CN107726931B - Parameter-bindable full-electronic fuze tester and control method thereof - Google Patents

Parameter-bindable full-electronic fuze tester and control method thereof Download PDF

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CN107726931B
CN107726931B CN201711169756.9A CN201711169756A CN107726931B CN 107726931 B CN107726931 B CN 107726931B CN 201711169756 A CN201711169756 A CN 201711169756A CN 107726931 B CN107726931 B CN 107726931B
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signal
self
fuze
connector
fuse
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CN107726931A (en
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周伟
周孟哲
李东杰
安晓伟
张险峰
毛维平
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Institute of Electronic Engineering of CAEP
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    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F42AMMUNITION; BLASTING
    • F42CAMMUNITION FUZES; ARMING OR SAFETY MEANS THEREFOR
    • F42C21/00Checking fuzes; Testing fuzes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention provides a parameter bindable full-electronic fuze tester and a control method thereof, wherein the scheme comprises a voltage conversion module, a relay, an MOS (metal oxide semiconductor) tube driver, a bus driver, a voltage matching resistor, a starting key, a ferroelectric memory, a communication bus driving module and a liquid crystal display, which are respectively and electrically connected with a microprocessor; the relay, the MOS tube driver, the bus driver and the voltage matching resistor are all electrically connected with the first connector; the relay and the voltage conversion module are electrically connected with a power supply; the microprocessor is electrically connected with the second connector; the communication bus driving module is electrically connected with the second connector. The technical scheme can meet the special requirements of the existing fuze data binding in function, is simple to operate, and can automatically complete all fuze power supply, release protection control, fuze key parameter binding, test result judgment, waveform result display and the like by the tester only by inputting the bound data through the keyboard.

Description

Parameter-bindable full-electronic fuze tester and control method thereof
Technical Field
The invention relates to a fuse detector, in particular to a parameter bindable full-electronic fuse tester and a test control method thereof.
Background
In order to test the safety and reliability of the full electronic fuse, a full electronic fuse tester is developed, which is a necessary supporting work in the fuse design. In recent years, a full-electronic fuze tester taking a single chip microcomputer and an ARM chip as cores is gradually developed. Because the control function is relatively strong, automatic control and test are gradually realized, and the test result is an important basis for judging the quality of the fuze. However, as the technology of all-electronic fuzes and communication technologies continue to develop, the technology of communication of the fuzes on the bomb has also been greatly developed. Therefore, the conventional fuze tester without the data binding interface cannot meet the data binding test requirement of the all-electronic fuze.
In 2013, in a text entitled "universal technology of programmable tester on chip for fuze electronic safety systems", published in detection and control journal, "volume 35, stage 3, a singlechip-based programmable tester on chip for fuze electronic safety systems is described in detail, wherein section 1.1 refers to: the tester realizes information exchange and detection control with an external computer through a memory and an external interface of the tester. But there is no communication interface between the tester and the fuze for binding data transmission. Therefore, the tester does not have the function of data communication with the fuze in a binding mode, and cannot bind critical data of fuze actions in real time; by section 1.1: the electronic safety system tester completes the detection of the fuze function in a one-key and indicator light mode, and can also find that the tester detects through a one-key metal key starting signal without a numeric keyboard, so that parameters needing to be bound cannot be input; meanwhile, the result display mode of the indicator light cannot display the information bound by the fuze in real time.
Therefore, novel test equipment which can bind data in real time and meet the complex requirements of a fuze test system is developed, and the test equipment can better meet various fuze test requirements of troops and the convenience of performance debugging and product inspection before products leave a factory.
And setting binding parameters by using a metal keyboard of the tester, and storing binding data by the tester after the setting is finished. Before the tester sends a release and trigger control instruction to the fuze, binding data transmission between the tester and the fuze is completed, so that the fuze receives the binding data, and the operation of binding the set parameter data of the upper computer is completed. And finally, carrying out fuse data read-back display through a display screen.
Disclosure of Invention
The invention aims to provide a technical scheme of a parameter-bindable all-electronic fuze tester and a test control method thereof aiming at the defects in the prior art, the scheme can meet the special requirements of the prior fuze data binding on the function, the operation is simple, and the tester can automatically complete all fuze power supply, relief control, fuze key parameter binding, test result judgment, waveform result display and the like only by inputting the binding data through a keyboard.
The scheme is realized by the following technical measures:
a kind of parameter can bind the whole electronic fuze tester, including voltage conversion module, electrical relay, MOS tube driver, bus driver, voltage matching resistance, starting button, ferroelectric memory, communication bus driving module and liquid crystal screen that connect electrically with microprocessor separately; the relay, the MOS tube driver, the bus driver and the voltage matching resistor are all electrically connected with the first connector; the relay and the voltage conversion module are electrically connected with a power supply; the microprocessor is electrically connected with the second connector; the communication bus driving module is electrically connected with the second connector.
The scheme is preferably as follows: the first connector is connected with a fuse to be tested; the second connector is connected with the upper computer.
The scheme is preferably as follows: the microprocessor is a chip based on the inner core of the single chip microcomputer.
The scheme is preferably as follows: the power supply is an AC-DC power supply.
A testing method of a parameter-bindable all-electronic fuze tester comprises the following steps:
a. after a power supply is turned on and the microprocessor is electrified, initializing a pin, an internal register and related variables of the system, pressing a start key and performing one-key operation (step 15);
b. the microprocessor judges the action information of the start key through the related pin and determines whether the tester enters a self-checking state (step 16); if the relevant level is high level, then entering a self-test flow (step 17); if the relevant level is a low level, entering a fuze detection process;
c. after entering the self-test flow, firstly, performing communication self-test (step 18): sending codes in a preset UART format in a preset format to a TX pin of a communication bus driving module, and sending an RS485 signal to a sending pin of a second connector after level conversion; the RS485 signal is connected to the receiving pin of the second connector through the sending pin of the second connector, the RS485 signal is transmitted to the RX pin of the communication bus driving module 12, the communication bus driving module 12 converts the communication bus driving module signal into a code in a preset UART format, the microprocessor 4 judges after receiving the relevant code, if the code does not meet the preset requirement, the communication self-check is unqualified, and the liquid crystal display displays that the communication self-check is unqualified (step 22); if the code meets the preset requirement, the communication self-check is qualified;
after the communication self-check is completed, power supply self-check (step 19) and insurance signal self-check (step 20) are carried out: connecting the fuse power supply signal and the fuse relief signal to a related receiving pin of the first connector through a sending pin of the second connector, converting the fuse power supply signal and the fuse relief signal into analog voltage which can be detected by a microprocessor through a voltage matching resistor, judging, if the power supply voltage does not meet the requirement of a preset range, performing power supply self-checking and fuse relief signal self-checking on unqualified products, and displaying the unqualified products by a liquid crystal display (step 22); if the voltage meets the requirement of the preset range, the power supply self-check is qualified; if the fuze relief signal voltage does not meet the requirement of the preset range, the relief signal self-check is unqualified, and the liquid crystal display displays that the self-check is unqualified (step 22); if the voltage of the fuze relief signal meets the requirement of a preset range, the relief signal is qualified by self-inspection, and the liquid crystal display screen displays that the relief signal is qualified by self-inspection (step 21);
d. after entering the fuse detection range, firstly, a microprocessor sends out a fuse power supply signal (step 23), and the voltage of a power supply is output to a first connector to supply power to the fuse under the control of a relay; after the fuse is electrified, the initial state signal is connected to a related detection pin of the microprocessor through the first connector and the voltage matching resistor, the microprocessor judges the initial state signal and stores a judgment result (step 24); the microprocessor sends out fuse arming signal and triggering signal according to time sequence, and the signals are transmitted to the first connector through the MOS tube driver to carry out arming control and triggering action on the fuse. The triggering action information of the fuze is connected to a related detection pin of the microprocessor through the first connector and the voltage matching resistor, and the microprocessor judges the triggering action information and stores a judgment result (step 25);
the microprocessor sends out a fuse communication self-checking signal (step 26), the signal is transmitted to the first connector through the bus driver, the communication self-checking signal is sent out to the fuse, the corresponding self-checking signal is returned after the fuse is received, the microprocessor judges the self-checking signal returned by the fuse through the first connector and the bus driver (step 27), if the self-checking signal does not meet the preset requirement, the liquid crystal display displays that the detection result of the fuse is unqualified (step 28), and if the self-checking signal meets the preset requirement, the communication self-checking with the fuse is qualified;
using a microprocessor to perform fuze parameter binding according to the flow of communication self-checking in the step 27, and judging a binding result returned by the fuze (step 29), if the returned binding signal does not meet the preset requirement, displaying that the detection result of the fuze is unqualified by a liquid crystal display, and if the binding result returned by the fuze meets the preset requirement, binding with the fuze is qualified;
judging results stored in the step 24 (step 30), if the state detection results do not meet the preset requirements, displaying that the fuse detection results are unqualified on the liquid crystal display (step 28), and if the state detection results meet the preset requirements, performing state detection;
and (5) judging the trigger action (step 31) according to the judgment result of the trigger action of the step 25 (step 30), if the judgment result of the trigger action does not meet the preset requirement, displaying that the detection result of the detonator on the liquid crystal screen is unqualified (step 28), and if the judgment result of the trigger action meets the preset requirement, displaying that the detonation detection is qualified on the liquid crystal screen, and sending a detonator power-off signal (step 32).
The beneficial effect of the scheme can be known from the description of the scheme, because the main control chip, the peripheral circuit and the external interface circuit based on the single chip microcomputer kernel have small volume and strong function, the key parameter binding requirement of the tester and the waveform display requirement of the key parameter can be met, and the tester can meet the portable battlefield informatization use requirement. In addition, in the aspect of control flow design, a metal keyboard is adopted to carry out full-automatic design of software flows of parameter binding and subsequent fuze testing and full-automatic indication of a test result, so that the fuze tester is simple to operate, and is beneficial to rapid and accurate completion of testing work of the full-electronic fuze by military operators.
Therefore, compared with the prior art, the invention has substantive characteristics and progress, and the beneficial effects of the implementation are also obvious.
Drawings
FIG. 1 is a schematic structural diagram of the present invention.
FIG. 2 is a flow chart of the control system of the present invention.
In the figure, 2 is a power supply, 3 is a voltage conversion module, 4 is a microprocessor, 5 is a relay, 6 is a first connector, 7 is a MOS transistor driver, 8 is a bus driver, 9 is a voltage matching resistor, 10 is a start button, 11 is a ferroelectric memory, 12 is a communication bus driving module, and 13 is a second connector.
Detailed Description
All of the features disclosed in this specification, or all of the steps in any method or process so disclosed, may be combined in any combination, except combinations of features and/or steps that are mutually exclusive.
Any feature disclosed in this specification (including any accompanying claims, abstract and drawings), may be replaced by alternative features serving equivalent or similar purposes, unless expressly stated otherwise. That is, unless expressly stated otherwise, each feature is only an example of a generic series of equivalent or similar features.
As shown in the figure, the scheme comprises a voltage conversion module, a relay, an MOS tube driver, a bus driver, a voltage matching resistor, a starting key, a ferroelectric memory, a communication bus driving module and a liquid crystal screen which are respectively and electrically connected with a microprocessor; the relay, the MOS tube driver, the bus driver and the voltage matching resistor are all electrically connected with the first connector; the relay and the voltage conversion module are electrically connected with a power supply; the microprocessor is electrically connected with the second connector; the communication bus driving module is electrically connected with the second connector. The first connector is connected with a fuse to be tested; the second connector is connected with the upper computer. The microprocessor is a chip based on the inner core of the single chip microcomputer. The power supply is an AC-DC power supply.
The control flow of the invention comprises the following steps:
a. after a power supply is turned on and a microprocessor is electrified, initializing a pin, an internal register and related variables of a system, pressing a start key and performing one-button operation (step 15);
b. the microprocessor judges the action information of the start key through the related pin and determines whether the tester enters a self-checking state (step 16); if the relevant level is high level, then entering a self-test flow (step 17); if the relevant level is a low level, entering a fuze detection process;
c. after entering the self-test flow, firstly, performing communication self-test (step 18): sending codes in a preset UART format in a preset format to a TX pin of a communication bus driving module, and sending an RS485 signal to a sending pin of a second connector after level conversion; the RS485 signal is connected to the receiving pin of the second connector through the sending pin of the second connector, the RS485 signal is transmitted to the RX pin of the communication bus driving module 12, the communication bus driving module 12 converts the communication bus driving module signal into a code in a preset UART format, the microprocessor 4 judges after receiving the relevant code, if the code does not meet the preset requirement, the communication self-check is unqualified, and the liquid crystal display displays that the communication self-check is unqualified (step 22); if the code meets the preset requirement, the communication self-check is qualified;
and after the communication self-test is completed, carrying out power supply self-test (step 19) and insurance signal self-test (step 20): connecting the fuse power supply signal and the fuse relief signal to a related receiving pin of the first connector through a sending pin of the second connector, converting the fuse power supply signal and the fuse relief signal into analog voltage which can be detected by a microprocessor through a voltage matching resistor, judging, if the power supply voltage does not meet the requirement of a preset range, performing power supply self-checking and fuse relief signal self-checking on unqualified products, and displaying the unqualified products by a liquid crystal display (step 22); if the voltage meets the requirement of a preset range, the power supply self-check is qualified; if the fuze relief signal voltage does not meet the requirement of the preset range, the relief signal self-check is unqualified, and the liquid crystal display displays that the self-check is unqualified (step 22); if the voltage of the fuze guarantee signal meets the requirement of a preset range, the guarantee signal is qualified by self-inspection, and the liquid crystal display screen displays that the guarantee signal is qualified by self-inspection (step 21);
d. after entering a fuse detection range, firstly, a microprocessor sends out a fuse power supply signal (step 23), and the voltage of a power supply is output to a first connector to supply power to a fuse under the control of a relay; after the fuse is electrified, the initial state signal is connected to a related detection pin of the microprocessor through the first connector and the voltage matching resistor, the microprocessor judges the initial state signal and stores a judgment result (step 24); the microprocessor sends out fuse arming signal and triggering signal according to time sequence, and the signals are transmitted to the first connector through the MOS tube driver to carry out arming control and triggering action on the fuse. The trigger action information of the fuze is connected to a related detection pin of the microprocessor through the first connector and the voltage matching resistor, the microprocessor judges the trigger action information and stores a judgment result (step 25);
the microprocessor sends out a fuse communication self-checking signal (step 26), the signal is transmitted to the first connector through the bus driver, the communication self-checking signal is sent out to the fuse, the corresponding self-checking signal is returned after the fuse is received, the microprocessor judges the self-checking signal returned by the fuse through the first connector and the bus driver (step 27), if the self-checking signal does not meet the preset requirement, a liquid crystal display screen displays that the detection result of the fuse is unqualified (step 28), and if the self-checking signal meets the preset requirement, the communication self-checking with the fuse is qualified;
using a microprocessor to perform fuze parameter binding according to the flow of communication self-checking in the step 27, and judging a binding result returned by the fuze (step 29), if the returned binding signal does not meet the preset requirement, displaying that the detection result of the fuze is unqualified by a liquid crystal display, and if the binding result returned by the fuze meets the preset requirement, binding with the fuze is qualified;
judging results stored in the step 24 (step 30), if the state detection results do not meet the preset requirements, displaying that the fuse detection results are unqualified on the liquid crystal display (step 28), and if the state detection results meet the preset requirements, performing state detection;
and (5) judging the trigger action (step 31) according to the judgment result of the trigger action of the step 25 (step 30), if the judgment result of the trigger action does not meet the preset requirement, displaying that the detection result of the detonator on the liquid crystal screen is unqualified (step 28), and if the judgment result of the trigger action meets the preset requirement, displaying that the detonation detection is qualified on the liquid crystal screen, and sending a detonator power-off signal (step 32).
The invention is not limited to the foregoing embodiments. The invention extends to any novel feature or any novel combination of features disclosed in this specification and any novel method or process steps or any novel combination of features disclosed.

Claims (4)

1. A testing method of a parameter-bindable full-electronic fuze tester is characterized by comprising the following steps: the tester comprises a voltage conversion module, a relay, an MOS tube driver, a bus driver, a voltage matching resistor, a starting key, a ferroelectric memory, a communication bus driving module and a liquid crystal screen which are respectively and electrically connected with the microprocessor; the relay, the MOS tube driver, the bus driver and the voltage matching resistor are all electrically connected with the first connector; the relay and the voltage conversion module are electrically connected with a power supply; the microprocessor is electrically connected with the second connector; the communication bus driving module is electrically connected with the second connector; the first connector is connected with a fuse to be tested; the second connector is connected with the upper computer;
the method comprises the following steps:
a. the method comprises the following steps that (1) after a power supply is turned on and a microprocessor is electrified, initialization of system pins, internal registers and related variables is carried out, a start button is pressed down, and one-button operation is carried out, namely step S1;
b. the microprocessor judges the action information of the start key through the related pin and determines whether the tester enters a self-checking state, namely step S2; if the relevant level is a high level, entering a self-checking test flow, namely a step S3; if the relevant level is a low level, entering a fuze detection process;
c. after entering the self-checking test flow, firstly, performing communication self-checking, namely, step S4: sending codes in a preset UART format in a preset format to a TX pin of a communication bus driving module, and sending an RS485 signal to a sending pin of a second connector after level conversion; the RS485 signal is connected to the receiving pin of the second connector through the sending pin of the second connector, the RS485 signal is transmitted to the RX pin of the communication bus driving module, the communication bus driving module is used for converting the communication bus driving module signal into a code in a preset UART format, the microprocessor judges after receiving the relevant code, if the code does not meet the preset requirement, the communication self-check is unqualified, and the liquid crystal display displays that the communication self-check is unqualified, namely step S8; if the code meets the preset requirement, the communication self-check is qualified;
after the communication self-check is completed, power supply self-check is performed, namely step S5 and signal self-check are performed, namely step S6: connecting the fuze power supply signal and the fuze relief signal to a relevant receiving pin of the first connector through a sending pin of the second connector, converting the fuze power supply signal and the fuze relief signal into analog voltage which can be detected by a microprocessor through a voltage matching resistor, judging, and if the power supply voltage does not meet the requirement of a preset range, displaying that the self-checking is not qualified by a liquid crystal screen, namely S8; if the voltage meets the requirement of a preset range, the power supply self-check is qualified; if the fuze relief signal voltage does not meet the requirement of the preset range, the relief signal self-check is unqualified, and the liquid crystal display screen displays that the self-check is unqualified, namely step S8; if the voltage of the fuze guarantee signal meets the requirement of a preset range, the guarantee signal is qualified by self-inspection, and the liquid crystal screen displays that the signal is qualified by self-inspection, namely step S7;
d. after entering a fuse detection process, firstly, a microprocessor sends out a fuse power supply signal, namely step S9, the voltage of a power supply is output to a first connector through the control of a relay to supply power to a fuse; after the fuse is electrified, the initial state signal is connected to a related detection pin of the microprocessor through the first connector and the voltage matching resistor, the microprocessor judges the initial state signal and stores a judgment result, and the step S10 is executed; the microprocessor sends out fuse arming signal and triggering signal according to time sequence, and the signals are transmitted to the first connector through the MOS tube driver to carry out arming control and triggering action on the fuse.
2. The method for testing the parameter-bindable all-electronic fuze tester according to claim 1, characterized in that: the trigger action information of the fuze is connected to a related detection pin of the microprocessor through the first connector and the voltage matching resistor, the microprocessor judges the trigger action information and stores a judgment result, and the step S11 is executed;
the microprocessor sends out a fuze communication self-checking signal, namely step S12; the signals are transmitted to the first connector through the bus driver, a communication self-checking signal is sent to the fuse, the corresponding self-checking signal is returned after the fuse is received, and the microprocessor judges the self-checking signal returned by the fuse through the first connector and the bus driver, namely step S13; if the self-checking signal does not meet the preset requirement, the liquid crystal display screen displays that the fuse detection result is unqualified, namely step S14; if the self-checking signal meets the preset requirement, the communication self-checking with the fuze is qualified;
using a microprocessor to perform fuze parameter binding according to the communication self-checking process in the step S13, and judging a binding result returned by the fuze, namely, a step S15; if the returned binding signal does not meet the preset requirement, the liquid crystal display displays that the fuse detection result is unqualified, and if the binding result returned by the fuse meets the preset requirement, the binding with the fuse is qualified;
a step S16 of determining the result stored in step S10; if the state detection result does not meet the preset requirement, the liquid crystal display screen displays that the fuse detection result is unqualified, namely step S14; if the state detection result meets the preset requirement, the state detection is qualified;
step S16, judging the trigger action according to the step S11; judging a trigger action, namely step S17; if the trigger action judgment result does not meet the preset requirement, the liquid crystal display screen displays that the fuze detection result is unqualified, namely step S14; and if the trigger action judgment result meets the preset requirement, displaying that the detonation detection is qualified by the liquid crystal screen, and sending out a fuze power-off signal, namely S18.
3. The method for testing the parameter-bindable all-electronic fuze tester according to claim 1, wherein the method comprises the following steps: the microprocessor is a chip based on a single chip microcomputer kernel.
4. The method for testing the parameter-bindable all-electronic fuze tester according to claim 1, wherein the method comprises the following steps: the power supply is an AC-DC power supply.
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