CN106017680A - Halogen tungsten lamp source and imaging spectrometer onboard calibration method - Google Patents
Halogen tungsten lamp source and imaging spectrometer onboard calibration method Download PDFInfo
- Publication number
- CN106017680A CN106017680A CN201610625322.4A CN201610625322A CN106017680A CN 106017680 A CN106017680 A CN 106017680A CN 201610625322 A CN201610625322 A CN 201610625322A CN 106017680 A CN106017680 A CN 106017680A
- Authority
- CN
- China
- Prior art keywords
- imaging spectrometer
- light source
- tungsten lamp
- halogen tungsten
- spectrum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003384 imaging method Methods 0.000 title claims abstract description 111
- 229910052736 halogen Inorganic materials 0.000 title claims abstract description 81
- 150000002367 halogens Chemical class 0.000 title claims abstract description 80
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 title claims abstract description 80
- 229910052721 tungsten Inorganic materials 0.000 title claims abstract description 80
- 239000010937 tungsten Substances 0.000 title claims abstract description 80
- 238000000034 method Methods 0.000 title claims abstract description 78
- 230000003595 spectral effect Effects 0.000 claims abstract description 76
- 238000001514 detection method Methods 0.000 claims abstract description 13
- 239000011248 coating agent Substances 0.000 claims abstract description 8
- 238000000576 coating method Methods 0.000 claims abstract description 8
- 238000004364 calculation method Methods 0.000 claims abstract description 4
- 238000001228 spectrum Methods 0.000 claims description 91
- 230000005540 biological transmission Effects 0.000 claims description 21
- 230000005855 radiation Effects 0.000 claims description 5
- 238000005286 illumination Methods 0.000 abstract 1
- 235000015250 liver sausages Nutrition 0.000 abstract 1
- 230000002457 bidirectional effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000002068 genetic effect Effects 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 210000004209 hair Anatomy 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
The invention discloses a halogen tungsten lamp source and an imaging spectrometer onboard calibration method. The halogen tungsten lamp source comprises an integrating sphere light source, a collimation system, a reflecting mirror, a diffuse reflection pate and a power control device. The integrating sphere light source comprises an integrating sphere and a halogen tungsten lamp arranged in the integrating sphere and is used for transmitting detection light, and the inner surface of the integrating sphere is provided with a diffuse reflection coating; the collimation system is used for collimating the detection light to obtain collimated detection light; the reflecting mirror is used for totally reflecting the collimated detection light to make the collimated detection light vertically enter the diffuse reflection plate to obtain illumination light exiting from the diffuse reflection plate; the power control device is used for controlling the radiance in the integrating sphere light source to be a fixed value. Compared with sunlight, the halogen tungsten lamp source has the advantage of being smooth in spectral curve, the difficulty of obtaining the spectral curve of the halogen tungsten lamp source through calculation with multiple spectral radiance values is lowered, and thus the difficulty of the imaging spectrometer onboard calibration method using the halogen tungsten lamp source is lowered.
Description
Technical field
The application relates to imaging spectrometer onboard process technical field, more particularly, it relates to a kind of halogen tungsten
Lamp source and imaging spectrometer onboard process method.
Background technology
Along with the development of scientific research, especially in national economy field, Crop Estimation, mineral prospecting,
The research of the problem such as resource investigation, environmental monitoring needs high-precision high-spectrum remote sensing data.EO-1 hyperion is distant
Sense (Hyper spectral Remote Sensing), full name is high spectral resolution remote sensing, refers to the narrowest
And continuous print spectrum channel continues the technology of remotely sensed image, the most topmost image device to ground object
For imaging spectrometer, therefore the onboard process precision of imaging spectrometer largely effects on the one-tenth of high-spectrum remote-sensing
As effect.
In prior art, the process to the onboard process of described imaging spectrometer specifically includes that employing sunlight
Irradiate the diffuse-reflectance plate transmission light source as transmission calibration of radiometer imaging spectrometer；Utilize described transmission spoke
Penetrate multiple spectrum channels of meter calibration imaging spectrometer, it is thus achieved that the spectral responsivity of the plurality of spectrum channel；
Owing to the spectrum channel number of described transmission radiometer is typically far fewer than the spectrum channel of described imaging spectrometer
Number, therefore, also needs to utilize described transmission radiometer to carry out the diffuse-reflectance plate of reflected sunlight fixed afterwards
Mark, and it is finally inversed by sunlight spectrum；Finally utilize the sunlight spectrum and described imaging spectrometer being finally inversed by
All passage reading do not calibrate passages all to described imaging spectrometer of not calibrating are calibrated, thus complete
The onboard process process of described imaging spectrometer.
But owing to the distribution smoothness of sunlight spectrum is relatively low, this will make inverting sunlight spectrum
Difficulty is relatively big, adds the difficulty of onboard process to described imaging spectrometer；And sunlight spectrum exists
Unstable in a short time, this will make the sunlight spectrum utilizing inverting own described imaging spectrometer
Not calibrating passage when calibrating, actual sunlight spectrum and the sunlight spectrum being finally inversed by are not consistent
Situation occur so that the precision of the onboard process of described imaging spectrometer is poor.
Therefore, a kind of imaging spectrometer onboard process method that difficulty is relatively low and precision is higher is needed badly.
Summary of the invention
For solving above-mentioned technical problem, the invention provides on a kind of halogen tungsten lamp light source and imaging spectrometer star
Calibrating method, to realize providing a kind of imaging spectrometer onboard process method that difficulty is relatively low and precision is higher
Purpose.
For realizing above-mentioned technical purpose, embodiments provide following technical scheme:
A kind of halogen tungsten lamp light source, is applied to imaging spectrometer onboard process, including: integrating sphere light source, standard
Lineal system, reflecting mirror, diffuse-reflectance plate and output control device；Wherein,
Described integrating sphere light source includes integrating sphere and is arranged at the halogen tungsten lamp within described integrating sphere, for sending out
Probing light, described integrating sphere inner surface is sent to have diffuse-reflectance coating；
Described colimated light system is used for collimating described probing light, it is thus achieved that the probing light after collimation；
Described reflecting mirror probing light after being totally reflected described collimation, makes the detection light after described collimation
Diffuse-reflectance plate described in line vertical incidence, it is thus achieved that the illuminating ray of described diffuse-reflectance plate outgoing；
It is fixed value that described output control device is used for the spoke brilliance control of described integrating sphere light source internal.
Preferably, described output control device includes:
Monitor detector, for detecting the spoke brightness in described integrating sphere light source；
Power controller, for halogen tungsten lamp described in the spoke brightness regulation according to the detection of described supervision detector
Power, is fixed value by the spoke brilliance control in described integrating sphere light source.
Preferably, described mirror surface has total reflection film.
Preferably, described diffuse-reflectance plate surface has diffuse-reflectance coating.
A kind of imaging spectrometer onboard process method, including:
Utilizing halogen tungsten lamp light source to provide illuminating ray for transmission radiometer, described halogen tungsten lamp light source is above-mentioned
Halogen tungsten lamp light source described in one embodiment, described transmission radiation is calculated as tracing the biography of space low temperature radiometer
Pass radiometer；
Utilize multiple spectrum channels of described transmission calibration of radiometer imaging spectrometer, it is thus achieved that the plurality of light
The spectral responsivity of spectrum passage；
Spectral responsivity according to the plurality of spectrum channel and multiple light of corresponding described imaging spectrometer
The reading of spectrum passage calculates and obtains multiple spectral radiance values；
The curve of spectrum obtaining described halogen tungsten lamp light source is calculated according to the plurality of spectral radiance value；
According to all passage readings of not calibrating of the described curve of spectrum and described imaging spectrometer, calculate and obtain institute
State all spectral responsivities not calibrating passage of imaging spectrometer.
Preferably, the described spectral responsivity according to the plurality of spectrum channel and corresponding described imaging
The reading of multiple spectrum channels of spectrometer calculates the formula of acquisition multiple spectral radiance values employing:
Wherein, L is spectral radiance；V is the spectrum channel reading of imaging spectrometer；ρ is
Spectral responsivity.
Preferably, the described light calculating the described halogen tungsten lamp light source of acquisition according to the plurality of spectral radiance value
Spectral curve includes:
According to the plurality of spectral radiance value, interpolation calculation is utilized to obtain the light of described halogen tungsten lamp light source
Spectral curve.
Preferably, described do not calibrate passage reading according to the described curve of spectrum and described imaging spectrometer are all,
Calculate the acquisition all spectral responsivities not calibrating passage of described imaging spectrometer to include:
The all spoke brightness not calibrating passage of described imaging spectrometer is obtained according to the described curve of spectrum；
All not according to all spoke brightness not calibrating passage of described imaging spectrometer and described imaging spectrometer
Calibration passage reading calculates and obtains all spectral responsivities not calibrating passage of described imaging spectrometer.
Preferably, described according to all spoke brightness not calibrating passage of described imaging spectrometer and described imaging
The all passage readings of not calibrating of spectrogrph calculate the acquisition all spectrum not calibrating passage of described imaging spectrometer
The formula that responsiveness is used is:
Wherein, L is spectral radiance；V is the spectrum channel reading of imaging spectrometer；ρ is
Spectral responsivity.
Preferably, the wavelength of described illuminating ray is that the full spectral coverage inversion accuracy of described halogen tungsten lamp light source is the highest
Characteristic wavelength.
From technique scheme it can be seen that embodiments provide a kind of halogen tungsten lamp light source and imaging
Spectrogrph onboard process method, wherein, described imaging spectrometer onboard process method uses described halogen tungsten lamp
The scaling light source that described imaging spectrometer is calibrated by light source as described transmission radiometer, it is thus achieved that described
The spectral responsivity of multiple spectrum channels；Then according to the spectral responsivity of the plurality of spectrum channel and right
The reading of multiple spectrum channels of the described imaging spectrometer answered calculates and obtains multiple spectral radiance values, and
The plurality of spectral radiance value is utilized to calculate the curve of spectrum obtaining described halogen tungsten lamp light source；Finally according to
The described curve of spectrum and all passage readings of not calibrating of described imaging spectrometer, calculate and obtain described imaging
The all spectral responsivities not calibrating passage of spectrometer.For described halogen tungsten lamp light source is compared to sunlight, tool
There is the advantage that the curve of spectrum is smooth, make to utilize the plurality of spectral radiance value to calculate and obtain described halogen tungsten lamp
The difficulty of the curve of spectrum of light source reduces, thus reduces the imaging spectrometer utilizing described halogen tungsten lamp light source
The difficulty of onboard process method.
Further, owing on the star of described halogen tungsten lamp light source, decay is consistent, therefore can be by inside it
Output control device by the method that spoke brilliance control is fixed value of described integrating sphere light source internal by described
The curve of spectrum of halogen tungsten lamp light source keeps highly stable, such that it is able to avoid the halogen tungsten lamp being finally inversed by utilization
The curve of spectrum of light source occurs that light is set a song to music to all calibration of described imaging spectrometer when passage is calibrated
The change of line and affect the situation of onboard process precision and occur, improve and utilize on described imaging spectrometer star
The calibrating method precision to imaging spectrometer onboard process.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to reality
Execute the required accompanying drawing used in example or description of the prior art to be briefly described, it should be apparent that below,
Accompanying drawing in description is only embodiments of the invention, for those of ordinary skill in the art, not
On the premise of paying creative work, it is also possible to obtain other accompanying drawing according to the accompanying drawing provided.
The structural representation of a kind of halogen tungsten lamp light source that the embodiment that Fig. 1 is the application provides；
The flow process of a kind of imaging spectrometer onboard process method that the embodiment that Fig. 2 is the application provides
Schematic diagram；
The curve of spectrum of a kind of halogen tungsten lamp light source that the embodiment that Fig. 3 is the application provides.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out
Clearly and completely describe, it is clear that described embodiment is only a part of embodiment of the present invention, and
It is not all, of embodiment.Based on the embodiment in the present invention, those of ordinary skill in the art are not doing
Go out the every other embodiment obtained under creative work premise, broadly fall into the scope of protection of the invention.
The embodiment of the present application provides a kind of halogen tungsten lamp light source, is applied to imaging spectrometer onboard process, as
Shown in Fig. 1, including: integrating sphere light source, colimated light system 3, reflecting mirror 4, diffuse-reflectance plate 5 and power control
Device；Wherein,
Described integrating sphere light source includes integrating sphere 1 and is arranged at the halogen tungsten lamp within described integrating sphere 1, is used for
Sending probing light, described integrating sphere 1 inner surface has diffuse-reflectance coating 10；
Described colimated light system 3 is used for collimating described probing light, it is thus achieved that the probing light after collimation；
The described reflecting mirror 4 probing light after being totally reflected described collimation, makes the detection light after described collimation
Diffuse-reflectance plate 5 described in line vertical incidence, it is thus achieved that the illuminating ray of described diffuse-reflectance plate 5 outgoing；
It is fixed value that described output control device is used for the spoke brilliance control of described integrating sphere light source internal.
In the present embodiment, the light that described halogen tungsten lamp sends, after the described even light of integrating sphere 1, become institute
State probing light, owing to described integrating sphere 1 inner surface has diffuse-reflectance coating 10, the most described probing light
For lambert's light (spoke brightness does not changes with direction), described probing light is through the first of described integrating sphere 1
Outgoing after aperture diaphragm 8 and the second aperture diaphragm 9；There is the described probing light of good Lambertian characteristics at warp
Crossing outgoing after described colimated light system 3 collimates is equally distributed collimated beam (the detection light after described collimation
Line), the probing light after described collimation is unrestrained anti-described in vertical incidence after the reflection through described reflecting mirror 4
Penetrating plate 5, the light of described diffuse-reflectance plate 5 outgoing is referred to as illuminating ray, for for transmitting calibration of radiometer
Imaging spectrometer provides light source.
Generally speaking, it is desirable to described reflecting mirror 4 needs the probing light after being totally reflected described collimation, to avoid
Decay to the probing light after described collimation.In an embodiment of the application, as it is shown in figure 1, logical
It is complete that the mode at described reflecting mirror 4 surface patch total reflection film 7 of crossing realizes the probing light after described collimation
Reflection.But in other embodiments of the application, it is also possible to by doing surface on described reflecting mirror 4 surface
The mode of reason realizes the total reflection to the probing light after described collimation, and this is not limited by the application,
Concrete depending on practical situation.
Also, it should be noted described output control device can be by bright for the spoke of described integrating sphere light source internal
Degree controls as fixed value, so adds described halogen tungsten lamp and decays on star consistent characteristic so that be described
The curve of spectrum of halogen tungsten lamp light source can keep highly stable, is so utilizing described halogen tungsten lamp to described one-tenth
When carrying out onboard process as spectrogrph, the change of the curve of spectrum due to light source can be avoided and the star that brings
Upscaling error, thus promote and utilize described halogen tungsten lamp that described imaging spectrometer is carried out the essence of onboard process
Degree.
In an embodiment of the application, described colimated light system 3 is off axis paraboloidal mirror, but in the application
Other embodiments in, described colimated light system 3 can also be made up of other optics, and the application is to this also
Do not limit, concrete depending on practical situation.
On the basis of above-described embodiment, in an embodiment of the application, described output control device
Including:
Monitor detector 6, for detecting the spoke brightness in described integrating sphere light source；
Power controller 11, for halogen tungsten lamp described in the spoke brightness regulation according to the detection of described supervision detector 6
Power, be fixed value by the spoke brilliance control in described integrating sphere light source.
Described supervision detector 6 can be sensor or other optics, and described power controller 11 is permissible
For single-chip microcomputer or microprocessor, this is not limited by the application, concrete depending on practical situation.
On the basis of above-described embodiment, in an embodiment of the application, as it is shown in figure 1, described unrestrained
Reflecting plate 5 realizes diffuse-reflectance function by the way of in surface-coated diffuse-reflectance coating 10.At its of the application
In his embodiment, described diffuse-reflectance plate 5 can also realize unrestrained anti-by the way of carrying out physical treatment on surface
Penetrate function.This is not limited by the application, concrete depending on practical situation.
Accordingly, the embodiment of the present application additionally provides a kind of imaging spectrometer onboard process method, such as Fig. 2 institute
Show, including:
S101: utilizing halogen tungsten lamp light source to provide illuminating ray for transmission radiometer, described halogen tungsten lamp light source is
Halogen tungsten lamp light source described in any of the above-described embodiment, described transmission radiation is calculated as tracing space low temperature radiation
The transmission radiometer of meter；
S102: utilize multiple spectrum channels of described transmission calibration of radiometer imaging spectrometer, it is thus achieved that described
The spectral responsivity of multiple spectrum channels；
S103: according to spectral responsivity and the corresponding described imaging spectrometer of the plurality of spectrum channel
The reading of multiple spectrum channels calculates and obtains multiple spectral radiance values；
S104: calculate the curve of spectrum obtaining described halogen tungsten lamp light source according to the plurality of spectral radiance value；
S105: according to all passage readings of not calibrating of the described curve of spectrum and described imaging spectrometer, calculates
Obtain all spectral responsivities not calibrating passage of described imaging spectrometer.
It should be noted that in step s 102, selected by described transmission calibration of radiometer imaging spectrometer
The determination mode of spectrum channel specifically include that the real spectrum curve setting up described halogen tungsten lamp light source is with logical
Cross the error equation of the curve of spectrum of multispectral data matching；Described error equation is sought by genetic algorithm
Globally optimal solution determines the spectrum channel of described transmission radiometer.Can directly be evaluated instead by said process
Drill the error of Halogen lamp spectrum curve, it is also possible to the directly deviation of centre wavelength, the spectrum to transmission radiation
The error that bandwidth and actinometry uncertainty introduce has an evaluation to the influence degree of fitting precision.
In step S104, calculate the described halogen tungsten lamp light source obtained according to the plurality of spectral radiance value
The curve of spectrum as shown in Figure 3.The position of the cross hairs mark in Fig. 3 is i.e. to lead to according to the plurality of spectrum
The reading of multiple spectrum channels of the spectral responsivity in road and corresponding described imaging spectrometer calculates acquisition
Multiple spectral radiance values.
Due to the advantage that described halogen tungsten lamp light source is smooth compared to having the curve of spectrum for sunlight, make profit
The difficulty calculating the curve of spectrum obtaining described halogen tungsten lamp light source by the plurality of spectral radiance value reduces,
Thus reduce the difficulty of the imaging spectrometer onboard process method utilizing described halogen tungsten lamp light source.
Further, owing on the star of described halogen tungsten lamp light source, decay is consistent, therefore can be by inside it
Output control device by the method that spoke brilliance control is fixed value of described integrating sphere light source internal by described
The curve of spectrum of halogen tungsten lamp light source keeps highly stable, such that it is able to avoid the halogen tungsten lamp being finally inversed by utilization
The curve of spectrum of light source occurs that light is set a song to music to all calibration of described imaging spectrometer when passage is calibrated
The change of line and affect the situation of onboard process precision and occur, improve and utilize on described imaging spectrometer star
The calibrating method precision to imaging spectrometer onboard process.
Further, since comprise ultraviolet component in sunlight, these ultraviolet component can gradually decompose described unrestrained anti-
Penetrate the chemical composition of plate 5, cause the bidirectional reflectanD of described diffuse-reflectance plate 5 to change, and this change
Being difficult to carry out in space detection by quantitative during change, this also can cause in prior art and utilizes sunlight as light
Source carries out the reduction of the precision of onboard process to described imaging spectrometer.And due to described imaging spectrometer star
Upscaling method uses described halogen tungsten lamp light source to provide illuminating ray for described transmission radiometer, thus avoids
The situation causing the bidirectional reflectanD of described diffuse-reflectance plate 5 to change, improves described imaging further
The onboard process precision of spectrometer onboard process method.
On the basis of above-described embodiment, in an embodiment of the application, described according to the plurality of
The reading of multiple spectrum channels of the spectral responsivity of spectrum channel and corresponding described imaging spectrometer calculates
The formula obtaining the employing of multiple spectral radiance value is:
Wherein, L is spectral radiance；V is the spectrum channel reading of imaging spectrometer；ρ is
Spectral responsivity.
On the basis of above-described embodiment, in another embodiment of the application, described according to described many
Individual spectral radiance value calculates the curve of spectrum of the described halogen tungsten lamp light source of acquisition and includes:
According to the plurality of spectral radiance value, interpolation calculation is utilized to obtain the light of described halogen tungsten lamp light source
Spectral curve.
Owing to the concrete principle of described interpolation method is well known to those skilled in the art, the application is at this not
Repeat.
On the basis of above-described embodiment, have in an embodiment in the application, described according to described light
Spectral curve and all passage readings of not calibrating of described imaging spectrometer, calculate and obtain described imaging spectrometer institute
The spectral responsivity not calibrating passage is had to include:
The all spoke brightness not calibrating passage of described imaging spectrometer is obtained according to the described curve of spectrum；
All not according to all spoke brightness not calibrating passage of described imaging spectrometer and described imaging spectrometer
Calibration passage reading calculates and obtains all spectral responsivities not calibrating passage of described imaging spectrometer.
Concrete, as it is shown on figure 3, after obtaining the described curve of spectrum, it is possible to according to the described curve of spectrum
Read all spoke brightness L not calibrating passage of described imaging spectrometer, own further according to described imaging spectrometer
Do not calibrate the reading V of passage, can be according to formulaCalculate the described imaging spectrometer of acquisition all uncertain
The spectral responsivity of mark passage；Wherein, L is spectral radiance；V is that the spectrum channel of imaging spectrometer is read
Number；ρ is spectral responsivity.
On the basis of above-described embodiment, in a preferred embodiment of the application, as it is shown on figure 3,
The wavelength of described illuminating ray is the characteristic wavelength that the full spectral coverage inversion accuracy of described halogen tungsten lamp light source is the highest
(the characteristic wavelength point in Fig. 3).
It should be noted that the wavelength of described illuminating ray to be chosen to be the characteristic wave of described halogen tungsten lamp light source
Long reason is, calculates (inverting) by the spoke brightness value at this feature wavelength and obtains described halogen tungsten light
The precision of the curve of spectrum in source is the highest.The wavelength of described illuminating ray is chosen to be described halogen tungsten light
The mode of the characteristic wavelength in source can be determined by genetic algorithm.
In sum, the embodiment of the present application provides a kind of halogen tungsten lamp light source and imaging spectrometer onboard process
Method, wherein, described imaging spectrometer onboard process method uses described halogen tungsten lamp light source as described biography
Pass the scaling light source that described imaging spectrometer is calibrated by radiometer, it is thus achieved that the plurality of spectrum channel
Spectral responsivity；Then according to spectral responsivity and the corresponding described imaging of the plurality of spectrum channel
The reading of multiple spectrum channels of spectrometer calculates and obtains multiple spectral radiance values, and utilizes the plurality of light
Spectrum spoke brightness value calculates the curve of spectrum obtaining described halogen tungsten lamp light source；Finally according to the described curve of spectrum and
The all passage readings of not calibrating of described imaging spectrometer, calculate and obtain that described imaging spectrometer is all does not calibrates
The spectral responsivity of passage.For described halogen tungsten lamp light source is compared to sunlight, there is the curve of spectrum and smooth
Advantage, make to utilize the plurality of spectral radiance value to calculate the curve of spectrum obtaining described halogen tungsten lamp light source
Difficulty reduce, thus reduce the imaging spectrometer onboard process method utilizing described halogen tungsten lamp light source
Difficulty.
Further, owing on the star of described halogen tungsten lamp light source, decay is consistent, therefore can be by inside it
Output control device by the method that spoke brilliance control is fixed value of described integrating sphere light source internal by described
The curve of spectrum of halogen tungsten lamp light source keeps highly stable, such that it is able to avoid the halogen tungsten lamp being finally inversed by utilization
The curve of spectrum of light source occurs that light is set a song to music to all calibration of described imaging spectrometer when passage is calibrated
The change of line and affect the situation of onboard process precision and occur, improve and utilize on described imaging spectrometer star
The calibrating method precision to imaging spectrometer onboard process.
In this specification, each embodiment uses the mode gone forward one by one to describe, and each embodiment stresses
Being the difference with other embodiments, between each embodiment, identical similar portion sees mutually.
Described above to the disclosed embodiments, makes professional and technical personnel in the field be capable of or uses
The present invention.Multiple amendment to these embodiments will be aobvious and easy for those skilled in the art
See, generic principles defined herein can without departing from the spirit or scope of the present invention,
Realize in other embodiments.Therefore, the present invention is not intended to be limited to the embodiments shown herein,
And it is to fit to the widest scope consistent with principles disclosed herein and features of novelty.
Claims (10)
1. a halogen tungsten lamp light source, it is characterised in that be applied to imaging spectrometer onboard process, including:
Integrating sphere light source, colimated light system, reflecting mirror, diffuse-reflectance plate and output control device；Wherein,
Described integrating sphere light source includes integrating sphere and is arranged at the halogen tungsten lamp within described integrating sphere, for sending out
Probing light, described integrating sphere inner surface is sent to have diffuse-reflectance coating；
Described colimated light system is used for collimating described probing light, it is thus achieved that the probing light after collimation；
Described reflecting mirror probing light after being totally reflected described collimation, makes the detection light after described collimation
Diffuse-reflectance plate described in line vertical incidence, it is thus achieved that the illuminating ray of described diffuse-reflectance plate outgoing；
It is fixed value that described output control device is used for the spoke brilliance control of described integrating sphere light source internal.
Halogen tungsten lamp light source the most according to claim 1, it is characterised in that described output control device
Including:
Monitor detector, for detecting the spoke brightness in described integrating sphere light source；
Power controller, for halogen tungsten lamp described in the spoke brightness regulation according to the detection of described supervision detector
Power, is fixed value by the spoke brilliance control in described integrating sphere light source.
Halogen tungsten lamp light source the most according to claim 1, it is characterised in that described mirror surface has
There is total reflection film.
Halogen tungsten lamp light source the most according to claim 1, it is characterised in that described diffuse-reflectance plate surface
There is diffuse-reflectance coating.
5. an imaging spectrometer onboard process method, it is characterised in that including:
Utilizing halogen tungsten lamp light source to provide illuminating ray for transmission radiometer, described halogen tungsten lamp light source is that right is wanted
The halogen tungsten lamp light source described in any one of 1-4, described transmission radiation is asked to be calculated as tracing space low temperature radiometer
Transmission radiometer；
Utilize multiple spectrum channels of described transmission calibration of radiometer imaging spectrometer, it is thus achieved that the plurality of light
The spectral responsivity of spectrum passage；
Spectral responsivity according to the plurality of spectrum channel and multiple light of corresponding described imaging spectrometer
The reading of spectrum passage calculates and obtains multiple spectral radiance values；
The curve of spectrum obtaining described halogen tungsten lamp light source is calculated according to the plurality of spectral radiance value；
According to all passage readings of not calibrating of the described curve of spectrum and described imaging spectrometer, calculate and obtain institute
State all spectral responsivities not calibrating passage of imaging spectrometer.
Imaging spectrometer onboard process method the most according to claim 5, it is characterised in that described
Multiple spectrum of the spectral responsivity according to the plurality of spectrum channel and corresponding described imaging spectrometer lead to
The reading in road calculates the formula of acquisition multiple spectral radiance values employing:
Wherein, L is spectral radiance；V is the spectrum channel reading of imaging spectrometer；ρ is
Spectral responsivity.
Imaging spectrometer onboard process method the most according to claim 5, it is characterised in that described
The curve of spectrum calculating the described halogen tungsten lamp light source of acquisition according to the plurality of spectral radiance value includes:
According to the plurality of spectral radiance value, interpolation calculation is utilized to obtain the light of described halogen tungsten lamp light source
Spectral curve.
Imaging spectrometer onboard process method the most according to claim 5, it is characterised in that described
According to all passage readings of not calibrating of the described curve of spectrum and described imaging spectrometer, calculate and obtain described one-tenth
Do not calibrate the spectral responsivity of passage include as spectrogrph be all:
The all spoke brightness not calibrating passage of described imaging spectrometer is obtained according to the described curve of spectrum；
All not according to all spoke brightness not calibrating passage of described imaging spectrometer and described imaging spectrometer
Calibration passage reading calculates and obtains all spectral responsivities not calibrating passage of described imaging spectrometer.
Imaging spectrometer onboard process method the most according to claim 8, it is characterised in that described
According to all spoke brightness not calibrating passage of described imaging spectrometer with described imaging spectrometer is all does not calibrates
Passage reading calculates and obtains the public affairs that all spectral responsivities not calibrating passage of described imaging spectrometer are used
Formula is:
Wherein, L is spectral radiance；V is the spectrum channel reading of imaging spectrometer；ρ is
Spectral responsivity.
10., according to the imaging spectrometer onboard process method described in any one of claim 5-9, its feature exists
In the characteristic wave that the full spectral coverage inversion accuracy that, the wavelength of described illuminating ray is described halogen tungsten lamp light source is the highest
Long.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610625322.4A CN106017680B (en) | 2016-08-02 | 2016-08-02 | A kind of halogen tungsten lamp light source and imaging spectrometer onboard process method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610625322.4A CN106017680B (en) | 2016-08-02 | 2016-08-02 | A kind of halogen tungsten lamp light source and imaging spectrometer onboard process method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106017680A true CN106017680A (en) | 2016-10-12 |
| CN106017680B CN106017680B (en) | 2018-10-19 |
Family
ID=57135092
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610625322.4A Active CN106017680B (en) | 2016-08-02 | 2016-08-02 | A kind of halogen tungsten lamp light source and imaging spectrometer onboard process method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106017680B (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109029725A (en) * | 2018-08-15 | 2018-12-18 | 合肥泰达光电科技有限公司 | Deep ultraviolet, visible, near infrared radiometric calibration source device |
| CN109185731A (en) * | 2018-08-31 | 2019-01-11 | 中国地质大学（武汉） | A kind of design method of Image processing spectroscopic light source |
| CN109342317A (en) * | 2018-11-15 | 2019-02-15 | 中国电子科技集团公司第四十研究所 | A kind of optical parameter test device and method for plane black-materials |
| CN109374550A (en) * | 2018-11-16 | 2019-02-22 | 中国科学院合肥物质科学研究院 | Super-resolution spectrograph spectrum calibration method based on optical transmission spectra |
| CN109405968A (en) * | 2018-10-18 | 2019-03-01 | 中国科学院云南天文台 | A kind of automatic spectrum observation system and its control method |
| CN110927943A (en) * | 2019-12-26 | 2020-03-27 | 中国科学院长春光学精密机械与物理研究所 | Off-axis three-reflection diffuse reflection plate lighting system |
| CN111982814A (en) * | 2020-08-25 | 2020-11-24 | 合肥泰禾光电科技股份有限公司 | Spectrometer wavelength calibration device |
| CN112146756A (en) * | 2020-09-21 | 2020-12-29 | 中国科学院长春光学精密机械与物理研究所 | Method, device and system for inverting spectral radiance of on-board lamp-panel system |
| CN112284533A (en) * | 2019-07-24 | 2021-01-29 | 中国科学院上海技术物理研究所启东光电遥感中心 | Radiometer for remote sensor on-orbit atmospheric correction |
| CN113631908A (en) * | 2018-12-21 | 2021-11-09 | 纳米线科技公司 | Method, apparatus, system and device for mobile digital spatial profiling of pathological specimens |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102323240A (en) * | 2011-07-25 | 2012-01-18 | 中国科学院安徽光学精密机械研究所 | Indoor full-automatic BRDF (bidirectional reflectance distribution function) measurement device |
| US20130003064A1 (en) * | 2011-01-03 | 2013-01-03 | National Institute Of Standards And Technology | Dynamic Spectral Radiance Calibration Source |
| CN103278236A (en) * | 2013-05-16 | 2013-09-04 | 中国科学院长春光学精密机械与物理研究所 | Large visual field optical remote sensing instrument radiation brightness calibrating device |
-
2016
- 2016-08-02 CN CN201610625322.4A patent/CN106017680B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130003064A1 (en) * | 2011-01-03 | 2013-01-03 | National Institute Of Standards And Technology | Dynamic Spectral Radiance Calibration Source |
| CN102323240A (en) * | 2011-07-25 | 2012-01-18 | 中国科学院安徽光学精密机械研究所 | Indoor full-automatic BRDF (bidirectional reflectance distribution function) measurement device |
| CN103278236A (en) * | 2013-05-16 | 2013-09-04 | 中国科学院长春光学精密机械与物理研究所 | Large visual field optical remote sensing instrument radiation brightness calibrating device |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109029725A (en) * | 2018-08-15 | 2018-12-18 | 合肥泰达光电科技有限公司 | Deep ultraviolet, visible, near infrared radiometric calibration source device |
| CN109185731A (en) * | 2018-08-31 | 2019-01-11 | 中国地质大学（武汉） | A kind of design method of Image processing spectroscopic light source |
| CN109405968B (en) * | 2018-10-18 | 2020-10-30 | 中国科学院云南天文台 | Automatic spectrum observation system and control method thereof |
| CN109405968A (en) * | 2018-10-18 | 2019-03-01 | 中国科学院云南天文台 | A kind of automatic spectrum observation system and its control method |
| CN109342317A (en) * | 2018-11-15 | 2019-02-15 | 中国电子科技集团公司第四十研究所 | A kind of optical parameter test device and method for plane black-materials |
| CN109342317B (en) * | 2018-11-15 | 2021-04-20 | 中国电子科技集团公司第四十一研究所 | Optical parameter testing device and method for plane black material |
| CN109374550A (en) * | 2018-11-16 | 2019-02-22 | 中国科学院合肥物质科学研究院 | Super-resolution spectrograph spectrum calibration method based on optical transmission spectra |
| CN113631908A (en) * | 2018-12-21 | 2021-11-09 | 纳米线科技公司 | Method, apparatus, system and device for mobile digital spatial profiling of pathological specimens |
| US12002572B2 (en) | 2018-12-21 | 2024-06-04 | Nanostring Technologies, Inc. | Methods, apparatuses, systems and devices for mobile digital spatial profiling of pathological specimens |
| CN112284533A (en) * | 2019-07-24 | 2021-01-29 | 中国科学院上海技术物理研究所启东光电遥感中心 | Radiometer for remote sensor on-orbit atmospheric correction |
| CN110927943A (en) * | 2019-12-26 | 2020-03-27 | 中国科学院长春光学精密机械与物理研究所 | Off-axis three-reflection diffuse reflection plate lighting system |
| CN111982814A (en) * | 2020-08-25 | 2020-11-24 | 合肥泰禾光电科技股份有限公司 | Spectrometer wavelength calibration device |
| CN112146756A (en) * | 2020-09-21 | 2020-12-29 | 中国科学院长春光学精密机械与物理研究所 | Method, device and system for inverting spectral radiance of on-board lamp-panel system |
| CN112146756B (en) * | 2020-09-21 | 2021-06-18 | 中国科学院长春光学精密机械与物理研究所 | Method, device and system for inverting spectral radiance of on-board lamp-panel system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106017680B (en) | 2018-10-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106017680A (en) | Halogen tungsten lamp source and imaging spectrometer onboard calibration method | |
| CN106352978A (en) | Method for calibrating laser light sources and imaging spectrometers in on-orbit manner | |
| Andersen et al. | Comparison between ray-tracing simulations and bi-directional transmission measurements on prismatic glazing | |
| CN106233104B (en) | The method and apparatus characterized for luminaire | |
| EP3421953B1 (en) | Measurement device and method for spectral responsivity of large-aperture radiometer | |
| Baribeau et al. | Development of a robot-based gonioreflectometer for spectral BRDF measurement | |
| CN102486404A (en) | Ultraviolet low-light stellar magnitude simulation and stellar magnitude calibration system | |
| CN111006762B (en) | Space remote sensing instrument on-satellite calibration method based on LED piecewise fitting solar spectrum | |
| CN104280119B (en) | A kind of biserial offsets the scaling system of infrared spectrometer | |
| CN113029336B (en) | Space remote sensing instrument on-satellite radiometric calibration device and calibration method | |
| CN103047998A (en) | System and method for detecting detectivity of space optical system | |
| CN107817053B (en) | A kind of heavy caliber infrared radiation measurement system calibrating method and device | |
| CN111174911B (en) | Method for calibrating absolute radiation of any ground object of space optical camera | |
| WO2022262692A1 (en) | Method and system for measuring spectral reflectivity | |
| CN107101807A (en) | A kind of space optical camera spectral radiance receptance function measurement apparatus and method | |
| CN103278236B (en) | Large visual field optical remote sensing instrument radiation brightness calibrating device | |
| CN109297685A (en) | A kind of spectral transmittance test device and method for heavy caliber parallel light tube | |
| CN102012266A (en) | Photosynthetic radiation illuminometer and measuring method thereof | |
| CN103207063A (en) | Spectrum weight adjustable spectrum simulation system | |
| CN115655670A (en) | Broadband large dynamic range radiometric calibration method under variable color temperature integrating sphere light source | |
| CN114216559B (en) | Partial aperture factor measuring method and device for on-board calibration mechanism | |
| Kómar et al. | Analysis of diffuse irradiance from two parts of sky vault divided by solar meridian using portable spectral sky-scanner | |
| Hanselaer et al. | A new integrating sphere design for spectral radiant flux determination of light-emitting diodes | |
| CN106769895A (en) | A kind of method for demarcating measurement whole atmosphere spectral transmittance | |
| CN104807616B (en) | A kind of Spectralon diffusing reflections plate bearing calibration |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |