CN106154202B - A kind of calibration method of electrical short-circuit testing ＆ measuring system - Google Patents
A kind of calibration method of electrical short-circuit testing ＆ measuring system Download PDFInfo
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- CN106154202B CN106154202B CN201610599203.6A CN201610599203A CN106154202B CN 106154202 B CN106154202 B CN 106154202B CN 201610599203 A CN201610599203 A CN 201610599203A CN 106154202 B CN106154202 B CN 106154202B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
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Abstract
The invention discloses a kind of calibration methods of electrical short-circuit testing ＆ measuring system, include the following steps：S1：Digital waveform signal is transmitted to the short-circuit waveform generator of simulation；S2：Digital waveform signal is converted into alignment of waveforms signal by the short-circuit waveform generator of simulation, and by alignment of waveforms signal transmission to measuring nose；S3：Survey Software at measurement host carries out data to the analog waveform signal that measuring nose exports and calculates to obtain the parameter of analog waveform signal；S4：The parameter of obtained analog waveform signal is compared with the parameter of digital waveform signal to obtain its difference.The present invention is as the improvement to component calibration method, when calibrating the measuring nose and measurement host of electrical short-circuit testing ＆ measuring system, using standard simulation short-circuit test waveform replace standard sine wave or square wave as signal source, it is more in line with practical application scene, the correctness and reliability of Short-Circuit Test Measurement System calibration is greatly improved.
Description
Technical field
The invention belongs to short-circuit tests to measure calibration field more particularly to a kind of calibration of electrical short-circuit testing ＆ measuring system
Method.
Background technology
The short-circuit test of electric appliance refers to that the various height voltage electricals such as verification breaker, switchgear, fuse and transformer are set
For under the experimental condition of correlation standard, short circuit current is closed, the ability of disjunction or carrying.It is that short circuit is closed and opened
The a series of experiments such as disconnected experiment, ultimate short-circuit breaking capacity experiment, short-circuit ability to bear experiment and peak value tolerance current testing
General name.When short-circuit test, electrical equipment itself can flow through the short circuit current of hundreds thousand of amperes of highest, and bear very high electronic
Power, heat and overvoltage.Therefore, short-circuit test is whether to judge equipment as more harsh experiment is examined to electrical equipment
The important means met the requirements of the standard.
When carrying out the short-circuit test of electrical equipment, need to record short circuit current, power frequency recovery voltage, transient state without distortion
Restore voltage, on/off switch coil current, the waveforms such as stroke curve, and accurately calculate from these waveforms virtual value, peak value,
The electric parameters such as the duration of short-circuit, transient recovery voltage value, arc time, power factor and DC component percentage, so as to
In just effectively judgement experiment, whether effective and these electrical equipments pass through experiment.For this reason, it may be necessary to which a kind of work is steady
Fixed reliable, electrical isolation and strong antijamming capability, picking rate be fast, parameter measurement calculates accurate Short-Circuit Test Measurement System.
Under this demand, the companies such as German HBM, U.S. ATIS are respectively proposed the measuring system of oneself, are widely used in the country
During the short-circuit test in outer major laboratory measures.These systems are in acquisition short circuit current, the recovery differences such as voltage or stroke curve
When the waveform of property, the low-level analog signals of small amount journey first generally are converted into (such as short circuit electricity with different transmitters
Stream uses current divider or Rogowski coil and integrator as transmitter, restores voltage and uses voltage transformer or RC divider as change
Device, stroke curve is sent to use incremental encoder or displacement sensor as transmitter), then by general measuring nose such as hall sensing
After the isolation such as device or photoelectric converter, it is sent into measurement host.Host is filtered these signals, samples and operation etc.
Reason, obtains digitized actual waveform.The software and algorithm that measuring system is separately developed according to included or user again, from waveform
On calculate the test parameters of the key such as virtual value, transient recovery voltage value, arc time and DC component percentage.Accordingly,
Testing crew judges whether effective and tested device passes through experiment for this experiment.
Therefore, short-circuit test is formed by above-mentioned transmitter, measuring nose, measurement host, Survey Software and four part of algorithm
The measurement accuracy and computational accuracy of measuring system affect to a large extent test result judgement consistency with it is just
Property.The calibration of measuring system is also thus particularly important for each laboratory.According to International Electrotechnical Commission
(International Electrotechnical Commission, IEC) and international short-circuit test alliance (Short-
Circuit Testing Liaison, STL) relevant criterion and fire protection technology regulation, it is current to short circuit in the world at present
The calibration method of testing ＆ measuring system has following two：
First, piece calibration method.The survey that standard Short-Circuit Test Measurement System i.e. by a set of after calibration is calibrated with needs
Amount system is installed along in the test loop in laboratory, and mark is used in customer laboratory by an approved calibration laboratory
Experiment is compared in the measuring system that locating tab assembly system calibrates needs.Made with the measurement of gauge measurement system and algorithm calculated value
For conventional true value, the measuring and calculating value of itself and measuring system to be calibrated is mutually compared, the school of measuring system to be calibrated is realized with this
It is accurate.
Second is that component calibration method.I.e. first to the transmitter of measuring system, such as current divider, Rogowski coil and integrator, capacitance-resistance
The components such as divider are calibrated respectively with respective product standard.Again to the measuring noses such as Hall sensor, photoelectric converter and survey
Host is measured, is calibrated with the waveform generator of standard and high-acruracy survey instrument.Then to Survey Software and algorithm, international short circuit
Experiment alliance proposes the method calibrated with a test data generator (Test Data Generator, TDG) software.
Specifically, TDG softwares theoretically simulate and generate different starting component virtual values, DC component, noise, drift,
Under the sampling parameters setting value such as the data parameters such as time constant setting value and sampling rate, total sampling number, data bits
Short-circuit test current waveform, and be txt text files according to certain format conversion.Survey Software to be verified imports this file
And it is displayed as wavy curve, it reuses its algorithm and calculates the ginsengs such as peak value, virtual value, DC component, the duration of waveform
Number.Finally these parameters are compared with above-mentioned setting value, to calibrate the Survey Software and algorithm.Finally, by the school of each section
Quasi- result is integrated into together, so that it may to obtain the calibration result of entire measuring system.
In practical applications, all there is defects and deficiency for above two method.For piece calibration method, first, obtain
A set of standard Short-Circuit Test Measurement System is highly difficult, and especially rated current is up to hundreds thousand of amperes of standard shunt,
All very high to the technique for manufacturing and processing and required precision, few correcting mechanisms possess.Secondly, it needs to install when calibration a whole set of
Gauge measurement system, be carried out at the same time actual short-circuit test, need to take a substantial amount of time and energy, cost are very high.Again,
The acting characteristic of test product, the distributed constant etc. in circuit are not quite similar when experiment every time, and these restore arc time, transient state
Voltage etc. has large effect, causes the repdocutbility of calibration poor.Therefore piece calibration method is seldom used in practice, generally only
There are a small number of large capacity laboratories when going into operation for the first time or can just be used when international comparison.
For component calibration method, main drawback is that distinguishing components such as transmitter, measuring nose and measurement hosts
When being calibrated, sine wave or square wave etc. that correcting mechanism can only provide standard according to its respective standard are used as signal source, and
The actual short-circuit test waveform for including abundant direct current and high fdrequency component can not be provided, this prevents calibration result from reflecting reality
Applicable cases, and difference is unpredictable between the two.In addition, when being calibrated to measurement host and software, TDG softwares can only give birth to
At the current waveform of short-circuit test, and it includes the key parameters such as transient recovery voltage, arc time, arc voltage that cannot generate
Voltage waveform, on/off switch coil current waveform and stroke curve.And TDG softwares are practical only to have calibrated software and algorithm
Uncertainty, and can not uncertainty of the calibration measurement host in data acquisition, conversion and transmission.
Invention content
For overcome the deficiencies in the prior art, the purpose of the present invention is to provide a kind of electrical short-circuit testing ＆ measuring systems
The correctness and reliability of Short-Circuit Test Measurement System calibration is greatly improved in calibration method.
The purpose of the present invention is realized using following technical scheme：
A kind of calibration method of electrical short-circuit testing ＆ measuring system, includes the following steps：
S1：Digital waveform signal is transmitted to the short-circuit waveform generator of simulation, the digital waveform signal is stored in
In one storage chip；
S2：Digital waveform signal is converted into alignment of waveforms signal, and high-ranking officers' quasi wave by the short-circuit waveform generator of simulation
Shape signal transmission is to measuring nose；
S3：Survey Software at measurement host carries out data to the analog waveform signal that measuring nose exports and calculates to obtain
Alignment of waveforms signal is converted to by the parameter of analog waveform signal, the analog waveform signal by measuring nose；
S4：The parameter of obtained analog waveform signal is compared with the parameter of digital waveform signal, obtains analog wave
The difference of the parameter of shape signal and the parameter of digital waveform signal.
Preferably, the measuring nose is Hall sensor or photoisolator.It can further solve measuring nose
Setting the technical issues of.
Preferably, the short-circuit waveform generator of the simulation includes the fpga chip being electrically connected successively, analog-digital chip
And low-pass filter.The technical issues of it further can solve to simulate the composition of short-circuit waveform generator.
Preferably, the short-circuit waveform generator of the simulation further includes direct synthesizer, the direct synthesizer
It is electrically connected between fpga chip and analog-digital chip.It can further solve the problems, such as the accuracy of data waveform.
Preferably, the digital waveform signal be standard short-circuit test waveform or test data generator generate waveform or
Person's theoretical calculation data waveform.It can further solve the problems, such as the source of digital waveform signal.
Preferably, the parameter of analog waveform signal includes the virtual value of waveform, transient recovery voltage value, arc time and straight
Flow component percentage.The parameters of analog waveform signal can be disclosed further.
Compared with prior art, the beneficial effects of the present invention are：
The innovation of the present invention mainly has following three points：1, as the improvement to component calibration method, the present invention is calibrating
When Hall sensor, photoisolator and measurement host, the sine wave of standard is replaced using the simulation short-circuit test waveform of standard
Or square wave is more in line with practical application scene as signal source, and the correct of Short-Circuit Test Measurement System calibration is greatly improved
Property and reliability；2, the present invention is in calibration measurement software and algorithm, can be used the actual current waveform of simulation, voltage waveform or
Stroke curve, which is used as signal source rather than test data generator software, can only use current waveform, and therefore, the present invention can be more
To be calibrated to Survey Software and algorithm comprehensively and credibly；3, the present invention leads Hall sensor, photoisolator, measurement
Machine and Survey Software and algorithm are calibrated together as a whole, are had the advantages that simple flow and are improved efficiency.Also school together simultaneously
The accurate transmission line and communication network of these equipment rooms, is easy to find to be easy to the hardware joint looseness ignored, line when individually calibration
The problems such as road impedance mismatch and abnormal network transmission.
Description of the drawings
Fig. 1 is the flow chart of the calibration method of electrical short-circuit pilot system of the present invention；
Fig. 2 is the circuit structure diagram of the short-circuit waveform generator of present invention simulation.
Specific implementation mode
In the following, in conjunction with attached drawing and specific implementation mode, the present invention is described further：
As depicted in figs. 1 and 2, the present invention provides a kind of calibration methods of electrical short-circuit testing ＆ measuring system, including with
Lower step：
S1：Digital waveform signal is transmitted to the short-circuit waveform generator of simulation, the digital waveform signal is stored in
In one storage chip；The short-circuit waveform generator of the simulation include the fpga chip being electrically connected successively, direct current frequency synthesizer,
Analog-digital chip and low-pass filter,
The digital waveform signal can be derived from any one in following three kinds of modes：1, pass through short-circuit test parameter root
It is theoretical calculation data waveform according to the model and theoretical formula method of short circuit；2, it is being tested by short-circuit test parameter
It is directly generated on number generator (TDG) and (is only limitted to short circuit current waveform), be that test data generator generates waveform；3, by
Meet the acquisition of relevant criterion required standard Short-Circuit Test Measurement System by calibration and uncertainty and measures short-circuit test
The standard short-circuit test waveform of parameter is standard short-circuit test waveform；Then digital waveform signal is stored in storage chip
In.
S2：Digital waveform signal is converted into alignment of waveforms signal, and high-ranking officers' quasi wave by the short-circuit waveform generator of simulation
Shape signal transmission is to measuring nose；The measuring nose is one kind in Hall sensor or photoisolator.
S3：Survey Software at measurement host carries out data to the analog waveform signal that measuring nose exports and calculates to obtain
Alignment of waveforms signal is converted to by the parameter of analog waveform signal, the analog waveform signal by measuring nose；Analog waveform
The parameter of signal includes virtual value, peak value, the duration of short-circuit, transient recovery voltage value, arc time and the direct current point of waveform
Measure percentage etc..
S4：The parameter of obtained analog waveform signal is compared with the parameter of digital waveform signal, obtains analog wave
The difference of the parameter of shape signal and the parameter of digital waveform signal.
The operation principle of the present invention：
It is above-mentioned be made of fpga chip, Direct Digital Frequency Synthesizers, analog-digital chip and low-pass filter it is arbitrary
The short-circuit waveform generator of the simulations of given parameters before use, itself should by the calibration of standard Short-Circuit Test Measurement System, with
Its measured value, uncertainty and traceability is set to meet relevant criterion requirement.In use, above-mentioned simulation short circuit waveform generator output
Alignment of waveforms signal be sent in the measuring nose of Short-Circuit Test Measurement System to be calibrated, and be measured system measurement master
Machine is acquired and is handled.Survey Software and algorithm in measurement host calculate collected short-circuit test waveform, obtain
The parameters such as virtual value, transient recovery voltage value, arc time and the DC component percentage of waveform.These parameters are short with simulating
The known parameters of the generator of road test waveform mutually compare, can know measuring nose, measurement host and Survey Software and
The combined standard uncertainty of algorithm.If the uncertainty of the measuring system transmitter is taken into account, so that it may to realize to whole
The calibration of a Short-Circuit Test Measurement System.
It will be apparent to those skilled in the art that technical solution that can be as described above and design, make various other
Corresponding change and deformation, and all these changes and deformation should all belong to the protection domain of the claims in the present invention
Within.
Claims (6)
1. a kind of calibration method of electrical short-circuit testing ＆ measuring system, which is characterized in that include the following steps：
S1：Digital waveform signal is transmitted to the short-circuit waveform generator of simulation, the digital waveform signal is stored in one and deposits
It stores up in chip；
S2：Digital waveform signal is converted into alignment of waveforms signal by the short-circuit waveform generator of simulation, and alignment of waveforms is believed
Number it is transmitted to measuring nose；
S3：Survey Software at measurement host carries out data to the analog waveform signal that measuring nose exports and calculates to be simulated
Alignment of waveforms signal is converted to by the parameter of waveform signal, the analog waveform signal by measuring nose；
S4：The parameter of obtained analog waveform signal is compared with the parameter of digital waveform signal, obtains analog waveform letter
Number parameter and digital waveform signal parameter difference.
2. the calibration method of electrical short-circuit testing ＆ measuring system as described in claim 1, which is characterized in that the measuring nose
For Hall sensor or photoisolator.
3. the calibration method of electrical short-circuit testing ＆ measuring system as described in claim 1, which is characterized in that the simulation short circuit
Waveform generator includes fpga chip, analog-digital chip and the low-pass filter being electrically connected.
4. the calibration method of electrical short-circuit testing ＆ measuring system as described in claim 1, which is characterized in that the simulation short circuit
Waveform generator further includes direct synthesizer, and the direct synthesizer is electrically connected at fpga chip and digital-to-analogue
Between conversion chip.
5. the calibration method of electrical short-circuit testing ＆ measuring system as described in claim 1, which is characterized in that the digital waveform
Signal is that either test data generator generates waveform or theoretical calculation data waveform to standard short-circuit test waveform.
6. the calibration method of electrical short-circuit testing ＆ measuring system as described in claim 1, which is characterized in that analog waveform signal
Parameter include the virtual value of waveform, transient recovery voltage value, arc time and DC component percentage.
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Families Citing this family (8)
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| WO2018018467A1 (en) * | 2016-07-27 | 2018-02-01 | 东莞市广安电气检测中心有限公司 | Method for calibrating short circuit test measurement system for electric appliance |
| CN108627790B (en) * | 2018-05-09 | 2021-04-02 | 合肥国轩高科动力能源有限公司 | Method for detecting measurement accuracy of lithium ion battery roll core short circuit tester |
| CN111698133B (en) * | 2020-06-23 | 2021-12-24 | 上海仁童电子科技有限公司 | Waveform correction instrument and waveform correction method |
| CN112147396B (en) * | 2020-09-09 | 2023-01-31 | 中国电力科学研究院有限公司 | Method and system for calculating percentage of direct current component of short-circuit current |
| CN112257360B (en) * | 2020-10-21 | 2024-04-16 | 海光信息技术股份有限公司 | Debugging method, device, debugging system and storage medium for data waveform |
| CN112257359B (en) * | 2020-10-21 | 2024-04-16 | 海光信息技术股份有限公司 | Debugging method, device, debugging system and storage medium for data waveform |
| CN113325352B (en) * | 2021-04-25 | 2024-02-23 | 中国电力科学研究院有限公司 | Calibration method and system for transient current measurement sensor |
| CN114089669B (en) * | 2021-11-22 | 2024-09-24 | 甘肃电器科学研究院 | Synchronous control system for single-channel high-voltage synthesis test |
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| TWI224197B (en) * | 2003-01-09 | 2004-11-21 | Delta Electronics Inc | Automatic test system |
| CN202008526U (en) * | 2011-03-07 | 2011-10-12 | 安徽省电力科学研究院 | Accuracy verification system for digital signal based electric energy quality measurement device |
| CN203414503U (en) * | 2013-08-08 | 2014-01-29 | 中国人民解放军总装备部军械技术研究所 | Self-checking adapter of automatic detection system based on PXI bus |
| CN105005013B (en) * | 2015-08-13 | 2017-10-31 | 成都三方电气有限公司 | A kind of calibrating installation of high-current test equipment |
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Inventor after: Zhou Xiaomeng Inventor after: Lin Zhili Inventor after: Yang Ming Inventor after: Zhang Dafen Inventor after: Li Shuyi Inventor after: Li Saisai Inventor after: Guo Xiangrong Inventor before: Zhou Xiaomeng Inventor before: Lin Zhili Inventor before: Zhang Dafen Inventor before: Li Shuyi Inventor before: Li Saisai Inventor before: Guo Xiangrong |
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