CN103425558B - A kind of method realizing the test of board I/O port based on test configurations table - Google Patents
A kind of method realizing the test of board I/O port based on test configurations table Download PDFInfo
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- CN103425558B CN103425558B CN201310324907.9A CN201310324907A CN103425558B CN 103425558 B CN103425558 B CN 103425558B CN 201310324907 A CN201310324907 A CN 201310324907A CN 103425558 B CN103425558 B CN 103425558B
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Abstract
The invention provides a kind of method realizing the test of board I/O port based on test configurations table, the content that I/O port is tested is made an I/O port test configurations table, fill in the information content in this test configurations table according to the requirement of hardware, the information content that I/O port test procedure carries out corresponding test according to group I/O port each in IO test configurations table runs I/O port test; And the result that this group I/O port is tested is preserved by bitmap mode; Show test results finally by explicit function.The equal test configurations table of rewriting of each project the invention enables test procedure height multiplexing, only need ensure the quality of test procedure, as long as can be tested to the I/O port of projects afterwards.
Description
Technical field
The present invention relates to computer testing technology field, particularly relate to a kind of method realizing the test of board I/O port based on test configurations table.
Background technology
In prior art, the board test of each project requires that I/O port is tested substantially, and different project I/O port test requests differs, size of code so is wherein larger, and repeatability is also very large, if can effectively make the reusability of these codes improve, just can reduce the workload of exploitation I/O port test, ensure code quality, reduction testing cost simultaneously.I/O port test simultaneously needs the often pair of I/O port recorded unsuccessfully, and finally tips out, and needs to use test point TP title to replace general I/O interface GPIO number, to produce informant person facilitating orientation problem when prompting.
Summary of the invention
The technical problem to be solved in the present invention, be to provide a kind of method realizing the test of board I/O port based on test configurations table, the equal test configurations table of rewriting of each project makes test procedure height multiplexing, only need ensure the quality of test procedure, as long as can be tested to the I/O port of projects afterwards; Improve production efficiency.
The present invention is achieved in that a kind of method realizing the test of board I/O port based on test configurations table, comprises the steps:
Step 1, in board test procedure, define an I/O port tested object, and set up an array of this tested object; Described array is as I/O port test configurations table, and this test configurations table described comprises each group I/O port in board and carries out the information content required for corresponding test, and two I/O ports of wherein corresponding test are one group;
Step 2, take out sequentially in I/O port test configurations table one group of I/O port carry out correspondence test;
Step 3, determine that two I/O ports of this group carry out positive test or negative testing according to the information content of test configurations table, described positive test is: the level drawing high or drag down first I/O port, and the level of the second I/O port should correspondingly detect into height or for low; Described negative testing is: the level drawing high or drag down first I/O port, and the level of the second I/O port should detect as low or for high on the contrary;
Step 4, test this group I/O port after, preserve the low and high level of first I/O port according to the information content of test configurations table;
Step 5, by this group I/O port test result preserved by bitmap mode, the test result of each bit representation test configurations table correspondence position I/O port of this bitmap;
Step 6, the I/O port taking off a group from test configurations table are tested according to the mode of step 3 to step 5, and are kept in bitmap by the result of test;
After I/O ports all in step 7, board is all completed, shown by the test result of result explicit function to the I/O port of each group.
Tool of the present invention has the following advantages: method of the present invention, in the process implemented, enormously simplify writing, safeguard and testing of I/O port test code.And configuration information is concentrated due to test configurations table, and time the design of hardware is carried out checking more for convenience, also greatly reduce the bug because clerical mistake causes, this design simultaneously can show final I/O port test result effectively, also improves production efficiency.
Accompanying drawing explanation
Fig. 1 is the inventive method schematic flow sheet.
Embodiment
Refer to shown in Fig. 1, the present invention is a kind of method realizing the test of board I/O port based on test configurations table, comprises the steps:
Step 1, in board test procedure, define an I/O port tested object, and set up an array of this tested object; Described array is as I/O port test configurations table, this test configurations table described to comprise in board each group I/O port and carries out the information content required for corresponding test (such as: have 8 I/O ports in board, then an IO having 4 groups carries out correspondence test, then include the information content of 4 groups in this test configurations table), two I/O ports of wherein corresponding test are one group; The information content that described each group of I/O port carries out required for corresponding test comprises: the title of the test point TP of two I/O ports and the general I/O interface GPIO number corresponding with this TP title, carry out positive test or negative testing, latter two I/O port of test needs to keep which type of level state, and whether has the level operation between the I/O port that is associated; Wherein, described GPIO number is unique sign of I/O port, and the one group of I/O port taken out in board is the information content of the I/O port test judging to belong to which group in test configurations table according to this GPIO number; (the general I/O interface GPIO number that such as: the 1st group of information content in this information content of 4 groups is: the test point TP name of first group of I/O port is called TP43 and TP89, this TP title is corresponding is: GPIOD11 and GPIOE1; This group carries out positive test; Latter two I/O port of test needs to keep high level state; This group has the level operation between the I/O port that is associated, and require that in test process, second group of I/O port is contrary with this group first I/O port level all the time, above information is the example of one group of use-case, does not limit the information content related in the present invention.）
Step 2, from test configurations table, take out one group of I/O port in order carry out correspondence test (as: herein for above-mentioned said 1st group of I/O port);
If step 21 information content definition that respectively group I/O port carries out required for corresponding test has the I/O port be associated, when then two I/O ports being tested, the pin of I/O port related in board need be done operation associated accordingly after, test (now to these two I/O ports again, relevant 2nd group of I/O port in 1st group also requires to keep reverse level, oppositely will arrange the level of the 2nd group of I/O port before test first group of I/O port;
Step 3, to determine that according to the information content of test configurations table two I/O ports of this group carry out positive test or negative testing (now the 1st group I/O port according to the information content of allocation list for carrying out positive test), described positive test is: the level drawing high or drag down first I/O port, and the level of the second I/O port should correspondingly detect into height or for low; (namely draw high the level of first I/O port, the level of the second I/O port should correspondingly detect as height; Drag down the level of first I/O port, the level of the second I/O port should correspondingly detect as low) described negative testing is: the level drawing high or drag down first I/O port, the level of the second I/O port should detect as low or for high on the contrary; (draw high the level of first I/O port, the level of the second I/O port should detect on the contrary as low; Drag down the level of first I/O port, the level of the second I/O port should detect on the contrary as height); I.e. positive test: the level drawing high first I/O port in two I/O ports, whether the level detecting second I/O port is high, then drag down the level of first I/O port, and whether the level detecting second I/O port is low; Negative testing is: the level drawing high first I/O port in two I/O ports, and whether the level detecting the second I/O port is low, then drag down the level of first I/O port, and whether the level detecting second I/O port is high;
Step 4, test this group I/O port after, preserve the low and high level (now, the information content of the 1st group of I/O port allocation list is high level, then the level preserving this group first I/O port is for high) of first I/O port according to the information content of test configurations table;
Step 5, by this group I/O port test result preserved by bitmap mode, (namely each position of bitmap is the I/O port object information of a group to the test result of each bit representation test configurations table correspondence position I/O port of this bitmap, then this is relative with the information content of the test configurations table of this group I/O port, and such as first group of I/O port just arranges the bit0 of this bitmap after having tested);
Step 6, the I/O port taking off a group in board are tested according to the mode of step 3 to step 5, and are kept in bitmap by the result of test;
After I/O ports all in step 7, board is all completed, shown by the test result of result explicit function to the I/O port of each group.
In the present invention, when in step 3, two I/O ports are tested, comprise further: two I/O ports are tested the level need drawing high first I/O port and detected second I/O port; Meanwhile, then the level dragging down first I/O port detect second I/O port; To prevent the erroneous judgement caused because of reasons such as short circuits.
Wherein, the title often organizing the test point TP of I/O port of test crash shows to point out which I/O port test of the personnel of production line not pass through according to each of bitmap value of preserving by described result explicit function, be convenient to investigation problem, such as suppose first group of I/O port test crash, then informant person is produced in prompting: TP43 and TP89 test crash.
Here it should be noted that: in the information content of allocation list: 1, carrying out negative testing is I/O port pair in order to adapt to phase inverter on board hardware; 2, the level state kept after test is the proper testing in order to ensure follow-up I/O port, some I/O port is the power supply I/O port of some hardware device, if this I/O port does not keep high level, I/O port then on follow-up corresponding hardware device cannot be tested, the I/O port that can affect the test of follow-up I/O port needs to be defined in affected I/O port to before in allocation list, and configures maintenance level state; 3, the configuration of I/O port of being associated requires that some I/O port has in the same way when testing or reverse requirement to adapt to fractional hardware.Therefore, as long as when hardware designing I/O port test, provide enough testing requirement information, i.e. the test configurations table of configurable I/O port, the program code on board is without the need to changing.
In a word, the content that I/O port is tested is made an I/O port test configurations table by the present invention, fill in the information content in this test configurations table according to the requirement of hardware, the information content that I/O port test procedure carries out corresponding test according to group I/O port each in IO test configurations table runs I/O port test; And the result that this group I/O port is tested is preserved by bitmap mode; Show test results finally by explicit function.The equal test configurations table of rewriting of each project the invention enables test procedure height multiplexing, only need ensure the quality of test procedure, as long as can be tested to the I/O port of projects afterwards.
The foregoing is only preferred embodiment of the present invention, all equalizations done according to the present patent application the scope of the claims change and modify, and all should belong to covering scope of the present invention.
Claims (5)
1. realize a method for board I/O port test based on test configurations table, it is characterized in that, comprise the steps:
Step 1, in board test procedure, define an I/O port tested object, and set up an array of this tested object; Described array is as I/O port test configurations table, and this test configurations table described comprises each group I/O port in board and carries out the information content required for corresponding test, and two I/O ports of wherein corresponding test are one group;
Step 2, take out sequentially in I/O port test configurations table one group of I/O port carry out correspondence test;
Step 3, determine that two I/O ports of this group carry out positive test or negative testing according to the information content of test configurations table, described positive test is: the level drawing high or drag down first I/O port, and the level of the second I/O port should correspondingly detect into height or for low; Described negative testing is: the level drawing high or drag down first I/O port, and the level of the second I/O port should detect as low or for high on the contrary;
Step 4, test this group I/O port after, preserve the low and high level of first I/O port according to the information content of test configurations table;
Step 5, by this group I/O port test result preserved by bitmap mode, the test result of each bit representation test configurations table correspondence position I/O port of this bitmap;
Step 6, the I/O port taking off a group from test configurations table are tested according to the mode of step 3 to step 5, and are kept in bitmap by the result of test;
After I/O ports all in step 7, board is all completed, shown by the test result of result explicit function to the I/O port of each group.
2. a kind of method realizing the test of board I/O port based on test configurations table according to claim 1, it is characterized in that: the information content that described each group of I/O port carries out required for corresponding test comprises: the title of the test point of two I/O ports and the general I/O interface GPIO number corresponding with the title of this test point, carry out positive test or negative testing, latter two I/O port of test needs to keep which type of level state, and whether has the level operation between the I/O port that is associated.
3. a kind of method realizing the test of board I/O port based on test configurations table according to claim 2, it is characterized in that: described step 2 also comprises with between step 3: if step 21 information content definition that respectively group I/O port carries out required for corresponding test has the I/O port be associated, when then two I/O ports being tested, the pin of I/O port related in board need be done operation associated accordingly after, then these two I/O ports to be tested.
4. a kind of method realizing the test of board I/O port based on test configurations table according to claim 1, it is characterized in that: when in step 3, two I/O ports are tested, comprise further: two I/O ports are tested the level need drawing high first I/O port and detected second I/O port; Meanwhile, then the level dragging down first I/O port detect second I/O port.
5. a kind of method realizing the test of board I/O port based on test configurations table according to claim 2, it is characterized in that: the title often organizing the test point of I/O port of test crash shows to point out which I/O port test of the personnel of production line not pass through according to each of bitmap value of preserving by described result explicit function, is convenient to investigation problem.
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| CN103700407B (en) * | 2013-12-14 | 2016-05-25 | 中国航空工业集团公司第六三一研究所 | A kind of production domesticization memory application verification method based on aerospace applications |
| CN108345476A (en) * | 2018-02-02 | 2018-07-31 | 曙光信息产业(北京)有限公司 | A kind of method and apparatus of batch processing hardware configuration information |
| CN109032878A (en) * | 2018-09-13 | 2018-12-18 | 郑州云海信息技术有限公司 | A kind of GPIO test method and device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5383192A (en) * | 1992-12-23 | 1995-01-17 | Intel Corporation | Minimizing the likelihood of slip between the instant a candidate for a break event is generated and the instant a microprocessor is instructed to perform a break, without missing breakpoints |
| CN1149735A (en) * | 1994-05-25 | 1997-05-14 | 西门子公司 | Service personal computer of modular structure |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5383192A (en) * | 1992-12-23 | 1995-01-17 | Intel Corporation | Minimizing the likelihood of slip between the instant a candidate for a break event is generated and the instant a microprocessor is instructed to perform a break, without missing breakpoints |
| CN1149735A (en) * | 1994-05-25 | 1997-05-14 | 西门子公司 | Service personal computer of modular structure |
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