CN106198623A - A kind of device of the arrangement using quartz lamp array light source able to programme for Infrared Non-destructive Testing - Google Patents
A kind of device of the arrangement using quartz lamp array light source able to programme for Infrared Non-destructive Testing Download PDFInfo
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- CN106198623A CN106198623A CN201610786724.2A CN201610786724A CN106198623A CN 106198623 A CN106198623 A CN 106198623A CN 201610786724 A CN201610786724 A CN 201610786724A CN 106198623 A CN106198623 A CN 106198623A
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- quartz lamp
- light source
- arrangement
- fluorescent tube
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
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- General Physics & Mathematics (AREA)
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- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
The invention provides a kind of for Infrared Non-destructive Testing arrangement using quartz lamp array able to programme light supply apparatus, by arranging arrangement using quartz lamp array light source assembly radiating light source, data processing unit calculates the power adjustment parameters of each road quartz lamp fluorescent tube, and it is input to multichannel programmable power supply unit, and each road quartz lamp fluorescent tube is connected with multichannel programmable power supply unit independent electrical respectively, achieve multichannel programmable power supply unit and regulate and control the power of each street lamp pipe according to power adjustment parameters, the fine power adjusting each quartz lamp, thus solve because in heat wave Infrared Non-destructive Testing, light irradiation is uneven, cause testee surface light according to uneven problem, achieve the defect detecting object matrix accurately and effectively.
Description
Technical field
The present invention relates to Infrared Non-destructive Testing technical field, particularly relate to the dress of a kind of arrangement using quartz lamp array light source able to programme
Put.
Background technology
Infrared Non-destructive Testing technology is a kind of new Dynamic Non-Destruction Measurement grown up after nineteen nineties.Closely
Nian Lai, Infrared Non-destructive Testing technology paid close attention to by Non-Destructive Testing worker, its application relate to Aero-Space, electric power safety,
Medical diagnosis, the building field such as bridge and historical relic reparation.The method is theoretical based on conduction of heat and heat radiation, utilizes infrared spoke
The physical characteristic penetrated measures.Any temperature higher than absolute zero object can infrared radiation, Infrared Non-destructive Testing
Technology is to utilize the thermal conduction characteristic of object, the temperature difference that the difference that heat wave conducts is formed by research base matter with defect, with
This judges a kind of lossless detection method that defect exists.Therefore design different driving sources and testee carried out Active spurring,
Use thermal infrared imager to record the change of temperature field of body surface continuously, and obtain body surface heat wave by image processing techniques
The characteristic of signal, realizes the rational judgment to interior of articles defect with this.
Infrared Non-destructive Testing technology has peculiar advantage in composite panel Inner Defect Testing, especially for honeycomb core
The Inner Defect Testing such as composite plate, carbon fiber skin plate and the unsticking of glass fibre skin material intralaminar part, layering, air-gap.
But, in the prior art, there is, due to excitation light source, the problem that irradiation is uneven in Infrared Non-destructive Testing, cause
Irradiation according to uneven to testee surface light, add the uncertainty of detection, affects the detection of heat wave Infrared Non-destructive Testing
Effect.
Summary of the invention
It is an object of the invention to provide the device of a kind of arrangement using quartz lamp array light source able to programme for Infrared Non-destructive Testing, it
The limitation of Infrared Non-destructive Testing light source of the prior art can be overcome, it is achieved accurate to interior of articles defect is quantitatively sentenced
Disconnected.
For achieving the above object, the invention provides following scheme:
A kind of for Infrared Non-destructive Testing arrangement using quartz lamp array able to programme light supply apparatus, it is characterised in that this device includes: stone
English lamp array light source assembly, high-absorbility uniformity test plate, thermal infrared imager, data processing unit and multichannel programmable are powered
Unit；
Described arrangement using quartz lamp array light source assembly is provided with multichannel for producing the quartz lamp fluorescent tube of excitation light source, described high-selenium corn
The one side of rate uniformity test plate is sensitive surface, and described sensitive surface is arranged towards described excitation light source at predeterminable range, described
Thermal infrared imager is in the side of described high-absorbility uniformity test plate, for gathering the thermal-induced imagery of described sensitive surface, institute
State data processing unit, described thermal infrared imager and described multichannel programmable power supply unit to be sequentially connected electrically；
Each road quartz lamp fluorescent tube is connected with described multichannel programmable power supply unit independent electrical respectively, and described data process single
Unit, for analyzing the heat flux distribution characteristic of described excitation light source according to described thermal-induced imagery, and so that described excitation light source
Heat flux distribution be evenly criterion, calculate the power adjustment parameters of each road quartz lamp fluorescent tube, being input to described multichannel can
In programming power supply unit, described multichannel programmable power supply unit regulates and controls the merit of each street lamp pipe according to described power adjustment parameters
Rate.
Said apparatus, preferential, described arrangement using quartz lamp array light source assembly includes closed slide；Described closed slide is a pair
The graduated guide rail of band being parallel to each other, multiple described quartz lamp fluorescent tube one-tenth arranged in parallel array is placed in described closed slide
On, each quartz lamp fluorescent tube is all slidably connected with described closed slide.
Said apparatus, preferential, described arrangement using quartz lamp array light source assembly also includes high reflectance barricade；Described high reflection
Rate barricade one side is resistant to elevated temperatures high reflectance face, and described high reflectance face is parallel with described quartz lamp fluorescent tube and towards described
Quartz burner is arranged；Described high reflectance barricade is slidably connected with described closed slide.
Said apparatus, preferential, described arrangement using quartz lamp array light source assembly also includes lockable mechanism；Quartz lamp fluorescent tube described in one
With the corresponding configured in parallel of high emission barricade described in, the two ends of high reflectance barricade described in quartz lamp fluorescent tube and described in
It is fixed on described closed slide by described lockable mechanism respectively.
Said apparatus, preferential, described high-absorbility uniformity test plate is made up of the metallic plate of one piece of uniform thickness, and one side
Spraying high-absorbility is pitch-dark, and being coated with pitch-dark one side is sensitive surface.
Said apparatus, preferential, described multichannel programmable power supply unit is for adjusting parallel in the power bracket of 0-100%
Control the power of each street lamp pipe.
The specific embodiment provided according to the present invention, the invention discloses techniques below effect:
The one that the present invention provides is for Infrared Non-destructive Testing arrangement using quartz lamp array able to programme light supply apparatus, by arranging quartz
Lamp array radiation light source, thermal infrared imager gathers thermal-induced imagery and analyzes the heat flux distribution characteristic of excitation light source, at data
Reason unit makes the heat flux distribution of excitation light source evenly and calculates the power adjustment parameters of each road quartz lamp fluorescent tube, is input to
Multichannel programmable power supply unit, and each road quartz lamp fluorescent tube is connected with multichannel programmable power supply unit independent electrical respectively, it is achieved
Multichannel programmable power supply unit regulates and controls the power of each street lamp pipe according to power adjustment parameters, the fine each quartz lamp of adjustment
Power, compared with prior art, overcomes the limitation of Infrared Non-destructive Testing light source of the prior art, solves because heat wave is infrared
In Non-Destructive Testing, light irradiation is uneven, causes testee surface light according to uneven problem, it is achieved that to examine accurately and effectively
Survey the defect of object matrix.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to institute in embodiment
The accompanying drawing used is needed to be briefly described, it should be apparent that, the accompanying drawing in describing below is only some enforcements of the present invention
Example, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to according to these accompanying drawings
Obtain other accompanying drawing.
Fig. 1 is the workflow diagram of the arrangement using quartz lamp array light source able to programme in the embodiment of the present invention；
Fig. 2 is the arrangement using quartz lamp array light source assembly apparatus structure schematic diagram in the embodiment of the present invention；
Fig. 3 is the structural representation of the arrangement using quartz lamp array light source able to programme in the embodiment of the present invention.
Arrangement using quartz lamp array light source assembly 101 high-absorbility uniformity test plate 102
Thermal infrared imager 103 data processing unit 104
Power supply unit 105 quartz burner 201 able to programme
Closed slide 202 high reflectance barricade 203
Lockable mechanism 204 quartz lamp group 301
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Describe, it is clear that described embodiment is only a part of embodiment of the present invention rather than whole embodiments wholely.Based on
Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under not making creative work premise
Embodiment, broadly falls into the scope of protection of the invention.
Understandable for enabling the above-mentioned purpose of the present invention, feature and advantage to become apparent from, real with concrete below in conjunction with the accompanying drawings
The present invention is further detailed explanation to execute mode.
Embodiments provide a kind of for Infrared Non-destructive Testing arrangement using quartz lamp array able to programme light supply apparatus, such as Fig. 1
Shown in, process including arrangement using quartz lamp array light source assembly 101, high-absorbility uniformity test plate 102, thermal infrared imager 103, data
Unit 104, multichannel programmable power supply unit 105.
Described arrangement using quartz lamp array light source assembly 101 is provided with multichannel for producing the quartz lamp fluorescent tube of excitation light source, described height
The one side of absorbance uniformity test plate 102 is sensitive surface, and described sensitive surface sets towards described excitation light source at predeterminable range
Putting, described thermal infrared imager 103 is in the side of described high-absorbility uniformity test plate 102, for gathering described sensitive surface
Thermal-induced imagery, described data processing unit 104, described thermal infrared imager 103 and described multichannel programmable power supply unit 105 depend on
Secondary electrical connection；
Each road quartz lamp fluorescent tube is connected, at described data with described multichannel programmable power supply unit 105 independent electrical respectively
Reason unit 104 for analyzing the heat flux distribution characteristic of described excitation light source and so that described sharp according to described thermal-induced imagery
The heat flux distribution encouraging light source is evenly criterion, calculates the power adjustment parameters of each road quartz lamp fluorescent tube, is input to described
In multichannel programmable power supply unit 105, described multichannel programmable power supply unit regulates and controls each road according to described power adjustment parameters
The power of fluorescent tube.
Wherein, described arrangement using quartz lamp array light source assembly 101, as in figure 2 it is shown, specifically include quartz burner 201, closed slide
202, high reflectance barricade 203 and lockable mechanism 204.
Multiple described quartz burners 201 one-tenth arranged in parallel array is placed on described closed slide 202, each quartz burner
All it is slidably connected with described closed slide 202, the high reflectance face of described high reflectance shielding 203 and described quartz burner 201
Parallel and arrange towards described quartz burner 201, i.e. quartz burner 201 described in is corresponding with high emission barricade 203 described in
Configured in parallel, described high reflectance barricade 203 is slidably connected with described closed slide 202, quartz burner 201 and one described in
The two ends of described high reflectance barricade 203 are fixed on described closed slide by described lockable mechanism 204 respectively.
Wherein, described quartz burner 201 is by heating element heater based on quartz lamp, mainly by tungsten filament, quartz burner
Form with lamp holder.Tungsten filament uses tungsten metal to turn to spiral, as the main radiant heat source of quartz lamp.Quartz burner uses stone
English glass, lamp filling steel pipes with argon, to suppress oxidation and the heat volatilization of tungsten.Fluorescent tube can absorb a part of energy in filament radiative process
Amount, becomes source of secondary radiation.The tungsten that filament is used belongs to refractory metal, and fusing point reaches 3400 DEG C, the most described quartz burner
Have that linear expansion coefficient is little, vapour pressure under high temperature and the advantage such as evaporation rate is low.And the quartz glass used by fluorescent tube has pole
Low thermal coefficient of expansion, high temperature tolerance, its melt temperature is 1725 DEG C, can work, and have splendid at 1200 DEG C
Thoroughly ultraviolet, visible ray and infrared spectrum performance, has that thermal inertia is little, is easy to control and the advantage such as assembling.
Described closed slide 202 is made up of the graduated guide rail of band that a pair is parallel to each other, and described quartz burner 201 can
To be fixed at closed slide arbitrary scale；Manually adjusting described quartz burner 201 spacing by described closed slide, it is right to obtain
The thermal excitation light source quick, high-power of Infrared Non-destructive Testing test specimen also exports with pulse or continuous print mode.
Described high reflectance barricade 203 one side is resistant to elevated temperatures high reflectance face, for described quartz lamp group being launched
Light all reflect back, determine that the light energy of quartz lamp group is to a fixing direction radiation.
Described lockable mechanism 204 is for being separately fixed at institute by high reflectance barricade described in quartz burner described in one and
State closed slide both sides.
Described high-absorbility uniformity test plate 102, is made up of the metallic plate of one piece of uniform thickness, and one side spraying high-absorbility is black
Paint.Before standing on described arrangement using quartz lamp array light source assembly 101 light-emitting area in use, and make to spray paint facing to described arrangement using quartz lamp array
Light source assembly 101.
Described thermal infrared imager 103, is radiated at described high-absorbility uniformity for Real-time Collection by described quartz lamp group
The infrared chart produced on test board 102, and described data processing unit 104 can be given by real-time data transmission.
Described data processing unit 104, by USB interface respectively with the described thermal infrared imager 103 of front end and rear end
Described power supply unit able to programme 105 connects, and by analyzing the Infrared Thermography Data of thermal imaging system transmission described in front end, analyzes quartz
The heat flux distribution characteristic of lamp group, and provide quartz lamp power adjustment parameters and be input in described power supply unit able to programme 105, simultaneously
According to analyzing the heat flux distribution characteristic of quartz lamp group, calculate fluorescent tube spacing, manually adjust described quartz by closed slide
Fluorescent tube 201 spacing, obtains the thermal excitation light source quick, high-power to Infrared Non-destructive Testing test specimen.
Described power supply unit able to programme 105, for supporting the multi-channel control of quartz lamp group, can the most certainly
By regulating, or controlling the switch of any quartz burner, the most each road quartz burner is powered with described multichannel programmable respectively
Unit 105 independent electrical connects, and described multichannel programmable power supply unit 105 regulates and controls each street lamp pipe according to described power adjustment parameters
Power, there is the function of the power that each street lamp pipe is fine-tuned, and in the power bracket of 0-100% and Row sum-equal matrix is multiple
The power output of quartz burner.
Present invention also offers the structure of a complete arrangement using quartz lamp array light source able to programme for Infrared Non-destructive Testing
Schematic diagram, as it is shown on figure 3, this instrument includes quartz lamp lamp group 301, closed slide 202, high reflectance barricade 203, locking machine
Structure 204, high-absorbility uniformity test plate 102, thermal infrared imager 103, data processing unit 104 and multichannel programmable are powered list
Unit 105.Quartz lamp lamp group 301 and high reflectance barricade 203 are commonly connected on scale closed slide 202, and use locking machine
Structure 204 is fixed.Before high-absorbility uniformity test plate 102 stands on quartz lamp group 301 light-emitting area.Thermal infrared imager 103 is towards height
Absorbance uniformity test plate 102 sensitive surface, data processing unit 104 can with thermal infrared imager 103 and multichannel by USB interface
Programming power supply unit 104 connects.
This instrument is by using quartz lamp group 301 radiating light source, and by quartz lamp group 301 and high reflectance barricade 203
It is placed in parallel and passes through lockable mechanism 204 and both are fixed on the graduated closed slide 202 of band, and high reflectance barricade
The high reflectance of 203, facing to quartz lamp group 301, improves in Infrared Non-destructive Testing, owing to light source luminescent critical piece is
Filament, around filament, the degree of irregularity of luminous energy is the highest, causes irradiation to testee surface light according to uneven, impact detection knot
The problem of fruit.
Meanwhile, by manually adjusting the spacing of quartz burner 301 with graduated closed slide 202, can obtain red
The thermal excitation light source quick, high-power of outer Non-Destructive Testing test specimen also exports with pulse or continuous print mode, overcomes in lossless inspection
Excitation light in survey is generally modulated to sine or square, does not possess the problem that light intensity is fine-tuned function.
It addition, each road quartz burner 301 is connected with multichannel programmable power supply unit 105 independent electrical respectively, data process
Unit 104 analyzes the heat flux distribution characteristic of excitation light source, and so that the hot-fluid of described excitation light source according to infrared chart instrument 103
It is more evenly distributed as criterion, calculates the power adjustment parameters of each road quartz burner 301, be input to multichannel programmable and power list
In unit 105, it is achieved that multichannel programmable power supply unit 105 can adjust power parameter according to practical situation and regulate and control each street lamp pipe
Power, the fine power adjusting each quartz lamp.
To sum up, the invention provides a kind of for Infrared Non-destructive Testing arrangement using quartz lamp array able to programme light supply apparatus, by setting
Put arrangement using quartz lamp array light source assembly, improve uneven because of light irradiation in heat wave Infrared Non-destructive Testing, cause measured object body surface
The problem that face uneven illumination is even.
Secondly, data processing unit calculates the power adjustment parameters of each road quartz lamp fluorescent tube, and is input to multichannel and can compile
Journey power supply unit, and each road quartz lamp fluorescent tube is connected with multichannel programmable power supply unit independent electrical respectively, it is achieved that multichannel can
Programming power supply unit regulates and controls the power of each street lamp pipe according to power adjustment parameters.
It addition, data cell is according to analyzing the heat flux distribution characteristic of driving source, calculates fluorescent tube spacing, pass through parallel conductive
Rail manually adjusts described quartz burner spacing, obtains the thermal excitation light source quick, high-power to Infrared Non-destructive Testing test specimen, improves
Because the driving source efficiency of heating surface is not enough, object matrix can be made inconspicuous with defect temperature difference and cannot clearly differentiate both ask
Topic, the thermal excitation light source quick, high-power simultaneously obtained is to export with pulse or continuous print mode, to overcome in prior art
Only excitation light is generally modulated to sine or square output, does not possess light intensity and function is fine-tuned.
In this specification, each embodiment uses the mode gone forward one by one to describe, and what each embodiment stressed is and other
The difference of embodiment, between each embodiment, identical similar portion sees mutually.For system disclosed in embodiment
For, owing to it corresponds to the method disclosed in Example, so describe is fairly simple, relevant part sees method part and says
Bright.
Principle and the embodiment of the present invention are set forth by specific case used herein, saying of above example
Bright method and the core concept thereof being only intended to help to understand the present invention；Simultaneously for one of ordinary skill in the art, foundation
The thought of the present invention, the most all will change.In sum, this specification content is not
It is interpreted as limitation of the present invention.
Claims (6)
1. one kind is used for Infrared Non-destructive Testing arrangement using quartz lamp array able to programme light supply apparatus, it is characterised in that this device includes: quartz
Lamp array light source assembly, high-absorbility uniformity test plate, thermal infrared imager, data processing unit and multichannel programmable are powered list
Unit；
Described arrangement using quartz lamp array light source assembly be provided with multichannel for produce excitation light source quartz lamp fluorescent tube, described high-absorbility is equal
The one side of even property test board is sensitive surface, and described sensitive surface is arranged towards described excitation light source at predeterminable range, described infrared
Thermal imaging system is in the side of described high-absorbility uniformity test plate, for gathering the thermal-induced imagery of described sensitive surface, described number
It is sequentially connected electrically according to processing unit, described thermal infrared imager and described multichannel programmable power supply unit；
Each road quartz lamp fluorescent tube is connected with described multichannel programmable power supply unit independent electrical respectively, described data processing unit,
For analyzing the heat flux distribution characteristic of described excitation light source according to described thermal-induced imagery, and so that the heat of described excitation light source
Flow distribution is evenly criterion, calculates the power adjustment parameters of each road quartz lamp fluorescent tube, is input to described multichannel programmable
In power supply unit, described multichannel programmable power supply unit regulates and controls the power of each street lamp pipe according to described power adjustment parameters.
One the most according to claim 1 is used for Infrared Non-destructive Testing arrangement using quartz lamp array able to programme light supply apparatus, its feature
Being, described arrangement using quartz lamp array light source assembly includes closed slide；
Described closed slide is the graduated guide rail of the band being parallel to each other for a pair, multiple described quartz lamp fluorescent tube Cheng Zhen arranged in parallel
Column is placed on described closed slide, and each quartz lamp fluorescent tube is all slidably connected with described closed slide.
One the most according to claim 1 is used for Infrared Non-destructive Testing arrangement using quartz lamp array able to programme light supply apparatus, its feature
Being, described arrangement using quartz lamp array light source assembly also includes high reflectance barricade；
Described high reflectance barricade one side is resistant to elevated temperatures high reflectance face, described high reflectance face and described quartz lamp fluorescent tube
Parallel and towards described quartz lamp fluorescent tube arrange；Described high reflectance barricade is slidably connected with described closed slide.
One the most according to claim 3 is used for Infrared Non-destructive Testing arrangement using quartz lamp array able to programme light supply apparatus, its feature
Being, described arrangement using quartz lamp array light source assembly also includes lockable mechanism；
Quartz lamp fluorescent tube described in one and the corresponding configured in parallel of high emission barricade described in, described in quartz lamp fluorescent tube and described in
The two ends of high reflectance barricade are fixed on described closed slide by described lockable mechanism respectively.
The device of a kind of arrangement using quartz lamp array light source able to programme for Infrared Non-destructive Testing the most according to claim 1, its
Being characterised by, described high-absorbility uniformity test plate is made up of the metallic plate of one piece of uniform thickness, and one side spraying high-absorbility is black
Paint, being coated with pitch-dark one side is sensitive surface.
The device of a kind of arrangement using quartz lamp array light source able to programme for Infrared Non-destructive Testing the most according to claim 1, its
Being characterised by, described multichannel programmable power supply unit is for each street lamp pipe of parallel regulation and control in the power bracket of 0-100%
Power.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610786724.2A CN106198623A (en) | 2016-08-31 | 2016-08-31 | A kind of device of the arrangement using quartz lamp array light source able to programme for Infrared Non-destructive Testing |
| CN201710120430.0A CN106872522B (en) | 2016-08-31 | 2017-03-02 | A kind of device of the programmable arrangement using quartz lamp array light source for Infrared Non-destructive Testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610786724.2A CN106198623A (en) | 2016-08-31 | 2016-08-31 | A kind of device of the arrangement using quartz lamp array light source able to programme for Infrared Non-destructive Testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106198623A true CN106198623A (en) | 2016-12-07 |
Family
ID=58087190
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610786724.2A Withdrawn CN106198623A (en) | 2016-08-31 | 2016-08-31 | A kind of device of the arrangement using quartz lamp array light source able to programme for Infrared Non-destructive Testing |
| CN201710120430.0A Expired - Fee Related CN106872522B (en) | 2016-08-31 | 2017-03-02 | A kind of device of the programmable arrangement using quartz lamp array light source for Infrared Non-destructive Testing |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710120430.0A Expired - Fee Related CN106872522B (en) | 2016-08-31 | 2017-03-02 | A kind of device of the programmable arrangement using quartz lamp array light source for Infrared Non-destructive Testing |
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| CN (2) | CN106198623A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110146547A (en) * | 2019-05-07 | 2019-08-20 | 上海工程技术大学 | A kind of infrared thermal wave NDT device |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108287028A (en) * | 2018-01-15 | 2018-07-17 | 北京理工大学 | Slow roasting combustion temperature test platform and its method based on Mechatronic Systems and dangerous material |
| CN112484956A (en) * | 2020-12-17 | 2021-03-12 | 中国航天空气动力技术研究院 | Quartz lamp radiation device with adjustable heat flux density for high-speed aircraft heat intensity test |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103558243B (en) * | 2013-11-19 | 2015-10-07 | 北京航空航天大学 | A kind of high-speed aircraft hot surface full field deformation measure device based on optical means |
| CN203703791U (en) * | 2014-01-20 | 2014-07-09 | 王赞 | LED table lamp with controllable light source |
| CN105222897A (en) * | 2015-09-10 | 2016-01-06 | 北京环境特性研究所 | A kind of metered dose high temp, infrared radiation origin system |
-
2016
- 2016-08-31 CN CN201610786724.2A patent/CN106198623A/en not_active Withdrawn
-
2017
- 2017-03-02 CN CN201710120430.0A patent/CN106872522B/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110146547A (en) * | 2019-05-07 | 2019-08-20 | 上海工程技术大学 | A kind of infrared thermal wave NDT device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106872522A (en) | 2017-06-20 |
| CN106872522B (en) | 2019-09-06 |
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Application publication date: 20161207 |