CN106291286A - Coil turn-to-turn corona tester - Google Patents
Coil turn-to-turn corona tester Download PDFInfo
- Publication number
- CN106291286A CN106291286A CN201610795094.5A CN201610795094A CN106291286A CN 106291286 A CN106291286 A CN 106291286A CN 201610795094 A CN201610795094 A CN 201610795094A CN 106291286 A CN106291286 A CN 106291286A
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- coil
- circuit
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- corona
- voltage
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- 238000012360 testing method Methods 0.000 claims abstract description 57
- 238000012545 processing Methods 0.000 claims abstract description 46
- 238000006243 chemical reaction Methods 0.000 claims abstract description 18
- 238000001514 detection method Methods 0.000 claims abstract description 14
- 238000012544 monitoring process Methods 0.000 claims abstract description 14
- 230000015556 catabolic process Effects 0.000 claims abstract description 9
- 238000009413 insulation Methods 0.000 claims abstract description 9
- 238000002955 isolation Methods 0.000 claims description 14
- 238000005070 sampling Methods 0.000 claims description 11
- 230000005611 electricity Effects 0.000 claims description 4
- 238000005259 measurement Methods 0.000 abstract description 5
- 238000013461 design Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 238000005457 optimization Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000034303 cell budding Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000005622 photoelectricity Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Relating To Insulation (AREA)
Abstract
The present invention provides a kind of coil turn-to-turn corona tester, including central processing unit, high pressure pulse discharge drive circuit, Coil Detector switching circuit, high-frequency signal testing circuit, analog to digital conversion circuit, bus voltage testing circuit, linear power source circuit, high pressure pulse discharge drive circuit is for carrying out high frequency, electrion to apply corona voltage to coil to be detected;High-frequency signal testing circuit is used for detecting coil corona trigger voltage, monitoring coil insulation breakdown voltage critical point;Whether Coil Detector switching circuit accesses test loop for switching coil;The test voltage that bus voltage testing circuit is applied on coil for monitoring.The coil turn-to-turn corona tester of the present invention, carry out high frequency by high pressure pulse discharge drive circuit, electrion applies corona voltage to coil, the cooperation coordinating signal deteching circuit, analog to digital conversion circuit and central processing unit realizes the test of coil turn-to-turn corona, low cost, certainty of measurement is high, it is thus achieved that the detection accreditation of international testing agency.
Description
Technical field
The invention belongs to Inverter fed motor technical field of measurement and test, be specifically related to a kind of coil turn-to-turn corona tester.
Background technology
The generation of corona is because rough conductor and produces uneven electric field, curvature half around uneven electric field
Near the electrode that footpath is little when voltage is increased to certain value, owing to free of air will discharge, form corona.Coil turn-to-turn
Corona tester is used for detecting coil turn-to-turn corona, uses high pressure pulse discharge that tested loop product carries out pressure insulation and surveys
Examination, corona between detection coil, sparking electric discharge is linear, solves quality problems in process of producing product.
At present, corona tester is at home also in the budding stage, and the people grasping this technology is few, cost is high, Product Precision
Low, poor reliability.
Summary of the invention
For solving above-mentioned technical problem, the invention provides a kind of coil turn-to-turn corona tester, low cost, certainty of measurement
High, it is thus achieved that the detection of product is approved by international testing agency.
For reaching above-mentioned purpose, technical scheme is as follows: a kind of coil turn-to-turn corona tester, its feature exists
In: include central processing unit, high pressure pulse discharge drive circuit, Coil Detector switching circuit, high-frequency signal testing circuit, modulus
Change-over circuit, bus voltage testing circuit, linear power source circuit,
-described high pressure pulse discharge drive circuit, it is connected with central processing unit, and it is for carrying out height to coil to be detected
Frequently, electrion is to apply corona voltage;
-described high-frequency signal testing circuit, it is connected with central processing unit, its be used for detecting coil corona trigger voltage,
And monitoring coil insulation breakdown voltage critical point;
-described Coil Detector switching circuit, it is connected with central processing unit, and whether it accesses for switching coil is tested back
Road;
-described bus voltage testing circuit, it is connected with central processing unit, its test being applied on coil for monitoring
Voltage;
-analog-digital conversion circuit as described, it is connected with central processing unit, and it is for changing into into several by the analogue signal collected
Word signal;
-described linear power source circuit, itself and central processing unit, high pressure pulse discharge drive circuit, Coil Detector switching electricity
Road, high-frequency signal testing circuit, analog to digital conversion circuit, bus voltage testing circuit connect, and it is used for output linearity DC source
Power to each modular circuit.
In one preferred embodiment of the present invention, farther include described high pressure pulse discharge drive circuit and include series connection height
Piezoelectric crystal, transistor driving chip, isolation controller, described isolation controller controls to connect transistor driving chip, described
Transistor driving chip drives connects tandem high pressure transistor, and described isolation controller controls described in transistor driving chip drives
The corona voltage of tandem high pressure transistor output-5000V~+5000V, described central processing unit controls to connect isolation controller.
In one preferred embodiment of the present invention, farther include described high-frequency signal testing circuit and include commutation diode
D, the first switch S1, capacitance-resistance filter, high frequency frequency selector, commutation diode D halfwave rectifier corona voltage, its negative electrode connects first
Switch S1, the first switch S1 connect capacitance-resistance filter, connect high frequency frequency selector, institute after the first switch S1 also Series detectors coil L
State the outfan of capacitance-resistance filter and connect central processing unit for detecting coil corona trigger voltage, described high frequency frequency selector defeated
Go out end and connect central processing unit for monitoring coil insulation breakdown voltage critical point.
In one preferred embodiment of the present invention, farther include described Coil Detector switching circuit and include relay one
J1, relay two J2, audion one Q1, audion two Q2, photoelectrical coupler V, relay one J1, relay two J2 and detection line
Accessing test loop after circle L three's series connection, the base stage of audion one Q1 connects central processing unit, its grounded emitter, its current collection
Pole connects photoelectrical coupler V, the base stage of photoelectrical coupler V outfan connecting triode two Q2, its grounded emitter, its colelctor electrode
Connect whether relay one J1 and relay two J2, the break-make change detection coil L of relay one J1 and relay two J2 access
Test loop.
In one preferred embodiment of the present invention, farther include described bus voltage testing circuit sampling resistor R1, R2,
R3, R4, operational amplifier and model are the voltage-reference of AD680, and central processing unit connects sampling resistor, sampling resistor pair
High pressure carries out the sampling of test voltage, and its concatenation operation amplifier, sampled voltage is amplified by operational amplifier, voltage reference
Source provides reference voltage for operational amplifier.
In one preferred embodiment of the present invention, farther including described linear power source circuit output accuracy is one thousandth
Direct current linear power supply.
In one preferred embodiment of the present invention, farther including described central processing unit is 16 single-chip microcomputers.
In one preferred embodiment of the present invention, farther include it and also include host computer, described host computer and centre
Based on RS232 half-duplex operation between reason device.
In one preferred embodiment of the present invention, farther include it and also include keyboard & display I/O circuit.
The invention has the beneficial effects as follows:
One, the coil turn-to-turn corona tester of the present invention, carry out high frequency, high pressure by high pressure pulse discharge drive circuit
Discharging and apply corona voltage to coil, the cooperation coordinating signal deteching circuit, analog to digital conversion circuit and central processing unit is real
The test of existing coil turn-to-turn corona, low cost, certainty of measurement is high, it is thus achieved that the detection of product is approved by international testing agency;
Two, the high pressure pulse discharge drive circuit of Optimization Design of Electronic Circuits and parts selection, controls series connection height by isolation
Coil is discharged by piezoelectric crystal, be precisely controlled transistor turns concordance, utilize high frequency absorption reduce interference signal with
This guarantees the certainty of measurement of corona tester;
Three, the high-frequency signal testing circuit of Optimization Design of Electronic Circuits and parts selection, produces turn-to-turn surge ripple according to system
Shape feature design capacitance-resistance filter carries out Wave data collection, real time on-line monitoring coil insulation breakdown voltage critical point;Design
High frequency frequency selector carries out the detection of coil corona trigger voltage, it is possible to the optimum testing reliability ensureing coil series products;
Four, the Coil Detector switching circuit of Optimization Design of Electronic Circuits and parts selection, test of automatically switching realizes coil
Carry out testing without dead angle;
Five, Optimization Design of Electronic Circuits and the analog to digital conversion circuit of parts selection, the digital signal frequency of conversion output is permissible
Reach 20MHz, farthest ensure the undistorted of sampled data, improve precision and accurately of detection data with this further
Property.
Accompanying drawing explanation
In order to be illustrated more clearly that the technical scheme in embodiment of the present invention technology, in embodiment technology being described below
The required accompanying drawing used is briefly described, it should be apparent that, the accompanying drawing in describing below is only some realities of the present invention
Execute example, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to according to these accompanying drawings
Obtain other accompanying drawing.
Fig. 1 is the structured flowchart of the preferred embodiment of the present invention;
Fig. 2 is the circuit theory diagrams of preferred embodiment of the present invention high-frequency signal testing circuit;
Fig. 3 is the circuit theory diagrams of preferred embodiment of the present invention high pressure pulse discharge drive circuit;
Fig. 4 is the circuit theory diagrams of preferred embodiment of the present invention Coil Detector switching circuit;
Fig. 5 is the circuit theory diagrams of preferred embodiment of the present invention analog to digital conversion circuit;
Fig. 6 is the circuit theory diagrams of the total line detection circuit of the preferred embodiment of the present invention.
Wherein: 10-central processing unit, 20-high pressure pulse discharge drive circuit, 30-Coil Detector switching circuit, 40-is high
Frequently signal deteching circuit, 50-analog to digital conversion circuit, 60-bus voltage testing circuit, 70-linear power source circuit, 80-keyboard shows
Show I/O circuit.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Describe, it is clear that described embodiment is only a part of embodiment of the present invention rather than whole embodiments wholely.Based on
Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under not making creative work premise
Embodiment, broadly falls into the scope of protection of the invention.
Embodiment
As it is shown in figure 1, the present embodiment discloses a kind of coil turn-to-turn corona tester, including central processing unit 10, height
Pressure pulsed discharge drive circuit 20, Coil Detector switching circuit 30, high-frequency signal testing circuit 40, analog to digital conversion circuit 50, total
Line voltage detecting circuit 60, linear power source circuit 70 and keyboard & display I/O circuit 80, host computer, host computer and central processing unit
Based on RS232 half-duplex operation between 10.
Described high pressure pulse discharge drive circuit 20 is connected with central processing unit 10, and it is for carrying out height to coil to be detected
Frequently, electrion is to apply corona voltage;
Described high-frequency signal testing circuit 40 is connected with central processing unit 10, its be used for detecting coil corona trigger voltage,
And monitoring coil insulation breakdown voltage critical point;
Described Coil Detector switching circuit 30 is connected with central processing unit 10, and whether it accesses for switching coil is tested back
Road;
Described bus voltage testing circuit 60 is connected with central processing unit 10, its test being applied on coil for monitoring
Voltage;
Analog-digital conversion circuit as described 50 is connected with central processing unit 10, and it is for changing into into several by the analogue signal collected
Word signal;
Described linear power source circuit 70 and central processing unit 10, high pressure pulse discharge drive circuit 20, Coil Detector switching
Circuit 30, high-frequency signal testing circuit 20, analog to digital conversion circuit 50, bus voltage testing circuit 60 connect, and it is used for output lead
Property DC source give each modular circuit power.
Described keyboard & display I/O circuit 80 is connected with central processing unit 10, and it is for the function behaviour of real-time monitoring and test instrument
Make and pass through liquid crystal display real-time testing data.
The particular circuit configurations of each circuit module is as follows:
(1) 16 single-chip microcomputers selected by central processing unit 10.
(2) as it is shown on figure 3, described high pressure pulse discharge drive circuit 20 carries out high frequency, electrion to coil to be detected
To apply corona voltage, it includes tandem high pressure transistor, transistor driving chip, isolation controller, described isolation controller
Controlling to connect transistor driving chip, described transistor driving chip drives connects tandem high pressure transistor, and described isolation controls
Device controls the corona voltage of tandem high pressure transistor output-5000V~+5000V described in transistor driving chip drives, described in
Central processor controls to connect isolation controller.High pressure pulse discharge design of drive circuit reaches the output of 5000V high voltage pulse, crystal
The preferred model of pipe driving chip is IXDF504, tandem high pressure transistor is pressure 1700V, uses four IGBT pipes series connection, isolation control
Device processed selects model to be the photoelectrical coupler of PC817, and the front end of photoelectrical coupler is controlled by the constant-current source that model is LM317, permanent
Stream source is controlled by central processing unit 10, and resistance R2, electric capacity C1 as shown in Figure 3 forms IGBT high frequency absorption, and resistance R7 is formed
IGBT manages the discharge resistance in disconnected loop, and diode D1, D2 form driving voltage clamp diode, and resistance R6 drives resistance to control to open
Logical rising time.
(3) as in figure 2 it is shown, described high-frequency signal testing circuit 40 includes commutation diode D, the first switch S1, capacitance-resistance filter
Ripple device, high frequency frequency selector, commutation diode D halfwave rectifier corona voltage, its negative electrode connects the first switch S1, and the first switch S1 is even
Connect capacitance-resistance filter, after the first switch S1 also Series detectors coil L, connect high frequency frequency selector, the outfan of described capacitance-resistance filter
Connecting central processing unit and be used for detecting coil corona trigger voltage, the outfan of described high frequency frequency selector connects central processing unit and uses
In monitoring coil insulation breakdown voltage critical point.As in figure 2 it is shown, resistance R5, electric capacity C2 form capacitance-resistance filter, inductance L1, L2,
Electric capacity C5 forms high frequency frequency selector, and high pressure passes through commutation diode D halfwave rectifier, is charged by electric capacity C4, and the first switch S1 passes through
Single-chip Controlling, applies test voltage to coil L, by waveform situation of change on resistance R5, electric capacity C2 detection coil, detects line
Circle corona trigger voltage, detects coil corona signal under high-pressure situations by inductance L1, L2, electric capacity C5, and monitoring coil is exhausted
Edge breakdown voltage critical point.
(4) as shown in Figure 4, described Coil Detector switching circuit 30 includes relay one J1, relay two J2, audion one
Test is accessed after Q1, audion two Q2, photoelectrical coupler V, relay one J1, relay two J2 and detection coil L three series connection
Loop, the base stage of audion one Q1 connects central processing unit, its grounded emitter, its colelctor electrode connection photoelectrical coupler V, photoelectricity
The base stage of bonder V outfan connecting triode two Q2, its grounded emitter, its collector connection relay one J1 and relay
Whether the break-make change detection coil L of two J2, relay one J1 and relay two J2 accesses test loop.Single-chip microcomputer provides control
Signal is to resistance R64 front end, and by audion one Q1 driving, photoelectrical coupler V controls relay one J1, relay J 2 inputs
End, audion two Q2 controls relay one J1, relay J 2 is connected K10, K9 and coil L is connected to test loop.
(5) as shown in Figure 6, described bus voltage testing circuit 60 includes that sampling resistor R1, R2, R3, R4, model are
The operational amplifier of LM324 and model are the voltage-reference of AD680, and central processing unit 10 connects sampling resistor, sampling resistor
High pressure carries out the sampling of test voltage, and its concatenation operation amplifier, sampled voltage is amplified by operational amplifier, voltage base
Quasi-source provides reference voltage for operational amplifier.DCBUS high pressure, through resistance R1, R2, R3, R4 dividing potential drop, obtains sampled voltage, profit
Being amplified with operational amplifier, export and detect to single-chip microcomputer, the reference voltage of voltage-reference is 2.5V.
(6) as it is shown in figure 5, analog-digital conversion circuit as described 50 includes the conversion chip that type selecting is 74AC14, by collect
Analog high frequency is converted into digital signal by conversion chip 74AC14, flows to central processing unit, and digital signal frequency can
To reach 20MHz, farthest ensure the undistorted of sampled data.In one preferred embodiment of the present invention, wrap further
Including described linear power source circuit output accuracy is millesimal direct current linear power supply.
Described above to the disclosed embodiments, makes professional and technical personnel in the field be capable of or uses the present invention.
Multiple amendment to these embodiments will be apparent from for those skilled in the art, as defined herein
General Principle can realize without departing from the spirit or scope of the present invention in other embodiments.Therefore, the present invention
It is not intended to be limited to the embodiments shown herein, and is to fit to and principles disclosed herein and features of novelty phase one
The widest scope caused.
Claims (9)
1. a coil turn-to-turn corona tester, it is characterised in that: include central processing unit, high pressure pulse discharge drive circuit,
Coil Detector switching circuit, high-frequency signal testing circuit, analog to digital conversion circuit, bus voltage testing circuit, linear power source circuit,
-described high pressure pulse discharge drive circuit, it is connected with central processing unit, its for coil to be detected is carried out high frequency,
Electrion is to apply corona voltage;
-described high-frequency signal testing circuit, it is connected with central processing unit, its be used for detecting coil corona trigger voltage and
Monitoring coil insulation breakdown voltage critical point;
-described Coil Detector switching circuit, it is connected with central processing unit, and whether it accesses test loop for switching coil;
-described bus voltage testing circuit, it is connected with central processing unit, its test electricity being applied on coil for monitoring
Pressure;
-analog-digital conversion circuit as described, it is connected with central processing unit, and it for changing into into numeral letter by the analogue signal collected
Number;
-described linear power source circuit, itself and central processing unit, high pressure pulse discharge drive circuit, Coil Detector switching circuit, height
Frequently signal deteching circuit, analog to digital conversion circuit, bus voltage testing circuit connect, and it gives each mould for output linearity DC source
Block circuit is powered.
Coil turn-to-turn corona tester the most according to claim 1, it is characterised in that: described high pressure pulse discharge drives electricity
Road includes tandem high pressure transistor, transistor driving chip, isolation controller, and described isolation controller controls to connect transistor and drives
Dynamic chip, described transistor driving chip drives connects tandem high pressure transistor, and described isolation controller controls transistor driving
The corona voltage of tandem high pressure transistor output-5000V~+5000V described in chip drives, described central processing unit controls to connect
Isolation controller.
Coil turn-to-turn corona tester the most according to claim 1, it is characterised in that: described high-frequency signal testing circuit bag
Include commutation diode (D), the first switch (S1), capacitance-resistance filter, high frequency frequency selector, commutation diode (D) halfwave rectifier corona
Voltage, its negative electrode connects the first switch (S1), and the first switch (S1) connects capacitance-resistance filter, and Series detectors gone back by the first switch (S1)
Coil (L) connects high frequency frequency selector afterwards, and the outfan of described capacitance-resistance filter connects central processing unit and is used for detecting coil corona
Trigger voltage, the outfan of described high frequency frequency selector connects central processing unit and is used for monitoring coil insulation breakdown voltage critical point.
Coil turn-to-turn corona tester the most according to claim 1, it is characterised in that: described Coil Detector switching circuit bag
Include relay one (J1), relay two (J2), audion one (Q1), audion two (Q2), photoelectrical coupler (V), relay one
(J1), test loop is accessed, during the base stage of audion one (Q1) connects after relay two (J2) and detection coil (L) three series connection
Central processor, its grounded emitter, its colelctor electrode connect photoelectrical coupler (V), photoelectrical coupler (V) outfan connecting triode
The base stage of two (Q2), its grounded emitter, its collector connection relay one (J1) and relay two (J2), relay one (J1)
Whether test loop is accessed with break-make change detection coil (L) of relay two (J2).
Coil turn-to-turn corona tester the most according to claim 1, it is characterised in that: described bus voltage testing circuit is adopted
Sample resistance (R1, R2, R3, R4), operational amplifier and model are the voltage-reference of AD680, and central processing unit connects sampling electricity
Resistance, sampling resistor carries out the sampling of test voltage to high pressure, its concatenation operation amplifier, and sampled voltage is carried out by operational amplifier
Amplifying, voltage-reference provides reference voltage for operational amplifier.
Coil turn-to-turn corona tester the most according to claim 1, it is characterised in that: described linear power source circuit output essence
Degree is millesimal direct current linear power supply.
7. according to the coil turn-to-turn corona tester described in any one of claim 1-6, it is characterised in that: described central processing unit
It is 16 single-chip microcomputers.
8. according to the coil turn-to-turn corona tester described in any one of claim 1-6, it is characterised in that: it also includes upper
Machine, based on RS232 half-duplex operation between described host computer and central processing unit.
9. according to the coil turn-to-turn corona tester described in any one of claim 1-6, it is characterised in that: it also includes that keyboard shows
Show I/O circuit.
Priority Applications (1)
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CN201610795094.5A CN106291286A (en) | 2016-08-30 | 2016-08-30 | Coil turn-to-turn corona tester |
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CN201610795094.5A CN106291286A (en) | 2016-08-30 | 2016-08-30 | Coil turn-to-turn corona tester |
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CN201610795094.5A Pending CN106291286A (en) | 2016-08-30 | 2016-08-30 | Coil turn-to-turn corona tester |
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Cited By (1)
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CN107726931A (en) * | 2017-11-22 | 2018-02-23 | 中国工程物理研究院电子工程研究所 | The all-electronin fuse tester and its control method that a kind of parameter can be bound |
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CN203674974U (en) * | 2014-01-21 | 2014-06-25 | 邹海平 | Circuit for enhancing power supply impacting and interference resistance properties of power-take switch |
CN206096352U (en) * | 2016-08-30 | 2017-04-12 | 江苏惠中电气有限公司 | Coil turn to turn corona tester |
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2016
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US4385271A (en) * | 1981-03-20 | 1983-05-24 | Moshe Kurtz | Fault monitoring by detecting a polarity difference |
CN1661384A (en) * | 2004-10-09 | 2005-08-31 | 西安交通大学 | Device for testing electric pulse strength for insulation |
CN201707419U (en) * | 2010-05-28 | 2011-01-12 | 常州市同惠电子有限公司 | Coil turn-to-turn insulation detector |
US20120212245A1 (en) * | 2011-02-22 | 2012-08-23 | Qualcomm Incorporated | Circuit and method for testing insulating material |
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CN107726931A (en) * | 2017-11-22 | 2018-02-23 | 中国工程物理研究院电子工程研究所 | The all-electronin fuse tester and its control method that a kind of parameter can be bound |
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