CN106441082A - 一种相位恢复方法及装置 - Google Patents
一种相位恢复方法及装置 Download PDFInfo
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- CN106441082A CN106441082A CN201610881939.2A CN201610881939A CN106441082A CN 106441082 A CN106441082 A CN 106441082A CN 201610881939 A CN201610881939 A CN 201610881939A CN 106441082 A CN106441082 A CN 106441082A
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- 238000011084 recovery Methods 0.000 title claims abstract description 39
- 238000000034 method Methods 0.000 title claims abstract description 22
- 230000010363 phase shift Effects 0.000 claims abstract description 101
- 230000009466 transformation Effects 0.000 claims abstract description 39
- 238000004422 calculation algorithm Methods 0.000 claims abstract description 23
- 239000000523 sample Substances 0.000 claims abstract description 14
- 238000012545 processing Methods 0.000 claims abstract description 13
- 238000001914 filtration Methods 0.000 claims abstract description 9
- 239000011159 matrix material Substances 0.000 claims description 20
- 238000001514 detection method Methods 0.000 claims description 17
- 230000003287 optical effect Effects 0.000 claims description 13
- 238000010606 normalization Methods 0.000 claims description 5
- 238000000513 principal component analysis Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 3
- 230000001131 transforming effect Effects 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
- 238000005305 interferometry Methods 0.000 description 2
- 230000002123 temporal effect Effects 0.000 description 2
- 238000009795 derivation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000001093 holography Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/0201—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal phase variation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
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CN201610881939.2A CN106441082B (zh) | 2016-10-08 | 2016-10-08 | 一种相位恢复方法及装置 |
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CN201610881939.2A CN106441082B (zh) | 2016-10-08 | 2016-10-08 | 一种相位恢复方法及装置 |
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CN106441082A true CN106441082A (zh) | 2017-02-22 |
CN106441082B CN106441082B (zh) | 2019-03-08 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107316039A (zh) * | 2017-06-02 | 2017-11-03 | 东北大学 | 一种基于主成分分析法的叉形干涉图像特征提取方法 |
CN108364268A (zh) * | 2018-02-26 | 2018-08-03 | 山东师范大学 | 一种单帧条纹图相位恢复方法和装置 |
CN109391434A (zh) * | 2017-08-11 | 2019-02-26 | 中兴通讯股份有限公司 | 参考信号的配置方法及装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102175332A (zh) * | 2011-01-21 | 2011-09-07 | 南京理工大学 | 一种从含有移相误差的干涉图中恢复相位的方法 |
CN103778650A (zh) * | 2013-10-25 | 2014-05-07 | 南京农业大学 | 主成分分析相位恢复算法 |
US20160003741A1 (en) * | 2013-01-09 | 2016-01-07 | The Regents Of The University Of California | Apparatus and methods for fluorescence imaging using radiofrequency-multiplexed excitation |
-
2016
- 2016-10-08 CN CN201610881939.2A patent/CN106441082B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102175332A (zh) * | 2011-01-21 | 2011-09-07 | 南京理工大学 | 一种从含有移相误差的干涉图中恢复相位的方法 |
US20160003741A1 (en) * | 2013-01-09 | 2016-01-07 | The Regents Of The University Of California | Apparatus and methods for fluorescence imaging using radiofrequency-multiplexed excitation |
CN103778650A (zh) * | 2013-10-25 | 2014-05-07 | 南京农业大学 | 主成分分析相位恢复算法 |
Non-Patent Citations (6)
Title |
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左超 等: "基于光强传输方程的非干涉相位恢复与定量相位显微成像:文献综述与最新进展", 《中国激光》 * |
徐媛媛 等: "生物细胞定量相位显微技术及相位恢复方法的新进展", 《激光与光电子学进展》 * |
曾文雯 等: "从单幅干涉图中恢复相位的区间反转方法", 《红外与激光工程》 * |
李海龙: "弱吸收细胞样品相位场定量测量技术研究", 《中国优秀硕士学位论文全文数据库 基础科技辑》 * |
熊六东 等: "单幅载频条纹图的相位恢复新算法", 《光学学报》 * |
马锁冬: "基于相位恢复的三维形貌复合通道测量技术研究及应用", 《中国博士学位论文全文数据库 信息科技辑》 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107316039A (zh) * | 2017-06-02 | 2017-11-03 | 东北大学 | 一种基于主成分分析法的叉形干涉图像特征提取方法 |
CN107316039B (zh) * | 2017-06-02 | 2020-07-24 | 东北大学 | 一种基于主成分分析法的叉形干涉图像特征提取方法 |
CN109391434A (zh) * | 2017-08-11 | 2019-02-26 | 中兴通讯股份有限公司 | 参考信号的配置方法及装置 |
CN108364268A (zh) * | 2018-02-26 | 2018-08-03 | 山东师范大学 | 一种单帧条纹图相位恢复方法和装置 |
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Effective date of registration: 20230104 Address after: No. 1088, Xueyuan Avenue, Nanshan District, Shenzhen, Guangdong 518000 Patentee after: Sun Xiaowei Patentee after: Shenzhen Pulang Quantum Semiconductor Co.,Ltd. Address before: 518000 2nd floor, building 19A, China Hisense innovation industry city, No.12, Ganli 6th Road, Ganli Industrial Park, Buji street, Longgang District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN PLANCK INNOVATION TECHNOLOGY Co.,Ltd. |
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Effective date of registration: 20240318 Address after: No. 17, Changsha Road, Wangcheng Sub district Office, Laixi, Qingdao, Shandong 266000 Patentee after: Qingdao Dingcheng New Material Technology Co.,Ltd. Country or region after: China Address before: No. 1088, Xueyuan Avenue, Nanshan District, Shenzhen, Guangdong 518000 Patentee before: Sun Xiaowei Country or region before: China Patentee before: Shenzhen Pulang Quantum Semiconductor Co.,Ltd. |