CN106154202A - A kind of calibration steps of electrical short-circuit testing & measuring system - Google Patents
A kind of calibration steps of electrical short-circuit testing & measuring system Download PDFInfo
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- CN106154202A CN106154202A CN201610599203.6A CN201610599203A CN106154202A CN 106154202 A CN106154202 A CN 106154202A CN 201610599203 A CN201610599203 A CN 201610599203A CN 106154202 A CN106154202 A CN 106154202A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
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Abstract
The invention discloses the calibration steps of a kind of electrical short-circuit testing & measuring system, comprise the following steps: S1: by digital waveform signal transmission to simulation short circuit waveform generator；S2: digital waveform signal is converted into alignment of waveforms signal by simulation short circuit waveform generator, and transmits alignment of waveforms signal to measuring nose；S3: the analog waveform signal that measuring nose is exported by the Survey Software at measurement main frame carries out data and calculates with the parameter obtaining analog waveform signal；S4: the parameter of the analog waveform signal obtained and the parameter of digital waveform signal are compared and obtains its difference.The present invention is as the improvement to assembly calibration method, when calibrating the measuring nose of electrical short-circuit testing & measuring system and measuring main frame, the sine wave of the simulation short-circuit test waveform replacement standard of use standard or square wave are as signal source, more conform to actual application scenarios, correctness and the reliability of Short-Circuit Test Measurement System calibration are greatly improved.
Description
Technical field
The invention belongs to short-circuit test and measure calibration field, particularly relate to the calibration of a kind of electrical short-circuit testing & measuring system
Method.
Background technology
The short-circuit test of electrical equipment, refers to verify that the various high-low pressures such as chopper, switch cubicle, fuse and transformator electrically set
Standby under the experimental condition of correlation standard, short circuit current is closed, disjunction or the ability of carrying.It is that short circuit closes and opens
The series of experiments such as disconnected test, ultimate short-circuit breaking capacity test, short circuit ability to bear test and peak value tolerance current testing
General name.During short-circuit test, electrical equipment self can flow through the short circuit current of the highest hundreds thousand of amperes, and bears the highest electronic
Power, heat and overvoltage.Therefore, short-circuit test as to the electrical equipment the harshest test of examination, be judge equipment whether
The important means that conformance with standard requires.
When carrying out the short-circuit test of electrical equipment, need to record short circuit current, power frequency recovery voltage, transient state without distortion
Recover the waveform such as voltage, on/off switch coil current, stroke curve, and calculate exactly from these waveforms virtual value, peak value,
The electric parameters such as the duration of short-circuit, transient recovery voltage value, arc time, power factor and DC component percent, in order to
Effectively judge that the most effectively and whether these electrical equipments are by testing in test in just.For this reason, it may be necessary to a kind of work is steady
Determine reliable, electrical isolation and capacity of resisting disturbance is strong, picking rate is fast, parameter measurement calculates Short-Circuit Test Measurement System accurately.
Under this demand, the company such as HBM, U.S. ATIS of Germany is each proposed the measurement system of oneself, is widely used in domestic
During the short-circuit test of outer each big experiment room is measured.These systems are gathering short circuit current, are recovering the difference such as voltage or stroke curve
During the waveform of character, the most first it is converted into the low-level analog signals of small amount journey (such as short circuit electricity with different transmitters
Stream diverter or Luo-coil and integrator, as transmitter, recover voltage voltage transformer or RC divider as change
Sending device, stroke curve incremental encoder or displacement transducer are as transmitter), then by general measuring nose such as hall sensing
After the isolation such as device or optical-electrical converter, send into and measure in main frame.These signals are filtered by main frame, sample and computing etc.
Reason, obtains digitized actual waveform.The measurement system software that foundation carries or user is developed separately again and algorithm, from waveform
On calculate the test parameters that virtual value, transient recovery voltage value, arc time and DC component percent etc. are crucial.Accordingly,
Testing crew judges this test, and the most effectively and whether tested device is by test.
Therefore, above-mentioned transmitter, measuring nose, measurement main frame, Survey Software and algorithm four part short-circuit test is formed
The certainty of measurement of measurement system and computational accuracy affect the concordance of result of the test judgement to a large extent with just
Property.The calibration of measurement system for each laboratory also thus be particularly important.According to International Electrotechnical Commission
(International Electrotechnical Commission, IEC) and international short-circuit test alliance (Short-
Circuit Testing Liaison, STL) relevant criterion and the regulation of fire protection technology, the most current to short circuit
The calibration steps of testing & measuring system has a following two:
One is piece calibration method.Will a set of standard Short-Circuit Test Measurement System after calibration and the survey needing calibration
Amount system is installed along with in the test loop of laboratory, an approved calibration laboratory use mark at customer laboratory
The measurement system needing calibration is compared test by locating tab assembly system.Make with algorithm value of calculation with the measurement of gauge measurement system
For conventional true value, by itself and the measuring and calculating mutual comparison of value of measurement system to be calibrated, realize the school of measurement system to be calibrated with this
Accurate.
Two is assembly calibration method.The most first transmitter to the system of measurement, such as diverter, Luo-coil and integrator, capacitance-resistance
The assemblies such as potentiometer, calibrate respectively by respective product standard.Again to the measuring nose such as Hall element, optical-electrical converter and survey
Amount main frame, waveform generator and high-acruracy survey instrument by standard are calibrated.Then to Survey Software and algorithm, international short circuit
Test alliance proposes the method calibrated with a test data generator (Test Data Generator, TDG) software.
Specifically, TDG software simulate theoretically and generate different initial component virtual values, DC component, noise, drift,
Under the sampling parameter setting values such as the data parameters setting values such as time constant and sampling rate, total sampling number, data bits
Short-circuit test current waveform, and be converted to txt text according to certain form.Survey Software to be verified imports this file
And it is displayed as wavy curve, re-use its algorithm and calculate the ginsengs such as the peak value of waveform, virtual value, DC component, persistent period
Number.Finally by these parameters compared with above-mentioned setting value, calibrate this Survey Software and algorithm.Finally, by the school of each several part
Quasi-result is integrated into together, it is possible to obtain the calibration result of whole measurement system.
In actual applications, above two method all also exists defect and deficiency.For piece calibration method, first, obtain
A set of standard Short-Circuit Test Measurement System is highly difficult, and particularly rated current is up to the standard shunt of hundreds thousand of amperes,
Technique and required precision to manufacturing and process are the highest, seldom have correcting mechanism to have.Secondly, need during calibration the whole series are installed
Gauge measurement system, carry out simultaneously reality short-circuit test, need take a substantial amount of time and energy, cost is the highest.Again,
During test, the acting characteristic of test product, the distributed constant etc. in loop are all not quite similar every time, and arc time, transient state are recovered by these
Voltage etc. have large effect, and the repdocutbility causing calibration is poor.Therefore reality seldom use piece calibration method, the most only
There is minority Large Copacity laboratory just can use when going into operation first or when carrying out international comparison.
For assembly calibration method, it main drawback is that transmitter, measuring nose and measures the assemblies such as main frame respectively
When calibrating, correcting mechanism can only according to its respective standard provide the sine wave of standard or square wave etc. as signal source, and
Cannot provide the actual short-circuit test waveform comprising abundant direct current and high fdrequency component, this makes calibration result can not reflect reality
Applicable cases, and difference is unpredictable between the two.Additionally, when calibrating measurement main frame and software, TDG software can only be given birth to
Become the current waveform of short-circuit test, and key parameters such as including transient recovery voltage, arc time, arc voltage can not be generated
Voltage waveform, on/off switch coil current waveform and stroke curve.And TDG software is actual has only calibrated software and algorithm
Uncertainty, and cannot calibration measurement main frame data acquisition, change and transmit time uncertainty.
Summary of the invention
In order to overcome the deficiencies in the prior art, it is an object of the invention to provide a kind of electrical short-circuit testing & measuring system
Calibration steps, its correctness that Short-Circuit Test Measurement System calibration is greatly improved and reliability.
The purpose of the present invention realizes by the following technical solutions:
The calibration steps of a kind of electrical short-circuit testing & measuring system, comprises the following steps:
S1: by digital waveform signal transmission to simulation short circuit waveform generator, described digital waveform signal is stored in
In one storage chip；
S2: digital waveform signal is converted into alignment of waveforms signal, and high-ranking officers' quasi wave by simulation short circuit waveform generator
Shape signal transmits to measuring nose；
S3: the analog waveform signal that measuring nose is exported by the Survey Software at measurement main frame carries out data and calculates to obtain
The parameter of analog waveform signal, alignment of waveforms signal is converted to by described analog waveform signal by measuring nose；
S4: the parameter of the analog waveform signal obtained is compared with the parameter of digital waveform signal, obtains analog wave
The parameter of shape signal and the difference of the parameter of digital waveform signal.
Preferably, described measuring nose is Hall element or photoisolator.It can solve measuring nose further
The technical problem of setting.
Preferably, described simulation short circuit waveform generator includes fpga chip, the analog-digital chip being electrically connected with successively
And low pass filter.Its technical problem that can solve further to simulate the composition of short circuit waveform generator.
Preferably, described simulation short circuit waveform generator also includes direct synthesizer, described direct synthesizer
It is electrically connected between fpga chip and analog-digital chip.The problem that can solve the accuracy of data waveform further.
Preferably, described digital waveform signal be standard short-circuit test waveform or test data generator produce waveform or
Person's Theoretical Calculation data waveform.The problem that can solve the source of digital waveform signal further.
Preferably, the parameter of analog waveform signal includes the virtual value of waveform, transient recovery voltage value, arc time and straight
Flow component percent.The parameters of analog waveform signal can be disclosed further.
Compared to existing technology, the beneficial effects of the present invention is:
The innovation of the present invention mainly has following three points: 1, as the improvement to assembly calibration method, and the present invention is in calibration
When Hall element, photoisolator and measurement main frame, the simulation short-circuit test waveform of standard is used to replace the sine wave of standard
Or square wave is as signal source, more conform to actual application scenarios, Short-Circuit Test Measurement System calibration correct is greatly improved
Property and reliability；2, the present invention is when calibration measurement software and algorithm, can use the actual current waveform of simulation, voltage waveform or
Stroke curve is used as signal source, rather than test data generator software can only use current waveform, and therefore, the present invention can be more
For and credibly Survey Software and algorithm being calibrated comprehensively；3, the present invention is by Hall element, photoisolator, measurement master
Machine and Survey Software are calibrated together with entirety with algorithm, have simple flow and put forward high efficiency advantage.School the most in the lump
The transmission line of these equipment rooms accurate and communication network, easily find hardware joint looseness, the line being prone to ignore during individually calibration
The problems such as road impedance mismatch and network transmission abnormality.
Accompanying drawing explanation
Fig. 1 is the flow chart of the calibration steps of electrical short-circuit pilot system of the present invention；
Fig. 2 is the circuit structure diagram that the present invention simulates short circuit waveform generator.
Detailed description of the invention
Below, in conjunction with accompanying drawing and detailed description of the invention, the present invention is described further:
As depicted in figs. 1 and 2, the invention provides the calibration steps of a kind of electrical short-circuit testing & measuring system, including with
Lower step:
S1: by digital waveform signal transmission to simulation short circuit waveform generator, described digital waveform signal is stored in
In one storage chip；Fpga chip that described simulation short circuit waveform generator includes being electrically connected with successively, direct current frequency synthesizer,
Analog-digital chip and low pass filter,
Described digital waveform signal can with come from following three kinds of modes any one: 1, by short-circuit test parameter root
According to model and the theoretical formula method of short circuit, it it is i.e. Theoretical Calculation data waveform；2, by short-circuit test parameter in test
Directly generate (being only limitted to short circuit current waveform) on number generator (TDG), be i.e. that test data generator produces waveform；3, by
Meet relevant criterion required standard Short-Circuit Test Measurement System collection through calibration and uncertainty and recorded short-circuit test
The standard short-circuit test waveform of parameter, is i.e. standard short-circuit test waveform；Then digital waveform signal is stored in storage chip
In.
S2: digital waveform signal is converted into alignment of waveforms signal, and high-ranking officers' quasi wave by simulation short circuit waveform generator
Shape signal transmits to measuring nose；Described measuring nose is the one in Hall element or photoisolator.
S3: the analog waveform signal that measuring nose is exported by the Survey Software at measurement main frame carries out data and calculates to obtain
The parameter of analog waveform signal, alignment of waveforms signal is converted to by described analog waveform signal by measuring nose；Analog waveform
The parameter of signal includes that the virtual value of waveform, peak value, the duration of short-circuit, transient recovery voltage value, arc time and direct current divide
Amount percent etc..
S4: the parameter of the analog waveform signal obtained is compared with the parameter of digital waveform signal, obtains analog wave
The parameter of shape signal and the difference of the parameter of digital waveform signal.
The operation principle of the present invention:
Above-mentioned by fpga chip, Direct Digital Frequency Synthesizers, analog-digital chip and low pass filter form any
The simulation short circuit waveform generator of given parameters before use, itself should pass through the calibration of standard Short-Circuit Test Measurement System, with
Its measured value, uncertainty and traceability is made to meet relevant criterion requirement.During use, above-mentioned simulation short circuit waveform generator exports
Alignment of waveforms signal be sent in the measuring nose of Short-Circuit Test Measurement System to be calibrated, and the measurement master of measured system
Machine is gathered and is processed.Measure the Survey Software in main frame and the short-circuit test waveform collected is calculated by algorithm, draw
The parameters such as the virtual value of waveform, transient recovery voltage value, arc time and DC component percent.These parameters are short with simulation
The mutual comparison of known parameters of the generator of road test waveform, just can know measuring nose, measure main frame and Survey Software and
The combined standard uncertainty of algorithm.If the uncertainty of this measurement system transmitter is taken into account, it is possible to realize whole
The calibration of individual Short-Circuit Test Measurement System.
It will be apparent to those skilled in the art that can technical scheme as described above and design, make other various
Corresponding change and deformation, and all these change and deformation all should belong to the protection domain of the claims in the present invention
Within.
Claims (6)
1. the calibration steps of an electrical short-circuit testing & measuring system, it is characterised in that comprise the following steps:
S1: by digital waveform signal transmission to simulation short circuit waveform generator, described digital waveform signal is stored in one and deposits
In storage chip；
S2: digital waveform signal is converted into alignment of waveforms signal by simulation short circuit waveform generator, and alignment of waveforms is believed
Number transmission to measuring nose；
S3: the analog waveform signal that measuring nose is exported by the Survey Software at measurement main frame carries out data and calculates to be simulated
The parameter of waveshape signal, alignment of waveforms signal is converted to by described analog waveform signal by measuring nose；
S4: the parameter of the analog waveform signal obtained compared with the parameter of digital waveform signal, obtains analog waveform letter
Number the difference of parameter of parameter and digital waveform signal.
2. the calibration steps of electrical short-circuit testing & measuring system as claimed in claim 1, it is characterised in that described measuring nose
For Hall element or photoisolator.
3. the calibration steps of electrical short-circuit testing & measuring system as claimed in claim 1, it is characterised in that described analog waveform
Signal generator includes fpga chip, analog-digital chip and the low pass filter being electrically connected with.
4. the calibration steps of electrical short-circuit testing & measuring system as claimed in claim 1, it is characterised in that described simulation short circuit
Waveform generator also includes that direct synthesizer, described direct synthesizer are electrically connected at fpga chip and digital-to-analogue conversion
Between chip.
5. the calibration steps of electrical short-circuit testing & measuring system as claimed in claim 1, it is characterised in that described digital waveform
Signal is that standard short-circuit test waveform or test data generator produce waveform or Theoretical Calculation data waveform.
6. the calibration steps of electrical short-circuit testing & measuring system as claimed in claim 1, it is characterised in that analog waveform signal
Parameter include the virtual value of waveform, transient recovery voltage value, arc time and DC component percent.
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Cited By (8)
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| WO2018018467A1 (en) * | 2016-07-27 | 2018-02-01 | 东莞市广安电气检测中心有限公司 | Method for calibrating short circuit test measurement system for electric appliance |
| CN108627790A (en) * | 2018-05-09 | 2018-10-09 | 合肥国轩高科动力能源有限公司 | Method for detecting measurement accuracy of lithium ion battery roll core short circuit tester |
| CN111698133A (en) * | 2020-06-23 | 2020-09-22 | 上海仁童电子科技有限公司 | Waveform correction instrument and waveform correction method |
| CN112147396A (en) * | 2020-09-09 | 2020-12-29 | 中国电力科学研究院有限公司 | Method and system for calculating percentage of direct current component of short-circuit current |
| CN112257360A (en) * | 2020-10-21 | 2021-01-22 | 海光信息技术股份有限公司 | Debugging method, device, debugging system and storage medium for data waveform |
| CN112257359A (en) * | 2020-10-21 | 2021-01-22 | 海光信息技术股份有限公司 | Debugging method, device, debugging system and storage medium for data waveform |
| CN113325352A (en) * | 2021-04-25 | 2021-08-31 | 中国电力科学研究院有限公司 | Calibration method and system for transient current measurement sensor |
| CN114089669A (en) * | 2021-11-22 | 2022-02-25 | 甘肃电器科学研究院 | Synchronous control system for single-channel high-voltage synthesis test |
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| GB2555888A (en) * | 2016-07-27 | 2018-05-16 | Dongguan Guang An Electrical Testing Centre Co Ltd | Method for calibrating short circuit test measurement system for electric appliance |
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| CN108627790B (en) * | 2018-05-09 | 2021-04-02 | 合肥国轩高科动力能源有限公司 | Method for detecting measurement accuracy of lithium ion battery roll core short circuit tester |
| CN108627790A (en) * | 2018-05-09 | 2018-10-09 | 合肥国轩高科动力能源有限公司 | Method for detecting measurement accuracy of lithium ion battery roll core short circuit tester |
| CN111698133A (en) * | 2020-06-23 | 2020-09-22 | 上海仁童电子科技有限公司 | Waveform correction instrument and waveform correction method |
| CN112147396A (en) * | 2020-09-09 | 2020-12-29 | 中国电力科学研究院有限公司 | Method and system for calculating percentage of direct current component of short-circuit current |
| CN112147396B (en) * | 2020-09-09 | 2023-01-31 | 中国电力科学研究院有限公司 | Method and system for calculating percentage of direct current component of short-circuit current |
| CN112257359A (en) * | 2020-10-21 | 2021-01-22 | 海光信息技术股份有限公司 | Debugging method, device, debugging system and storage medium for data waveform |
| CN112257360A (en) * | 2020-10-21 | 2021-01-22 | 海光信息技术股份有限公司 | Debugging method, device, debugging system and storage medium for data waveform |
| CN112257359B (en) * | 2020-10-21 | 2024-04-16 | 海光信息技术股份有限公司 | Debugging method, device, debugging system and storage medium for data waveform |
| CN112257360B (en) * | 2020-10-21 | 2024-04-16 | 海光信息技术股份有限公司 | Debugging method, device, debugging system and storage medium for data waveform |
| CN113325352A (en) * | 2021-04-25 | 2021-08-31 | 中国电力科学研究院有限公司 | Calibration method and system for transient current measurement sensor |
| CN113325352B (en) * | 2021-04-25 | 2024-02-23 | 中国电力科学研究院有限公司 | Calibration method and system for transient current measurement sensor |
| CN114089669A (en) * | 2021-11-22 | 2022-02-25 | 甘肃电器科学研究院 | Synchronous control system for single-channel high-voltage synthesis test |
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