CN106513337A - Detection device of chip resistors - Google Patents
Detection device of chip resistors Download PDFInfo
- Publication number
- CN106513337A CN106513337A CN201610983240.7A CN201610983240A CN106513337A CN 106513337 A CN106513337 A CN 106513337A CN 201610983240 A CN201610983240 A CN 201610983240A CN 106513337 A CN106513337 A CN 106513337A
- Authority
- CN
- China
- Prior art keywords
- chip
- testing equipment
- camera
- motor
- feeding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
- B07C5/3422—Sorting according to other particular properties according to optical properties, e.g. colour using video scanning devices, e.g. TV-cameras
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
Abstract
The invention discloses a detection device of chip resistors. The detection device comprises a drive device, a feeding device, a detecting device, a laser cutting device and a discharging device. The drive device comprises a motor. The motor is connected with a first drive plate, and a gripper is arranged on the first drive plate. The feeding device comprises two feeding grooves side by side. The detecting device comprises a camera and a computer host connected with the camera. The discharging device comprises a qualified object groove and a reject groove. The detection device can automatically detect unqualified chip resistors on panels and automatically remove unqualified panels and carries out laser cutting on the unqualified chip resistors on the panels. The detection device has the beneficial effects of being high in efficiency and saves production cost.
Description
Technical field
The present invention relates to mechanical field, and in particular to a kind of Chip-R testing equipment.
Background technology
The Chip-R being arranged on panel easily causes damage because of small volume, but the Chip-R for damaging be difficult by
It was found that and searching.The testing equipment of the Chip-R of prior art is typically only capable to detect large-area on inferior panel or panel
The inferior situation of Chip-R, defect, diffusion, plug net, skew, mixed piece, part, unfilled corner to Chip-R etc. can not be comprehensive
Detect and need manually to be picked, such defect ware enters lower step operation can affect the quality of product, and manual detection efficiency
Not high and accuracy is difficult to hold, and easily causes the waste of material.
The content of the invention
The present invention provides a kind of testing equipment of Chip-R, to solve the above problems.
The embodiment of the present invention provides a kind of testing equipment of Chip-R, including driving means, feeding device, detection dress
Put, laser cutting device and drawing mechanism, the driving means include a motor, be connected with the motor the first driving plate and
Second driving plate, is provided with handgrip in second driving plate, the feeding device includes two feeding grooves side by side, the inspection
The host computer that device is included a camera and is connected with camera is surveyed, the drawing mechanism includes success slot and inferior groove.
Preferably, the testing equipment of the Chip-R includes the display being connected with the host computer.
Preferably, feeding trench bottom is provided with a drive cylinder.
Preferably, sucker is provided with the handgrip.
Preferably, a baffle plate is connected with the motor.
Preferably, the through hole passed through for the machine shaft is offered in first driving plate, the machine shaft is worn
Cross the through hole and be connected with a gib block, offer a gathering sill in first driving plate, on the gib block, offer one
Chute, the gathering sill and the chute are attached by same slide block.
Preferably, the pixel of the camera is 25,000,000～40,000,000.
Further, the pixel of the camera is 29,000,000.
Preferably, the testing equipment of the Chip-R also includes a frame.
Preferably, a transparent window is provided with the frame.
The present invention has advantages below compared with prior art：
1st, the feeding device of the testing equipment of Chip-R of the invention is two feeding grooves side by side, the feeding trench bottom
Drive cylinder is provided with, described two feeding grooves can be used alternatingly, can so realize continual job demand.
2nd, the detection means of the testing equipment of Chip-R of the invention includes a host computer, stores up in the host computer
There is the standard control picture of Chip-R, when, in the incoming host computer of picture that camera will shoot, main frame can be by incoming figure
Piece is contrasted with standard control picture, whether intact so as to judge Chip-R.
Description of the drawings
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
Accompanying drawing to be used needed for having technology description is briefly described, it should be apparent that, drawings in the following description are only this
Some embodiments of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can be with
Other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is the axonometric chart of the testing equipment of the Chip-R of the embodiment of the present invention；
Fig. 2 is the internal structure schematic diagram of the testing equipment of the Chip-R of the embodiment of the present invention；
Fig. 3 is the structural representation of the driving means of the testing equipment of this Chip-R；
Fig. 4 is the connection diagram of the motor of the driving means of the testing equipment of this Chip-R.
Reference：
1st, driving means；
11st, motor；
12nd, the first driving plate；
121st, gathering sill；
13rd, the second driving plate；
131st, handgrip；
1311st, sucker；
14th, baffle plate；
15th, gib block；
151st, chute；
16th, slide block；
2nd, feeding device；
21st, feeding groove；
22nd, drive cylinder；
3rd, detection means；
31st, camera；
4th, laser cutting device；
5th, drawing mechanism；
51st, success slot；
52nd, inferior groove；
6th, frame；
61st, transparent window；
7th, display.
Specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation is described, it is clear that described embodiment is only a part of embodiment of the invention, rather than the embodiment of whole.It is based on
Embodiment in the present invention, it is all other that those of ordinary skill in the art are obtained under the premise of creative work is not made
Embodiment, belongs to the scope of protection of the invention.
Embodiment：
As shown in Figures 1 to 4, the testing equipment of Chip-R of the invention, including driving means 1, feeding device 2, inspection
Device 3, laser cutting device 4 and drawing mechanism 5 is surveyed, the driving means 1 include a motor 11, are connected with the motor 11
First driving plate 12 and the second driving plate 13, are provided with handgrip 131 in second driving plate 13, the feeding device 2 includes
Two feeding grooves 21 side by side, the host computer that the detection means 3 is included a camera 31 and is connected with the camera 31 are described
Drawing mechanism 5 includes success slot 51 and inferior groove 52.The testing equipment of the Chip-R includes being connected with the host computer
Display 7.21 bottom of the feeding groove is provided with a drive cylinder 22.Sucker 1311 is provided with the handgrip 131.It is described
A baffle plate 14 is connected with motor 11.The through hole passed through for 11 rotating shaft of the motor, institute is offered in first driving plate 12
State 11 rotating shaft of motor and a gib block 15 be connected with through the through hole, offer a gathering sill 121 in first driving plate 12,
A chute 151 is offered on the gib block 15, and the gathering sill 121 and the chute 151 are attached by same slide block 16.
The pixel of the camera 31 is 25,000,000～40,000,000.The pixel of the camera 31 is 29,000,000.The detection of the Chip-R
Equipment also includes a frame 6.A transparent window is provided with the frame 6.
To detect cutting again to discharging whole to drive Chip-R panel to complete to expect from above for the driving means 1
Individual operation.The driving means 1 include a motor 11, and the rotating shaft of the motor 11 is fixed through the through hole of the first driving plate 12 and connected
A gib block 15 is connected to, a chute 151 in the middle part of the gib block 15, is offered, a slide block 16, institute in the chute 151, is provided with
State slide block 16 to slide in the chute 151, the guiding being adapted to the slide block 16 is provided with first driving plate 12
Groove 121, the slide block 16 are moved in the gathering sill 121, and are limited (as shown in Figure 4) by the gathering sill 121.Work as electricity
When machine 11 works, the rotating shaft of the motor 11 rotarily drives the gib block 15 and moves, and the gib block 15 drives the slide block
16 move, and the motion of the slide block 16 is subject to the gathering sill 121 being arranged in the first driving plate 12 and is arranged on gib block
The restriction of the chute 151 in 15.
The slide block 16 is attached with the second driving plate 13, and the slide block 16 is moved so as to drive the second driving plate 13
Raw motion, is provided with handgrip 131 in second driving plate 13, it is preferable that the number of the handgrip 131 is four, described to grab
Sucker 1311 is provided with handss 131, it is preferable that be provided with four suckers 1311, the handgrip 131 on a handgrip 131
For capturing Chip-R panel.
As shown in Fig. 2 when the testing equipment of this Chip-R works, placing in two feeding grooves 21 of feeding device 2
There is Chip-R panel, now the handgrip 131 in driving means 1 is moved to top one piece of Chip-R face of crawl of feeding groove 21
Plate, is then moved on the detection station of detection means 3, and Chip-R panel is placed on detection station, now by phase
Machine 31 is taken pictures to the Chip-R panel, and photo is sent in host computer, and completes to paster in host computer
The whether intact judgement of resistance, and Chip-R panel is divided into into good plate, waste product plate and plate is repaired, and by good plate by grabbing
Handss 131 deliver to success slot 51, and waste product plate delivers to inferior groove 52 by handgrip 131, will repair plate and are transferred to laser by handgrip 131
On the station of cutter sweep 4, and underproof Chip-R is cut off from Chip-R panel by way of laser
Fall, then the Chip-R panel after excision is transferred in success slot 51 by handgrip 131.
A kind of testing equipment of the Chip-R for being provided to the embodiment of the present invention above is described in detail, herein
Apply specific case to be set forth principle of the invention and embodiment, the explanation of above example is only intended to help
Understand the core concept of the present invention；Simultaneously for one of ordinary skill in the art, according to the thought and method of the present invention,
Will change in specific embodiment and range of application, in sum, this specification content is should not be construed as to this
Bright restriction.
Claims (10)
1. a kind of testing equipment of Chip-R, cuts including the driving means, feeding device, detection means, laser being mutually adapted
Cut device and drawing mechanism, it is characterised in that：The driving means include a motor, are connected with the first driving plate on the motor
With the second driving plate, handgrip in second driving plate, is provided with, the feeding device includes two feeding grooves side by side, described
The host computer that detection means is included a camera and is connected with the camera, the drawing mechanism include success slot and inferior groove.
2. the testing equipment of Chip-R according to claim 1, it is characterised in that：The testing equipment of the Chip-R
Including the display being connected with the host computer.
3. the testing equipment of Chip-R according to claim 1, it is characterised in that：The feeding trench bottom is provided with one
Drive cylinder.
4. the testing equipment of Chip-R according to claim 1, it is characterised in that：Sucker is provided with the handgrip.
5. the testing equipment of Chip-R according to claim 1, it is characterised in that：A gear is connected with the motor
Plate.
6. the testing equipment of Chip-R according to claim 1, it is characterised in that：Offer in first driving plate
For the through hole that the machine shaft is passed through, the machine shaft is connected with a gib block through the through hole, and described first drives
A gathering sill is offered on plate, a chute is offered on the gib block, and the gathering sill and the chute are entered by same slide block
Row connection.
7. the testing equipment of Chip-R according to claim 7, it is characterised in that：The pixel of the camera is 25,000,000
～4,000 ten thousand.
8. the testing equipment of Chip-R according to claim 7, it is characterised in that：The pixel of the camera is 2900
Ten thousand.
9. the testing equipment of Chip-R according to claim 1, it is characterised in that：The testing equipment of the Chip-R
Also include a frame.
10. the testing equipment of Chip-R according to claim 9, it is characterised in that：One is provided with the frame saturating
Bright window.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610983240.7A CN106513337B (en) | 2016-11-08 | 2016-11-08 | A kind of detection device of Chip-R |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610983240.7A CN106513337B (en) | 2016-11-08 | 2016-11-08 | A kind of detection device of Chip-R |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106513337A true CN106513337A (en) | 2017-03-22 |
| CN106513337B CN106513337B (en) | 2019-03-26 |
Family
ID=58350548
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610983240.7A Active CN106513337B (en) | 2016-11-08 | 2016-11-08 | A kind of detection device of Chip-R |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106513337B (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0933609A (en) * | 1995-07-24 | 1997-02-07 | Seiwa Sangyo Kk | Automatic sorting apparatus for chip-shaped electronic component |
| CN202119399U (en) * | 2011-06-23 | 2012-01-18 | 杭州古思科技有限公司 | Device for detecting position of SMD resistor on substrate |
| CN104259109A (en) * | 2014-07-28 | 2015-01-07 | 中国电子科技集团公司第四十八研究所 | Stepping silicon wafer quality sorting system |
| CN105070672A (en) * | 2015-08-06 | 2015-11-18 | 杭州灏元自动化设备有限公司 | Equipment and method for detecting and processing bad particles in chip resistor |
| CN105293060A (en) * | 2015-10-16 | 2016-02-03 | 吴道华 | Stable and efficient clamping moving picking device |
| CN105738747A (en) * | 2016-02-06 | 2016-07-06 | 深圳市杰普特光电股份有限公司 | Chip resistor detection method, system and device |
-
2016
- 2016-11-08 CN CN201610983240.7A patent/CN106513337B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0933609A (en) * | 1995-07-24 | 1997-02-07 | Seiwa Sangyo Kk | Automatic sorting apparatus for chip-shaped electronic component |
| CN202119399U (en) * | 2011-06-23 | 2012-01-18 | 杭州古思科技有限公司 | Device for detecting position of SMD resistor on substrate |
| CN104259109A (en) * | 2014-07-28 | 2015-01-07 | 中国电子科技集团公司第四十八研究所 | Stepping silicon wafer quality sorting system |
| CN105070672A (en) * | 2015-08-06 | 2015-11-18 | 杭州灏元自动化设备有限公司 | Equipment and method for detecting and processing bad particles in chip resistor |
| CN105293060A (en) * | 2015-10-16 | 2016-02-03 | 吴道华 | Stable and efficient clamping moving picking device |
| CN105738747A (en) * | 2016-02-06 | 2016-07-06 | 深圳市杰普特光电股份有限公司 | Chip resistor detection method, system and device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106513337B (en) | 2019-03-26 |
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