CN106201814A - Test chassis system - Google Patents
Test chassis system Download PDFInfo
- Publication number
- CN106201814A CN106201814A CN201610549779.1A CN201610549779A CN106201814A CN 106201814 A CN106201814 A CN 106201814A CN 201610549779 A CN201610549779 A CN 201610549779A CN 106201814 A CN106201814 A CN 106201814A
- Authority
- CN
- China
- Prior art keywords
- moving frame
- space
- chassis system
- moving
- electronic installation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/18—Construction of rack or frame
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The present invention provides a kind of test chassis system, and to provide multiple electronic installation to test, it includes the first moving frame and 2 second moving frames.First moving frame has the first support body and multiple first moving assembly, and the first support body constitutes the first space, and multiple first moving assembly is arranged at the bottom of the first support body.Each second moving frame has the second support body and multiple second moving assembly, second support body constitutes multiple second spaces, multiple electronic installation can be housed, and multiple second moving assembly is arranged at the bottom of each second support body, and the second moving frame can be placed in the first space.The second space of each second support body vertically arranges, multiple second moving frames are placed in described first space along orientation, and configuration direction, multiple electronic installation edge is arranged in the second space of correspondence, configuration direction, orientation are mutually orthogonal to one another with vertical direction.By the present invention, the problem the best to solve the test jobs efficiency of prior art existence.
Description
Technical field
The present invention relates to the technical field of a kind of test chassis system, particularly relate to the frame system of a kind of testing service device
System.
Background technology
Along with the development of cloud computing technology, use a large amount of server to process calculating operation and become indispensable, and these
The stability of server becomes the emphasis being concerned especially.In the exploitation proof procedure of server, it is generally required to various merits
The experiment of continuous print machine open/close can be carried out repeatedly and carry out the stability of testing service device, such as need during the debugging (Debug) of system
Carry out repetition machine open/close repeatedly to reappear Bug.
But, current test jobs is, in a test station, multiple servers is carried out the test of a specific function, and
After completing the test of described specific function, more described multiple servers is moved to taking advantage of load limited quantity (about 2-4
Platform) go-cart, then move to another test station carry out another test.
From the viewpoint of lean production, existing test jobs has the action of many redundances, has influence on entirety
Production time.Additionally, due to the number of servers that go-cart can take advantage of load is limited, significantly limits test and produce and transport effect
Rate.Furthermore, when the quantity of server is more, the carrying amount of staff is relatively big, easily causes employee tired or injured.
Summary of the invention
Present invention is primarily targeted at a kind of test chassis system of offer, to solve the test jobs that prior art exists
The problem that efficiency is the best.
For solving the problems referred to above, the embodiment of the present invention provides a kind of test chassis system, and it fills in order to provide multiple electronics
Put and test.The test chassis system of the embodiment of the present invention includes the first moving frame and 2 second moving frames.First moves
Motivation frame has the first support body and multiple first moving assembly, and described first support body constitutes the first space, and the plurality of
One moving assembly is arranged at the bottom of described first support body.Each described second moving frame has the second support body and multiple second
Moving assembly, described second support body constitutes multiple second spaces, houses the plurality of electronic installation respectively, and the plurality of second
Moving assembly is arranged at the bottom of each described second support body, and the plurality of second moving frame is placed in described first space
In.Wherein, the plurality of second space of each described second support body vertically arranges, the plurality of second moving frame edge
Orientation is placed in described first space, and the plurality of electronic installation is arranged at described the second of correspondence along configuration direction
In space, described configuration direction, described orientation are mutually orthogonal to one another with described vertical direction.
Wherein, in described test chassis system, each described second space is provided with at least one arrangement for guiding, each described electronics
Device is arranged in the described second space of correspondence along described configuration direction by described arrangement for guiding.
Wherein, in described test chassis system, each described second moving frame also includes multiple door-plate, is hubbed at respectively
The entrance of corresponding each described second space, limits the movement of described electronic installation in each described second space.
Wherein, in described test chassis system, described first moving frame also includes multiple signal line connection group, arranges
In described first space, each described signal line connection group is electrically connected at the position port at described electronic installation trailing edge.
Wherein, in described test chassis system, also include exchanger group, be configured at described first moving frame, and lead to
The port of the described signal line connection group and described electronic installation of crossing correspondence is electrically connected with.
Wherein, in described test chassis system, also including controller and power supply unit, controller is configured at described
One moving frame, and be electrically connected with by the port of corresponding described signal line connection group with described electronic installation；Power supply is supplied
Device, is configured at described first moving frame, and by the port electricity of corresponding described signal line connection group with described electronic installation
Property connect.
Wherein, in described test chassis system, also include display and display installing rack, display installing rack, tool
Having first end and the second end, described first end is articulated in the front side of described first moving frame along described vertical direction
Edge, described the second end is provided with described display.
Wherein, in described test chassis system, described display installing rack from described first moving frame along described row
Column direction extends out to outside described first moving frame, and described the second end rotates with described vertical direction for axle, with
It is folded in the side of described first moving frame.
Wherein, in described test chassis system, described second moving frame also includes multiple display signal connecting line, point
Not being arranged at each described second space of correspondence, the end of each described display signal connecting line is electrically connected at position at described electronics
The port of device trailing edge, the other end along described configuration direction cabling to described second moving frame leading edge, and with described display
Device is electrically connected with.
Wherein, in described test chassis system, described first moving frame has the first width in described orientation,
Described second moving frame has described second width in described orientation, and described first width is more than or equal to the institute of twice
State the second width sum total.
According to technical scheme, it is by being respectively provided with first moving frame and 2 second with moving assembly
Moving frame, and make the plurality of second moving frame carrying to be tested or the server in test, simultaneously by the plurality of
Second moving frame is placed in described first moving frame, with easily and efficient move a large amount of server to corresponding survey
Examination website.Specifically, technical scheme can also arrange on the first moving frame and carry out testing required display
The associated components such as device, exchanger group, controller, power supply unit, to allow the multiple servers also can be directly in the first moving frame
Inside carry out the functional test of correspondence, be added significantly to the convenience of test jobs.
Accompanying drawing explanation
Accompanying drawing described herein is used for providing a further understanding of the present invention, constitutes the part of the application, this
Bright schematic description and description is used for explaining the present invention, is not intended that inappropriate limitation of the present invention.In the accompanying drawings:
Fig. 1 is the structured flowchart of test chassis system according to embodiments of the present invention；
Fig. 2 is the schematic diagram of test chassis system according to embodiments of the present invention；
Fig. 3 is the schematic diagram of the first moving frame of the test chassis system of Fig. 2；
Fig. 4 is the schematic diagram of the second moving frame of the test chassis system of Fig. 2；
Fig. 5 is the schematic diagram that electronic installation is tested by the test chassis system of Fig. 2；
Fig. 6 is the side schematic view of the test chassis system of Fig. 5；
Fig. 7 is the schematic rear view of the test chassis system of Fig. 5；
Detailed description of the invention
The main thought of the present invention is, based on by arranging moving assembly at the first moving frame, and by second
Moving frame arranges moving assembly, then by the plurality of second moving frame being placed in the space of described first moving frame
In, with easily and efficient multiple servers of moving is to corresponding test station.Certainly, multiple servers also can be directly in
Carry out the functional test of correspondence in one moving frame, be added significantly to the convenience of test jobs.
For making the object, technical solutions and advantages of the present invention clearer, below in conjunction with drawings and the specific embodiments, to this
Invention is described in further detail.
Fig. 1 is the structured flowchart of test chassis system according to embodiments of the present invention.Please refer to Fig. 1, the present embodiment
Test chassis system 100 is provided for multiple electronic installation 200 and tests, its mainly include the first moving frame 110 with
2 second moving frames 120.Additionally, the test chassis system 100 of the present embodiment the most such as includes display 130, exchanger group
150, controller 160 and power supply unit 170.Wherein, the present embodiment such as can will be shown by a display installing rack
Device is installed on described first moving frame 110.Additionally, exchanger group 150 is arranged in described first moving frame 110, and
The described electronic installation 200 be suitable to and be carried on the second moving frame 120 is electrically connected with.Similarly, controller 160 supplies with power supply
Answer device 170 to be the most e.g. configured at described first moving frame 110, and be suitable to and be carried on the described of the second moving frame 120
Electronic installation 200 is electrically connected with.The test chassis system 100 of the present embodiment the most e.g. by display 130, exchanger group 150,
Controller 160 and power supply unit 170 are arranged on the first moving frame 110, and can will carry a large amount of described electronic installation 200
2 second moving frames 120 elapse actively to the space of the first moving frame 110.
Consequently, it is possible to a large amount of electronic installations 200 being carried on described 2 second moving frames 120 can move easily to
In the space of the first moving frame 110, with utilization be arranged on the first moving frame 110 display 130, exchanger group 150,
Controller 160 carries out relevant functional test to power supply unit 170.Certainly, first moving frame 110 of the present embodiment is also
Can be elapsed actively, be passed together to predetermined survey with 2 second moving frames 120 together with space on its interior
Examination website carries out specific test jobs.
Composition component about the test chassis system of the embodiment of the present invention will be in hereafter elaborating.First, herein
The first design for the first moving frame and the second moving frame is explained.Fig. 2 is test according to embodiments of the present invention
The schematic diagram of machine frame system, Fig. 3 is the schematic diagram of the first moving frame of the test chassis system of Fig. 2, and Fig. 4 is the survey of Fig. 2
The schematic diagram of the second moving frame of examination machine frame system.Please in the lump with reference to Fig. 2, Fig. 3 and Fig. 4, the first of the present embodiment is moved
Frame 110 has the first support body 112 and multiple first moving assembly 114, and described first support body 112 constitutes the first space S 1,
And the plurality of first moving assembly 114 is arranged at the bottom of described first support body 112.Similarly, each described second moving machine
Frame 120 has the second support body 122 and multiple second moving assembly 124, and described second support body 122 constitutes multiple second space
S2, houses the plurality of electronic installation 200 respectively, and the plurality of second moving assembly 124 is arranged at each described second support body
The bottom of 122, and the plurality of second moving frame 120 is placed in described first space S 1.It is noted that due to this
First moving frame 110 of embodiment and the second moving frame 120 are both provided with moving assembly, therefore the first moving frame
110 and second moving frame 120 can be elapsed actively, with every operation routine of production test of arranging in pairs or groups by described many
Individual electronic installation 200 is moved to predetermined test station.
From the above, in the present embodiment, the plurality of second space S2 of each described second support body 122 is vertically
D1 arranges, and the plurality of second moving frame 120 is placed in described first space S 1 along orientation D2, and the plurality of electricity
Sub-device 200 is arranged in the described second space S2 of correspondence along configuration direction D3, described configuration direction D3, described orientation
D2 is e.g. mutually orthogonal to one another with described vertical direction D1.Wherein, described first moving frame 110 is in described orientation D2
Having the first width W1, described second moving frame 120 has a described second width W2 in described orientation D2, and described first
Width W1 is e.g. more than or equal to the described second width sum total of twice.Therefore, the first moving frame 110 i.e. can accommodate two
Individual or more second moving frame 120, efficiently to move the plurality of electronic installation 200 to predetermined survey
Examination website.
From the above, for each described electronic installation 200 being conveniently arranged in the described second space S2 of correspondence, with
Follow-up the moving and test jobs of profit, each described second space S2 is provided with at least one arrangement for guiding 126, each described electronic installation
200 such as can be arranged in the described second space S2 of correspondence along described configuration direction D3 by described arrangement for guiding 126.Guide
Assembly 126 can be guide rail or guide roller, and the present embodiment does not do any restriction at this.Additionally, each described second moves
Frame 120 can also include multiple door-plate 128, is hubbed at the entrance I of each described second space S2 of correspondence respectively, each to limit
The movement of the described electronic installation 200 in described second space S2.Consequently, it is possible to either at test jobs or move operation
In, described electronic installation 200 can firmly be configured in each described second space S2 of correspondence.
Fig. 5 is the schematic diagram that electronic installation is tested by the test chassis system of Fig. 2, and Fig. 6 is the test chassis system of Fig. 5
The side schematic view of system, and Fig. 7 is the schematic rear view of test chassis system of Fig. 5.Please also refer to Fig. 5, Fig. 6 and Fig. 7,
In the present embodiment, described first moving frame 110 also includes multiple signal line connection group 116, these signal line connection groups 116
It is disposed on described first space S 1.In the test jobs of described electronic installation 200, each described signal line connection group 116 electricity
Property is connected to the position port P at described electronic installation 200 trailing edge.Similarly, described exchanger group 150, controller 160 and electricity
Source supply 170 the most such as can be by the port P electricity of corresponding described signal line connection group 116 with described electronic installation 200
Property connect.
On the other hand, for test jobs can be carried out efficiently, the present embodiment is by order to be provided with described display
The display installing rack 140 of 130 is articulated in the cephalolateral margin of described first moving frame 110.Additionally, described second moving frame
120 also include multiple display signal connecting line L1.The plurality of display signal connecting line L1 is respectively arranged at each described of correspondence
Second space S2, the end L11 of each described display signal connecting line L1 are electrically connected at position at described electronic installation 200 trailing edge
Port P, the other end L12 along described configuration direction D3 cabling to described second moving frame 120 leading edge, and with described display
130 are electrically connected with.Therefore, tester only needs to stand in the first moving frame 110 front and comes one by one by each for correspondence described electronics
The signal line connection L1 of device 200 is electrically connected to described display 130, i.e. would know that the test of each described electronic installation 200
Message, is substantially improved test jobs efficiency.
It is noted that the display installing rack 140 of the present embodiment has first end 142 and the second end 144,
Described first end 142 is the cephalolateral margin being articulated in described first moving frame 110 along described vertical direction D1, described second end
Portion 144 is then to be provided with described display 130.In the present embodiment, described display installing rack 140 is from described first
Moving frame 110 extends out to outside described first moving frame 110 along described orientation D2, and described the second end
144 rotate with described vertical direction D1 for axle, to be folded in the side of described first moving frame 110.Consequently, it is possible in passage
During first moving frame 110, described display installing rack 140 can carry out described folding operation, it is to avoid passage process
Damaged by external force collision.
In sum, the technical scheme is that by being respectively provided with first moving frame and two with moving assembly
Second moving frame, and make the plurality of second moving frame carrying to be tested or the server in test, simultaneously by described
Multiple second moving frames are placed in described first moving frame, with easily and efficient move a large amount of server to corresponding
Test station.Specifically, technical scheme can also arrange on the first moving frame carry out testing required
The associated components such as display, exchanger group, controller, power supply unit, so that multiple servers also can directly be moved in first
Carry out the functional test of correspondence in frame, be added significantly to the convenience of test jobs.
The foregoing is only embodiments of the invention, be not limited to the present invention, for those skilled in the art
For Yuan, the present invention can have various modifications and variations.All within the spirit and principles in the present invention, any amendment of being made,
Equivalent, improvement etc., within should be included in scope of the presently claimed invention.
Claims (10)
1. a test chassis system, in order to provide multiple electronic installation to test, it is characterised in that including:
First moving frame, has the first support body and multiple first moving assembly, and described first support body constitutes the first space, and
The plurality of first moving assembly is arranged at the bottom of described first support body；
2 second moving frames, each described second moving frame has the second support body and multiple second moving assembly, and described
Two support bodys constitute multiple second spaces, house the plurality of electronic installation respectively, and the plurality of second moving assembly is arranged at
The bottom of each described second support body, and the plurality of second moving frame is placed in described first space；
Wherein, the plurality of second space of each described second support body vertically arranges, the plurality of second moving frame
It is placed in described first space along orientation, and the plurality of electronic installation is arranged at described the of correspondence along configuration direction
In two spaces, described configuration direction, described orientation are mutually orthogonal to one another with described vertical direction.
Test chassis system the most according to claim 1, it is characterised in that each described second space is provided with at least one guiding
Assembly, each described electronic installation is arranged in the described second space of correspondence along described configuration direction by described arrangement for guiding.
Test chassis system the most according to claim 1, it is characterised in that each described second moving frame also includes multiple
Door-plate, is hubbed at the entrance of each described second space of correspondence respectively, limits the described electronic installation in each described second space
Movement.
Test chassis system the most according to claim 1, it is characterised in that described first moving frame also includes multiple news
Number connecting line group, is arranged at described first space, and each described signal line connection group is electrically connected at position after described electronic installation
The port of edge.
Test chassis system the most according to claim 4, it is characterised in that also include:
Exchanger group, is configured at described first moving frame, and is filled with described electronics by corresponding described signal line connection group
The port put is electrically connected with.
Test chassis system the most according to claim 1, it is characterised in that also include:
Controller, is configured at described first moving frame, and by corresponding described signal line connection group and described electronic installation
Port be electrically connected with；
Power supply unit, is configured at described first moving frame, and by corresponding described signal line connection group and described electronics
The port of device is electrically connected with.
Test chassis system the most according to claim 1, it is characterised in that also include:
Display；
Display installing rack, has first end and the second end, and described first end is articulated in institute along described vertical direction
Stating the cephalolateral margin of the first moving frame, described the second end is provided with described display.
Test chassis system the most according to claim 7, it is characterised in that described display installing rack moves from described first
Motivation frame extends out to outside described first moving frame along described orientation, and described the second end is with described Vertical Square
Rotate to for axle, to be folded in the side of described first moving frame.
Test chassis system the most according to claim 7, it is characterised in that described second moving frame also includes multiple aobvious
Showing signal line connection, be respectively arranged at each described second space of correspondence, the end of each described display signal connecting line electrically connects
It is connected to the position port at described electronic installation trailing edge, before the other end is along described configuration direction cabling to described second moving frame
Edge, and be electrically connected with described display.
Test chassis system the most according to claim 1, it is characterised in that described first moving frame is in described arrangement
Direction has the first width, and described second moving frame has described second width, described first width in described orientation
Described second width sum total more than or equal to twice.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610549779.1A CN106201814A (en) | 2016-07-13 | 2016-07-13 | Test chassis system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610549779.1A CN106201814A (en) | 2016-07-13 | 2016-07-13 | Test chassis system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106201814A true CN106201814A (en) | 2016-12-07 |
Family
ID=57477311
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610549779.1A Pending CN106201814A (en) | 2016-07-13 | 2016-07-13 | Test chassis system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106201814A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107202934A (en) * | 2017-06-06 | 2017-09-26 | 英业达科技有限公司 | Test chassis system |
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|---|---|---|---|---|
| JPH11189100A (en) * | 1997-12-26 | 1999-07-13 | Hitachi Denshi Ltd | Movable sub-rack structure of on-board device |
| JP2000332469A (en) * | 1999-05-25 | 2000-11-30 | Fujitsu I-Network Systems Ltd | Telecommunication apparatus |
| KR200377846Y1 (en) * | 2004-12-09 | 2005-03-10 | 주식회사 제이엔에스 | Moving rack for using call test of cellula phone |
| TWI239803B (en) * | 2004-04-07 | 2005-09-11 | Aerospace Ind Dev Corp | Test fixture structure |
| CN104466611A (en) * | 2013-09-25 | 2015-03-25 | 天津仁义合自动化技术有限公司 | Automatic wire inserting equipment for test machine |
| CN105466473A (en) * | 2015-12-28 | 2016-04-06 | 北京二七轨道交通装备有限责任公司 | Test table structure |
| CN205274533U (en) * | 2016-01-12 | 2016-06-01 | 田华伟 | Conveyor of test jig for testing machine |
-
2016
- 2016-07-13 CN CN201610549779.1A patent/CN106201814A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11189100A (en) * | 1997-12-26 | 1999-07-13 | Hitachi Denshi Ltd | Movable sub-rack structure of on-board device |
| JP2000332469A (en) * | 1999-05-25 | 2000-11-30 | Fujitsu I-Network Systems Ltd | Telecommunication apparatus |
| TWI239803B (en) * | 2004-04-07 | 2005-09-11 | Aerospace Ind Dev Corp | Test fixture structure |
| KR200377846Y1 (en) * | 2004-12-09 | 2005-03-10 | 주식회사 제이엔에스 | Moving rack for using call test of cellula phone |
| CN104466611A (en) * | 2013-09-25 | 2015-03-25 | 天津仁义合自动化技术有限公司 | Automatic wire inserting equipment for test machine |
| CN105466473A (en) * | 2015-12-28 | 2016-04-06 | 北京二七轨道交通装备有限责任公司 | Test table structure |
| CN205274533U (en) * | 2016-01-12 | 2016-06-01 | 田华伟 | Conveyor of test jig for testing machine |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107202934A (en) * | 2017-06-06 | 2017-09-26 | 英业达科技有限公司 | Test chassis system |
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Application publication date: 20161207 |