CN108089567B - Semiconductor dry-wet contact fault diagnosis circuit and diagnosis method - Google Patents

Semiconductor dry-wet contact fault diagnosis circuit and diagnosis method Download PDF

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Publication number
CN108089567B
CN108089567B CN201711310024.7A CN201711310024A CN108089567B CN 108089567 B CN108089567 B CN 108089567B CN 201711310024 A CN201711310024 A CN 201711310024A CN 108089567 B CN108089567 B CN 108089567B
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dry
switch tube
semiconductor switch
wet
feedback signal
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CN108089567A (en
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王志云
王世权
陶扬
付伟
黄茨
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CHENGDU YUANDA TECHNOLOGY Co Ltd
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CHENGDU YUANDA TECHNOLOGY Co Ltd
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)

Abstract

The invention discloses a semiconductor dry and wet contact fault diagnosis circuit which comprises a semiconductor switch tube U2_1, a dry and wet contact Q1_1 and a semiconductor switch tube U3_1, wherein the input end of the semiconductor switch tube U2_1 is used for receiving a driving signal, the output end of the semiconductor switch tube U2_1 controls the on and off of the dry and wet contact Q1_1, the input end of the semiconductor switch tube U3_1 is connected with the dry and wet contact Q1_1, and the output end of the semiconductor switch tube U3_1 outputs a feedback signal; when the dry-wet junction Q1_1 is turned on, the output end of the semiconductor switch tube U3_1 outputs an effective feedback signal, and when the dry-wet junction Q1_1 is turned off, the output end of the semiconductor switch tube U3_1 outputs an ineffective feedback signal. The dry and wet joint judging method is simple, the control chip judges whether the dry joint is normal or not by comparing the states of the driving signal and the feedback signal, and if the driving signal and the feedback signal are not present at the same time or not, the dry joint can be judged to be normal; if the effective states of the driving signal and the feedback signal are inconsistent, the fault of the dry contact can be judged.

Description

semiconductor dry-wet contact fault diagnosis circuit and diagnosis method
Technical Field
The invention relates to the field of logic control of rail transit vehicle-mounted equipment, in particular to a semiconductor dry and wet junction fault diagnosis circuit and a diagnosis method.
Background
The conventional dry and wet contact usually adopts an electromagnetic relay, but with the improvement of reliability requirements, such as the improvement of rail transit vehicle-mounted control equipment concerning personal safety, the defect of high intrinsic failure rate of the relay cannot meet the requirement of high reliability, and high and new technology enterprises begin to adopt a semiconductor Logic Control Unit (LCU) to replace the conventional electromagnetic relay scheme.
In the existing LCU system, the traditional time relay and intermediate relay are replaced by semiconductor devices with obvious reliability advantages for input and output, an input circuit carries out photoelectric isolation sampling on 110V input and then sends the sampled 110V input to a control chip for processing, a driving signal is given to a channel to be opened, a semiconductor switching tube is driven to be conducted after photoelectric isolation, and meanwhile, the conducting state is isolated and fed back to the control chip for fault self-diagnosis.
However, the detection of the dry contact and the wet contact in the existing LCU system can only be separately detected, the detection of the wet contact in the existing technology must rely on the voltage (+110V) of the front end of the wet contact to realize output feedback, and for the dry contact, because the front end may not have voltage, the detection circuit of the wet contact cannot be effectively used; in the prior art, no effective solution is available for fault diagnosis of a semiconductor dry contact, a switching tube front end feedback method is generally adopted in compromise, but the design has the defect that only the driving front end fault can be diagnosed, and faults such as breakdown and the like of the switching tube cannot be effectively diagnosed.
Disclosure of Invention
the invention aims to solve the technical problem that the prior art can only separately detect dry and wet joints, and aims to provide a fault diagnosis circuit and a fault diagnosis method for the dry and wet joints of a semiconductor, which can detect the dry joints and the wet joints.
The invention is realized by the following technical scheme:
A semiconductor dry and wet contact fault diagnosis circuit comprises a semiconductor switch tube U2_1, a dry and wet contact Q1_1 and a semiconductor switch tube U3_1, wherein the input end of the semiconductor switch tube U2_1 is used for receiving a driving signal, the output end of the semiconductor switch tube U2_1 is used for controlling the on and off of the dry and wet contact Q1_1, the input end of the semiconductor switch tube U3_1 is connected with the dry and wet contact Q1_1, and the output end of the semiconductor switch tube U3_1 outputs a feedback signal; when the dry-wet junction Q1_1 is turned on, the output end of the semiconductor switch tube U3_1 outputs an effective feedback signal, and when the dry-wet junction Q1_1 is turned off, the output end of the semiconductor switch tube U3_1 outputs an ineffective feedback signal.
Further, the semiconductor switch tube U2_1 adopts an optical coupler, the dry-wet joint Q1_1 adopts one of an MOS tube, an IGBT and a thyristor, and the semiconductor switch tube U3_1 adopts an optical coupler.
Further, the semiconductor dry and wet joint fault diagnosis circuit further comprises a dry and wet joint driving chip U1_1, wherein an input end of the semiconductor switch tube U2_1 receives a driving signal, the driving signal transmits the driving signal to the dry and wet joint driving chip U1_1 through photoelectric conversion of the semiconductor switch tube U2_1, the dry and wet joint driving chip U1_1 is connected to a control end of the dry and wet joint Q1_1, and the dry and wet joint driving chip U1_1 drives the dry and wet joint Q1_1 to be conducted; the anode of the light emitting diode of the semiconductor switch tube U3_1 and the dry and wet contact driving chip U1_1 are connected with the same driving power supply, and the cathode of the light emitting diode of the semiconductor switch tube U3_1 is connected with the input end of the dry and wet contact Q1_ 1; the semiconductor switch tube U3_1 is used for converting the state of the dry-wet joint Q1_1 into a feedback signal and outputting the feedback signal to the control chip.
Furthermore, a diode D2_1 and a resistor R4_1 are sequentially connected to a line connecting the driving power supply and the semiconductor switch tube U3_1, an anode of the diode D2_1 is connected to the driving power supply, a cathode of the diode D2_1 is connected to the resistor R4_1, and the other end of the resistor R4_1, which is connected to the end of the diode D2_1, is connected to an anode of the light emitting diode of the semiconductor switch tube U3_ 1.
When the driving signal of the semiconductor switch tube U2_1 is active and the feedback signal of the semiconductor switch tube U3_1 is active, the dry-wet contact Q1_1 is in a normal state; when the driving signal of the semiconductor switch tube U2_1 is invalid and the feedback signal of the semiconductor switch tube U3_1 is invalid, the state of the dry-wet joint Q1_1 is normal; when the driving signal of the semiconductor switch tube U2_1 is effective and the feedback signal of the semiconductor switch tube U3_1 is ineffective, the dry-wet contact Q1_1 fails; when the driving signal of the semiconductor switch tube U2_1 is invalid and the feedback signal of the semiconductor switch tube U3_1 is valid, the dry-wet junction Q1_1 fails.
Compared with the prior art, the invention has the following advantages and beneficial effects:
1. The invention takes the dry and wet joint as the return flow path, and carries out independent fault self-diagnosis on the dry and wet joint, and the fault condition of the dry and wet joint is fed back most directly;
2. The dry and wet joint judging method is simple, the control chip judges whether the dry joint is normal or not by comparing the states of the driving signal and the feedback signal, and if the driving signal and the feedback signal are not present at the same time or not, the dry joint can be judged to be normal; if the effective states of the driving signal and the feedback signal are inconsistent, the fault of the dry contact can be judged;
3. According to the invention, fault self-diagnosis can be realized most simply only by the dry and wet contact, without providing external inquiry voltage, inquiry power ground or any other auxiliary voltage or ground;
4. The invention has the characteristics of simple structure, reliable work, economy and practicality.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principles of the invention. In the drawings:
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a block diagram of the input/output channel of the LCU system;
FIG. 3 is a prior art diagnostic scheme for a semiconductor wet contact;
Fig. 4 is a prior art dry junction diagnostic scheme.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.
Fig. 2 is a block diagram of the input/output channel of the LCU system, in which the conventional time relay and intermediate relay are replaced by semiconductor devices with obvious reliability advantages for both input and output, the input circuit performs photoelectric isolation sampling on 110V input, and sends the sampled input to the control chip for processing, and gives a driving signal to the channel to be opened, and after photoelectric isolation, drives the semiconductor switch tube to conduct, and simultaneously feeds back the conduction state isolation to the control chip for fault self-diagnosis.
for the semiconductor wet pad in the LCU system, the fault feedback solution as shown in fig. 3 is available in the prior art, but the solution has the limitation that the voltage (+110V) of the front end of the wet pad is required to realize the output feedback, and for the dry pad, the circuit cannot be effectively used because the front end may not have the voltage.
At present, no effective solution exists for fault diagnosis of the semiconductor dry contact, and the general compromise is to adopt a method of switching tube front end feedback, as shown in fig. 4. However, the design has the defect that only the drive front end fault can be diagnosed, and the faults, such as breakdown and the like, of the switching tube can not be effectively diagnosed.
Examples
As shown in fig. 1, a semiconductor dry and wet contact fault diagnosis circuit includes a semiconductor switching tube U2_1, a dry and wet contact Q1_1, and a semiconductor switching tube U3_1, an input end of the semiconductor switching tube U2_1 is used for receiving a driving signal, an output end of the semiconductor switching tube U2_1 controls on and off of the dry and wet contact Q1_1, an input end of the semiconductor switching tube U3_1 is connected to the dry and wet contact Q1_1, and an output end of the semiconductor switching tube U3_1 outputs a feedback signal; when the dry-wet junction Q1_1 is turned on, the output end of the semiconductor switch tube U3_1 outputs an effective feedback signal, and when the dry-wet junction Q1_1 is turned off, the output end of the semiconductor switch tube U3_1 outputs an ineffective feedback signal.
the semiconductor switch tube U2_1 adopts an optical coupler, the dry and wet contact Q1_1 adopts one of an MOS tube, an IGBT and a thyristor, the dry and wet contact Q1_1 adopts an MOS tube in the embodiment, and the semiconductor switch tube U3_1 adopts an optical coupler.
The semiconductor dry and wet contact fault diagnosis circuit further comprises a dry and wet contact driving chip U1_1, wherein an input end of a semiconductor switch tube U2_1 receives a driving signal, the driving signal transmits the driving signal to the dry and wet contact driving chip U1_1 through photoelectric conversion of the semiconductor switch tube U2_1, the dry and wet contact driving chip U1_1 is connected to a control end of a dry and wet contact Q1_1, and the dry and wet contact driving chip U1_1 drives the dry and wet contact Q1_1 to be conducted; the anode of the light emitting diode of the semiconductor switch tube U3_1 and the dry and wet contact driving chip U1_1 are connected with the same driving power supply, and the cathode of the light emitting diode of the semiconductor switch tube U3_1 is connected with the input end of the dry and wet contact Q1_ 1; the semiconductor switch tube U3_1 is used for converting the state of the dry-wet joint Q1_1 into a feedback signal and outputting the feedback signal to the control chip.
a diode D2_1 and a resistor R4_1 are further connected in sequence to a line connecting the driving power supply and the semiconductor switch tube U3_1, the anode of the diode D2_1 is connected to the driving power supply, the cathode of the diode D2_1 is connected to the resistor R4_1, and the other end of the resistor R4_1, which is connected to the end of the diode D2_1, is connected to the anode of the light emitting diode of the semiconductor switch tube U3_ 1.
when a driving signal of a semiconductor switch tube U2_1 is effective and a feedback signal of the semiconductor switch tube U3_1 is effective, the state of a dry and wet contact Q1_1 is normal; when the driving signal of the semiconductor switch tube U2_1 is invalid and the feedback signal of the semiconductor switch tube U3_1 is invalid, the state of the dry-wet joint Q1_1 is normal; when the driving signal of the semiconductor switch tube U2_1 is effective and the feedback signal of the semiconductor switch tube U3_1 is ineffective, the dry-wet contact Q1_1 fails; when the driving signal of the semiconductor switch tube U2_1 is invalid and the feedback signal of the semiconductor switch tube U3_1 is valid, the dry-wet junction Q1_1 fails.
The voltage difference between the driving power supply of the dry and wet contact driving chip and the negative end of the power supply is about 14V. The driving power source is connected to the D end of the dry and wet joint Q1_1 through a reverse-flow prevention diode D2_1, a current limiting resistor R4_1 and a feedback isolation optocoupler, namely a light emitting diode of a semiconductor switch tube U3_1, and then is connected to the S end through the switch tube to form a return flow path. The feedback isolation optocoupler, namely the semiconductor switch tube U3_1 feeds back a feedback signal to the control chip through a pin 3. When the driving signal is effective, the dry and wet contact driving chip drives the dry contact Q1_1 to be conducted, the dry and wet contact Q1_1 is conducted to the input end and the output end, meanwhile, as the DS of Q1_1 is conducted, current flows into the ground through the driving power supply, the D2_1, the R4_1, the input side of U3_1 and the drain source DS end of Q1_1 to form a passage, the feedback isolation optocoupler, namely the semiconductor switch tube U3_1 is driven, and the feedback signal is pulled high and sent back to the control chip. When the driving signal is invalid, the dry and wet contact driving chip controls the dry contact Q1_1 to be turned off, so that the dry and wet contact is disconnected with the output end, meanwhile, a feedback isolation optocoupler, namely a semiconductor switching tube U3_1, does not form a passage at the input side, the output side is kept turned off, the feedback signal is low, and the feedback signal is sent back to the control chip.
The semiconductor dry contact circuit has two recognizable failure modes, and the diagnosis implementation method of the invention is as follows:
And if the first fault occurs, the driving signal of the control chip is effective, and the feedback signal is ineffective, the dry and wet contact is kept disconnected to be in a fault state.
The detection mode is as follows: after a driving power supply is input to an input end through D2_1, R4_1 and U3_1, the driving power supply is disconnected at a dry contact Q1_1, current cannot flow back to the ground end, a current path does not exist, a feedback isolation optocoupler, namely a semiconductor switch tube U3_1 cannot be driven, a feedback signal is low, at the moment, a driving signal sent by a control chip is high, and the control chip judges the dry-wet contact fault.
and if the second fault occurs, the driving signal of the control chip is invalid, and the feedback signal is valid, the dry contact is conducted to be in a fault state.
The detection mode is as follows: after a driving power supply is input to an input end through D2_1, R4_1 and U3_1, a dry contact and a wet contact are conducted, current flows back to the ground end, a feedback isolation optocoupler, namely a semiconductor switch tube U3_1, is driven, a feedback signal is high, at the moment, a driving signal sent by a control chip is low, and the control chip judges the dry contact fault.
The whole process can be summarized as that when the driving signal is effective, the dry contact is conducted, and the conducted feedback signal is sent back to the control chip in a high mode; when the driving signal is invalid, the dry contact is turned off, and the off feedback signal is sent back to the control chip in a low state. If the plurality of contacts have faults, the corresponding relation between the driving signal and the feedback signal cannot be realized, and the main control chip judges whether the dry contact has faults or not by comparing the states of the driving signal and the feedback signal. Table 1 shows the correspondence between the drive signal and the feedback signal of the semiconductor dry contact of the LCU system.
TABLE 1 LCU System semiconductor Dry contact drive Signal and feedback Signal mapping
The invention discloses a semiconductor dry and wet contact fault diagnosis circuit which is suitable for performing independent fault self-diagnosis on a dry and wet contact. The diagnosis mode is used for constructing a fault diagnosis loop aiming at the dry and wet contact, can effectively diagnose the fault of the dry and wet contact in time without depending on the states of other dry and wet contacts and depending on an auxiliary power supply, has the characteristics of simple structure, reliable work, economy, practicality and the like, and is a fault diagnosis means with very high feasibility.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are merely exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.

Claims (3)

1. the semiconductor dry and wet contact fault diagnosis circuit is characterized by comprising a semiconductor switch tube U2_1, a dry and wet contact Q1_1 and a semiconductor switch tube U3_1, wherein the input end of the semiconductor switch tube U2_1 is used for receiving a driving signal, the output end of the semiconductor switch tube U2_1 controls the on and off of the dry and wet contact Q1_1, the input end of the semiconductor switch tube U3_1 is connected with the dry and wet contact Q1_1, and the output end of the semiconductor switch tube U3_1 outputs a feedback signal; when the dry-wet joint Q1_1 is switched on, the output end of the semiconductor switch tube U3_1 outputs an effective feedback signal, and when the dry-wet joint Q1_1 is switched off, the output end of the semiconductor switch tube U3_1 outputs an ineffective feedback signal; the semiconductor switch tube U2_1 adopts an optical coupler, the dry-wet joint Q1_1 adopts one of an MOS tube, an IGBT and a thyristor, and the semiconductor switch tube U3_1 adopts an optical coupler; the driving circuit further comprises a dry and wet joint driving chip U1_1, wherein an input end of the semiconductor switch tube U2_1 receives a driving signal, the driving signal transmits the driving signal to the dry and wet joint driving chip U1_1 through photoelectric conversion of the semiconductor switch tube U2_1, the dry and wet joint driving chip U1_1 is connected to a control end of the dry and wet joint Q1_1, and the dry and wet joint driving chip U1_1 drives the dry and wet joint Q1_1 to be conducted; the anode of the light emitting diode of the semiconductor switch tube U3_1 and the dry and wet contact driving chip U1_1 are connected with the same driving power supply, and the cathode of the light emitting diode of the semiconductor switch tube U3_1 is connected with the input end of the dry and wet contact Q1_ 1; the semiconductor switch tube U3_1 is used for converting the state of the dry-wet joint Q1_1 into a feedback signal and outputting the feedback signal to the control chip.
2. The circuit of claim 1, wherein a diode D2_1 and a resistor R4_1 are connected in sequence to a line connecting the driving power source and the semiconductor switch tube U3_1, wherein an anode of the diode D2_1 is connected to the driving power source, a cathode of the diode D2_1 is connected to the resistor R4_1, and the other end of the resistor R4_1, which is connected to the end of the diode D2_1, is connected to an anode of the light emitting diode of the semiconductor switch tube U3_ 1.
3. The diagnostic method of the fault diagnostic circuit of the semiconductor dry and wet contact is applied to claim 1 or 2, characterized in that when the driving signal of the semiconductor switch tube U2_1 is valid and the feedback signal of the semiconductor switch tube U3_1 is valid, the state of the dry and wet contact Q1_1 is normal; when the driving signal of the semiconductor switch tube U2_1 is invalid and the feedback signal of the semiconductor switch tube U3_1 is invalid, the state of the dry-wet joint Q1_1 is normal; when the driving signal of the semiconductor switch tube U2_1 is effective and the feedback signal of the semiconductor switch tube U3_1 is ineffective, the dry-wet contact Q1_1 fails; when the driving signal of the semiconductor switch tube U2_1 is invalid and the feedback signal of the semiconductor switch tube U3_1 is valid, the dry-wet junction Q1_1 fails.
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CN112098887B (en) * 2020-08-17 2024-01-26 交控科技股份有限公司 Rail transit dry contact state judging system and method
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