CN106442411A - Graphene surface wave based high-sensitivity ultrafast refractive index detecting device and method - Google Patents
Graphene surface wave based high-sensitivity ultrafast refractive index detecting device and method Download PDFInfo
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
Abstract
The invention discloses a refractive index detecting device and a refractive index detecting method. By utilizing an ultimate principle that the optical absorption sensitiveness, on a surface wave, of a graphene layer relies on a medium refractive index, and through adopting a sound wave generating device capable of quickly changing the refractive index of a to-be-detected medium, thus, the high-sensitivity ultrafast measurement on the refractive index of the to-be-detected medium is realized; the response time of measuring the refractive index by utilizing the device and the method which are provided by the invention can be as short as 1ns; the sensitivity and the detection limit are up to 1*10<6>mV/RIU and 5*10<-6>RIU.
Description
Technical field
The present invention relates to detecting the fields such as related physics, chemistry, biomedicine to refractive index and in particular to light refraction
Rate field of detecting, more specifically, is a kind of apparatus and method detecting refractive index based on graphenic surface ripple.
Background technology
Refractive index is the basic optical parameter of material, for refractive index carry out detection in physics, chemistry, biomedicine etc.
Numerous areas have a wide range of applications.Traditional refractive index measurement method is based primarily upon the law of refraction and principle of optical interference, such as：
Abbe's imagery refractive index measurement method, Michelson interference refractive index measurement method etc..Traditional refractive index measurement method is sensitive
Degree is not high, and response time is very long, although can improve the spirit of refractometry to a certain extent using optical interference method
Sensitivity, but response time is still longer（From second to minute）.
In order to improve sensitivity and the response time of measurement refractive index further, occur in that some new refractive indexs are surveyed in the recent period
Amount method, such as：Based on Graphene total internal reflection structured refractive rate measuring method, by refractive index is measured using monitoring light intensity,
Disclose one kind in application ZL201210696836.4 before the present inventor and be based on Graphene interior reaction structure entirely
Detecting refractive index method and apparatus, by using the difference of reflectance when s polarization and p-polarization total internal reflection, two kinds of polarizations of measurement
The difference of light reflection carrys out variable concentrations solution on the real time measure base material（NaCl）Refractive index, its method relatively before has
Effect improves response speed and detectivity it is achieved that the real-time monitoring of detected materials refractive index, but on the one hand, due to this
In method, the change of refractive index depends on the change of solution concentration to be measured, and the change reflection of solution concentration is to the change of refractive index
There is still a need for the regular hour, limit the response speed of its refractive index（Several milliseconds）；On the other hand, this device is using total reflection
Structure and circularly polarized light are incident, strongly limit the detection limit of its refractive index（10-4RIU）, this refraction index test method and dress
Put and still do not enable, the small-signal transient soundings such as unimolecule kinetics, minimum gas thermodynamics field dynamic to ultrafast smooth sea
Application.Accordingly, it would be desirable to a kind of method that can realize high sensitivity and the measurement of fast refractive rate simultaneously, it is capable of reflecting
Rate detect move in ultrafast smooth sea, the application in the small-signal transient soundings such as unimolecule kinetics, minimum gas thermodynamics field.
The present inventor finds through research, and under reflection coupling structure, a part of component of incident field can edge
Graphenic surface propagate formed surface wave, i.e. graphenic surface ripple, this surface wave under particular graphite alkene thickness condition even
Some tens of pm can be propagated remote, and fully act on Graphene and its top dielectric.Due to the absorption to surface wave for the graphene layer
Very sensitive, the trickle change of refractive index all will lead to Graphene to absorb quick response and change for surface wave, therefore, if
Can provide a kind of based on graphenic surface ripple principle and the quick method and apparatus changing measured medium refractive index can be detected,
The method and device can make the refractive index of measured medium in moment, small change occur, so that Graphene is to surface wave
Absorption changes, and then leads to intensity of reflected light that respective change occurs, and thus just can realize measuring targets refractive index
High sensitivity and quick measurement.
Content of the invention
It is an object of the invention to proposing a kind of refractive index detection device based on graphenic surface ripple and its detection method,
Using the sensitive ultimate principle relying on medium refraction index of optical absorption to surface wave for the graphene layer, by making the folding of measured medium
Rate of penetrating there is small change in moment, using intensity of reflected light monitoring means it is achieved that medium refraction index highly sensitive
Degree and ultrafast detection.
It is an object of the present invention to propose a kind of ultrafast refractive index of high sensitivity based on graphenic surface ripple detecting
Device.This device includes：
Probe source device, provides light beam to form surface wave to be absorbed by Graphene, described light beam is s polarized light or comprises s
The light of polarized component；
Based on Graphene refractive index probe, receiving light beam with Graphene formed detection window, by Graphene to surface
The Change of absorption of ripple is to reflect the variations in refractive index of testing sample, and the reflected light with refractive index information is reflected further；
Information carrying beam extraction element, receives the reflected light with refractive index information, therefrom extracts s polarized light component light further
Bundle；
Photodetector, receives s polarized light component light beam, and the light intensity value receiving is converted to magnitude of voltage；
Acquisition chip and computer, the magnitude of voltage of collection photodetector output, processed by computer calculating, by voltage signal
It is converted into corresponding refractive index value to show；
Wherein, described refractive index probe is followed successively by couple prism, transparent substrates from bottom to top, is bound to the Graphene of substrate surface
Film, the surface of described graphene film is further provided with sample cell, is further provided with making testing sample roll in sample cell
Penetrate the sound wave generating device that rate occurs quickly faint change, the testing sample in sample cell and graphene film directly contact.
The present invention is provided with sound wave generating device in the sample cell of testing medium, when sound wave generating device produces sound wave
When, sound wave is propagated to form sound pressure in measured medium, and it is quickly faint that this pressure makes the refractive index of measured medium occur
Change, the quickly faint change propagation of this refractive index to graphene membrane surface makes graphene film that the absorption of surface wave is occurred
Quickly faint change, and then lead to intensity of reflected light that respective change occurs, the reflected light carrying refractive index information is through information
Light beam extraction element extracts s polarized light component, and the s polarized component light beam carrying information completely is received by photodetector, light
The light intensity value receiving is converted to magnitude of voltage and is input in acquisition chip by electric explorer, is processed by computer calculating, takes
Voltage signal with refractive index information is converted into corresponding refractive index value and shows.
Preferably, the light beam that described probe source device provides is linear polarization, circular polarization or elliptical polarization, the wavelength of light source
For single wavelength, multi-wavelength or broad band wavelength.
Preferably, described sound wave generating device is sonic generator or speaker.
Preferably, described graphene film pass through chemical gaseous phase depositing process, mechanical stripping method, molecular beam epitaxy or
Oxide-reduction method obtains.
Preferably, described couple prism is D-shaped prism, Dove prism or Tp.
Preferably, the testing sample in described sample cell is solid, liquid, gas, plasma, biomolecule, biology
Tissue or biological cell.
Preferably, described probe source device further includes laser instrument, collimator, polaroid and 1/2 wave plate.
Preferably, described information light beam extraction element further includes beam attenuator and polarization extraction element, described inclined
The extraction element that shakes be polaroid, polarization splitting prism or polarization extractor.
Preferably, lens can be set further with focus on light beam between probe source device and refractive index probe.
Preferably, the thickness of described graphene film is 0.34nm-100 nm.
Further object is that providing a kind of ultrafast refractive index of high sensitivity based on graphenic surface ripple to visit
Survey method, the method includes：
（1）It is combined with interpolation sample in the substrate of graphene film to surface, so that sample is contacted with graphene film；
（2）Light beam is applied on graphene film, described light beam is s polarized light or the light comprising s polarized component；
（3）There is small change in moment in the refractive index making sample by applying sound wave, make graphene film to surface wave
Absorption respective change, and by being extracted information carrying beam is fed back to the Change of absorption of surface wave with the reflected light of couple prism
Device；
（4）After polarization extraction, opto-electronic conversion, electrical signal collection and calculating are processed, record the refractive index of sample.
Preferably, described testing sample is solid, liquid, gas, plasma, biomolecule, biological tissue or life
Thing cell.
Preferably, the thickness of described graphene film is 0.34nm-100nm.
Preferably, the response time of the method is -100 milliseconds of 1 nanosecond.
Preferably, the sensitivity of the method and detection limit are respectively 1 × 106MV/RIU and 5 × 10-6RIU
Beneficial effects of the present invention：
1）The present invention passes through to apply sound wave in testing sample, and sound wave is propagated to form sound pressure in measured medium, this pressure
Power makes the refractive index of measured medium that quickly faint change occurs, with respect to passing through concentration in testing sample in prior art
Change, in the way of so that refractive index is changed, can complete changing of sample refractive index in moment by the way of sound wave controlled
Become, the response time of its refractive index is only -100 milliseconds of 1 nanosecond, substantially reduces response time.
2）The present invention passes through to control the applying intensity of sound wave, and the refractive index of sample can be made to become in more small scope
Change, rely on effect in conjunction with the sensitive refractive index that graphenic surface ripple absorbs, can feed back refractive index by absorbing the change of ripple
Minor variations, this patent medium sensitivity and detection limit are respectively 1 × 106MV/RIU and 5 × 10-6RIU, is much better than other bases
Intensity type refraction index detector in surface plasma body technique and Graphene technology.
3）The present invention preparation the refraction index detector based on graphenic surface ripple, detected by prism-coupled it is only necessary to
S polarized light component is comprised, the lens that it need not be extra converge light source in light source, anti-without being incited somebody to action using light splitting device
Penetrate light light splitting for s polarization and p-polarization, in device, all structures are fixed, and light path is more simple.
4）The refraction index detector based on graphenic surface ripple of present invention preparation, refractive index probe can be straight with testing sample
Contact, refraction materials to be measured are unrestricted, go for multiple states of matters（Solid, liquid, gas and plasma state）And complexity
The ultrafast detection of high sensitivity of refractive index environment.
5）The refraction index detector based on graphenic surface ripple of present invention preparation, directly controls measurement using computer,
Simple to operate, easy miniaturization integrated array realizes small size, multichannel refractive index detects.
Brief description
Fig. 1 is the schematic diagram of one embodiment of the invention；
Fig. 2 is that the ultrafast faint sound wave of one embodiment of the invention causes the refractive index of water variations in refractive index gained and voltage at any time
Between result of variations curve；
Fig. 3 causes air refraction change institute for the sound wave that sends through speaker of actually measured people of one embodiment of the invention
The refractive index result curve over time obtaining.
Specific embodiment
With reference to the accompanying drawings and examples the present invention is described in detail.Embodiment gives detailed embodiment
With specific operating process, but the present invention is not limited to following examples.
Embodiment 1
As shown in figure 1, the device of the present embodiment includes：Probe source device 1, lens L, refractive index probe 2, reflecting mirror M, information
Light beam extraction element 3, photodetector 4, acquisition chip and computer 5；Wherein, probe source device 1 includes laser instrument（Wavelength
633nm）11st, collimator 12, polaroid 13 and 1/2 wave plate 14；Refractive index probe 2 includes D-shaped quartz couple prism 21, piezoid
22nd, thermal reduction graphene film 23, tank 24, sonic generator 25；Information carrying beam extraction element 3 includes beam attenuator 31 and partially
Shake piece 32.
The step of the present embodiment includes：
1）Using thermal reduction method, graphene film 23 is attached in quartz plate substrate 22, piezoid 22 passes through index-matching oil
It is pasted onto on the reflecting surface of D-shaped quartz couple prism 21；
2）On graphene film 23, tank 24 is installed, the probe of sonic generator 25 is placed in tank；
3）Probe source device 1 sends s polarized light, focuses on the D-shaped quartz couple prism inciding refractive index probe 2 through lens L
21 reflectings surface, light beam is irradiated to formation detection window on graphene film 23 by D-shaped quartz couple prism 21, piezoid 22, takes
Reflected light with refractive index information is received by photodetector 4 after information carrying beam extraction element 3；
4）When sonic generator 25 produces sound wave, sound wave can form sound pressure in water transmission, and this pressure makes the folding of water
There is quickly faint change in rate of penetrating, the quickly faint change propagation of this refractive index makes graphene film to graphene film 23 surface
There is quickly faint change in absorbing of 23 pairs of surface waves, intensity of reflected light occurs respective change simultaneously, carries water refractive index letter
The reflected light of breath extracts s polarized light component through information carrying beam extraction element, carries the s polarization point of water refractive index information completely
Amount light beam is received by photodetector 4；
5）The light intensity value receiving is converted to magnitude of voltage and is input in acquisition chip by photodetector, at computer 5
Reason, the voltage signal carrying water refractive index information is converted into corresponding refractive index value and shows.
In the present embodiment, laser instrument 11 is He-Ne laser instrument.Tested through theoretical simulation and selection different-thickness
Test, show that the optimum thickness range of graphene film is 0.34nm-100nm.Tank material is lucite, bottom surface thereon
Break into through hole, be pasted onto the upper surface of graphene film 23 by glue.
Fig. 2 is that actually measured ultrafast faint sound wave causes the change in time of the refractive index and voltage of water variations in refractive index gained
Change result, Fig. 2 shows 4 × 10-5The refractive index variable quantity of RIU can be detected, and signal to noise ratio is about 8, can calculate detection limit
For 5 × 10-6RIU, sensitivity is 1 × 106Show in mV/RIU, Fig. 2 that pulsed sound causes the cycle of water variations in refractive index only about
For 8 nanoseconds, this ultrafast response process can accurately be detected.
Embodiment 2
The device of the present embodiment includes：Probe source device 1, refractive index probe 2, reflecting mirror M, information carrying beam extraction element 3, light
Electric explorer 4, acquisition chip and computer 5；Wherein, probe source device 1 includes laser instrument 11, collimator 12, polaroid 13
With 1/2 wave plate 14；Refractive index probe 2 includes D-shaped glass couple prism 21, substrate of glass 22, chemical vapor deposition graphene film
23rd, air groove 24, speaker 25；Information carrying beam extraction element 3 includes beam attenuator 31 and polarization splitting prism 32.
The step of the present embodiment includes：
1）Graphene film 23 prepared by chemical gaseous phase depositing process is transferred in substrate of glass 22, and substrate of glass 22 passes through refraction
Rate coupling oil is pasted onto on the reflecting surface of D-shaped glass couple prism 21；
2）Airtight air groove 24 is installed on graphene film 23, speaker 25 is placed in airtight air groove；
3）Probe source device 1 sends elliptically polarized light, and the D-shaped quartz couple prism 21 being directly incident on refractive index probe 2 is anti-
Penetrate face, light beam passes through D-shaped glass couple prism 21, substrate of glass 22 is irradiated to formation detection window on graphene film 23, carries
The reflected light of refractive index information is received by photodetector 4 after information carrying beam extraction element 3；
4）When people produces sound wave by speaker 25, sound wave is propagated in atmosphere and can be formed sound pressure, and this pressure makes to have leisure
There is quickly faint change in the refractive index of gas, the quickly faint change propagation of this refractive index makes stone to graphene film 23 surface
There is quickly faint change to absorbing of surface wave in black alkene film 23, intensity of reflected light occurs respective change simultaneously, carries and waits sky
The reflected light of gas refractive index information extracts s polarized light component through information carrying beam extraction element, carries air refraction completely
The s polarized component light beam of information is received by photodetector 4；
5）The light intensity value receiving is converted to magnitude of voltage and is input in acquisition chip by photodetector, at computer
Reason, the voltage signal carrying air refraction information is converted into corresponding refractive index value and shows.
In the present embodiment, laser instrument 11 is 532nm semiconductor laser.Enter through theoretical simulation and selection different-thickness
Row experiment test, show that the optimum thickness range of graphene film is 0.34nm-100nm.Air groove material is lucite, leads to
Cross the upper surface that glue is pasted onto graphene film 23, speaker seal is placed in one.
Fig. 3 be the sound wave that actually measured people sends through speaker cause air refraction change gained refractive index at any time
Between result of variations curve, Fig. 3 show several microns response signals can be very good to be detected by this graphenic surface wave detector,
This detector can respond the faint variations in refractive index signal of -100 milliseconds of 1 nanosecond.
Claims (15)
1. the ultrafast refractive index detection device of a kind of high sensitivity based on graphenic surface ripple, including：
Probe source device（1）, provide light beam to form surface wave to be absorbed by Graphene, described light beam is s polarized light or bag
Light containing s polarized component；
Refractive index probe based on Graphene（2）, receiving light beam with Graphene formed detection window, by Graphene to table
The Change of absorption of face ripple, and will be anti-further for the reflected light with refractive index information to reflect the variations in refractive index of testing sample
Penetrate；
Information carrying beam extraction element（3）, receive the reflected light with refractive index information, therefrom extract s polarized light further and divide
Amount light beam；
Photodetector（4）, receive s polarized light component light beam, and the light intensity value receiving be converted to magnitude of voltage；
Acquisition chip and computer (5), gather photodetector（4）The magnitude of voltage of output, is processed by computer calculating, by electricity
Pressure signal is converted into corresponding refractive index value and shows；
Wherein, described refractive index probe（2）It is followed successively by couple prism from bottom to top（21）, transparent substrates（22）, be bound to substrate
（22）The graphene film on surface（23）, described graphene film（23）Surface be further provided with sample cell, sample cell（24）Interior
It is further provided with the sound wave generating device that can make testing sample refractive index that quickly faint change occurs（25）, in sample cell
Testing sample and graphene film directly contact.
2. device according to claim 1 it is characterised in that：Probe source device（1）The light beam providing is linear polarization, circle
Polarization or elliptical polarization, the wavelength of light source is single wavelength, multi-wavelength or broad band wavelength.
3. device according to claim 1 it is characterised in that：Described sound wave generating device（25）For sonic generator or
Speaker.
4. device according to claim 1 it is characterised in that：Described graphene film（23）By chemical vapor deposition side
Method, mechanical stripping method, molecular beam epitaxy or oxide-reduction method obtain.
5. device according to claim 1 it is characterised in that：Described couple prism is D-shaped prism, Dove prism or three
Angular prism.
6. device according to claim 1 it is characterised in that：Described sample cell（24）In testing sample be solid, liquid
Body, gas, plasma, biomolecule, biological tissue or biological cell.
7. device according to claim 1 it is characterised in that：Described probe source device（1）Further include laser instrument
（11）, collimator（12）, polaroid（13）With 1/2 wave plate（14）.
8. device according to claim 1 it is characterised in that：Described information light beam extraction element（3）Further include light
Beam attenuation device（31）With polarization extraction element（32）, described polarization extraction element（32）For polaroid, polarization splitting prism or inclined
Shake extractor.
9. device according to claim 1 it is characterised in that：In probe source device（1）With refractive index probe（2）Between
Setting lens are with focus on light beam further.
10. device according to claim 1 it is characterised in that：Described graphene film（23）Thickness be 0.34 nm-
100nm.
A kind of ultrafast refractive index detection method of 11. high sensitivity based on graphenic surface ripple, the method includes：
（1）It is combined with interpolation testing sample in the substrate of graphene film to surface, so that sample is contacted with graphene film；
（2）Light beam is applied on graphene film, described light beam is s polarized light or the light comprising s polarized component；
（3）There is small change in moment in the refractive index making testing sample by applying sound wave, make graphene film to surface wave
Absorption respective change, and by the change of surface wave being fed back to information carrying beam extraction element with the reflected light of couple prism；
（4）After polarization extraction, opto-electronic conversion, electrical signal collection and calculating are processed, record the refractive index of testing sample.
12. methods according to claim 11 it is characterised in that：Described testing sample be solid, liquid, gas, etc.
Gas ions, biomolecule, biological tissue or biological cell.
13. methods according to claim 11 it is characterised in that：The thickness of described graphene film is 0.34nm-100nm.
14. methods according to claim 11 it is characterised in that：The response time of the method is -100 milliseconds of 1 nanosecond.
15. methods according to claim 11 it is characterised in that：The sensitivity of the method and detection limit be respectively 1 ×
106MV/RIU and 5 × 10-6RIU.
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| CN201611076871.7A CN106442411A (en) | 2016-11-30 | 2016-11-30 | Graphene surface wave based high-sensitivity ultrafast refractive index detecting device and method |
| PCT/CN2017/113650 WO2018099408A1 (en) | 2016-11-30 | 2017-11-29 | Highly sensitive, graphene surface wave based multiple light beam refractive index detection apparatus and method |
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| CN201611076871.7A CN106442411A (en) | 2016-11-30 | 2016-11-30 | Graphene surface wave based high-sensitivity ultrafast refractive index detecting device and method |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107024453A (en) * | 2017-05-26 | 2017-08-08 | 北京碳世纪科技有限公司 | A kind of quick humidity method for sensing based on graphene/graphene oxide laminated film |
| CN107300537A (en) * | 2017-06-12 | 2017-10-27 | 电子科技大学 | Graphene complex refractivity index measuring method based on LPFG spectrum |
| CN108088815A (en) * | 2017-11-28 | 2018-05-29 | 北京碳世纪科技有限公司 | Highly sensitive multiple beam refractive index detection device and method based on graphene surface ripple |
| WO2018099408A1 (en) * | 2016-11-30 | 2018-06-07 | 北京碳世纪科技有限公司 | Highly sensitive, graphene surface wave based multiple light beam refractive index detection apparatus and method |
| WO2019019562A1 (en) * | 2017-07-26 | 2019-01-31 | 福州大学 | Terahertz surface plasmon resonance sensing device and using method |
| CN109596569A (en) * | 2018-12-20 | 2019-04-09 | 南开大学 | A kind of low concentration glucose detection chip and preparation method thereof |
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