CN1061457C - 坑/纹道判别电路 - Google Patents
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- G11B11/105—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor using recording by magnetic means or other means for magnetisation or demagnetisation of a record carrier, e.g. light induced spin magnetisation; Demagnetisation by thermal or stress means in the presence or not of an orienting magnetic field using a beam of light or a magnetic field for recording by change of magnetisation and a beam of light for reproducing, i.e. magneto-optical, e.g. light-induced thermomagnetic recording, spin magnetisation recording, Kerr or Faraday effect reproducing
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Abstract
加到输入端子上的、来自光敏元件的输出信号,在加法电路11中进行运算后,加在第1及第2晶体管上。来自第1晶体管的输出信号是用电容器进行包络检波后的信号,在减法电路中与第2晶体管13的输出信号进行运算。减法电路的输出信号在比较电路中与基准值进行比较。根据比较结果的比较电路输出信号加在可重触发单稳态多谐振荡器上。而且,从可重触发单稳态多谐振荡器产生根据光盘上坑/纹道判别结果的输出信号。
Description
本发明涉及判别光盘上的、特别是可记录的磁光盘上的坑区和纹道区的坑/纹道判别电路。
近年来设计了相当于CD(密纹盘)一半大小的容易处理的MD(小型盘)。MD不仅能再生,而且能用光和磁进行记录。
这种可记录的MD的内周部分刻有与CD相同的坑,在该坑区外侧部分上形成螺旋形纹道,沿纹道进行数据记录。在这种MD上记录信号时,首先用发射器跟踪坑部分,当拾取到表示记录条件的数据后,必须使光发射器移动到横切坑及纹道系列的位置上。但是,由于以往横切时不能判别坑和纹道,所以,必须将光发射器移动到纹道中间,然后再置于纹道的前端,存在着到记录开始前的这段时间长的问题。
可是,由于反射率(径向跟踪信号,Radial Tracking Signal)在坑上和纹道上不同,所以,为了进行适当的伺服,就必须判别正在跟踪坑部分还是正在跟踪纹道部分。以往,作为这种跟踪时的坑/纹道判别电路,设计了如图2所示的电路。
在图2中,光敏元件的输出信号通过输入端子(1)及(2),再分别经过第1及第2耦合电容器(3)及(4)后,在使用差动放大器的加法电路(5)中进行加法运算,变成RF信号。RF信号通过第3耦合电容器(6)后,加到峰值保持电路(7)上,保持上述RF信号的峰值。峰值保持电路(7)的输出信号在比较电路(8)中与基准值进行比较,根据比较结果,产生“1”或“0”输出信号。
图2中的坑/纹道判别电路能够判别跟踪坑和纹道两者中的哪一个。但是,图2中的坑/纹道判别电路在发射器横切时不能进行坑/纹道判别,因此不能用于如上所述的记录开始时的判别。即横切时,在坑及纹道两个区内,从加法电路(5)产生输出信号,由于上述输出信号的峰值被保持,所以从比较电路(8)产生“1”输出信号,故不能进行判别。
本发明就是鉴于上述问题而开发的,其特征为:它由下述各部分构成,对从光盘读出的信号进行加法运算的加法器;对该加法器的输出信号进行包络检波的包络检波器:对上述加法器的输出信号和包络检波器的输出信号进行减法运算的减法器:对该减法器的输出信号和基准值进行比较、根据比较结果产生输出信号的比较器;以及当加上该比较器输出信号后、在规定时间内产生输出信号的信号发生器。
另一个特征是:在MD唱机中,横切时判别MD上的坑区和纹道区。
如果根据本发明,则从光盘读出的信号在加法器中进行加法运算后,由包络检波器进行包络检波。而且,在减法器中,加法器的输出信号和包络检波器的输出信号相减后,减法器的输出信号在比较器中与基准值进行比较,再根据比较器的输出信号,从信号发生器产生输出信号。如上所述,通过加法器的输出信号和包络检波器的输出信号相减,进行横切磁迹时坑/纹道的判别。
图1是表示本发明一个实施例的电路图:
图2是表示先有例的图:
图3是表示横切磁迹系列时,图1中的各部分输出波形的波形图
图4是表示跟踪时,图1中的各部分输出波形的波形图。
图中,11:加法电路
12:第1晶体管
13:第2晶体管
14:电容器
15:第1恒流源
16.第2恒流源
17:减法电路
18:比较电路
19.可重触发单稳态多谐振荡器
图1所示是本发明的一个实施例,(9)及(10)是第1及第2光敏元件的输出信号加在其上的输入端子,(11)是由电阻和运算放大器构成的、对光敏元件输出信号进行加法运算的加法电路,(12)及(13)是加法电路(11)的输出信号加在其基极上的第1及第2晶体管,(14)是连接在第1晶体管发射极和地之间的电容器,(15)及(16)是分别连接在第1及第2晶体管(12)及(13)发射极上的第1及第2恒流源,(17)是由电阻和运算放大器构成的、对第1及第2晶体管(12)及(13)的输出信号进行减法运算的减法电路、(18)是把减法电路(17)的输出信号的基准值进行比较的比较电路、(19)是比较电路(16)的输出信号加在其上的可重触发单稳态多谐振荡器。另外,第1晶体管(12)、电容器(14)及第1恒流源(15)构成包络检波电路,第2晶体管(13)及恒流源(16)构成发射极跟随器。
参照图3所示的波形图说明图1电路的动作。光发射器横切光盘上的磁迹系列时,来自第1及第2光敏元件的输出信号通过输入端子(9)及(10)分别加在加法电路(11)上。在加法电路(11)中,对上述输出信号进行加法运算,在加法电路(11)的输出端产生如图3(a)所示的RF信号。
这时,在光盘上的坑区,坑的反射率小,其它地方的反射率大。而在纹道区,纹道的反射率大,其它地方反射率小。因此,如果横切旋转的光盘上的磁迹系列,则如图3(a)所示,RF信号在坑区和纹道区不同。
RF信号加在第1及第2晶体管(12)及(13)的基极上被放大。由于电容器(14)和第1恒流源(15)连接在第1晶体管(12)的发射极上,因此当第1晶体管(12)的发射极电流比第1恒流源(15)的恒定电流大时,上述发射极电流与恒定电流之差供给电容器(14),电容器(14)被充电。另外,当上述发射极电流比上述恒定电流小时,电容器(14)放电。因为把电容器(14)的时间常数设定为能够跟踪与上述磁迹系列对应的RF信号的变化,所以,来自第1晶体管(12)发射极的输出信号成为对加法电路(11)的输出信号进行了包络检波的信号,如图3(b)所示。
另外,由于第2恒流源(16)连接在第2晶体管(13)的发射极上,构成了发射极跟随器,所以,从第2晶体管(13)发射极产生的输出信号成为具有与图3(a)同样波形的信号。但是可以把来自第1及第2晶体管(12)及(13)输出信号的最大值调整得一致。
来自第1及第2晶体管(12)及(13)的输出信号通过第1及第2缓冲放大器(20)及(21)后加在减法电路(17)上。在减法电路(17)中对上述输出信号进行减法运算,在减法电路(17)的输出端出现图3(c)所示的信号。在图3(c)中,在坑区产生输出信号,在纹道区由于来自第1及第2晶体管(12)及(13)的输出信号一致,所以从减法电路(17)不产生输出信号。
减法电路(17)的输出信号加在比较电路(18)的(-)端子上与加在(+)端子上的基准值Vref进行比较。当减法电路(17)的输出信号值比基准值小时,比较电路(18)的输出信号为“1”,当上述输出信号比基准值大时,比较电路(18)的输出信号为“0”。因此,如图3(c)所示,如果对应于减法电路(17)的输出信号设定基准值Vref,则比较电路(18)的输出信号为图3(d)所示的信号。
另外,比较电路(18)的输出信号加在可重触发单稳态多谐振荡器(19)上。可重触发单稳态多谐振荡器的动作如下,例如,当输入触发信号来到时,与输入触发信号上升的同时,产生输出信号“1”,输入触发信号即使下降,也继续产生输出信号“1”,从下降开始经过规定的时间后,输出信号变为“0”,在产生输出信号的过程中,当下一个输入触发信号来到时,从上述输入触发信号下降开始经过规定的时间后,停止产生输出信号。因此,由于上述规定时间设定得比图3(d)所示的坑区中信号之间的时间长,所以可重触发单稳态多谐振荡器(19)的输出信号为图3(e)所示的信号。因此,图1所示电路的输出信号在坑区为“1”,在纹道区为“0”,所以光发射器横切磁迹系列时,能判别坑/纹道。
其次,利用图4说明光发射器跟踪磁迹系列时,图1中各部分的输出信号。在加法电路(11)的输出端出现如图4(a)所示的波形,在坑区出现根据光盘上坑的排列的信号,在纹道区出现数值一定的波形。此后对加法电路(11)的输出信号进行包络检波,则在第1晶体管(12)的发射极上出现如图4(b)所示的信号。另外在第2晶体管(13)的发射极上产生具有与图(a)同样波形的信号。
然后,来自第1及第2晶体管(12)及(13)的输出信号相减,在减法电路(17)的输出端出现如图4(c)所示的信号。在图4(c)中,在坑区出现信号,而在纹道区不出现信号。因此,将图4(c)中的减法电路(17)的输出信号与基准值Vref进行比较,便从比较电路(18)产生如图4(d)所示的信号。另外,从可重触发单稳态多谐振荡器(19)产生的、根据比较电路(18)的输出信号的信号表现为如图4(e)所示的波形。
因此,光发射器跟踪坑区的磁迹系列时,图1所示电路的输出信号为“1”;跟踪纹道区时,上述输出信号为“0”。
另外,在图1中,第1及第2晶体管(12)及(13)虽然是采用nPn型晶体管,但上述晶体管也可采用PnP型的晶体管。这时,上述晶体管的集电极接地,发射极连接在第1及第2恒流源(15)及(16)上,同时第1及第2恒流源(15)及(16)连接在电源电压上。
另外,可重触发单稳态多谐振荡器(19)也可以使用从输入触发信号上升开始、在规定时间内产生输出信号的装置。
因此,如果根据本发明,对来自光敏元件的输出信号进行加法运算得到RF信号,利用该RF信号与对其进行包络检波后的信号相减而生成的信号,不仅跟踪时而且横切时也能进行坑/纹道判别。
另外,进行MD记录时,由于能进行横切时的坑/纹道判别,所以将光发射器移动到坑和纹道的边界附近后,由于能置于纹道的前端,所以能缩短记录开始前的时间。
Claims (2)
1.一种坑/纹道判别电路,其特征为:它由下述各部分构成,
对从光盘读出的信号进行加法运算的加法器:
对所述加法器的输出信号进行包络检波的包络检波器;
对所述加法器的输出信号和包络检波器的输出信号进行减法运算的减法器;
对该减法器的输出信号和基准值进行比较、根据比较结果产生输出信号的比较器:
以及根据该比较器输出信号、在规定时间内产生输出信号的信号发生器。
2.根据权利要求1所述的坑/纹道判别电路,其特征为:它是用于MD系统的坑/纹道判别电路,横切时判别MD上的坑区和纹道区。
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JP6050730A JP2944411B2 (ja) | 1994-03-22 | 1994-03-22 | ピット/グルーブ判別回路 |
JP050730/1994 | 1994-03-22 | ||
JP050730/94 | 1994-03-22 |
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CN1134011A CN1134011A (zh) | 1996-10-23 |
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EP (1) | EP0674311B1 (zh) |
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KR (1) | KR0168450B1 (zh) |
CN (1) | CN1061457C (zh) |
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KR0176569B1 (ko) * | 1996-01-29 | 1999-04-15 | 김광호 | 광디스크 시스템에 있어서 두께가 다른 디스크간의 자동판별방법 및 장치 |
KR100197631B1 (ko) * | 1996-11-29 | 1999-06-15 | 윤종용 | 트래킹밸런스 보정장치 |
JP3690177B2 (ja) | 1999-02-22 | 2005-08-31 | 三菱電機株式会社 | ディスク装置 |
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US20050156322A1 (en) * | 2001-08-31 | 2005-07-21 | Smith Lee J. | Thin semiconductor package including stacked dies |
JP5238984B2 (ja) * | 2009-05-29 | 2013-07-17 | セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー | レベルシフト回路 |
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JPH0654554B2 (ja) * | 1987-03-26 | 1994-07-20 | 日本電気株式会社 | 光磁気再生装置 |
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-
1994
- 1994-03-22 JP JP6050730A patent/JP2944411B2/ja not_active Expired - Fee Related
-
1995
- 1995-02-08 TW TW084101019A patent/TW350066B/zh not_active IP Right Cessation
- 1995-03-21 DK DK95301887T patent/DK0674311T3/da active
- 1995-03-21 US US08/407,563 patent/US5541907A/en not_active Expired - Lifetime
- 1995-03-21 EP EP95301887A patent/EP0674311B1/en not_active Expired - Lifetime
- 1995-03-21 DE DE69512114T patent/DE69512114T2/de not_active Expired - Fee Related
- 1995-03-21 KR KR1019950005933A patent/KR0168450B1/ko not_active IP Right Cessation
- 1995-03-22 CN CN95103011A patent/CN1061457C/zh not_active Expired - Fee Related
Patent Citations (2)
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US4821252A (en) * | 1986-11-20 | 1989-04-11 | Ricoh Company, Ltd. | Information recording and/or reproducing apparatus |
EP0429045A2 (en) * | 1989-11-20 | 1991-05-29 | Matsushita Electric Industrial Co., Ltd. | Optical disc reproducing apparatus |
Also Published As
Publication number | Publication date |
---|---|
JP2944411B2 (ja) | 1999-09-06 |
DE69512114D1 (de) | 1999-10-21 |
DK0674311T3 (da) | 2000-04-03 |
EP0674311B1 (en) | 1999-09-15 |
US5541907A (en) | 1996-07-30 |
DE69512114T2 (de) | 1999-12-30 |
TW350066B (en) | 1999-01-11 |
KR950034125A (ko) | 1995-12-26 |
EP0674311A3 (en) | 1996-01-03 |
EP0674311A2 (en) | 1995-09-27 |
KR0168450B1 (ko) | 1999-03-20 |
JPH07262561A (ja) | 1995-10-13 |
CN1134011A (zh) | 1996-10-23 |
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