CN106500879A - 微功耗皮秒级时差信号捕捉与测量控制系统及方法 - Google Patents
微功耗皮秒级时差信号捕捉与测量控制系统及方法 Download PDFInfo
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- CN106500879A CN106500879A CN201611097501.1A CN201611097501A CN106500879A CN 106500879 A CN106500879 A CN 106500879A CN 201611097501 A CN201611097501 A CN 201611097501A CN 106500879 A CN106500879 A CN 106500879A
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- 238000005259 measurement Methods 0.000 title claims abstract description 34
- 238000000034 method Methods 0.000 title claims abstract description 17
- 238000012360 testing method Methods 0.000 claims abstract description 163
- 238000001514 detection method Methods 0.000 claims abstract description 21
- 238000002604 ultrasonography Methods 0.000 claims description 18
- 238000004891 communication Methods 0.000 claims description 10
- 230000005540 biological transmission Effects 0.000 claims description 4
- 238000010248 power generation Methods 0.000 claims description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 210000001367 artery Anatomy 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 235000013399 edible fruits Nutrition 0.000 description 2
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- 102100023882 Endoribonuclease ZC3H12A Human genes 0.000 description 1
- 101710112715 Endoribonuclease ZC3H12A Proteins 0.000 description 1
- 108700012364 REG1 Proteins 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012812 general test Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- QGVYYLZOAMMKAH-UHFFFAOYSA-N pegnivacogin Chemical compound COCCOC(=O)NCCCCC(NC(=O)OCCOC)C(=O)NCCCCCCOP(=O)(O)O QGVYYLZOAMMKAH-UHFFFAOYSA-N 0.000 description 1
- 238000007634 remodeling Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K19/00—Testing or calibrating calorimeters
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- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
Description
功能码编号 | 测试机的功能码 | 测试内容 | MCU负责测试 | 测试机负责测试 |
1 | 000 | 利用REG1进行通讯测试 | √ | |
2 | 001 | 高速脉冲Fire1和Fire2测试 | √ | |
3 | 010 | 范围1测试 | √ | |
4 | 011 | 范围2测试 | √ | |
5 | 100 | 温度测试(PT2=PT3=1K) | √ | |
6 | 101 | 静态功耗 | √ | |
7 | 110 | 4MHZ高速振荡器的功耗 | √ | |
8 | 111 | 未用 |
Claims (9)
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CN201611097501.1A CN106500879A (zh) | 2016-12-02 | 2016-12-02 | 微功耗皮秒级时差信号捕捉与测量控制系统及方法 |
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CN201611097501.1A CN106500879A (zh) | 2016-12-02 | 2016-12-02 | 微功耗皮秒级时差信号捕捉与测量控制系统及方法 |
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CN106500879A true CN106500879A (zh) | 2017-03-15 |
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Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1574268A (zh) * | 2003-05-30 | 2005-02-02 | 夏普株式会社 | 器件测试设备和测试方法 |
CN101435853A (zh) * | 2007-11-16 | 2009-05-20 | 普诚科技股份有限公司 | 测试系统 |
CN102183726A (zh) * | 2011-03-16 | 2011-09-14 | 建荣集成电路科技(珠海)有限公司 | 一种基于fpga的集成电路芯片测试系统与方法 |
CN102944831A (zh) * | 2012-11-22 | 2013-02-27 | 复旦大学 | 自动化测试中扩展输入输出通道的方法 |
CN103760486A (zh) * | 2013-12-26 | 2014-04-30 | 联合汽车电子有限公司 | 电路板上特殊芯片的功能测试装置 |
CN105717439A (zh) * | 2016-02-24 | 2016-06-29 | 上海东软载波微电子有限公司 | 芯片测试方法及系统 |
CN105911451A (zh) * | 2016-04-05 | 2016-08-31 | 硅谷数模半导体(北京)有限公司 | 芯片测试方法及装置 |
CN206192548U (zh) * | 2016-12-02 | 2017-05-24 | 深圳市华宇半导体有限公司 | 微功耗皮秒级时差信号捕捉与测量控制系统 |
-
2016
- 2016-12-02 CN CN201611097501.1A patent/CN106500879A/zh active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1574268A (zh) * | 2003-05-30 | 2005-02-02 | 夏普株式会社 | 器件测试设备和测试方法 |
CN101435853A (zh) * | 2007-11-16 | 2009-05-20 | 普诚科技股份有限公司 | 测试系统 |
CN102183726A (zh) * | 2011-03-16 | 2011-09-14 | 建荣集成电路科技(珠海)有限公司 | 一种基于fpga的集成电路芯片测试系统与方法 |
CN102944831A (zh) * | 2012-11-22 | 2013-02-27 | 复旦大学 | 自动化测试中扩展输入输出通道的方法 |
CN103760486A (zh) * | 2013-12-26 | 2014-04-30 | 联合汽车电子有限公司 | 电路板上特殊芯片的功能测试装置 |
CN105717439A (zh) * | 2016-02-24 | 2016-06-29 | 上海东软载波微电子有限公司 | 芯片测试方法及系统 |
CN105911451A (zh) * | 2016-04-05 | 2016-08-31 | 硅谷数模半导体(北京)有限公司 | 芯片测试方法及装置 |
CN206192548U (zh) * | 2016-12-02 | 2017-05-24 | 深圳市华宇半导体有限公司 | 微功耗皮秒级时差信号捕捉与测量控制系统 |
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Address after: 318000 415 (trusteeship No. 0155), entrepreneurial Service Center building, south side of development avenue, Taizhou Development Zone, Zhejiang Province Applicant after: Taizhou Huawei Electronic Co.,Ltd. Address before: 518104 Xixiang, Baoan District, the streets of the streets of the town of Huang Yang Yang Industrial Zone, one of the first phase of the, 3, 4, 5, and the building of the fourth (Building 3 floor, the second floor), 7, Applicant before: SHENZHEN HUAYU SEMICONDUCTOR Co.,Ltd. |
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Effective date of registration: 20200426 Address after: 518000 Guangdong Province Baoan District Hangcheng Street Huangtian Community Huangtian Yangbei Industrial Zone Phase I 4 201, 301, 402 Applicant after: Shenzhen Hualiyu Electronic Technology Co.,Ltd. Address before: 318000 415 (trusteeship No. 0155), entrepreneurial Service Center building, south side of development avenue, Taizhou Development Zone, Zhejiang Province Applicant before: Taizhou Huawei Electronic Co.,Ltd. |
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Application publication date: 20170315 |