-down mode after a test command, judge whether to need memory write, if needed, memory write, judges whether the current count value of described write operation counter and the value of described power down location variable equate, as equated to return to testing apparatus the status word that represents power down, the value of described power down location variable is increased to a power down step-length, simulate COS power down and re-power, at the inferior test command of accepting waiting of power-down mode; If do not needed, carry out this test command, to testing apparatus return state word and test data, at the inferior test command of accepting waiting of power-down mode.
Described equipment under test can also comprise following feature:
Preferably, described order reception and processing module, in the inferior process of accepting a test command waiting of power-down mode, also judge whether to receive the instruction of closing power-down mode that testing apparatus sends, and is to close power-down mode.
Preferably, described test command is Application Protocol Data Unit APDU order.
Preferably, described storer is the scratch pad memory on smart card.
Preferably, described smart card is Java card.
As shown in Figure 7, the embodiment of the present invention provides a kind of smart card power down test macro, comprises above-mentioned testing apparatus and equipment under test.
A kind of smart card power down method of testing that above-described embodiment provides, testing apparatus, equipment under test and power down test macro, the chip operating system COS of dry run smart card on equipment under test, and the test case that TCK is installed, by testing apparatus, to equipment under test, sending instruction unlatching power down tests, equipment under test is counted the number of times of memory write operation, at interval of certain write operation number of times, simulate a power down and re-power, and return to power-down state word to testing apparatus, testing apparatus receives power-down state word, rerun this test script, otherwise check whether status word and test data that equipment under test returns meet expection, then process.The present invention can solve the problem that testing cost is high, efficiency is low, flow process is complicated that conventional power down test needs the power down test case of special testing apparatus and write specialized to cause.
One of ordinary skill in the art will appreciate that all or part of step in said method can come instruction related hardware to complete by program, described program can be stored in computer-readable recording medium, as ROM (read-only memory), disk or CD etc.Alternatively, all or part of step of above-described embodiment also can realize with one or more integrated circuit, and correspondingly, each the module/unit in above-described embodiment can adopt the form of hardware to realize, and also can adopt the form of software function module to realize.The present invention is not restricted to the combination of the hardware and software of any particular form.
It should be noted that; the present invention also can have other various embodiments; in the situation that not deviating from spirit of the present invention and essence thereof; those of ordinary skill in the art can make according to the present invention various corresponding changes and distortion, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.
Claims (14)
1. a power down method of testing for smart card, the method is applied to testing apparatus, comprising:
After compatibility test instrument TCK test case is installed on equipment under test, to equipment under test, send the instruction of opening power-down mode;
Test script brings into operation; After test command of every transmission, receive equipment under test and carrying out status word and the test data of returning after this test command, as the status word receiving is for representing the status word of power down, restarts to move this test script; As the status word receiving and test data meet expection, judge whether to exist next test command, be to continue to send next test command, otherwise finish the operation of described test script, to equipment under test, send the instruction of closing power-down mode;
Wherein, described test script comprises one or more test command.
2. the method for claim 1, is characterized in that:
As the status word receiving and test data do not meet expection, end the operation of this test script, to equipment under test, send the instruction of closing power-down mode, and preserve the status word that receives and test data for follow-up error analysis.
3. the method for claim 1, is characterized in that:
Described test command is Application Protocol Data Unit APDU order.
4. a power down method of testing for smart card, the method is applied to equipment under test, and the chip operating system COS of dry run smart card on described equipment under test, and the test case that compatibility test instrument TCK has been installed, comprising:
The instruction of the unlatching power-down mode that testing apparatus sends as received, enters power-down mode, initialization write operation counter and power down location variable; Wherein, described write operation counter automatically to memory write each time operation to carry out number of times cumulative;
Under power-down mode, often receive after a test command, judge whether to need memory write, if needed, memory write, judge whether the current count value of described write operation counter and the value of described power down location variable equate, as equated to return to testing apparatus the status word that represents power down, the value of described power down location variable is increased to a power down step-length, simulate COS power down and re-power, at the inferior test command of accepting waiting of power-down mode; If do not needed, carry out this test command, to testing apparatus return state word and test data, at the inferior test command of accepting waiting of power-down mode.
5. method as claimed in claim 4, is characterized in that:
In the inferior process of accepting a test command waiting of power-down mode, also judge whether to receive the instruction of closing power-down mode that testing apparatus sends, be to close power-down mode.
6. method as claimed in claim 4, is characterized in that:
Described storer is the scratch pad memory on smart card.
7. the method as described in any one in claim 4-6, is characterized in that:
Described smart card is Java card.
8. a power down method of testing for smart card, comprising:
Testing apparatus adopts the method as described in any one in claim 1-3 to carry out power down test to equipment under test;
Equipment under test adopts the power down test of the method acceptance test equipment as described in any one in claim 4-7.
9. a testing apparatus, comprising:
Power down test opening module, after being installed on equipment under test in compatibility test instrument TCK test case, sends the instruction of opening power-down mode to equipment under test;
Order sends and processing module, for the test script that brings into operation; After test command of every transmission, receive equipment under test and carrying out status word and the test data of returning after this test command, as the status word receiving is for representing the status word of power down, restarts to move this test script; As the status word receiving and test data meet expection, judge whether to exist next test command, be to continue to send next test command, otherwise finish the operation of described test script, to equipment under test, send the instruction of closing power-down mode; Wherein, described test script comprises one or more test command.
10. testing apparatus as claimed in claim 9, is characterized in that:
Described order transmission and processing module, also for not meeting expection as the status word and the test data that receive, end the operation of this test script, to equipment under test, send the instruction close power-down mode, and preserve the status word that receives and test data for follow-up error analysis.
11. 1 kinds of equipment under tests, the chip operating system COS of dry run smart card on described equipment under test, and the test case that compatibility test instrument TCK has been installed, this equipment under test comprises:
Power down test opening module, for as received the instruction of the unlatching power-down mode of testing apparatus transmission, enters power-down mode, initialization write operation counter and power down location variable; Wherein, described write operation counter automatically to memory write each time operation to carry out number of times cumulative;
Order receives and processing module, for often receiving under power-down mode after a test command, judge whether to need memory write, if needed, memory write, judges whether the current count value of described write operation counter and the value of described power down location variable equate, as equated to return to testing apparatus the status word that represents power down, the value of described power down location variable is increased to a power down step-length, simulate COS power down and re-power, at the inferior test command of accepting waiting of power-down mode; If do not needed, carry out this test command, to testing apparatus return state word and test data, at the inferior test command of accepting waiting of power-down mode.
12. equipment under tests as claimed in claim 11, is characterized in that:
Described order reception and processing module, in the inferior process of accepting a test command waiting of power-down mode, also judge whether to receive the instruction of closing power-down mode that testing apparatus sends, and is to close power-down mode.
13. methods as described in claim 11 or 12, is characterized in that:
Described smart card is Java card.
The power down test macro of 14. 1 kinds of smart cards, comprising:
Testing apparatus as described in any one in claim 9-10;
Equipment under test as described in any one in claim 11-13.
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| CN106339308A (en) * | 2015-07-10 | 2017-01-18 | 北京中电华大电子设计有限责任公司 | Test method of Java Card transaction mechanism |
| CN106610862A (en) * | 2015-10-21 | 2017-05-03 | 上海华虹集成电路有限责任公司 | Simulator supporting EEPROM power failure test |
| CN106708680A (en) * | 2016-12-15 | 2017-05-24 | 北京海泰方圆科技股份有限公司 | Power-off test system, method and apparatus |
| CN107797930A (en) * | 2017-10-27 | 2018-03-13 | 东信和平科技股份有限公司 | Method, system, device and the readable storage medium storing program for executing of testing smart card function |
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| CN109522230A (en) * | 2018-11-16 | 2019-03-26 | 郑州云海信息技术有限公司 | A kind of method and apparatus for automatic test course |
| CN110767259A (en) * | 2019-10-31 | 2020-02-07 | 江苏华存电子科技有限公司 | Power failure pressure test method for flash memory device |
| CN111488249A (en) * | 2020-04-17 | 2020-08-04 | 苏州浪潮智能科技有限公司 | Method and device for testing influence of GPU card dropping recovery on training task |
| CN111651309A (en) * | 2020-05-08 | 2020-09-11 | 星汉智能科技股份有限公司 | Reliability test method and system for computer system |
| CN111769905A (en) * | 2020-06-29 | 2020-10-13 | 上海通联金融服务有限公司 | Method for preventing IC card offline PIN from being cracked through time sequence attack method |
| CN112416669A (en) * | 2020-10-28 | 2021-02-26 | 北京智芯微电子科技有限公司 | Power failure test method and device for security chip |
| CN113010404A (en) * | 2019-12-20 | 2021-06-22 | 北京紫光青藤微系统有限公司 | Finished product testing method of high-capacity smart card |
| CN115098360A (en) * | 2022-06-01 | 2022-09-23 | 深圳康佳电子科技有限公司 | Method, system, task manager and storage medium for dynamically allocating tasks |
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| CN106021088A (en) * | 2015-07-10 | 2016-10-12 | 北京中电华大电子设计有限责任公司 | Method and device for atomicity test on JAVA card |
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| CN106610862B (en) * | 2015-10-21 | 2020-06-02 | 上海华虹集成电路有限责任公司 | Emulator supporting EEPROM power-down test |
| CN106708680A (en) * | 2016-12-15 | 2017-05-24 | 北京海泰方圆科技股份有限公司 | Power-off test system, method and apparatus |
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| CN107797930B (en) * | 2017-10-27 | 2021-04-23 | 东信和平科技股份有限公司 | Method, system, device and readable storage medium for testing functions of smart card |
| CN107797930A (en) * | 2017-10-27 | 2018-03-13 | 东信和平科技股份有限公司 | Method, system, device and the readable storage medium storing program for executing of testing smart card function |
| CN109522230A (en) * | 2018-11-16 | 2019-03-26 | 郑州云海信息技术有限公司 | A kind of method and apparatus for automatic test course |
| CN110767259A (en) * | 2019-10-31 | 2020-02-07 | 江苏华存电子科技有限公司 | Power failure pressure test method for flash memory device |
| CN113010404A (en) * | 2019-12-20 | 2021-06-22 | 北京紫光青藤微系统有限公司 | Finished product testing method of high-capacity smart card |
| CN111488249A (en) * | 2020-04-17 | 2020-08-04 | 苏州浪潮智能科技有限公司 | Method and device for testing influence of GPU card dropping recovery on training task |
| CN111488249B (en) * | 2020-04-17 | 2023-01-10 | 苏州浪潮智能科技有限公司 | Method and device for testing influence of GPU card dropping recovery on training task |
| CN111651309A (en) * | 2020-05-08 | 2020-09-11 | 星汉智能科技股份有限公司 | Reliability test method and system for computer system |
| CN111769905A (en) * | 2020-06-29 | 2020-10-13 | 上海通联金融服务有限公司 | Method for preventing IC card offline PIN from being cracked through time sequence attack method |
| CN112416669A (en) * | 2020-10-28 | 2021-02-26 | 北京智芯微电子科技有限公司 | Power failure test method and device for security chip |
| CN112416669B (en) * | 2020-10-28 | 2023-07-14 | 北京智芯微电子科技有限公司 | Power-down test method and device for security chip |
| CN115098360A (en) * | 2022-06-01 | 2022-09-23 | 深圳康佳电子科技有限公司 | Method, system, task manager and storage medium for dynamically allocating tasks |
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