CN105973769A - Device and method for measurement of size of suspended submicron particulate matter - Google Patents
Device and method for measurement of size of suspended submicron particulate matter Download PDFInfo
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- CN105973769A CN105973769A CN201610277805.XA CN201610277805A CN105973769A CN 105973769 A CN105973769 A CN 105973769A CN 201610277805 A CN201610277805 A CN 201610277805A CN 105973769 A CN105973769 A CN 105973769A
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- 238000005259 measurement Methods 0.000 title claims abstract description 18
- 238000000034 method Methods 0.000 title claims abstract description 16
- 239000013618 particulate matter Substances 0.000 title claims abstract description 11
- 238000001514 detection method Methods 0.000 claims abstract description 36
- 239000004005 microsphere Substances 0.000 claims abstract description 24
- 238000012545 processing Methods 0.000 claims abstract description 12
- 239000002245 particle Substances 0.000 claims description 65
- 230000003287 optical effect Effects 0.000 claims description 59
- 239000000725 suspension Substances 0.000 claims description 53
- 235000013339 cereals Nutrition 0.000 claims description 5
- 240000007594 Oryza sativa Species 0.000 claims description 2
- 235000007164 Oryza sativa Nutrition 0.000 claims description 2
- 235000009566 rice Nutrition 0.000 claims description 2
- 238000009738 saturating Methods 0.000 claims 1
- 229920000642 polymer Polymers 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000008187 granular material Substances 0.000 description 3
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- 239000008280 blood Substances 0.000 description 1
- 210000004369 blood Anatomy 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000002296 dynamic light scattering Methods 0.000 description 1
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- 238000010304 firing Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
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- 244000005700 microbiome Species 0.000 description 1
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- 238000012544 monitoring process Methods 0.000 description 1
- 238000012634 optical imaging Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
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Abstract
A device and method for measurement of the size of a suspended submicron particulate matter are provided. The device comprises a light source, a backward scattered light receiving lens, a forward scattered light receiving lens, a backward scattered light detection module, a forward scattered light detection module and a processing module; light emitted by the light source passes through the backward scattered light receiving lens and then is incident to a to-be-detected submicron particulate matter, and forward scattered light and backward scattered light are produced; the light intensity value of the forward scattered light passing through the forward scattered light receiving lens is detected by the forward scattered light detection module; the light intensity value of the backward scattered light passing through the backward scattered light receiving lens is detected by the backward scattered light detection module; the ratio R of the light intensity value of the backward scattered light and the light intensity value of the forward scattered light is calculated by the processing module, and according to the predetermined monotonous relationship between the ratio R and the microsphere diameter D, the size of the to-be-detected submicron particulate matter is determined. The method can particularly simply and reliably measure single suspended submicron particulate matter.
Description
Technical field
The present invention relates to a kind of method measuring suspension Submicron Particles size.
Background technology
Submicron Particles field non-for marine ecology and air quality is important.In ocean, submicron
The most species of planktonic algae, antibacterial and virus, abundance is maximum, and the microorganism ring that they are formed is
The important mechanisms of ocean material circulation, plays the part of very important role especially in oceanic environment.Air
The granule of sub-micron, concentration is maximum, and they can be rapidly absorbed by a human pulmonary, enters the blood of people, right
Lethal challenge is constituted in people's health.
Meanwhile, the monitoring to submicron particles is the most day by day subject to people's attention, and develops multiple
Instrument detects them.The size of Submicron Particles settles with it, has transported substantial connection, is to retouch
State the important parameter of submicron particles.Measure the big submethod of Submicron Particles at present and rely primarily on micro-
The laboratory techniques such as mirror, Electronic Speculum, they need to fix Submicron Particles；Comparatively speaking, suspend
Submicron Particles under state is measured more rare.Optical imaging method due to the restriction of resolution,
1 micron can only be accomplished.Dynamic light scattering method utilize Brownian movement to obtain the information of size, but it
Need to measure a period of time, and only obtain average effect.Flow cytometer is by measuring forward direction and side
To scattering, minimum can accomplish 0.5 micron, but the fluid means of its complexity is applied to particle
Also have any problem.In a word, the size currently for the Submicron Particles suspended is measured, the most easy to handle
Method can realize.
Summary of the invention
Present invention is primarily targeted at and overcome the deficiencies in the prior art, it is provided that a kind of measurement suspension sub-micro
The method of rice grain thing size, can the size of easy reliable measurements single suspension Submicron Particles.
For achieving the above object, the present invention is by the following technical solutions:
A kind of device measuring suspension Submicron Particles size, including light source, back scattering light-receiving
Lens, forward scattering optical receiver lens, rear orientation light detecting module, forward scattering optical detection module
And processing module, the light that described light source sends incides after described back scattering light-receiving lens
On suspension Submicron Particles to be measured in sample cell, produce forward scattering optical receiver lens described in directive
Forward scattering light and directive described in the rear orientation light of back scattering light-receiving lens, before described
To the light intensity value of the described forward scattering light of scattering optical receiver lens by described forward scattering optical detection mould
Block detects, through the light intensity value of described rear orientation light of described back scattering light-receiving lens by described
Rear orientation light detecting module detects, and described processing module calculates the light intensity value of described rear orientation light
With the ratio R of the light intensity value of described forward scattering light, and straight with microsphere according to predetermined ratio R
Monotonic relationshi between the D of footpath, determines the size of described suspension Submicron Particles to be measured, wherein said
Monotonic relationshi between ratio R and microsphere diameter D is the multiple different size of mark for known diameter
Quasi-microsphere is obtained by ratio R described in described measurement device.
Further:
Described rear orientation light detecting module includes that beam splitter, rear orientation light collecting lens and first are visited
Survey device, described beam splitter between described light source and described back scattering light-receiving lens, described light
The light that source sends first is again incident on described back scattering light-receiving lens transmitted through described beam splitter, passes through
The described rear orientation light of described back scattering light-receiving lens reflects, instead on described beam splitter
The described rear orientation light penetrated through rear orientation light collecting lens post-concentration to described first detector,
Described first detector detects the light intensity value of described rear orientation light.
Described forward scattering optical detection module includes forward scattering light collecting lens and the second detector, warp
The described forward scattering light crossing described forward scattering optical receiver lens incides described forward scattering light meeting
Poly-lens, through described forward scattering light collecting lens post-concentration to described second detector, described
Two detectors detect the light intensity value of described forward scattering light.
Also include being arranged on described forward scattering optical receiver lens and described forward scattering optical detection module
Between diaphragm, described diaphragm blocks forward-scattering angle less than the light of predetermined angle theta 0 to avoid its quilt
Described forward scattering optical detection module receives.
The half-angle that described back scattering light-receiving lens can collect light is θ b, the back scattering of covering
The scope at angle is [180 ° of-2* θ b, 180 °], and described forward scattering optical receiver lens can collect light
Half-angle be θ f, the scope of the forward-scattering angle of covering is [θ 0,2* θ f].
Also include the aperture light channel structure before being arranged on described first detector, described aperture light channel structure
The suspension Submicron Particles to be measured of the pre-position being in sample cell is visited described first
The contribution of the light intensity value surveying device detection is not less than predetermined extent.Preferably, described aperture light channel structure bag
Include the foraminate dark slide of tool and the aperture between described dark slide and described first detector
Convergence of rays lens, described aperture position in described dark slide and described suspension submicron to be measured
Grain thing location is corresponding.
Also include the aperture light channel structure before being arranged on described second detector, described aperture light channel structure
The suspension Submicron Particles to be measured of the pre-position being in sample cell is visited described second
The contribution of the light intensity value surveying device detection is not less than predetermined extent.Preferably, described aperture light channel structure bag
Include the foraminate dark slide of tool and the aperture between described dark slide and described second detector
Convergence of rays lens, described aperture position in described dark slide and described suspension submicron to be measured
Grain thing location is corresponding.
A kind of device measuring suspension Submicron Particles size, including described light source, described after
To scattering optical receiver lens, described forward scattering optical receiver lens, described back scattering optical detection
Module and described forward scattering optical detection module.
A kind of method measuring suspension Submicron Particles size, uses described measurement suspension submicron
The device of particulate matter size carries out the measurement of suspension Submicron Particles size, and wherein said light source sends
Light after described back scattering light-receiving lens, incide the suspension submicron to be measured in sample cell
On particulate matter, after producing described in the forward scattering light of forward scattering optical receiver lens described in directive and directive
To scattering optical receiver lens rear orientation light, through described forward scattering optical receiver lens described before
Detect by described forward scattering optical detection module to the light intensity value of scattered light, through described rear orientation light
The light intensity value of the described rear orientation light receiving lens is detected by described rear orientation light detecting module, institute
State processing module and calculate the light intensity value of described rear orientation light and the light intensity value of described forward scattering light
Ratio R, and according to the monotonic relationshi between predetermined ratio R and microsphere diameter D, determine
The size of described suspension Submicron Particles to be measured, between wherein said ratio R and microsphere diameter D
Monotonic relationshi is that the multiple different size of standard microsphere for known diameter uses described measurement device
Described ratio R and obtain.
Beneficial effects of the present invention:
The device and method measuring suspension Submicron Particles size that the present invention proposes, based on light scattering
Measuring the size of commercial measurement single suspension Submicron Particles, the present invention passes through back scattering light-receiving
Lens make light oblique incidence illuminate sample, connect by having the rear orientation light of predetermined large-numerical aperture
Receive lens and forward scattering optical receiver lens, the forward scattering light of polarizers of big angle scope can be collected and backward dissipate
Penetrate light, both light intensity of detection, then calculate ratio between the two, this ratio and submicron particles
The size of thing is monotonic relationshi.The advantage of the method is to be capable of single suspension Submicron Particles
Easy measure reliably, be particularly well-suited to the Submicron Particles of suspended state.
Accompanying drawing explanation
Fig. 1 is that the structure of a kind of embodiment of device that the present invention measures suspension Submicron Particles size is shown
It is intended to.
Fig. 2 is the aperture light channel structure schematic diagram in the preferred embodiment of the present invention.
Fig. 3 is that the ratio R utilizing the measurement device shown in Fig. 1 is along with the pass of polymer microsphere diameter D
System, the wherein I-shaped pattern representation limits of error.
Fig. 4 is the flow chart that the present invention measures sub-micron particle size.
Detailed description of the invention
Hereinafter embodiments of the present invention are elaborated.It is emphasized that the description below is only
It is exemplary rather than in order to limit the scope of the present invention and application thereof.
Refering to Fig. 1, in one embodiment, a kind of device measuring suspension Submicron Particles size,
Including light source 1, back scattering light-receiving lens L1, forward scattering optical receiver lens L2, back scattering
Optical detection module, forward scattering optical detection module and processing module, the light warp that described light source 1 sends
The suspension submicron particles to be measured inciding in sample cell 5 after crossing described back scattering light-receiving lens L1
On thing, backward described in the forward scattering light of forward scattering optical receiver lens L2 described in generation directive and directive
The rear orientation light of scattering optical receiver lens L1, through the institute of described forward scattering optical receiver lens L2
The light intensity value stating forward scattering light is detected by described forward scattering optical detection module, through described backward scattered
Penetrate the light intensity value of described rear orientation light of optical receiver lens L1 by described rear orientation light detecting module
Detection, described processing module calculates the light intensity value of described rear orientation light and described forward scattering light
The ratio R of light intensity value, and according to the monotonic relationshi between predetermined ratio R and microsphere diameter D,
Determine the size of described suspension Submicron Particles to be measured, wherein said ratio R and microsphere diameter D it
Between monotonic relationshi be that the multiple different size of standard microsphere for known diameter is by described measurement device
Described ratio R obtains.
In an advantageous embodiment, described rear orientation light detecting module includes beam splitter 2, backward
Scattered light collecting lens L3 and the first detector 3, described beam splitter 2 is positioned at described light source 1 and described
Between back scattering light-receiving lens L1, the light that described light source 1 sends is first transmitted through described beam splitter 2
It is again incident on described back scattering light-receiving lens L1, through described back scattering light-receiving lens L1
Described rear orientation light reflect on described beam splitter 2, the described rear orientation light warp of reflection
Cross rear orientation light collecting lens L3 post-concentration to described first detector 3, described first detector 3
Detect the light intensity value of described rear orientation light.
In an advantageous embodiment, described forward scattering optical detection module includes that forward scattering light is assembled
Lens L4 and the second detector 4, the described forward direction through described forward scattering optical receiver lens L2 dissipates
Penetrate light and incide described forward scattering light collecting lens L4, through described forward scattering light collecting lens
L4 post-concentration detects described forward scattering light to described second detector 4, described second detector 4
Light intensity value.
In an advantageous embodiment, device also includes being arranged on described forward scattering optical receiver lens L2
And the diaphragm 6 between described forward scattering optical detection module, it is little that described diaphragm 6 blocks forward-scattering angle
In the light of predetermined angle theta 0 to avoid it to be received by described forward scattering optical detection module.
In a further embodiment, described back scattering light-receiving lens L1 can collect the half of light
Angle is θ b, and the scope at the back scattering angle of covering is [180 ° of-2* θ b, 180 °], described forward direction
It is θ f that scattering optical receiver lens L2 can collect the half-angle of light, and the scope of the forward-scattering angle of covering is
[θ0,2*θf].It is preferred that half angle θ b=θ f=45 °.
Refering to Fig. 2, in an advantageous embodiment, device also includes being arranged on described first detector
Aperture light channel structure before 3, described aperture light channel structure is in the precalculated position in sample cell 5
The suspension Submicron Particles to be measured at place is the lowest to the contribution of the light intensity value of described first detector 3 detection
In predetermined extent.It is highly preferred that described aperture light channel structure includes having foraminate dark slide and position
Aperture convergence of rays lens between described dark slide and described first detector 3, described aperture exists
Position in described dark slide is corresponding with described suspension Submicron Particles location to be measured.
Refering to Fig. 2, in an advantageous embodiment, device also includes being arranged on described second detector
Aperture light channel structure before 4, described aperture light channel structure is in the precalculated position in sample cell 5
The suspension Submicron Particles to be measured at place is the lowest to the contribution of the light intensity value of described second detector 4 detection
In predetermined extent.It is highly preferred that described aperture light channel structure include having foraminate dark slide 7 and
Aperture convergence of rays lens L6 between described dark slide 7 and described second detector 4, described
Aperture position in described dark slide 7 and described suspension Submicron Particles location phase to be measured
Corresponding.
Described light source 1 can be LASER Light Source, described rear orientation light detecting module and described forward scattering
Optical detection module all can use CCD.
In another kind of embodiment, a kind of device measuring suspension Submicron Particles size, including before
State the light source 1 of any embodiment, back scattering light-receiving lens L1, forward scattering optical receiver lens L2,
Rear orientation light detecting module and forward scattering optical detection module.Those skilled in the art easily manage
Solving, the device of the present embodiment can coordinate extra processing module to carry out work as an independent device
Make.
In another kind of embodiment, a kind of method measuring suspension Submicron Particles size, use institute
The device measuring suspension Submicron Particles size stated carries out the survey of suspension Submicron Particles size
Amount, the light that wherein said light source 1 sends incides sample after described back scattering light-receiving lens L1
On suspension Submicron Particles to be measured in product pond 5, produce forward scattering optical receiver lens described in directive
The rear orientation light of back scattering light-receiving lens L1 described in the forward scattering light of L2 and directive, passes through
The light intensity value of the described forward scattering light of described forward scattering optical receiver lens L2 is by described forward scattering
Optical detection module detects, through the light of the described rear orientation light of described back scattering light-receiving lens L1
Intensity values is detected by described rear orientation light detecting module, and described processing module calculates described back scattering
The ratio R of the light intensity value of the light intensity value of light and described forward scattering light, and according to predetermined ratio R
And the monotonic relationshi between microsphere diameter D, determines the size of described suspension Submicron Particles to be measured,
Monotonic relationshi between wherein said ratio R from microsphere diameter D is multiple different for known diameter
The standard microsphere of size uses ratio R described in described measurement device to obtain.
Below in conjunction with accompanying drawing, the specific embodiment of the present invention is further described.
It is the device schematic diagram of the specific embodiment of the invention as shown in Figure 1.In figure, incident illumination is through beam splitting
After mirror 2, changed angle by back scattering light-receiving lens L1, oblique be mapped in sample cell 5, illumination
Particulate matter O.Rear orientation light is collected by back scattering light-receiving lens L1, quilt after beam splitter 2
Reflection, is then focused on record on the first detector 3 by rear orientation light collecting lens L3.Forward direction dissipates
Penetrate light to be collected by forward scattering optical receiver lens L2, owing to 0 ° of scattered light and unscattered light are same
On direction, in order to eliminate the impact of unscattered light, we utilize a diaphragm 6 to block, and only dissipate
The firing angle light more than θ 0 just can be received by a detector.Forward scattering light is assembled thoroughly by forward scattering light
Mirror L4 focuses on, by the second detector 4 record.
If the numerical aperture of back scattering light-receiving lens L1 and forward scattering optical receiver lens L2 is enough
Greatly, to such an extent as to can to collect the half-angle of light be 45 °, then the model that rear orientation light can be recorded
Enclosing span from 90 °-180 °, the scope that forward scattering light can be recorded is [θ 0,90 °].I
By the light intensity value of the first detector 3 than the light intensity value of the second detector 4, then just obtained ratio
R.R is monotonic relationshi with the size of Submicron Particles.
Owing to scattered light is simultaneously by back scattering light-receiving lens L1 and forward scattering optical receiver lens L2
Collecting, we can control the first detector 3 and the second detector 4 records backward simultaneously and forward direction scattered
Penetrate value, then we just can measure the R of same sample.
The scattering of submicron particles is the most weak, device as shown in Figure 1, owing to can collect relatively
Scattered light in polarizers of big angle scope, so optical signal can obtain the biggest reinforcement.In this case,
The scattering value of individual particle can be arrived, calculate R.Such as the device of Fig. 1, the picture of particulate matter O can become
On the face of the first detector 3 and the second detector 4.
If as in figure 2 it is shown, the leading portion at the first detector 3 and the second detector 4 increases aperture light path
Structure, can limit the granule at only O can have contribution to signal, thus is advantageously implemented single
The measurement of grain thing.Owing to adding an aperture light channel structure, it is allowed in an aperture on optical axis
Light passes through, and has blocked the light of other parts, accordingly, derive from O near the dissipating of other particles
Penetrate light to be fallen by gear or reduce, thus the scattered light of the particle at only O is received by a detector, or
In the scattered light being received by a detector, the contribution of the scattered light of the particle at O exceedes predetermined extent.Cause
This, the present embodiment is particularly conducive to realize the detection of single particle.
R used in the measuring method of the specific embodiment of the invention and the relation of sub-micron particle size,
Can be by the experimental verification in Examples below.
Example
Utilizing the device shown in Fig. 1, we have built experimental provision, and utilize 0.1-0.8 micron model
Enclose the relation between R and the microsphere diameter D that interior polymer microsphere mentions in method of testing.Fig. 3
Shown in be i.e. lab diagram.Fig. 3 represents that measurement device goes out R along with the relation of polymer microsphere diameter D,
Wherein blue portion represents the limits of error.From figure 3, it can be seen that R is monotone increasing relation along with D.
This also imply that, can uniquely determine D by measuring R.
Flow process in the application, as shown in Figure 4.We first with standard polymer microsphere measurement obtain as
Relation between R and D of Fig. 3, then measures the R of unknown granule, learns corresponding D from Fig. 3
Value.
Above content is that combination is concrete/the most made for the present invention the most specifically
Bright, it is impossible to assert the present invention be embodied as be confined to these explanations.For technology belonging to the present invention
For the those of ordinary skill in field, without departing from the inventive concept of the premise, it can also be to this
The embodiment having described that a bit makes some replacements or modification, and these substitute or variant all should
It is considered as belonging to protection scope of the present invention.
Claims (9)
1. the device measuring suspension Submicron Particles size, it is characterised in that include light source,
Back scattering light-receiving lens, forward scattering optical receiver lens, rear orientation light detecting module, forward direction
Scattered light detecting module and processing module, the light that described light source sends connects through described rear orientation light
Incide on the suspension Submicron Particles to be measured in sample cell after receiving lens, produce forward direction described in directive
Described in the forward scattering light of scattering optical receiver lens and directive, the backward of back scattering light-receiving lens dissipates
Penetrate light, through the light intensity value of described forward scattering light of described forward scattering optical receiver lens by before described
Detect to scattered light detecting module, through the described rear orientation light of described back scattering light-receiving lens
Light intensity value detected by described rear orientation light detecting module, described processing module calculates described backward
The ratio R of the light intensity value of the light intensity value of scattered light and described forward scattering light, and according to predetermined
Monotonic relationshi between ratio R and microsphere diameter D, determines described suspension Submicron Particles to be measured
Size, the monotonic relationshi between wherein said ratio R and microsphere diameter D is many for known diameter
Individual different size of standard microsphere uses ratio R described in described measurement device to obtain.
2. the device measuring suspension Submicron Particles size as claimed in claim 1, its feature
Being, described rear orientation light detecting module includes beam splitter, rear orientation light collecting lens and first
Detector, described beam splitter is between described light source and described back scattering light-receiving lens, described
The light that light source sends first is again incident on described back scattering light-receiving lens, warp transmitted through described beam splitter
The described rear orientation light crossing described back scattering light-receiving lens reflects on described beam splitter,
The described rear orientation light of reflection detects to described first through rear orientation light collecting lens post-concentration
Device, described first detector detects the light intensity value of described rear orientation light.
3. the device measuring suspension Submicron Particles size as claimed in claim 1, its feature
Being, described forward scattering optical detection module includes forward scattering light collecting lens and the second detector,
Described forward scattering light through described forward scattering optical receiver lens incides described forward scattering light
Collecting lens, through described forward scattering light collecting lens post-concentration to described second detector, described
Second detector detects the light intensity value of described forward scattering light.
4. the dress measuring suspension Submicron Particles size as described in any one of claims 1 to 3
Put, it is characterised in that also include being arranged on described forward scattering optical receiver lens and described forward scattering
Diaphragm between optical detection module, described diaphragm blocks the forward-scattering angle light less than predetermined angle theta 0
To avoid it to be received by described forward scattering optical detection module.
5. the device measuring suspension Submicron Particles size as claimed in claim 4, its feature
Being, the half-angle that described back scattering light-receiving lens can collect light is θ b, the back scattering of covering
The scope at angle is [180 ° of-2* θ b, 180 °], and described forward scattering optical receiver lens can collect light
Half-angle be θ f, the scope of the forward-scattering angle of covering is [θ 0,2* θ f].
6. the device measuring suspension Submicron Particles size as claimed in claim 2, its feature
Being, also including the aperture light channel structure before being arranged on described first detector, described aperture light path is tied
The suspension Submicron Particles to be measured of the pre-position that structure is in sample cell is to described first
The contribution of the light intensity value of detector detection is not less than predetermined extent, it is preferable that described aperture light channel structure
Including having foraminate dark slide and little between described dark slide and described first detector
Hole convergence of rays lens, described aperture position in described dark slide and described suspension submicron to be measured
Particulate matter location is corresponding.
7. the device measuring suspension Submicron Particles size as claimed in claim 3, its feature
Being, also including the aperture light channel structure before being arranged on described second detector, described aperture light path is tied
The suspension Submicron Particles to be measured of the pre-position that structure is in sample cell is to described second
The contribution of the light intensity value of detector detection is not less than predetermined extent, it is preferable that described aperture light channel structure
Including having foraminate dark slide and little between described dark slide and described second detector
Hole convergence of rays lens, described aperture position in described dark slide and described suspension submicron to be measured
Particulate matter location is corresponding.
8. the device measuring suspension Submicron Particles size, it is characterised in that include such as right
Require the light source described in any one of 1-7, described back scattering light-receiving lens, described forward direction
Scattering optical receiver lens, described rear orientation light detecting module and described forward scattering optical detection
Module.
9. the method measuring suspension Submicron Particles size, it is characterised in that use such as right
Require that the device measuring suspension Submicron Particles size described in any one of 1-7 carries out suspension sub-micro
The measurement of rice grain thing size, the light that wherein said light source sends is saturating through described back scattering light-receiving
Incide on the suspension Submicron Particles to be measured in sample cell after mirror, produce forward scattering described in directive
The rear orientation light of back scattering light-receiving lens described in the forward scattering light of optical receiver lens and directive,
Light intensity value through the described forward scattering light of described forward scattering optical receiver lens is dissipated by described forward direction
Penetrate the detection of optical detection module, through the light of the described rear orientation light of described back scattering light-receiving lens
Intensity values is detected by described rear orientation light detecting module, and described processing module calculates described back scattering
The ratio R of the light intensity value of the light intensity value of light and described forward scattering light, and according to predetermined ratio
Monotonic relationshi between R and microsphere diameter D, determines the size of described suspension Submicron Particles to be measured,
Monotonic relationshi between wherein said ratio R from microsphere diameter D is multiple different for known diameter
The standard microsphere of size uses ratio R described in described measurement device to obtain.
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| CN201610277805.XA CN105973769A (en) | 2016-04-28 | 2016-04-28 | Device and method for measurement of size of suspended submicron particulate matter |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110208169A (en) * | 2019-07-10 | 2019-09-06 | 湖北中医药高等专科学校 | A kind of method of scatter light polarization state data in measurement polarizers of big angle scope |
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