CN106356314B

CN106356314B - SOT26 test clamp with adjustable test groove and operation method thereof

Info

Publication number: CN106356314B
Application number: CN201611030790.3A
Authority: CN
Inventors: 李国祥; 吴靖宇; 叶金锋; 蒋节文; 孙超
Original assignee: Changjiang Electronics Technology Chuzhou Co Ltd
Current assignee: Changjiang Electronics Technology Chuzhou Co Ltd
Priority date: 2016-11-16
Filing date: 2016-11-16
Publication date: 2023-06-23
Anticipated expiration: 2036-11-16
Also published as: CN106356314A

Abstract

The invention discloses a test groove adjustable SOT26 test clamp and an operation method thereof, and belongs to the technical field of chip testing. The invention discloses a test groove adjustable SOT26 test clamp, which comprises a fixed clamp and a movable clamp; the fixed clamp and the movable clamp are connected through the mutually matched rotating devices, and the width of the clamping opening between the fixed clamp and the movable clamp is adjusted through the rotation of the movable clamp relative to the fixed clamp, so that the test clamp opening can be adjusted adaptively according to the size of the SOT26. According to the operating method of the test clamp, through the steps of pressing-in, testing and ejecting of the SOT26, the opening and closing of the movable clamp are controlled by the spring, so that left and right offset caused by the size of the SOT26 is compensated, the yield of one-time test is improved, and meanwhile, the ejector rod is additionally arranged; the movable clamp and the ejector rod cooperate to achieve the purposes of accurately positioning SOT26 during testing, preventing stacking and improving the testing yield, and the yield is improved, so that the effect of double functions is achieved.

Description

SOT26 test clamp with adjustable test groove and operation method thereof

Technical Field

The invention relates to the technical field of chip testing, in particular to a SOT26 testing clamp with an adjustable testing groove and an operation method thereof.

Background

Currently, in the manufacturing process of semiconductor integrated circuits, further testing needs to be performed on finished chips after cutting and packaging, and a testing fixture plays a key role. In the chip testing process, the chip is transferred into the testing clamp through the suction nozzle of the chip sorting machine, and after the testing is finished, the suction nozzle of the chip sorting machine transfers the chip to the next working procedure.

SOT is the abbreviation of English Small-outlinersistor, refers to a packaging form of a transistor, SOT26 is the abbreviation of SOT23-6, SOT23-6 is one of SOT23, and mantissa 6 represents 6 pins; as shown in fig. 2, the opening size of the clamping opening (3) is fixed, and the length of the SOT26 is inconsistent due to the limitation of the manufacturing process level, so that the testing clamp designed by the original equipment is designed according to the maximum length of the SOT26, and the pins of the SOT26 product are offset left and right when contacting a test piece, so that poor contact is caused, and the primary test rate is reduced; the pins of the SOT26 are symmetrically arranged left and right, and how to ensure the contact between the pins at two sides and the test piece during the test is also a technical problem to be considered by technicians.

Through searching, chinese patent application, publication number: CN105931979a, publication date: 2016.09.07A rotary pressing-down chip testing fixture comprises a bracket, wherein the bracket comprises a base station with a horizontal plane and a vertical supporting rod; the support rod is fixedly provided with a hollow columnar support frame with spiral lines on the inner wall; the lower pressing rod is provided with spiral lines on the outer wall; the spiral lines on the inner wall of the support frame and the spiral lines on the outer wall of the pressing rod are matched with each other; an upper test needle is arranged at the lower end of the pressing rod, and a handle is arranged at the upper end of the pressing rod; the chip placing table is fixed on the base table, a chip positioning rod is arranged on the upper surface of the chip placing table, a through hole is further formed in the chip placing table, and a lower test needle is fixed in the through hole. The invention is suitable for testing unpackaged chips, can position and rapidly test the chips without welding test pins on the chips, is rapid and convenient for mounting and dismounting the chips, and is suitable for large-batch testing. However, the base station at the horizontal plane of the invention can not be adjusted in size, and only chips with fixed specifications can be tested, and the invention is only suitable for testing unpacked chips and has poor universality.

Disclosure of Invention

1. Technical problem to be solved by the invention

Aiming at the problem that SOT26 pins shift left and right when contacting a test piece in SOT26 test in the prior art, the invention provides a SOT26 test clamp with an adjustable test groove and an operation method thereof. The test clamp can realize the adaptive adjustment of the test clamp according to the size of the SOT26, and the aim of improving the average yield of the test is fulfilled.

2. Technical proposal

In order to achieve the above purpose, the technical scheme provided by the invention is as follows:

a SOT26 test clamp with an adjustable test groove comprises a fixed clamp and a movable clamp; the fixed clamp and the movable clamp are connected through the mutually matched rotating device, and the width of the clamping opening between the fixed clamp and the movable clamp is adjusted through the rotation of the movable clamp relative to the fixed clamp, so that the clamping opening of the test clamp can be adaptively adjusted according to the size of the SOT26, and the aim of improving the test average yield of the SOT26 is fulfilled.

According to a further technical scheme, the rotating device is a convex semi-cylinder and a concave semi-cylinder which are respectively arranged and matched on the opposite side surfaces of the fixed clamp and the movable clamp; the movable clamp is hung on the convex half cylinder of the fixed clamp through the concave half cylinder, the concave half cylinder rotates by taking the convex half cylinder as an axis, and as the overall size of the SOT26 is smaller, large width adjustment is not needed, and the required width adjustment of the clamp opening can be realized only by reserving a narrow gap between the fixed clamp and the movable clamp, so that the concave half cylinder rotates by taking the convex half cylinder as an axis, and the fine adjustment of the width of the clamp opening can be realized.

According to a further technical scheme, the fixing clamp is in an inverted T shape; the movable clamp is hung on one side of a boss in the middle of the fixed clamp, an L-shaped rotating gap is reserved between the movable clamp and the fixed clamp, the gap is L-shaped, and small-angle rotation of the concave semi-cylinder by taking the convex semi-cylinder as an axis is realized.

According to a further technical scheme, the lower half part of the movable clamp is provided with a spring containing cavity in the horizontal direction, and a clamp opening width adjusting spring in the horizontal direction is arranged in the lower part of the concave semi-cylinder. After the SOT26 test is finished, the width of the clamping opening is reset, and the clamping force of the clamping opening to the SOT26 during the test can be realized, so that the stability of the position during the SOT26 test is ensured.

According to a further technical scheme, a vertical ejector rod accommodating cavity is arranged in a boss in the middle of the fixing clamp, and an ejector rod spring and an ejector rod which are connected with each other are arranged in the boss from bottom to top; the ejector rod is in a convex shape, the top end of the ejector rod penetrates out of the upper surface of the fixing clamp and is close to the middle of the clamping opening, and the bottom of the ejector rod is an ejector rod seat connected with an ejector rod spring, so that SOT26 products cannot be clamped in the testing clamp after testing, and the stacking alarm probability of the auxiliary disc is reduced.

Further technical scheme, the upper surface of fixation clamp sets up the fixation clamp and indicates, the upper surface of activity clamp sets up the activity and presss from both sides the finger, and fixation clamp finger groove and activity press from both sides finger groove and set up relatively, can effectively avoid the metal that the both ends of the SOT product no pin that some special lead frames were packaged were exposed, prevent product and peripheral short circuit, hold the clamp mouth of SOT26 encapsulation body in the middle, make SOT26 impress behind the clamp mouth, slot and clamp mouth synergism prevent left way skew and can guarantee the parallel of SOT26 both sides pin and test piece when SOT26 tests, the convenience test and improve the precision of test.

Further technical scheme, the opposite side surfaces of the fixed clamp finger and the movable clamp finger are inclined planes with two different angles, the upper parts of the inclined planes are outwards opened, the lower end inclined angles are consistent with the shape of the SOT26 packaging body, buffer pressing-in of the SOT26 during pressing-in of the clamp opening is guaranteed, mutual damage caused by excessively hard contact between the SOT26 packaging body and the clamp opening plane is avoided, and stability after pressing-in is further guaranteed.

According to a further technical scheme, the convex half cylinder is penetrated with a hollow fixing pin hole in the horizontal direction; the fixing pin is transversely inserted into the fixing pin hole in a T shape, the top end of the fixing pin is fixedly connected with a fixing pin cap, and the tail end of the fixing pin penetrates out of the fixing pin hole and is in tight fit connection with the gasket so as to ensure the stable parallel relation between the fixed clamp finger groove and the movable clamp finger groove; the rotation of the concave semi-cylinder is clockwise 0-4 degrees, and the rotation angle is automatically adjusted according to the size of the SOT26 so as to adapt to SOT26 products with different sizes.

According to a further technical scheme, the tail end of the fixing pin is further provided with a fixing jack in a penetrating mode, a stop lever is inserted into the fixing jack, and glue is adhered to fix the stop lever. So as to avoid dislocation of the fixed clamp finger groove and the movable clamp finger groove caused by tight connection and looseness of the gasket.

A method for operating an SOT26 test clamp with an adjustable test groove comprises the following steps:

step one, pressing in SOT 26: the suction nozzle of the chip sorting machine adsorbs the packaging body in the middle of the SOT26 and then presses the packaging body into the clamping opening, in the pressing process, the movable clamp rotates clockwise relative to the fixed clamp, the width of the clamping opening is gradually increased, the clamping opening width adjusting spring is gradually compressed until the SOT26 packaging body is completely pressed into the clamping opening of the test clamp, and the chip sorting machine keeps pressing-in type fixation on the SOT26;

step two, testing SOT 26: testing each pin contact test piece of the SOT26 one by one;

step three, ejection of SOT 26: after the test is finished, a suction nozzle of the sorting machine ascends, SOT26 products on the suction nozzle are ejected out under the action of vacuum and the ejection of the ejector rod, the clamping opening width adjusting spring returns, and the width of the clamping opening is restored to the initial width; the chip sorter transfers the SOT26 to the next process;

and fourth, repeating the first to third steps, and testing the other SOT26.

The single-side movable clamp is adopted to act, the opening and the closing of the movable clamp are controlled by the spring, so that the left-right offset caused by the size of the SOT26 is compensated, the yield of one-time test is improved, and meanwhile, the ejector rod is additionally arranged, so that the product is prevented from being blocked in the clamp opening, and the purpose of automatically preventing material overlapping is achieved; the movable clamp and the ejector rod cooperate to achieve the purposes of double protection of SOT26 and improvement of test yield in test, which is equivalent to improvement of productivity, and meanwhile, the hidden trouble of stacking is basically eliminated, so that the effect of double functions is achieved.

3. Advantageous effects

Compared with the prior art, the technical scheme provided by the invention has the following beneficial effects:

(1) According to the SOT26 test clamp with the adjustable test groove, the width of the clamping opening between the test groove and the fixed clamp is adjusted through the rotation of the movable clamp relative to the fixed clamp, so that the test clamping opening can be adaptively adjusted according to the size of the SOT26, and the aim of improving the test average yield of the SOT26 is fulfilled;

(2) According to the SOT26 test clamp with the adjustable test groove, the SOT26 is small in overall size (in single millimeter level), large width adjustment is not needed, and the required width adjustment of the clamp opening can be realized only by reserving a small gap between the fixed clamp and the movable clamp, so that the concave semi-cylinder rotates by taking the convex semi-cylinder as an axis, and the fine adjustment of the width of the clamp opening can be realized;

(3) According to the SOT26 test clamp with the adjustable test groove, a gap between the movable clamp and the fixed clamp is L-shaped, so that small-angle rotation of the concave semi-cylinder by taking the convex semi-cylinder as an axis is realized;

(4) According to the SOT26 test clamp with the adjustable test groove, the clamping opening width adjusting spring is arranged, so that the reset of the clamping opening width after the SOT26 test is finished is realized, the clamping force of the clamping opening to the SOT26 during the test can be realized, and the stability of the position during the SOT26 test is ensured. The method comprises the steps of carrying out a first treatment on the surface of the

(5) According to the SOT26 test clamp with the adjustable test groove, the ejector rod arranged in the fixing clamp ensures that an SOT26 product cannot be clamped in the test clamp after the test is finished, and further reduces the stacking alarm probability of the auxiliary disc;

(6) According to the SOT26 test clamp with the adjustable test groove, after the SOT26 is pressed into the clamp opening, the groove and the clamp opening cooperate to prevent the SOT26 from shifting left and right during testing, so that the testing accuracy is improved; the grooves can also be used to avoid exposed metal points at the two ends of the leadless of SOT26 products packaged by some special lead frames so as to prevent the products from being shorted with the test clamp;

(7) According to the SOT26 test clamp with the adjustable test groove, the inclination angles of the side surfaces of the fixed clamp finger and the movable clamp finger are consistent with the shape of the SOT26 packaging body, so that buffer pressing in of the SOT26 during pressing in of the clamp opening is ensured, mutual damage caused by excessively hard contact between the SOT26 packaging body and the plane of the clamp opening is avoided, and the stability after pressing in is further ensured;

(8) According to the SOT26 test clamp with the adjustable test groove, the fixed pins are arranged, so that the stable parallel relationship between the fixed clamp finger grooves and the movable clamp finger grooves can be ensured; the rotation of the concave semi-cylinder is clockwise 0-4 degrees, and the rotation angle is adjusted according to the SOT26; to adapt to SOT26 of different specifications;

(9) According to the SOT26 test clamp with the adjustable test groove, disclosed by the invention, due to the matched arrangement of the fixed jack and the stop lever, dislocation of the fixed clamp finger groove and the movable clamp finger groove caused by tight connection and looseness of the gasket is avoided;

(10) According to the operation method of the SOT26 test clamp with the adjustable test groove, the single-side movable clamp is adopted to act, and the opening and the closing of the movable clamp are controlled by the spring to compensate the left-right offset caused by the size of the SOT26, so that the yield of one-time test is improved, and meanwhile, the ejector rod is additionally arranged to prevent a product from being clamped in the clamp opening, so that the purpose of automatically preventing material overlapping is achieved; the synergy of the movable clamp and the ejector rod plays the roles of double protection of SOT26 and improvement of test yield in test, which is equivalent to improvement of productivity, meanwhile, the hidden danger of stacking is basically eliminated, the effect of double achievement is achieved, and the productivity can be improved by at least 10% through statistics, so that the method is a remarkable progress for hundreds of millions of batch production of SOT26.

Drawings

FIG. 1 is a schematic diagram of a SOT26 test clip with adjustable test grooves according to the present invention;

FIG. 2 is a schematic diagram of a prior art SOT26 test clip;

FIG. 3 is a top view of the SOT26 product;

FIG. 4 is a side view of the SOT26 product;

FIG. 5 is a cross-sectional view of a retaining clip according to the present invention;

FIG. 6 is a cross-sectional view of a clip according to the present invention;

FIG. 7 is a perspective view of a removable clip according to the present invention;

FIG. 8 is an enlarged schematic view of the fixing pin according to the present invention;

FIG. 9 is an enlarged schematic view of a gasket according to the present invention;

fig. 10 is a schematic view of a mandrel structure in the present invention.

Reference numerals in the schematic drawings illustrate: 1. a fixing clamp; 2. a movable clamp; 3. a clamping opening; 4. a push rod; 5. a fixing pin; 7. a gasket; 8. SOT26; 9. a rotary gap; 11. a fixed clamping finger; 12. a convex semi-cylinder; 14. a fixing clip finger groove; 15. a push rod accommodating cavity; 16. a fixing pin hole; 21. a movable clamping finger; 22. a concave semi-cylinder; 23. a nip width adjustment spring; 24. a movable finger-clamping groove; 25. a spring cavity; 41. a push rod seat; 51. a fixed jack; 52. a fixing pin cap; 81. SOT26 middle pin; 82. SOT26 package.

Detailed Description

For a further understanding of the present invention, the present invention will be described in detail with reference to the drawings.

The shape of the SOT26 product is shown in FIGS. 3 and 4.

Example 1

The SOT26 test clamp with the adjustable test groove comprises a fixed clamp 1 and a movable clamp 2; the fixed clamp 1 and the movable clamp 2 are connected through mutually matched rotating devices, and as shown in fig. 5 and 7, the rotating devices are convex semi-cylinders 12 and concave semi-cylinders 22 which are respectively arranged and matched on opposite side surfaces of the fixed clamp 1 and the movable clamp 2; the movable clamp 2 is hung on the convex half cylinder 12 of the fixed clamp 1 through the concave half cylinder 22, and the concave half cylinder 22 rotates by taking the convex half cylinder 12 as an axis. The test clamping port can be adaptively adjusted according to the size of the SOT26, and the aim of improving the test average yield of the SOT26 is fulfilled. Because the overall size of the SOT26 is smaller, large width adjustment is not needed, and the required width adjustment of the clamping opening 3 can be realized only by reserving a narrow gap between the fixed clamp 1 and the movable clamp 2, so that the concave semi-cylinder 22 rotates by taking the convex semi-cylinder 12 as an axis, and the fine adjustment of the width of the clamping opening 3 can be realized.

Example 2

The test groove-adjustable SOT26 test clamp of this embodiment has the same basic structure as that of embodiment 1, and is different and improved in that: as shown in fig. 1, the fixing clip 1 is in an inverted T shape; the movable clamp 2 is hung on one side of a boss in the middle of the fixed clamp 1, an L-shaped rotary gap 9 is reserved between the movable clamp and the fixed clamp 1, the gap is L-shaped, and small-angle rotation of the concave semi-cylinder 22 by taking the convex semi-cylinder 12 as an axis is realized. As shown in fig. 6, the lower half part of the movable clip 2 is provided with a spring containing cavity 25 in the horizontal direction at the lower part of the concave semi-cylinder 22, and a clip width adjusting spring 23 in the horizontal direction is arranged in the lower part. After the SOT26 test is finished, the width of the clamping opening 3 is reset, and the clamping force of the clamping opening 3 to the SOT26 during the test can be realized, so that the stability of the position during the SOT26 test is ensured.

Example 3

The test groove-adjustable SOT26 test clamp of this embodiment has the same basic structure as that of embodiment 2, and is different and improved in that: as shown in fig. 5, a vertical ejector rod accommodating cavity 15 is arranged in a boss in the middle of the fixing clamp 1, and an ejector rod spring and an ejector rod 4 which are connected with each other are arranged in the boss from bottom to top; as shown in fig. 10, the ejector rod 4 is in a shape of a convex shape, the top end of the ejector rod passes through the upper surface of the fixing clamp 1 and is close to the middle of the clamping opening 3, and the bottom of the ejector rod seat 41 is connected with an ejector rod spring, so that the SOT26 product is ensured not to be blocked in the test clamp after the test is finished, and the stacking alarm probability of the auxiliary disc is further reduced. The upper surface of fixation clamp 1 sets up fixation clamp finger 11, the upper surface of activity clamp 2 sets up activity clamp finger 21, and fixation clamp finger groove 14 and activity clamp finger groove 24 set up relatively, can effectively avoid the metal that the both ends of the SOT product no pin that some special lead frames encapsulated are exposed, prevent product and peripheral short circuit, hold the clamp mouth 3 of SOT26 encapsulation body 82 in the middle, make SOT26 impress behind the clamp mouth, slot and clamp mouth synergism prevent the skew about the SOT26 test, the precision of convenient test and improvement test. The size of the "L" shaped rotational gap was 0.33mm.

The operation method of the test groove adjustable SOT26 test clamp of the embodiment applies SOT26 with the specification of 3.0 x 1.6mm, the tolerance is +/-0.02 to +/-0.2, the pin width is 0.4mm, and the steps are as follows:

step one, pressing in SOT 26: the suction nozzle of the chip sorting machine adsorbs the encapsulation 82 in the middle of the SOT26 and then presses the encapsulation 82 into the clamp opening 3, in the pressing process, the movable clamp 2 rotates clockwise relative to the fixed clamp 1, the rotation angle is 1.5-3.0 degrees, the width of the clamp opening 3 is gradually increased, the clamp opening width adjusting spring 23 is gradually compressed until the encapsulation 82 of the SOT26 is completely pressed into the clamp opening 3 of the test clamp, and the chip sorting machine keeps pressing-in type fixation on the SOT26;

step three, ejection of SOT 26: after the test is finished, the suction nozzle of the sorting machine ascends, the product is ejected out under the action of vacuum and the upward ejection of the ejector rod 4, the clamping opening width adjusting spring 23 returns, and the width of the clamping opening 3 is restored to the initial width; the chip sorter transfers the SOT26 to the next process;

and fourth, repeating the first to third steps, and testing the other SOT26.

The SOT26 test clamp with the adjustable test groove adopts a unilateral movable clamp to act, and the opening and the closing of the movable clamp are controlled by a spring to compensate the left-right offset caused by the size of the SOT26 so as to improve the yield of one-time test, and meanwhile, the ejector rod is additionally arranged to prevent a product from being blocked in a clamp opening, so that the aim of automatically preventing material overlapping is fulfilled; the movable clamp and the ejector rod cooperate to achieve the purposes of double protection of SOT26 and improvement of test yield in test, which is equivalent to improvement of productivity, and meanwhile, the hidden trouble of stacking is basically eliminated, so that the effect of double functions is achieved.

According to statistics, the test groove-adjustable SOT26 test clamp of the embodiment has the advantages that the test yield is improved by 13%, which is equivalent to at least 13% of productivity improvement.

Examples: 2016/4/21 statistics:

example 4

The test groove-adjustable SOT26 test clamp of this embodiment has the same basic structure as that of embodiment 3, and is different and improved in that: the opposite side surfaces of the fixed clamp finger 11 and the movable clamp finger 21 are double inclined surfaces with the upper parts outwards opened, the lower inclined surface is 7 degrees, and the upper inclined surface is 30 degrees; the inclination is consistent with the shape of the SOT26 packaging body 82, so that buffer pressing in of the SOT26 during pressing in of the clamping opening is guaranteed, mutual damage caused by excessively hard contact between the SOT26 packaging body and the clamping opening plane is avoided, and stability after pressing in is further guaranteed. The convex half cylinder 12 is penetrated with a hollow fixing pin hole 16 in the horizontal direction and has the diameter of 1mm; as shown in fig. 8 and 9, the fixing pin 5 is transversely inserted into the fixing pin hole 16 in a T shape, the top end is fixedly connected with the fixing pin cap 52, and the tail end penetrates out of the fixing pin hole 16 and is tightly connected with the gasket 7, so that the stable parallel relationship between the fixing clip finger groove 14 and the movable clip finger groove 24 is ensured. The tail end of the fixing pin 5 is also provided with a fixing jack 51, a stop lever is inserted into the fixing jack 51 and is stuck by glue, so that dislocation of the fixing clamp finger groove 14 and the movable clamp finger groove 24 caused by tight connection looseness of the gasket 7 is avoided. The size of the "L" shaped rotational gap was 0.23mm.

The operation method of the test groove adjustable SOT26 test clamp of the embodiment applies SOT26 with the specification of 3.0 x 1.6mm, and the tolerance is +/-0.01 to +/-0.1, and comprises the following steps:

step one, pressing in SOT 26: the suction nozzle of the chip sorting machine adsorbs the SOT26 packaging body 82 of the SOT26 and then presses the SOT26 packaging body 82 into the clamping opening 3 of the test clamp, in the pressing process, the movable clamp 2 rotates clockwise relative to the fixed clamp 1, the rotation angle is 0-1.5 degrees, the width of the clamping opening 3 is gradually increased, the clamping opening width adjusting spring 23 is gradually compressed until the SOT26 packaging body 82 is completely pressed into the clamping opening 3 of the test clamp, and the chip sorting machine keeps pressing-in fixation on the SOT26;

step three, ejection of SOT 26: after the test is finished, a suction nozzle of the sorting machine ascends, SOT26 products on the suction nozzle eject the SOT26 under the actions of vacuum and the jacking of the ejector rod 4, the clamping opening width adjusting spring 23 returns, and the width of the clamping opening 3 is restored to the initial width; the chip sorter transfers the SOT26 to the next process;

and fourth, repeating the first to third steps, and testing the other SOT26.

The test groove-adjustable SOT26 test clamp of the embodiment has the advantages that the test yield is improved by 15% through statistics, and the test groove-adjustable SOT26 test clamp is a remarkable progress for hundreds of millions of mass production of SOT26.

The invention and its embodiments have been described above by way of illustration and not limitation, and the invention is illustrated in the accompanying drawings and described in the drawings in which the actual structure is not limited thereto. Therefore, if one of ordinary skill in the art is informed by this disclosure, the structural mode and the embodiments similar to the technical scheme are not creatively designed without departing from the gist of the present invention.

Claims

1. The SOT26 test clamp with the adjustable test groove comprises a fixed clamp (1) and is characterized by also comprising a movable clamp (2); the fixed clamp (1) and the movable clamp (2) are connected through mutually matched rotating devices;

the rotating device is a convex semi-cylinder (12) and a concave semi-cylinder (22) which are respectively arranged and matched on the opposite side surfaces of the fixed clamp (1) and the movable clamp (2); the movable clamp (2) is hung on the convex half cylinder (12) of the fixed clamp (1) through the concave half cylinder (22), and the concave half cylinder (22) rotates by taking the convex half cylinder (12) as an axis; the upper surface of fixation clamp (1) sets up fixation clamp finger (11), the upper surface of activity clamp (2) sets up activity clamp finger (21), and the upper portion outwards opens upper and lower double inclined plane is all pointed (11) with activity clamp to the side that the opposite of finger (21).

2. The test groove adjustable SOT26 test clip of claim 1, wherein: the fixing clamp (1) is in an inverted T shape; the movable clamp (2) is hung on one side of a boss in the middle of the fixed clamp (1), and an L-shaped rotary gap (9) is reserved between the movable clamp and the fixed clamp (1).

3. The test groove adjustable SOT26 test clip of claim 2, wherein: the lower half part of the movable clamp (2) is provided with a spring containing cavity (25) in the horizontal direction at the lower part of the concave semi-cylinder (22), and a clamp opening width adjusting spring (23) in the horizontal direction is arranged in the lower part.

4. A test groove adjustable SOT26 test clip as set forth in claim 3, wherein: a vertical ejector rod accommodating cavity (15) is arranged in the middle of the fixing clamp (1), and the ejector rod accommodating cavity (15) is internally provided with an ejector rod spring and an ejector rod (4) which are connected with each other from bottom to top; the ejector rod (4) is in a convex shape, the top end of the ejector rod penetrates out of the upper surface of the fixing clamp (1) and is close to the middle of the clamping opening (3), and the bottom of the ejector rod is an ejector rod seat (41) connected with an ejector rod spring.

5. The test groove adjustable SOT26 test clip of claim 4, wherein: the fixed finger groove (14) and the movable finger groove (24) are arranged oppositely to form a clamping opening (3) for accommodating the SOT26 packaging body (82) in the middle.

6. The test groove adjustable SOT26 test clip of claim 5, wherein: the opposite side surfaces of the fixed clamping finger (11) and the movable clamping finger (21) are inclined angles of the upper part outwards opened inclined planes, and the inclined angles are consistent with the shape of the SOT26 packaging body (82).

7. The test groove adjustable SOT26 test clip of claim 6, wherein: the middle of the convex semi-cylinder (12) is provided with a fixing pin hole (16) in the horizontal direction; the fixing pin (5) is transversely inserted into the fixing pin hole (16) in a T shape, the top end of the fixing pin is fixedly connected with the fixing pin cap (52), the tail end of the fixing pin penetrates out of the fixing pin hole (16) and is in close fit connection with the gasket (7), and the concave semi-cylinder (22) rotates clockwise by 0-4 degrees.

8. The test groove adjustable SOT26 test clip of claim 7, wherein: the tail end of the fixing pin (5) is also provided with a fixing jack (51), a stop lever is inserted into the fixing jack (51), and then the stop lever is fixed.

9. A method for operating an SOT26 test clamp with an adjustable test groove is characterized in that: the method comprises the following steps:

step one, pressing in SOT 26: the suction nozzle of the chip sorting machine adsorbs the encapsulation body (82) in the middle of the SOT26 (8) and then presses the encapsulation body into the clamping opening (3), in the pressing process, the movable clamp (2) rotates clockwise relative to the fixed clamp (1), the width of the clamping opening (3) is gradually increased, the clamping opening width adjusting spring (23) is gradually compressed until the SOT26 encapsulation body (82) is completely pressed into the clamping opening (3) of the test clamp, and the chip sorting machine keeps pressing-in type fixation on the SOT26;

step two, testing SOT 26: testing each pin contact test piece of the SOT26 (8) one by one;

step three, ejection of SOT 26: after the test is finished, a suction nozzle of the sorting machine ascends, and under the action of vacuum and the upward pushing action of the ejector rod (4), the SOT26 (8) is ejected out by the SOT26 (8), the clamping opening width adjusting spring (23) returns, and the width of the clamping opening (3) is restored to the initial width; the chip sorter transfers the SOT26 to the next process;

step four, repeating steps one to three, testing additional SOTs 26 (8).