CN106291328B - A kind of spacecraft switch matrix fault detection and positioning device - Google Patents
A kind of spacecraft switch matrix fault detection and positioning device Download PDFInfo
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- CN106291328B CN106291328B CN201610738491.9A CN201610738491A CN106291328B CN 106291328 B CN106291328 B CN 106291328B CN 201610738491 A CN201610738491 A CN 201610738491A CN 106291328 B CN106291328 B CN 106291328B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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Abstract
The present invention discloses a kind of spacecraft switch matrix fault detection and positioning device, including self-test vector generation unit, one group or more self-test isolated location and one group or more self-test state generation unit；Self-test vector generation unit generates and respectively switchs one-to-one test vector in switch matrix and be delivered to switch matrix, controls corresponding switch conduction or shutdown；Every group of self-test isolated location is arranged between the adjacent two-stage switch of switch matrix, each road signal between adjacent two-stage switch is isolated in every group of self-test isolated location, and corresponding self-test state generation unit is conveyed to after the signal after isolation is combined；Self-test state generation unit receives combining signal, and self-test status signal is obtained after converting to the level state of combining signal, the failure of switch matrix is detected and positioned according to the self-test status signal under each test vector, the present invention can carry out switch fault detection and positioning in the case where not influencing switching circuit work.
Description
Technical field
The invention belongs to spacecraft composite elctronics technical fields, and in particular to a kind of spacecraft switch matrix fault detection and
Positioning device.
Background technique
Switch control is the important circuit component part of spacecraft, and usual spacecraft switch control uses relay or MOS
Pipe etc. is realized, but either relay or metal-oxide-semiconductor has certain failure of removal mode, therefore can in order to enhance design
By property, the ON-OFF control circuit that can generally realize to relay or metal-oxide-semiconductor is held using the design method of serial or parallel connection to form
Matrix is closed, enhances the reliability of ON-OFF control circuit design with this.In addition to understanding the working condition of ON-OFF control circuit, need
The state of each way switch in ON-OFF control circuit is detected, in traditional switch working state detection method, usually
It is that the mode of quantity of state and telemetering amount is set using hall device or in ON-OFF control circuit in switching circuit to sentence
Whether disconnected switching circuit work is working properly, however the volume of hall device occupancy and area are big, and weight is also big, for a small amount of
The detection of electric switch circuit working condition still, but for the switching circuit in a large amount of switch matrix, is needed using a large amount of
Hall device will lead to the rising of deisgn product weight and volume, be unfavorable for the optimization of design, and set in ON-OFF control circuit
The mode for setting quantity of state and telemetering amount needs each way switch to be respectively provided with an independent state or telemetering amount, to occupy a large amount of
Telemetry-acquisition channel, this is for design resource limited on spacecraft can not be received, at the same no matter use Hall
The mode that still quantity of state is arranged in device in ON-OFF control circuit can only also reflect ON-OFF control circuit to a certain extent
Working condition cannot occur point to the switch fault in ON-OFF control circuit and position, this to the isolation of Spacecraft malfunction and
Recovery brings difficulty.
Summary of the invention
In view of this, the present invention provides a kind of spacecraft switch matrix fault detection and positioning device, it can be in not shadow
Detection and localization of fault are carried out to switch fault in the case where ringing switching circuit work.
Realize that technical scheme is as follows:
A kind of spacecraft switch matrix fault detection and positioning device, including self-test vector generation unit, one group or more
Self-test isolated location and one group or more of self-test state generation unit；Self-test isolated location and self-test state generate
Unit corresponds；
The self-test vector generation unit is for generating and respectively switching one-to-one test vector simultaneously in switch matrix
Switch matrix is delivered to, to the on or off of inductive switch in the test vector control switch matrix；
Every group of self-test isolated location is arranged between the adjacent two-stage switch of switch matrix, the self-test isolated location
Including self-test isolation module a and self-test isolation module b, the self-test state generation unit includes that self-test state generates
Module a and self-test state generation module b；Wherein, self-test isolation module a setting upper level switch in adjacent two-stage switch
Between user load, self-test isolation module b is arranged in adjacent two-stage switch between next stage switch and user load, from
Test isolation module a is used to that upper level switch in adjacent two-stage switch to be isolated with each road signal between user load,
And the signal after isolation is combined into and is conveyed to corresponding self-test state generation module a afterwards all the way；Self-test isolation module b
For each road signal between next stage switch and user load in adjacent two-stage switch to be isolated, and by the letter after isolation
It number is combined into and to be conveyed to corresponding self-test state generation module b afterwards all the way；
Self-test state generation module a receives the signal of self-test isolation module a conveying, and turns to the level state of signal
Self-test status signal a is obtained after changing, self-test state generation module b receives the signal of self-test isolation module b conveying, and right
Self-test status signal b is obtained after the level state conversion of signal, according to the self-test status signal a under each test vector and certainly
Test mode signal b is detected and is positioned to the failure of switch matrix；
When fault detection, under the control of test vector, all switches is all turned on respectively, is all off, each
Grade successively all turn on, successively all off operation at different levels, under each operation according to the self-test status signal a of acquisition and from survey
The state for trying status signal b detects the switches at different levels in switch matrix with the presence or absence of short circuit or open circuit fault；
If in n grades of switch matrix kth grade (k ∈ (1, n), n > 1) switch there are short troubles, then by 1~k-1 grades and
K+1~n grades of switches are all closed, and k grades of switches are all off, record self-test status signal a at this time and self-test state
Signal b later successively disconnects k+1~n grades of parallel relationship switches, and each operation guarantees that only paralleling switch is in disconnection all the way
State, and as k=n, the operation switched to k+1~n grades is substituted by operating to 1~k-1 grades of switches, and operation is according to survey certainly every time
Try the self-test status signal a recorded when status signal a and self-test status signal b switchs all off with k grades respectively and oneself
Whether test mode signal b, which compares to change, judges k grades of road switch with the presence or absence of short trouble, if any one state becomes
Change, illustrates that there are short troubles；
If in n grades of switch matrix kth grade (k ∈ (1, n), n > 1) switch there are open circuit faults, then by 1~k-1 grades and
K+1~n grades of switches are all closed, and k grades of switches are all off, record self-test status signal a at this time and self-test state
Kth grade switch is successively closed by signal b later, while k+1~n grades of parallel relationship switches successively being disconnected, and operation guarantees every time
Only the k grade switch of paralleling switch is in closure all the way, and k+1~n grades of switches, which are in, to be disconnected, and as k=n, to k+1~n grades
The operation of switch is by 1~k-1 grades of switch operation substitutions, operation is believed according to self-test status signal a and self-test state every time
Whether change compared with self-test status signal a and self-test status signal b that number b is recorded when k grades of switches are all off respectively
Judge that k grades of road switch illustrates that there are open circuit faults if state is unchanged with the presence or absence of open circuit fault.
Further, to switch conduction and shutdown when the self-test vector generation unit is worked normally according to switch matrix
Control mode generate test vector.
Further, the self-test isolation module a and self-test isolation module b by diode, triode, optocoupler or
The isolation of magnetic coupling realization signal.
Further, in the self-test isolation module a, in adjacent two-stage switch upper level switch and user load it
The road Jian Ge signal realizes the isolation of signal by being separately connected more than one concatenated diode, and the signal after isolation is combined into one
Road simultaneously exports, and all diodes in self-test isolation module a are in the same direction；In self-test isolation module b, user load with it is adjacent
Each road signal in two-stage switch between next stage switch realizes signal by being separately connected more than one concatenated diode
Isolation, the signal after isolation are combined into all the way and export, and all diodes in self-test isolation module b are in the same direction；Self-test isolation
The diode of module a is contrary with the diode of self-test isolation module b.
Further, the self-test isolation module a and self-test isolation module b utilizes optocoupler that self-test is isolated single
The signal of member output is converted into photoelectric current, i.e. generation self-test status signal.
The utility model has the advantages that
(1) this fault detection and positioning device compensate for the defect that abort situation can not be accurately positioned in switching circuit,
Self-test isolated location and self-test state generation unit are increased in switch matrix circuit, it is only necessary to which the circuit overhead of very little is
Achievable fault detection and positioning to switches all in circuit matrix can be to switch convenient for design realization and design optimization
The position that short circuit and open circuit fault detect and positioning failure occurs.
(2) when switch control and switch matrix needed for the test vector in this fault detection and positioning device work normally
Required switch control mode is consistent, simplifies the design of test vector, and can be real by the design of simple test vector
Now comprehensive test coverage.
(3) the self-test isolated location of this fault detection and positioning device realizes signal isolation function using diode, no
Electric energy is expended, and the arrangement design of diode combines self-test state in self-test isolation module a and self-test isolation module b
The self-test status signal of generation module a and self-test state generation module b can accurately detect investigation be out of order type and
Position occurs.
(4) the self-test isolated location of this fault detection and positioning device passes through more than two concatenated diodes realizations pair
The isolation of each path switching signal enhances the reliability of self-test isolated location.
(5) operating current of the self-test state generation unit (i.e. optocoupler) of this fault detection and positioning device is only a few millis
Peace, can almost ignore compared with the operating current of switch matrix, so during switching circuit works normally in switch matrix,
Apparatus of the present invention will not generate any influence to switching circuit.
(6) this fault detection and positioning device can be accurately positioned the position broken down, and mention for the isolation and recovery of failure
Supplied technical foundation, compared to the master backup switching mode of traditional extensive style, can only to the switching circuit to break down carry out every
From and restore, improve the utilization efficiency of circuit.
Detailed description of the invention
Fig. 1 is switch matrix fault detection of the present invention and positioning device theory of constitution figure.
Fig. 2 is switch matrix fault detection of the present invention and positioning device embodiment schematic diagram.
Specific embodiment
The present invention will now be described in detail with reference to the accompanying drawings and examples.
As shown in Figure 1, the present invention provides a kind of spacecraft switch matrix fault detection and positioning device, including self-test
The self-test state generation unit of vector generation unit, one group or more of self-test isolated location and one group or more；Self-test every
It is corresponded from unit and self-test state generation unit；
The self-test vector generation unit is for generating and respectively switching one-to-one test vector simultaneously in switch matrix
Switch matrix is delivered to, to the on or off of inductive switch in the test vector control switch matrix；The test vector is only
Independent switch is connected or is turned off control.When the self-test vector generation unit can be worked normally with switch matrix
Switch control unit unification, test vector control switch conducting with shutdown control mode and switch matrix work normally
When it is consistent with the control mode of shutdown to switch conduction, in the case where not increasing circuit overhead realize switch matrix self-test
Function, self-test vector generation unit output test vector signal into switch matrix, to each way switch in switch matrix into
The operation of row on or off.
Every group of self-test isolated location is arranged between the adjacent two-stage switch of switch matrix, and arbitrary neighborhood two-stage switchs
Between be provided with user load, the self-test isolated location includes self-test isolation module a and self-test isolation module b,
The self-test state generation unit includes self-test state generation module a and self-test state generation module b；Wherein, from survey
It tries isolation module a setting upper level in adjacent two-stage switch to switch between user load, self-test isolation module b setting exists
In adjacent two-stage switch between next stage switch and user load, self-test isolation module a is used for in adjacent two-stage switch
Level-one switch is isolated with each road signal between user load, and the signal after isolation is combined into be conveyed to afterwards all the way and its
Corresponding self-test state generation module a；Self-test isolation module b is used for next stage switch and user in adjacent two-stage switch
Each road signal between load is isolated, and the signal after isolation is combined into and is conveyed to corresponding self-test shape afterwards all the way
State generation module b.
The self-test isolation module a and self-test isolation module b is realized by diode, triode, optocoupler or magnetic coupling
The isolation of signal.
Each road in the self-test isolation module a, in adjacent two-stage switch between upper level switch and user load
Signal realizes the isolation of signal by being separately connected more than one concatenated diode, and the signal after isolation is combined into all the way and defeated
Out, all diodes in self-test isolation module a are in the same direction；In self-test isolation module b, user load is opened with adjacent two-stage
Each road signal between the next stage switch of the Central Shanxi Plain realizes the isolation of signal by being separately connected more than one concatenated diode, every
Signal from after is combined into all the way and exports, and all diodes in self-test isolation module b are in the same direction；Self-test isolation module a's
Diode is contrary with the diode of self-test isolation module b.
As on or off of the test vector to switches different in switch matrix controls, the road switch matrix Zhong Ge signal
Also can on or off therewith, signal of the self-test isolated location to conducting and the shutdown of path switching signal each in switch matrix
State is isolated, and signal after isolation is combined into all the way, if only having a switch, the switch matrix in switch matrix
Fault detection and positioning device can not include self-test isolation circuit.
According to the series-parallel relationship switched in switch matrix, may include in a switch matrix fault detection and positioning device
1 or multiple groups self-test isolated location and self-test state generation unit, pass through the state of the self-test status signal of multiple generations
And mutual relationship is detected and is positioned to each switch fault in switch matrix.For in parallel in switch matrix
The switch of relationship shares one group of self-test isolated location and one group of self-test state generation unit with the switch of level-one, for
The switch of series relationship in switch matrix is in switch not at the same level, need that independent self-test is arranged for concatenated switch
Isolated location and self-test state generation unit.
Self-test state generation module a receives the signal of self-test isolation module a conveying, and turns to the level state of signal
Self-test status signal a is obtained after changing, self-test state generation module b receives the signal of self-test isolation module b conveying, and right
Self-test status signal b is obtained after the level state conversion of signal, according to the self-test status signal a under each test vector and certainly
Test mode signal b is detected and is positioned to the failure of switch matrix.The self-test isolation module a and self-test isolation mode
Block b converts photoelectric current for the signal that self-test isolated location exports using optocoupler, i.e. generation self-test status signal.
The self-test state generation unit can be can be greatly reduced by generating self-test status signal for the signal after combining
The expense of middle circuit.The conducting and shutdown that switch in switch matrix are controlled according to test vector, generate corresponding self-test
State, each test vector can generate a self-test state, by the acquisition and judgement to self-test state, in conjunction with being grasped
The test vector of work, judges whether the way switch breaks down, and after judgement, continues the execution of next test vector, directly
Position is finished to by switch detections all in switch matrix.
When fault detection, under the control of test vector, all switches is all turned on respectively, is all off, each
Grade successively all turn on, successively all off operation at different levels, under each operation according to the self-test status signal a of acquisition and from survey
The state for trying status signal b detects the switches at different levels in switch matrix with the presence or absence of short circuit or open circuit fault；
If in n grades of switch matrix kth grade (k ∈ (1, n), n > 1) switch there are short troubles, then by 1~k-1 grades and
K+1~n grades of switches are all closed, and k grades of switches are all off, record self-test status signal a at this time and self-test state
Signal b later successively disconnects k+1~n grades of parallel relationship switches, and each operation guarantees that only paralleling switch is in disconnection all the way
State, and as k=n, the operation switched to k+1~n grades is substituted by operating to 1~k-1 grades of switches, and operation is according to survey certainly every time
Try the self-test status signal a recorded when status signal a and self-test status signal b switchs all off with k grades respectively and oneself
Whether test mode signal b, which compares to change, judges k grades of road switch with the presence or absence of short trouble, if any one state becomes
Change, illustrates that there are short troubles；
If in n grades of switch matrix kth grade (k ∈ (1, n), n > 1) switch there are open circuit faults, then by 1~k-1 grades and
K+1~n grades of switches are all closed, and k grades of switches are all off, record self-test status signal a at this time and self-test state
Kth grade switch is successively closed by signal b later, while k+1~n grades of parallel relationship switches successively being disconnected, and operation guarantees every time
Only the k grade switch of paralleling switch is in closure all the way, and k+1~n grades of switches, which are in, to be disconnected, and as k=n, to k+1~n grades
The operation of switch is by 1~k-1 grades of switch operation substitutions, operation is believed according to self-test status signal a and self-test state every time
Whether change compared with self-test status signal a and self-test status signal b that number b is recorded when k grades of switches are all off respectively
Judge that k grades of road switch illustrates that there are open circuit faults if state is unchanged with the presence or absence of open circuit fault.
Specific embodiments of the present invention are as follows:
As shown in Fig. 2, sharing 2n switch in switch matrix, wherein n switch for level-one, and n are 2 grades of switches, at 1 grade
It is user load between switch and 2 grades of switches, this switch matrix typically can be applied in the power driving circuit of spacecraft,
It is wherein series relationship between 1 grade of the road switch matrix Zhong Mei switch and 2 grades of switches, switchs it thus for 1 grade of switch and 2 grades
Between 1 self-test isolated location and self-test state generation unit are set, wherein from the self-test isolation surveyed in isolated location
Unit a is located between user load circuit and 1 grade of switch, and all diodes in self-test isolation module a are in the same direction and diode
Cathode is connect with switching signal；It is located between user load circuit and 2 grades of switches from isolated location b is surveyed, self-test isolation module b
In all diodes in the same direction and diode cathode connect with switching signal, the self-test state in self-test state generation unit
Generation unit a is located at from surveying between isolated location a and state generation power supply, is located at self-test isolation from state generation unit b is surveyed
Between unit b and power ground.Self-test vector generation unit can be realized using processor or FPGA design, be surveyed to be produced from
It trying vector and on or off control is carried out to the switch in switch matrix, self-test isolated location is realized using diode design,
Be isolated by the one-way conduction characteristic of diode between path switching signal each in switch matrix, in order to enhance self-test every
Reliability from unit is realized the isolation to switching signal by two concatenated diodes, and is set for the switch of series relationship
Independent self-test isolated location is set, while being sent to self-test state after the switching signal after isolation is combined and generating list
Member, self-test state generation unit generate the self-test status signal of corresponding level according to the switching signal after combining, and will be certainly
Test mode signal is sent to self-test vector generation unit, by self-test vector generation unit according to self-test status signal and
Whether test vector comes with the presence of switch failure in comprehensive descision switch matrix, and specific implementation steps are as described below.
(1) fault detection
As shown in Fig. 2, by switch matrix it is all 1 grades switch and 2 grades switch be set as it is all off, all closure,
Switches at different levels successively all closure, switch successively all off state at different levels, according to self-test state generation unit generate from
Test mode signal carries out initial decision to the switch fault state in switch matrix, specific as follows:
(a) 1 grade of switch and 2 grades of switches are placed in all off state
I. it is ' 00 ' that self-test, which generates state: representing 1 grade of switch, there are short troubles, and there are short troubles for 2 grades of switches, and
1 grade of switch is located at 2 grades of switch faults does not go the same way；
Ii. it is ' 01 ' that self-test, which generates state: representing 1 grade of switch there are short trouble, 2 grades of switches are normal；
Iii. it is ' 10 ' that self-test, which generates state: representing 1 grade of switch normally, there are short troubles for 2 grades of switches；
Iv. it is ' 11 ' that self-test, which generates state: normal condition；
(b) 1 grade of switch and 2 grades of switches are placed in whole closed states
I. it is ' 00 ' that self-test, which generates state: representing 1 grade of switch, there are open circuit faults, and there are open circuit faults for 2 grades of switches, and
1 grade of switch is located at 2 grades of switch faults does not go the same way；
Ii. it is ' 01 ' that self-test, which generates state: representing 1 grade of switch normally, there are open circuit faults for 2 grades of switches；
Iii. it is ' 10 ' that self-test, which generates state: representing 1 grade of switch there are open circuit fault, 2 grades of switches are normal；
Iv. it is ' 11 ' that self-test, which generates state: normal condition；
(c) 1 grade of switch is placed in all off state, 2 grades of switches are placed in whole closed states
I. it is ' 00 ' that self-test, which generates state: representing 1 grade of switch, there are short troubles, and there are open circuit faults for 2 grades of switches, and
1 grade of switch and 2 grades of switch faults are located at all the way, being multiple failure；
Ii. self-test generation state is ' 01 ': representing 1 grade of switch, all there are short troubles, and 2 grades have open circuit event
There are short troubles for barrier or 1 grade of switch, and all there are open circuit faults for 2 grades of switches；
Iii. it is ' 10 ' that self-test, which generates state: normal condition；
Iv. it is ' 11 ' that self-test, which generates state: representing 1 grade of switch, all there are short troubles or 2 grades of switches all to exist
Open circuit fault；
(d) 1 grade of switch is placed in whole closed states, 2 grades of switches are placed in all off state
I. it is ' 00 ' that self-test, which generates state: representing 1 grade of switch, there are open circuit faults, and there are short troubles for 2 grades of switches, and
1 grade of switch and 2 grades of switch faults are located at all the way, being multiple failure；
Ii. it is ' 01 ' that self-test, which generates state: normal condition；
Iii. self-test generation state is ' 10 ': representing 1 grade of switch, all there are open circuit faults, and 2 grades have short circuit event
There are open circuit faults for barrier or 1 grade of switch, and all there are short troubles for 2 grades of switches；
Iv. it is ' 11 ' that self-test, which generates state: representing 1 grade of switch, all there are open circuit faults or 2 grades of switches all to exist
Short trouble.
(2) fault location
The fault type according to detected by fault detection realizes the circuit break and short circuit at different levels and each way switch respectively
Fault location, specific as follows:
(a) 1 grade of switch short fault location
I. 1 grade of switch is placed in all off state, 2 grades of switches are placed in whole closed states, and self-test generates state and is
‘10'；
Ii. 2 grades of switches are successively turned off and (guarantees that operation only has 2 grades of 1 tunnel switch in an off state every time), work as self-test
When generation state becomes ' 00 ', illustrate that there are short troubles for 1 grade of road switch；
(b) 2 grades of switch short fault location
I. 2 grades of switches are placed in all off state, 1 grade of switch is placed in whole closed states, and self-test generates state and is
‘01'；
Ii. 1 grade of switch is successively turned off and (guarantees that operation only has 1 grade of 1 tunnel switch in an off state every time), work as self-test
When generation state becomes ' 00 ', illustrate that there are short troubles for 2 grades of road switch；
(c) 1 grade of switch open circuit fault positioning
I. 1 grade of switch is placed in all off state, 2 grades of switches are placed in whole closed states, and self-test generates state and is
‘10'；
Ii. 1 grade of switch is successively closed, while by with 2 grades of switches all the way, successively shutdown (guarantees operation every time only 1
1 grade of road closes the switch, 2 grades of switch OFFs), when self-test, which generates state, becomes ' 00 ', illustrate that there is no disconnected for 1 grade of road switch
Road failure illustrates that there are open circuit faults for 1 grade of road switch when self-test, which generates state, not to be changed；
(d) 2 grades of switch open circuit fault positioning
I. 2 grades of switches are placed in all off state, 1 grade of switch is placed in whole closed states, and self-test generates state and is
‘01'；
I. 2 grades of switches are successively closed, while by with 1 grade of switch all the way, successively shutdown (guarantees that operation only has 1 tunnel every time
2 grades close the switch, 1 grade of switch OFF), when self-test, which generates state, becomes ' 00 ', illustrate that there is no open circuits for 2 grades of road switch
Failure illustrates that there are open circuit faults for 2 grades of road switch when self-test, which generates state, not to be changed.
In conclusion the above is merely preferred embodiments of the present invention, being not intended to limit the scope of the present invention.
All within the spirits and principles of the present invention, any modification, equivalent replacement, improvement and so on should be included in of the invention
Within protection scope.
Claims (5)
1. a kind of spacecraft switch matrix fault detection and positioning device, which is characterized in that including self-test vector generation unit,
The self-test state generation unit of one group or more of self-test isolated location and one group or more；Self-test isolated location and self-test
State generation unit corresponds；
The self-test vector generation unit is for generating and respectively switching one-to-one test vector in switch matrix and convey
To switch matrix, to the on or off of inductive switch in the test vector control switch matrix；
Every group of self-test isolated location is arranged between the adjacent two-stage switch of switch matrix, and the self-test isolated location includes
Self-test isolation module a and self-test isolation module b, the self-test state generation unit include self-test state generation module
A and self-test state generation module b；Wherein, self-test isolation module a setting upper level switch and use in adjacent two-stage switch
Between the load of family, self-test in adjacent two-stage switch between next stage switch and user load is arranged in self-test isolation module b
Isolation module a is used to that upper level switch in adjacent two-stage switch to be isolated with each road signal between user load, and will
Signal after isolation is combined into is conveyed to corresponding self-test state generation module a afterwards all the way；Self-test isolation module b is used for
Each road signal in adjacent two-stage switch between next stage switch and user load is isolated, and the signal after isolation is closed
To be conveyed to corresponding self-test state generation module b afterwards all the way；
Self-test state generation module a receive self-test isolation module a conveying signal, and to the level state of signal conversion after
Self-test status signal a is obtained, self-test state generation module b receives the signal of self-test isolation module b conveying, and to signal
Level state conversion after obtain self-test status signal b, according under each test vector self-test status signal a and self-test
Status signal b is detected and is positioned to the failure of switch matrix；
When fault detection, under the control of test vector, all switches are all turned on respectively, all off, Ge Jiyi
Secondary conducting, successively shutdown operation at different levels, according to the self-test status signal a of acquisition and self-test status signal b under each operation
State to the switches at different levels in switch matrix with the presence or absence of short circuit or open circuit fault detect；
If there are short trouble, k ∈ (1, n), n > 1, then by 1~k-1 grades and k+1 for kth grade switch in n grades of switch matrix
~n grades of switch is all closed, and k grades of switches are all off, records self-test status signal a and self-test status signal at this time
B later successively disconnects k+1~n grades of parallel relationship switches, and each operation guarantees that only paralleling switch is in disconnection shape all the way
State, and as k=n, the operation switched to k+1~n grades is substituted by operating to 1~k-1 grades of switches, and operation is according to survey certainly every time
Try the self-test status signal a recorded when status signal a and self-test status signal b switchs all off with k grades respectively and oneself
Whether test mode signal b, which compares to change, judges k grades of road switch with the presence or absence of short trouble, if any one state becomes
Change, illustrates that there are short troubles；
If there are open circuit fault, k ∈ (1, n), n > 1, then by 1~k-1 grades and k+1 for kth grade switch in n grades of switch matrix
~n grades of switch is all closed, and k grades of switches are all off, records self-test status signal a and self-test status signal at this time
Kth grade switch is successively closed by b later, while k+1~n grades of parallel relationship switches successively being disconnected, and operation guarantees only have every time
In closure, k+1~n grades of switches are in be disconnected the k grade switch of paralleling switch, and as k=n, is switched to k+1~n grades all the way
Operation by 1~k-1 grades of switches operation substitution, operation is according to self-test status signal a and self-test status signal b every time
Whether change judgement compared with the self-test status signal a and self-test status signal b that record when k grades of switches are all off respectively
K grades of road switch illustrates that there are open circuit faults if state is unchanged with the presence or absence of open circuit fault.
2. a kind of spacecraft switch matrix fault detection as described in claim 1 and positioning device, which is characterized in that it is described from
Test vector is generated to the control mode of switch conduction and shutdown when test vector generation unit is worked normally according to switch matrix.
3. a kind of spacecraft switch matrix fault detection as described in claim 1 and positioning device, which is characterized in that it is described from
Test the isolation that isolation module a and self-test isolation module b realizes signal by diode, triode, optocoupler or magnetic coupling.
4. a kind of spacecraft switch matrix fault detection as claimed in claim 1 or 3 and positioning device, which is characterized in that
In the self-test isolation module a, each road signal in adjacent two-stage switch between upper level switch and user load is by dividing
Do not connect the isolation that more than one concatenated diode realizes signal, the signal after isolation is combined into all the way and exports, self-test every
It is in the same direction from all diodes in module a；In self-test isolation module b, next stage in user load and adjacent two-stage switch
Each road signal between switch realizes the isolation of signal, the signal after isolation by being separately connected more than one concatenated diode
It is combined into all the way and exports, all diodes in self-test isolation module b are in the same direction；The diode of self-test isolation module a with from
The diode for testing isolation module b is contrary.
5. a kind of spacecraft switch matrix fault detection as described in claim 1 and positioning device, which is characterized in that it is described from
Test isolation module a and self-test isolation module b converts photoelectricity for the signal that self-test isolated location exports using optocoupler
Stream, i.e. generation self-test status signal.
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| CN108092850A (en) * | 2017-12-12 | 2018-05-29 | 郑州云海信息技术有限公司 | A kind of cluster server method for diagnosing faults and system based on heartbeat mechanism |
| CN109946556B (en) * | 2018-12-25 | 2024-05-14 | 江苏核电有限公司 | Nuclear power station switch cabinet public alarm quick positioning device and positioning method thereof |
| CN113985250B (en) * | 2021-10-27 | 2023-05-23 | 无锡中微亿芯有限公司 | Switching value full-coverage test method for switch matrix in FPGA chip |
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| DE10106556B4 (en) * | 2001-02-13 | 2004-07-22 | Infineon Technologies Ag | Semiconductor module with an arrangement for self-testing a plurality of interface circuits and use of the semiconductor module in a test method |
| JP2013140075A (en) * | 2012-01-04 | 2013-07-18 | Advantest Corp | Test circuit and tester |
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