CN107045099A - A kind of bipolarity multiple-pulse turn-to-turn insulation test system and method for testing - Google Patents
A kind of bipolarity multiple-pulse turn-to-turn insulation test system and method for testing Download PDFInfo
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- CN107045099A CN107045099A CN201710283243.4A CN201710283243A CN107045099A CN 107045099 A CN107045099 A CN 107045099A CN 201710283243 A CN201710283243 A CN 201710283243A CN 107045099 A CN107045099 A CN 107045099A
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- 238000009413 insulation Methods 0.000 title claims abstract description 39
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
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- Testing Relating To Insulation (AREA)
Abstract
A kind of bipolarity multiple-pulse turn-to-turn insulation test system and method for testing, including calculation control unit, current rectifying and wave filtering circuit, inversion unit and sample circuit, the chopped unit of rectification filtering unit connects inversion unit, calculation control unit connects copped wave unit through IGBT driver elements, connects inversion unit through 3 road MOSFET drive circuits；The sample circuit includes current sampling circuit and voltage sampling circuit, and both are all connected with calculation control unit.This method is that sample circuit is collected by calculation control unit computations electric current after current signal, and instruction current and measured current are carried out into stagnant ring and compared, and the current waveform for producing the desired frequency of pwm signal driving MOSFET generations is applied on test product.The present invention gathers signal using calculation control unit as core by sample circuit, produces the break-make that PWM ripples drive MOSFET, and generation electric voltage frequency, the adjustable sine wave of amplitude are applied on subject reactor and carry out turn-to-turn insulation voltage-withstand test.
Description
Technical field：
The present invention relates to a kind of dress that turn-to-turn insulation test is carried out to the bipolarity multiple-pulse voltage method that air core coil is used
Put, and in particular to a kind of bipolarity multiple-pulse turn-to-turn insulation test system and method for testing.
Background technology：
The equipment that dry-type hollow coil is made has good, the simple in construction reactance linearity, light weight, unsuitable magnetically saturated spy
Point.As dry-type hollow coil largely comes into operation, failure also progressively increases, wherein the failure of the overwhelming majority is by turn-to-turn insulation
Damage causes.Therefore, while coil preparation technology, dielectric level is improved, effective test method and with turn-to-turn insulation
The equipment development of power of test is particularly important.
Traditional turn-to-turn insulation test mode mainly has sensing voltage method, lightning impulse voltage test to substitute progress turn-to-turn insulation
Test method(s), impulse oscillometry etc..
But all there are various problems in these methods：Some equipment being made up of air core coil, such as dry-type air-core reactor
Etc. no secondary side and magnetic circuit opening, it is impossible to apply induced voltage to test turn-to-turn insulation.
Traditional lightning impulse voltage test and impulse oscillometry turn-to-turn overvoltage experiment be all by control circuit first to
Main capacitance charges, and then electric capacity discharge breakdown ball gap is added in high-voltage pulse on reactor test product.Wherein, lightning impulse voltage is tried
Test by wave front resistance and wave terminal resistance regulation experimental waveform, still, due to the effect of high-voltage pulse, by coil distributed constant
Influence, the small regional turn-to-turn of electric potential gradient does not reach the voltage of requirement of experiment.Furthermore, due to such as air reactor coil turn
Many, the number of plies in parallel is more, wherein a circle punctures, the total resistance of reactor and inductance are varied less, using lightning impulse voltage method very
Easily to whether occur turn-to-turn insulation damage cause erroneous judgement.
The voltage that the experiment of impulse oscillometry turn-to-turn overvoltage punctures ball gap is applied directly to test item coil and makes itself and electric capacity
The higher-order of oscillation is formed, national standard GB1094.6-2011 regulations, the frequency of oscillation of impulse oscillometry turn-to-turn overvoltage experiment is less than
100kHz, duration of test runs 1min, discharge time are no less than 3000 times.The method can equally produce a series of problems：First,
Due to ball gap it is breakdown for the first time after puncture become easy again, so device first time discharge pulse voltage is high, then discharge
Pulse voltage step-down.Secondly, this generating means causes pulse voltage amplitude frequency to fix, it is impossible to accurate adjustable.
The content of the invention：
There is provided a kind of bipolarity multiple-pulse turn-to-turn insulation test system and test side to overcome above-mentioned deficiency by the present invention
Method, it gathers signal by sample circuit using calculation control unit as core, produces PWM ripples, driven by MOSFET driver elements
MOSFET break-make, it is pressure-resistant that generation electric voltage frequency, the adjustable sine wave of amplitude are applied to progress turn-to-turn insulation on subject reactor
Test.
The bipolarity multiple-pulse turn-to-turn insulation test system of the present invention, the technical scheme used to achieve the above object exists
In：Including calculation control unit, current rectifying and wave filtering circuit, inversion unit and sample circuit, the chopped list of rectification filtering unit
Member connection inversion unit, the calculation control unit connects copped wave unit through IGBT driver elements, through 3 road MOSFET drive circuits
Connect inversion unit；The filtered circuit connection boost module of inversion unit, the sample circuit includes current sampling circuit
And voltage sampling circuit, current sampling circuit and voltage sampling circuit are all connected with calculation control unit, calculation control unit connection
Display screen.
As a further improvement on the present invention, the calculation control unit passes through double including CPLD and DSP, CPLD and DSP
Mouth RAM is attached, and the DSP connections display, the CPLD connects copped wave unit and inverse respectively through MOSFET driver elements
Become unit, current sampling circuit and voltage sampling circuit are connected with CPLD.
As a further improvement on the present invention, the filter circuit is Butterworth analog filter.It is arranged such, passes through
Butterworth filter circuit make inverter circuit export high-voltage pulse controlled shape, be specifically can end in positive half-wave peak value into
The positive verification of row turn-to-turn insulation, can also equally carry out the negative verification of turn-to-turn insulation in the cut-off of minus half crest value.
As a further improvement on the present invention, the current sampling circuit is current transformer.By current transformer with
Test product connects to gather the current signal of test product.
As a further improvement on the present invention, the voltage sampling circuit is resistive-capacitive voltage divider circuit.Pass through resistive-capacitive voltage divider electricity
Road voltage signal to gather test product in parallel with test product.
As a further improvement on the present invention, the MOSFET driver elements are formed in parallel by two MOSFET, can be met
System primary side capacity requirement.
As a further improvement on the present invention, the current rectifying and wave filtering circuit is electric for the three-phase uncontrollable rectifier of powered capacitor filter
Road, adjusts the size of output voltage, output voltage can reach 539V according to system voltage, load weight.
The bipolarity multiple-pulse turn-to-turn insulation method of testing of the present invention, the technical scheme of use is to comprise the following steps：
The time of sampling is controlled, then writes the data of sampling in the different address of dual port RAM；
2nd, DSP selects signal to read sampled data and by connection and display screen phase from dual port RAM opposite side according to plate
Even, sample waveform, i.e. test product voltage waveform are exported by display screen；
3rd, DSP is by controlling IGBT driver elements to lead to the section time and then controlling dutycycle come Control experiment output amplitude
Size, inversion unit MOSFET is controlled by producing square-wave modulation signal；
3rd, the modulated signal produced in CPLD and DSP is compared, control MOSFET driver element driving inversion unit productions
The current waveform of raw desired frequency, control IGBT driver element driving buck circuits produce the verification amplitude needed；
4th, before analogue thunder-lighting impaction voltage is applied to test product, CPLD is by controlling IGBT driver elements to change copped wave electricity
The dutycycle on road, one 50% amplitude lightning impulse voltage of output is added on test product, and CPLD is now tried by sample circuit collection
The voltage signal and current signal of product, are considered as control group, and shown by display screen；
5th, repeat step four, then export a double amplitude lightning impulse voltage and be added on test product, obtain test group, and by
Display screen is shown；
6th, control group and test group are subjected to display comparison, calculate two groups of waveform attenuating frequencies and the rate of decay, thus sentence
Whether disconnected test product turn-to-turn insulation is problematic.
The beneficial effects of the invention are as follows：The present invention is, using DSP and CPLD as master controller, electricity to be adjusted by chopper circuit
The amplitude of pressure makes amplitude controllable, frequency conversion system of the inversion unit using MOSFET as switch, and CPLD is calculated by control algolithm and produced
Raw PWM ripples, are then driven MOSFET break-make by MOSFET driver elements, produce electric voltage frequency, the adjustable sine wave of amplitude
Turn-to-turn insulation voltage-withstand test is carried out on subject reactor, the actual voltage signal and electric current for collecting test product by sample circuit are believed
Number, CPLD is fed back to after processing is amplified to signal, is communicated using CPLD, DSP and dual port RAM, quickly number is realized
According to exchange.Wherein, by the control to inversion unit, make the pulse repetition frequency that inversion unit is sent 20kHz~
100kHz is adjustable, passes through the control to copped wave unit switch device so that device can export maximum 200KV pulse voltage,
And a variety of impulse waveforms can be exported, air reactor turn-to-turn insulation principle is tested based on impulse oscillometry, high-voltage pulse will be exported
It is added to and is applied progress turn-to-turn insulation experiment on reactor.Whole device safety, reliably, has compared with existing Insulation test mode
Following advantage：
1), the high-voltage pulse amplitude of output, frequency and each pulse spacing frequency are adjustable；
2), the high-voltage pulse controlled shape of output, you can to end the positive verification for carrying out turn-to-turn insulation in positive half-wave peak value,
The negative verification of turn-to-turn insulation can also be equally carried out in the cut-off of minus half crest value；
3), the traditional approach that aspheric gap punctures using power electronics control technology, equipment is more safe and reliable；
4), improve traditional oscillograph and carry out test experiments, change and shown on computers.
Brief description of the drawings：
Fig. 1 is principle schematic diagram of the invention；
Fig. 2 is turn-to-turn insulation main circuit system figure in the present invention；
Fig. 3 is the connection circuit diagram of inversion unit and transformer；
Fig. 4 is control principle block diagram of the invention.
Embodiment：
Reference picture 1 and Fig. 4, the bipolarity multiple-pulse turn-to-turn insulation test system, including calculation control unit, rectifying and wave-filtering
Circuit, inversion unit and sample circuit, the chopped unit connection inversion unit of rectification filtering unit, the calculating control are single
Member connects copped wave unit through IGBT driver elements, and inversion unit is connected through 3 road MOSFET drive circuits；The inversion unit is through filter
Wave circuit connect boost module, the sample circuit include current sampling circuit and voltage sampling circuit, current sampling circuit and
Voltage sampling circuit is all connected with calculation control unit, calculation control unit connection display screen.
The calculation control unit includes CPLD and DSP, CPLD and DSP is attached by dual port RAM, and the DSP connects
Display is connect, the CPLD connects copped wave unit and inversion unit, current sampling circuit and electricity respectively through MOSFET driver elements
Pressure sample circuit is connected with CPLD.
Further, the current rectifying and wave filtering circuit is the three-phase uncontrollable rectifier circuit of powered capacitor filter.
Further, the current sampling circuit is current transformer.
Further, the voltage sampling circuit is resistive-capacitive voltage divider circuit.
Further, the filter circuit is Butterworth analog filter.
Further, H bridge portion circuits as shown in Figure 3, the MOSFET driver elements by two MOSFET it is in parallel and
Into because system requirements inversion unit output frequency is maximum 100kHz, therefore from derailing switches of the MOSFET as inverter circuit
Part meets frequency requirement, and MOSFET on the market can not directly meet output current and voltage request simultaneously, therefore considers to use
MOSFET parallel technologies, using two MOSFET parallel connections, while being driven to two MOSFET, wherein each MOSFET overcurrent
167A, bears voltage 400V, and system primary side capacity requirement is met with this.
Reference picture 2,1 frame portion point is the three-phase uncontrollable rectifier circuit part of capacitor filtering, its output voltage highest 539V, defeated
Go out magnitude of voltage relevant with system voltage, load weight；2 frame portions are divided into buck chopper circuits, and it is made by the adjustment to dutycycle
Obtain voltage after copped wave adjustable, and then so that the electricity at the two ends for being tested reactor (abbreviation test product) is being added in after high frequency transformer
Press size, waveform situation is adjustable；3 frames are inverter circuit, can for 20kHz~100kHz by the adjustable frequency of making of inverter circuit
The square wave of tune；4 frames are Butterworth filter circuit, and it causes the square wave after inversion to become sine wave and filter out higher hamonic wave to do
Disturb；5 be booster circuit, specifically using high-frequency step-up transformer T, and its capacity is 100kVA, will pass through inversion, filtered electricity
Pressure boosts to highest 200kV；6 frames are two electric capacity and inductance composition resistive-capacitive voltage divider circuit in sample circuit, sample circuit, to adopt
Collection is added in the electric current that test product is flowed through in current transformer collection in the high-frequency ac voltage on test product, sample circuit, by collection result
Analysis calculating is carried out in input DSP and is compared, so as to judge whether test product insulating properties are intact.
The test system of the present invention is using calculation control unit as core, and calculation control unit is used as master control using DSP and CPLD
Device processed, is communicated using CPLD, DSP and dual port RAM, realizes quick data exchange.CPLD is gathered by sample circuit and tried
Electric current, the voltage signal of product, processing is amplified to signal, coordinates the instruction of host computer, and CPLD is calculated by control algolithm and produced
Raw PWM ripples, CPLD command signals are compared by the modulated signal with being produced in DSP, and drive is sent to MOSFET driver elements
Dynamic signal, the break-make of controlling switch pipe, meanwhile, in the event of failure, calculation control unit can also collect MOSFET failure
Signal is reacted and closes system in time, and then PWM ripples are realized to the buffer action of electric signal by photoelectric conversion module, by
MOSFET driver elements drive MOSFET break-make, produce electric voltage frequency, the adjustable sine wave of amplitude, are boosted transformation by high frequency
Device is added on subject reactor and carries out turn-to-turn insulation voltage-withstand test.In use, 220V industrial-frequency alternating currents pass through rectification filtering unit
Highest 539V DC voltage is exported after rectifying and wave-filtering, by controllable copped wave unit and inversion unit again through high frequency boosting transformation
Device boosts, you can output pulse shape is controllable, the adjustable high pressure pulse wave of frequency amplitude is added on air reactor test product.
The bipolarity multiple-pulse turn-to-turn insulation method of testing of the present invention, comprises the following steps：
First, the current signal of test product is gathered by the current transformer in sample circuit, sampling is received by CPLD
Data and the time for controlling sampling, then the data of sampling are write in the different address of dual port RAM；
2nd, DSP selects signal to read sampled data and by connection and display screen phase from dual port RAM opposite side according to plate
Even, sample waveform, i.e. test product voltage waveform are exported by display screen；
3rd, DSP is by controlling IGBT driver elements to lead to the section time and then controlling dutycycle come Control experiment output amplitude
Size, inversion unit MOSFET is controlled by producing square-wave modulation signal；
4th, the modulated signal produced in CPLD and DSP is compared, control MOSFET driver element driving inversion unit productions
The current waveform of raw desired frequency, control IGBT driver element driving buck circuits produce the verification amplitude needed；
4th, before analogue thunder-lighting impaction voltage is applied to test product, CPLD is by controlling IGBT driver elements to change copped wave electricity
The dutycycle on road, one 50% amplitude lightning impulse voltage of output is added on test product, and CPLD is now tried by sample circuit collection
The voltage signal and current signal of product, are considered as control group, and shown by display screen；
5th, repeat step four, then export a double amplitude lightning impulse voltage and be added on test product, obtain test group, and by
Display screen is shown；
6th, control group and test group are subjected to display comparison, calculate two groups of waveform attenuating frequencies and the rate of decay, thus sentence
Whether disconnected test product turn-to-turn insulation is problematic.
Claims (8)
1. a kind of bipolarity multiple-pulse turn-to-turn insulation test system, it is characterised in that：Including calculation control unit, rectifying and wave-filtering electricity
Road, inversion unit and sample circuit, the chopped unit connection inversion unit of rectification filtering unit, the calculation control unit
Copped wave unit is connected through IGBT driver elements, inversion unit is connected through 3 road MOSFET drive circuits；The inversion unit is filtered
Circuit connects boost module, and the sample circuit includes current sampling circuit and voltage sampling circuit, current sampling circuit and electricity
Pressure sample circuit is all connected with calculation control unit, calculation control unit connection display screen.
2. a kind of bipolarity multiple-pulse turn-to-turn insulation test system as claimed in claim 1, it is characterised in that：It is described to calculate control
Unit processed includes CPLD and DSP, CPLD and DSP is attached by dual port RAM, the DSP connections display, the CPLD warps
MOSFET driver elements connect copped wave unit and inversion unit, current sampling circuit and voltage sampling circuit and CPLD phases respectively
Even.
3. a kind of bipolarity multiple-pulse turn-to-turn insulation test system as claimed in claim 2, it is characterised in that：The electric current is adopted
Sample circuit is current transformer.
4. a kind of bipolarity multiple-pulse turn-to-turn insulation test system as claimed in claim 2, it is characterised in that：The voltage is adopted
Sample circuit is resistive-capacitive voltage divider circuit.
5. a kind of bipolarity multiple-pulse turn-to-turn insulation test system as claimed in claim 2, it is characterised in that：The rectification filter
Wave circuit is the three-phase uncontrollable rectifier circuit of powered capacitor filter.
6. a kind of bipolarity multiple-pulse turn-to-turn insulation test system as claimed in claim 2, it is characterised in that：The MOSFET
Driver element is formed in parallel by two MOSFET.
7. a kind of bipolarity multiple-pulse turn-to-turn insulation test system as described in claim 1-6 any one, its feature exists
In：The filter circuit is Butterworth analog filter.
8. a kind of bipolarity multiple-pulse turn-to-turn insulation method of testing, it is characterised in that comprise the following steps：
First, the current signal of test product is gathered by the current transformer in sample circuit, the data of sampling are received by CPLD
And control the time of sampling, then to write the data of sampling in the different address of dual port RAM；
2nd, DSP selects signal to read sampled data from dual port RAM opposite side and be connected by connection with display screen according to plate, leads to
Cross display screen output sample waveform, i.e. test product voltage waveform；
3rd, by controlling, IGBT driver elements lead to the section time to DSP and then control dutycycle is come the size of Control experiment output amplitude,
Inversion unit MOSFET is controlled by producing square-wave modulation signal；
3rd, the modulated signal produced in CPLD and DSP is compared, and control MOSFET driver element driving inversion units, which are produced, to be thought
The current waveform of frequency is wanted, control IGBT driver element driving buck circuits produce the verification amplitude needed；
4th, before analogue thunder-lighting impaction voltage is applied to test product, CPLD is by controlling IGBT driver elements to change chopper circuit
Dutycycle, one 50% amplitude lightning impulse voltage of output is added on test product, and CPLD gathers now test product by sample circuit
Voltage signal and current signal, are considered as control group, and shown by display screen；
5th, repeat step four, then export a double amplitude lightning impulse voltage and be added on test product, test group is obtained, and by showing
Screen is shown；
6th, control group and test group are subjected to display comparison, calculate two groups of waveform attenuating frequencies and the rate of decay, thus judge examination
Whether product turn-to-turn insulation is problematic.
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| CN201710283243.4A CN107045099A (en) | 2017-04-26 | 2017-04-26 | A kind of bipolarity multiple-pulse turn-to-turn insulation test system and method for testing |
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| CN201710283243.4A CN107045099A (en) | 2017-04-26 | 2017-04-26 | A kind of bipolarity multiple-pulse turn-to-turn insulation test system and method for testing |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109581157A (en) * | 2018-11-15 | 2019-04-05 | 青岛艾诺智能仪器有限公司 | A kind of quick bump test device of turn-to-turn and method |
| CN110579720A (en) * | 2018-06-08 | 2019-12-17 | 台达电子工业股份有限公司 | Power supply monitor |
| CN111983323A (en) * | 2020-07-03 | 2020-11-24 | 中广核核电运营有限公司 | Method and device for measuring resistance value of generator sealing tile by induction voltage method |
| CN112526316A (en) * | 2020-11-09 | 2021-03-19 | 广西玉柴机器股份有限公司 | Hardware performance test method for BOOST circuit of oil injector chip |
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2017
- 2017-04-26 CN CN201710283243.4A patent/CN107045099A/en active Pending
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110579720A (en) * | 2018-06-08 | 2019-12-17 | 台达电子工业股份有限公司 | Power supply monitor |
| CN110579720B (en) * | 2018-06-08 | 2022-08-30 | 台达电子工业股份有限公司 | Power supply monitor |
| CN109581157A (en) * | 2018-11-15 | 2019-04-05 | 青岛艾诺智能仪器有限公司 | A kind of quick bump test device of turn-to-turn and method |
| CN109581157B (en) * | 2018-11-15 | 2020-12-18 | 青岛艾诺智能仪器有限公司 | Inter-turn rapid continuous impact testing device and method |
| CN111983323A (en) * | 2020-07-03 | 2020-11-24 | 中广核核电运营有限公司 | Method and device for measuring resistance value of generator sealing tile by induction voltage method |
| CN111983323B (en) * | 2020-07-03 | 2023-09-19 | 中广核核电运营有限公司 | Method and device for measuring resistance of generator sealing tile by induced voltage method |
| CN112526316A (en) * | 2020-11-09 | 2021-03-19 | 广西玉柴机器股份有限公司 | Hardware performance test method for BOOST circuit of oil injector chip |
| CN112526316B (en) * | 2020-11-09 | 2024-04-19 | 广西玉柴机器股份有限公司 | Hardware performance test method for BOOST circuit of fuel injector chip |
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Application publication date: 20170815 |