CN106057248A - System and method for verifying data holding capacity - Google Patents
System and method for verifying data holding capacity Download PDFInfo
- Publication number
- CN106057248A CN106057248A CN201610370044.2A CN201610370044A CN106057248A CN 106057248 A CN106057248 A CN 106057248A CN 201610370044 A CN201610370044 A CN 201610370044A CN 106057248 A CN106057248 A CN 106057248A
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- Prior art keywords
- test device
- voltage
- waiting time
- data
- test
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Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/12005—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising voltage or current generators
Abstract
The invention provides a system and method for verifying data holding capacity. A variable voltage parameter setting port is used to set different voltages applied to test devices in a same test program, and a waiting time parameter setting interface is used to directly set waiting time; working voltage can be converted directly, waiting time can be set directly, with no need for adding additional test items to change the working voltage and the waiting time; the process procedures are simplified, time and cost are saved, and verifying efficiency is improved.
Description
Technical field
The present invention relates to semiconductor process technique field, be specifically related to a kind of system verifying data holding ability and side
Method.
Background technology
At present, in chip functions is tested, checking data holding ability is an important indicator of test chip.Data are protected
Hold the test purpose of ability and be to ensure that device can keep the inner data of memory element (memory cell).Therefore, its test philosophy
It is: when voltage vcc is chip normal working voltage Vnormal to write data to memory element, is then gradually lowered work electricity
It is depressed into minimum Vmin, waits for a period of time, then voltage is gradually increased to normal working voltage Vnormal, now
Read the storage information of memory element, it is judged that storage information is the most identical.
But, standard method based on conventionally test platform, if the test parameter that board to be changed sets, can only split
Complete step by step for multiple test programs, after a test program completes, need to stop this test program, and open another
One test program, such as, the test of checking data holding ability needs three test items to complete, and during test, tests device
Carrying out successively between these three test program, that is to say, first turn on test program, utilize test device, normally work electricity
Depress to test device write initial data；Being then turned on test program, test device is under minimum and waits one
The section time；Next opens test program, and the running voltage of test device is increased to normal working voltage；Then, read test
In device data and to judge initial data the most identical with the data read.Wherein, second test program 102 is logical
The mode crossing execution vector realizes the waiting time, adds the conversion between three test programs, and the program of considerably increasing is opened
The complexity sent out, is unfavorable for the test program exploitation of volume production product.In view of above problems, need optimal inspection method, thus
Simplify program development and improve the development efficiency of test program.
Summary of the invention
In order to overcome problem above, it is desirable to provide a kind of system and method verifying data holding ability, use
One test program realizes the requirement to test parameter change, additionally it is possible to set the waiting time more flexibly.
In order to achieve the above object, the invention provides a kind of system verifying data holding ability, for tester
Part detects；Comprising:
Variable voltage parameter arranges interface, is normal voltage or minimum for arranging the running voltage putting on test device
Voltage；
Voltage control module, arranges interface with variable voltage parameter and is connected, for by set normal voltage or
Small voltage puts on described test device；
Writing module, for inputting initial data in test device；
Waiting time parameter arranges interface, the waiting time of the test device for being arranged under minimum voltage；
Read module, reads and is stored in the test device that running voltage after the waiting time increases to normal voltage
Data；
Comparison module, it is judged that the data stored are the most identical with initial data；
Judge module, judges to test the data holding ability of device according to the comparative result of comparison module.
Preferably, the described waiting time is 100～1000ms.
Preferably, described test device is memorizer.
In order to achieve the above object, present invention also offers a kind of method verifying data holding ability, comprising:
Step 01: a test device is provided；
Step 02: the running voltage putting on test device is arranged to normal voltage, normal voltage is put on test
On device；Then in test device, initial data is inputted；
Step 03: the running voltage putting on test device is set to minimum voltage by normal voltage, by minimum voltage
Put on test device；
Step 04: under minimum voltage, performs a waiting time；
Step 05: after the waiting time terminates, is set to the running voltage putting on test device normally by minimum voltage
Voltage, puts on normal voltage on test device；
Step 06: the data stored in read test device；
Step 07: compare stored data the most identical with initial data；
Step 08: sentence the data holding ability of test device according to comparative result.
Preferably, the described waiting time is 100～1000ms.
Preferably, described test device is memorizer.
The system and method for the checking data holding ability of the present invention, make use of variable voltage parameter to arrange interface, it is achieved
To test device is applied the setting of different voltage by same test program, utilize waiting time parameter that interface is set, realize
To directly arranging of waiting time, the present invention can realize the direct conversion of running voltage, and the directly setting of waiting time,
And change running voltage and waiting time without the most additionally increasing test item, this invention simplifies process, when having saved
Between and cost, improve verification efficiency.
Accompanying drawing explanation
Fig. 1 is the block chart of the system of the checking data holding ability of a preferred embodiment of the present invention
Fig. 2 is the schematic flow sheet of the method for the checking data holding ability of a preferred embodiment of the present invention
Detailed description of the invention
For making present disclosure more clear understandable, below in conjunction with Figure of description, present disclosure is made into one
Step explanation.Certainly the invention is not limited in this specific embodiment, the general replacement known to those skilled in the art is also
Contain within the scope of the present invention.
Below in conjunction with accompanying drawing 1-2 and specific embodiment, the present invention is described in further detail.It should be noted that, accompanying drawing is equal
Use the form simplified very much, use non-ratio accurately, and only in order to conveniently, clearly to reach to aid in illustrating the present embodiment
Purpose.
In the present embodiment, referring to Fig. 1, the system of checking data holding ability, test device can be any to have number
According to the device of storage capacity, such as storage chip etc.；Specifically include:
Variable voltage parameter arranges interface, is normal voltage or minimum for arranging the running voltage putting on test device
Voltage；Here, interface is set by variable voltage parameter, can first arrange put on test device running voltage be normal
Voltage, then, inputs initial data in test device；Then, the running voltage putting on test device is set to minimum
Voltage；After waiting for a period of time, then the running voltage putting on test device is set to normal voltage.It is, can power transformation
It is a variable that pressure parameter arranges the parameter of interface, and this variable can arbitrarily change.
Voltage control module, arranges interface with variable voltage parameter and is connected, for by set normal voltage or
Small voltage puts on described test device；
Writing module, for inputting initial data in test device；
Waiting time parameter arranges interface, the waiting time of the test device for being arranged under minimum voltage；Here, etc.
The time for the treatment of can be 100～1000ms；
Read module, reads and is stored in the test device that running voltage after the waiting time increases to normal voltage
Data；
Comparison module, it is judged that the data stored are the most identical with initial data；
Judge module, judges to test the data holding ability of device according to the comparative result of comparison module.Here, if
The data stored are essentially identical with initial data or close, show that the data holding ability of this test device is preferable, if institute
The data of storage, less than the 1/2 of initial data, show that the data of this test device represent that ability is poor.
In the present embodiment, use said system to carry out the method verifying data holding ability, refer to Fig. 2, including:
Step 01: a test device is provided；Here test device can be any device with storage capacity.
Step 02: the running voltage putting on test device is arranged to normal voltage, normal voltage is put on test
On device；Initial data is inputted in test device；
Step 03: the running voltage putting on test device is set to minimum voltage by normal voltage, by minimum voltage
Put on test device；
Step 04: under minimum voltage, performs a waiting time；Here, the waiting time can be 100～1000ms；
Step 05: after the waiting time terminates, is set to the running voltage putting on test device normally by minimum voltage
Voltage, is arranged at normal voltage on test device；
Step 06: the data stored in read test device；
Step 07: compare stored data the most identical with initial data；
Step 08: sentence the data holding ability of test device according to comparative result.Here, if the data stored with
Initial data is essentially identical or close, shows that the data holding ability of this test device is preferable, if the data stored are less than
The 1/2 of initial data, shows that the data of this test device represent that ability is poor.
Although the present invention with preferred embodiment disclose as above, right described embodiment illustrate only for the purposes of explanation and
, it is not limited to the present invention, if those skilled in the art can make without departing from the spirit and scope of the present invention
Dry change and retouching, the protection domain that the present invention is advocated should be as the criterion with described in claims.
Claims (6)
1. verify a system for data holding ability, for test device is detected；It is characterized in that, including:
Variable voltage parameter arranges interface, is normal voltage or minimum electricity for arranging the running voltage putting on test device
Pressure；
Voltage control module, arranges interface with variable voltage parameter and is connected, for by set normal voltage or minimum electricity
Pressure puts on described test device；
Writing module, for inputting initial data in test device；
Waiting time parameter arranges interface, the waiting time of the test device for being arranged under minimum voltage；
Read module, reads the number that running voltage after the waiting time increases to stored in the test device of normal voltage
According to；
Comparison module, it is judged that the data stored are the most identical with initial data；
Judge module, judges to test the data holding ability of device according to the comparative result of comparison module.
System the most according to claim 1, it is characterised in that the described waiting time is 100～1000ms.
System the most according to claim 1, it is characterised in that described test device is memorizer.
4. the method verifying data holding ability, it is characterised in that including:
Step 01: a test device is provided；
Step 02: the running voltage putting on test device is arranged to normal voltage, normal voltage is put on test device
On；Then in test device, initial data is inputted；
Step 03: the running voltage putting on test device is set to minimum voltage by normal voltage, minimum voltage is applied
On test device；
Step 04: under minimum voltage, performs a waiting time；
Step 05: after the waiting time terminates, is set to normal voltage by the running voltage putting on test device by minimum voltage,
Normal voltage is put on test device；
Step 06: the data stored in read test device；
Step 07: compare stored data the most identical with initial data；
Step 08: sentence the data holding ability of test device according to comparative result.
Method the most according to claim 4, it is characterised in that the described waiting time is 100～1000ms.
Method the most according to claim 4, it is characterised in that described test device is memorizer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610370044.2A CN106057248A (en) | 2016-05-30 | 2016-05-30 | System and method for verifying data holding capacity |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610370044.2A CN106057248A (en) | 2016-05-30 | 2016-05-30 | System and method for verifying data holding capacity |
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| CN106057248A true CN106057248A (en) | 2016-10-26 |
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| CN201610370044.2A Pending CN106057248A (en) | 2016-05-30 | 2016-05-30 | System and method for verifying data holding capacity |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108345752A (en) * | 2018-02-24 | 2018-07-31 | 北京智芯微电子科技有限公司 | The life characteristic appraisal procedure of wafer scale nonvolatile memory |
| CN111289884A (en) * | 2018-12-27 | 2020-06-16 | 展讯通信（上海）有限公司 | Testing device, chip and method for testing voltage of memory |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080059849A1 (en) * | 2006-09-01 | 2008-03-06 | Fujitsu Limited | Semiconductor device |
| CN102810335A (en) * | 2011-05-31 | 2012-12-05 | 英飞凌科技股份有限公司 | Memory reliability verification techniques |
| CN103871476A (en) * | 2012-12-10 | 2014-06-18 | 德州仪器公司 | Programmable Built In Self Test (pBIST) system |
-
2016
- 2016-05-30 CN CN201610370044.2A patent/CN106057248A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080059849A1 (en) * | 2006-09-01 | 2008-03-06 | Fujitsu Limited | Semiconductor device |
| CN102810335A (en) * | 2011-05-31 | 2012-12-05 | 英飞凌科技股份有限公司 | Memory reliability verification techniques |
| CN103871476A (en) * | 2012-12-10 | 2014-06-18 | 德州仪器公司 | Programmable Built In Self Test (pBIST) system |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108345752A (en) * | 2018-02-24 | 2018-07-31 | 北京智芯微电子科技有限公司 | The life characteristic appraisal procedure of wafer scale nonvolatile memory |
| CN111289884A (en) * | 2018-12-27 | 2020-06-16 | 展讯通信（上海）有限公司 | Testing device, chip and method for testing voltage of memory |
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Application publication date: 20161026 |