CN106030544B - 计算机设备内存的检测方法和计算机设备 - Google Patents

计算机设备内存的检测方法和计算机设备 Download PDF

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CN106030544B
CN106030544B CN201480065448.XA CN201480065448A CN106030544B CN 106030544 B CN106030544 B CN 106030544B CN 201480065448 A CN201480065448 A CN 201480065448A CN 106030544 B CN106030544 B CN 106030544B
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memory
detection unit
cpu
detection
memory detection
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CN106030544A (zh
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莫良伟
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Huawei Technologies Co Ltd
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K5/00—Methods or arrangements for verifying the correctness of markings on a record carrier; Column detection devices

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  • Engineering & Computer Science (AREA)
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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
CN201480065448.XA 2014-12-24 2014-12-24 计算机设备内存的检测方法和计算机设备 Active CN106030544B (zh)

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PCT/CN2014/094823 WO2016101177A1 (fr) 2014-12-24 2014-12-24 Procédé de détection de mémoire à accès aléatoire de dispositif informatique et dispositif informatique

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CN106030544B true CN106030544B (zh) 2020-01-21

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Families Citing this family (4)

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Publication number Priority date Publication date Assignee Title
CN108021482A (zh) * 2017-12-28 2018-05-11 杭州迪普科技股份有限公司 一种Boot Loader下检测内存的方法及装置
CN110618905B (zh) * 2019-08-06 2023-05-09 晶晨半导体（深圳）有限公司 一种检测ddr内存模块中异常ddr内存的方法
CN114780323A (zh) * 2022-06-17 2022-07-22 新华三信息技术有限公司 一种服务器中内存的故障检测方法、装置及设备
CN116913362B (zh) * 2023-06-13 2024-06-28 深圳玖合精工科技有限公司 一种带有多个独立检测工位的电脑内存条检测台

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1991782A (zh) * 2005-12-30 2007-07-04 英业达股份有限公司 内存模块安装状态检测方法及系统
CN102708031A (zh) * 2012-05-15 2012-10-03 浪潮电子信息产业股份有限公司 一种快速定位故障内存的硬件实现方法
CN102799506A (zh) * 2012-06-29 2012-11-28 浪潮电子信息产业股份有限公司 一种定位故障内存的方法
CN103065687A (zh) * 2012-12-28 2013-04-24 山东华芯半导体有限公司 并行检测集成电路中ram生产缺陷的方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3655176B2 (ja) * 2000-02-22 2005-06-02 松下電器産業株式会社 メモリポーズ装置及びメモリポーズ方法
US7805644B2 (en) * 2007-12-29 2010-09-28 Texas Instruments Incorporated Multiple pBIST controllers
CN102237115A (zh) * 2011-08-03 2011-11-09 深圳芯邦科技股份有限公司 一种测试方法和相应的测试系统
JP6070374B2 (ja) * 2013-03-29 2017-02-01 富士通株式会社 情報処理装置、メモリ試験プログラムおよびメモリ試験方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1991782A (zh) * 2005-12-30 2007-07-04 英业达股份有限公司 内存模块安装状态检测方法及系统
CN102708031A (zh) * 2012-05-15 2012-10-03 浪潮电子信息产业股份有限公司 一种快速定位故障内存的硬件实现方法
CN102799506A (zh) * 2012-06-29 2012-11-28 浪潮电子信息产业股份有限公司 一种定位故障内存的方法
CN103065687A (zh) * 2012-12-28 2013-04-24 山东华芯半导体有限公司 并行检测集成电路中ram生产缺陷的方法

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CN106030544A (zh) 2016-10-12

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