CN106093484A - Surface mount SAW filter test fixture - Google Patents
Surface mount SAW filter test fixture Download PDFInfo
- Publication number
- CN106093484A CN106093484A CN201610606100.8A CN201610606100A CN106093484A CN 106093484 A CN106093484 A CN 106093484A CN 201610606100 A CN201610606100 A CN 201610606100A CN 106093484 A CN106093484 A CN 106093484A
- Authority
- CN
- China
- Prior art keywords
- test
- circuit board
- press strip
- test circuit
- surface mount
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
Abstract
The invention discloses a kind of surface mount SAW filter test fixture, including testing base, test circuit board and test press strip, test circuit board is removably installed in the middle part of testing base upper surface length direction, and test circuit board upper surface is covered with the conductive film strengthening electric conductivity；Conductive film is provided with test sheet frame, is provided with the cavity of up/down perforation in the middle part of test sheet frame；Testing, circuit board side is unsettled is provided with high-frequency adapter device；Test press strip two ends are located at testing base upper surface by trip bolt and are positioned on test circuit board.The present invention, by reducing testing base upper surface and the size of test circuit board, shortens the length of holding wire on test circuit board, reduces loss；Test press strip lobe more than tested device, make device can preferably with test circuit board contacts, reduce contact loss；Test press strip two ends are screwed, can flexible height, be widely used in the test of the surface mount housing device of different encapsulation.
Description
Technical field
The invention belongs to SAW device technical field, especially relate to a kind of surface mount SAW filter and survey
Examination fixture.
Background technology
SAW filter is widely used in communication, radar, navigation, mobile phone mobile communication etc., along with technology
Development, it is desirable to the SAW filter of higher frequency, but frequency is the highest, and loss is the biggest, the most serious by ectocine.Table
Face attachment wave filter, owing to using ceramic package, with linking of ground, only relies on exit minimum on ceramic package, contact surface
Long-pending limited, compared with the device of metal package shell, its ground connection poor performance, therefore, it is encapsulated in surface mount ceramic package
The performance of high-frequency sound surface wave wave filter can be deteriorated.Use traditional test fixture, it is impossible to test out high frequency sound table well
The performance of face wave filter.
Summary of the invention
For the deficiency existing for prior art, solved by the invention problematically, how to provide one to improve high frequency
The test performances such as the loss of surface mount SAW filter, Out-of-band rejection, preferably test out the actual performance of wave filter
The test fixture of index.
For achieving the above object, the present invention uses following scheme:
A kind of surface mount SAW filter test fixture, including testing base, test circuit board and test press strip, test
Circuit board is removably installed in the middle part of testing base upper surface length direction, and test circuit board upper surface is covered with enhancing electric conductivity
Conductive film；Conductive film is provided with test sheet frame, is provided with the cavity of up/down perforation in the middle part of described test sheet frame, and this cavity is used
In placing measured device to realize measured device cross spacing；At the unsettled high-frequency adapter device that is provided with in test circuit board side, height
Frequently adapter is for being connected with measured device input/output signal；Test press strip two ends are located in testing base by trip bolt
Surface is also positioned on test circuit board, for longitudinally being compressed by the measured device being arranged in test sheet frame cavity.
Described testing base is made up of the mounting seat testing base plate be arranged on test base plate, test base plate and mounting seat
In inverted T-shaped and one-body molded；Described test circuit board and test press strip are arranged in mounting seat, the upper surface width of described mounting seat
Degree is less than the width of test circuit board.
Described test sheet frame thickness is less than the height of measured device；It is provided with downward lobe in the middle part of described test press strip,
The area of lobe is more than the surface area of tested device can be covered by test device completely when compressing.
The trip bolt of described test press strip one end is rotatably connected in test by this rotating shaft as rotating shaft, test press strip
On base；The trip bolt of the other end is pre-installed in base upper surface, test press strip and limited post corresponding end as limited post
Being provided with bayonet socket, bayonet socket be may be stuck on limited post during test press strip rotates around the axis and locked by bayonet socket end by limited post
Tightly；The thickness in described test press strip intermediate projections portion is less than the thickness of rotating shaft corresponding end.
Compared to prior art, there is advantages that
1, the narrower width of testing base upper surface, so can reduce its test circuit board size being placed above, and shortens test
The length of holding wire on circuit board, reduces loss.
2, the area of test press strip intermediate raised portion is more than the surface area of tested device, is so easy to tested device
Fixing in vertical direction, in order to tested device can well with test circuit board contacts, reduce contact loss.
3, the thickness of test press strip intermediate raised portion is used for fixing bolt portion less than termination, so, when test press strip
Intermediate raised portion is placed under when being device under, and can be screwed portion keeps horizontal direction balance with termination.
4, test press strip two ends are screwed, can flexible height, be widely used in outside the surface mount of different encapsulation
The test of shell device.
Accompanying drawing explanation
Fig. 1 is present configuration schematic diagram.
In figure, 1-testing base, 2-tests press strip, and 3-tests circuit board, and 4-tests sheet frame, 5-conductive film, and 6-is protruding
Portion, 7-high-frequency adapter device, 8-trip bolt.
Detailed description of the invention
Below in conjunction with the accompanying drawings the present invention is described in further detail, but embodiments of the present invention are not limited to this.
Embodiment:
A kind of surface mount SAW filter test fixture, as it is shown in figure 1, include testing base 1, test circuit board 3 and
Test press strip 2, test circuit board 3 is removably installed in the middle part of testing base 1 upper surface length direction, on test circuit board 3
Surface is covered with the conductive film 5 strengthening electric conductivity；Conductive film 5 is provided with test sheet frame 4, is provided with in the middle part of described test sheet frame 4
The cavity of up/down perforation, this cavity is used for placing measured device to realize measured device cross spacing；In test circuit board 3 side
The unsettled high-frequency adapter device 7 that is provided with, high-frequency adapter device 7 is for being connected with measured device input/output signal；Test press strip 2 two ends
It is located at testing base 1 upper surface by trip bolt 8 and is positioned on test circuit board 3, empty for test sheet frame 4 will be arranged on
The measured device of intracavity longitudinally compresses.Owing to the electrode position of difference test device is different, corresponding test circuit board needs
Arranging is put, and test sheet frame 4 is for limiting test device lateral attitude simultaneously, makes test device put into test sheet frame cavity
After, naturally make to test device corresponding with test circuit board electrode, be electrically connected reliably by being achieved that after pressing under test press strip
Connect, so test sheet frame cavity shape and size need corresponding with test device.Thus, the present invention will according to test circuit board,
Conductive film, the order of test sheet frame are arranged in testing base from top to bottom, and high-frequency adapter device is connected to the two of circuit board
End.If test device is different, only need to change test circuit board and test sheet frame, be assembled into the most again overall structure install and
In testing base, conductive film and high-frequency adapter device are general, and test press strip and base, without replacing, are achieved in various
The detection of device.
So, various sizes of test circuit board and test device it are adapted to, moreover it is possible to the pressure of flexible press strip
Tight degree, can be widely used for the test of the surface mount device of different encapsulation.
Described testing base 1 is made up of test base plate and the mounting seat being arranged on test base plate, test base plate and installation
Seat in low wide and up narrow inverted T-shaped and one-body molded, so can allow testing base place more stable.Described high-frequency adapter device 7
Being two, one is input high-frequency adapter device, and another is output high-frequency adapter device, and test circuit board is located at by two high-frequency adapter devices
3 both sides.Described test circuit board 3 and test press strip 2 are arranged in mounting seat, and the upper surface width of described mounting seat is narrower, and
Width less than test circuit board.
So, the width of testing base 1 upper surface is reduced, so that test circuit board size can be made enough
Little, so can significantly reduce loss, particularly important for high-frequency element.
Described test sheet frame 4 thickness, less than the height of measured device, is provided with downward lobe in the middle part of described test press strip 2
6, the area of lobe 6 more than the surface area of tested device can completely test device be covered when compressing, its directly and
The cover plate rigid contact of measured device.After so test device is placed on cavity, device surface can protrude from test sheet frame, so
One, in the middle part of test press strip, projection can compress measured device, the most in vertical direction so that measured device can be more abundant
Ground and test circuit board contacts, thus reduce contact loss.
The trip bolt 8 of described test press strip 2 one end is rotatably connected by this rotating shaft as rotating shaft, test press strip 2
In testing base 1；The trip bolt 8 of the other end is pre-installed in base upper surface, test press strip 2 and limited post as limited post
Corresponding end is provided with bayonet socket, and bayonet socket be may be stuck on limited post during test press strip 2 rotates around the axis and will be blocked by limited post
Mouth end locking；The thickness in described test press strip 2 intermediate projections portion 6 is less than the thickness of rotating shaft corresponding end.
So, when testing press strip lobe measured device placed under, part can be screwed with termination
Keep horizontal direction balance.This structure can realize quickly compressing and disengaging simultaneously, during compression, is pre-placed by test device
In test sheet frame cavity, then rotate around the axis test press strip, makes the bayonet socket of test press strip be stuck on limited post, now tests
Press strip is placed exactly in above test device, then will tighten respectively as the trip bolt of rotating shaft and limited post, will tester
Part longitudinally compresses, it is achieved electrically connect reliably.When needs take out device time, unscrew two screws but do not fall off, make test press strip around
Axis of rotation, so that test press strip disengages limited post, after test device is completely exposed, i.e. can be taken off.
The material of described testing base 1 and test press strip 2 is metallic copper, so can ensure that ground connection is functional.
The present invention uses the fixture being applicable to the test of Frequency Surface Mount Device of scalable test press strip first, tests the end
Material used by seat and test press strip is copper, and ground connection performance is more preferable.Used test circuit board size is little, and signal transmission distance is short, more
It is suitable for high-frequency element to use.And do not change the outward appearance of tested device, just can test out the electrical of tested device well
Can, such as loss, Out-of-band rejection etc..The present invention also can only change test circuit board and test board according to the size of tested device
For fixing the size of tested device in the middle of frame, other do not change, and just can test out the electrical property of tested device, are formed
A kind of test fixture is for the test of multiple package dimension device.
Finally illustrating, above example is only in order to illustrate technical scheme and unrestricted, although with reference to relatively
The present invention has been described in detail by good embodiment, it will be understood by those within the art that, can be to the skill of the present invention
Art scheme is modified or equivalent, and without deviating from objective and the scope of inventive technique scheme, it all should be contained at this
In the middle of bright right.
Claims (4)
1. a surface mount SAW filter test fixture, it is characterised in that: include testing base, test circuit board and
Test press strip, test circuit board is removably installed in the middle part of testing base upper surface length direction, tests circuit board upper surface
It is covered with the conductive film strengthening electric conductivity；Conductive film is provided with test sheet frame, is provided with up/down perforation in the middle part of described test sheet frame
Cavity, this cavity is used for placing measured device to realize measured device cross spacing；In the test unsettled setting in circuit board side
Having high-frequency adapter device, high-frequency adapter device is for being connected with measured device input/output signal；Test press strip two ends are by fastening spiral shell
Nail is located at testing base upper surface and is positioned on test circuit board, for the measured device that will be arranged in test sheet frame cavity
Longitudinally compress.
Surface mount SAW filter test fixture the most according to claim 1, it is characterised in that: at the bottom of described test
Seat is made up of test base plate and the mounting seat being arranged on test base plate, and test base plate and mounting seat are inverted T-shaped one-body molded；
Described test circuit board and test press strip are arranged in mounting seat, and the upper surface width of described mounting seat is less than test circuit board
Width.
Surface mount SAW filter test fixture the most according to claim 1, it is characterised in that: described test board
Frame thickness is less than the height of measured device；Being provided with downward lobe in the middle part of described test press strip, the area of lobe is more than quilt
The surface area of test device is can cover test device completely when compressing.
Surface mount SAW filter test fixture the most according to claim 3, it is characterised in that: described test pressure
The trip bolt of bar one end is rotatably connected in testing base by this rotating shaft as rotating shaft, test press strip；The other end tight
Gu screw is pre-installed in base upper surface as limited post, test press strip is provided with bayonet socket with limited post corresponding end, and bayonet socket is being surveyed
Pressure testing bar be may be stuck on limited post and locked by bayonet socket end by limited post during rotating around the axis；In the middle of described test press strip
The thickness of lobe is less than the thickness of rotating shaft corresponding end.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610606100.8A CN106093484B (en) | 2016-07-28 | 2016-07-28 | Surface mount SAW filter test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610606100.8A CN106093484B (en) | 2016-07-28 | 2016-07-28 | Surface mount SAW filter test fixture |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106093484A true CN106093484A (en) | 2016-11-09 |
| CN106093484B CN106093484B (en) | 2018-12-21 |
Family
ID=57478385
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610606100.8A Active CN106093484B (en) | 2016-07-28 | 2016-07-28 | Surface mount SAW filter test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106093484B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107238505A (en) * | 2017-05-24 | 2017-10-10 | 中国电子科技集团公司第四十研究所 | A kind of fixture tested for SAW filter high/low temperature |
| CN108037324A (en) * | 2017-11-21 | 2018-05-15 | 漳州科华技术有限责任公司 | A kind of patch calibrating terminal and its processing method |
| CN112433072A (en) * | 2020-09-28 | 2021-03-02 | 中国电子科技集团公司第二十九研究所 | Test fixture for broadband radio frequency BGA interface system-in-package product |
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| CN105044402A (en) * | 2015-08-25 | 2015-11-11 | 贵州航天计量测试技术研究所 | Encapsulated micro-wave voltage-controlled oscillator test device |
| CN204789822U (en) * | 2015-07-16 | 2015-11-18 | 成都嘉纳海威科技有限责任公司 | Integrated encapsulation radio frequency device test fixture of surface mounting formula |
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| CN202018486U (en) * | 2011-03-07 | 2011-10-26 | 中国电子科技集团公司第十三研究所 | Testing device for microwave surface-mounting component |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107238505A (en) * | 2017-05-24 | 2017-10-10 | 中国电子科技集团公司第四十研究所 | A kind of fixture tested for SAW filter high/low temperature |
| CN108037324A (en) * | 2017-11-21 | 2018-05-15 | 漳州科华技术有限责任公司 | A kind of patch calibrating terminal and its processing method |
| CN108037324B (en) * | 2017-11-21 | 2020-08-28 | 漳州科华技术有限责任公司 | Surface Mount Device (SMD) test terminal and processing method thereof |
| CN112433072A (en) * | 2020-09-28 | 2021-03-02 | 中国电子科技集团公司第二十九研究所 | Test fixture for broadband radio frequency BGA interface system-in-package product |
| CN112433072B (en) * | 2020-09-28 | 2023-06-02 | 中国电子科技集团公司第二十九研究所 | Test fixture for broadband radio frequency BGA interface system-in-package product |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106093484B (en) | 2018-12-21 |
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Effective date of registration: 20220530 Address after: No.23 Xiyong Avenue, Shapingba District, Chongqing 401332 Patentee after: CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION CHONGQING ACOUSTIC-OPTIC-ELECTRONIC CO.,LTD. Address before: 400060 Chongqing Nanping Nan'an District No. 14 Huayuan Road Patentee before: CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION NO.26 Research Institute |