CN106092952A - A kind of central shielding device - Google Patents
A kind of central shielding device Download PDFInfo
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- CN106092952A CN106092952A CN201610370334.7A CN201610370334A CN106092952A CN 106092952 A CN106092952 A CN 106092952A CN 201610370334 A CN201610370334 A CN 201610370334A CN 106092952 A CN106092952 A CN 106092952A
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- 238000003384 imaging method Methods 0.000 claims abstract description 33
- 239000007788 liquid Substances 0.000 claims description 26
- 239000000463 material Substances 0.000 claims description 13
- 239000000126 substance Substances 0.000 claims description 13
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical group O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 7
- 208000002925 dental caries Diseases 0.000 claims description 6
- 239000012153 distilled water Substances 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 claims description 3
- 229920002521 macromolecule Polymers 0.000 claims 1
- 238000012360 testing method Methods 0.000 abstract description 26
- 230000007547 defect Effects 0.000 abstract description 9
- 230000000903 blocking effect Effects 0.000 abstract description 5
- 239000004531 microgranule Substances 0.000 abstract description 4
- 239000000523 sample Substances 0.000 description 29
- 238000000034 method Methods 0.000 description 7
- 238000010521 absorption reaction Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- -1 timber Substances 0.000 description 2
- 235000007926 Craterellus fallax Nutrition 0.000 description 1
- 240000007175 Datura inoxia Species 0.000 description 1
- 239000012472 biological sample Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000002329 infrared spectrum Methods 0.000 description 1
- 230000005865 ionizing radiation Effects 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 239000005022 packaging material Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000010412 perfusion Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 239000002887 superconductor Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/064—Stray light conditioning
- G01N2201/0642—Light traps; baffles
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Toxicology (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
This application discloses a kind of central shielding device, this central shielding device is applied to THz wave imaging system, so that this system carries out imaging to testing sample.The THz wave of terahertz imaging system is gone forward being irradiated to testing sample, central shielding device is for blocking the central part of THz wave, the detector of THz wave imaging system generates terahertz wave signal according to the THz wave received, and finally gives the THz wave image of testing sample.Central shielding device is owing to blocking the central part of THz wave; vertical incidence ripple is made to cannot be introduced in object lens; and enter the terahertz wave beam simply scattered of object lens by microgranule or the superficial makings of testing sample, convex height or defect etc.; make to provide brighter image in dark comparison field; i.e. dark-field imaging mode such that it is able to the problem solving to manifest the detail sections such as the superficial makings of testing sample, convex height and defect under light field imaging mode.
Description
Technical field
The application relates to THz wave technical field, more particularly, it relates to a kind of central shielding device.
Background technology
Research about the substance characteristics of THz wave spectral coverage is always " no-man's-land " (terahertz of scientific circles
Gap), along with being showing improvement or progress day by day of THz source and detector technology, gradually make THz wave and application thereof become academic in recent years
Boundary, the research and development focus of industrial circle.
Why THz wave has considerable application in fields such as basic research, commercial Application, biomedicine, military affairs
Prospect, is that it has the following characteristics that the wavelength of (a) Terahertz general optics of bands of a spectrum wavelength ratio and near-infrared spectra to be grown, detection
Biological organization sample is not susceptible to scattering；Terahertz emission has shorter wavelength than microwave, and this makes tera-hertz spectra have
Higher spatial resolution, the bigger depth of field.B () THz wave penetrance is good, it is possible to penetrate nonpolar liquid and many dielectrics
Material (clothes, plastics, timber, paper etc.), it means that people may utilize THz wave and penetrate packaging material to its inside thing
Body detects.C (), due to the photon energy of THz wave the lowest (electron volts magnitude in the least), during its penetrating material, is not susceptible to
Ionization, thus can be utilized for safe Non-Destructive Testing, the detection of corresponding X-ray then has suitable ionizing radiation dangerous.
(d) many material macromole, if the vibration of biomacromolecule and speed are all at terahertz wave band, so at terahertz wave band
Show the strongest absorption and resonance, this show use terahertz light spectral analysis technology can clearly see a lot of object,
Material, at the characteristic absorption peak of terahertz wave band, i.e. can use THz wave that article to be checked are carried out contactless component analysis.(e)
The time-domain spectral signal to noise ratio of THz wave is the highest, and this makes Terahertz be highly suitable for imaging applications.The typical case of terahertz pulse
Pulsewidth is at picosecond magnitude, when can carry out various materials (including liquid, quasiconductor, superconductor, biological sample etc.) easily
Between differentiate research.
These advantages having in view of THz wave, utilize THz wave that sample carries out imaging, with this to tested
The inside of sample carries out detecting becomes one important application direction of THz wave.When detecting material, traditional is bright
Sample and background can be illuminated by field imaging mode simultaneously, cause into image contrast poor, thus cannot manifest sample
The detail sections such as superficial makings, convex height, defect.
Summary of the invention
In view of this, the application provides a kind of central shielding device, for the Terahertz in THz wave imaging system
The central part of ripple blocks, to solve to be difficult under light field imaging mode embody the superficial makings of sample, convex height and defect
Problem Deng detail section.
To achieve these goals, it is proposed that scheme as follows:
A kind of central shielding device, is applied to THz wave imaging system, and described central shielding device includes circular non-opaque
Cavity, wherein:
The liquid substance for absorbing THz wave is included in described circular non-opaque cavity.
Optionally, the material of described circular non-opaque cavity is macromolecular material or semi-conducting material.
Optionally, described liquid substance is distilled water.
Optionally, the hand-hole being provided centrally with for injecting described liquid substance of described circular non-opaque cavity.
Optionally, described circular non-opaque cavity includes multiple chamber, and wherein, the plurality of chamber includes:
It is positioned at the circular chamber of described circular non-opaque cavity；
The multiple annular compartments being distributed with one heart around described circular chamber.
Optionally, arrange between different described annular compartments and between described circular chamber and the annular compartment of next-door neighbour
Fluid-through port.
Optionally, described fluid-through port is provided with flow control valve.
Optionally, including multiple described circular non-opaque cavitys, wherein:
The radius of the inner chamber of multiple described circular non-opaque cavitys increases successively；
Also including catch support, described catch support is for by the part or all of overlap of multiple described circular non-opaque cavitys
It is assembled together.
From above-mentioned technical scheme it can be seen that this application discloses a kind of central shielding device, this central shielding device
It is applied to THz wave imaging system, so that this system carries out imaging to testing sample.The THz wave of terahertz imaging system
Going forward being irradiated to testing sample, central shielding device is used for blocking the central part of THz wave, THz wave imaging
The detector of system generates terahertz wave signal according to the THz wave received, and finally gives the THz wave of testing sample
Image.Central shielding device, owing to being blocked by the central part of THz wave, makes vertical incidence ripple cannot be introduced in object lens,
And enter the terahertz wave beam simply scattered of object lens by microgranule or the superficial makings of testing sample, convex height or defect etc., make
Dark comparison field provides brighter image, i.e. dark-field imaging mode such that it is able to solve nothing under light field imaging mode
The problem of the detail sections such as the existing superficial makings of testing sample of Faxian, convex height and defect.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present application or technical scheme of the prior art, below will be to embodiment or existing
In having technology to describe, the required accompanying drawing used is briefly described, it should be apparent that, the accompanying drawing in describing below is only this
Some embodiments of application, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to
Other accompanying drawing is obtained according to these accompanying drawings.
The top view of a kind of central shielding device that Fig. 1 provides for the embodiment of the present application；
The structural representation of a kind of THz wave imaging system that Fig. 2 provides for the application；
The side view of a kind of central shielding device that Fig. 3 provides for another embodiment of the application；
The top view of multiple circular non-opaque cavitys that Fig. 4 provides for the application.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present application, the technical scheme in the embodiment of the present application is carried out clear, complete
Describe, it is clear that described embodiment is only some embodiments of the present application rather than whole embodiments wholely.Based on
Embodiment in the application, it is every other that those of ordinary skill in the art are obtained under not making creative work premise
Embodiment, broadly falls into the scope of the application protection.
Embodiment one
The top view of a kind of central shielding device that Fig. 1 provides for the embodiment of the present application.
As it is shown in figure 1, the central shielding device that the present embodiment provides is applied to THz wave imaging system, including one thoroughly
The circular non-opaque cavity 61 of bright material, " transparent " at this place refers to that this cavity is made by the less material of THz wave absorption,
Such as macromolecular material or semi-conducting material.And perfusion can absorb the liquid substance of THz wave in transparent cavity 61.
It addition, the THz wave imaging system mentioned by the present embodiment is for carrying out THz wave one-tenth to testing sample 30
Picture, so that it is analyzed for structure, specifically include be arranged in order THz source 10, condenser lens 20, object lens 40, Terahertz visit
Surveying device 50 and processing means (not shown), testing sample 30 is between condenser lens 20 and object lens 40, it addition, also include that center hides
Blocking means 60, as shown in Figure 2.
THz source 10 is used for producing THz wave, and the generation principle of THz wave can optically-based method, electronics side
Method and plasma method etc., therefore THz source 10 can be the optics THz source of optically-based method, based on electronics side
The electronics THz source of method or plasma THz source based on plasma principle.
Condenser lens 20 is positioned at the rear of THz source 10, is specially positioned at the road of the THz wave that THz source 10 is sent
On footpath, for collimating THz wave and focusing on, only carrying out simplifying statement to it with condenser lens 20 in the application, it is tangible
Actual application specifically includes the collimation mechanism (not shown) for collimating THz wave, and for THz wave is entered
The Focusing mechanism (not shown) of row focusing.
Testing sample 30 is placed on a mobile platform (not shown), when detecting testing sample, by shifting
Testing sample can be moved by moving up and down of moving platform, such that it is able to make to collimate through condenser lens 20 and focus on
Testing sample 30 is comprehensively irradiated by the wave beam of THz wave.
Object lens 40 are for collecting the THz wave scattered out from testing sample 30, and converge to be positioned at its rear too
On hertz detector 50.
Terahertz detector 50 is for receiving the THz wave that object lens 40 converge, and is converted to by THz wave the most too
Hertz wave signal, this signal is the signal of telecommunication or the digital signal being adapted for image procossing.
Processing means, for processing the terahertz wave signal of terahertz detector 50 output, obtains reflection and treats test sample
The THz wave image of the structure of product 30.
Central shielding device 60 is positioned on the path of terahertz wave beam, in the THz wave of condenser lens 20
Heart region is blocked, thus does not make vertical incidence ripple enter in object lens 40, and make entrance object lens 40 is by microgranule or to treat
The terahertz wave beam that the superficial makings of test sample product, convex height or defect etc. are scattered, so that be given in dark comparison field
Brighter image, i.e. dark-field imaging mode.Central shielding device 60 can be arranged on the position against condenser lens 20.
From technique scheme it can be seen that present embodiments provide a kind of central shielding device, this central shielding device
It is applied to THz wave imaging system, so that this system carries out imaging to testing sample.The THz wave of terahertz imaging system
Going forward being irradiated to testing sample, central shielding device is used for blocking the central part of THz wave, THz wave imaging
The detector of system generates terahertz wave signal according to the THz wave received, and finally gives the THz wave of testing sample
Image.Central shielding device, owing to being blocked by the central part of THz wave, makes vertical incidence ripple cannot be introduced in object lens,
And enter the terahertz wave beam simply scattered of object lens by microgranule or the superficial makings of testing sample, convex height or defect etc., make
Dark comparison field provides brighter image, i.e. dark-field imaging mode such that it is able to solve nothing under light field imaging mode
The problem of the detail sections such as the existing superficial makings of testing sample of Faxian, convex height and defect.
Further, since water has stronger Absorption to THz wave, according to list of references, at 0.3THz-3.72THz frequency
Section, the minimum 123cm of its absorptance of the distilled water of 22 DEG C-1As long as therefore we are set to 0.5mm the thickness of moisture film, just
Moisture film can be made to drop to the transmitance of THz wave about one thousandth, and (according to formula L=-ln (T)/α, wherein L is that moisture film is thick
Degree, T is THz wave transmitance, and α is the water absorptance to THz wave), and water is relatively inexpensive, therefore liquid substance is preferred
Distilled water is as this liquid substance.And the hand-hole being provided centrally with for injecting liquid substance at cavity.
It addition, when different testing samples is carried out dark-field imaging, need the numerical aperture according to focus lamp, Terahertz
Shielded area is adjusted by wavelength, sample material parameters, to this end, this transparent cavity can also be made up of multiple chambers, multiple
Chamber includes that a transparent chamber 611 being positioned at center and multiple arranged concentric and radius around this transparent chamber increase successively
Big annular compartment 612.Logical liquid it is provided with between transparent chamber 611 and annular compartment 612 and between annular compartment 612
Mouthful, fluid-through port is provided with and controls the flow control valve 614 that liquid substance passes through.
Inside circular non-opaque cavity 61, inject liquid substance by hand-hole 613, be allowed to be full of whole internal cavity, and
Pass in and out each layer of annular compartment 612 by flow control valve 614, thus reach liquid film in the appointment region of liquid film catch
Covering, make the region of only catch marginal area non-Covering Liguid film just can pass through terahertz wave beam.
This central shielding device only need to simply adjust the surface area of wherein liquid film and can meet replacing other are hard
The details in a play not acted out on stage, but told through dialogues measuring condition of new system after part.This adjustment both can manually regulate, and automatically can be adjusted by motor again, root
Adjust liquid film region area according to dark-field imaging definition, reach optimal dark-field imaging effect.
This liquid film catch can also be adjusted to the most not block the state (discharging liquid film therein) of THz wave,
In this case from focus lamp assemble straight incoming terahertz wave beam can be unobstructed through this mechanism arrive treat test sample
Product surface, here it is conventional light field measuring method.Along with manually or electrically controlling liquid film in the baffle structure of center slowly
Spreading out, the direct projection terahertz wave beam of focus lamp center is absorbed by liquid film, and only the terahertz wave beam at edge is with bigger
Scattering angle arrives on sample, reaches dark-field imaging effect.Therefore the present invention can very easily switched system light field measure
With details in a play not acted out on stage, but told through dialogues measuring state, it is simple to sample is observed by user from light field, two states of details in a play not acted out on stage, but told through dialogues, can obtain relatively horn of plenty
Image feature information.
Embodiment two
The side view of a kind of central shielding device that Fig. 3 provides for another embodiment of the application.
As it is shown on figure 3, the central shielding device for the present embodiment offer includes catch support 62, set in catch support 62
It is equipped with multiple dismountable circular non-opaque cavity 63, as shown in Figure 4.The liquid film radius of each circular non-opaque cavity 63 increases successively
Greatly.In use, according to calculating processing circular non-opaque cavity 63, then circular non-opaque cavity 63 is pressed suitable according to the scope of regulation
Sequence (liquid area etc. circle change) loads in catch support 62 after being sequentially overlapped, then by being fixed on catch support 62 and push pedal
Spring 641 on 64 makes liquid film catch be in the state of clamping.
In this specification, each embodiment uses the mode gone forward one by one to describe, and what each embodiment stressed is and other
The difference of embodiment, between each embodiment, identical similar portion sees mutually.Upper to the disclosed embodiments
State bright, make professional and technical personnel in the field be capable of or use the application.To the multiple amendment of these embodiments to ability
Will be apparent from for the professional and technical personnel in territory, generic principles defined herein can be without departing from the application's
In the case of spirit or scope, realize in other embodiments.Therefore, the application be not intended to be limited to shown in this article these
Embodiment, and it is to fit to the widest scope consistent with principles disclosed herein and features of novelty.
Claims (8)
1. a central shielding device, is applied to THz wave imaging system, it is characterised in that described central shielding device includes
Circular non-opaque cavity, wherein:
The liquid substance for absorbing THz wave is included in described circular non-opaque cavity.
2. central shielding device as claimed in claim 1, it is characterised in that the material of described circular non-opaque cavity is macromolecule
Material or semi-conducting material.
3. central shielding device as claimed in claim 1, it is characterised in that described liquid substance is distilled water.
4. central shielding device as claimed in claim 1, it is characterised in that described circular non-opaque cavity centrally disposed useful
In the hand-hole injecting described liquid substance.
5. the central shielding device as described in any one of Claims 1 to 4, described circular non-opaque cavity includes multiple chamber, its
In, the plurality of chamber includes:
It is positioned at the circular chamber of described circular non-opaque cavity；
The multiple annular compartments being distributed with one heart around described circular chamber.
6. central shielding device as claimed in claim 5, it is characterised in that with described between different described annular compartments
Fluid-through port is set between circular chamber and the annular compartment of next-door neighbour.
7. central shielding device as claimed in claim 6, it is characterised in that be provided with flow control valve on described fluid-through port.
8. the central shielding device as described in any one of Claims 1 to 4, it is characterised in that include multiple described circular non-opaque
Cavity, wherein:
The radius of the inner chamber of multiple described circular non-opaque cavitys increases successively；
Also including catch support, described catch support is for by the part or all of overlap assembly of multiple described circular non-opaque cavitys
Together.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610370334.7A CN106092952B (en) | 2016-05-30 | 2016-05-30 | A kind of central shielding device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610370334.7A CN106092952B (en) | 2016-05-30 | 2016-05-30 | A kind of central shielding device |
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| Publication Number | Publication Date |
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| CN106092952A true CN106092952A (en) | 2016-11-09 |
| CN106092952B CN106092952B (en) | 2019-03-22 |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070181811A1 (en) * | 2006-02-09 | 2007-08-09 | Oleg Mitrofanov | Near-field terahertz imaging |
| CN104238063A (en) * | 2013-06-18 | 2014-12-24 | 三星电机株式会社 | lens module and camera module including the same |
| CN105486625A (en) * | 2016-01-28 | 2016-04-13 | 中国科学院重庆绿色智能技术研究院 | Cell counting device and method based on Terahertz time-domain spectroscopy technology |
| CN105572797A (en) * | 2016-02-15 | 2016-05-11 | 欧阳征标 | Terahertz wave pulse amplitude modulation signal and optical pulse amplitude modulation signal conversion amplifier |
-
2016
- 2016-05-30 CN CN201610370334.7A patent/CN106092952B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070181811A1 (en) * | 2006-02-09 | 2007-08-09 | Oleg Mitrofanov | Near-field terahertz imaging |
| CN104238063A (en) * | 2013-06-18 | 2014-12-24 | 三星电机株式会社 | lens module and camera module including the same |
| CN105486625A (en) * | 2016-01-28 | 2016-04-13 | 中国科学院重庆绿色智能技术研究院 | Cell counting device and method based on Terahertz time-domain spectroscopy technology |
| CN105572797A (en) * | 2016-02-15 | 2016-05-11 | 欧阳征标 | Terahertz wave pulse amplitude modulation signal and optical pulse amplitude modulation signal conversion amplifier |
Non-Patent Citations (2)
| Title |
|---|
| NOBORU HASEGAWA 等: ""Remote identification of protrusions and dents on surfaces by terahertz reflectometry with spatial beam filtering and out-of-focus detection"", 《APPLIED PHYSICS LETTERS》 * |
| YUN-SHIK LEE: "《太赫兹科学与技术原理》", 31 August 2012 * |
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| CN106092952B (en) | 2019-03-22 |
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