CN106442358A - Apple quality detection device and apple quality detection method - Google Patents
Apple quality detection device and apple quality detection method Download PDFInfo
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- CN106442358A CN106442358A CN201610884770.6A CN201610884770A CN106442358A CN 106442358 A CN106442358 A CN 106442358A CN 201610884770 A CN201610884770 A CN 201610884770A CN 106442358 A CN106442358 A CN 106442358A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N2021/3185—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry typically monochromatic or band-limited
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Abstract
The invention relates to an apple quality detection device and an apple quality detection method. The device mainly comprises a coating plane reflector, a band-pass optical filter, an imaging lens and an image sensor sequentially arranged along the optical axis direction; in detection, the plane reflector is arranged parallel to the connection line between the apple stem and calyx; the distance from the apple to a plane mirror is equal to the apple diameter; the imaging lens determines the optical axis direction of an optical system by taking the connection line between the apple top end and the bottom end of the image of the apple formed through the plane mirror as a visual axis; meanwhile, the field angle of the imaging lens capable of covering the bottom end of the apple and the top end of the apple image at the same time meets the requirement, and the distance from the imaging lens to the plane reflector is determined according to the requirement; and after the position of the imaging lens is determined, the band-pass optical filter and the image sensor are arranged on the two sides of the imaging lens respectively according to the determined optical axis and are both vertical to the optical axis. According to the invention, simultaneous detection of the inner quality and outer quality of the apple can be realized, and all images of the apple surface can be acquired once by use of one image sensor.
Description
Technical field
The invention belongs to photoelectron and technical field of information processing, relate generally to one kind and realize object inside and outside quality simultaneously
Detecting system and its method for use, specifically a kind of apple quality detection means and detection method.
Background technology
China is the first in the world apple production big country, and national apple production reaches 43,000,000 tons within 2015.But the apple of China
Most of class are relatively low in the international market for fruit, and domestic top grade Apples Market is also monopolized by Apple in Foreign Countries, import apple in 2015
Fruit amount surge 50%, is that China puts into not it is difficult to meet consumer couple to apple grading detection the reason one of critically important
The higher and higher requirement of apple quality, lead to apple variety to mix, quality good or not uneven.
Lifting apple competitiveness needs to select the apple of high-quality from general merchandise.The postpartum commercial treatment of apple has
Multiple steps, are wherein the key links according to the classification that carries out different with internal moral character of size, maturity, and be correctly classified
Premise is exactly the high level detection to apple external sort and inside quality.
China's apple external sort detection at present adopts artificial treatment, and the traditional detection method of inside quality often adopts
Sampling chemical detection, these methods have that analysis process is more complicated, time-consuming mostly, testing cost is high, technical conditions are complicated,
It is difficult to realize immediately monitoring and need the shortcomings of destroy sample.For realizing apple according to the synthesis product such as size, color and pol
Quick, the accurate classification of matter, effectively improves the satisfaction of consumer, improves Chinese apple value-added content of product, lifting China apple
The price of fruit outlet and profit level lifting international competitiveness, are badly in need of the new apple quality Fast nondestructive evaluation system of exploitation.
The apple external sort detection carried out using machine vision, it is possible to achieve the information such as apple appearance and size, color
Aulomatizeted Detect, but the inner parameter of reflection apple quality is difficult to extract.
Near-infrared spectrum technique is widely used in measuring the inside quality of agricultural product as a kind of nondestructiving detecting means, can
Detect the multiple parameters of apple internal simultaneously, and have the advantages that Non-contact nondestructive detects, but utilize near-infrared spectrum analysis
Technology focuses primarily upon the analysis of target local message, is not suitable for uneven components target detection, and will realize overall goals detection will
Expend more time.
Comprehensive utilization image processing techniques and the spectral imaging technology of spectral analysis technique, are counted with chemistry based on pattern-recognition
The subject knowledges such as amount, can carry out the Non-Destructive Testing research of apple external sort and inside quality, but will obtain apple appearance
Face full detail needs to arrange two and images above sensor.Simultaneously because existing image processing techniques can change apple table
The intensity distribution of each wavelength light of face reflection, is so unfavorable for carrying out spectrum analysis to obtain apple internal quality information, therefore
Existing apple quality detecting system is difficult to realize the detection of external image information and internal component information simultaneously.
Content of the invention
The present invention proposes a kind of apple quality detection means and detection method, overcomes spectrum detection technique and can't see figure
As and be difficult in adapt to the uneven deficiency of component distributing, also can take machine vision be difficult to detect inside quality defect, can
Realize inside and outside quality to detect simultaneously, and can once detect apple surface full detail.
In order to realize goal of the invention, the technical solution adopted in the present invention is as follows：
A kind of apple quality detection means, including along optical axis direction tactic plated film plane mirror, bandpass filter, one-tenth
As lens and imageing sensor；
Described plated film planar mirror surface plated film, is 99% to wavelength for the reflectivity of 400-780nm light；
Described bandpass filter end face perpendicular to optical axis direction, the high about 10nm of transmitance peak value half-breadth, can lead to through centre wavelength
Cross replacing optical filter and change；
The optical axis of described imaging len is overlapped with optical axis direction；
The receiving plane of described image sensor is perpendicular to optical axis direction；
Described imaging len of stating is close to bandpass filter, and the effective clear aperture of bandpass filter is not less than lens.
A kind of apple quality detection method, during detection, described plane mirror is according to parallel to apple carpopodium with calyx even
Line direction is placed, and apple leaves level crossing distance and approximates apple diameter, and imaging len is with apple top and apple through level crossing
Imaging bottom line is the optical axis, determines system optical axis direction, the angle of visual field of imaging len is can cover apple simultaneously simultaneously
Fruit bottom and apple are to meet to require as top, require to determine the distance that imaging len leaves plane mirror according to this, treat into
As lens position determines, bandpass filter and imageing sensor according to the optical axis determining be respectively arranged at imaging len both sides and
It is each perpendicular to optical axis setting；
Described bandpass filter interchangeable, replaceable transmission centre wavelength is suitable for the bandpass filter that spectrum analysis measurement needs
Piece, transmitance 95%；
Described image sensor receiving plane is simultaneously received apple bottom and apple through level crossing imaging top.
Above-mentioned plane mirror a size of 50-100mm × 50-100mm, can become the complete picture of apple, mirror surface plated film,
For the reflectivity of 400-900nm light, 99% is to wavelength.
The present invention is capable of detecting to while the quality of apple inside and outside, can be utilized an imageing sensor once to obtain
Apple surface all images, reduce the complexity of image-taking system, and can realize apple by withdrawing spectral information and analysis
Fruit inside quality detects.Compared with prior art, it is an advantage of the invention that：
1st, because the plane mirror of high reflectance is used in apple profile measurement the present invention, by reasonable selection imaging len
With respect to apple and apple through the position relationship of plane mirror imaging, can achieve that an imageing sensor once obtains apple
Fruit outer surface full detail, reduce Apple image acquisition system realizes difficulty, and gathers system with respect to multi-sensor image
System reduces the accurate algorithm complexity extracting apple appearance information.
2nd, planar mirror surface coating film treatment makes, to each wavelength light wave reflection rate uniformity, not changing apple table
The intensity distribution of each wavelength light of face reflection, is conducive to carrying out spectrum analysis acquisition apple internal quality information, thus solving
Existing apple quality detecting system is difficult to realize the problem of external image information and internal component infomation detection simultaneously.
3rd, pass through to change the bandpass filter that different peak values pass through wavelength, apple to be measured can be obtained under different monochrome wavelength
Corresponding whole appearance information.Reflect apple to be measured by this system is carried out with the different calibration experiments through wave spectrum response
Fruit, in the true radiation of each different wave length, based on this spectroscopic data, can obtain reflecting apple internal by data matching
The pol value of quality information, realizes detection while apple inside and outside quality to be measured, reduces spectral imaging technology and carry out apple
The difficulty of Quality Detection..
4th, the present invention is applied to fruit industry Non-Destructive Testing and the skill that apple inside and outside Quality Detection automaticity is had high demands
Art field.
Brief description
Fig. 1 is apple inside and outside of the present invention quality detecting system principle schematic simultaneously；
Description of reference numerals is as follows：
1- plated film plane mirror；2- optical filter；3- imaging len；4- CCD image sensor.
Specific embodiment
Below in conjunction with the accompanying drawings to the detailed description of the invention：
Referring to Fig. 1, a kind of apple quality detection means, including along optical axis direction tactic plated film plane mirror 1, band logical
Optical filter 2, imaging len 3 and imageing sensor 4；Described plated film plane mirror 1 surface coating, is 400-780nm to wavelength
The reflectivity of light is 99%；Described bandpass filter 2 end face perpendicular to optical axis direction, the high about 10nm of transmitance peak value half-breadth, thoroughly
Cross centre wavelength to change by changing optical filter；The optical axis of described imaging len 3 is overlapped with optical axis direction；Described image passes
The receiving plane of sensor 4 is perpendicular to optical axis direction；Described imaging len 3 of stating is close to bandpass filter 2, and bandpass filter 2 is effective
Clear aperture is not less than lens 3.
A kind of apple quality detection method, during detection, described plane mirror 1 is according to parallel to apple carpopodium and calyx
Line direction is placed, and apple leaves level crossing distance and approximates apple diameter, and imaging len 3 is with apple top and apple through plane
Mirror imaging bottom line is the optical axis, determines system optical axis direction, the angle of visual field of imaging len 3 is can cover simultaneously simultaneously
Apple bottom and apple are to meet to require as top, require to determine the distance that imaging len 3 leaves plane mirror according to this, treat
Imaging len 3 position determines, bandpass filter 2 and imageing sensor 4 are respectively arranged at imaging len 3 according to the optical axis determining
Both sides and be each perpendicular to optical axis setting；Described bandpass filter 2 interchangeable, replaceable transmission centre wavelength is suitable for spectrum analysis
The bandpass filter that measurement needs, transmitance 95%；Described image sensor 4 receiving plane is simultaneously received apple bottom and apple
Through level crossing imaging top.Above-mentioned plane mirror 1 a size of 50-100mm × 50-100mm, can become the complete picture of apple, instead
Penetrate mirror surface coating, for the reflectivity of 400-900nm light, 99% is to wavelength.
Below the detection method of the present invention is described in detail below：From apple front surface to be measured（Table towards optical filter
Face）Diffuse after optical filter 2 and imaging len 3, before directly obtaining apple to be measured in CCD image sensor 4
The monochrome image on surface；Surface after apple to be measured（Surface towards plated film plane mirror 1）To diffuse be can not
It is directly entered optical system, therefore existing apple quality detecting system generally can not once obtain whole appearances of apple to be measured
Surface information, the system due to employing plated film plane mirror 1, can by after apple surface diffuse anti-through plated film plane
Bandpass filter 2, imaging len 3 and CCD image sensor 4 is sequentially passed through, by the numeral to monochrome image after penetrating mirror reflection
Image procossing can obtain apple surface size, shape and colouring information it is achieved that measurement while apple whole appearance information.Plating
The reflectivity of membrane plane mirror surface 99% ensure that the uniform of apple front and rear surfaces reflected energy to be measured.
In addition, the system, on the basis of realizing once recording whole appearance information under apple Single wavelength to be measured, is changed not
Pass through the bandpass filter of wavelength with peak value, apple to be measured corresponding whole appearance information under different monochrome wavelength can be obtained.
Reflect apple to be measured in each different wave length by this system is carried out with the different calibration experiments through wave spectrum response
The true pol value radiating, reflection apple internal quality information based on this spectroscopic data, being obtained by data matching, real
Detection while existing apple inside and outside quality to be measured.
The program has obvious technical advantage with respect to existing based on the apple quality detecting system of spectral imaging technology,
Plated film plane mirror is placed in the side only needing to be difficult to direct imaging in apple optical system to be measured, and is adjusted to as optical system
The optical axis direction of system, selects the suitable imaging optical system angle of visual field and the depth of field, and the program just can be realized to apple to be measured
Measure while the quality of inside and outside, it is to avoid existing spectrum imaging system carries out can only once obtaining during apple quality measurement to be measured
Apple front surface profile and the defect of spectral information.
Embodiment 1：
Detecting system is made up of designed apple inside and outside quality catoptric system and imaging system simultaneously, and catoptric system is plated film
Plane mirror, plane mirror size is not less than the half of apple size to be measured it is desirable to plated film plane mirror is to 400-
The reflectivity of 780nm light wave is 99%；Imaging system is made up of bandpass filter 2, imaging len 3 and imageing sensor 4, band logical
Optical filter is used for allowing the light wave in a wavelength range to pass through imaging optical system, to record under apple monochrome wavelength to be measured
Information, the monochromatic light from apple front and rear surfaces to be measured is focused on imageing sensor by imaging len, by changing different peak values
The full surface information of the corresponding apple to be measured of different monochromatic light realized by bandpass filter through wavelength.From apple front surface to be measured
Diffused light be directly over bandpass filter 2, imaging len 3 reach imageing sensor 4, the diffusion on surface after apple to be measured
Light reaches imageing sensor 4 after the reflection of plated film plane mirror, then through bandpass filter 2, imaging len 3, can achieve simultaneously
Record apple all surfaces information to be measured.The bandpass filter 2 passing through wavelength by changing different peak values can achieve to different single
The record of the full surface information of the corresponding apple to be measured of coloured light.
In the present embodiment, detector selects ccd sensor, imaging lens selection standard C mouth mirror head, focal length 50mm, filters
The high 10nm of piece peak value half-breadth, replaceable peak wavelength is 630nm, 650nm, 670nm, 780nm and 850nm, apple distance to be measured
Plated film plane mirror is about apple diameter.Adjust imaging lens to the distance of apple to be measured, by ccd sensor Real Time Observation
To be simultaneously received apple bottom and apple as top is as suitable distance in visual field, realize the once acquisition of apple full detail.
By changing bandpass filter 2, realize the acquisition of apple to be measured different monochrome wavelength all images spectral information, by digitized map
Detect as process can complete the information such as size, shape, color and pol value in the quality of apple inside and outside to be measured simultaneously.
The apple inside and outside quality detection means simultaneously of the present invention, solves in the quality detection system of apple inside and outside and is difficult to
The problem that after realization, surface information detects simultaneously.
Embodiment 2：
In the present embodiment, detector selects ccd sensor, imaging lens selection standard C mouth mirror head, focal length 16mm, optical filter peak
Value the high 10nm of half-breadth, replaceable peak wavelength be 632nm, 650nm, 670nm, 780nm, 850nm and 900nm, apple to be measured away from
It is about apple diameter from plated film plane mirror.Adjustment imaging lens, to the distance of apple to be measured, are seen in real time by ccd sensor
Examine in visual field to be simultaneously received apple bottom and apple as top is as suitable distance, realize once obtaining of apple full detail
Take.By changing bandpass filter 2, realize the acquisition of apple to be measured different monochrome wavelength all images spectral information, by number
Word image procossing can complete the information such as size, shape, color and pol value in the quality of apple inside and outside to be measured and detect simultaneously.
To sum up, the present invention is adopted plated film plane mirror and is solved using replaceable bandpass filter and imaging optical system
In apple quality detection, inside and outside quality record can not the problem of whole apple information simultaneously or can not detect simultaneously.The present invention
It is applied to fruit industry Non-Destructive Testing and the technical field that apple inside and outside Quality Detection automaticity is had high demands.
Claims (3)
1. a kind of apple quality detection means it is characterised in that：Including along optical axis direction tactic plated film plane mirror
（1）, bandpass filter（2）, imaging len（3）And imageing sensor（4）；Described plated film plane mirror（1）Surface coating, right
Wavelength is that the reflectivity of 400-780nm light is 99%；Described bandpass filter（2）End face is perpendicular to optical axis direction, transmitance peak
The value high about 10nm of half-breadth, can be changed by changing optical filter through centre wavelength；Described imaging len（3）Optical axis and optical axis
Direction overlaps；Described image sensor（4）Receiving plane perpendicular to optical axis direction；Described state imaging len（3）It is close to band logical filter
Mating plate（2）, and bandpass filter（2）Effectively clear aperture is not less than lens（3）.
2. a kind of apple quality detection method it is characterised in that：During detection, plane mirror（1）According to parallel to apple carpopodium
Place with calyx line direction, apple leaves level crossing distance and approximates apple diameter, imaging len（3）With apple top and apple
Fruit is the optical axis through level crossing imaging bottom line, determines system optical axis direction, simultaneously imaging len（3）The angle of visual field with
Apple bottom and apple can be covered as top is to meet to require simultaneously, requires to determine imaging len according to this（3）Leave plane anti-
Penetrate the distance of mirror, lens to be imaged（3）Position determines, bandpass filter（2）And imageing sensor（4）Optical axis according to determining divides
It is not arranged at imaging len（3）Both sides and be each perpendicular to optical axis setting；
Described bandpass filter（2）Interchangeable, replaceable transmission centre wavelength is suitable for the band logical filter that spectrum analysis measurement needs
Mating plate, transmitance 95%；
Described image sensor（4）Receiving plane is simultaneously received apple bottom and apple through level crossing imaging top.
3. apple quality detection method according to claim 2 it is characterised in that：Described plane mirror（1）A size of
50-100mm × 50-100mm, can become the complete picture of apple, mirror surface plated film, to wavelength for 400-900nm light reflectivity
It is 99%.
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| CN107238395A (en) * | 2017-08-01 | 2017-10-10 | 珠海市微半导体有限公司 | The light stream mileage sensor-based system and its focus depth adjusting method of mobile robot |
| CN109886259A (en) * | 2019-02-22 | 2019-06-14 | 潍坊科技学院 | A kind of tomato disease based on computer vision identification method for early warning and device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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